US20200092830A1 - Quick-start high-voltage boost - Google Patents
Quick-start high-voltage boost Download PDFInfo
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- US20200092830A1 US20200092830A1 US16/563,821 US201916563821A US2020092830A1 US 20200092830 A1 US20200092830 A1 US 20200092830A1 US 201916563821 A US201916563821 A US 201916563821A US 2020092830 A1 US2020092830 A1 US 2020092830A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W52/00—Power management, e.g. TPC [Transmission Power Control], power saving or power classes
- H04W52/04—TPC
- H04W52/30—TPC using constraints in the total amount of available transmission power
- H04W52/36—TPC using constraints in the total amount of available transmission power with a discrete range or set of values, e.g. step size, ramping or offsets
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/14—Arrangements for reducing ripples from dc input or output
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/36—Means for starting or stopping converters
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
- H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
- H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
- H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
- H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
- H02M3/156—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/02—Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation
- H03F1/0205—Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation in transistor amplifiers
- H03F1/0211—Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation in transistor amplifiers with control of the supply voltage or current
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/32—Modifications of amplifiers to reduce non-linear distortion
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High frequency amplifiers, e.g. radio frequency amplifiers
- H03F3/19—High frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
- H03F3/24—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
- H03F3/24—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages
- H03F3/245—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers of transmitter output stages with semiconductor devices only
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0003—Details of control, feedback or regulation circuits
- H02M1/0009—Devices or circuits for detecting current in a converter
-
- H02M2001/0009—
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/451—Indexing scheme relating to amplifiers the amplifier being a radio frequency amplifier
Definitions
- the present disclosure relates to power amplifiers in radio-frequency (RF) applications.
- RF radio-frequency
- Power amplifiers are widely used in various communication networks to set the transmission power level of an information-bearing signal transmitted by one device to another device.
- power amplifiers are used to set the pulse energy emitted by pulsed lasers in optical communication networks.
- Power amplifiers are also used in the radio frequency (RF) front-end components of wireless carrier network devices—such as base stations, repeaters, and mobile client devices (e.g. mobile phones, smartphones, tablet computers, etc.)—to set the power level of a wireless signal transmitted through an antenna.
- RF radio frequency
- PAs are also used in local area networks of homes and offices to support both wired and wireless connectivity of servers, computers, laptops, and peripheral devices such as photocopiers and printers.
- PAs use a boost converter for DC-to-DC power conversion when the PAs output voltage should be greater than its input voltage.
- a boost converter with a compensated error-amplifier has an intrinsic soft-start feature. With the capacitor at the error-amplifier output slowly being charged up, the duty cycle of the boost is slowly increased, leading to a slow increase of the boost output voltage.
- the boost converter in order to use a boost converter to power a high-voltage PA, the boost converter is specified to ramp up at a rate of 570 mV/ ⁇ s in order to avoid any signal distortion at the output of the PA.
- the fast ramp-rate of the boost output voltage not only limits the value of the output capacitor, but also posts a challenge on circuit design and architecture to work against the slow soft-start nature of the error amplifier.
- the present disclosure relates to a voltage boost assembly including a boost converter having a capacitive element arranged at an output, and an inductive element connectable to an electrical supply.
- the voltage boost assembly also includes a sensor assembly provided to generate a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold.
- the voltage boost assembly further includes a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output.
- the inductive element is provided to establish an output current level.
- detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an electrical output (e.g., an output voltage) that is at least 10% higher than the current electrical output of the boost converter.
- detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an electrical output (e.g., an output voltage) that is at least 20% higher than the current electrical output of the boost converter.
- the quick-start module includes a charging circuit provided to charge the capacitive element so that an electrical output (e.g., an output voltage) of an associated error amplifier satisfies a third threshold in response to the quick-start enable signal.
- the third threshold is characterized in relation to a high voltage level that can be sustained at the output of the error amplifier.
- the quick-start module includes a saturation limiting circuit provided to limit current through the inductive element to establish the output current in response to the quick-start enable signal.
- the current through the inductive element is limited to a level that is characterized by a saturation condition of the inductive element.
- the quick-start module includes a ripple control module provided to reduce current ripple in the output current level by adjustment of a switching frequency in response to the quick-start enable signal.
- the ripple control module includes an oscillator that provides a switching frequency that is increased in response to the quick-start enable signal.
- the second threshold is characterized by a current level available to charge the capacitive element.
- the sensor assembly is configured to turn off the quick-start enable signal in response to determining that the electrical output of the boost converter has satisfied a fourth threshold.
- the fourth threshold is approximately 95% of a set-point output level.
- the present disclosure relates to a module that includes a packaging substrate configured to receive a plurality of components.
- the module also includes a power amplifier.
- the module further includes a voltage boost assembly, including a boost converter configured for a power amplifier included on at least a portion of the substrate, the boost converter having a capacitive element arranged at the output, and an inductive element connectable to an electrical supply.
- the voltage boost assembly also includes a sensor assembly provided to generate a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold.
- the voltage boost assembly further includes a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output.
- the quick-start module includes a charging circuit provided to charge the capacitive element so that the output of an associated error amplifier satisfies a third threshold in response to the quick-start enable signal.
- the quick-start module includes a saturation limiting circuit provided to limit current through the inductive element coupled to establish the output current level in response to the quick-start enable signal.
- the quick-start module includes a ripple control module provided to reduce current ripple in the output current level by adjustment of a switching frequency in response to the quick-start enable signal.
- the quick-start module is configured to turn off the quick-start enable signal in response to determining that the electrical output of the boost converter has satisfied a third threshold.
- the module is at least one of a power amplifier module (PAM) or a front-end module (FEM).
- PAM power amplifier module
- FEM front-end module
- the voltage boost assembly of the module includes the functions and/or features of any of the voltage boost assemblies described herein.
- the present disclosure relates to a radio-frequency (RF) device that includes a transceiver generate to an RF signal.
- the RF device also includes a front-end module (FEM) in communication with the transceiver, the FEM including a packaging substrate configured to receive a plurality of components, the FEM further including a voltage boost assembly on the packaging substrate, the voltage boost assembly including a boost converter having a capacitive element arranged at the output, and an inductive element connectable to an electrical supply a sensor assembly provided to generate, the voltage boost assembly also including a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold, and the voltage boost assembly further including a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output.
- the RF device further includes an antenna
- the RF device includes a wireless device.
- the wireless device includes at least one of a base station, a repeater, a cellular phone, a smartphone, a computer, a laptop, a tablet computer, and a peripheral device.
- the voltage boost assembly of the FEM module includes the functions and/or features of any of voltage boost assemblies described herein.
- the present disclosure relates to a method of ramping up the output of a boost converter.
- the method includes sensing that an electrical condition relative to an electrical output of the boost converter has breached a first threshold.
- the method further also generating a quick-start enable signal in response to sensing the breach of the first threshold.
- the method further includes driving a boost converter to deliver an output current that satisfies a second threshold in order to charge a capacitive element arranged at the output of the boost converter by charging the capacitive element so that the output of an associated error amplifier satisfies a third threshold, limiting the current through an inductive element coupled to a supply, and increasing a switching frequency in order to reduce ripple.
- FIG. 1 is a block diagram of a voltage boost assembly according to some implementations.
- FIG. 2 is a schematic diagram of the voltage boost assembly in FIG. 1 according to some implementations.
- FIG. 3 is a schematic diagram of a portion of the voltage boost assembly in FIG. 1 according to some implementations.
- FIG. 4 shows example performance plots of the voltage boost assembly in FIG. 1 according to some implementations.
