US20190086579A1 - Meta-surface optical element and method of manufacturing the same - Google Patents
Meta-surface optical element and method of manufacturing the same Download PDFInfo
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- US20190086579A1 US20190086579A1 US16/020,434 US201816020434A US2019086579A1 US 20190086579 A1 US20190086579 A1 US 20190086579A1 US 201816020434 A US201816020434 A US 201816020434A US 2019086579 A1 US2019086579 A1 US 2019086579A1
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- control member
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/002—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of materials engineered to provide properties not available in nature, e.g. metamaterials
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
- G02B27/4211—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant correcting chromatic aberrations
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/005—Diaphragms
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1814—Diffraction gratings structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/22—Absorbing filters
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/26—Reflecting filters
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
Definitions
- Apparatuses and methods consistent with exemplary embodiments relate to optical elements, and more particularly, to meta-surface optical elements and methods of manufacturing the same.
- a meta-surface includes a plurality of patterns. Optical characteristics of a meta-surface vary according to the specific nano-structure patterns used in the meta-surface. A phase delay may be created based on the radius of the patterns of the meta-surface, and a lens may be realized using a meta-surface based on this phase delay.
- One or more exemplary embodiments may provide meta-surface optical elements configured to reduce a zero-order effect.
- One or more exemplary embodiments may provide methods of manufacturing the meta-surface optical elements.
- a meta-surface optical element includes a substrate, a first meta-surface arranged on a region of the substrate, and a light control member arranged around the first meta-surface.
- the light control member may be arranged on an upper surface or a bottom surface of the substrate.
- the meta-surface optical element may further include a material layer, that is the same material as the first meta-surface disposed between the light control member and the substrate.
- the meta-surface optical element may further include a material layer completely covering an upper surface of the light control member.
- the meta-surface optical element may further include a second meta-surface on a bottom surface of the substrate.
- At least one second meta-surface may be stacked on the first meta-surface, and the light control member may be arranged around the at least one second meta-surface.
- the light control member may be a light absorption layer or a light reflection layer.
- the light control member may include a plurality of patterns that perform a first operation with respect to light incident thereon different from a second operation performed by the first meta-surface with respect to light incident thereon.
- the light control member may include a first plurality of patterns that perform a first operation with respect to light incident thereon and a second plurality of patterns that perform a second operation, different from the first operation, with respect to light incident thereon, and the first meta-surface may perform a third operation, different from the first operation and the second operation, with respect to light incident thereon.
- the material layer may include alignment key patterns.
- the meta-surface optical element may further include a second light control member around the second meta-surface.
- the second meta-surface may include a plurality of patterns that perform an operation, with respect to light incident thereon, different from an operation performed by the first meta-surface with respect to light incident thereon.
- the first meta-surface and the light control member having a gap therebetween, the gap having a width less than six times a wavelength of incident light.
- the width of the gap may be equal to or less than 5 ⁇ m.
- the first meta-surface and the light control member may overlap each other with a width of the overlap being less than ten times a wavelength of incident light.
- the width of the overlap may be equal to or less than 9 ⁇ m.
- a method of manufacturing a meta-surface optical element including forming a meta-surface on a substrate and forming alight control member around the meta-surface.
- the light control member may be separated from an upper surface of the substrate.
- the light control member may contact the upper surface of the substrate.
- the light control member may be formed on a bottom surface of the substrate.
- the light control member may be formed on and below the substrate.
- the forming of the meta-surface on the substrate may include sequentially forming first and second meta-surfaces on the substrate.
- the method may further include forming another meta-surface below the substrate.
- the meta-surface and the light control member may be formed on the same surface of the substrate.
- the meta-surface and the light control member may be formed on different surfaces from each other of the substrate.
- the light control member may include a first part that performs a first operation with respect to light incident thereon and a second part that performs a second operation, different from the first operation, with respect to light incident thereon.
- the light control member may include a light absorption layer or a light reflection layer.
