US20230180441A1 - Heat dissipation structure and electronic device adopting the same - Google Patents
Heat dissipation structure and electronic device adopting the same Download PDFInfo
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- US20230180441A1 US20230180441A1 US18/163,651 US202318163651A US2023180441A1 US 20230180441 A1 US20230180441 A1 US 20230180441A1 US 202318163651 A US202318163651 A US 202318163651A US 2023180441 A1 US2023180441 A1 US 2023180441A1
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- heat dissipation
- electronic device
- liquid metal
- layer
- heat
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- 230000017525 heat dissipation Effects 0.000 title claims abstract description 58
- 229910001338 liquidmetal Inorganic materials 0.000 claims abstract description 50
- 238000005260 corrosion Methods 0.000 claims abstract description 36
- 229910052751 metal Inorganic materials 0.000 claims abstract description 8
- 239000002184 metal Substances 0.000 claims abstract description 8
- 238000009413 insulation Methods 0.000 claims description 33
- 239000000758 substrate Substances 0.000 claims description 29
- 230000000903 blocking effect Effects 0.000 claims description 20
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 229910052802 copper Inorganic materials 0.000 claims description 6
- 239000010949 copper Substances 0.000 claims description 6
- 239000000919 ceramic Substances 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 239000000853 adhesive Substances 0.000 description 11
- 230000001070 adhesive effect Effects 0.000 description 11
- 239000003351 stiffener Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 5
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 229910052733 gallium Inorganic materials 0.000 description 4
- 229910000765 intermetallic Inorganic materials 0.000 description 3
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 2
- 229910001128 Sn alloy Inorganic materials 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- CDZGJSREWGPJMG-UHFFFAOYSA-N copper gallium Chemical compound [Cu].[Ga] CDZGJSREWGPJMG-UHFFFAOYSA-N 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- FRWYFWZENXDZMU-UHFFFAOYSA-N 2-iodoquinoline Chemical compound C1=CC=CC2=NC(I)=CC=C21 FRWYFWZENXDZMU-UHFFFAOYSA-N 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910001297 Zn alloy Inorganic materials 0.000 description 1
- PSMFTUMUGZHOOU-UHFFFAOYSA-N [In].[Sn].[Bi] Chemical compound [In].[Sn].[Bi] PSMFTUMUGZHOOU-UHFFFAOYSA-N 0.000 description 1
- MXCODEAYRFLVOQ-UHFFFAOYSA-N [Zn].[Bi].[In] Chemical compound [Zn].[Bi].[In] MXCODEAYRFLVOQ-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 1
- LTPBRCUWZOMYOC-UHFFFAOYSA-N beryllium oxide Inorganic materials O=[Be] LTPBRCUWZOMYOC-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 239000006258 conductive agent Substances 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010433 feldspar Substances 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 229910000000 metal hydroxide Inorganic materials 0.000 description 1
- 150000004692 metal hydroxides Chemical class 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- -1 or the like) Inorganic materials 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/2039—Modifications to facilitate cooling, ventilating, or heating characterised by the heat transfer by conduction from the heat generating element to a dissipating body
- H05K7/20436—Inner thermal coupling elements in heat dissipating housings, e.g. protrusions or depressions integrally formed in the housing
- H05K7/20445—Inner thermal coupling elements in heat dissipating housings, e.g. protrusions or depressions integrally formed in the housing the coupling element being an additional piece, e.g. thermal standoff
- H05K7/20472—Sheet interfaces
- H05K7/20481—Sheet interfaces characterised by the material composition exhibiting specific thermal properties
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/2039—Modifications to facilitate cooling, ventilating, or heating characterised by the heat transfer by conduction from the heat generating element to a dissipating body
- H05K7/205—Heat-dissipating body thermally connected to heat generating element via thermal paths through printed circuit board [PCB]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0201—Thermal arrangements, e.g. for cooling, heating or preventing overheating
- H05K1/0203—Cooling of mounted components
- H05K1/0204—Cooling of mounted components using means for thermal conduction connection in the thickness direction of the substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/182—Printed circuits structurally associated with non-printed electric components associated with components mounted in the printed circuit board, e.g. insert mounted components [IMC]
- H05K1/185—Components encapsulated in the insulating substrate of the printed circuit or incorporated in internal layers of a multilayer circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/282—Applying non-metallic protective coatings for inhibiting the corrosion of the circuit, e.g. for preserving the solderability
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0272—Adaptations for fluid transport, e.g. channels, holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/06—Thermal details
- H05K2201/064—Fluid cooling, e.g. by integral pipes
Definitions
- the disclosure relates to a heat dissipation structure and an electronic device adopting the same, and more particularly to a heat dissipation structure adapted to dissipate heat from a heat-generating structure and an electronic device adopting the same.
- a liquid metal is a metal or a metal alloy that is in a liquid state at room temperature due to its low melting point or that is in a liquid state when heated to its melting point.
- liquid metal include gallium indium tin alloy, indium bismuth tin alloy, and indium bismuth zinc alloy.
- Liquid metals have high stability and exceptional thermal and electrical conductivity. Moreover, the specific heat capacity and thermal conductivity of the liquid metals are much higher than those of the traditional silicone conductive pastes, so that they are now used as a thermal conductive agent between a heat source and heat-dissipating fins or thermal modules.
- Aluminum or copper is often used as the main material for heat-dissipating fins or thermal modules.
- aluminum is easily corroded by gallium in the liquid metal, resulting in the damage of the heat-dissipating fins and losing the thermal conductivity of the liquid metal.
