US4638259A - CMOS differential amplifier stage with bulk isolation - Google Patents

CMOS differential amplifier stage with bulk isolation Download PDF

Info

Publication number
US4638259A
US4638259A US06/814,199 US81419985A US4638259A US 4638259 A US4638259 A US 4638259A US 81419985 A US81419985 A US 81419985A US 4638259 A US4638259 A US 4638259A
Authority
US
United States
Prior art keywords
transistors
differential
current source
conduction
differential amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US06/814,199
Inventor
Veikko R. Saari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia Bell Labs
AT&T Corp
Original Assignee
AT&T Bell Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Bell Laboratories Inc filed Critical AT&T Bell Laboratories Inc
Priority to US06/814,199 priority Critical patent/US4638259A/en
Assigned to BELL TELEPHONE LABORATORIES, INCORPORATED reassignment BELL TELEPHONE LABORATORIES, INCORPORATED ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: SAARI, VEIKKO R.
Priority to CA000524164A priority patent/CA1238694A/en
Priority to EP86309642A priority patent/EP0228216A3/en
Priority to JP61304041A priority patent/JPS62159906A/en
Application granted granted Critical
Publication of US4638259A publication Critical patent/US4638259A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers
    • H03F3/45071Differential amplifiers with semiconductor devices only
    • H03F3/45076Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H03F3/45183Long tailed pairs
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers
    • H03F3/45071Differential amplifiers with semiconductor devices only
    • H03F3/45479Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45632Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
    • H03F3/45695Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by using feedforward means
    • H03F3/45699Measuring at the input circuit of the differential amplifier
    • H03F3/45713Controlling the active amplifying circuit of the differential amplifier

Definitions

  • the present invention relates to electronic amplifiers of the type which act on a differential input and which use field effect transistors.
  • CMOS complementary metal-oxide-silicon
  • CMOS complementary metal-oxide-silicon
  • CMOS complementary metal-oxide-silicon
  • CMOS complementary metal-oxide-silicon
  • CMOS complementary metal-oxide-silicon
  • CMOS complementary metal-oxide-silicon
  • the control electrodes, or gates of the devices form inverting and noninverting input nodes, respectively, while the drains form inverting and noninverting output nodes, respectively.
  • the output nodes usually provide a pair of signals to a second, differential amplifier stage.
  • CMOS differential input stages suffer significantly from common mode transmission and power supply noise coupling.
  • a CMOS differential amplifier input circuit having a primary differential pair of transistors with their conducting paths connected at one side to a first current source is provided with a secondary differential pair of transistors connected in parallel between a second current source and a reference potential.
  • the bulk regions of the primary and secondary differential transistors are all connected together and to the sources of the secondary differential transistors.
  • this arrangement is further advantageous in that it reduces the coupling of power supply noise through the tub-to-substrate capacitance to the signal path.
  • FIG. 1 is a schematic circuit diagram of a prior art differential input circuit.
  • FIG. 2 is a schematic circuit diagram of a differential input circuit in accordance with the preferred embodiment of the present invention.
  • all the transistors are N-conductivity type conduction channel enhancement mode MOS devices.
  • the connections of a transistor as such refers to the connections of its conduction channel, namely the source-drain.
  • Ground potential may be any suitable reference potential, and is not necessarily actual earth ground potential or a chassis potential.
  • the differential input circuit 10 of FIG. 1 is representative of prior art structures. It includes a pair of first and second differential input transistors M1,M2 with gates 12, 14 and drains 16,18, respectively. Their sources are connected together as a source node 22. The source node 22, in turn, is connected to a current source 24 which provides bias current to the transistors M1,M2. The bulk regions of the transistors M1,M2 are connected together as a bulk node 20 and also connected to the source node 22. A capacitor C1, shown in phantom connected between the bulk node 20 and a positive supply voltage V+, represents parasitic capacitance which is present in the transistors Ml and M2.
  • the circuit 10 is subject to significant common mode transmission at relatively high signal frequencies. Such transmission can be attributed to the effects of charging of the bulk regions of the transistors M1 and M2 in response to the common mode voltage on the gates 12,14.
  • the charging current is drawn from the source node 22 and thereby becomes coupled to the signal path of the transistors M1,M2.
  • the circuit 10 is also subject to noise coupling from the positive supply voltage node V+ via the parasitic capacitance C1. This coupling is particularly troublesome at above-audio signal frequencies.
  • the circuit 26 of FIG. 2 is one example of a differential input stage in accordance with the present invention. Elements of the circuit 26 which correspond to similar elements in the circuit 10 of FIG. 1 are denoted with similar reference symbols.
  • a pair of secondary differential isolation transistors M3 and M4 are connected to have common gates with the primary differential input transistors M1 and M2, respectively.
  • the bulk regions of all four transistors M1,M2,M3,M4 are connected together and are parasitically coupled to the positive supply voltage V+ through the capacitance C2, shown in phantom.
  • the sources of the secondary transistors M3,M4 are connected to their bulk and to a second current source 28, while the drains are connected to ground potential.
  • circuit 26 described above is implemented with N-type conduction channel devices, it will be readily apparent to those skilled in the art that analogous arrangements also fully within the scope of the invention may be readily designed with P-type conduction channel devices, or with depletion mode devices of either conduction channel conductivity type.