- the light control member may include patterns that absorb, reflect, or refract incident light.
- the light control member may be formed to be separate from the meta-surface with a separation distance that is less than six times of a wavelength of incident light.
- the separation distance may be less than or equal to 5 ⁇ m.
- the light control member and the meta-surface may overlap with each other with an overlap width that is less than ten times of a wavelength of incident light.
- the overlap width may be less than or equal to 9 ⁇ m.
- FIGS. 1A through 1D are cross-sectional views of a method of manufacturing a meta-surface optical device according to an exemplary embodiment
- FIGS. 2A through 2C are cross-sectional views of a method of manufacturing a meta-surface optical device according to another exemplary embodiment
- FIG. 3A is a plan view of a meta-surface optical device according to another exemplary embodiment
- FIG. 3B is a cross-sectional view taken along line 3 B- 3 B′ of FIG. 3A ;
- FIGS. 3C and 3D are cross-sectional views of modifications of the meta-surface optical device of FIG. 3B ;
- FIG. 3E is a cross-sectional view for explaining an exemplary manufacturing process for obtaining the results of FIGS. 3C and 3D ;
- FIGS. 4A through 4C are cross-sectional views of a meta-surface optical device according to another exemplary embodiment
- FIGS. 5 through 13 are cross-sectional views respectively showing operations of meta-surfaces and light control members formed around the meta-surfaces with respect to incident light, according to exemplary embodiments;
- FIG. 14 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment
- FIGS. 15A through 15D are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device of FIG. 14 ;
- FIG. 16 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment
- FIGS. 17A through 17I are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device of FIG. 16 ;
- FIG. 18 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment.
- FIGS. 19A through 19E are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device of FIG. 18 ;
- FIGS. 20A through 20C are cross-sectional views of a meta-surface optical device according to another exemplary embodiment
- FIGS. 21A through 21G are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device of FIG. 20A ;
- FIG. 22 is a cross-sectional view showing a case in which a material layer having a high adhesion force with respect to a light blocking layer is attached to a surface of a stamp to be attached to a pattern region;
- FIG. 23 is photographs showing an effect of the use of meta-surface optical devices according to exemplary embodiments.
- FIG. 24 is a plan view of an exemplary correct alignment between a meta-surface and a light control member
- FIG. 25 is a plan view of an exemplary incorrect alignment between a meta-surface and a light control member
- FIG. 26 is a plan view of another exemplary incorrect alignment between a meta-surface and a light control member
- FIGS. 27A, 27B, and 27C are photographs illustrating are photographs illustrating three exemplary alignment states of meta-surfaces and light control members
- FIGS. 28A, 28B, and 28C are photographs of structured optical patterns obtained using meta surface optical devices aligned as shown in FIGS. 27A, 27B, and 27C , respectively.
- a meta-surface may be used for any of various applications. However, an undesirable defect may occur as a result of an optical part that includes only a meta-structure.
- peripheral light is blocked by an optical part combining an aperture with a module.
- the assembling cost may be increased and precision may be reduced.
- a meta-surface optical device including a structure for reducing a zero-order effect, that is, a structure for reducing the effect of zero-order light in a diffractive optical element and a method of manufacturing the meta-surface optical device are described.
- the method of manufacturing the meta-surface optical element according to the present exemplary embodiment includes (1) a method of using an optical absorption material and (2) a method of forming a multi-functional meta-surface.
- FIG. 1D is a cross-sectional view of a meta-surface optical device according to an exemplary embodiment.
- a meta-surface 118 is formed on a region of a substrate 110 .
- the substrate 110 may be a material layer that is transparent with respect to light.
- the meta-surface 118 includes a plurality of patterns 120 formed on the substrate 110 .
- the patterns 120 are separated from each other by first gaps d 1 .
- the first gaps d 1 by which the patterns 120 are separated may be constant or may vary.
- the patterns 120 may have various respective widths w 1 .