- copper has a much stable electron configuration due to the 10 electrons in its 3d orbital, and thus, copper does not corrode as easily as aluminum when in contact with gallium.
- FIG. 1 in actual practice, after a period of time and under high temperature, copper can still react with gallium to form a needle-like intermetallic compound CuGa, which is also known as liquid metal dry-out.
- an object of the present disclosure is to provide a heat dissipation structure and an electronic device adopting the same that can alleviate at least one of the drawbacks of the prior art.
- a heat dissipation structure adapted to dissipate heat from a heat-generating structure.
- the heat dissipation structure includes a heat dissipation unit and a liquid metal layer.
- the heat dissipation unit includes a heat dissipation body and an anti-corrosion layer formed on the heat dissipation body.
- the liquid metal layer is disposed between the heat-generating structure and the anti-corrosion layer, and is opposite to the heat dissipation body.
- an electronic device which includes a heat-generating structure and a heat dissipation structure.
- the heat dissipation structure includes a heat dissipation unit and a liquid metal layer.
- the heat dissipation unit includes a heat dissipation body and an anti-corrosion layer formed on the heat dissipation body.
- the liquid metal layer is disposed between the heat-generating structure and the anti-corrosion layer, and is opposite to the heat dissipation body.
- FIG. 1 is a scanning electron microscope (SEM) image of a crystalline phase of a needle-like copper-gallium compound
- FIGS. 2 to 4 illustrate an accumulation process of the copper-gallium compound
- FIG. 5 is a sectional view of a first embodiment of an electronic device according to the present disclosure.
- FIG. 6 is a sectional view of a second embodiment of the electronic device of this disclosure.
- FIG. 7 is a view similar to FIG. 6 , but illustrating how a blocking member of the second embodiment works when a liquid metal layer of the second embodiment is squeezed;
- FIG. 8 is a sectional view of a third embodiment of the electronic device of this disclosure.
- FIG. 9 is a view similar to FIG. 8 , but illustrating how a blocking member of the third embodiment works when a liquid metal layer of the third embodiment is squeezed;
- FIG. 10 is a sectional view of a fourth embodiment of the electronic device of this disclosure.
- FIG. 11 is a sectional view of a fifth embodiment of the electronic device of this disclosure.
- FIG. 12 is a sectional view of a sixth embodiment of the electronic device of this disclosure.
- FIG. 13 is a sectional view of a seventh embodiment of the electronic device of this disclosure.
- FIG. 14 is a view similar to FIG. 13 , but illustrating how a blocking member of the seventh embodiment works when a liquid metal layer of the seventh embodiment is squeezed;
- FIG. 15 is a sectional view of an eighth embodiment of the electronic device of this disclosure.
- FIG. 16 is a top view of the eighth embodiment.
- FIG. 17 is a sectional view illustrating how the eighth embodiment provides protection for the electronic device against corrosion by liquid metal.
- a heat dissipation structure 1 for dissipating heat from a heat-generating structure 2 .
- the heat dissipation structure 1 includes a liquid metal layer 11 and a heat dissipation unit 12 .
- the heat dissipation unit 12 includes a heat dissipation body 121 and an anti-corrosion layer 122 formed on the heat dissipation body 121 .
- the liquid metal layer 11 is disposed between the heat-generating structure 2 and the anti-corrosion layer 122 , and is opposite to the heat dissipation body 121 .
- the liquid metal layer 11 is in direct contact with the anti-corrosion layer 122 of the heat dissipation unit 12 .
- the heat dissipation body 121 may be made of, but not limited to, copper, aluminum, and alloys thereof.
- the anti-corrosion layer 122 is plated on the heat dissipation body 121 to prevent direct contact between the liquid metal layer 11 and the heat dissipation body 121 .
- the anti-corrosion layer 122 is made of metal or ceramic.
- the metal may be, but not limited to, nickel.
- Materials for the ceramic may be, but not limited to, silicate, metal oxide (e.g., aluminum oxide, zinc oxide, beryllium oxide, or the like), metal nitride (e.g., aluminum nitride, boron nitride, silicon nitride, or the like), carbide (e.g., silicon carbide, or the like), or metal hydroxide (e.g., aluminum hydroxide).
- the silicate may be made from feldspar, clay, quartz, or combinations thereof.
- the heat dissipation structure 1 further includes a blocking member 13 that is connected to the anti-corrosion layer 122 and that surrounds the liquid metal layer 11 .
- the electronic device 3 includes the heat dissipation structure 1 and a heat-generating structure 2 .
- the heat-generating structure 2 includes a substrate 21 , and an electronic component 22 disposed on the substrate 21 .
- the heat-generating structure 2 may be, for example, but not limited to, a central processing unit (CPU) or a graphics processing unit (GPU).
- the substrate 21 includes a printed circuit layer 211 located on top thereof, but is not limited thereto.
- the liquid metal layer 11 is disposed between the electronic component 22 and the anti-corrosion layer 122 , and is opposite to the heat dissipation body 121 .
- the liquid metal layer 11 is coated on the electronic component 22 , but is not limited thereto.
- the liquid metal layer 11 may be coated on the anti-corrosion layer 122 or on both of the electronic component 22 and the anti-corrosion layer 122 , as long as the liquid metal layer 11 is disposed between the heat-generating structure 2 and the heat dissipation unit 12 .
