US2816243A - Negative ion source - Google Patents

Negative ion source Download PDF

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Publication number
US2816243A
US2816243A US577133A US57713356A US2816243A US 2816243 A US2816243 A US 2816243A US 577133 A US577133 A US 577133A US 57713356 A US57713356 A US 57713356A US 2816243 A US2816243 A US 2816243A
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ions
capillary
negative
positive
ion
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US577133A
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Raymond G Herb
James A Weinman
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High Voltage Engineering Corp
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High Voltage Engineering Corp
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Priority to US577133A priority Critical patent/US2816243A/en
Priority to GB14608/56A priority patent/GB833658A/en
Priority to DEH45660A priority patent/DE1187749B/de
Priority to DEH27052A priority patent/DE1156515B/de
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/028—Negative ion sources
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/14—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using charge exchange devices, e.g. for neutralising or changing the sign of the electrical charges of beams
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H7/00—Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00
    • H05H7/06—Two-beam arrangements; Multi-beam arrangements storage rings; Electron rings

Definitions

  • This invention relates to a method of and apparatus 4for producing negative ions by the passage of positive ions through a gas.
  • this'invention comprehends the production of negative ions by the passage of positive ions through a capillary into which a gas has been introduced at some point between the extremities of the capillary.
  • One of the most useful tools in nuclear research is an artificial source of high-energy charged particles, and one of the major problems in nuclear research is ⁇ the more ei'licient production of such charged particles.
  • One method of producing high-energy charged particles makes use of the well-known phenomenon that negative ions can easily be converted to positive ions.
  • a high-voltage positively charged terminal can be used to attract negative ions, the negative ions ⁇ can be converted to positive ions within the highvoltage terminal, and the same terminal can be used 'to repel the resultant positive ions.
  • the energy of the particles accelerated by an available voltage is increased; usually the energy of the particles is doubled.
  • both the ion source and the target are at ground potential.
  • An electrostatic accelerator of this type has additional virtues: maintenance should be easier than in present models since much of the machinery now housed in the high-voltage electrode could be kept at ground potential; the momentum of the negative ions can be determined such that only those ions that will ultimately be useful need be accelerated; there is also considerablefreedom of focal conditions before ,the beam enters the accelerating tube. Moreover, an electrostatic accelerator of this type may be used to attain pulsed proton beams of variable energies up to of the order of 100 m. e. v. or more,
  • the invention is not limited to its use in such particle accelerators, ⁇ but includes, .all uses requiring a source of negative ions (e. g. spectroscopy).
  • a source of negative ions e. g. spectroscopy
  • the negative ion source "ofjthe linvention may be used to increase the available v'energy for reactionsfproduced by charged particles arti ciallyaccelerated to energies in the billion-electron-volt energy such that the positive ions are converted into negative ions by the capture of electrons.
  • Thin, foils or gases can serve as electron-donating ⁇ matter.
  • the density of the donor material may bereadily adjusted to 4 l015 atoms per square centimeter, avvalue that approaches ythe density for charge exchange ,equilibrinm.
  • the invention overcomes the difliculties attendant, upon the achievement of thenecessary threshold valueby'di- 'recting the beam of positive ions through a capillary into which gas is introduced at some point between the extremlties of the capillary.
  • the capillary provides more gas for a given flow, and increases impedance to gas ow,
  • the ion current delivered to the capillary should be maximized; since the diameter of the capillary is very small, for reasons hereinafter to be set forth, the ion current density must be very high.
  • close spacing between the positive ion source and the capillary reduces space charge effects since it increases the voltage gradient for a given voltage dierence.
  • the close spacing also reduces the probability for a given gas pressure in the positive-ion acceleration space, of the positive ions colliding with other particles before reaching the capillary.
  • the spacing must not be so close as substantially to impede the iiow of gas from the capillary into the exterior evacuated region.
  • a further important feature of the invention is the way in which negative ions are extracted from the electrondonating matter.
  • the device which accelerates negative ions from the capillary will also accelerate electrons.
  • the acceleration of these electrons absorbs power from the negative-ion-accelerating device, and the accelerated electrons produce X-rays when they strike an object in their path.