- the widths w 1 of the patterns 120 may be equal to each other or may vary.
- the first gaps d 1 between the patterns 120 and the widths w 1 of the patterns 120 may be less than a wavelength of light incident on the meta-surface 118 .
- a material layer (hereinafter, a meta-material layer) 112 used for forming the meta-surface 118 is formed on the substrate 110 on both sides of the meta-surface 118 .
- the material forming the patterns 120 may be the same as the material of the meta-material layer 112 .
- the meta-material layer 112 may be a transparent material layer, and may include any of various materials according to the light intended to be incident on the device.
- the meta-material layer 112 may be formed of any of various dielectric materials, for example, amorphous silicon a-Si, titanium oxide (for example, TiO 2 ), or silicon nitride (for example, Si 3 N 4 ).
- the meta-material layer 112 formed on both sides of the meta-surface 118 may respectively include alignment key patterns 114 and 116 .
- the alignment key patterns 114 and 116 may be symmetrical with respect to the meta-surface 118 .
- the alignment key patterns 114 and 116 may be through holes passing through the meta-material layer 112 .
- Metal patterns or embossed patterns may also be formed as alignment key patterns.
- the metal patterns or the embossed patterns may be formed along or together with the through holes. Portions of the substrate 110 are thus exposed through the alignment key patterns 114 and 116 .
- the height and type of the alignment key patterns 114 and 116 may be the same as the height and type of alignment key patterns used in a related art semiconductor photolithography process.
- a light absorption layer 130 may be arranged on the meta-material layer 112 .
- the light absorption layer 130 may cover the meta-material layer 112 to prevent light from being incident on the meta-material layer 112 .
- the light absorption layer 130 may fill the through holes, to be the alignment key patterns 114 and 116 , and may completely cover an upper surface of the meta-material layer 112 around the alignment key patterns 114 and 116 .
- the light absorption layer 130 may be, for example, a photo-definable polymer layer.
- FIGS. 1A through 1D a method of manufacturing a meta-surface optical device according to an exemplary embodiment will now be described with reference to FIGS. 1A through 1D .
- the meta-material layer 112 is formed on the substrate 110 .
- the substrate 110 may be formed of a material that is transparent with respect to incident light.
- the meta-material layer 112 may be formed of the dielectric materials described above.
- a first region A 1 in which the meta-surface 118 (refer to FIG. 1B ) will be formed, and second and third regions AK 1 and AK 2 , in which the alignment key patterns 114 and 116 will be formed, are defined on the meta-material layer 112 .
- One of the second and third regions AK 1 and AK 2 may be on one side of the first region A 1 and the other of the second and third regions AK 1 and AK 2 may be on the other side of the first region A 1 .
- the second and third regions AK 1 and AK 2 may be symmetrical with respect to the first region A 1 .
- the meta-surface 118 including the patterns 120 is formed on the first region A 1 in the meta-material layer 112 .
- first and second alignment key patterns 114 and 116 respectively are also formed on the second and third regions AK 1 and AK 2 in the meta-material layer 112 .
- the first and second alignment key patterns 114 and 116 may be formed for aligning a photomask in a subsequent patterning process of the meta-material layer 112 .
- the meta-surface 118 and the first and second alignment key patterns 114 and 116 may be formed by using any of various nano-processes, such as photolithography, e-beam lithography, nano-imprint, soft-lithography, etc.
- the patterns 120 included in the meta-surface 118 may be formed to be separated from each other by the first gaps d 1 .
- the first gaps d 1 between the patterns 120 may be constant, as shown, or may vary.
- Each of the patterns 120 may have provided widths w 1 .
- the widths w 1 of the patterns 120 may be equal to each other, as shown, or may vary.
- the patterns 120 may have a provided height h 1 .
- the height h 1 of the patterns 120 may be equal to each other, as shown, or may vary.
- the light absorption layer 130 completely covering the meta-material layer 112 and the meta-surface 118 is formed on the substrate 110 and on the remaining portions of the meta-material.