- FIG. 5 is a flowchart representation of a method of operating the voltage boost assembly in FIG. 1 according to some implementations.
- FIG. 6A-6C are block diagrams of different integrated circuit (IC) implementations of the voltage boost assembly in FIG. 1 according to some implementations.
- IC integrated circuit
- FIG. 7 is a block diagram of an example module according to some implementations.
- FIG. 8 is a block diagram of an example radio frequency (RF) device according to some implementations.
- RF radio frequency
- a boost converter is specified to ramp up at a rate of 570 mV/ ⁇ s in order to avoid any signal distortion at the output of the PA.
- a 1 ⁇ F capacitor is used as the output capacitor.
- the boost converter activates a quick-start module.
- the quick-start circuit module includes at least one of a charging circuit, a saturation limiting circuit, or a ripple control module.
- the quick-start circuit module includes a charging circuit with a current source that is turned on to force the output voltage of the error amplifier satisfy a predefined value (e.g., 1.1 V or 1.2 V). In other words, the charging circuit requests the boost converter to run at maximum duty-cycle.
- the quick-start circuit module includes a saturation limiting circuit which sets the current-limit of the boost converter to a predetermined level (e.g., 2.5 A) to prevent an inductive element of the boost converter from being saturated. In other words, the saturation limiting circuit allows enough current into the output.
- the quick-start circuit module includes a ripple control module which increases the switching frequency of the boost converter above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz) to achieve lower ripple through the inductive element.
- the quick-start module when the output voltage of the boost converter is sensed to reach 95% of its set-point, the quick-start module is turned off.
- the quick-start module allows the boost to be operated at high duty-cycle, pumping a maximum amount of current to charge the capacitor at the boost output.
- FIG. 1 is a block diagram of a voltage boost assembly 100 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, in some implementations, the voltage boost assembly 100 includes a quick-start assembly 115 and a boost converter 130 . According to some implementations, the quick-start assembly 115 includes a sensor assembly 110 and a quick-start module 120 .
- the sensor assembly 110 is configured to provide an enable signal to the quick-start module 120 when one or more predetermined quick-start enable conditions are satisfied. In one example, the quick-start enable conditions are satisfied when V IN 102 ⁇ V REF 104 and 0.8*V REF 104 >V OUT 106 . In some implementations, the sensor assembly 110 is configured to provide a disable signal to the quick-start module 120 when one or more predetermined quick-start disable conditions are satisfied. In one example, the quick-start disable conditions are satisfied when 0.95*V REF 104 ⁇ V OUT 106 or V IN 102 >V REF 104 .
- the quick-start module 120 includes a charging circuit 122 , a saturation limiting circuit 124 , and a ripple control module 126 .
- the boost converter 130 includes a capacitive element 132 , an inductive element 134 , and an error amplifier 136 .
- the inductive element 134 is provided to establish an output current level.
- the charging circuit 122 is configured to force the output of the error amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V). For example, in some implementations, this forces the error amplifier 136 to run at a duty cycle that satisfies a predefined threshold (e.g., 100% or maximum duty cycle).
- a predefined threshold e.g., 100% or maximum duty cycle.
- the saturation limiting circuit 124 is configured to set a limit of the current flowing through the inductive element 134 to a predetermined output level (e.g., 2.5 A). For example, in some implementations, this prevents saturation of the inductive element 134 .
- the ripple control module 126 is configured to increase the switching frequency of an oscillator 128 above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz). For example, in some implementations, this reduces ripple in the current flowing through the inductive element 134 .
- FIG. 2 is a schematic diagram of the voltage boost assembly 100 in FIG. 1 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. Elements common to FIGS. 1-2 include common reference numbers, and only the differences between FIGS. 1-2 are described herein for the sake of brevity. To that end, in some implementations, the voltage boost assembly 100 includes resistive elements 246 and 248 , V OUT precharge 204 (e.g., the output voltage prior to the capacitive element 132 ), and V OUT 106 (e.g., the output voltage after the capacitive element 132 ).
- V OUT precharge 204 e.g., the output voltage prior to the capacitive element 132
- V OUT 106 e.g., the output voltage after the capacitive element 132
- PFET p-channel field-effect transistor
- the value of the inductive element 134 is, for example, 1.5 pH
- the value of the capacitive element 132 is, for example, 1 ⁇ F.
- the quick-start assembly 115 is coupled with the output of error amplifier 136 .
- the quick-start assembly 115 or a component thereof e.g., the charging circuit 122 in FIG. 1
- a predefined value e.g., 1.1 V or 1.2 V.
- the quick-start assembly 115 provides an input to current limit comparator 224 .
- the quick-start assembly 115 or a component thereof e.g., the saturation limiting circuit 124 in FIG. 1
- a predetermined output level e.g., 2.5 A
- the quick-start assembly 115 provides an input to summation element 236 to compensate for the oscillator slope.
- the quick-start assembly 115 or a component thereof e.g., the ripple control module 126 in FIG. 1
- the switching frequency is configured to increase the switching frequency above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz).
- the output of the error amplifier 136 provides an input to pulse-width modulation (PWM) comparator 222 .
- PWM pulse-width modulation
- the output of the error amplifier 136 is also coupled with a shunt resistance element 242 (e.g., 80 k ⁇ ) and a shunt capacitance element 244 (e.g., 100 ⁇ F), which are connected in series to ground.
- the output of the PWM comparator 222 provides an input to OR gate 226
- the output of the current limit comparator 224 provides another input to the OR gate 226 .
- the output of the OR gate 226 provides an input to SR latch 228 (e.g., the R input) along with a clock (CLK) signal (e.g., the S input).
- the output of the SR latch 228 (e.g., the Q output) provides an input to a driver amplifier 230 .
- the source of the NFET 230 is coupled with the output of the inductive element 134 , and the drain of the NFET 230 is coupled with ground.
- NFET n-channel field-effect transistor
- the output of the inductive element 134 provides an input to differential amplifier 232 .
- the source of NFET 234 provides another input to the differential amplifier 232 .
- the gate of NFET 234 is coupled with V OUT 106
- the drain of NFET 234 is coupled with ground.
- the output of the differential amplifier 232 provides an input to the current limit comparator 224 and the summation element 236 .
- FIG. 3 is a schematic diagram of a portion of the voltage boost assembly 100 in FIG. 1 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. Elements common to FIGS. 1-3 include common reference numbers, and only the differences between FIGS. 1-3 are described herein for the sake of brevity. To that end, in some implementations, the quick-start assembly 115 : includes comparators 302 , 304 , and 306 ; differential amplifiers 308 and 310 ; SR latch 314 ; AND gate 316 ; NFET 318 ; and current source 320 .
- the comparators 304 and 306 provide inputs to the SR latch 314 (e.g., the S and R inputs, respectively).
- the comparator 302 and the SR latch 314 (e.g., the Q output) provide inputs to the AND gate 316 .
- the output of the AND gate 316 is logic high (e.g., 1 ) and the voltage boost assembly 100 operates under quick-start parameters.
- the current flowing through the inductive element 134 is set to a predetermined output level (e.g., 2.5 A)
- the switching frequency is increased above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz)
- the current source 320 supplies a predefined current (e.g., 10 ⁇ A) so that the output of the error amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V).
- a predefined current e.g. 10 ⁇ A
- V REF 104 and V OUT 106 provide inputs to the differential amplifier 308 .
- the output of the differential amplifier 308 and V bg 312 provide inputs to the differential amplifier 310 .