- the anti-corrosion layer 122 is plated on the heat dissipation body 121 , and is adhered to the liquid metal layer 11 so as to prevent the liquid metal layer 11 from directly contacting the heat dissipation body 121 during heat dissipation, thereby preventing the heat dissipation body 121 from being corroded by the liquid metal layer 11 or forming an intermetallic compound therewith.
- the anti-corrosion layer 122 of this embodiment is a nickel layer.
- a second embodiment of the electronic device 3 of this disclosure is substantially the same as the first embodiment, except that the electronic device 3 of the second embodiment further includes a blocking member 13 that is disposed between the substrate 21 and the anti-corrosion layer 122 , that is connected to the anti-corrosion layer 122 , and that surrounds the liquid metal layer 11 and the electronic component 22 .
- the blocking member 13 is spaced apart from the electronic component 22 , and may be disposed on the substrate 21 by adherence, latching, or integrating with the substrate 21 . Further, the blocking member 13 cooperates with the anti-corrosion layer 122 , the substrate 21 , and the electronic component 22 to define a receiving space 100 .
- the blocking member 13 can block and limit the portion of the liquid metal layer 11 within the receiving space 100 , preventing the liquid metal layer 11 from short circuiting or corroding other components of the electronic device 3 .
- a third embodiment of the electronic device 3 of this disclosure is substantially the same as the second embodiment, except that, in the third embodiment, the heat-generating structure 2 further includes a plurality of electronic elements 23 disposed on the substrate 21 within the receiving space 100 , and the electronic device 3 further includes an insulation layer 31 that is disposed in the receiving space 100 and that encapsulates the electronic elements 23 .
- the electronic elements 23 may be capacitors or other components. When the liquid metal layer 11 is squeezed, it will flow into a gap between the insulation layer 31 and the anti-corrosion layer 122 , as shown in FIG. 9 , and will not be in contact with the electronic elements 23 . Thus, the electronic elements 23 are prevented from contacting with the conductive liquid metal layer 11 and short circuiting.
- the insulation layer 31 may be an insulation paste or glue.
- a fourth embodiment of the electronic device 3 of this disclosure is substantially the same as the second embodiment, except that the electronic device 3 of the fourth embodiment further includes an insulation layer 31 that is disposed on the substrate 21 and that surrounds the electronic component 22 .
- the liquid metal layer 11 When the liquid metal layer 11 is squeezed, it will flow into a gap between the insulation layer 31 and the anti-corrosion layer 122 , and is prevented from contacting with the substrate 21 or other components of the electronic device 3 and short circuiting.
- a fifth embodiment of the electronic device 3 of this disclosure is substantially the same as the fourth embodiment, except that the heat-generating structure 2 of the fifth embodiment further includes a plurality of electronic elements 23 that are disposed on the substrate 21 , that surround the electronic component 22 , and that are encapsulated by the insulation layer 31 .
- a sixth embodiment of the electronic device 3 of this disclosure is substantially the same as the second embodiment, except that the electronic device 3 of the sixth embodiment further includes an insulation layer 31 disposed on the substrate 21 within the receiving space 100 and surrounding the electronic component 22 .
- the liquid metal layer 11 When the liquid metal layer 11 is squeezed, it will flow into a gap between the insulation layer 31 and the anti-corrosion layer 122 , and is prevented from contacting with the substrate 21 or other components of the electronic device 3 and short circuiting.
- a seventh embodiment of the electronic device 3 of this disclosure is substantially the same as the first embodiment, except that, in the seventh embodiment, the electronic device 3 further includes an insulation layer 31 that is disposed on the substrate 21 and that surrounds the electronic component 22 , and the heat dissipation structure 1 further includes a blocking member 13 connected between the insulation layer 31 and the anti-corrosion layer 122 and surrounding the liquid metal layer 11 and the electronic component 22 .
- the blocking member 13 cooperates with the anti-corrosion metal layer 122 , the insulation layer 31 , and the electronic component 22 to define a receiving space 100 .
- the liquid metal layer 11 is squeezed, a portion of the liquid metal layer 11 will fall down onto the insulation layer 31 within the receiving space 100 , and is prevented from contacting with the substrate 21 or other components of the electronic device 3 and short circuiting.
- an eighth embodiment of the electronic device 3 of this disclosure is substantially the same as the second embodiment.
- the heat-generating structure 2 further includes at least one electronic element 23 that is disposed on the substrate 21 .
- the electronic device 3 of this embodiment further includes a fixing adhesive 32 , an insulation layer 31 , and a stiffener ring 33 .
- the stiffener ring 33 is disposed between the substrate 21 and the anti-corrosion layer 122 , and is connected to the substrate 21 .
- the stiffener ring 33 is disposed between the substrate 21 and the insulation layer 31 .
- the at least one electronic element 23 is located between the electronic component 22 and the stiffener ring 33 .
- the fixing adhesive 32 is disposed on the substrate 21 , and is located between the electronic component 22 and the electronic elements 23 .
- the insulation layer 31 extends from the stiffener ring 33 to the fixing adhesive 32 , and divides the receiving space 100 into an upper receiving portion 101 and a lower receiving portion 102 .
- the upper receiving portion 101 is defined by the insulation layer 31 , a portion of the electronic component 22 , the blocking member 13 , and the anti-corrosion layer 122 .
- the lower receiving portion 102 is defined by the insulation layer 31 , the fixing adhesive 32 , the stiffener ring 33 , and the substrate 21 .
- the fixing adhesive 32 and the at least one electronic element 23 are located in the lower receiving portion 102 , and are covered by the insulation layer 31 .
