US3450867A - Estimated tap temperature calculator for basic oxygen furnace - Google Patents

Estimated tap temperature calculator for basic oxygen furnace Download PDF

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Publication number
US3450867A
US3450867A US534043A US3450867DA US3450867A US 3450867 A US3450867 A US 3450867A US 534043 A US534043 A US 534043A US 3450867D A US3450867D A US 3450867DA US 3450867 A US3450867 A US 3450867A
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United States
Prior art keywords
signal
carbon
bath
temperature
tap
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Expired - Lifetime
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US534043A
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English (en)
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Bernard Blum
John W Schwartzenberg
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Leeds and Northrup Co
Phillips Petroleum Co
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Leeds and Northrup Co
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/48—Analogue computers for specific processes, systems or devices, e.g. simulators
    • G06G7/58—Analogue computers for specific processes, systems or devices, e.g. simulators for chemical processes ; for physico-chemical processes; for metallurgical processes
    • C—CHEMISTRY; METALLURGY
    • C21—METALLURGY OF IRON
    • C21C—PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C5/00—Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
    • C21C5/28—Manufacture of steel in the converter
    • C21C5/30—Regulating or controlling the blowing
    • C—CHEMISTRY; METALLURGY
    • C21—METALLURGY OF IRON
    • C21C—PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C5/00—Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
    • C21C5/28—Manufacture of steel in the converter
    • C21C5/42—Constructional features of converters
    • C21C5/46—Details or accessories
    • C21C5/4673—Measuring and sampling devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer

