US4545680A - Spectroanalysis system - Google Patents
Spectroanalysis system Download PDFInfo
- Publication number
- US4545680A US4545680A US06/483,111 US48311183A US4545680A US 4545680 A US4545680 A US 4545680A US 48311183 A US48311183 A US 48311183A US 4545680 A US4545680 A US 4545680A
- Authority
- US
- United States
- Prior art keywords
- radiation
- monochromator
- analysis
- aperture
- dispersed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000005855 radiation Effects 0.000 claims abstract description 47
- 238000010521 absorption reaction Methods 0.000 claims description 3
- 230000004048 modification Effects 0.000 claims description 3
- 238000012986 modification Methods 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims 4
- 230000000694 effects Effects 0.000 claims 2
- 238000001228 spectrum Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
- G01J2003/042—Slit wheel
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/3103—Atomic absorption analysis
Definitions
- This invention relates to spectroanalysis systems and more particularly to spectroanalysis systems of the double beam type.
- spectroanalysis systems of the double beam type two beams of radiation are provided, an analysis beam that is modified by the sample to be analyzed and a reference beam that is not modified by the sample.
- a moving component such as a chopper is used to alternately close and open the two beam channels at a steady rate, a common type of chopper being a rotating shutter.
- a chopper alternately provides radiation along the reference and analysis paths such that there cannot be simultaneous measurement of the two beams which makes difficult to analyze transient events.
- Complexities are introduced by the addition of this moving component as the chopper mirror must be flat and precisely positioned relative to the axis of rotation of the chopper and to the beam axis or monochromator system axis.
- the chopper may be used with a beam splitter or two choppers which are accurately synchronized may be used.
- the use of movable members in spectroanalytical systems frequently results in loss of accuracy over a period of time.
- a spectroanalytical system of the double beam type in which radiation from a common source is split into reference and analysis beams.
- the two beams are directed along similar paths such that the analysis beam passes through an analysis region and the reference beam bypasses that analysis region.
- a monochromator is arranged with two spaced aperture regions such that one portion of one aperture region functions as an entrance aperture for the analysis beam and another portion of that aperture region functions as an exit aperture for a dispersed portion of the reference beam, and one portion of the other aperture region functions as an entrance aperture for the reference beam and another portion of that other aperture region functions as an exit aperture for a dispersed portion of the analysis beam.
- the beams exiting from the two exit apertures may be concurrently monitored and compared to compensate for errors due to source fluctuations and the like.
- a hollow cathode type radiation source is employed in an atomic absorption type of analysis system, the output beam from the source is divided by a beam splitter into reference and analysis beams that are passed along generally parallel paths that lie in a plane that is angularly offset from the monochromator axis less than one degree. While separate entrance and exit apertures may be employed, in that particular embodiment the apertures are defined by spaced elongated curved slits of a monchromator of the stigmatic type.
- the analysis beam passes through the lower portion of one slit and is dispersed into a spectrum with a portion of the dispersed spectrum being passed as an exit beam through the upper portion of the second slit.
- the reference beam passes through the lower portion of the second slit and is dispersed into a spectrum with a portion of the dispersed spectrum of the reference beam being passed as an exit beam through the upper portion of the first slit.
- the monochromator includes a masked collimating mirror and a reflection grating, and a mirror and detector assembly is supported at each slit for sensing the dispersed radiation exiting through that slit.
- FIG. 1 is a diagram of a spectroanalysis system in accordance with the invention
- FIG. 2 is a diagrammatic plan view of the spectroanalysis system shown in FIG. 1;
- FIG. 3 is a diagrammatic elevational view corresponding to the plan view of FIG. 2 and showing the analysis beam path, the reference beam detector 66 and its support being omitted from that diagram;
- FIG. 4 is a perspective view of a mirror and sensor support that is mounted at the entrance - exit slit 40 of the system shown in FIGS. 1-3.
- the spectroanalytical system shown in the diagram of FIG. 1 includes radiation source 10 in the form of a hollow cathode tube that generates a beam of radiation along part 12.
- a first (analytical) portion 14 of the radiation in beam 12 from tube 10 is passed through quartz beam splitter 16 and is focused by spherical quartz lens 18 for passage through analysis zone (flame 20 from burner 22) so that the image of the aperture of tube 10 is located in the center of flame 20.
- a second lens 24 focuses the beam of radiation that passes through flame 20 on the entrance slit 26 of stigmatic monochromator 30.
