US4623251A - Method for focusing spherical holographic diffraction gratings working by reflection, and dispersive lenses and spectrometers applying this method - Google Patents
Method for focusing spherical holographic diffraction gratings working by reflection, and dispersive lenses and spectrometers applying this method Download PDFInfo
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- US4623251A US4623251A US06/517,418 US51741883A US4623251A US 4623251 A US4623251 A US 4623251A US 51741883 A US51741883 A US 51741883A US 4623251 A US4623251 A US 4623251A
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- 210000001747 pupil Anatomy 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 3
- 238000000870 ultraviolet spectroscopy Methods 0.000 description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1838—Holographic gratings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0202—Mechanical elements; Supports for optical elements
Definitions
- the present invention relates to a method for focusing spherical holographic diffraction gratings working by reflection, for dispersing the different radiations making up a polychromatic light.
- the invention also relates to dispersive lenses and spectrometers using the method.
- the spectrometers according to the present invention are spectrometers in which the dispersion and focusing of the polychromatic incident radiations are performed by a single optical element, namely a concave (or convex) grating.
- the entrance slit is focused in the virtual space of the grating by means of a toroidal mirror working at its stigmatic points, that is to say with a magnification of one);
- At least one exit slit or a detector consisting, for example, of a set of mutually parallel, equidistant microchannels arranged over a curved surface.
- the present invention is not concerned with the methods of recording the hologram, but to a focusing method in which a hologram placed on a spherical surface plays an active part in the focusing, and therefore relates also to the spatial localization of the recording points:
- the present invention relates in particular to spectrometers intended for studying the profiles of the lines, that is to say those for which the pulsed response is symmetrical, this being an essential condition for easy application of the conventional methods of deconvolution.
- the 4th order aberrations (generalized spherical aberration) only cause a symmetrical broadening; on the other hand, the astigmatism curvature and the coma terms produce an asymmetrical broadening which must be made zero or negligible (the tolerances will then be deduced from the known image quality criteria).
- a spectrometer which works with a fixed entrance slit, a fixed grating and a fixed detector, all the elements of which are on a circle of diameter ROW, called a Rowland circle [cf. J. A. R. Sampson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, N.Y., 1967)].
- a Rowland circle cf. J. A. R. Sampson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, N.Y., 1967)].
- all the mountings on the Rowland circle do not satisfy the requisite quality criterion.
- a holographic grating with a non-uniform line distribution can give stigmatic images (cf. French Pat. No. 70/27,186 and its Certificate of Addition No. 73/28,625), that is to say images corrected for all the aberrations, if the recording points and the object and image points are harmonic conjugates relative to the circle of radius ROW, the center of which is the center of curvature of the grating.
- the harmonicity ratio depends on the recording wavelength ⁇ o . At present, this solution cannot always be applied in the far ultraviolet (high value of the ratio ⁇ o / ⁇ ).
- the focusing locus is determined as a function of the position of the tangential object and image focal lines.
- the present invention deviates radically from this concept and, quite unexpectedly, in contrast to the teachings of the prior art, it considers both a method and devices in which the focusing locus is determined as a function of the position of the sagittal object and image focal lines.
- the prior art envisaged displacing the sagittal focal line towards the tangential focal line.
- the surface (spherical or toroidal) and a line distribution (uniform or non-uniform) was therefore chosen in order to obtain an image corrected for the aberrations in the plane of the tangential focal line.
- the embodiments do not cover the whole plane and do not make it possible to obtain stigmatism at very short wavelengths (less than 100 nanometers), the stigmatism wavelengths always being proportional to the recording wavelength of the hologram, which at present is 487.9 nanometers.
- the present invention consists of dissociating the object space and the image space.
- the spherical incident wave surface remains spherical in the object space after interaction with the grating and likewise remains spherical in the image space.
- the devices of the invention can be used, from the spectral point of view, at any wavelength ⁇ , the embodiments described herein will relate more particularly to the near and far ultraviolet, that is to say wavelengths less than 300 nm (nanometers).
