US2175016A - Method of producing selenium rectifiers or the like - Google Patents
Method of producing selenium rectifiers or the like Download PDFInfo
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- US2175016A US2175016A US146318A US14631837A US2175016A US 2175016 A US2175016 A US 2175016A US 146318 A US146318 A US 146318A US 14631837 A US14631837 A US 14631837A US 2175016 A US2175016 A US 2175016A
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- United States
- Prior art keywords
- semi
- carrier electrode
- electrode
- selenium
- conductor layer
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title description 17
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 title description 16
- 229910052711 selenium Inorganic materials 0.000 title description 16
- 239000011669 selenium Substances 0.000 title description 16
- 239000004065 semiconductor Substances 0.000 description 41
- 239000000463 material Substances 0.000 description 25
- 239000007789 gas Substances 0.000 description 18
- 230000007935 neutral effect Effects 0.000 description 11
- 239000000203 mixture Substances 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 8
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 8
- 229910052740 iodine Inorganic materials 0.000 description 8
- 239000011630 iodine Substances 0.000 description 8
- 229910052749 magnesium Inorganic materials 0.000 description 8
- 239000011777 magnesium Substances 0.000 description 8
- 229910045601 alloy Inorganic materials 0.000 description 7
- 239000000956 alloy Substances 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- 229910052790 beryllium Inorganic materials 0.000 description 7
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 7
- 150000002739 metals Chemical class 0.000 description 7
- 238000009834 vaporization Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 229940065287 selenium compound Drugs 0.000 description 2
- 150000003343 selenium compounds Chemical class 0.000 description 2
- 230000008016 vaporization Effects 0.000 description 2
- 229940037003 alum Drugs 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/06—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising selenium or tellurium in uncombined form other than as impurities in semiconductor bodies of other materials
- H01L21/10—Preliminary treatment of the selenium or tellurium, its application to the foundation plate, or the subsequent treatment of the combination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/06—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising selenium or tellurium in uncombined form other than as impurities in semiconductor bodies of other materials
- H01L21/10—Preliminary treatment of the selenium or tellurium, its application to the foundation plate, or the subsequent treatment of the combination
- H01L21/101—Application of the selenium or tellurium to the foundation plate
Definitions
- Frit z Brunke is Attorneg.
- My invention relates to dry plate rectifiers or like devices such as light-sensitive cells of the type'wherein a semi-conductor layer composed of a material such as selenium or a selenium compound is deposited by a vaporization process on a carrier electrode.
- the object of the invention is to provide an improved device of the above type and an improved method of forming the semi-conductor layer on the carrier electrode.
- the selenium type for rectifiers or light-sensitive devices comprise a carrier electrode ghaving thereon a semi-conductor layer of selenium or selenium compound, and a counterelect'rode in contact with the semi conductor layer.
- I-Ieretofore the semi-conductor layer has been commonly produced by a mechanical application of the selenium or selenium compound to the carrier electrode, for example by melting of the semi-conductor material upon the electrode and flowing the material thereover to form a layer of the required thickness. It has been suggested to produce the semi-conductor layer, for cells of the selenium type for example, by exposing the carrier electrode to the vapor of a semi-conductor material in a high vacuum.
- Semi-conductor layers produced by the latter or similar vaporization methods are characterized by a more uniform construction and greater degree of emciency as compared with layers proucked by the mechanical methods such as the above-mentioned fusion of the semi-conductor material to the carrier electrode.
- Light metals, or metal alloys, for example metals or alloys oi the group comprising aluminum, magnesium and beryllium, have proved to be particularly advantageous and efficient materials for the carrier electrode when the vaporization method of iorming the semi-conductor layer is employed.
- the vaporization method has had the disadvantage, however, that the carrier electrode must be maintained at a temperature at which the semi-conductor material has a low vapor pressure.