- the output of the differential amplifier 310 is coupled to the gate of NFET 318 .
- the NFET 318 and differential amplifiers 308 and 310 clamp the output of the error amplifier 136 at 1.2 V.
- FIG. 4 shows example performance plots of the voltage boost assembly 100 in FIG. 1 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, in some implementations, example performance plot 410 shows V OUT 106 over time. For example, as shown in example performance plot 410 , V OUT 106 increases from approximately 3.8 V to 9.5 V in approximately 10 ⁇ s.
- example performance plot 420 shows V REF 104 versus time. For example, as shown in example performance plot 420 , V REF 104 increases from approximately 0.5 V to 2.0 V.
- example performance plot 430 shows the output voltage of the error amplifier 136 versus time. For example, as shown in example performance plot 430 , the output voltage of the error amplifier 136 is clamped at 1.2 V during the quick-start period between 5 and 10 ⁇ s.
- example performance plot 440 shows the current flowing through the inductive element 134 versus time.
- the current flowing through the inductive element 134 is limited to 2.5 A during the quick-start period between 5 and 10 ⁇ s.
- FIG. 5 is a flowchart representation of a method 500 of operating the voltage boost assembly 100 in FIG. 1 in accordance with some implementations.
- the method 500 is performed by the voltage boost assembly 100 in FIG. 1 or a controller associated therewith. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, briefly, in some circumstances, the method 500 includes: powering on a voltage boost assembly; determining whether quick-start conditions are satisfied; operating the voltage boost assembly under regular parameters if the quick-start conditions are not satisfied; and operating the voltage boost assembly under quick-start parameters if the quick-start conditions are satisfied.
- the method 500 includes powering on a voltage boost assembly.
- the voltage boost assembly 100 initiates operation when the associated device (e.g., a mobile phone or the like) is powered on.
- the voltage boost assembly 100 is powered on when the PFET associated with boost control 202 is in an “on” state, which allows current to flow from the inductive element 134 to the capacitive element 132 .
- the method 500 includes determining whether quick-start enable conditions are satisfied.
- the sensor assembly 110 senses whether an electrical condition relative to an electrical output of the boost converter (e.g., V OUT 106 ) has breached a first threshold.
- the quick-start enable conditions are satisfied when V IN 102 ⁇ V REF 104 and 0.8*V REF 104 >V OUT 106 .
- the method continues to block 5 - 3 . If the quick-start enable conditions are satisfied, the method continues to block 5 - 4 .
- the sensor assembly 110 generates a quick-start enable signal and provides the quick-start enable signal to the quick-start module 120 in response to sensing that the first threshold has been breached.
- detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an output voltage that is at least 10% higher than the current output voltage.
- detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an output voltage that is at least 20% higher than the current output voltage.
- the output of the AND gate 316 is logic high (e.g., 1 ) and the voltage boost assembly 100 operates under quick-start parameters.
- the method 500 includes operating the voltage boost assembly under regular parameters.
- the method 500 includes operating the voltage boost assembly under quick-start parameters.
- the quick-start module 120 is configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge a capacitive element arranged at the output in response to the quick-start enable signal.
- the second threshold is characterized by a current level available to charge the capacitive element.
- the method 500 includes enabling the charging circuit.
- the quick-start module 120 includes a charging circuit 122 provided to charge the capacitive element 132 so that the output of an associated error amplifier satisfies a third threshold in response to the quick-start enable signal.
- the third threshold is characterized in relation to a high voltage level that can be sustained at the output of the error amplifier.
- the charging circuit 122 is configured to force the output of the error amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V). For example, in some implementations, this forces the error amplifier 136 to run at a duty cycle that satisfies a predefined threshold (e.g., 100% or maximum duty cycle).
- the method 500 includes enabling the saturation limiting circuit.
- the quick-start module 120 includes a saturation limiting circuit 124 provided to limit current through the inductive element 134 of the boost converter 130 to establish the output current level in response to the quick-start enable signal.
- the current through the inductive element 134 is limited to a level that is characterized by a saturation condition of the inductive element 134 .
- the saturation limiting circuit 124 is configured to set a limit of the current flowing through the inductive element 134 to a predetermined output level (e.g., 2.5 A). For example, in some implementations, this prevents saturation of the inductive element 134 .
- the method 500 includes enabling the ripple control module.
- the quick-start module 120 includes a ripple control module 136 provided to reduce current ripple in the output current level by adjustment of a switching frequency in response to the quick-start enable signal.
- the ripple control module 134 includes an oscillator 128 that provides switching frequency that is increased in response to the quick-start enable signal.
- ripple control module 126 is configured to increase the switching frequency of an oscillator 128 above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz). For example, in some implementations, this reduces ripple in the current flowing through the inductive element 134 .
- the method 500 includes determining whether quick-start disable conditions are satisfied.
- the sensor assembly 110 is configured to turn off the quick-start enable signal in response to determining that the electrical output of the boost converter 130 (e.g., V OUT 106 ) satisfies a fourth threshold.
- the fourth threshold is approximately 95% of a set-point output level.
- the quick-start disable conditions are satisfied when 0.95*V REF 104 ⁇ V OUT 106 or V IN 102 >V REF 104 .
- the method continues to block 5 - 4 . If the quick-start disable conditions are satisfied, the method continues to block 5 - 2 .
- FIGS. 6A-6C are block diagrams of various integrated circuits (ICs) according to some implementations. While some example features are illustrated, those skilled in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, for example, FIG. 6A shows that in some implementations, some or all portions of the quick-start assembly 115 , which operates the voltage boost assembly 100 under quick-start parameters when quick-start conditions are satisfied, can be part of a semiconductor die 600 .
- the quick-start assembly 115 can be formed on a substrate 602 of the die 600 .
- a plurality of connection pads 604 can also be formed on the substrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 .
- FIG. 6B shows that in some implementations, a semiconductor die 600 having a substrate 602 can include some or all portions of the quick-start assembly 115 and some or all portions of the boost converter 130 , which operates according to conventional boost converter techniques.
- a plurality of connection pads 604 can also be formed on the substrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 and some or all portions of the boost converter 130 .
- FIG. 6C shows that in some implementations, a semiconductor die 600 having a substrate 602 can include some or all portions of the quick-start assembly 115 and some or all portions of the boost converter 130 , and some or all portions of the power amplifier (PA) 620 .
- a plurality of connection pads 604 can also be formed on the substrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 and some or all portions of the boost converter 130 , and some or all portions of the PA 620 .
- FIG. 7 is a schematic diagram of an implementation of a module 700 including the voltage boost assembly 100 in FIG. 1 according to some implementations. While some example features are illustrated, those skilled in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein.
- the module 700 includes a packaging substrate 752 , connection pads 756 , a CMOS (complementary metal-oxide semiconductor) die 600 , a HBT (heterojunction bipolar transistor) die 710 , a matching network 720 , and one or more surface mount devices 760 .
- the module 700 is at least one of a power amplifier module (PAM) or a front-end module (FEM).
- PAM power amplifier module
- FEM front-end module
- the CMOS die 600 includes a substrate 602 including some or all portions of the bias circuit 200 and some or all portions of the bias circuit 610 .
- a plurality of connection pads 604 is formed on the substrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 and some or all portions of the boost converter 130 .
- the HBT die 710 includes a substrate 702 including some or all portions of the PA 620 .
- the HBT die 710 also includes a plurality of connection pads 704 formed on the substrate 702 to facilitate functionalities associated with some or all portions of the PA 620 .
- connection pads 756 on the packaging substrate 752 facilitate electrical connections to and from each of the CMOS die 600 and the HBT die 710 .