- the invention therefore proposes a method for focusing spherical holographic diffraction gratings of radius of curvature R, working by reflection, for dispersing the different radiations making up a polychromatic light.
- a fixed entrance slit and at least one fixed exit slit (or a multichannel detector) are used.
- Relationship n represents the number of lines per mm of the holographic grating produced at the laser wavelength ⁇ o from the recording of interference fringes generated by two source points C and D, respectively defined by their polar coordinates, relative to the top of the grating, as follows: ##EQU3## V and V' being constants which can be equal to one another, the intensity distribution of the resulting diffracted image is symmetrical.
- the present invention also relates to a dispersive lens corrected for the astigmatism and the comas.
- the recording point is at a distance r c from the top of the grating of radius of curvature R and the source point is at a distance r such that ##EQU4##
- the present invention also provides a dispersive lens of the above type in which the recording point located on the normal to the grating is at a distance ##EQU7## from the top of the grating of radius of curvature R, and the source point is located at a distance ##EQU8## from the top of the grating.
- the present invention also provides a dispersive lens for which the locus of the object points is a circle of radius R/[2
- the locus of the images diffracted at the angle ⁇ , with sin ⁇ P sin ⁇ .
- the present invention also proposes a stigmatic polychromator that works in the positive order for the wavelengths
- the present invention also relates to a stigmatic polychromator that works in the negative orders for the wvelengths
- ⁇ x sin ⁇ x
- tan ⁇ x -sin ⁇ (sin ⁇ +cos ⁇ )
- the focusing locus is a circle centered on the center of the Rowland circle and of radius ##EQU9##
- the present invention also proposes a stigmatic dispersive lens for the far ultraviolet, that works in the negative orders.
- the object is located on the normal to the grating.
- the direction of observation corresponds to an angle of diffraction ⁇ of less than 45°.
- the present invention also relates to a dispersive collimator in which the object is located at infinity on the normal to the grating.
- the source point and the image point are located on a circle whose radius is centered on the tangent to the top of the grating, and which passes through the top of the grating.
- a toroidal mirror working at a magnification of 1, gives an image of the source point.
- the image is located on the above mentioned circle whose radius is centered on the tangent to the top of the grating.
- the image passes through the top of the grating, with said image acting as a virtual object for the grating, thus giving a stigmatic real image located on the said circle.
- One of the recording points, C is at the center of curvature and the other, D, is at infinity, inclined at an angle ⁇ relative to the normal to the grating.
- One of the source points (C) is at the center of curvature of the said lens and the other (D) is at infinity, inclined at an angle ⁇ relative to the normal to the said lens, this angle being equal to that formed by the normal to the lens and the bisector of the angle 2 ⁇ .
- FIG. 1 illustrates spectrometer mountings according to the prior art
- FIG. 1A illustrates the optical arrangement of a prior art grating
- FIG. 2 shows the focusing locus of the images S' (circle P 1 ) corrected for the astigmatism and the coma for a source point S located on the normal to the grating R 1 .
- One of the recording points C of the hologram also is on the normal to the grating R 1 .
- ROW is the Rowland circle (locus of the tangential focal lines).
- FIG. 2 further shows wavelengths ⁇ 1 and ⁇ 2 on the circle in broken lines;
- FIG. 3 shows the focusing locus (circle P 2 ) of the images corrected for the astigmatism and coma for several wavelengths obtained with a single grating
- FIG. 4 is a variant of FIG. 3;
- FIG. 5 shows the stigmatism wavelengths obtained in the mountings according to FIGS. 3 and 4 as a function of a parameter characterizing the hologram
- FIGS. 6A, 6B and 6C illustrate a grating support with independent adjustment parameters
- FIGS. 7A, 7B and 7C illustrate, in section, a slit with a symmetrical aperture
- FIG. 8 shows the locus of the object points located at a finite distance for obtaining a strictly stigmatic image
- FIG. 9 shows the various circles for obtaining an image whose quality is limited only by the 4th order aberrations.