Definitions

  • This invention relates to a method and means for calculating that temperature of the bath in a basic oxygen furnace which is to be anticipated at the time when the heat is ready for tapping and more particularly, the means and methods for calculating the estimated tap temperature from existing values of process variables and the carbon content desired at tapping.
  • a calculation of the estimated tap temperature during the process is capable of providing a very useful indication so that the operator may take any necessary steps to modify the temperature of the bath so as toproduce a suitable tapping temperature at the time when the desired tap carbon has been reached.
  • the present invention in one form, provides means for producing a bath temperature signal which is representative of the existing bath temperature. There is also produced a tap carbon signal representative of the temperature change which would be associated with the oxidation of the amount of carbon which is desired as the remaining carbon content of the bath after the refining process. The tapcarbon signal is subtracted from a bath carbon signal which is produced to be representative of the temperature change which would be associated with the existing bath carbon content. The difference between the bath carbon and tap carbon signals is then added to the 'bath temperature signal to obtain the estimated tap temperature.
  • FIG. 1 is a block diagram showing a circuit which is useful in obtaining the estimated tap temperature during high carbon heats.
  • FIG. 2 is a modification of the circuit of FIG. 1 utilizing a different means for obtaining the signal representative of the temperature change associated with the bath carbon content.
  • FIG. 3 is still another variation of FIG. 1 showing an alternative but preferred means for producing the signal representative of the temperature change associated with the bath carbon content as 'well as a preferred form for obtaining the signal representative of the temperature change associated with the tap carbon content.
  • the estimated tap temperature indication is obtained by combining several signals.
  • the first of these signals is obtained from the bath temperature computer 10 which may be any one of a number of computer arrangements designed to continuously determine during the process the temperature (TB) of the bath.
  • the computer 10 puts out a signal on line 12 which is indicative of the bath temperature.
  • the second signal which is utilized in calculating the estimated tap temperature is derived from the bath carbon (CB) computer 14 which is designed to continuously determine the carbon content of the bath in the basic oxygen furnace during the processing procedure.
  • An output Signal from the bath carbon computer is produced on line 16.
  • This bath carbon signal is preferably representative of the temperature change which would be effected in the bath if the amount of carbon calculated to be con tained in the bath by computer 14 were combined with the oxygen introduced into the bath by the lance.
  • the third signal which is necessary for the calculation of the estimated tap temperature is produced in FIG. 1 by the adjustment of adjustable contact 18A on potentiometer slidewire 18 by knob 18B so as to vary the potential on the output line 20 linearly with the movement of the knob 18B.
  • the potentiometer slidewire 18 has its upper terminal connected to a potential source E and its lower terminal connected to ground.
  • a tap carbon signal which is representative of the temperature change which would be effected by the combination of the amount of carbon which is desired as the remaining content in the steel at time of tapping with the oxygen supplied by the lance, or in other words, it is the temperature equivalent of the tap carbon for the bath in the basic oxygen furnace.
  • the signals on lines 12, 16 and 20 are introduced as input signals into an amplifier 22, the signals on line 12 and 16 being added while the signal on line 20 subtracts from the sum thus obtained. There is thus produced an output from amplifier 22 on line 24 which is a composite signal supplied to the indicator 26 and representative of the estimated tap temperature.
  • the circuit diagram shown in block form in FIG. 1 is particularly useful in determining the estimated tap temperature for high carbon heats. Such heats do not usually involve the production of a large amount of slag FeO and therefore the signal on line 16 can be a linear function of the carbon content calculated for the bath and the signal on line 20 can be a linear function of the tap carbon value set by knob 18B. Both the bath carbon signal and the tap carbon signal as established by computer 14 and the potentiometer 18 respectively are in terms of points of carbon so that the signals provided on lines 16 and 20, respectively, are independent of the bath weight.
  • the bath temperature computer may be any one of a number of computers designed to continuously compute the temperature of the bath.
  • One example of such a computer is disclosed in our co-pending US. application Ser. No. 444,014.
  • a means for computing the bath carbon which means could be utilized as the bath carbon computer 14 of FIG. 1.
  • the bath carbon could be computed in a manner disclosed in U.S. Patent 3,181,343 issued to J. D. Fillon on May 4, 1965.
  • FIG. 2 the bath temperature computer 10 is similar to that described for FIG. 1 and it produces on its output line 12 a signal comparable to that produced in FIG. 1.
  • the tap carbon setting as established by the adjustment of knob 18B to adjust the variable contact 18A on potentiometer slidewire 18 is similar to that shown in FIG. 1 where the potentiometer slidewire 18 has its upper terminal connected to a potential source E and its lower terminal connected to ground.
  • PG function generator
  • the function generator 30 has a characteristic such as shown in the block 30 so as to produce on its output line 32 a tap carbon signal representative of the temperature change associated with the tap carbon content as established by the setting of knob 18B.
  • the non-linearity introduced by the function generator 30 in establishing a signal on line 32 is necessary because of the non-linear relationship between the carbon content of the bath and the associated temperature change. This non-linearity is the result of the amount of heat which is released due to the production of FeO in the slag on the bath. Since a considerable amount of slag will be made during the production of the low carbon heat, this non-linearity is an important factor in relating the carbon content of the bath to an associated temperature change.
  • a different means is utilized for producing the bath carbon signal to amplifier 22. That signal is to be representative of the temperature change associated with the bath carbon content and in FIG. 2 this is produced from two signals indicative of different process conditions.
  • the first of those two process condition signals is that produced by the carbon loss rate (CLR) computer 36 which is designed to produce on its output line 38 a signal indicative of the rate at which carbon is being lost from the bath of the basic oxygen furnace.
  • the CLR computer 36 may be of the type disclosed in our co-pending application Ser. No. 444,014 filed on Mar. 30, 1965.