  • an electron suppressor is provided to stop these electrons before they have acquired appreciable velocity; in this way, power absorption and X-rays are minimized.
  • the ex mandate of operation would be prohibitive without using the electron suppressor of the invention.
  • Figure l is a somewhat diagrammatic view of longitudinal central section of a negative ion source embodying the invention.
  • Figure 2 is a diagram illustrating the main parts of a negative ion source embodying the invention
  • Figure 3 is a view in longitudinal central section of a modification of a portion of the negative ion source shown in Figure l;
  • Figure 4 is a diagram illustrating apparatus in which negative ions are iirst accelerated to' high energy by a linear accelerator and then injected into an electrostatic accelerator lin which they are either accelerated or decelerated and converted to positive ions, which are then further accelerated or decelerated;
  • Figure 5 is a diagram illustrating a protron synchroton in which positive ions and negative ions are accelerated in opposite directions and allowed to collide at the same energy in the b. e. v. range;
  • Figure 6 is a diagram similar to that of Figure 5 and showing a modification of the proton synchroton of Figure 5.
  • positive ions are produced yby an ion source 1. These ions are extracted and accelerated by a voltage of the P order of 104 volts. The ions then pass through an cleo 4 tron pickup capillary tube 2 into which the electron do hating gas is introduced. The negative ions emerging from this tube 2 are further accelerated, while the emerging secondary electrons are electrostatically repelled by an electron suppressor 3. The negative ions are then focused by a suitable lens 4, shown in Figure 1 as a saddle-field lens. The entire negative ion source, excluding the vacuum pump and magnetic analyzer assembly, is shown in Figure l, and is enclosed within a chamber 5 which is evacuated by the vacuum pump.
  • the negative ion source may be constructed entirely of metal and ceramic so that it can be operated at the elevated temperatures associated with high power input.
  • the entire negative ion source assembly, excluding the focus lens 4, is fastened to a demountable end iiange 6, so that this assembly can readily be removed for servicing.
  • Metal gaskets may be used on all demountable joints.
  • the positive ion source 1 is constructed so that the plasma-enclosing envelope is entirely housed in the vacuum chamber 5, thus minimizing the number of vacuum seals which are exposed to atmospheric pressure.
  • the positive ion source 1 may be any one of the various well-known types. Merely by way of example, there is shown at 1 in Figure l a magnetic ion source, similar in principle to the one described by I. Kistemaker and H. L. Douwes Dekker in Pity/Sica, XVI, 3, 198 (1950).
  • a suitable gas such as hydrogen or deuterium, is introduced into the positive-ion source through a suitable gas line 7. Electrons are emitted by a spiral filament 8 and drawn toward a cylindrical anode 9, which is maintained at a potential of between 0 and 300 volts positive with respect to the filament by a voltage source 10.
  • an axial magnetic iield produced by a solenoid 11 constrains their motion along the axis.
  • the electrons thus move in the axial direction until they reach the end of the ion source 1 where they are reflected by a plate 12 held at filament potential.
  • This arrangement is very eflicient for producing a dense plasma.
  • the location of the filament 8 near the positive ion exit aperture 13 modifies the plasma boundary so that a large yield of positive ions is assured for a given extraction voltage.
  • the positive ions are withdrawn from the plasma through the aperture 13, and focused into the capillary tube 2 by means of a voltage source 14 which maintains the electrode 15 in which the capillary 2 is formed at about l()4 volts negative with respect to the iilament 8.
  • a voltage source 14 which maintains the electrode 15 in which the capillary 2 is formed at about l()4 volts negative with respect to the iilament 8.
  • the distance separating the ion source exit aperture 13 from the capillary 2 should be between l and 10 times the diameter of the capillary Z, and preferably is 2 or 3 times the diameter of the capillary 2.
  • the half of the electrode 15 that is bombarded by positive ions may be constructed of molybdenum because of its high melting point and machinability, while the other half may be of aluminum.
  • berryllium copper may be used, since it has similar properties, is cheaper, has a high thermal conductivity, and provides a high yield of secondary electrons to help neutralize space charge.