- FIG. 10 illustrates an arrangement for a object and an image at infinity.
- ⁇ 1 (w, l) and ⁇ 2 (w, l) can be expressed by:
- a and B are functions depending solely on the pupil coordinates, the radius of curvature R and a constant V or V' depending on the characteristics of the hologram.
- the effect of making the functions ⁇ 1 and ⁇ 2 zero is thus to make the optical path stationary, irrespective of the aperature. It is recalled that, in the generally accepted theories, the values of ⁇ are expressed as a function of the pupil coordinates and the coefficients of aberration, that is to say by:
- Cij depend on various functions of e, e', ⁇ , ⁇ , ⁇ , ⁇ D and ⁇ c .
- the functions ⁇ 1 and ⁇ 2 depend only on the positions of the object and image points.
- ⁇ o being the wavelength of the laser used to produce the hologram and having the generally accepted value of 487.986 nm.
- FIGS. 1 and 1A illustrate, respectively a prior art spectrometer mounting and a grating used in said mounting.
- luminous point A (r, ⁇ ,z) is shown on the entrance slit of an image point B (r', ⁇ ,z').
- P(u,w, ⁇ ) is a point located on the nth line from the origin O
- C( ⁇ ,r c ) and D( ⁇ ,r D ) are the luminous source points used for recording a hologram.
- a stigmatic solution is shown, as in French Pat. No. 70/27,186 and its Certificate of Addition No. 73/625, wherein the source point S, and one of the recording points C are at the center of curvature O' of the grating and the stigmatic image point (all the aberrations being zero) is at S" 1 (FIG. 1) with
- the condition of focusing in the horizontal plane is satisfied first by considering that the sum of the tangential object and image focal lines must be zero. This is used to deduce, for a position of the source point, a position of the image and a condition relating to the localization of the recording points (cf. again to J. A. R. Sampson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, N.Y., 1967) and M. Pouey, Journal of the Spectroscopical Society, Volume 23, Supplement No. 1, 1974, pages 67-81).
- FIG. 2 illustrates the present invention wherein the object space and the image space (optical path terms carrying the prime in equation 1) are considered separately.
- the image distance deduced from the equations for the sagittal focal line is imposed as the image distance. It is therefore necessary to determine the conditions for which the tangential focal line can be made to coincide with the sagittal focal line.
- the image space is considered first:
- the image distance is characterised by:
- the second source point D being characterised by ⁇ and by:
- the image point S' can be used as a source point with the image then forming at S on the normal to the grating.
- ⁇ 1 + ⁇ the focusing law in the horizontal plane will be: ##EQU19##
- the focusing locus is a curved surface which can be compared, for small values of ⁇ , with an arc of a circle.
- the focusing locus is a plane P' forming an angle of about 73.8° with the direction of the diffracted ray.
- the image distance is
- the focusing locus is a circle centered at 0", which is the center of the Rowland circle, and of radius: ##EQU20##
- the limiting resolution is imposed by the diffraction and hence by the wavelengths at which perfectly corrected lenses can be produced.
- a stigmatic device is hereinafter described which can work at 121.6 nm, because there are intense, stable and reproducible sources for this wavelength.
- a fixed grating whose blaze angle will be optimised, by any known means, for operating in the order m, and which is covered with suitable reflecting layers (for example Al+MgF 2 );
- the diffraction angle ⁇ 4 - ⁇ x corresponding to operation in the negative orders.
- the object distance will be, according to equation (9): ##EQU21## and the image distance will be:
- the device will be strictly stigmatic for all wavelengths such that m ⁇ -0.48656 ⁇ m, that is to say for Ly ⁇ (121.6 nm) in the negative 4th order.
- the limiting resolution of the device will be imposed by the diffraction, 0.85 (R/W) ⁇ m, or fractions of microns for apertures of f/25. Taking account of the values of r', it is necessary to work with high values of R since the object distance then is large. In this case, the beam can be bent with the aid of plane mirrors.