- the blocking member 13 is disposed and clamped between the insulation layer 31 and the anti-corrosion layer 122 .
- an insulation paste or glue 17 may be provided in the lower receiving portion 102 and may encapsulate the electronic elements 23 to enhance the effect of insulating the at least one electronic element 23 .
- the fixing adhesive 32 has a square shape, and surrounds the electronic component 22 , as shown in FIG. 16 .
- the fixing adhesive 32 is a polymeric material, preferably double-sided tape and with an upper surface adhered to the insulation layer 31 and a lower surface adhered to the substrate 21 .
- the insulation layer 31 is an insulation film.
- the insulation layer 31 has an inner side connected to the fixing adhesive 32 and an outer side connected to the stiffener ring 33 .
- the insulation layer 31 is located above the electronic elements 23 in order to cover the same.
- the blocking member 13 is a polymeric material, and the polymeric material may be a foam tape.
- the blocking member 13 is a cushioning adhesive.
- the blocking member 13 has a lower surface adhered to the outer side of the insulation layer 31 and an upper surface adhered to the anti-corrosion layer 122 .
- the liquid metal layer 11 When the liquid metal layer 11 is squeezed and a portion thereof flows down onto the insulation layer 31 within the upper receiving portion 101 , as shown in FIG. 17 , the liquid metal layer 11 is prevented from contacting the electronic elements 23 and the substrate 21 through the blocking of the insulation layer 31 , the blocking member 13 , and the fixing adhesive 32 , so that the electronic elements 23 and other components of the electronic device 3 can be prevented from short circuiting and being damaged.
- Installation and locations of the fixing adhesive 32 , the insulation layer 31 , and the blocking member 13 are not limited to the disclosure, and can be subject to change according to the different configurations of the heat-generating structure 2 .
- the anti-corrosion layer 122 can prevent direct contact between the liquid metal layer 11 and the heat dissipation body 121 , so that reaction and corrosion between the two can be avoided, thereby improving the stability and durability of the heat dissipation structure 1 of this disclosure.
- the liquid metal layer 11 can be prevented from flowing out and damaging the electronic device 3 .
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- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
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- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
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Abstract
A heat dissipation structure adapted to dissipate heat from a heat-generating structure includes a heat dissipation unit and a liquid metal layer. The heat dissipation unit includes a heat dissipation body and an anti-corrosion metal layer formed on the heat dissipation body. The liquid metal layer is disposed between the heat-generating structure and the anti-corrosion metal layer, and is opposite to the heat dissipation body. An electronic device that adopts the heat dissipation structure is also disclosed.
Description
- This application is a Continuation of co-pending application Ser. No. 17/240,411, filed on Apr. 26, 2021, for which priority is claimed under 35 U.S.C. § 120; which claims priority of Taiwanese Utility Model Patent Application No. TW109204988U filed on Apr. 27, 2020 and Taiwanese Utility Model Patent Application No. TW110202467U filed on Mar. 9, 2021 under 35 U.S.C. § 119, the entire contents of all of which are hereby incorporated by reference.
- The disclosure relates to a heat dissipation structure and an electronic device adopting the same, and more particularly to a heat dissipation structure adapted to dissipate heat from a heat-generating structure and an electronic device adopting the same.
- A liquid metal is a metal or a metal alloy that is in a liquid state at room temperature due to its low melting point or that is in a liquid state when heated to its melting point. Some examples of liquid metal include gallium indium tin alloy, indium bismuth tin alloy, and indium bismuth zinc alloy. Liquid metals have high stability and exceptional thermal and electrical conductivity. Moreover, the specific heat capacity and thermal conductivity of the liquid metals are much higher than those of the traditional silicone conductive pastes, so that they are now used as a thermal conductive agent between a heat source and heat-dissipating fins or thermal modules.
- Aluminum or copper is often used as the main material for heat-dissipating fins or thermal modules. However, aluminum is easily corroded by gallium in the liquid metal, resulting in the damage of the heat-dissipating fins and losing the thermal conductivity of the liquid metal. On the other hand, compared to aluminum, copper has a much stable electron configuration due to the 10 electrons in its 3d orbital, and thus, copper does not corrode as easily as aluminum when in contact with gallium. Referring to
FIG. 1 , in actual practice, after a period of time and under high temperature, copper can still react with gallium to form a needle-like intermetallic compound CuGa, which is also known as liquid metal dry-out. This kind of intermetallic compound will continue to accumulate and thicken under long term use, as shown inFIGS. 2 to 4 , and finally cause the liquid metal to lose its thermal and electrical conductivity. Further, if the liquid metal comes into contact with an electronic component or substrate, it is also easy to cause short circuit damage. - Therefore, an object of the present disclosure is to provide a heat dissipation structure and an electronic device adopting the same that can alleviate at least one of the drawbacks of the prior art.
- According to a first aspect of the present disclosure, there is provided a heat dissipation structure adapted to dissipate heat from a heat-generating structure. The heat dissipation structure includes a heat dissipation unit and a liquid metal layer. The heat dissipation unit includes a heat dissipation body and an anti-corrosion layer formed on the heat dissipation body. The liquid metal layer is disposed between the heat-generating structure and the anti-corrosion layer, and is opposite to the heat dissipation body.