- Beam splitter 16 and mirror 32 reflect a second (reference) portion of the output beam 12 along path 34 through lenses 36, 38 for passage through a second entrance slit 40 of monochromator 30.
- slits 26 and 40 are two of a series of ten slits of graduated width that are formed in planar disc 42 of the type shown in Smith et al., U.S. Pat. No. 3,508,813.
- disc 42 comprises a copper substrate in which apertures are formed and that carries a nickel film in which five pairs of matched slits are formed along a circle that is about 6.8 centimeters in diameter, the slits being of equal length (about 1.7 centimeters), and graduated in width from ten microns to four-hundred microns to permit slit width adjustability by rotation of disc 42. It will be apparent, of course, that other slit arrangements may be used.
- Monochromator 30 includes collimating mirror 50 with an aligned mask 52 that has aperture 54 aligned with the analysis beam 14 of radiation that passes through the lower portion of slit 26 and aperture 56 aligned with the reference beam 34 of radiation that passes through the lower portion of slit 40; and a dispersing element 60 in the form of a reflection grating mounted for rotation about an axis perpendicular to axis 44 of the monochromator.
- Dispersed radiation from reference beam 34 exits along path 64 through the upper portion of slit 26 and is reflected by mirror 62 mounted adjacent the upper portion of slit 26 along path 65 to photosensor 66.
- dispersed radiation from analysis beam 14 exits along path 70 through the upper portion of slit 40 and is reflected by mirror 68 mounted adjacent the upper portion of slit 40 along path 71 to sensor 72.
- Monochromator 30 is of the Ebert type and of 1/3 meter focal length.
- the entrance beams 14, 34 are each located at an angle of twelve minutes below the monochromator axis 44 and the exit beams 64, 70 are similarly each located at a corresponding similar angle above the monochromator axis 44 as indicated in FIG. 3.
- the beams 14 and 34 are spaced about nine centimeters apart at beam splitter 16 and mirror 32.
- Each mirror 62, 68 is mounted on a support 74, 76 respectively that is fastened to housing 78 for slit disc 42.
- analysis beam 14 enters monochromator 30 through the lower part of slit 26 and, after dispersion, exits in beam 70 through the upper part of slit 40 for sensing by photomultiplier tube 72, as indicated in FIG. 3.
- reference beam 34 enters monochromator 30 through the lower part of slit 40 and a correspondingly dispersed component (beam 64) exits through the upper portion of slit 26 for concurrent sensing by photomultiplier tube 66.
- each support member 74, 76 is of aluminum and has a planar face 80 that is fastened against a face of housing 78 by fasteners which are received in threaded holes 82, face 80 having a height of about three centimeters and a width of about three centimeters.
- Formed in face 80 is an elongated opening that has an upper portion 84, a lower portion 86 and a slot 88 that is about 0.8 millimeter in width.
- Each opening 84, 86 has a width of about 0.6 centimeter and a height of about one centimeter.
- Channel 90 extends rearwardly from opening 86 through support 76 (a length of about 21/2 centimeters) to the rear surface and provides a passage for entrance beam 34.
- a baffle plate (not shown in FIG. 4) has one edge received in slot 88 and is seated on surface 92 to define the upper boundary of channel 90.
- a similar channel 94 extends rearwardly from upper opening 84 to surface 96 that is disposed at an angle of sixty degrees to face 80 and against which mirror 68 is fastened. Cylindrical surface 98 of about two centimeters radius is formed in the rear of block 76 and photosensor 72 is seated against that surface.
- a third channel 100 extends from channel 94 to the curved surface 98 along a path that is disposed in an angle of thirty degrees to face 80 and provides a path for the exit beam 71 (reflected at 102 by mirror 68) to sensor 72.
- the beam of radiation from tube 10 is divided by beam splitter 16 into analysis beam 14 and reference beam 34.
- the beams 14, 34 are directed along similar paths (analysis beam 14 passing through burner flame 20) and the beams pass through the lower portions of entrance slit 26, 40 respectively.
- Each beam is collimated by mirror 50 and dispersed into a spectrum by grating 60 with a portion of each resulting spectrum being directed along an exit path 70, 64 respectively through the upper portions of slits 40, 26 respectively, and then reflected by its respective mirror 68, 62 for concurrent sensing by the respective photomultipliers 72, 66.