  • a suitable electromdonating gas preferably hydrogen although other gases, such as argon, may be used, is introduced into the pickup capillary 2 between the extremities thereof through a suitable gas line 16.
  • the gas is introduced at the center of the capillary 2, as shown in Figure l; and, where the electrode 15 comprises two parts, as just described, the gas may be introduced be tween these two parts, as shown in Figure 3.
  • the beam that ieaves the electron pickup capillary tube 2 is composecfl of negative ions, neutral particles, positive ions and electrons.
  • electrode'lvand electron suppressor 3 may be biasedebetween ⁇ Oz'and 45 kilovolts'negativewith respect toground1byrthe voltagesource.18.: ⁇ :
  • This assembly may ⁇ be insulated by an 8 inch O. D. by 6.inchI..D.. byA 2- inch ceramiciring 19,Jand'the.associatedtpower supplies 10,114, l'lf-mayfbetisolated from ground -throughstransformers (notishownywith 45"l;ilovolt insulation.-
  • the negative ion accelerating electrodewZtl may. consist.A
  • Thiselectrode4 may have, for example, a 4 inchdiame.- ter entrance .and a 1% inch diameter.exit....A suitable-. length might be ofthe .order of ..7 inches, since..a..longer. electrode4 would Anot give .a vshorter .focal length...for.:a. given applied voltage... All ofthe electrodesS, 3,20-,
  • the beam may ⁇ nowpassthrough a 2%, inch diameter. stainless steelitubev 2.12.,.and may then beA deected by a beam analyzer assem.. b y.
  • the emergent :negative-ion beam willbe composed vof more than one type of negative ion; and:so1-the 'type of negative ion desired may be separated:v from the rest ofthe beam .bydirecting thebeam intera*l beam analyzer 25,; whence A.the .desired ⁇ negative-ions emerge as a beam ⁇ 26....
  • soureeinthe ,case of vapparatusconstructed in accordancewithithe. invention is. that it should. have good luminosity, i where? luminosity fis fa quantity/which. is proportional@ to the .tionfcurrenttperunit area...v The luminosityiis more?.
  • the ion beam vfrom a positive ion source utilizing hydrogen'vof atomic weight 1 is composed of three-:typesof-molecular ions, ⁇ being mass 1, mass 2 ⁇ and massS. c Among' these, the order of preference may@ be: pure ⁇ mass 3, puremass 2, pure mass 1, mixed. cIn.
  • practicegrone' maya'aimfor mass 2. ⁇
  • lSincefthe'energy is lshared between tw'o'I particles; 1 the. accelerating lvoltage -must be doubled.
  • lthe positive-ionsoureeris anfimprovement of the Kistemaker source,-fas hereinbefore described.
  • the ions produced aren mostly notfmonatomi and, l"as noted' ⁇ aboveyfthat VVis desirable.
  • the. ion/source-. will be'delivering about-500 lwatts on a smalle spotgfand.v so lhighftemperature -construction:must:v be used. ⁇ i
  • The.number of:neg ⁇ ative ions produced by the passage.. of..awgiven.beam-.ofnpositive ions .through a .given..ex1.. change.; device isara function of-the--energy of.. thezincoming'positive-fionsf-the number of ynegative ions reachesV a maximum "at-.a ypositive-.ions .energyof a few thousand'. electron volts;r .Of .--course, ⁇ the energy of. the .negative ions.. is also-.a ⁇ functionofrthe energy-vof the.incoming.positive ions,beingapproximatelyequalthereto.v Hence the posi.
  • the maximum pumping speed (liters per second) available limits the throughput or gas flow (pressure times volume per second) tolerable.
  • a certain minimum or threshold number of atoms per unit area must be presented to the positive ion beam. in thev capillary 2.
  • the number of atoms per unit area is proportional to the integral, over the length of the capillary, of the pressure within it. Therefore, since the pressure at the extremities of the capillary is limited to a certain maximum value by evacuation requirements, the number' of atoms per unit area can be increased for a given capillary only by increasing the pressure at the point where the gas enters the capillary.
  • the best ratio of the radius r of the capillary to the length L of the capillary will be determined by (a) the angular divergence of the beam and (b) the luminosity at the entrance to the capillary as a function of distance from the central axis of the capillary.