- According to a second aspect of the present disclosure, there is provided an electronic device which includes a heat-generating structure and a heat dissipation structure. The heat dissipation structure includes a heat dissipation unit and a liquid metal layer. The heat dissipation unit includes a heat dissipation body and an anti-corrosion layer formed on the heat dissipation body. The liquid metal layer is disposed between the heat-generating structure and the anti-corrosion layer, and is opposite to the heat dissipation body.
- Other features and advantages of the disclosure will become apparent in the following detailed description of the embodiments with reference to the accompanying drawings, of which:
-
FIG. 1 is a scanning electron microscope (SEM) image of a crystalline phase of a needle-like copper-gallium compound; -
FIGS. 2 to 4 illustrate an accumulation process of the copper-gallium compound; -
FIG. 5 is a sectional view of a first embodiment of an electronic device according to the present disclosure; -
FIG. 6 is a sectional view of a second embodiment of the electronic device of this disclosure; -
FIG. 7 is a view similar toFIG. 6 , but illustrating how a blocking member of the second embodiment works when a liquid metal layer of the second embodiment is squeezed; -
FIG. 8 is a sectional view of a third embodiment of the electronic device of this disclosure; -
FIG. 9 is a view similar toFIG. 8 , but illustrating how a blocking member of the third embodiment works when a liquid metal layer of the third embodiment is squeezed; -
FIG. 10 is a sectional view of a fourth embodiment of the electronic device of this disclosure; -
FIG. 11 is a sectional view of a fifth embodiment of the electronic device of this disclosure; -
FIG. 12 is a sectional view of a sixth embodiment of the electronic device of this disclosure; -
FIG. 13 is a sectional view of a seventh embodiment of the electronic device of this disclosure; -
FIG. 14 is a view similar toFIG. 13 , but illustrating how a blocking member of the seventh embodiment works when a liquid metal layer of the seventh embodiment is squeezed; -
FIG. 15 is a sectional view of an eighth embodiment of the electronic device of this disclosure; -
FIG. 16 is a top view of the eighth embodiment; and -
FIG. 17 is a sectional view illustrating how the eighth embodiment provides protection for the electronic device against corrosion by liquid metal. - Before the disclosure is described in greater detail, it should be noted that where considered appropriate, reference numerals or terminal portions of reference numerals have been repeated among the figures to indicate corresponding or analogous elements, which may optionally have similar characteristics.
- In the present disclosure, a
heat dissipation structure 1 is provided for dissipating heat from a heat-generatingstructure 2. Theheat dissipation structure 1 includes aliquid metal layer 11 and aheat dissipation unit 12. Theheat dissipation unit 12 includes aheat dissipation body 121 and ananti-corrosion layer 122 formed on theheat dissipation body 121. Theliquid metal layer 11 is disposed between the heat-generating structure 2 and theanti-corrosion layer 122, and is opposite to theheat dissipation body 121. In some embodiments, theliquid metal layer 11 is in direct contact with theanti-corrosion layer 122 of theheat dissipation unit 12. - In some embodiments, the
heat dissipation body 121 may be made of, but not limited to, copper, aluminum, and alloys thereof. - In some embodiments, the
anti-corrosion layer 122 is plated on theheat dissipation body 121 to prevent direct contact between theliquid metal layer 11 and theheat dissipation body 121. In certain embodiments, theanti-corrosion layer 122 is made of metal or ceramic. The metal may be, but not limited to, nickel. Materials for the ceramic may be, but not limited to, silicate, metal oxide (e.g., aluminum oxide, zinc oxide, beryllium oxide, or the like), metal nitride (e.g., aluminum nitride, boron nitride, silicon nitride, or the like), carbide (e.g., silicon carbide, or the like), or metal hydroxide (e.g., aluminum hydroxide). The silicate may be made from feldspar, clay, quartz, or combinations thereof. - In some embodiments, the
heat dissipation structure 1 further includes a blockingmember 13 that is connected to theanti-corrosion layer 122 and that surrounds theliquid metal layer 11. - Referring to
FIG. 5 , a first embodiment of anelectronic device 3 that adopts theheat dissipation structure 1 of this disclosure is provided. In this embodiment, theelectronic device 3 includes theheat dissipation structure 1 and a heat-generating structure 2. The heat-generating structure 2 includes asubstrate 21, and anelectronic component 22 disposed on thesubstrate 21. The heat-generating structure 2 may be, for example, but not limited to, a central processing unit (CPU) or a graphics processing unit (GPU). Thesubstrate 21 includes a printedcircuit layer 211 located on top thereof, but is not limited thereto. - The
liquid metal layer 11 is disposed between theelectronic component 22 and theanti-corrosion layer 122, and is opposite to theheat dissipation body 121. In this embodiment, theliquid metal layer 11 is coated on theelectronic component 22, but is not limited thereto. Theliquid metal layer 11 may be coated on theanti-corrosion layer 122 or on both of theelectronic component 22 and theanti-corrosion layer 122, as long as theliquid metal layer 11 is disposed between the heat-generatingstructure 2 and theheat dissipation unit 12. Further, in this embodiment, theanti-corrosion layer 122 is plated on theheat dissipation body 121, and is adhered to theliquid metal layer 11 so as to prevent theliquid metal layer 11 from directly contacting theheat dissipation body 121 during heat dissipation, thereby preventing theheat dissipation body 121 from being corroded by theliquid metal layer 11 or forming an intermetallic compound therewith. Thus, damage of theheat dissipation body 121 can be avoided, and the heat dissipation stability of theliquid metal layer 11 can be ensured. Theanti-corrosion layer 122 of this embodiment is a nickel layer. - Referring to