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)

Abstract

An MOS differential input stage circuit (10) includes first (M1) and second (M2) differential input transistors with input nodes at their gates and output nodes at their drains. The sources are connected to a first current source (24). A second pair of differential transistors (M3,M4) which have their sources connected to a second current source (28), their drains connected to a reference voltage node, and their gates common to the respective first differential input transistors, have their bulk regions in common with the bulk regions (20) of the first differential transistors for isolation from supply voltage noise and from common mode input signal effects.

Description

TECHNICAL FIELD
The present invention relates to electronic amplifiers of the type which act on a differential input and which use field effect transistors.
BACKGROUND OF THE INVENTION
Differential input amplifiers are widely used as stages in various types of electronic circuits, particularly at higher frequencies, where signal distortions are increasingly evident. For circuits implemented in complementary metal-oxide-silicon (CMOS) technology, a typical differential input stage is formed with two transistors having common sources connected to a current source. The control electrodes, or gates of the devices form inverting and noninverting input nodes, respectively, while the drains form inverting and noninverting output nodes, respectively. The output nodes usually provide a pair of signals to a second, differential amplifier stage. At frequencies above the audible range, CMOS differential input stages suffer significantly from common mode transmission and power supply noise coupling.
SUMMARY OF THE INVENTION
In accordance with the present invention, a CMOS differential amplifier input circuit having a primary differential pair of transistors with their conducting paths connected at one side to a first current source is provided with a secondary differential pair of transistors connected in parallel between a second current source and a reference potential. The bulk regions of the primary and secondary differential transistors are all connected together and to the sources of the secondary differential transistors. With this arrangement, the common mode rejection of the differential amplifier stage is improved in that charging of the bulk regions of the primary differential transistors is not supplied through a lead which is also connected to their signal conduction path. This provides effective isolation of the primary outputs from the common-mode-driven bulk-charging current. Where the primary input differential transistor pair is formed in a tub of P (or N) material sitting on a substrate of N (or P) material, as is typically the case, this arrangement is further advantageous in that it reduces the coupling of power supply noise through the tub-to-substrate capacitance to the signal path.
BRIEF DESCRIPTION OF THE DRAWING
FIG. 1 is a schematic circuit diagram of a prior art differential input circuit.
FIG. 2 is a schematic circuit diagram of a differential input circuit in accordance with the preferred embodiment of the present invention.
DETAILED DESCRIPTION
In the descriptions of the examples below, all the transistors are N-conductivity type conduction channel enhancement mode MOS devices. The connections of a transistor as such refers to the connections of its conduction channel, namely the source-drain. Ground potential may be any suitable reference potential, and is not necessarily actual earth ground potential or a chassis potential.
The differential input circuit 10 of FIG. 1 is representative of prior art structures. It includes a pair of first and second differential input transistors M1,M2 with gates 12, 14 and drains 16,18, respectively. Their sources are connected together as a source node 22. The source node 22, in turn, is connected to a current source 24 which provides bias current to the transistors M1,M2. The bulk regions of the transistors M1,M2 are connected together as a bulk node 20 and also connected to the source node 22. A capacitor C1, shown in phantom connected between the bulk node 20 and a positive supply voltage V+, represents parasitic capacitance which is present in the transistors Ml and M2.
The circuit 10 is subject to significant common mode transmission at relatively high signal frequencies. Such transmission can be attributed to the effects of charging of the bulk regions of the transistors M1 and M2 in response to the common mode voltage on the gates 12,14. The charging current is drawn from the source node 22 and thereby becomes coupled to the signal path of the transistors M1,M2. The circuit 10 is also subject to noise coupling from the positive supply voltage node V+ via the parasitic capacitance C1. This coupling is particularly troublesome at above-audio signal frequencies.
The circuit 26 of FIG. 2 is one example of a differential input stage in accordance with the present invention. Elements of the circuit 26 which correspond to similar elements in the circuit 10 of FIG. 1 are denoted with similar reference symbols. A pair of secondary differential isolation transistors M3 and M4 are connected to have common gates with the primary differential input transistors M1 and M2, respectively. The bulk regions of all four transistors M1,M2,M3,M4 are connected together and are parasitically coupled to the positive supply voltage V+ through the capacitance C2, shown in phantom. The sources of the secondary transistors M3,M4 are connected to their bulk and to a second current source 28, while the drains are connected to ground potential.
With the circuit 26, common mode transmission is reduced, since the charging current for the bulk regions of the primary transistors M1,M2 is not associated with a signal path and is instead supplied from the sources of the secondary transistors M3,M4. The bias current of, and the area occupied by the secondary differential transistors M3,M4 do not have to be as great as those of the primary differential transistors M1,M2. The secondary transistors M3,M4 are designed with only half the length-to-width ratio of the primary transistors M1,M2, and the secondary bias current source 28 is smaller than the primary current source 24. The appropriate relative proportions of these devices are determined for the particular application for which the circuit 26 is to be used.
While the circuit 26 described above is implemented with N-type conduction channel devices, it will be readily apparent to those skilled in the art that analogous arrangements also fully within the scope of the invention may be readily designed with P-type conduction channel devices, or with depletion mode devices of either conduction channel conductivity type.