  • the diameter of the capillary must be made very small, and that the length cannot be made too long.
  • the pumping speed will have to be high.
  • the high pumping speed is an important feature of the invention, and is required because of the upper'lirnit on the length of the capillary imposed by space charge considerations.
  • the pumping speed will have to be at least of the order of 10 atmosphere-cc. per hour, or at a pressure of the order of105 mm. Hg, the pumping speed should be at least of the order of 1()3 liters per second.
  • the positive ion source when the positive ion source is of a type having a heated filament, vapor-free conditions are desirable; and, in such cases, it may be advantageous to use a high-speed dry pump, such as that described in the Review of Scientific Instruments, of volume 25, page 1193 (1954) by R. H. Davis and A. S. Divatia.
  • the gas pressure at the inlet to the capillary 2 should be made as high as is consistent with the gas ow resulting.
  • the capillary has marked advantage over a larger chamber into which and from which the ion beams pass through apertures, because theinlet pressure may be raised much higher for a" given outlet pressure in the case' of a capillary than iny the case of an enlarged chamber. This, in turn, increases the massper unit area of gas.
  • the negative ion beam which is extracted from the capillary 2 will also include negative ions of various momenta.
  • the magnetic analyzer 25, shown in Figure 2 eliminates from the beam 26 all but negative ions having the momentum desired. Thereafter, the negative ion beam 26 can be injected into a suitable acceleration tube, or any other device for which the negative ions are desired.
  • the analyzer 25 is not an essential part of the invention.
  • the negative ion source of the invention provides a negative ion beam of small divergence.
  • the lens 4 shown in Figure l may be any type of lens, but by way of example is shown as a saddle-eld lens. Such a lens is preferred on account of its simplicity.
  • the electron suppressor 3 has a relatively small aperture and is biased at about 50 volts negative with respect to the electrode 15, while the negative ion accelerating electrode 20 presents a relatively large aperture to the entering ion beam.
  • These three electrodes, 15, 3 and 20, act as a lens which has a cross-over; and there is some danger of an objectionable space-charge spreading of the beam at cross-over.
  • the modied construction shown in Figure 3 may be employed, wherein the electron suppressor 3 is biased at about 100 volts negative with respect to the electrode 15, and wherein the negative ion accelerating electrode 20 presents a relatively small aperture to the entering ion beam.
  • Such a construction reduces the diiculties attendant upon cross-over.
  • the electrode 15 having the capillary 2 in which charge exchange takes place gets heavily bombarded by positive ions, and its temperature rises. For a given number of atoms or molecules in the capillary 2, the number that ilows out per second will increase as the gas temperature increases. Cooling the converting gas therefore has certain advantages. the input gas to the conversion tube 2 or by cooling the electrode 15 having the conversion capillary 2. This latter procedure would probably be the more practical of the two possibilities. in either event, the cooling may be accomplished by techniques well-known in the art, and need not be described herein in any detail.
  • FIG. 4 illustrates a scheme for attaining pulsed'proton beams of variable energies up to the order of m. e. v. or more.
  • a negative ion source 27 which may be constructed in accordance with the invention, produces a negative ion beam which may be injected either into a linear accelerator 28 or into a double-ended electrostatic accelerator 29, depending upon which the deecting magnet 30 is turned oli or on, respectively.
  • the electrostatic accelerator 29 has a high-voltage terminal 31 which is maintained at a positive potential and which contains a suitable device 32 for converting negative ions passing there.
  • the electrostatic acceleratorV 29 will furnish 'a continuously variable beam l,energy fronr Oto l0 m. e. v. when the magnet -30lis energized so as to deflect negative ions from the negative'ion source-27 ⁇ into theelectrostatic accelerator 29.
  • the negative ions: from the negative ion source 27 are directed into a linear accelerator 28 which may be .fof-the same design-as con- ⁇ ventional proton linear ⁇ accelerators except for a suitablealongv to serve as the second electrostatic.accelerator 34.