- a double beam spectroanalytical system that does not require a chopper mechanism.
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (18)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/483,111 US4545680A (en) | 1983-04-08 | 1983-04-08 | Spectroanalysis system |
DE8484102550T DE3473925D1 (en) | 1983-04-08 | 1984-03-09 | Spectroanalysis system |
EP84102550A EP0122441B1 (en) | 1983-04-08 | 1984-03-09 | Spectroanalysis system |
JP59070733A JPS59197836A (en) | 1983-04-08 | 1984-04-09 | Spectroscopic analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/483,111 US4545680A (en) | 1983-04-08 | 1983-04-08 | Spectroanalysis system |
Publications (1)
Publication Number | Publication Date |
---|---|
US4545680A true US4545680A (en) | 1985-10-08 |
Family
ID=23918702
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US06/483,111 Expired - Fee Related US4545680A (en) | 1983-04-08 | 1983-04-08 | Spectroanalysis system |
Country Status (4)
Country | Link |
---|---|
US (1) | US4545680A (en) |
EP (1) | EP0122441B1 (en) |
JP (1) | JPS59197836A (en) |
DE (1) | DE3473925D1 (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992001921A1 (en) * | 1990-07-17 | 1992-02-06 | Rainin Instrument Co., Inc. | A high performance absorbance detector with flashlamp and compact folded optics system |
DE4223211A1 (en) * | 1992-07-15 | 1994-01-20 | Bodenseewerk Perkin Elmer Co | Two-beam grating polychromator with measurement and control beam paths - has symmetrical arrangement of adjacent inlet apertures and detector array, and curved mirrors, for reflecting beams towards and receiving beams from grating |
US5483337A (en) * | 1994-10-19 | 1996-01-09 | Barnard; Thomas W. | Spectrometer with selectable radiation from induction plasma light source |
US5642190A (en) * | 1995-09-01 | 1997-06-24 | Thermo Jarrell Ash Corp. | Dual-axis plasma imaging system for use in spectroscopic analysis |
US5699156A (en) * | 1994-11-23 | 1997-12-16 | Carver; David R. | Spectrophotometer apparatus with dual light sources and optical paths, fiber optic pick-up and sample cell therefor |
US5969812A (en) * | 1995-10-18 | 1999-10-19 | Carver; David R. | Spectrophotometer apparatus with dual concentric beams and fiber optic beam splitter |
US6151111A (en) * | 1994-04-15 | 2000-11-21 | Molecular Devices Corporation | Photometric device |
US6204919B1 (en) * | 1993-07-22 | 2001-03-20 | Novachem Bv | Double beam spectrometer |
US6222626B1 (en) * | 1997-09-12 | 2001-04-24 | Bodenseewerk Perkin-Elmer Gmbh | Atomic absorption spectrometer |
US20030197861A1 (en) * | 2002-02-22 | 2003-10-23 | Radziuk Bernhard H. | Atom absorption spectroscopy method and atom absorption spectrometer |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4678917A (en) * | 1985-02-19 | 1987-07-07 | The Perkin-Elmer Corporation | Instantaneous reading multichannel polychromatic spectrophotometer method and apparatus |
US5039855A (en) * | 1990-03-05 | 1991-08-13 | Bran+Luebbe Analyzing Technologies, Inc. | Dual beam acousto-optic tunable spectrometer |
Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2750836A (en) * | 1954-07-27 | 1956-06-19 | Leeds & Northrup Co | Monochromator system for spectrochemical analysis |
US2975669A (en) * | 1954-08-26 | 1961-03-21 | Jarrell Ash Company | Crossed dispersion photographic spectrometer |
US3102155A (en) * | 1955-02-16 | 1963-08-27 | Technicon Instr | Background compensation for spectrometers used in quantitative spectrochemical studies |
US3229563A (en) * | 1961-02-27 | 1966-01-18 | Perkin Elmer Corp | Plural grating scanning system |
US3247759A (en) * | 1962-03-06 | 1966-04-26 | Cons Electrodynamics Corp | Spectrometer with multiple entrance slits |
GB1103320A (en) * | 1965-10-08 | 1968-02-14 | Atomic Energy Authority Uk | Improvements in or relating to spectrometric apparatus |
US3503686A (en) * | 1965-05-28 | 1970-03-31 | Commw Scient Ind Res Org | Atomic absorption spectrophotometer |