- the practical limiting resolution is therefore influenced by the quality of the grating and of the surface conditions of the mirrors, as well as by the mechanical stability of the system.
- Equation 2e the function ⁇ 1 (e, ⁇ , ⁇ c , ⁇ ) is represented in equation 2e by T+PH and S 2 +PK 2 .
- the expression for the sagittal and tangential focal lines is therefore unique and gives rise to the stigmatism.
- the locus of the images can be considered as that which would be deduced, according to classical theories, from the locus of the particular expression for the sagittal focal line, that is to say of:
- the locus of the object points for obtaining a strictly stigmatic image is therefore a circle P 1 ' of radius R/(
- ), centered in the direction ⁇ sin ⁇ o cos ⁇ and passing through the top of the grating and its center of curvature, with
- cos ⁇ o .
- the object point A and one of the recording points C are at the center of curvature:
- the object point A is defined by:
- the recording point C is such that: ##EQU26##
- ⁇ > being the mean quadratic value of the width at half-height of the pulsed response.
- the locus of the images is the circle of radius R/(2 sin ⁇ ), described previously.
- FIG. 8 illustrates an arrangement for precise values of ⁇ and ⁇ and for an angle of incidence ⁇ 0.
- the dotted line of this circle P 1 corresponds to the negative order cases: ##EQU30##
- the circle P 1 is the locus of the diffracted image (r' ⁇ ) corrected for astigmatism and coma.
- the object could be located either at O' or S 1 both on the grating normal.
- the source S could also be located on a circle P' 1 centered at O"' and passing through O and O'.
- the dotted line of said circle P' 1 corresponds also to the case of negative orders.
- P>0 means of course positive orders.
- Equation 30 characterizes the generalized focusing method of the present invention. To show the applications of this method, several illustrative examples are given:
- Equation 30 is then written as follows: ##EQU39##
- the pitch of the grating is fixed, and to each wavelength there coresponds an angle of diffraction ⁇ with which an image distance deduced from the value of ⁇ satisfying equation 35 is associated.
- This again gives a configuration of the stigmatic Rowland type in which it is possible to work outside the plane.
- the displacement of the source point outside the plane in the vertical direction parallel to the 7 mm lines introduces an operating difference of only one wavelength.
- the entrance slit can therefore be lcoated one centimeter above the plane of the Rowland circle, with the detector being located below the latter.
- equation 19 is written as follows: ##EQU44##
- F and G depending on ⁇ and ⁇ , are given by: ##EQU45##
- FIG. 3 which illustrates also the classical Rowland Circle (ROW) of diameter OO'
- the source S and the image S' are positioned on the circle of radius Ra passing through the top O of the grating and centered at O on the tangent to the top of the grating fixed in space. Consequently: ##EQU49##
- FIG. 9 illustrates the case where the source and the image are located on circles of radius aR.
- the pulsed response is therefore symmetrical for wavelengths ⁇ x such that: ##EQU52##
- the autocollimation solution is particularly interesting because the device can work in high orders, which increases the limiting resolving power.
- the 3rd order it is possible to observe the CV and OVII lines, and measuring the broadening of these lines gives fundamental information relating to the density and the ion temperature of the plasmas.
- the left vertical axis gives the stigmatic wavelengths in nanometer units while the right vertical axis gives the number of lines per micrometers (n), the broken line shows the variation of n in function of C characterizing the recording parameters.
- FIG. 4 gives an example of operation as a monochromator, the source S being refocused with the aid of a toroidal mirror M working at a magnification of one.
- the toroidal mirror M gives an image S' 1 located on the circle P 2 , which image S 1 acts as a virtual object for the grating R, giving a stigmatic real image S" thereof on the circle P 2 .
- image S 1 acts as a virtual object for the grating R
- stigmatic real image S" thereof on the circle P 2 .
- equation 55 has four real solutions of which at least two are positive. For each value of ⁇ , there are thus two values of ⁇ , for the positive orders, for which the pulsed response is symmetrical. The astigmatism and comas are corrected and the 4th order aberrations are negligible in terms of the Strehl criterion.