  • the other signal source which is necessary to determine the temperature equivalent of the bath carbon content is a measurement of the lance oxygen fiow, which is shown as being obtained by a flowmeter indicated as block 40 in FIG. 2.
  • the output of the flowmeter on line 42 is thus a signal representative of the oxygen flow in the lance of the furnace.
  • the signal on line 38 is divided by the signal on line 42 in the dividing network shown as the block 44.
  • the divider 44 then produces an output on line 46 representative of the carbon removal efficiency (CRE).
  • the carbon removal efliciency signal on line 46 provides an input to a function generator 48 having a characteristic similar to that illustrated in the block.
  • the function generator in turn produces on its output line 50 a signal which is indicative of the bath carbon. That signal can be introduced through line 52 to an indicator 54 so as to indicate on a linear scale the bath carbon content.
  • the linearity of the scale is possible on indicator 54 because of the non-linear function introduced by function generator 48. Since normally the carbon removal efficiency signal, as introduced on line 46, has a non-linear relationship with the carbon content of the bath in the low carbon range, an accurate indication in that range can be obtained.
  • the input signals to an amplifier 22 representative of the bath temperature and the temperature change associated with the bath carbon content are summed and from that value is subtracted a signal representative of the temperature change associated with the tap carbon content, namely that signal which appears on line 32.
  • the amplifier 22 produces on its output line 24 a composite signal which is introduced into the indicator 26, similar to that of FIG. 1 to introduce an indication of the estimated tap temperature.
  • FIG. 3 Still another and a preferred embodiment of this invention, particularly for the production of an indication of the estimated tap temperature during the processing of a low carbon heat, is shown in FIG. 3.
  • the bath temperature computer 10 produces a bath temperature signal on line 12 which is introduced into amplifier 22 much as described previously for FIG. 1 and FIG. 2.
  • the tap carbon signal on line 32 which is also introduced in amplifier 22 is produced in a different fashion than that shown in FIG. 2.
  • a potentiometer arrangement which would give a linear relationship between the adjustment of the adjusting knob, such as knob 18B of FIG.
  • a non-linear potentiometer arrangement which consists of a fixed resistor 60 having one terminal connected to a potential source E and its other terminal connected to one terminal of potentiometer resistor 18 whose variable tap 18A is adjusted by knob 18B.
  • the variable tap 18A is connected by line 62 to line 32 which also connects to the point at which the resistor 60 and the potentiometer resistor 18 join, namely junction 64.
  • the tap carbon signal in the form of the potential which is provided on line 32 will have a non-linear relationship to the adjustment of the knob 18B so as to make unnecessary the inclusion of the function generator such as function generator 30 of FIG. 2, a non-linearity being introduced in the potentiometer arrangement itself, so that the signal provided on line 32 is representative of the temperature change associated with the tap carbon content.
  • FIG. 3 there is also provided a variation in the manner in which the bath carbon signal representative of the temperature change associated with the bath carbon content is produced.
  • the carbon loss rate computer 36 and the measurement of the lance oxygen flow by flowmeter 40 is similar to that described in FIG. 2.
  • Each of these elements produces its associated output on lines 38 and 42 respectively to the dividing network 44 which is similar to that of FIG. 2.
  • the dividing network 44 divides the signal produced on line 38 by that produced on line 42 so as to produce on its output line 46 a signal indicative of the carbon removal efliciency.
  • This signal is likewise representative of the temperature change associated with the bath carbon content and is therefore introduced as one of the signals forming an input into amplifier 22.
  • the carbon removal efliciency signal appearing on line 46 is also introduced by way of line 68 into indictor 69 for indicating the bath carbon content (CB).
  • CB bath carbon content
  • the scale on indicator 69 is in terms of points of carbon in the bath and is a nonlinear scale. In fact, the scale is substantially logarithmic in character so that it provides easily read scale divisions in the lower carbon regions where it is most useful.
  • the amplifier 22 serves to sum the signals on lines '12 and 46 and to subtract from that sum the signal appearing on line 32 so as to produce an output signal on line '24 to the indicator 26 which then provides the indication of the estimated tap temperature much as described with regard to FIGS. 1 and 2.
  • Apparatus for computing an estimated tap temperature for the bath of a basic oxygen furnance comprising means for producing a bath temperature signal representative of the existing bath temperature
  • said means for producing said tap carbon signal includes a linearly adjustable source for providing a signal representing the desired tap carbon content of the bath, and
  • a function generator in circuit with said source for modifying said last named signal so as to provide another signal representing the temperature change associated with said desired tap carbon content.
  • Apparatus as set forth in claim 1 in which said means for producing said bath carbon signal includes means for producing a signal representative of the carbon loss rate from said furnace,
  • a first function generator means responsive to said carbon removal efliciency signal for producing a signal linearly related to the bath carbon content
  • a second function generator means responsive to the output of said first function generator means for producing a signal representative of the temperature change associated with said bath carbon content.
  • said means for producing said tap carbon signal includes a linearly adjustable source for providing a signal representing the desired tap carbon content of the bath, and
  • a function generator in circuit with said source for modifying said last named signal so as to provide another signal representing the temperature change associated with said desired tap carbon content.
  • said means for producing said tap carbon signal includes an adjustable non-linear source for providing a signal representing the temperature change associated with said desired tap carbon content.
  • said means for producing said tap carbon signal includes an adjustable non-linear source for providing a signal representing the temperature change associated with said desired tap carbon.
  • Apparatus for computing an estimated tap temperature of the bath of a basic oxygen furnace comprising means for producing a bath temperature signal representative of the existing bath temperature
  • the method of calculating the estimated tap temperature of a basic oxygen furnace which comprises the steps of producing a bath temperature signal representative of the temperature of the bath of said furnace,