US3508813A (en) * | 1967-03-24 | 1970-04-28 | Instrumentation Labor Inc | Adjustable slit system for use in spectroanalysis apparatus |
US3586441A (en) * | 1967-07-12 | 1971-06-22 | Instrumentation Labor Inc | Atomic absorption spectroanalysis system |
US3645629A (en) * | 1969-07-03 | 1972-02-29 | Technicon Corp | Apparatus for spectroscopic analysis with modulated electrodeless discharge tube |
US3689158A (en) * | 1971-02-16 | 1972-09-05 | Beckman Instruments Inc | Atomic absorption analyzer compensated for background absorption |
US3735565A (en) * | 1971-05-06 | 1973-05-29 | Wilks Scientific Corp | Enrichment of chromatograph output |
US3825344A (en) * | 1971-09-14 | 1974-07-23 | Commissariat Energie Atomique | Device for analysing a substance by atomic absorption with background correction |
US3924950A (en) * | 1974-09-16 | 1975-12-09 | Perkin Elmer Corp | Atomic absorption spectroscopy with background correction |
US3937576A (en) * | 1974-04-08 | 1976-02-10 | Beckman Instruments G.M.B.H. | Illumination system for an atomic absorption spectral photometer |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1118969A (en) * | 1965-10-27 | 1968-07-03 | Parsons & Co Sir Howard G | Improvements in and relating to monochromators |
JPS4931152A (en) * | 1972-07-20 | 1974-03-20 | ||
JPS576989Y2 (en) * | 1975-07-22 | 1982-02-09 |
-
1983
- 1983-04-08 US US06/483,111 patent/US4545680A/en not_active Expired - Fee Related
-
1984
- 1984-03-09 DE DE8484102550T patent/DE3473925D1/en not_active Expired
- 1984-03-09 EP EP84102550A patent/EP0122441B1/en not_active Expired
- 1984-04-09 JP JP59070733A patent/JPS59197836A/en active Pending
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2750836A (en) * | 1954-07-27 | 1956-06-19 | Leeds & Northrup Co | Monochromator system for spectrochemical analysis |
US2975669A (en) * | 1954-08-26 | 1961-03-21 | Jarrell Ash Company | Crossed dispersion photographic spectrometer |
US3102155A (en) * | 1955-02-16 | 1963-08-27 | Technicon Instr | Background compensation for spectrometers used in quantitative spectrochemical studies |
US3229563A (en) * | 1961-02-27 | 1966-01-18 | Perkin Elmer Corp | Plural grating scanning system |
US3247759A (en) * | 1962-03-06 | 1966-04-26 | Cons Electrodynamics Corp | Spectrometer with multiple entrance slits |
US3503686A (en) * | 1965-05-28 | 1970-03-31 | Commw Scient Ind Res Org | Atomic absorption spectrophotometer |
GB1103320A (en) * | 1965-10-08 | 1968-02-14 | Atomic Energy Authority Uk | Improvements in or relating to spectrometric apparatus |
US3508813A (en) * | 1967-03-24 | 1970-04-28 | Instrumentation Labor Inc | Adjustable slit system for use in spectroanalysis apparatus |
US3586441A (en) * | 1967-07-12 | 1971-06-22 | Instrumentation Labor Inc | Atomic absorption spectroanalysis system |
US3645629A (en) * | 1969-07-03 | 1972-02-29 | Technicon Corp | Apparatus for spectroscopic analysis with modulated electrodeless discharge tube |
US3689158A (en) * | 1971-02-16 | 1972-09-05 | Beckman Instruments Inc | Atomic absorption analyzer compensated for background absorption |
US3735565A (en) * | 1971-05-06 | 1973-05-29 | Wilks Scientific Corp | Enrichment of chromatograph output |
US3825344A (en) * | 1971-09-14 | 1974-07-23 | Commissariat Energie Atomique | Device for analysing a substance by atomic absorption with background correction |
US3937576A (en) * | 1974-04-08 | 1976-02-10 | Beckman Instruments G.M.B.H. | Illumination system for an atomic absorption spectral photometer |
US3924950A (en) * | 1974-09-16 | 1975-12-09 | Perkin Elmer Corp | Atomic absorption spectroscopy with background correction |
Non-Patent Citations (4)
Title |
---|
Fastie, W. G., "Image Forming Properties of the Ebert Monochromator," Journal of the Optical Society of America, V. 42, No. 9, p. 649. |
Fastie, W. G., Image Forming Properties of the Ebert Monochromator, Journal of the Optical Society of America, V. 42, No. 9, p. 649. * |