- the source S and the detector placed behind the exit slit localized at S'
- the source S and the detector can be displaced over a circle of radius R passing through the top O of the grating and centered at O on its tangent
- the quality of the image can be deduced from the geometrical image quality criterion (cf. M. Pouey, Journal of the Spectroscopical Society Am., op. cit.).
- This solution is particularly suited to the case of grazing incidence ⁇ >> ⁇ , the image obtained being real for a convex grating.
- the concave or convex holographic mirror is then equivalent to a plane mirror having spectral selection properties.
- plane gratings used especially in CZERNY-TURNER type mountings, are considered in the literature.
- incident beams there is introduced into the direction of diffraction wave surface distortions generating a strong coma and a curvature of spectral lines.
- this angle defines the angular position of the recording point D located at infinity.
- the second recording point is located at the center of curvature of the mirror.
- the essential elements that is to say the grating support and the slit or slits, should be made with precision and possess adjustment possibilities of appropriate sensitivity.
- FIGS. 6A, 6B and 6C illustrate a grating support with independent adjustment parameters
- FIGS. 7A, 7B and 7C relate to a slit with a symmetrical aperture.
- XX' is the rotation axis of the grating for the adjustment of its orientatin by autocollimation.
- YY' is the tilting axis of the grating.
- the plane tangential to the top of the grating must be vertical.
- the entrance slit is the vertical of the locus and the normal to the grating being in the horizontal plane.
- ZZ' is the tilting axis of the lines of the grating (the middle of all the diffracted images must be in the horizontal plane).
- the grating R is housed in a casing 12 and fixed by a plate 13 in which there is a rectangular orifice limiting the active surface of the pupil.
- the casing 12 is held in a support 14 by means of a clamp comprising a nut 15 and a spring washer 16.
- a bore made in the support 14 and a cylindrical part of the back of the casing 12 define the axis ZZ'.
- the grating R is tilted by the action of two screws tightening the part 21.
- the leaf spring 20 is gripped between the support 14 of the casing 12 and the part 21.
- the rotation of the grating lines is adjusted by means of two opposing screws 22 and 23 with screw 22 acting on the flattened part produced on cylinder portion 24 fixed to the back of the support 14 of the casing 12 of the grating R, and screw 23 acting on a flattened part of the screw 25.
- a return force is provided by the leaf spring 26.
- FIGS. 7A, 7B and 7C illustrate, in section, a slit with a symmetrical aperture.
- the casing of the slit consists of a bottom 3 and a cylindrical part 2.
- Two movable lips 4 and 5 (FIG. 7C) are held flat on the bottom 3 by a part 1.
- a control button not shown, causes translational movement of the pin 6, which, by means of the ball 8, produces a vertical thrust on the V formed by the upper part of the two movable lips 4 and 5.
- the value of the angle is chosen so that a 1.5 mm aperture of the slit corresponds to a 7.5 mm vertical displacement of the pin 6.
- a 2 micron aperture thus corresponds to a displacement of 1/100.
- the opposing force is obtained by means of a spring 9 and a ball 11 identical to the ball 8, the spring 9 being held by a part 7 fixed to the cylindrical part 2.
- the eyelets 10 (FIG. 7B) are used to adjust the verticality of the slit, which must be housed in a casing connected to the vacuum chamber of the spectral device.