Claims (6)

What is claimed is:
1. In a differential amplifier of the type having:
first and second field-effect transistors having one side of their conduction paths connected to a first current source, the control electrodes of the first and second transistors being first and second input nodes, respectively, and the other side of the conduction paths of the first and second transistors being first and second output nodes, respectively,
The improvement therein comprising:
third and fourth field-effect transistors having one side of their conduction paths connected to the bulk regions of the first, second, third and fourth transistors and to a second current source, the control electrodes of the third and fourth transistors being connected, respectively, to the control electrodes of the first and second transistors, and the other side of the conduction path of the third and fourth transistors being connected to a common reference voltage.
2. The amplifier defined in claim 1 wherein the first and second transistors have the same conduction channel conductivity type.
3. The amplifier defined in claim 2 wherein the third and fourth transistors have the same conduction channel conductivity type.
4. The amplifier defined in claim 3 wherein the first and second transistors have substantially identical operating characteristics.
5. The amplifier defined in claim 4 wherein the third and fourth transistors have substantially identical operating characteristics.
6. The amplifier defined in claim 5 wherein the first, second, third, and fourth transistors are of the enhancement mode type with N-conductivity type conduction channels.
US06/814,199 1985-12-27 1985-12-27 CMOS differential amplifier stage with bulk isolation Expired - Lifetime US4638259A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US06/814,199 US4638259A (en) 1985-12-27 1985-12-27 CMOS differential amplifier stage with bulk isolation
CA000524164A CA1238694A (en) 1985-12-27 1986-11-28 Cmos differential amplifier stage with bulk isolation
EP86309642A EP0228216A3 (en) 1985-12-27 1986-12-10 Differential amplifier
JP61304041A JPS62159906A (en) 1985-12-27 1986-12-22 Differential amplifier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/814,199 US4638259A (en) 1985-12-27 1985-12-27 CMOS differential amplifier stage with bulk isolation

Publications (1)

Publication Number Publication Date
US4638259A true US4638259A (en) 1987-01-20

Family

ID=25214411

Family Applications (1)

Application Number Title Priority Date Filing Date
US06/814,199 Expired - Lifetime US4638259A (en) 1985-12-27 1985-12-27 CMOS differential amplifier stage with bulk isolation

Country Status (4)

Country Link
US (1) US4638259A (en)
EP (1) EP0228216A3 (en)
JP (1) JPS62159906A (en)
CA (1) CA1238694A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4859880A (en) * 1988-06-16 1989-08-22 International Business Machines Corporation High speed CMOS differential driver
US5200637A (en) * 1988-12-15 1993-04-06 Kabushiki Kaisha Toshiba MOS transistor and differential amplifier circuit with low offset
US6549073B1 (en) 2001-12-21 2003-04-15 Xerox Corporation Operational amplifier with common mode gain control using impedance transport
US20060037822A1 (en) * 2004-08-17 2006-02-23 Mcfarland D M Device, a system and a method for transferring vibrational energy
US7064609B1 (en) 2004-08-17 2006-06-20 Ami Semiconductor, Inc. High voltage, low-offset operational amplifier with rail-to-rail common mode input range in a digital CMOS process
WO2007127777A2 (en) * 2006-04-25 2007-11-08 Texas Instruments Incorporated Circuit and method for driving bulk capacitance of amplifier input transistors

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961279A (en) * 1975-01-29 1976-06-01 National Semiconductor Corporation CMOS differential amplifier circuit utilizing a CMOS current sinking transistor which tracks CMOS current sourcing transistors

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4345213A (en) * 1980-02-28 1982-08-17 Rca Corporation Differential-input amplifier circuitry with increased common-mode _voltage range

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961279A (en) * 1975-01-29 1976-06-01 National Semiconductor Corporation CMOS differential amplifier circuit utilizing a CMOS current sinking transistor which tracks CMOS current sourcing transistors