- the light absorption layer 130 may also completely cover the first and second alignment key patterns 114 and 116 .
- the surface of the light absorption layer 130 may be flat.
- the light absorption layer 130 is removed from the meta-surface 118 .
- the meta-surface optical device is formed.
- the light absorption layer 130 is formed on both sides of the meta-surface 118 , light, for example, zero-order light incident on the regions outside the meta-surface 118 may be absorbed by the light absorption layer 130 . Accordingly, a defect, for example, an image of the meta-surface 118 or a bright spot on a boundary of the meta-surface 118 due to zero-order light does not occur on an image region formed by light incident on through the meta-surface 118 .
- the light absorption layer 130 is only one example of a light control member, and as described below, there are various types of light control members.
- a meta-surface optical device is arranged on a rear side of a substrate.
- the meta-surface 118 and the alignment key patterns 114 and 116 are arranged on the substrate 110 .
- the arrangement of the meta-surface 118 and the alignment key patterns 114 and 116 may be the same as that of FIG. 1D .
- a cladding layer 210 is formed on the substrate 110 and over the meta-surface 118 and the alignment key patterns 114 and 116 .
- the cladding layer 210 fills through holes that are the alignment key patterns 114 and 116 .
- the cladding layer 210 covers the meta-material layer 112 and the meta-surface 118 .
- the cladding layer 210 may be a planarization layer.
- the cladding layer 210 may be, for example, a spin-on-glass (SOG) layer, an SiO2 layer or an Si3N4 layer and so on.
- a light absorption layer 220 is attached to a bottom surface of the substrate 110 .
- the light absorption layer 220 may be the same material as the light absorption layer 130 of FIG. 1D .
- the light absorption layer 220 is arranged below the meta-material layer 112 and is not arranged below the meta-surface 118 . Accordingly, light incident on the meta-material layer 112 outside a region of the meta-surface 118 is absorbed by the light absorption layer 220 .
- the meta-surface 118 and the alignment key patterns 114 and 116 are formed on the substrate 110 .
- the meta-surface 118 and the alignment key patterns 114 and 116 may be formed as the method described with reference to FIGS. 1A and 1B .
- the cladding layer 210 covering the meta-surface 118 , the alignment key patterns 114 and 116 , and the meta-material layer 112 is formed on the substrate 110 and over the meta-surface 118 and the alignment key patterns 114 and 116 .
- the cladding layer 210 may be, for example, an SOG layer. After forming the cladding layer 210 , a surface of the cladding layer 210 is flattened.
- the light absorption layer 220 is formed.
- the light absorption layer 220 may be a photo-definable polymer layer.
- the light absorption layer 220 below the meta-surface 118 is removed by patterning the light absorption layer 220 .
- the patterning of the light absorption layer 220 may be performed by using any of various nano-processes, such as photolithography, e-beam lithography, nano-imprint, soft-lithography, etc. dry etching, or deposition or a composite of these processes.
- the meta-surface optical device may be formed, in which the portions of the bottom surface of the substrate 110 adjacent to the portion opposite the meta-surface 118 are covered by the light absorption layer 220 .
- FIG. 3A is a plan view of a meta-surface optical device according to another exemplary embodiment.
- the meta-surface optical device includes a first region 300 A in which a meta-surface is formed and a second region 300 B surrounding the first region 300 A.
- the second region 300 B performs an operation different from that of the first region 300 A with respect to incident light.
- the first region 300 A includes a plurality of patterns 310 that perform a specific operation with respect to incident light.
- the specific operation may be an operation of refracting or diffracting the incident light.
- the second region 300 B includes a plurality of patterns 320 .
- the patterns 320 in the second region 300 B may be light control members that effect the progress of light or change the progress direction of light, and perform an operation different from the operation of the patterns 310 formed in the first region 300 A with respect to incident light.