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Abstract
Description
λ.sup.x -Δλ<λ.sup.x <λ.sup.x +Δλ,
λ.sup.x -Δλ<λ.sup.x <λ.sup.x +Δλ,
Δ.sub.1 (w,l)=A(w,l,R,V)φ.sub.1 (e,α,ρ.sub.o,η) [2a]
Δ.sub.2 (w,l)=B(w,l,R,V')φ.sub.2 (e',β,ρ.sub.D,δ) [2b]
Δ.sub.1 (w,l)=ΣC.sub.1 ijw.sup.i l.sup.j [ 2c]
Δ.sub.2 (w,l)=ΣC.sub.2 ijw.sup.i l.sup.j. [2d]
V≠V' sin α=-P sin η [4a]
sin β=P sin δ [4b]
V=V'=1/a (equation 3)
sin α+sin β=ρηλ.sub.o (equation 4)
r".sub.1 =Pr.sub.D. (equation 8)
r'.sub.2 =R[cotan δ sin β+cos β] (equation 9)
r.sub.D =r'.sub.2 /P (equation 9')
1/e=1-P(ρ.sub.c -1) (equation 10)
r.sub.c =r/P; r=R(1-P); P≠+1 (equation 12)
mnλ.sub.1.sup.x =sin β.sub.1.sup.x =cos δ.sub.1 =0.5432 (equation 14)
mnλ.sub.2.sup.x =sin β.sub.2.sup.x =cos δ.sub.2 =0.6077, (equation 15)
r'=R cos β.sub.2.sup.-1 =R sin δ.sub.2.sup.-1 ≅1.26R
tan β.sub.3.sup.x =-sin δ(sin δ+cos δ) (equation 16)
r'=R[cos β.sup.x -cotan δ sin β.sup.x ] (equation 19)
C[η=Or.sub.c ≅20 R]
D[δ=50.2°r.sub.d ≅4.5.10.sup.-2 R]
1/e-cos α+P[ρ.sub.c -cos η] (equation 21a)
r=Re=R[sin α cotan η+cos α]. (equation 21b-circle P.sub.1 ')
r=Re=R; e=1; α=0
r.sub.c =R/ρ.sub.c ; ρ.sub.c =1; η=0
α=0; r=Re=R(1=P).
r.sub.c =RP(P+1).sup.-1 ; η=0 e=∞; α=0 (equation 26)
T=S=S.sub.2 +S'.sub.2 +P(K.sub.2 -K.sub.2 ')
1/e-cos α+1/e, -cos β+(Q-R)(K.sub.2 -K.sub.2 ')=0 (equation 30)
sin α=Qnλ.sub.o ; sin β=-Rnλ.sub.o (equation 31) ##EQU38##
e'/e=-Γ (equation 32)
mn λ=sin α+sin β=sin α(1-Γ) (equation 34)
r'=Re'=-2 cos αeR (equation 38)
e=0.2589
ρ.sub.c sin η=3.15356; ρ.sub.c =-3.47957
ρ.sub.D =4.501556
(Ct.sup.2 +1)([c+1-c.sup.2 ]t.sup.2 +2[c-1]t-[c-1])=0 (equation 53)
V.sup.4 +2[φ.sub.1 +1]V.sup.3 +2[2C-1]V.sup.2 +2[φ.sub.1 -1]V+1=0 (equation 55)
1/e'=1+cos α+P[cos η-cos δ] (equation 56)
δ+ζ=π+2α (equation 57)
θ.sup.2.sub.V W.sup.2 cos α=3Rλ (equation 58)
1/e'=1+cos α-P cos δ (equation 60)
r'=R sin δ[sin δ+sin (δ-α)].sup.-1 (equation 61)
-cos α-cos β+P cos δ=0 (equation 63)
Claims (13)
λ.sup.x -Δλ<λ.sup.x <λ.sup.x +Δλ
λ.sup.x -Δλ<λ.sup.x <λ.sup.x +Δλ,
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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FR8213205A FR2531213A1 (en) | 1982-07-28 | 1982-07-28 | METHOD FOR FOCUSING REFERENCE WORKING HOLOGRAPHIC SPHERICAL DIFFRACTION NETWORKS, DISPERSIVE OBJECTIVES AND SPECTROMETERS USING THE SAME |
FR8213205 | 1982-07-28 |
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US4623251A true US4623251A (en) | 1986-11-18 |
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US06/517,418 Expired - Fee Related US4623251A (en) | 1982-07-28 | 1983-07-26 | Method for focusing spherical holographic diffraction gratings working by reflection, and dispersive lenses and spectrometers applying this method |
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EP (1) | EP0102272B1 (en) |
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FR (1) | FR2531213A1 (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4815849A (en) * | 1987-12-30 | 1989-03-28 | Hewlett-Packard Company | Spectrometer using concave holographic diffraction grating |
EP0413939A1 (en) * | 1989-08-24 | 1991-02-27 | Edward W. Stark | Improved grating spectrometer |