  • the potential of the high-voltage terminal 36 of the second electrostaticv accelerator 34 can be varied between -5 and +5 mega. volts. If the rst linear accelerator 28-has a 205m. e. v.- output, the second electrostatic accelerator 34 will furnish a continuously variable beam energy from to 30 m. e. v. when the second magnet 35 isenergized 2solas to deect negative ions from the trst linear accelerator 28 into the second electrostatic accelerator 34. Of course7 when the high-voltage terminal 36 of the second electrostatic accelerator 34 is at a negative potential, theiofnsl traveling through the second electrostatic accelerator 34 are continuously decelerated rather than accelerated.
  • the beam energy y may be made toy vary from to 50 m. e. v., and so on. In this manner one may get a proton beam continuously variable from .0.
  • FIG. 5 illustrates an arrangement whereby the considerable expense of a second b. e. v. machine may be avoided in accordance with our invention.
  • both positive and negative ions are introduced into a single proton synchrotron 3S in opposite directions from the positive ion source 39 and a negative ion source 40, respectively.
  • Both ion beams are accelerated in the same machine 38 and are allowed to collide at the same energy in the b. e. v. range, the collision taking place at some convenient location such as 41.
  • chambrgacfpump g adapted; to evacuatesaid;v chamberyank electrodel supportedffwithn :Said .ichamberf-.and.v havingxa. capillary thereth r o1,1gh,l rrieausrfor,y introducing-a gasainto; Said, apillaryiatsome point: betweenthe, .extremities therev of, means y fon-creating@ beamfo ⁇ positive*lions,-y and means; for directinggsaid gbeama-,intoefsaid-rgcapillaryi lengthwiset ⁇ thereeip 2.
  • A; -negatiyeionsourcein; accordance ⁇ with-',clairn il, wherein. said :gas comprises arnisntope ⁇ of-.1hydr.ogen andi wherein saidl beam1 comprises positive; :ions'havingaa ysingle nuclearcharge.;A v
  • aperture-ifsaideenclosuree beingifposif; tioned-gtso, r that Said: aperture :is iclosezato: one endf ofesad; capillary,I andmeansgfor maintainingzsaid;electredefat a potential iofnthe oriderooff, voltsfn'egatiyez V.withf:respecta to said enclosure.
  • a negative ion source comprising in combination: a chamber, a pump adapted to evacuate said chamber, an electrode supported within said chamber and having a capillary therethrough, means for introducing a gas into said capillary at some point between the extremities thereof, means for creating a beam of positive ions, means for directing said beam into said capillary lengthwise thereof,
  • means for extracting negative ions from said capillary and means for collecting those electrons which are accelerated by said means for extracting negative ions, prior to their acquisition of appreciable energy.
  • a negative ion source comprising in combination: a chamber, a pump adapted to evacuate said chamber, an electrode supported within said chamber and having a capillary therethrough, means for introducing a gas into said capillary at a point approximately midway between the extremities thereof, means for creating a beam of positive ions, and means for directing said beam into said capillary lengthwise thereof.
  • a negative ion source comprising in combination: a chamber, a pump adapted to evacuate said chamber, an electrode supported within said chamber and having a capillary therethrough, means for introducing a gas into said capillary at some point between the extremities thereof, means for cooling said gas, means for creating a beam of positive ions, and means for directing said beam into said capillary lengthwise thereof.
  • a negative ion source comprising in combination: a chamber, a pump adapted to evacuate said chamber, an electrode supported within said chamber and having a capillary therethrough, means for introducing a gas into said capillary at some point between the extremities thereof, means for cool-ing said electrode so as to cool the gas in said capillary, means for creating a beam of positive ions, and means for directing said beam into said capillary lengthwise thereof.
  • said ion accelerator has a fixed-energy output which cannot be altered by the operator of the ion accelerator: means for injecting negative ions into said ion accelerator so as to be accelerated by the same, an electrostatic belttype generator having an electrode upon which is maintained an accumulation of electric charge the amount of which can be varied by the operator of the ion accelerator, thereby varying the fixed potential of said electrode, conversion means, supported at said electrode, for converting negative ions to positive ions, and means for directing the high-energy negative ions issuing from said ion accelerator through said conversion means, whereby positive ions are produced having an energy which can be varied by the operator of the ion accelerator.
