US2769910A - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

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Publication number
US2769910A
US2769910A US380813A US38081353A US2769910A US 2769910 A US2769910 A US 2769910A US 380813 A US380813 A US 380813A US 38081353 A US38081353 A US 38081353A US 2769910 A US2769910 A US 2769910A
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United States
Prior art keywords
ions
double helix
mass spectrometer
deflected
helix
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Expired - Lifetime
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US380813A
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English (en)
Inventor
Elings Garmt Allard
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Hartford National Bank and Trust Co
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Hartford National Bank and Trust Co
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping

Definitions

  • the invention relates to a mass spectrometer, i. e. a device for analysing or, if desired, decomposing substances into their constituents, the substance to be examined being ionized in a gaseous state, the ions then being subjected to an electric and/or magneticfield in a manner such that a decomposition of the constituents according to the mass or at least the ratio between the mass and the charge is obtained.
  • a mass spectrometer i. e. a device for analysing or, if desired, decomposing substances into their constituents, the substance to be examined being ionized in a gaseous state, the ions then being subjected to an electric and/or magneticfield in a manner such that a decomposition of the constituents according to the mass or at least the ratio between the mass and the charge is obtained.
  • the invention has for its object to provide a mass spectrometer of simple construction, which may nevertheless yield satisfactory results.
  • a mass spectrometer comprises an ion gun and a collecting electrode, between which two conductors shaped in the form of a double helix are arranged in a manner such that the axis thereof coincides with the junction line of the ion gun and the collecting electrode, an alternating voltage, taken from a generator, being applied between the conductors of the double helix, the frequency of this voltage being such that the ions of a given velocity traverse the length of one pitch in one period, the ions deflected from their paths under the action of the radial field in the double helix being collected, and measured or recorded.
  • ions of which the velocity fulfils the given condition are deflected from their paths, whereas the others are deflected to a smaller degree within the double helix. After they have left the double helix, the ions maintain their velocity in the direction of deflection.
  • ions of difierent masses may be deflected and collected. The fact that only ions of a definite velocity and hence of a definite ratio between charge and mass are deflected, may be accounted for in a simple manner as follows:
  • the diameter of the ion beam travelling along the axis of the double helix is sufliciently small relative to the diameter of the helix and to the pitch, it may be assumed, as a first approximation, that the strength of the radial field acting upon the ions is independent of the position in the beam and of any deflections already performed.
  • the radial force exerted on the ions varies as a cosine function with time owing to the alternating voltage applied to the double helix.
  • the component of the force parallel to a given plane through the axis varies also as a cosine function, with the path covered in the helix, owing to the helical field. Consequently the total radial 2 velocity maybe expressed, with the exception of one factor by:
  • x designates the path covered in the helix in the time t and s designates the pitch of the helix.
  • nt designates the pitch of the helix.
  • the direction in which the lateral velocity is determined for one kind of ions depends on the phase of the voltage applied to the double helix at the entrance of the ions. Since this differs for all ions, the directions of deflection arealso different. Sinceafter' thtraversal of the double helix the lateral velocity no longenih creases, the deflected ions move along a cone surface. It is not necessary to construct the double helix in the form of a cylindrical helix, but the influence of inhomogeneity of the field on ions already deflected may be better avoided by a double helix wound in an adequately chosen plane of revolution, of which the generatrix, viewed from the entry of the ions, has a positive first and second derivative.
  • Reference numeral 1 designates an elongated glass tube having widened ends, in which an ion source 2 and a collecting electrode system 3 are arranged.
  • the double helix is designated by 4 and the collecting electrode system comprises a ring 5 and a plate 6.
  • a high-frequency generator 7 having push-pull output is connected to the double helix and a current measuring apparatus 8, for example, a cathode-ray oscillograph, is connected to the ring 5.
  • the ion gun has an acceleration voltage of l kv., so that the two electrodes 5 and 6 and an acceleration electrode 10 also have a voltage of 1 kv. (negative) with respect to the cathode 9 of the ion source.
  • the double helix has 2X54 turns and a pitch of 6 mms. and a diameter of 12.5 mms.
  • the high-frequency generator 7 supplies an alternating voltage having frequencies variable from 3 to 40 mc./s. and a peak voltage of a few times 10 volts.
  • Thecharge of the deflected ions, collected by the ring electrode 5, is passed through the measuring apparatus 8. If the latter is a cathode ray oscillograph, the vertical deflection of the electron beam therein may, for example, indicate the value of the ion flow and the horizontal varying the frequency of the high-frequency generator 7 in synchronism with the time base of the oscillograph.
  • the double helix may be, as an alternative, wound on the outer side of the tube. Then the apparatus may be manufactured in a simpler manner.
  • a mass spectrometer comprising an ion gun, a colto a particular frequency of said alternating voltage are deflected away from the axis of the helix.
  • a mass spectrometer comprising an ion gun, a collecting electrode including a plate and an annular member, a pair of conductors shaped in the form of a double helix between said gun and said collecting electrode and coaxially arranged therewith, means for applying an alternating voltage of variable frequency between said conductors whereby ions of a given mass corresponding to a particular frequency of said alternating voltage are deflected toward said annular member, and indicating means coupled to said annular member for indicating the extent of ion collection thereof.
  • a mass spectrometer comprising a glass envelope having widened ends, an ion gun disposed at one widened end of said envelope, a collecting electrode including a plate 'and an annular member disposed at the other widened end of said envelope, a pair of conductors shaped in the form of a double helix disposed within said envelope between said gun and said collecting electrode and coaxially arranged therewith, means for applying an alternating voltage of variable frequency between said conductors whereby ions of a given mass corresponding to a particular frequency of said alternating voltage are deflected toward said annular member, and indicating means coupled to said annular member for indicating the extent of ion collection thereof.
  • a mass spectrometer comprising a glass envelope, an ion gun disposed at one end of said envelope, a collecting electrode including aplate and an annular member disposed at the other end of said envelope, a pair of conductors shaped in the form of a double helix surrounding said envelope between said gun and said collecting electrode and coaxially arranged therewith, means for applying an alternating voltage of variable frequency between said conductors whereby ions of a given mass corresponding to a particular frequency of said alternating voltage are deflected toward said annular member, and indicating means coupled to said annular member for indicating the extent ofion collection thereof.
  • a mass spectrometer comprising an ion gun, a collecting electrode, a pair of conductors shaped in the form of a double helix wound in a plane of revolution having a generatrix having a positive first and second derivative and disposed between said gun and said collecting electrode and coaxially arranged therewith, means for applying an alternating voltage of variable frequency between said conductors, whereby ions of a given mass corresponding to a particular frequency of said alternating voltage are deflected away from the axis of the helix, and means coupled to said collecting electrode for measuring the current of the deflected ions as a function of the frequency of said applied voltage.