- the connection pads 756 facilitate the use of wirebonds 754 for passing various signals and supply currents and/or voltages to each of the CMOS die 600 and the HBT die 710 .
- the components mounted on the packaging substrate 752 or formed on or in the packaging substrate 752 can further include, for example, one or more surface mount devices (SMDs) (e.g., 760 ) and one or more matching networks (e.g., 720 ).
- the packaging substrate 752 can include a laminate substrate.
- the module 700 can also include one or more packaging structures to, for example, provide protection and facilitate easier handling of the module 700 .
- a packaging structure can include an overmold formed over the packaging substrate 752 and dimensioned to substantially encapsulate the various circuits and components thereon.
- module 700 is described in the context of wirebond-based electrical connections, one or more features of the present disclosure can also be implemented in other packaging configurations, including flip-chip configurations.
- FIG. 8 schematically depicts an example radio-frequency (RF) device 800 having one or more advantageous features described herein. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein.
- the RF device 800 is a wireless device.
- such a wireless device can include, for example, a cellular phone, a smart-phone, a hand-held wireless device with or without phone functionality, a computer, a laptop, a tablet computer, a peripheral device, a router, a repeater, a wireless access point, a base station, or the like.
- the RF device 800 includes one or more power amplifier (PAs) (e.g., the PA 620 in FIGS. 6C and 7 ) in a PA module 812 configured to receive their respective RF signals from a transceiver 810 that can be configured and operated in known manners to generate RF signals to be amplified and transmitted, and to process received signals.
- PAs power amplifier
- the PA module 812 can include one or more filters and/or one or more band/mode selection switches configured to provide duplexing and/or switching functionalities as described herein.
- the PA module 812 includes the voltage boost assembly 100 described above with reference to FIGS. 1-3 .
- the voltage boost assembly 100 operates under quick-start parameters (e.g., the quick-start module 120 is enabled) when the quick-start enable conditions are satisfied, and the voltage boost assembly 100 operates under regular parameters (e.g., according to conventional boost converter techniques) when the quick-start enable conditions are not satisfied.
- quick-start parameters e.g., the quick-start module 120 is enabled
- regular parameters e.g., according to conventional boost converter techniques
- the transceiver 810 is shown to interact with a baseband sub-system 808 that is configured to provide conversion between data and/or voice signals suitable for a user and RF signals suitable for the transceiver 810 .
- the transceiver 810 is also shown to be connected to a power management component 806 that is configured to manage power for the operation of the RF device 800 .
- the power management component 806 can also control operations of the baseband sub-system 808 and other components of the RF device 800 .
- the baseband sub-system 808 is shown to be connected to a user interface 802 to facilitate various input and output of voice and/or data provided to and received from the user.
- the baseband sub-system 808 can also be connected to a memory 18804 that is configured to store data and/or instructions to facilitate the operation of the wireless device, and/or to provide storage of information for the user.
- a matching network 814 is provided between the PA module 812 and the antenna switch module (ASM) 816 .
- the ASM 816 is connected to an antenna 820 and is configured to control which signals are transmitted via the antenna 820 .
- LNAs low-noise amplifiers
- Amplified signals from the one or more LNAs 824 are shown to be routed to the transceiver 810 .
- the RF device 800 does not need to be a multi-band device.
- the RF device 800 can include additional antennas such as diversity antenna, and additional connectivity features such as Wi-Fi, Bluetooth, and GPS.
- the words “comprise,” “comprising,” and the like are to be construed in an inclusive sense, as opposed to an exclusive or exhaustive sense; that is to say, in the sense of “including, but not limited to.”
- the word “coupled”, as generally used herein, refers to two or more elements that may be either directly connected, or connected by way of one or more intermediate elements. Additionally, the words “herein,” “above,” “below,” and words of similar import, when used in this application, shall refer to this application as a whole and not to any particular portions of this application. Where the context permits, words in the above Detailed Description using the singular or plural number may also include the plural or singular number respectively.
Abstract
In one implementation, a voltage boost assembly including a boost converter having a capacitive element arranged at an output, and an inductive element connectable to an electrical supply. The voltage boost assembly also includes a sensor assembly provided to generate a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold. The voltage boost assembly further includes a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output.
Description
- This application is a divisional of U.S. patent application Ser. No. 15/445,730, filed Feb. 28, 2017, entitled “QUICK-START HIGH-VOLTAGE BOOST,” which is a divisional of U.S. patent application Ser. No. 15/042,330, filed Feb. 12, 2016, entitled “QUICK-START HIGH-VOLTAGE BOOST,” which claims priority to U.S. Provisional Application No. 62/116,415, filed Feb. 14, 2015, entitled “QUICK-START HIGH-VOLTAGE BOOST,” the disclosure of each of which is hereby expressly incorporated by reference herein in its entirety.
- The present disclosure relates to power amplifiers in radio-frequency (RF) applications.
- Power amplifiers (PAs) are widely used in various communication networks to set the transmission power level of an information-bearing signal transmitted by one device to another device. For example, power amplifiers are used to set the pulse energy emitted by pulsed lasers in optical communication networks. Power amplifiers are also used in the radio frequency (RF) front-end components of wireless carrier network devices—such as base stations, repeaters, and mobile client devices (e.g. mobile phones, smartphones, tablet computers, etc.)—to set the power level of a wireless signal transmitted through an antenna. PAs are also used in local area networks of homes and offices to support both wired and wireless connectivity of servers, computers, laptops, and peripheral devices such as photocopiers and printers.
- In some implementations, PAs use a boost converter for DC-to-DC power conversion when the PAs output voltage should be greater than its input voltage. Typically, a boost converter with a compensated error-amplifier has an intrinsic soft-start feature. With the capacitor at the error-amplifier output slowly being charged up, the duty cycle of the boost is slowly increased, leading to a slow increase of the boost output voltage. In some implementations, in order to use a boost converter to power a high-voltage PA, the boost converter is specified to ramp up at a rate of 570 mV/μs in order to avoid any signal distortion at the output of the PA. The fast ramp-rate of the boost output voltage not only limits the value of the output capacitor, but also posts a challenge on circuit design and architecture to work against the slow soft-start nature of the error amplifier.
- In accordance with a number of implementations, the present disclosure relates to a voltage boost assembly including a boost converter having a capacitive element arranged at an output, and an inductive element connectable to an electrical supply. The voltage boost assembly also includes a sensor assembly provided to generate a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold. The voltage boost assembly further includes a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output.
- In some implementations, the inductive element is provided to establish an output current level.
- In some implementations, detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an electrical output (e.g., an output voltage) that is at least 10% higher than the current electrical output of the boost converter.
- In some implementations, detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an electrical output (e.g., an output voltage) that is at least 20% higher than the current electrical output of the boost converter.
- In some implementations, the quick-start module includes a charging circuit provided to charge the capacitive element so that an electrical output (e.g., an output voltage) of an associated error amplifier satisfies a third threshold in response to the quick-start enable signal. In some implementations, the third threshold is characterized in relation to a high voltage level that can be sustained at the output of the error amplifier.
- In some implementations, the quick-start module includes a saturation limiting circuit provided to limit current through the inductive element to establish the output current in response to the quick-start enable signal. In some implementations, the current through the inductive element is limited to a level that is characterized by a saturation condition of the inductive element.
- In some implementations, the quick-start module includes a ripple control module provided to reduce current ripple in the output current level by adjustment of a switching frequency in response to the quick-start enable signal. In some implementations, the ripple control module includes an oscillator that provides a switching frequency that is increased in response to the quick-start enable signal.