  • said ion accelerator comprises a plurality of linear accelerators adapted to act cumulatively upon said negative lons.

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
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US577133A 1956-04-09 1956-04-09 Negative ion source Expired - Lifetime US2816243A (en)

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Application Number Priority Date Filing Date Title
US577133A US2816243A (en) 1956-04-09 1956-04-09 Negative ion source
GB14608/56A GB833658A (en) 1956-04-09 1956-05-10 Negative ion source
DEH45660A DE1187749B (de) 1956-04-09 1956-05-15 Teilchenbeschleuniger nach Art eines Synchrotrons
DEH27052A DE1156515B (de) 1956-04-09 1956-05-15 Vorrichtung zur Erzeugung negativer Ionen

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US2961559A (en) * 1959-08-28 1960-11-22 Jr John Marshall Methods and means for obtaining hydromagnetically accelerated plasma jet
US2978580A (en) * 1958-04-25 1961-04-04 Vakutronik Veb Process and device for the addition of slow electrons to polyatomic or highmolecular compounds
US3336475A (en) * 1964-02-05 1967-08-15 Electro Optical Systems Inc Device for forming negative ions from iodine gas and a lanthanum boride contact ionizer surface
US3373305A (en) * 1964-10-26 1968-03-12 Atomic Energy Authority Uk Duoplasmatron source having an offset compressor electrode
US3374384A (en) * 1966-05-05 1968-03-19 Lake Forest College Process for producing negative helium ions
US3395302A (en) * 1966-01-10 1968-07-30 High Voltage Engineering Corp Vapor target for particle accelerators
US3577026A (en) * 1969-06-24 1971-05-04 Atomic Energy Commission Method for producing ions utilizing a charge-transfer collision
US3790787A (en) * 1972-04-04 1974-02-05 Commissariat Energie Atomique Method and device for producing by charge-transfer a beam of neutral particles or of ions having multiple charges
US4066894A (en) * 1976-01-20 1978-01-03 University Of Virginia Positive and negative ion recording system for mass spectrometer
US4209704A (en) * 1977-08-25 1980-06-24 Siemens Aktiengesellschaft Tandem ion acceleration having a matter-free ion charge reversed zone
US4616157A (en) * 1985-07-26 1986-10-07 General Ionex Corporation Injector for negative ions
US4712012A (en) * 1985-07-26 1987-12-08 General Ionex Corporation Charge conversion unit for negative ion source
USRE33344E (en) * 1977-04-22 1990-09-18 Finnigan Corporation Apparatus and method for detecting negative ions
US5177358A (en) * 1982-06-30 1993-01-05 The United States Of America As Represented By The Secretary Of The Army Solid stripper for a space based neutral particle beam system
US5466941A (en) * 1994-07-27 1995-11-14 Kim; Seong I. Negative ion sputtering beam source
US5521389A (en) * 1995-03-21 1996-05-28 Kim; Seong I. Solid state cesium ion gun
US6039847A (en) * 1997-06-23 2000-03-21 Agency Of Industrial Science & Technology Method of forming a highly pure thin film and apparatus therefor
US6259090B1 (en) * 1987-02-09 2001-07-10 The United States Of America As Represented By The Secretary Of The Army Supported thin foil stripper and simple non-obstructing power meter for a space based neutral particle beam system
WO2015198069A1 (en) * 2014-06-26 2015-12-30 University Court Of The University Of Glasgow Particle beam treatment
CN106717132A (zh) * 2014-09-03 2017-05-24 三菱电机株式会社 移动式直线加速器系统及具备该移动式直线加速器系统的移动式中子源

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GB8725459D0 (en) * 1987-10-30 1987-12-02 Nat Research Dev Corpn Generating particle beams

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US2232030A (en) * 1938-02-08 1941-02-18 Ig Farbenindustrie Ag Device for the generation of large amounts of negative ions
US2498841A (en) * 1945-06-01 1950-02-28 King L D Percival Ion source
US2489344A (en) * 1945-07-16 1949-11-29 Cons Eng Corp Mass spectrometry
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DE1187749B (de) 1965-02-25
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