- a condition, not easily controlled, of the semi-conductor material ensues in which the material may be at a given instant either in process of being condensed or of being vaporized, and the thickness and structure of the semiconductor layer obtainable are so greatly dependent on the temperature or the carrier electrode and on the vapor pressure of the semiconductor emerging from the vaporization apparatus that these characteristics 01 the semiconductor layer can not, arbitrarily, under this latter condition, be properly determined.
- the vaporization process other difliculties connection with the accompanying drawing and its scope will be pcintedout in the appended claims.
- Figs. 1 and 2 illustrate rectifier cells in which, in accordance with my invention, a semi-conductor layer is mounted between a carrier electrode and a counterelectrode.
- the rectifier cell or element includes a carrier electrode I, a semi-conductor layer 2, and a counterelectrode 3.
- the semi-conductor layer is deposited on the carrier electrode by exposing the carrier electrode to the vapor of a semi-conductor material, as usual in the vaporh zatlon process.
- the vaporizing-of the semiconductor material and the exposing of the carrier electrode i to the vapor or the material, for forming the semi-conductor layer 2, on the carrier electrode take place in an atmosphere of a neutral gas. Nitrogen and the rare gases, helium, neon, argon, krypton, and xenon have proved suitable.
- the thickness and structure of the semi-conductor layer can be better controlled than by former methods; by varying the pressure of the neutral gas and the temperature of the carrier electrode within wide limits, adjustment can be made for any especial condition arising from the revaporization of the semi-conductor material.
- the method in accordance with my invention can further be improved by employing a directed stream of the neutral gas, thus hindering the revaporization, of the semi-conductor material which is being deposited onto the carrier electrode.
- the gas current is preferably caused to flow directly against the carrier electrode, so that thelosses of material become small. Preheating of the current of neutral gas has proved to be of advantage.
- the method according to the present invention makes it possible that a plurality of semi-conductor materials may be simultaneously vaporized and intermixed without difliculty, the semiconductor layers thus obtained proving very emcient in many cases.
- the production of such compound layers has been difiicult heretofore by reason of the varying gas pressure of the components in the course of evaporation in a high vacuum, whereas the presence of a neutral gas, asv provided by my present invention, considerably improves and simplifies the method or production of the semi-conductor layer.
- the use of the neutral gas, and by carefully directing the gas stream against the carrier electrode eificient mixing of the components of the semi-conductor material is assured. I have found that a mixture of selenium and iodine, as illustrated in Figs. 1 and 2, is particularly advantageous.
- the semi-conductor layer viz., the maintaining of the carrier electrode, upon which the layer is being deposited, at a temperature of over 210- C.
- the semi-conductor layer 2 is composed, as in Fig. 1, of a mixture of selenium and iodine.
- the carrier electrode 4 is composed of a metal or metal alloy of the group comprising aluminum, magnesium and beryllium.
- the semi-conductor layer is deposited on the carrier electrode in the same manner as hereinabove described in connection with the cell or element illustrated in Fig. 1.
- An element for a dry plate device including a carrier electrode, and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
- An element for a dry plate device including a carrier electrode composed of a material of the group comprising aluminum, magnesium, and beryllium and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
- An element for a dry plate device including a. carrier electrode composed of an alloy of the group of metals comprising aluminum, magnesium and beryllium, and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
- An element for a dry plate rectifier or the like including a carrier electrode, and a semiconductor layer on said electrode composed of a mixture of selenium and iodine.
- An element for adry plate rectifieror the like including a carrier electrode composed of a material of the group comprising aluminum, magnesium, and beryllium and alloys of said metals, and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Rectifiers (AREA)
Description
Oct. 3, 1939. F. BRUNKE 2,175,016
METHOD OF PRODUCING SELENIUM RECTIFIERS OR THE LIKE Filed June 55, 1937 Fig. I.
cou/vrzre ELECTRODE.
gag/ 444 44140155; wgllllqgwaqlllln MIXTURE 0F VAPOR/ZED CQUNTER E L EC TRODE M/XTURE 0F VAPOR/2E D 24 !(4 114 144 4444 14444- wlawawaa 4 55L E/V/UM AND METAL up ALLOY OF THE 4 aeou co/vs/smva 0F ALUM/NUM, MAGNESIUM AND BERYLL/UM.