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
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US534043A 1966-03-14 1966-03-14 Estimated tap temperature calculator for basic oxygen furnace Expired - Lifetime US3450867A (en)

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US (1) US3450867A (en, 2012)
BE (1) BE690810A (en, 2012)
DE (1) DE1533937B1 (en, 2012)
ES (1) ES334356A1 (en, 2012)
FR (1) FR1501690A (en, 2012)
GB (1) GB1102847A (en, 2012)
SE (1) SE308535B (en, 2012)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641444A (en) * 1970-09-01 1972-02-08 Atomic Energy Commission Baseline compensating integrator
US3837841A (en) * 1971-03-25 1974-09-24 Vacmetal Gmbh Process for controlled removal of carbon under vacuum from highly alloyed steels
DE2724186A1 (de) * 1976-05-27 1977-12-08 Sumitomo Bakelite Co Verfahren und vorrichtung zur herstellung eines formstuecks durch warmformen
US7603249B1 (en) * 2006-04-19 2009-10-13 Darryl Walker Semiconductor device having variable parameter selection based on temperature and test method
US20110044119A1 (en) * 2006-04-19 2011-02-24 Walker Darryl G Semiconductor Device having variable parameter selection based on temperature and test method
US9194754B2 (en) 2014-03-28 2015-11-24 Darryl G. Walker Power up of semiconductor device having a temperature circuit and method therefor
US9286991B1 (en) 2015-02-17 2016-03-15 Darryl G. Walker Multi-chip non-volatile semiconductor memory package including heater and sensor elements
US9645191B2 (en) 2014-08-20 2017-05-09 Darryl G. Walker Testing and setting performance parameters in a semiconductor device and method therefor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3100699A (en) * 1959-09-11 1963-08-13 Huettenwerk Oberhausen Ag Control system and process for refining metals
US3181343A (en) * 1961-08-05 1965-05-04 Siderurgie Fse Inst Rech Method and arrangement for measuring continuously the change of the carbon content of a bath of molten metal
US3218158A (en) * 1962-03-14 1965-11-16 Siderurgie Fse Inst Rech Method of controlling the exhaust of gases from a metal refining bath
US3329495A (en) * 1963-09-26 1967-07-04 Yawata Iron & Steel Co Process for measuring the value of carbon content of a steel bath in an oxygen top-blowing converter
US3372023A (en) * 1964-05-23 1968-03-05 Beteiligungs & Patentverw Gmbh Method of monitoring and controlling the oxygen blowing process
US3377158A (en) * 1965-04-28 1968-04-09 Jones & Laughlin Steel Corp Converter control systems and methods

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1149034B (de) * 1961-02-18 1963-05-22 Max Planck Inst Eisenforschung Einrichtung zum thermoelektrischen Messen des Temperaturverlaufes beim Frischen von Roheisen z. B. in Konvertern

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3100699A (en) * 1959-09-11 1963-08-13 Huettenwerk Oberhausen Ag Control system and process for refining metals
US3181343A (en) * 1961-08-05 1965-05-04 Siderurgie Fse Inst Rech Method and arrangement for measuring continuously the change of the carbon content of a bath of molten metal
US3218158A (en) * 1962-03-14 1965-11-16 Siderurgie Fse Inst Rech Method of controlling the exhaust of gases from a metal refining bath
US3329495A (en) * 1963-09-26 1967-07-04 Yawata Iron & Steel Co Process for measuring the value of carbon content of a steel bath in an oxygen top-blowing converter
US3372023A (en) * 1964-05-23 1968-03-05 Beteiligungs & Patentverw Gmbh Method of monitoring and controlling the oxygen blowing process
US3377158A (en) * 1965-04-28 1968-04-09 Jones & Laughlin Steel Corp Converter control systems and methods