- the patterns 310 in the first region 300 A constitute a meta-surface.
- the patterns 310 are separated from each other by second gaps d 2 .
- the second gaps d 2 may have a size less than a wavelength of light incident onto the first region 300 A.
- the patterns 320 in the second region 300 B are separated from each other by third gaps d 3 .
- the third gaps d 3 may be larger or smaller than the second gaps d 2 .
- the patterns 320 in the second region 300 B may be provided to cause an operation, for example, absorption, reflection, or high refraction, different from that of the meta-surface with respect to incident light.
- the phrase “high refraction” denotes a refraction of light incident onto the second region 300 B so that the light incident on the second region 300 B deviates from an image region formed by the meta-surface in the first region 300 A.
- One of the absorption, reflection, and high refraction may be referred to as a first operation with respect to incident light, while another of the absorption, reflection, and high refraction may be a second operation, and yet another of the absorption, reflection, and high refraction may be a third operation.
- FIG. 3B is a cross-sectional view taken along a line 3 B- 3 B′ of FIG. 3A .
- patterns that is, meta-surface patterns 310 , are formed in a first region 300 A of a transparent substrate 300 and a plurality of patterns 320 are formed in a second region 300 B of a transparent substrate 300 .
- Third gaps d 3 and widths w 3 of the patterns 320 in the second region 300 B may be greater or less than second gaps d 2 and widths w 2 of the patterns 310 in the first region 300 A.
- a height h 2 of the patterns 310 in the first region 300 A may be equal to that of the patterns 320 in the second region 300 B.
- patterns 310 may be arranged in the first region 300 A of FIG. 3C
- patterns 330 having gaps d 2 and widths w 2 of the first patterns 310 of FIG. 3B
- the heights of the meta-surface patterns 310 in the first region 300 A and of the patterns 320 in the second region 300 B may be different from each other.
- a height h 11 of the meta-surface patterns 310 in the first region 300 A may be less than a height h 2 of the patterns 330 in the second region 300 B.
- FIG. 3D shows a case opposite to the case of FIG. 3C . That is, the meta-surface patterns 310 in the first region 300 A have a height greater than that of the patterns 320 in the second region 300 B.
- the results of FIG. 3C or FIG. 3D may be obtained by forming patterns 370 having the same height over a whole surface of the transparent substrate 300 , as shown in FIG. 3E , and by subsequently selectively etching the patterns 370 in an unselected region in a state in which a selected region, for example, the first region 300 A, is protected by a mask M 2 . Accordingly, the height of the patterns 370 in the unselected region may be controlled by controlling an etching time.
- the meta-surface patterns 310 having different heights from each other may be formed by selectively etching a meta-surface material layer after forming the meta-surface material layer on the transparent substrate 300 ; or, the meta-surface patterns 310 having different heights may be formed by processing meta-surface material layers having different heights through any of various processes, as would be understood by one of skill in the art.
- the patterns 320 may be arranged in the second region 300 B on a bottom surface of the transparent substrate 300 .
- the patterns 330 may be arranged in the second region 300 B, on the bottom surface of the transparent substrate 300 .
- the patterns 330 similar to those of FIG. 3D , may be arranged in the second region 300 B on the bottom surface of the transparent substrate 300 .
- FIGS. 5 through 13 are cross-sectional views respectively showing operations of meta-surfaces and light control members formed around the meta-surfaces with respect to incident light.
- the meta-surfaces may be the meta-surface patterns 310 formed in the first region 300 A as described with respect to any of reference to FIGS. 3 and 4
- the light control members may be the patterns 320 formed in the second region 300 B, as described with respect to any of FIGS. 3 and 4 .
- the meta-surfaces including a plurality of patterns formed on the transparent substrate 300 are depicted as a single material layer, and also, the light control members are depicted as a single material layer.
- FIG. 5 shows a case in which both a meta-surface 520 and a light control member 530 are arranged on a surface of a substrate 510 facing a light source 500 , and the light control member 530 includes patterns configured to reflect incident light.