Inventor: Frit z Brunke is Attorneg.
Patented 3, v I
'METHOD OF PRODUCING sELENIUM FIERS on LIKE THE FFlCE RECTI-,,
Fritz Brunke, Berlin-Steglitz, Germany, asslgnor to General Electric Company, a corporation of New York Application June 3, 1937, Serial No. 148,318
Germany June 20, 1936 9 Claims.
My invention relates to dry plate rectifiers or like devices such as light-sensitive cells of the type'wherein a semi-conductor layer composed of a material such as selenium or a selenium compound is deposited by a vaporization process on a carrier electrode. The object of the invention is to provide an improved device of the above type and an improved method of forming the semi-conductor layer on the carrier electrode.
Conventional cells; 01' the selenium type for rectifiers or light-sensitive devices comprise a carrier electrode ghaving thereon a semi-conductor layer of selenium or selenium compound, and a counterelect'rode in contact with the semi conductor layer. I-Ieretofore the semi-conductor layer has been commonly produced by a mechanical application of the selenium or selenium compound to the carrier electrode, for example by melting of the semi-conductor material upon the electrode and flowing the material thereover to form a layer of the required thickness. It has been suggested to produce the semi-conductor layer, for cells of the selenium type for example, by exposing the carrier electrode to the vapor of a semi-conductor material in a high vacuum.
Semi-conductor layers produced by the latter or similar vaporization methods are characterized by a more uniform construction and greater degree of emciency as compared with layers pro duced by the mechanical methods such as the above-mentioned fusion of the semi-conductor material to the carrier electrode. Light metals, or metal alloys, for example metals or alloys oi the group comprising aluminum, magnesium and beryllium, have proved to be particularly advantageous and efficient materials for the carrier electrode when the vaporization method of iorming the semi-conductor layer is employed.
- The vaporization method has had the disadvantage, however, that the carrier electrode must be maintained at a temperature at which the semi-conductor material has a low vapor pressure. Thus a condition, not easily controlled, of the semi-conductor material ensues in which the material may be at a given instant either in process of being condensed or of being vaporized, and the thickness and structure of the semiconductor layer obtainable are so greatly dependent on the temperature or the carrier electrode and on the vapor pressure of the semiconductor emerging from the vaporization apparatus that these characteristics 01 the semiconductor layer can not, arbitrarily, under this latter condition, be properly determined. In the use of the vaporization process other difliculties connection with the accompanying drawing and its scope will be pcintedout in the appended claims.
Referring to the drawing, Figs. 1 and 2 illustrate rectifier cells in which, in accordance with my invention, a semi-conductor layer is mounted between a carrier electrode and a counterelectrode.
In Fig. I the rectifier cell or element includes a carrier electrode I, a semi-conductor layer 2, and a counterelectrode 3. The semi-conductor layeris deposited on the carrier electrode by exposing the carrier electrode to the vapor of a semi-conductor material, as usual in the vaporh zatlon process. In accordance with the present invention, however, the vaporizing-of the semiconductor material and the exposing of the carrier electrode i to the vapor or the material, for forming the semi-conductor layer 2, on the carrier electrode, take place in an atmosphere of a neutral gas. Nitrogen and the rare gases, helium, neon, argon, krypton, and xenon have proved suitable. In accordance with the method of the present invention the thickness and structure of the semi-conductor layer can be better controlled than by former methods; by varying the pressure of the neutral gas and the temperature of the carrier electrode within wide limits, adjustment can be made for any especial condition arising from the revaporization of the semi-conductor material.
The method in accordance with my invention can further be improved by employing a directed stream of the neutral gas, thus hindering the revaporization, of the semi-conductor material which is being deposited onto the carrier electrode. The gas current is preferably caused to flow directly against the carrier electrode, so that thelosses of material become small. Preheating of the current of neutral gas has proved to be of advantage.