- In some implementations, the second threshold is characterized by a current level available to charge the capacitive element.
- In some implementations, the sensor assembly is configured to turn off the quick-start enable signal in response to determining that the electrical output of the boost converter has satisfied a fourth threshold. In some implementations, the fourth threshold is approximately 95% of a set-point output level.
- In some implementations, the present disclosure relates to a module that includes a packaging substrate configured to receive a plurality of components. The module also includes a power amplifier. The module further includes a voltage boost assembly, including a boost converter configured for a power amplifier included on at least a portion of the substrate, the boost converter having a capacitive element arranged at the output, and an inductive element connectable to an electrical supply. The voltage boost assembly also includes a sensor assembly provided to generate a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold. The voltage boost assembly further includes a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output.
- In some implementations, the quick-start module includes a charging circuit provided to charge the capacitive element so that the output of an associated error amplifier satisfies a third threshold in response to the quick-start enable signal.
- In some implementations, the quick-start module includes a saturation limiting circuit provided to limit current through the inductive element coupled to establish the output current level in response to the quick-start enable signal.
- In some implementations, the quick-start module includes a ripple control module provided to reduce current ripple in the output current level by adjustment of a switching frequency in response to the quick-start enable signal.
- In some implementations, the quick-start module is configured to turn off the quick-start enable signal in response to determining that the electrical output of the boost converter has satisfied a third threshold.
- In some implementations, the module is at least one of a power amplifier module (PAM) or a front-end module (FEM). In accordance with some implementations, the voltage boost assembly of the module includes the functions and/or features of any of the voltage boost assemblies described herein.
- According to some teachings, the present disclosure relates to a radio-frequency (RF) device that includes a transceiver generate to an RF signal. The RF device also includes a front-end module (FEM) in communication with the transceiver, the FEM including a packaging substrate configured to receive a plurality of components, the FEM further including a voltage boost assembly on the packaging substrate, the voltage boost assembly including a boost converter having a capacitive element arranged at the output, and an inductive element connectable to an electrical supply a sensor assembly provided to generate, the voltage boost assembly also including a quick-start enable signal in response to detecting that an electrical condition relative to an electrical output of the boost converter has breached a first threshold, and the voltage boost assembly further including a quick-start module responsive to the quick-start enable signal, and configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge the capacitive element arranged at the output. The RF device further includes an antenna in communication with the FEM, the antenna configured to transmit the amplified RF signal.
- In some implementations, the RF device includes a wireless device. In some implementations, the wireless device includes at least one of a base station, a repeater, a cellular phone, a smartphone, a computer, a laptop, a tablet computer, and a peripheral device. In accordance with some implementations, the voltage boost assembly of the FEM module includes the functions and/or features of any of voltage boost assemblies described herein.
- According to some teaching, the present disclosure relates to a method of ramping up the output of a boost converter. The method includes sensing that an electrical condition relative to an electrical output of the boost converter has breached a first threshold. The method further also generating a quick-start enable signal in response to sensing the breach of the first threshold. The method further includes driving a boost converter to deliver an output current that satisfies a second threshold in order to charge a capacitive element arranged at the output of the boost converter by charging the capacitive element so that the output of an associated error amplifier satisfies a third threshold, limiting the current through an inductive element coupled to a supply, and increasing a switching frequency in order to reduce ripple.
- For purposes of summarizing the disclosure, certain aspects, advantages and novel features of the inventions have been described herein. It is to be understood that not necessarily all such advantages may be achieved in accordance with any particular embodiment of the invention. Thus, the invention may be embodied or carried out in a manner that achieves or optimizes one advantage or group of advantages as taught herein without necessarily achieving other advantages as may be taught or suggested herein.
- So that the present disclosure can be understood in greater detail, a more particular description may be had by reference to the features of various implementations, some of which are illustrated in the appended drawings. The appended drawings, however, merely illustrate the more pertinent features of the present disclosure and are therefore not to be considered limiting, for the description may admit to other effective features.
-
FIG. 1 is a block diagram of a voltage boost assembly according to some implementations. -
FIG. 2 is a schematic diagram of the voltage boost assembly inFIG. 1 according to some implementations. -
FIG. 3 is a schematic diagram of a portion of the voltage boost assembly inFIG. 1 according to some implementations. -
FIG. 4 shows example performance plots of the voltage boost assembly inFIG. 1 according to some implementations. -
FIG. 5 is a flowchart representation of a method of operating the voltage boost assembly inFIG. 1 according to some implementations. -
FIG. 6A-6C are block diagrams of different integrated circuit (IC) implementations of the voltage boost assembly inFIG. 1 according to some implementations. -
FIG. 7 is a block diagram of an example module according to some implementations. -
FIG. 8 is a block diagram of an example radio frequency (RF) device according to some implementations. - In accordance with common practice the various features illustrated in the drawings may not be drawn to scale. Accordingly, the dimensions of the various features may be arbitrarily expanded or reduced for clarity. In addition, some of the drawings may not depict all of the components of a given system, method or device. Finally, like reference numerals may be used to denote like features throughout the specification and figures.
- The headings provided herein, if any, are for convenience only and do not necessarily affect the scope or meaning of the claimed invention.
- As discussed above, in order to use a boost converter to power a high-voltage PA, a boost converter is specified to ramp up at a rate of 570 mV/μs in order to avoid any signal distortion at the output of the PA. In order to ramp up the boost output voltage quickly, for example, a 1 μF capacitor is used as the output capacitor. According to some implementations, when the reference voltage VREF from the controller interface (e.g., MIPI) requests that VOUT be higher than VIN, and 20% higher than the current output voltage value, the boost converter activates a quick-start module.
- In some implementations, the quick-start circuit module includes at least one of a charging circuit, a saturation limiting circuit, or a ripple control module. In some implementations, the quick-start circuit module includes a charging circuit with a current source that is turned on to force the output voltage of the error amplifier satisfy a predefined value (e.g., 1.1 V or 1.2 V). In other words, the charging circuit requests the boost converter to run at maximum duty-cycle. In some implementations, the quick-start circuit module includes a saturation limiting circuit which sets the current-limit of the boost converter to a predetermined level (e.g., 2.5 A) to prevent an inductive element of the boost converter from being saturated. In other words, the saturation limiting circuit allows enough current into the output. In some implementations, the quick-start circuit module includes a ripple control module which increases the switching frequency of the boost converter above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz) to achieve lower ripple through the inductive element.
- In some implementations, when the output voltage of the boost converter is sensed to reach 95% of its set-point, the quick-start module is turned off. The quick-start module allows the boost to be operated at high duty-cycle, pumping a maximum amount of current to charge the capacitor at the boost output.