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
US380813A 1952-09-30 1953-09-17 Mass spectrometer Expired - Lifetime US2769910A (en)

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NL316816X 1952-09-30

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US (1) US2769910A (enrdf_load_html_response)
FR (1) FR1084075A (enrdf_load_html_response)
GB (1) GB725113A (enrdf_load_html_response)
NL (2) NL172823B (enrdf_load_html_response)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2933646A (en) * 1958-05-06 1960-04-19 Friedrich H Reder Molecular beam focusing devices
US2939952A (en) * 1953-12-24 1960-06-07 Paul Apparatus for separating charged particles of different specific charges
US2950389A (en) * 1957-12-27 1960-08-23 Siemens Ag Method of separating ions of different specific charges
US3029361A (en) * 1958-08-19 1962-04-10 Rca Corp High temperature plasma confinement using a travelling electromagnetic field
US3075076A (en) * 1958-12-12 1963-01-22 Siemens Ag Gas-analyzing method and apparatus
US3427449A (en) * 1965-06-30 1969-02-11 Philips Corp Cycloidal mass spectrometer employing crossed uniform magnetic and electric fields
US3532880A (en) * 1968-01-30 1970-10-06 Nasa Electrostatic charged particle analyzer having deflection members shaped according to the periodic voltage applied thereto
US4959543A (en) * 1988-06-03 1990-09-25 Ionspec Corporation Method and apparatus for acceleration and detection of ions in an ion cyclotron resonance cell
US5095208A (en) * 1988-06-24 1992-03-10 Hitachi, Ltd. Charged particle generating device and focusing lens therefor
US5283436A (en) * 1990-01-08 1994-02-01 Bruker-Franzen Analytik Gmbh Generation of an exact three-dimensional quadrupole electric field and superposition of a homogeneous electric field in trapping-exciting mass spectrometer (TEMS)
US5572035A (en) * 1995-06-30 1996-11-05 Bruker-Franzen Analytik Gmbh Method and device for the reflection of charged particles on surfaces
US6111358A (en) * 1998-07-31 2000-08-29 Hughes Electronics Corporation System and method for recovering power from a traveling wave tube
US20060085141A1 (en) * 2004-07-23 2006-04-20 Baylor University Method and machine for identifying a chemical compound
EP3264443A1 (en) 2016-06-30 2018-01-03 Bruker Daltonics, Inc. Mass spectrometer comprising a radio frequency ion guide having continuous electrodes