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
1983 IEEE International Solid State Circuits Conference, Session XVII, Precision Analog Components T. C. Choi, R. T. Kaneshiro, R. Brodersen, P. Gray, W. Jett and M. Wilcox: ISSCC 83/Friday, 2/25/83, Imperial Ballroom B/11:15 a.m., pp. 246, 247 and 314. *
1983 IEEE International Solid-State Circuits Conference, "Session XVII, Precision Analog Components" T. C. Choi, R. T. Kaneshiro, R. Brodersen, P. Gray, W. Jett and M. Wilcox: ISSCC 83/Friday, 2/25/83, Imperial Ballroom B/11:15 a.m., pp. 246, 247 and 314.
IEEE Journal of Solid State Circuits, High Frequency CMOS Switched Capacitor Filters for Communications Application T. Choi, R. T. Kaneshiro, R. W. Brodersen, P. R. Gray, W. Jett and M. Wilcox, vol. sc 18, No. 6, Dec. 1983. *
IEEE Journal of Solid-State Circuits, "High-Frequency CMOS Switched-Capacitor Filters for Communications Application" T. Choi, R. T. Kaneshiro, R. W. Brodersen, P. R. Gray, W. Jett and M. Wilcox, vol. sc-18, No. 6, Dec. 1983.

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4859880A (en) * 1988-06-16 1989-08-22 International Business Machines Corporation High speed CMOS differential driver
US5200637A (en) * 1988-12-15 1993-04-06 Kabushiki Kaisha Toshiba MOS transistor and differential amplifier circuit with low offset
US6549073B1 (en) 2001-12-21 2003-04-15 Xerox Corporation Operational amplifier with common mode gain control using impedance transport
US20060037822A1 (en) * 2004-08-17 2006-02-23 Mcfarland D M Device, a system and a method for transferring vibrational energy
US7064609B1 (en) 2004-08-17 2006-06-20 Ami Semiconductor, Inc. High voltage, low-offset operational amplifier with rail-to-rail common mode input range in a digital CMOS process
WO2007127777A2 (en) * 2006-04-25 2007-11-08 Texas Instruments Incorporated Circuit and method for driving bulk capacitance of amplifier input transistors
WO2007127777A3 (en) * 2006-04-25 2009-01-22 Texas Instruments Inc Circuit and method for driving bulk capacitance of amplifier input transistors
CN101443996B (en) * 2006-04-25 2011-10-12 德克萨斯仪器股份有限公司 Circuit and method for driving bulk capacitance of amplifier input transistors

Also Published As

Publication number Publication date
CA1238694A (en) 1988-06-28
JPS62159906A (en) 1987-07-15
EP0228216A2 (en) 1987-07-08
EP0228216A3 (en) 1988-11-23

Similar Documents

Publication Publication Date Title
US4554515A (en) CMOS Operational amplifier
US4518926A (en) Gate-coupled field-effect transistor pair amplifier
US6265941B1 (en) Balanced differential amplifier having common mode feedback with kick-start
US5942940A (en) Low voltage CMOS differential amplifier
US4284957A (en) CMOS Operational amplifier with reduced power dissipation
US4477782A (en) Compound current mirror
US4459555A (en) MOS Differential amplifier gain control circuit
US4484148A (en) Current source frequency compensation for a CMOS amplifier
US4736117A (en) VDS clamp for limiting impact ionization in high density CMOS devices
US5289058A (en) MOS operational amplifier circuit
US4340867A (en) Inverter amplifier
US6236270B1 (en) Operational amplifier circuit including folded cascode circuit
US4656437A (en) CMOS operational amplifier with improved common-mode rejection
US4315223A (en) CMOS Operational amplifier with improved frequency compensation
US6236269B1 (en) Complementary CMOS differential amplifier circuit
US4638259A (en) CMOS differential amplifier stage with bulk isolation
US4533877A (en) Telecommunication operational amplifier
EP0228215B1 (en) Field-effect transistor amplifier circuits
US5959490A (en) High speed low voltage swing receiver for mixed supply voltage interfaces
US5773872A (en) Semiconductor device having an integrated differential circuit with an improved common-mode rejection ratio (CMRR)
CA1259672A (en) Differential input stage for differential line receivers and operational amplifiers
US4656436A (en) CMOS transconductance circuit with triode mode input
US4785258A (en) CMOS amplifier circuit which minimizes power supply noise coupled via a substrate
US5621374A (en) Amplifying circuit for simulating a unity gain buffer amplifier
CA1180773A (en) Differential amplifier with differential to single- ended conversion function

Legal Events

Date Code Title Description
AS Assignment

Owner name: BELL TELEPHONE LABORATORIES, INCORPORATED, 600 MOU

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:SAARI, VEIKKO R.;REEL/FRAME:004498/0020

Effective date: 19851226

STCF Information on status: patent grant

Free format text: PATENTED CASE

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 12