-
FIG. 1 is a block diagram of avoltage boost assembly 100 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, in some implementations, thevoltage boost assembly 100 includes a quick-start assembly 115 and aboost converter 130. According to some implementations, the quick-start assembly 115 includes asensor assembly 110 and a quick-start module 120. - In some implementations, the
sensor assembly 110 is configured to provide an enable signal to the quick-start module 120 when one or more predetermined quick-start enable conditions are satisfied. In one example, the quick-start enable conditions are satisfied whenV IN 102<V REF 104 and 0.8*V REF 104>V OUT 106. In some implementations, thesensor assembly 110 is configured to provide a disable signal to the quick-start module 120 when one or more predetermined quick-start disable conditions are satisfied. In one example, the quick-start disable conditions are satisfied when 0.95*V REF 104<V OUT 106 orV IN 102>V REF 104. - In some implementations, the quick-
start module 120 includes a chargingcircuit 122, asaturation limiting circuit 124, and aripple control module 126. In some implementations, theboost converter 130 includes acapacitive element 132, aninductive element 134, and anerror amplifier 136. In some implementations, theinductive element 134 is provided to establish an output current level. - According to some implementations, the charging
circuit 122 is configured to force the output of theerror amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V). For example, in some implementations, this forces theerror amplifier 136 to run at a duty cycle that satisfies a predefined threshold (e.g., 100% or maximum duty cycle). According to some implementations, thesaturation limiting circuit 124 is configured to set a limit of the current flowing through theinductive element 134 to a predetermined output level (e.g., 2.5 A). For example, in some implementations, this prevents saturation of theinductive element 134. According to some implementations, theripple control module 126 is configured to increase the switching frequency of anoscillator 128 above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz). For example, in some implementations, this reduces ripple in the current flowing through theinductive element 134. -
FIG. 2 is a schematic diagram of thevoltage boost assembly 100 inFIG. 1 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. Elements common toFIGS. 1-2 include common reference numbers, and only the differences betweenFIGS. 1-2 are described herein for the sake of brevity. To that end, in some implementations, thevoltage boost assembly 100 includesresistive elements voltage boost assembly 100 includes aboost control 202 associated with a p-channel field-effect transistor (PFET) (e.g., with Rds=0.27Ω), which acts as a switch to enable and disable thevoltage boost assembly 100. According to some implementations, the value of theinductive element 134 is, for example, 1.5 pH, and the value of thecapacitive element 132 is, for example, 1 μF. - As shown in
FIG. 2 , in some implementations, the quick-start assembly 115 is coupled with the output oferror amplifier 136. For example, as discussed above with reference toFIG. 1 , the quick-start assembly 115 or a component thereof (e.g., the chargingcircuit 122 inFIG. 1 ) is configured to force the output of theerror amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V). - As shown in
FIG. 2 , in some implementations, the quick-start assembly 115 provides an input tocurrent limit comparator 224. For example, as discussed above with reference toFIG. 1 , the quick-start assembly 115 or a component thereof (e.g., thesaturation limiting circuit 124 inFIG. 1 ) is configured to set a limit of the current flowing through theinductive element 134 to a predetermined output level (e.g., 2.5 A). - As shown in
FIG. 2 , in some implementations, the quick-start assembly 115 provides an input tosummation element 236 to compensate for the oscillator slope. For example, as discussed above with reference toFIG. 1 , the quick-start assembly 115 or a component thereof (e.g., theripple control module 126 inFIG. 1 ) is configured to increase the switching frequency above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz). - As shown in
FIG. 2 , in some implementations, the output of theerror amplifier 136 provides an input to pulse-width modulation (PWM)comparator 222. The output of theerror amplifier 136 is also coupled with a shunt resistance element 242 (e.g., 80 kΩ) and a shunt capacitance element 244 (e.g., 100 μF), which are connected in series to ground. The output of thePWM comparator 222 provides an input to ORgate 226, and the output of thecurrent limit comparator 224 provides another input to theOR gate 226. - As shown in
FIG. 2 , in some implementations, the output of theOR gate 226 provides an input to SR latch 228 (e.g., the R input) along with a clock (CLK) signal (e.g., the S input). The output of the SR latch 228 (e.g., the Q output) provides an input to adriver amplifier 230. The output of thedriver amplifier 230 is coupled with the gate of an n-channel field-effect transistor (NFET) (e.g., with Rds=0.15Ω) 230. The source of theNFET 230 is coupled with the output of theinductive element 134, and the drain of theNFET 230 is coupled with ground. - As shown in
FIG. 2 , in some implementations, the output of theinductive element 134 provides an input todifferential amplifier 232. The source ofNFET 234 provides another input to thedifferential amplifier 232. As shown inFIG. 2 , in some implementations, the gate ofNFET 234 is coupled withV OUT 106, and the drain ofNFET 234 is coupled with ground. The output of thedifferential amplifier 232 provides an input to thecurrent limit comparator 224 and thesummation element 236. -
FIG. 3 is a schematic diagram of a portion of thevoltage boost assembly 100 inFIG. 1 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. Elements common toFIGS. 1-3 include common reference numbers, and only the differences betweenFIGS. 1-3 are described herein for the sake of brevity. To that end, in some implementations, the quick-start assembly 115: includescomparators differential amplifiers SR latch 314; ANDgate 316;NFET 318; andcurrent source 320. - As shown in
FIG. 3 , in some implementations, thecomparators FIG. 3 , in some implementations, thecomparator 302 and the SR latch 314 (e.g., the Q output) provide inputs to the ANDgate 316. WhenV IN 102<V REF 104 and 0.8*V REF 104>V OUT 106, the output of the ANDgate 316 is logic high (e.g., 1) and thevoltage boost assembly 100 operates under quick-start parameters. Under quick-start parameters, (A) the current flowing through theinductive element 134 is set to a predetermined output level (e.g., 2.5 A), (B) the switching frequency is increased above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz), and (C) thecurrent source 320 supplies a predefined current (e.g., 10 μA) so that the output of theerror amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V). WhenV IN 102>V REF 104 or 0.95*V REF 104<V OUT 106, the output of the ANDgate 316 is logic low (e.g., 0) and thevoltage boost assembly 100 operates under regular parameters. - As shown in
FIG. 3 , in some implementations,V REF 104 andV OUT 106 provide inputs to thedifferential amplifier 308. The output of thedifferential amplifier 308 andV bg 312 provide inputs to thedifferential amplifier 310. The output of thedifferential amplifier 310 is coupled to the gate ofNFET 318. In other words, in one example, theNFET 318 anddifferential amplifiers error amplifier 136 at 1.2 V. -
FIG. 4 shows example performance plots of thevoltage boost assembly 100 inFIG. 1 according to some implementations. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, in some implementations,example performance plot 410 showsV OUT 106 over time. For example, as shown inexample performance plot 410,V OUT 106 increases from approximately 3.8 V to 9.5 V in approximately 10 μs. - According to some implementations,
example performance plot 420 showsV REF 104 versus time. For example, as shown inexample performance plot 420,V REF 104 increases from approximately 0.5 V to 2.0 V. - According to some implementations, example performance plot 430 shows the output voltage of the
error amplifier 136 versus time. For example, as shown in example performance plot 430, the output voltage of theerror amplifier 136 is clamped at 1.2 V during the quick-start period between 5 and 10 μs. - According to some implementations,
example performance plot 440 shows the current flowing through theinductive element 134 versus time. For example, as shown inexample performance plot 440, the current flowing through theinductive element 134 is limited to 2.5 A during the quick-start period between 5 and 10 μs. -