FIGS. 6 and 7 , a second embodiment of theelectronic device 3 of this disclosure is substantially the same as the first embodiment, except that theelectronic device 3 of the second embodiment further includes a blockingmember 13 that is disposed between thesubstrate 21 and theanti-corrosion layer 122, that is connected to theanti-corrosion layer 122, and that surrounds theliquid metal layer 11 and theelectronic component 22. The blockingmember 13 is spaced apart from theelectronic component 22, and may be disposed on thesubstrate 21 by adherence, latching, or integrating with thesubstrate 21. Further, the blockingmember 13 cooperates with theanti-corrosion layer 122, thesubstrate 21, and theelectronic component 22 to define a receivingspace 100. Due to the fluidity of theliquid metal layer 11 and when theliquid metal layer 11 is squeezed, a portion of theliquid metal layer 11 may fall down onto thesubstrate 21, as shown inFIG. 7 . Under the aforesaid circumstance, the blockingmember 13 can block and limit the portion of theliquid metal layer 11 within the receivingspace 100, preventing theliquid metal layer 11 from short circuiting or corroding other components of theelectronic device 3. - Referring to
FIGS. 8 and 9 , a third embodiment of theelectronic device 3 of this disclosure is substantially the same as the second embodiment, except that, in the third embodiment, the heat-generatingstructure 2 further includes a plurality ofelectronic elements 23 disposed on thesubstrate 21 within the receivingspace 100, and theelectronic device 3 further includes aninsulation layer 31 that is disposed in the receivingspace 100 and that encapsulates theelectronic elements 23. Theelectronic elements 23 may be capacitors or other components. When theliquid metal layer 11 is squeezed, it will flow into a gap between theinsulation layer 31 and theanti-corrosion layer 122, as shown inFIG. 9 , and will not be in contact with theelectronic elements 23. Thus, theelectronic elements 23 are prevented from contacting with the conductiveliquid metal layer 11 and short circuiting. Theinsulation layer 31 may be an insulation paste or glue. - Referring to
FIG. 10 , a fourth embodiment of theelectronic device 3 of this disclosure is substantially the same as the second embodiment, except that theelectronic device 3 of the fourth embodiment further includes aninsulation layer 31 that is disposed on thesubstrate 21 and that surrounds theelectronic component 22. When theliquid metal layer 11 is squeezed, it will flow into a gap between theinsulation layer 31 and theanti-corrosion layer 122, and is prevented from contacting with thesubstrate 21 or other components of theelectronic device 3 and short circuiting. - Referring to
FIG. 11 , a fifth embodiment of theelectronic device 3 of this disclosure is substantially the same as the fourth embodiment, except that the heat-generatingstructure 2 of the fifth embodiment further includes a plurality ofelectronic elements 23 that are disposed on thesubstrate 21, that surround theelectronic component 22, and that are encapsulated by theinsulation layer 31. - Referring to
FIG. 12 , a sixth embodiment of theelectronic device 3 of this disclosure is substantially the same as the second embodiment, except that theelectronic device 3 of the sixth embodiment further includes aninsulation layer 31 disposed on thesubstrate 21 within the receivingspace 100 and surrounding theelectronic component 22. When theliquid metal layer 11 is squeezed, it will flow into a gap between theinsulation layer 31 and theanti-corrosion layer 122, and is prevented from contacting with thesubstrate 21 or other components of theelectronic device 3 and short circuiting. - Referring to
FIGS. 13 and 14 , a seventh embodiment of theelectronic device 3 of this disclosure is substantially the same as the first embodiment, except that, in the seventh embodiment, theelectronic device 3 further includes aninsulation layer 31 that is disposed on thesubstrate 21 and that surrounds theelectronic component 22, and theheat dissipation structure 1 further includes a blockingmember 13 connected between theinsulation layer 31 and theanti-corrosion layer 122 and surrounding theliquid metal layer 11 and theelectronic component 22. The blockingmember 13 cooperates with theanti-corrosion metal layer 122, theinsulation layer 31, and theelectronic component 22 to define a receivingspace 100. When theliquid metal layer 11 is squeezed, a portion of theliquid metal layer 11 will fall down onto theinsulation layer 31 within the receivingspace 100, and is prevented from contacting with thesubstrate 21 or other components of theelectronic device 3 and short circuiting. - Referring to