Cited By (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641444A (en) * 1970-09-01 1972-02-08 Atomic Energy Commission Baseline compensating integrator
US3837841A (en) * 1971-03-25 1974-09-24 Vacmetal Gmbh Process for controlled removal of carbon under vacuum from highly alloyed steels
DE2724186A1 (de) * 1976-05-27 1977-12-08 Sumitomo Bakelite Co Verfahren und vorrichtung zur herstellung eines formstuecks durch warmformen
US8308359B2 (en) 2006-04-19 2012-11-13 Intellectual Ventures Holding 83 LLC Semiconductor device having variable parameter selection based on temperature and test method
US9766135B2 (en) 2006-04-19 2017-09-19 Nytell Software LLC Semiconductor device having variable parameter selection based on temperature and test method
US20110046912A1 (en) * 2006-04-19 2011-02-24 Walker Darryl G Semiconductor Device having variable parameter selection based on temperature and test method
US20110044118A1 (en) * 2006-04-19 2011-02-24 Walker Darryl G Semiconductor Device having variable parameter selection based on temperature and test method
US20110044119A1 (en) * 2006-04-19 2011-02-24 Walker Darryl G Semiconductor Device having variable parameter selection based on temperature and test method
US20110044372A1 (en) * 2006-04-19 2011-02-24 Walker Darryl G Semiconductor Device having variable parameter selection based on temperature and test method
US7953573B2 (en) 2006-04-19 2011-05-31 Agersonn Rall Group, L.L.C. Semiconductor device having variable parameter selection based on temperature and test method
US8005641B2 (en) 2006-04-19 2011-08-23 Agersonn Rall Group, L.L.C. Temperature sensing circuit with hysteresis and time delay
US8040742B2 (en) 2006-04-19 2011-10-18 Agersonn Rall Group, L.L.C. Semiconductor device having variable parameter selection based on temperature and test method
US8049145B1 (en) 2006-04-19 2011-11-01 Agerson Rall Group, L.L.C. Semiconductor device having variable parameter selection based on temperature and test method
US8081532B2 (en) 2006-04-19 2011-12-20 Intellectual Ventures Holding 83 LLC Semiconductor device having variable parameter selection based on temperature and test method
US7603249B1 (en) * 2006-04-19 2009-10-13 Darryl Walker Semiconductor device having variable parameter selection based on temperature and test method
US8497453B2 (en) 2006-04-19 2013-07-30 Intellectual Ventures Holding 83 LLC Semiconductor device having variable parameter selection based on temperature
US10656028B2 (en) 2006-04-19 2020-05-19 Samsung Electronics Co., Ltd. Semiconductor device having variable parameter selection based on temperature and test method
US20110037138A1 (en) * 2006-04-19 2011-02-17 Walker Darryl G Semiconductor Device having variable parameter selection based on temperature and test method
US9274007B2 (en) 2014-03-28 2016-03-01 Darryl G. Walker Semiconductor device having temperature sensor circuits
US9772232B2 (en) 2014-03-28 2017-09-26 Darryl G. Walker Semiconductor device having temperature sensor circuit that detects a temperature range upper limit value and a temperature range lower limit value
US9810585B2 (en) 2014-03-28 2017-11-07 Darryl G. Walker Semiconductor device having a temperature circuit that provides a plurality of temperature operating ranges
US9939330B2 (en) 2014-03-28 2018-04-10 Darryl G. Walker Semiconductor device having subthreshold operating circuits including a back body bias potential based on temperature range
US9194754B2 (en) 2014-03-28 2015-11-24 Darryl G. Walker Power up of semiconductor device having a temperature circuit and method therefor
US9645191B2 (en) 2014-08-20 2017-05-09 Darryl G. Walker Testing and setting performance parameters in a semiconductor device and method therefor
US9658277B2 (en) 2014-08-20 2017-05-23 Darryl G. Walker Testing and setting performance parameters in a semiconductor device and method therefor
US10006959B2 (en) 2014-08-20 2018-06-26 Darryl G. Walker Testing and setting performance parameters in a semiconductor device and method therefor
US9286991B1 (en) 2015-02-17 2016-03-15 Darryl G. Walker Multi-chip non-volatile semiconductor memory package including heater and sensor elements
US9613719B1 (en) 2015-02-17 2017-04-04 Darryl G. Walker Multi-chip non-volatile semiconductor memory package including heater and sensor elements
US9928925B1 (en) 2015-02-17 2018-03-27 Darryl G. Walker Multi-chip non-volatile semiconductor memory package including heater and sensor elements
US10141058B1 (en) 2015-02-17 2018-11-27 Darryl G. Walker Multi-chip non-volatile semiconductor memory package including heater and sensor elements

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Publication number Publication date
FR1501690A (fr) 1967-11-10
GB1102847A (en) 1968-02-14
BE690810A (en, 2012) 1967-05-16
ES334356A1 (es) 1967-10-16
DE1533937B1 (de) 1971-12-09
SE308535B (en, 2012) 1969-02-17

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