FIG. 5 is a flowchart representation of amethod 500 of operating thevoltage boost assembly 100 inFIG. 1 in accordance with some implementations. In some implementations, themethod 500 is performed by thevoltage boost assembly 100 inFIG. 1 or a controller associated therewith. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, briefly, in some circumstances, themethod 500 includes: powering on a voltage boost assembly; determining whether quick-start conditions are satisfied; operating the voltage boost assembly under regular parameters if the quick-start conditions are not satisfied; and operating the voltage boost assembly under quick-start parameters if the quick-start conditions are satisfied. - To that end, as represented by block 5-1, the
method 500 includes powering on a voltage boost assembly. For example, with reference toFIG. 1 , thevoltage boost assembly 100 initiates operation when the associated device (e.g., a mobile phone or the like) is powered on. For example, with reference toFIG. 2 , thevoltage boost assembly 100 is powered on when the PFET associated withboost control 202 is in an “on” state, which allows current to flow from theinductive element 134 to thecapacitive element 132. - As represented by block 5-2, the
method 500 includes determining whether quick-start enable conditions are satisfied. For example, with reference toFIG. 1 , thesensor assembly 110 senses whether an electrical condition relative to an electrical output of the boost converter (e.g., VOUT 106) has breached a first threshold. According to some implementations, for example, the quick-start enable conditions are satisfied whenV IN 102<V REF 104 and 0.8*V REF 104>V OUT 106. - If the quick-start enable conditions are not satisfied, the method continues to block 5-3. If the quick-start enable conditions are satisfied, the method continues to block 5-4. For example, with reference to
FIG. 1 , thesensor assembly 110 generates a quick-start enable signal and provides the quick-start enable signal to the quick-start module 120 in response to sensing that the first threshold has been breached. According to some implementations, detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an output voltage that is at least 10% higher than the current output voltage. In some implementations, detecting that an electrical condition relative to an electrical output of the boost converter has breached the first threshold includes detecting that a reference voltage indicates demand for an output voltage that is at least 20% higher than the current output voltage. In another example, with reference toFIG. 3 , whenV IN 102<V REF 104 and 0.8*V REF 104>V OUT 106, the output of the ANDgate 316 is logic high (e.g., 1) and thevoltage boost assembly 100 operates under quick-start parameters. - As represented by block 5-3, the
method 500 includes operating the voltage boost assembly under regular parameters. - As represented by block 5-4, the
method 500 includes operating the voltage boost assembly under quick-start parameters. For example, with reference toFIG. 1 , the quick-start module 120 is configured to drive the boost converter at a relatively high duty-cycle and so that the boost converter delivers an output current that satisfies a second threshold in order to charge a capacitive element arranged at the output in response to the quick-start enable signal. According to some implementations, the second threshold is characterized by a current level available to charge the capacitive element. - According to some implementations, as represented by block 5-4 a, the
method 500 includes enabling the charging circuit. For example, with reference toFIG. 1 , the quick-start module 120 includes a chargingcircuit 122 provided to charge thecapacitive element 132 so that the output of an associated error amplifier satisfies a third threshold in response to the quick-start enable signal. According to some implementations, the third threshold is characterized in relation to a high voltage level that can be sustained at the output of the error amplifier. In some implementations, the chargingcircuit 122 is configured to force the output of theerror amplifier 136 to satisfy a predefined value (e.g., 1.1 V or 1.2 V). For example, in some implementations, this forces theerror amplifier 136 to run at a duty cycle that satisfies a predefined threshold (e.g., 100% or maximum duty cycle). - According to some implementations, as represented by block 5-4 b, the
method 500 includes enabling the saturation limiting circuit. For example, with reference toFIG. 1 , the quick-start module 120 includes asaturation limiting circuit 124 provided to limit current through theinductive element 134 of theboost converter 130 to establish the output current level in response to the quick-start enable signal. According to some implementations, the current through theinductive element 134 is limited to a level that is characterized by a saturation condition of theinductive element 134. In some implementations, thesaturation limiting circuit 124 is configured to set a limit of the current flowing through theinductive element 134 to a predetermined output level (e.g., 2.5 A). For example, in some implementations, this prevents saturation of theinductive element 134. - According to some implementations, as represented by block 5-4 c, the
method 500 includes enabling the ripple control module. For example, with reference toFIG. 1 , the quick-start module 120 includes aripple control module 136 provided to reduce current ripple in the output current level by adjustment of a switching frequency in response to the quick-start enable signal. According to some implementations, theripple control module 134 includes anoscillator 128 that provides switching frequency that is increased in response to the quick-start enable signal. In some implementations,ripple control module 126 is configured to increase the switching frequency of anoscillator 128 above a predetermined switching frequency (e.g., from 2 MHz to 2.5 MHz). For example, in some implementations, this reduces ripple in the current flowing through theinductive element 134. - As represented by block 5-5, the
method 500 includes determining whether quick-start disable conditions are satisfied. For example, with reference toFIG. 1 , thesensor assembly 110 is configured to turn off the quick-start enable signal in response to determining that the electrical output of the boost converter 130 (e.g., VOUT 106) satisfies a fourth threshold. In some implementations, the fourth threshold is approximately 95% of a set-point output level. According to some implementations, for example, the quick-start disable conditions are satisfied when 0.95*V REF 104<V OUT 106 orV IN 102>V REF 104. For example, with reference toFIG. 3 , whenV IN 102>V REF 104 or 0.95*V REF 104<V OUT 106, the output of the ANDgate 316 is logic low (e.g., 0) and thevoltage boost assembly 100 operates under regular parameters. - If the quick-start disable conditions are not satisfied, the method continues to block 5-4. If the quick-start disable conditions are satisfied, the method continues to block 5-2.
-
FIGS. 6A-6C are block diagrams of various integrated circuits (ICs) according to some implementations. While some example features are illustrated, those skilled in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, for example,FIG. 6A shows that in some implementations, some or all portions of the quick-start assembly 115, which operates thevoltage boost assembly 100 under quick-start parameters when quick-start conditions are satisfied, can be part of asemiconductor die 600. By way of an example, the quick-start assembly 115 can be formed on asubstrate 602 of thedie 600. A plurality ofconnection pads 604 can also be formed on thesubstrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115. -
FIG. 6B shows that in some implementations, asemiconductor die 600 having asubstrate 602 can include some or all portions of the quick-start assembly 115 and some or all portions of theboost converter 130, which operates according to conventional boost converter techniques. A plurality ofconnection pads 604 can also be formed on thesubstrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 and some or all portions of theboost converter 130. -
FIG. 6C shows that in some implementations, asemiconductor die 600 having asubstrate 602 can include some or all portions of the quick-start assembly 115 and some or all portions of theboost converter 130, and some or all portions of the power amplifier (PA) 620. A plurality ofconnection pads 604 can also be formed on thesubstrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 and some or all portions of theboost converter 130, and some or all portions of thePA 620. - In some implementations, one or more features described herein can be included in a module.