FIGS. 15 to 17 , an eighth embodiment of theelectronic device 3 of this disclosure is substantially the same as the second embodiment. However, in the eighth embodiment, the heat-generatingstructure 2 further includes at least oneelectronic element 23 that is disposed on thesubstrate 21. Theelectronic device 3 of this embodiment further includes a fixingadhesive 32, aninsulation layer 31, and astiffener ring 33. Thestiffener ring 33 is disposed between thesubstrate 21 and theanti-corrosion layer 122, and is connected to thesubstrate 21. In certain embodiments, thestiffener ring 33 is disposed between thesubstrate 21 and theinsulation layer 31. The at least oneelectronic element 23 is located between theelectronic component 22 and thestiffener ring 33. The fixingadhesive 32 is disposed on thesubstrate 21, and is located between theelectronic component 22 and theelectronic elements 23. Theinsulation layer 31 extends from thestiffener ring 33 to the fixingadhesive 32, and divides the receivingspace 100 into anupper receiving portion 101 and alower receiving portion 102. Theupper receiving portion 101 is defined by theinsulation layer 31, a portion of theelectronic component 22, the blockingmember 13, and theanti-corrosion layer 122. Thelower receiving portion 102 is defined by theinsulation layer 31, the fixingadhesive 32, thestiffener ring 33, and thesubstrate 21. The fixingadhesive 32 and the at least oneelectronic element 23 are located in thelower receiving portion 102, and are covered by theinsulation layer 31. The blockingmember 13 is disposed and clamped between theinsulation layer 31 and theanti-corrosion layer 122. It should be noted herein that, in this embodiment, an insulation paste orglue 17 may be provided in thelower receiving portion 102 and may encapsulate theelectronic elements 23 to enhance the effect of insulating the at least oneelectronic element 23. - In this embodiment, the fixing
adhesive 32 has a square shape, and surrounds theelectronic component 22, as shown inFIG. 16 . The fixingadhesive 32 is a polymeric material, preferably double-sided tape and with an upper surface adhered to theinsulation layer 31 and a lower surface adhered to thesubstrate 21. Theinsulation layer 31 is an insulation film. In this embodiment, theinsulation layer 31 has an inner side connected to the fixingadhesive 32 and an outer side connected to thestiffener ring 33. Further, theinsulation layer 31 is located above theelectronic elements 23 in order to cover the same. In certain embodiments, the blockingmember 13 is a polymeric material, and the polymeric material may be a foam tape. In certain embodiment the blockingmember 13 is a cushioning adhesive. The blockingmember 13 has a lower surface adhered to the outer side of theinsulation layer 31 and an upper surface adhered to theanti-corrosion layer 122. - When the
liquid metal layer 11 is squeezed and a portion thereof flows down onto theinsulation layer 31 within the upper receivingportion 101, as shown inFIG. 17 , theliquid metal layer 11 is prevented from contacting theelectronic elements 23 and thesubstrate 21 through the blocking of theinsulation layer 31, the blockingmember 13, and the fixingadhesive 32, so that theelectronic elements 23 and other components of theelectronic device 3 can be prevented from short circuiting and being damaged. - Installation and locations of the fixing
adhesive 32, theinsulation layer 31, and the blockingmember 13 are not limited to the disclosure, and can be subject to change according to the different configurations of the heat-generatingstructure 2. - In view of the aforesaid, by forming an
anti-corrosion layer 122 on theheat dissipation body 121 of theheat dissipation unit 12, theanti-corrosion layer 122 can prevent direct contact between theliquid metal layer 11 and theheat dissipation body 121, so that reaction and corrosion between the two can be avoided, thereby improving the stability and durability of theheat dissipation structure 1 of this disclosure. Moreover, by providing the blockingmember 13 and theinsulation layer 31 in theelectronic device 3, theliquid metal layer 11 can be prevented from flowing out and damaging theelectronic device 3. - In the description above, for the purposes of explanation, numerous specific details have been set forth in order to provide a thorough understanding of the embodiment(s). It will be apparent, however, to one skilled in the art, that one or more other embodiments may be practiced without some of these specific details. It should also be appreciated that reference throughout this specification to “one embodiment,” “an embodiment,” an embodiment with an indication of an ordinal number and so forth means that a particular feature, structure, or characteristic may be included in the practice of the disclosure. It should be further appreciated that in the description, various features are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of various inventive aspects, and that one or more features or specific details from one embodiment may be practiced together with one or more features or specific details from another embodiment, where appropriate, in the practice of the disclosure.
- While the disclosure has been described in connection with what are considered the exemplary embodiments, it is understood that this disclosure is not limited to the disclosed embodiment(s) but is intended to cover various arrangements included within the spirit and scope of the broadest interpretation so as to encompass all such modifications and equivalent arrangements.
Claims (4)
1. An electronic device (3), comprising:
a heat-generating structure (2) including a substrate (21) and an electronic component (22) disposed on said substrate (21);
a heat dissipation structure (1) including
a heat dissipation unit (12) that includes a heat dissipation body (121) and an anti-corrosion layer (122) formed on said heat dissipation body (121), and
a liquid metal layer (11) disposed between said electronic component (22) and said anti-corrosion layer (122) and opposite to said heat dissipation body (121); and
an insulation layer (31) that is disposed on said substrate (21) and that surrounds said electronic component (22).
2. The electronic device (3) as claimed in claim 1 , wherein said heat-generating structure (2) further includes at least one electronic element (23) that is disposed on said substrate (21) , that is located between said electronic component (22) and said blocking member (13), and that is encapsulated by said insulation layer (31).
3. The electronic device (3) as claimed in claim 1 , wherein said anti-corrosion layer (122) is made of metal or ceramic.