Perkin Elmer Models 290B and 303 Atomic Absorption Spectrophotometers, Nov. 22, 1968 (brochure). * |
Perkin-Elmer Models 290B and 303 Atomic Absorption Spectrophotometers, Nov. 22, 1968 (brochure). |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5148239A (en) * | 1990-07-17 | 1992-09-15 | Rainin Instrument Co., Inc. | High performance absorbance detector with flashlamp and compact folded optics system |
WO1992001921A1 (en) * | 1990-07-17 | 1992-02-06 | Rainin Instrument Co., Inc. | A high performance absorbance detector with flashlamp and compact folded optics system |
DE4223211C2 (en) * | 1992-07-15 | 1999-03-04 | Bodenseewerk Perkin Elmer Co | Double-beam lattice polychromator |
DE4223211A1 (en) * | 1992-07-15 | 1994-01-20 | Bodenseewerk Perkin Elmer Co | Two-beam grating polychromator with measurement and control beam paths - has symmetrical arrangement of adjacent inlet apertures and detector array, and curved mirrors, for reflecting beams towards and receiving beams from grating |
US6204919B1 (en) * | 1993-07-22 | 2001-03-20 | Novachem Bv | Double beam spectrometer |
US6151111A (en) * | 1994-04-15 | 2000-11-21 | Molecular Devices Corporation | Photometric device |
US5483337A (en) * | 1994-10-19 | 1996-01-09 | Barnard; Thomas W. | Spectrometer with selectable radiation from induction plasma light source |
US5699156A (en) * | 1994-11-23 | 1997-12-16 | Carver; David R. | Spectrophotometer apparatus with dual light sources and optical paths, fiber optic pick-up and sample cell therefor |
US5642190A (en) * | 1995-09-01 | 1997-06-24 | Thermo Jarrell Ash Corp. | Dual-axis plasma imaging system for use in spectroscopic analysis |
US5969812A (en) * | 1995-10-18 | 1999-10-19 | Carver; David R. | Spectrophotometer apparatus with dual concentric beams and fiber optic beam splitter |
US6222626B1 (en) * | 1997-09-12 | 2001-04-24 | Bodenseewerk Perkin-Elmer Gmbh | Atomic absorption spectrometer |
US20030197861A1 (en) * | 2002-02-22 | 2003-10-23 | Radziuk Bernhard H. | Atom absorption spectroscopy method and atom absorption spectrometer |
US6977725B2 (en) * | 2002-02-22 | 2005-12-20 | Perkinelmer Singapore Pte. Ltd. | Atom absorption spectroscopy method and atom absorption spectrometer |
US20060066849A1 (en) * | 2002-02-22 | 2006-03-30 | Radziuk Bernhard H | Atom absorption spectroscopy method and atom absorption spectrometer |
US7167238B2 (en) | 2002-02-22 | 2007-01-23 | Perkinelmer Singapore Pte. Ltd. | Atom absorption spectroscopy method and atom absorption spectrometer |
Also Published As
Publication number | Publication date |
---|---|
EP0122441A2 (en) | 1984-10-24 |
JPS59197836A (en) | 1984-11-09 |
EP0122441B1 (en) | 1988-09-07 |
DE3473925D1 (en) | 1988-10-13 |
EP0122441A3 (en) | 1985-06-19 |
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Legal Events
Date | Code | Title | Description |
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AS | Assignment |
Owner name: INSTRUMENTATION LABORATORY INC., LEXINGTON, MA., A Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:SMITH, STANLEY B. JR.;REEL/FRAME:004115/0368 Effective date: 19830401 |
|
AS | Assignment |
Owner name: ALLIED CORPORATION COLUMBIA ROAD AND PARK AVE., MO Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:INSTRUMENTATION LABORATORY INC., A DE CORP;REEL/FRAME:004211/0801 Effective date: 19840103 |
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AS | Assignment |
Owner name: THERMO JARRELL ASH CORPORATION, WALTHAM, MA A CORP Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:ALLIED CORPORATION, A CORP. OF NY;REEL/FRAME:004708/0154 Effective date: 19870421 |
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REMI | Maintenance fee reminder mailed | ||
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Year of fee payment: 4 |
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