FIG. 7 is a schematic diagram of an implementation of amodule 700 including thevoltage boost assembly 100 inFIG. 1 according to some implementations. While some example features are illustrated, those skilled in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. Themodule 700 includes apackaging substrate 752,connection pads 756, a CMOS (complementary metal-oxide semiconductor) die 600, a HBT (heterojunction bipolar transistor) die 710, amatching network 720, and one or more surface mount devices 760. In some implementations, themodule 700 is at least one of a power amplifier module (PAM) or a front-end module (FEM). - The CMOS die 600 includes a
substrate 602 including some or all portions of the bias circuit 200 and some or all portions of the bias circuit 610. A plurality ofconnection pads 604 is formed on thesubstrate 602 to facilitate functionalities associated with some or all portions of the quick-start assembly 115 and some or all portions of theboost converter 130. Similarly, the HBT die 710 includes asubstrate 702 including some or all portions of thePA 620. The HBT die 710 also includes a plurality ofconnection pads 704 formed on thesubstrate 702 to facilitate functionalities associated with some or all portions of thePA 620. - The
connection pads 756 on thepackaging substrate 752 facilitate electrical connections to and from each of the CMOS die 600 and the HBT die 710. For example, theconnection pads 756 facilitate the use ofwirebonds 754 for passing various signals and supply currents and/or voltages to each of the CMOS die 600 and the HBT die 710. - In some implementations, the components mounted on the
packaging substrate 752 or formed on or in thepackaging substrate 752 can further include, for example, one or more surface mount devices (SMDs) (e.g., 760) and one or more matching networks (e.g., 720). In some implementations, thepackaging substrate 752 can include a laminate substrate. - In some implementations, the
module 700 can also include one or more packaging structures to, for example, provide protection and facilitate easier handling of themodule 700. Such a packaging structure can include an overmold formed over thepackaging substrate 752 and dimensioned to substantially encapsulate the various circuits and components thereon. - It will be understood that although the
module 700 is described in the context of wirebond-based electrical connections, one or more features of the present disclosure can also be implemented in other packaging configurations, including flip-chip configurations. -
FIG. 8 schematically depicts an example radio-frequency (RF)device 800 having one or more advantageous features described herein. While pertinent features are shown, those of ordinary skill in the art will appreciate from the present disclosure that various other features have not been illustrated for the sake of brevity and so as not to obscure more pertinent aspects of the example implementations disclosed herein. To that end, in some implementations, theRF device 800 is a wireless device. In some implementations, such a wireless device can include, for example, a cellular phone, a smart-phone, a hand-held wireless device with or without phone functionality, a computer, a laptop, a tablet computer, a peripheral device, a router, a repeater, a wireless access point, a base station, or the like. - In some implementations the
RF device 800 includes one or more power amplifier (PAs) (e.g., thePA 620 inFIGS. 6C and 7 ) in aPA module 812 configured to receive their respective RF signals from atransceiver 810 that can be configured and operated in known manners to generate RF signals to be amplified and transmitted, and to process received signals. In some implementations, thePA module 812 can include one or more filters and/or one or more band/mode selection switches configured to provide duplexing and/or switching functionalities as described herein. According to some implementations, thePA module 812 includes thevoltage boost assembly 100 described above with reference toFIGS. 1-3 . For example, thevoltage boost assembly 100 operates under quick-start parameters (e.g., the quick-start module 120 is enabled) when the quick-start enable conditions are satisfied, and thevoltage boost assembly 100 operates under regular parameters (e.g., according to conventional boost converter techniques) when the quick-start enable conditions are not satisfied. - The
transceiver 810 is shown to interact with abaseband sub-system 808 that is configured to provide conversion between data and/or voice signals suitable for a user and RF signals suitable for thetransceiver 810. Thetransceiver 810 is also shown to be connected to apower management component 806 that is configured to manage power for the operation of theRF device 800. In some implementations, thepower management component 806 can also control operations of thebaseband sub-system 808 and other components of theRF device 800. - The
baseband sub-system 808 is shown to be connected to auser interface 802 to facilitate various input and output of voice and/or data provided to and received from the user. Thebaseband sub-system 808 can also be connected to a memory 18804 that is configured to store data and/or instructions to facilitate the operation of the wireless device, and/or to provide storage of information for the user. - In some implementations, a
matching network 814 is provided between thePA module 812 and the antenna switch module (ASM) 816. In some implementations, theASM 816 is connected to anantenna 820 and is configured to control which signals are transmitted via theantenna 820. - As shown in
FIG. 8 , some received signals via theantenna 820 are shown to be routed from theASM 816 to one or more low-noise amplifiers (LNAs) 824. Amplified signals from the one or more LNAs 824 are shown to be routed to thetransceiver 810. - A number of other wireless device configurations can utilize one or more features described herein. For example, the
RF device 800 does not need to be a multi-band device. In another example, theRF device 800 can include additional antennas such as diversity antenna, and additional connectivity features such as Wi-Fi, Bluetooth, and GPS. - Unless the context clearly requires otherwise, throughout the description and the claims, the words “comprise,” “comprising,” and the like are to be construed in an inclusive sense, as opposed to an exclusive or exhaustive sense; that is to say, in the sense of “including, but not limited to.” The word “coupled”, as generally used herein, refers to two or more elements that may be either directly connected, or connected by way of one or more intermediate elements. Additionally, the words “herein,” “above,” “below,” and words of similar import, when used in this application, shall refer to this application as a whole and not to any particular portions of this application. Where the context permits, words in the above Detailed Description using the singular or plural number may also include the plural or singular number respectively. The word “or” in reference to a list of two or more items, that word covers all of the following interpretations of the word: any of the items in the list, all of the items in the list, and any combination of the items in the list.
- The above detailed description of embodiments of the invention is not intended to be exhaustive or to limit the invention to the precise form disclosed above. While specific embodiments of, and examples for, the invention are described above for illustrative purposes, various equivalent modifications are possible within the scope of the invention, as those skilled in the relevant art will recognize. For example, while processes or blocks are presented in a given order, alternative embodiments may perform routines having steps, or employ systems having blocks, in a different order, and some processes or blocks may be deleted, moved, added, subdivided, combined, and/or modified. Each of these processes or blocks may be implemented in a variety of different ways. Also, while processes or blocks are at times shown as being performed in series, these processes or blocks may instead be performed in parallel, or may be performed at different times.
- The teachings of the invention provided herein can be applied to other systems, not necessarily the system described above. The elements and acts of the various embodiments described above can be combined to provide further embodiments.
- While some implementations of the inventions have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope of the disclosure. Indeed, the novel methods and systems described herein may be embodied in a variety of other forms; furthermore, various omissions, substitutions and changes in the form of the methods and systems described herein may be made without departing from the spirit of the disclosure. The accompanying claims and their equivalents are intended to cover such forms or modifications as would fall within the scope and spirit of the disclosure.
Claims (1)
1. A method of ramping up the output of a boost converter, the method comprising:
sensing that an electrical condition relative to an electrical output of the boost converter has satisfied a first threshold;
generating an enable signal;
driving a boost converter to deliver an output current that satisfies a second threshold in order to charge a capacitive element arranged at the output of the boost converter.
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US15/445,730 US10420042B2 (en) | 2015-02-14 | 2017-02-28 | Quick-start high-voltage boost |
US16/563,821 US20200092830A1 (en) | 2015-02-14 | 2019-09-07 | Quick-start high-voltage boost |
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US10084983B2 (en) * | 2014-04-29 | 2018-09-25 | Fermi Research Alliance, Llc | Wafer-scale pixelated detector system |
US9584012B2 (en) * | 2015-02-14 | 2017-02-28 | Skyworks Solutions, Inc. | Quick-start high-voltage boost |
US11218116B2 (en) | 2019-10-03 | 2022-01-04 | Skyworks Solutions, Inc. | Fast ramping power amplifier boost converter |
CN112098978B (en) * | 2020-09-14 | 2024-03-26 | 哈工大机器人(合肥)国际创新研究院 | System and method for improving turn-on speed of TOF camera laser and reducing driving power consumption |
KR102326448B1 (en) * | 2021-06-29 | 2021-11-15 | (주)더스탠다드 | Irreversible electroporation system monitoring output high voltage stably |
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- 2018-06-11 HK HK18107553.4A patent/HK1248408A1/en unknown
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WO2016131026A1 (en) | 2016-08-18 |
CN107466439A (en) | 2017-12-12 |
CN107466439B (en) | 2020-07-28 |
US10420042B2 (en) | 2019-09-17 |
US20170181106A1 (en) | 2017-06-22 |
KR20170117534A (en) | 2017-10-23 |
US9584012B2 (en) | 2017-02-28 |
KR102538997B1 (en) | 2023-05-31 |
HK1248408A1 (en) | 2018-10-12 |
US20160241143A1 (en) | 2016-08-18 |
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