The method according to the present invention makes it possible that a plurality of semi-conductor materials may be simultaneously vaporized and intermixed without difliculty, the semiconductor layers thus obtained proving very emcient in many cases. The production of such compound layers has been difiicult heretofore by reason of the varying gas pressure of the components in the course of evaporation in a high vacuum, whereas the presence of a neutral gas, asv provided by my present invention, considerably improves and simplifies the method or production of the semi-conductor layer. the use of the neutral gas, and by carefully directing the gas stream against the carrier electrode, eificient mixing of the components of the semi-conductor material is assured. I have found that a mixture of selenium and iodine, as illustrated in Figs. 1 and 2, is particularly advantageous.
When employing the method of the present invention it is, further, expedient to operate at a pressure of the neutral gas which is higher than the external-pressure, i. e., at a pressure higher than one atmosphere, the neutral gas then preventing access of air to the carrier electrode, upon which the semi-conductor layer is being deposited. By this means, further, an especially favorable condition is possible and preferably.
utilized for developing the semi-conductor layer, viz., the maintaining of the carrier electrode, upon which the layer is being deposited, at a temperature of over 210- C.
In Fig. 2 the semi-conductor layer 2 is composed, as in Fig. 1, of a mixture of selenium and iodine. The carrier electrode 4, however, is composed of a metal or metal alloy of the group comprising aluminum, magnesium and beryllium. The semi-conductor layer is deposited on the carrier electrode in the same manner as hereinabove described in connection with the cell or element illustrated in Fig. 1.
It has been set forth herein that light metals or alloys are suitable as materials for the carrier electrode. It will be readily understood, however, that other well known materials such as iron or nickel may be utilized for this purpose in practising my present invention.
My invention has been described herein in particular embodiments for purposes of illustration. It is to be understood, however, that the invention is susceptible of various changes and modiiications, and that by the appended claims I intend to cover any such modifications as fall within the true spirit and scope of my invention.
What I claimas new and desire to secure ,by Letters Patent of the United States, is:
1. The method of producing an element for a dry plate device, said element comprising a carrier electrode composed of a material of .the
group comprising aluminum, magnesium, and beryllium and alloys of said metals, which includes exposing said electrode to a mixture of selenium vapor and iodine vapor in the presence of a chemically neutral gas.
2. The method of producing an element for a dry plate device, said element comprising a carrier electrode, which includes forming a vapor of a semi-conductor material, forming a current of preheated, chemically inactive gas, and blowing said vapor against said carrier electrode by said current of gas, to form a layer of said semiconductor material on said electrode.
3. The method of producing an element for a dry plate device, said element comprising a carrier electrode, which includes exposing said electrode to the vapor of a semi-conductor material in the presence of a chemically neutral gas, said gas being at a pressure higher than atmosphere, and maintaining said carrier electrode at a temperature sufficiently low to cause said vapor to condense thereon to form'a solid semi-conductor layer thereon.
4. An element for a dry plate device, including a carrier electrode, and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
5. An element for a dry plate device, including a carrier electrode composed of a material of the group comprising aluminum, magnesium, and beryllium and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
6. An element for a dry plate device, including a. carrier electrode composed of an alloy of the group of metals comprising aluminum, magnesium and beryllium, and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
7. The method of producing an element for a dry plate rectifier or the like, said element comprising a carrier electrode composed of a material of the group comprising aluminum, magnesium, and beryllium and alloys of said metals, which includes exposing said electrode to a mixture of selenium vapor and'iodine vapor in the presence of a chemically neutral gas.
8. An element for a dry plate rectifier or the like, including a carrier electrode, and a semiconductor layer on said electrode composed of a mixture of selenium and iodine.
9. An element for adry plate rectifieror the like, including a carrier electrode composed of a material of the group comprising aluminum, magnesium, and beryllium and alloys of said metals, and a semi-conductor layer on said electrode composed of a mixture of selenium and iodine.