US5066127A (en) * | 1989-08-29 | 1991-11-19 | Hyperfine, Inc. | Stigmatic imaging with spherical concave diffraction gratings |
US5684582A (en) * | 1994-03-18 | 1997-11-04 | Lucid Technologies, Inc. | Spectrophotometry |
US5742389A (en) * | 1994-03-18 | 1998-04-21 | Lucid Technologies Inc. | Spectrophotometer and electro-optic module especially suitable for use therein |
WO2001079915A2 (en) * | 2000-04-18 | 2001-10-25 | University Of Manitoba | Diffraction grating in the whispering gallery mount |
US7209230B2 (en) | 2004-06-18 | 2007-04-24 | Luckoff Display Corporation | Hand-held spectra-reflectometer |
US7233394B2 (en) | 2005-06-20 | 2007-06-19 | Luckoff Display Corporation | Compact spectrometer |
US20080273231A1 (en) * | 2007-05-01 | 2008-11-06 | Reliant Technologies, Inc. | Optical Scan Engine Using Rotating Mirror Sectors |
JP2010181413A (en) * | 1998-04-29 | 2010-08-19 | Headwall Photonics Inc | Corrected concentric spectrometer |
US7817274B2 (en) | 2007-10-05 | 2010-10-19 | Jingyun Zhang | Compact spectrometer |
US8345226B2 (en) | 2007-11-30 | 2013-01-01 | Jingyun Zhang | Spectrometers miniaturized for working with cellular phones and other portable electronic devices |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2557694B1 (en) * | 1983-12-30 | 1987-03-20 | Centre Nat Rech Scient | MONOCHROMATOR WITH TELECENTRIC DISPERSITIVE OBJECTIVE |
FR2585468B1 (en) * | 1985-07-24 | 1987-11-20 | Centre Nat Rech Scient | MONOCHROMATORS WITH PLANE ARRAYS WITHOUT ABERRATIONS |
FR2643731B1 (en) * | 1989-02-27 | 1991-06-14 | Centre Nat Rech Scient | |
FR2680012B1 (en) * | 1991-07-30 | 1994-12-09 | Sextant Avionique | SPECTRAL DISPERSION DEVICE. |
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FR2124119A1 (en) * | 1971-02-08 | 1972-09-22 | Anvar | |
FR2180574A1 (en) * | 1972-04-21 | 1973-11-30 | Anvar | |
US3973850A (en) * | 1972-04-21 | 1976-08-10 | Agence Nationale De Valorisation De La Recherche (Anvar) | Focalization process of spherical concave diffraction gratings |
FR2323132A2 (en) * | 1973-02-21 | 1977-04-01 | Anvar | Concave reflecting holographic diffraction grating - is used with fixed entrance and exit slits and is rotated |
US4036558A (en) * | 1972-04-21 | 1977-07-19 | Etablissement Public: Agence Nationale De Valorisation De Recherche (Anvar) | Focalization process of spherical concave diffraction gratings |
US4241999A (en) * | 1978-08-24 | 1980-12-30 | Agence Nationale De Valorisation De La Recherche (Anvar) | Monochromators |
-
1982
- 1982-07-28 FR FR8213205A patent/FR2531213A1/en active Granted
-
1983
- 1983-07-26 EP EP83401539A patent/EP0102272B1/en not_active Expired
- 1983-07-26 US US06/517,418 patent/US4623251A/en not_active Expired - Fee Related
- 1983-07-26 DE DE8383401539T patent/DE3374712D1/en not_active Expired
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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FR2124119A1 (en) * | 1971-02-08 | 1972-09-22 | Anvar | |
FR2180574A1 (en) * | 1972-04-21 | 1973-11-30 | Anvar | |
US3973850A (en) * | 1972-04-21 | 1976-08-10 | Agence Nationale De Valorisation De La Recherche (Anvar) | Focalization process of spherical concave diffraction gratings |