- light (illustrated with solid lines) that is sequentially transmitted through the meta-surface 520 and the substrate 510 forms an image 540 in a region separated from the substrate 510 .
- the image 540 may be a structured optical pattern.
- light (illustrated with dashed lines) incident on the light control member 530 around the meta-surface 520 is reflected by the light control member 530 .
- FIG. 6 shows a case in which both of a meta-surface 520 and a light control member 550 are arranged on a surface of a substrate 510 facing a light source 500 , and the light control member 550 includes a plurality of patterns configured to absorb incident light.
- light (illustrated with solid lines) that is sequentially transmitted through the meta-surface 520 and the substrate 510 forms an image 540 in a region separated from the substrate 510 .
- light incident on the light control member 550 around the meta-surface 520 is absorbed by the light control member 550 .
- FIG. 7 shows a case in which both of a meta-surface 520 and a light control member 560 are arranged on a surface of a substrate 510 facing a light source 500 , and the light control member 560 includes a plurality of patterns configured to refract incident light away from a region in which an image 540 is formed.
- the operation of the meta-surface 520 is the same as that of the meta-surface 520 of FIG. 5 .
- light (illustrated with dashed lines) incident on the light control member 560 around the meta-surface 520 is refracted away from the region in which the image 540 is formed by the light transmitted by meta-surface 520 .
- FIG. 8 shows a case in which both a meta-surface 520 and first and second light control members 530 and 550 different from each other are arranged on a surface of the substrate 510 facing the light source 500 .
- the first and second light control members 530 and 550 include patterns configured to perform operations different from those of the meta surface 520 with respect to incident light.
- the operation of the meta-surface 520 is the same as that of the meta-surface 520 of FIG. 5 .
- light (illustrated with dashed lines) incident on the first light control member 530 around the meta-surface 520 is reflected and light (also illustrated with dashed lines) incident on the second light control member 550 is absorbed by the second light control member 550 .
- FIG. 9 shows a case in which a meta-surface 520 and a light control member 530 respectively are arranged on opposite surfaces of a substrate 510 , and the light control member 530 includes patterns configured to reflect incident light.
- the meta-surface 520 is arranged on a surface (hereinafter, a first surface) of the substrate 510 facing the light source 500 .
- the light control member 530 is arranged on a surface (hereinafter, a second surface) of the substrate 510 opposite the first surface.
- light (illustrated with dashed lines) incident on the light control member 530 around the meta-surface 520 is reflected by the light control member 530 , back towards the light source 500 after being transmitted through the substrate 510 .
- FIG. 10 shows a case in which a meta-surface 520 and a light control member 550 are arranged on different surfaces of the substrate 510 , and the light control member 550 includes patterns configured to absorb incident light.
- the meta-surface 520 is arranged on the first surface of the substrate 510 and the light control member 550 is arranged on the second surface of the substrate 510 .
- the arrangement location of the light control member 550 is the same as that shown in FIG. 9 .
- the operation of light (illustrated with solid lines) that has passed through the meta-surface 520 is the same as the operation of the light incident on the meta-surface 520 of FIG. 9 .
- light (illustrated with dashed lines) incident on the light control member 550 is absorbed by the light control member 550 after being transmitted through the substrate 510 .
- FIG. 11 shows a case in which a meta-surface 520 and a light control member 560 respectively are arranged on different surfaces of the substrate 510 , and the light control member 560 includes patterns configured to refract incident light away from the region in which the image 540 is formed.
- the meta-surface 520 is arranged on the first surface of the substrate 510 .
- the light control member 560 is arranged on the second surface of the substrate 510 .
- the arrangement location of the light control member 560 may be the same as that shown in FIG. 9 .
- an operation of light (illustrated with solid lines) that has been transmitted through the meta-surface 520 is the same as the operation of the light transmitted through the meta-surface 520 of FIG. 9 .