4. The electronic device (3) as claimed in claim 1 , wherein said heat dissipation body (121) is made of copper, aluminum, or alloys thereof.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US18/163,651 US20230180441A1 (en) | 2020-04-27 | 2023-02-02 | Heat dissipation structure and electronic device adopting the same |
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW109204988U TWM598743U (en) | 2020-04-27 | 2020-04-27 | Heat sink |
| TW109204988 | 2020-04-27 | ||
| TW110202467U TWM613290U (en) | 2021-03-09 | 2021-03-09 | Heat dissipation apparatus |
| TW110202467 | 2021-03-09 | ||
| US17/240,441 US11758691B2 (en) | 2020-04-27 | 2021-04-26 | Heat dissipation structure and electronic device adopting the same |
| US18/163,651 US20230180441A1 (en) | 2020-04-27 | 2023-02-02 | Heat dissipation structure and electronic device adopting the same |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US17/240,441 Continuation US11758691B2 (en) | 2020-04-27 | 2021-04-26 | Heat dissipation structure and electronic device adopting the same |
Publications (1)
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| US20230180441A1 true US20230180441A1 (en) | 2023-06-08 |
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| US17/240,441 Active 2041-10-12 US11758691B2 (en) | 2020-04-27 | 2021-04-26 | Heat dissipation structure and electronic device adopting the same |
| US18/163,651 Abandoned US20230180441A1 (en) | 2020-04-27 | 2023-02-02 | Heat dissipation structure and electronic device adopting the same |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US17/240,441 Active 2041-10-12 US11758691B2 (en) | 2020-04-27 | 2021-04-26 | Heat dissipation structure and electronic device adopting the same |
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| US (2) | US11758691B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20230240047A1 (en) * | 2022-01-07 | 2023-07-27 | Lenovo (Singapore) Pte. Ltd. | Heat dissipation structure, method for manufacturing heat dissipation structure, and electronic apparatus |
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| WO2021149161A1 (en) * | 2020-01-21 | 2021-07-29 | 三菱電機株式会社 | Heat dissipation member and heat sink |
| DE102020114527B4 (en) * | 2020-05-29 | 2023-11-30 | Infineon Technologies Ag | CHIP HOUSING AND METHOD FOR FORMING A CHIP HOUSING |
| US12309977B2 (en) * | 2021-07-12 | 2025-05-20 | Dell Products L.P. | Management with a liquid metal embedded elastomer |
| CN216749870U (en) * | 2021-12-10 | 2022-06-14 | 云南中宣液态金属科技有限公司 | Liquid metal packaging structure for chip heat dissipation |
| JP7242824B1 (en) | 2021-12-16 | 2023-03-20 | レノボ・シンガポール・プライベート・リミテッド | Heat dissipation structure and electronic equipment |
| CN114980486B (en) * | 2022-05-20 | 2024-11-26 | 联想(北京)有限公司 | A heat dissipation protection structure and electronic device packaging |
| JP7362854B1 (en) * | 2022-07-28 | 2023-10-17 | レノボ・シンガポール・プライベート・リミテッド | Heat dissipation structure and electronic equipment |
| JP7554303B1 (en) * | 2023-03-01 | 2024-09-19 | レノボ・シンガポール・プライベート・リミテッド | Heat dissipation structure and portable information device |
| US12191234B2 (en) * | 2023-05-17 | 2025-01-07 | Adeia Semiconductor Bonding Technologies Inc. | Integrated cooling assemblies for advanced device packaging and methods of manufacturing the same |
| US12283490B1 (en) | 2023-12-21 | 2025-04-22 | Adeia Semiconductor Bonding Technologies Inc. | Integrated cooling assemblies for advanced device packaging and methods of manufacturing the same |
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| US4323914A (en) * | 1979-02-01 | 1982-04-06 | International Business Machines Corporation | Heat transfer structure for integrated circuit package |
| US7061099B2 (en) * | 2004-09-30 | 2006-06-13 | Intel Corporation | Microelectronic package having chamber sealed by material including one or more intermetallic compounds |
| US20060120051A1 (en) * | 2004-12-03 | 2006-06-08 | Chris Macris | Liquid metal thermal interface material system |
| US7554190B2 (en) * | 2004-12-03 | 2009-06-30 | Chris Macris | Liquid metal thermal interface material system |
| US20060131738A1 (en) * | 2004-12-17 | 2006-06-22 | Furman Bruce K | Method and apparatus for chip cooling using a liquid metal thermal interface |
| US7663227B2 (en) * | 2005-10-11 | 2010-02-16 | Macris Chris G | Liquid metal thermal interface material system |
| US7440281B2 (en) * | 2006-02-01 | 2008-10-21 | Apple Inc. | Thermal interface apparatus |
| US7694719B2 (en) * | 2007-01-04 | 2010-04-13 | International Business Machines Corporation | Patterned metal thermal interface |
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| US20110240279A1 (en) * | 2010-03-30 | 2011-10-06 | International Business Machines Corporation | Hybrid liquid metal-solder thermal interface |
| US8477500B2 (en) * | 2010-05-25 | 2013-07-02 | General Electric Company | Locking device and method for making the same |
| US11031319B2 (en) * | 2016-10-06 | 2021-06-08 | Hewlett-Packard Development Company, L.P. | Thermal interface materials with adhesive selant for electronic components |
| US20210125896A1 (en) * | 2019-10-24 | 2021-04-29 | Intel Corporation | Filled liquid metal thermal interface materials |
| US11869824B2 (en) * | 2019-11-04 | 2024-01-09 | Intel Corporation | Thermal interface structures for integrated circuit packages |
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- 2021-04-26 US US17/240,441 patent/US11758691B2/en active Active
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2023
- 2023-02-02 US US18/163,651 patent/US20230180441A1/en not_active Abandoned
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20230240047A1 (en) * | 2022-01-07 | 2023-07-27 | Lenovo (Singapore) Pte. Ltd. | Heat dissipation structure, method for manufacturing heat dissipation structure, and electronic apparatus |
| US12238897B2 (en) * | 2022-01-07 | 2025-02-25 | Lenovo (Singapore) Pte. Ltd. | Heat dissipation structure, method for manufacturing heat dissipation structure, and electronic apparatus |
Also Published As
| Publication number | Publication date |
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| US20210337696A1 (en) | 2021-10-28 |
| US11758691B2 (en) | 2023-09-12 |
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