US4036558A (en) * | 1972-04-21 | 1977-07-19 | Etablissement Public: Agence Nationale De Valorisation De Recherche (Anvar) | Focalization process of spherical concave diffraction gratings |
FR2323132A2 (en) * | 1973-02-21 | 1977-04-01 | Anvar | Concave reflecting holographic diffraction grating - is used with fixed entrance and exit slits and is rotated |
US4241999A (en) * | 1978-08-24 | 1980-12-30 | Agence Nationale De Valorisation De La Recherche (Anvar) | Monochromators |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0322654A2 (en) * | 1987-12-30 | 1989-07-05 | Hewlett-Packard Company | Spectrometer using concave holographic diffraction grating |
EP0322654A3 (en) * | 1987-12-30 | 1991-09-18 | Hewlett-Packard Company | Spectrometer using concave holographic diffraction grating |
US4815849A (en) * | 1987-12-30 | 1989-03-28 | Hewlett-Packard Company | Spectrometer using concave holographic diffraction grating |
EP0413939A1 (en) * | 1989-08-24 | 1991-02-27 | Edward W. Stark | Improved grating spectrometer |
US5066127A (en) * | 1989-08-29 | 1991-11-19 | Hyperfine, Inc. | Stigmatic imaging with spherical concave diffraction gratings |
US5684582A (en) * | 1994-03-18 | 1997-11-04 | Lucid Technologies, Inc. | Spectrophotometry |
US5742389A (en) * | 1994-03-18 | 1998-04-21 | Lucid Technologies Inc. | Spectrophotometer and electro-optic module especially suitable for use therein |
US5825486A (en) * | 1994-03-18 | 1998-10-20 | Lucid Technologies Inc. | Electro-optic module especially suitable for use in a spectrophotometer |
JP2010181413A (en) * | 1998-04-29 | 2010-08-19 | Headwall Photonics Inc | Corrected concentric spectrometer |
WO2001079915A2 (en) * | 2000-04-18 | 2001-10-25 | University Of Manitoba | Diffraction grating in the whispering gallery mount |
WO2001079915A3 (en) * | 2000-04-18 | 2002-08-08 | Univ Manitoba | Diffraction grating in the whispering gallery mount |
US7209230B2 (en) | 2004-06-18 | 2007-04-24 | Luckoff Display Corporation | Hand-held spectra-reflectometer |
US7233394B2 (en) | 2005-06-20 | 2007-06-19 | Luckoff Display Corporation | Compact spectrometer |
US20080273231A1 (en) * | 2007-05-01 | 2008-11-06 | Reliant Technologies, Inc. | Optical Scan Engine Using Rotating Mirror Sectors |
WO2008137601A1 (en) * | 2007-05-01 | 2008-11-13 | Reliant Technologies, Inc. | Optical scan engine using rotating mirror sectors |
US7729029B2 (en) | 2007-05-01 | 2010-06-01 | Reliant Technologies, Inc. | Optical scan engine using rotating mirror sectors |
US7817274B2 (en) | 2007-10-05 | 2010-10-19 | Jingyun Zhang | Compact spectrometer |
US8345226B2 (en) | 2007-11-30 | 2013-01-01 | Jingyun Zhang | Spectrometers miniaturized for working with cellular phones and other portable electronic devices |
US8537343B2 (en) | 2007-11-30 | 2013-09-17 | Jingyun Zhang | Spectrometer miniaturized for working with cellular phones and other portable electronic devices |
Also Published As
Publication number | Publication date |
---|---|
DE3374712D1 (en) | 1988-01-07 |
EP0102272B1 (en) | 1987-11-25 |
EP0102272A1 (en) | 1984-03-07 |
FR2531213A1 (en) | 1984-02-03 |
FR2531213B1 (en) | 1985-01-18 |
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