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2606291A (en) * 1946-03-11 1952-08-05 Robert R Wilson Method and apparatus for material separation
US2659822A (en) * 1947-04-22 1953-11-17 George H Lee Mass spectrometer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2606291A (en) * 1946-03-11 1952-08-05 Robert R Wilson Method and apparatus for material separation
US2659822A (en) * 1947-04-22 1953-11-17 George H Lee Mass spectrometer

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2939952A (en) * 1953-12-24 1960-06-07 Paul Apparatus for separating charged particles of different specific charges
US2950389A (en) * 1957-12-27 1960-08-23 Siemens Ag Method of separating ions of different specific charges
US2933646A (en) * 1958-05-06 1960-04-19 Friedrich H Reder Molecular beam focusing devices
US3029361A (en) * 1958-08-19 1962-04-10 Rca Corp High temperature plasma confinement using a travelling electromagnetic field
US3075076A (en) * 1958-12-12 1963-01-22 Siemens Ag Gas-analyzing method and apparatus
US3427449A (en) * 1965-06-30 1969-02-11 Philips Corp Cycloidal mass spectrometer employing crossed uniform magnetic and electric fields
US3532880A (en) * 1968-01-30 1970-10-06 Nasa Electrostatic charged particle analyzer having deflection members shaped according to the periodic voltage applied thereto
US4959543A (en) * 1988-06-03 1990-09-25 Ionspec Corporation Method and apparatus for acceleration and detection of ions in an ion cyclotron resonance cell
US5095208A (en) * 1988-06-24 1992-03-10 Hitachi, Ltd. Charged particle generating device and focusing lens therefor
US5283436A (en) * 1990-01-08 1994-02-01 Bruker-Franzen Analytik Gmbh Generation of an exact three-dimensional quadrupole electric field and superposition of a homogeneous electric field in trapping-exciting mass spectrometer (TEMS)
US5572035A (en) * 1995-06-30 1996-11-05 Bruker-Franzen Analytik Gmbh Method and device for the reflection of charged particles on surfaces
US6111358A (en) * 1998-07-31 2000-08-29 Hughes Electronics Corporation System and method for recovering power from a traveling wave tube
US20060085141A1 (en) * 2004-07-23 2006-04-20 Baylor University Method and machine for identifying a chemical compound
US7206700B2 (en) 2004-07-23 2007-04-17 Baylor University Method and machine for identifying a chemical compound
US20080215253A1 (en) * 2004-07-23 2008-09-04 Baylor University Method and machine for identifying a chemical compound related applications
US7653494B2 (en) 2004-07-23 2010-01-26 Baylor University Method and machine for identifying a chemical compound
EP3264443A1 (en) 2016-06-30 2018-01-03 Bruker Daltonics, Inc. Mass spectrometer comprising a radio frequency ion guide having continuous electrodes
US9899199B2 (en) 2016-06-30 2018-02-20 Bruker Daltonics, Inc. Mass spectrometer comprising a radio frequency ion guide having continuous electrodes

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Publication number Publication date
GB725113A (en) 1955-03-02
NL172823B (nl)
NL88023C (enrdf_load_html_response)
FR1084075A (fr) 1955-01-17

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