- light (illustrated with dashed lines) incident on the light control member 560 is refracted away from the image 540 .
- FIG. 12 shows a case in which a meta-surface 520 is arranged on the first surface of the substrate 510 and first and second light control members 530 and 560 , which perform operations different from each other with respect to incident light, are arranged on the second surface of the substrate 510 , and the first and second light control members 530 and 560 include patterns configured to respectively reflect light and to refract light away from the image 540 .
- the locations of arrangements of the light control members 530 and 560 may be the same as the locations of the light control members 530 , 550 , and 560 as shown in FIGS. 9 through 11 .
- the operation of light (illustrated with solid lines) that is transmitted through the meta-surface 520 is the same as the light incident on the meta-surface 520 of FIG. 9 .
- light (illustrated with dashed lines) incident on the light control member 530 is reflected therefrom after being transmitted through the substrate 510 .
- light (also illustrated with dashed lines) incident on the light control member 560 is refracted away from the image 540 .
- FIG. 13 shows a case in which a meta-surface 520 is arranged on the first surface of the substrate 510 and light control members 530 and 550 , that perform operations different from each other with respect to incident light are arranged on the second surface of the substrate 510 , and the light control members 530 and 550 include patterns configured to respectively reflect and absorb incident light.
- arrangement locations of the light control members 530 and 550 are the same as the locations of the light control members 530 and 560 of FIG. 12 .
- An operation of the light (illustrated with solid lines) that has been transmitted through the meta-surface 520 is the same as the light incident on the meta-surface 520 of FIG. 9 .
- light (illustrated with dashed lines) incident on the light control member 530 is reflected after being transmitted through the substrate 510 .
- light (also illustrated with dashed lines) incident on the light control member 550 is absorbed by the light control member 550 .
- FIG. 14 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment.
- the meta-surface patterns 120 , the meta-material layer 112 , and the alignment key patterns 114 and 116 that are described with reference to FIG. 1B are arranged on the substrate 110 .
- the meta-material layer 112 , disposed around the meta-surface 118 , and the alignment key patterns 114 and 116 are covered by a metal film 1410 .
- the through holes, that is, the alignment key patterns 114 and 116 are also covered by the metal film 1410 . That is, all regions on the substrate 110 except for the region of the meta-surface 118 are covered by the metal film 1410 .
- the metal film 1410 may be a light control member that reflects incident light. Accordingly, all light incident on regions around the meta-surface 118 may be reflected by the metal film 1410 .
- the metal film 1410 may be, for example, an Au film.
- FIGS. 15A through 15D are cross-sectional views of a method of manufacturing the meta-surface optical device of FIG. 14 .
- the meta-surface 118 and the alignment key patterns 114 and 116 are formed in the meta-material layer 112 on the substrate 110 .
- a mask layer 1500 covering the meta-material layer 112 , the meta-surface 118 , the alignment key patterns 114 and 116 , and exposed portions of the substrate 110 is formed on the substrate 110 .
- the mask layer 1500 may be a photosensitive film.
- FIG. 15B after exposing a portion of the mask layer 1500 by using a photolithography process, the mask layer 1500 is removed except for the portion covering the meta-surface 118 .
- the metal film 1410 is formed to cover completely the upper surface of the mask layer 1500 , the meta-material layer 112 , the alignment key patterns 114 and 116 , and exposed regions of the substrate 110 . Accordingly, all regions around the mask layer 1500 including the upper surface of the remaining portion of the mask layer 1500 are covered by the metal film 1410 .
- the mask layer 1500 is removed by using a lift-off process. At this point, the metal film 1410 formed on the mask layer 1500 is also removed.
- the mask layer 1500 may be removed by using, for example, an ashing process.
- a meta-surface optical device in which the metal film 1410 as a light control member is formed around the meta-surface 118 is formed.
- FIG. 16 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment.
- FIG. 16 shows a case in which meta-surfaces are respectively formed on both surfaces of a transparent substrate 1700 .