FRITZ BRUNKE.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE476790X | 1936-06-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
US2175016A true US2175016A (en) | 1939-10-03 |
Family
ID=6542040
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US146318A Expired - Lifetime US2175016A (en) | 1936-06-20 | 1937-06-03 | Method of producing selenium rectifiers or the like |
Country Status (3)
Country | Link |
---|---|
US (1) | US2175016A (en) |
GB (1) | GB476790A (en) |
NL (1) | NL46218C (en) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2438923A (en) * | 1943-02-11 | 1948-04-06 | Fed Telephone & Radio Corp | Method and means for making selenium elements |
US2446467A (en) * | 1944-11-11 | 1948-08-03 | Fansteel Metallurgical Corp | Dry plate rectifier |
US2446468A (en) * | 1945-06-14 | 1948-08-03 | Fansteel Metallurgical Corp | Selenium rectifiers |
US2462906A (en) * | 1943-05-01 | 1949-03-01 | Standard Telephones Cables Ltd | Manufacture of metal contact rectifiers |
US2530110A (en) * | 1944-06-02 | 1950-11-14 | Sperry Corp | Nonlinear circuit device utilizing germanium |
US2642367A (en) * | 1947-01-09 | 1953-06-16 | Us Sec War | Method of protecting lenses |
US2756165A (en) * | 1950-09-15 | 1956-07-24 | Dean A Lyon | Electrically conducting films and process for forming the same |
US2759861A (en) * | 1954-09-22 | 1956-08-21 | Bell Telephone Labor Inc | Process of making photoconductive compounds |
US2914837A (en) * | 1952-06-19 | 1959-12-01 | Siemens Ag | Method of manufacturing selenium rectifier cells |
US3202490A (en) * | 1961-03-23 | 1965-08-24 | Csf | Sealing structure |
CN109273355A (en) * | 2018-06-06 | 2019-01-25 | 鹤壁维达科巽电气有限公司 | A kind of selenium cell preparation process |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1067783A (en) * | 1951-12-18 | 1954-06-18 | Int Standard Electric Corp | Rectifying surface comprising silicon or germanium |
-
0
- NL NL46218D patent/NL46218C/xx active
-
1937
- 1937-06-03 US US146318A patent/US2175016A/en not_active Expired - Lifetime
- 1937-06-21 GB GB17240/37A patent/GB476790A/en not_active Expired
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2438923A (en) * | 1943-02-11 | 1948-04-06 | Fed Telephone & Radio Corp | Method and means for making selenium elements |
US2462906A (en) * | 1943-05-01 | 1949-03-01 | Standard Telephones Cables Ltd | Manufacture of metal contact rectifiers |
US2530110A (en) * | 1944-06-02 | 1950-11-14 | Sperry Corp | Nonlinear circuit device utilizing germanium |
US2446467A (en) * | 1944-11-11 | 1948-08-03 | Fansteel Metallurgical Corp | Dry plate rectifier |
US2446468A (en) * | 1945-06-14 | 1948-08-03 | Fansteel Metallurgical Corp | Selenium rectifiers |
US2642367A (en) * | 1947-01-09 | 1953-06-16 | Us Sec War | Method of protecting lenses |
US2756165A (en) * | 1950-09-15 | 1956-07-24 | Dean A Lyon | Electrically conducting films and process for forming the same |
US2914837A (en) * | 1952-06-19 | 1959-12-01 | Siemens Ag | Method of manufacturing selenium rectifier cells |
US2759861A (en) * | 1954-09-22 | 1956-08-21 | Bell Telephone Labor Inc | Process of making photoconductive compounds |
US3202490A (en) * | 1961-03-23 | 1965-08-24 | Csf | Sealing structure |
CN109273355A (en) * | 2018-06-06 | 2019-01-25 | 鹤壁维达科巽电气有限公司 | A kind of selenium cell preparation process |
CN109273355B (en) * | 2018-06-06 | 2022-03-01 | 鹤壁维达科巽电气有限公司 | Preparation process of selenium rectifying sheet |
Also Published As
Publication number | Publication date |
---|---|
NL46218C (en) | 1900-01-01 |
GB476790A (en) | 1937-12-15 |
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