- a first meta-material layer 1710 is arranged on an upper surface of the substrate 1700 .
- the first meta-material layer 1710 includes a first meta-surface 1718 and first alignment key patterns 1714 .
- the first meta-surface 1718 includes a plurality of patterns 1720 .
- the substrate 1700 is exposed through gaps between the patterns 1720 .
- the patterns 1720 are separated by first gaps d 1 .
- Each of the patterns 1720 has a width w 1 and a height h 1 .
- the first gaps d 1 and the width w 1 are less than a wavelength of incident light.
- a first cladding layer 1730 is formed to cover the first meta-surface 1718 , the first alignment key patterns 1714 , and exposed portions of the substrate 1700 .
- a surface of the first cladding layer 1730 is flat.
- the first cladding layer 1730 may be, for example, a spin-on-glass (SOG) layer.
- a first light blocking layer 1750 is arranged on the first cladding layer 1730 .
- the first light blocking layer 1750 may completely cover an upper surface of the first cladding layer 1730 except for a portion of the first cladding layer 1730 corresponding to the first meta-surface 1718 .
- the first light blocking layer 1750 may be a light absorption layer or a light reflection layer.
- the first light blocking layer 1750 may be a metal layer or a polymer layer.
- a second meta-material layer 1712 is attached to a bottom surface of the transparent substrate 1700 .
- the second meta-material layer 1712 includes a second meta-surface 1738 and second alignment key patterns 1734 .
- the second alignment key patterns 1734 are formed by one and one on both sides of the second meta-surface 1738 .
- the second alignment key patterns 1734 may be vertically symmetrical, about the transparent substrate 1700 , with respect to the first alignment key patterns 1714 .
- the first meta-surface 1738 includes a plurality of patterns 1760 .
- the patterns 1760 are separated by fourth gaps d 4 , and each has a width w 4 .
- the fourth gaps d 4 and the width w 4 of the patterns 1760 that constitute the second meta-surface 1738 are less than a wavelength of incident light.
- the fourth gaps d 4 and the width w 4 of the patterns 1760 that constitute the second meta-surface 1738 may be different from the first gaps d 1 and the width w 1 of the patterns 1720 that constitute the first meta-surface 1718 .
- the fourth gaps d 4 and the width w 4 of the patterns 1760 that respectively constitute the second meta-surface 1738 may be greater than the first gaps d 1 and the width w 1 of the patterns 1720 that constitute the first meta-surface 1718 .
- the first meta-surface 1718 and the second meta-surface 1738 may be operated, respectively, as different optical elements from each other with respect to incident light.
- the first meta-surface 1718 may act as a first refractive optical element and the second meta-surface 1738 may act as a second refractive optical element.
- the first and second refractive optical elements may be a lens.
- a second cladding layer 1770 is formed, covering the second meta-surface 1738 and the second alignment key patterns 1734 , below the second meta-material layer 1712 .
- the second cladding layer 1770 may include the same material as the first cladding layer 1730 .
- a bottom surface of the second cladding layer 1770 is flat.
- a second light blocking layer 1790 is attached to the bottom surface of the second cladding layer 1770 .
- the second light blocking layer 1790 covers the whole bottom surface of the second cladding layer 1770 except for a portion of the second cladding layer 1770 corresponding to the second meta-surface 1738 .
- the second light blocking layer 1790 may be a light absorption layer or a light reflection layer.
- FIGS. 17A through 17I are cross-sectional views of a method of manufacturing the meta-surface optical device of FIG. 16 .
- the first meta-material layer 1710 is formed on an upper surface of the transparent substrate 1700 .
- the first meta-material layer 1710 may include any of various dielectric materials, for example, amorphous silicon a-Si, titanium oxide (for example, TiO 2 ), or silicon nitride (for example, Si 3 N 4 ).
- the first meta-material layer 1710 may include a first region 17 A 1 , on which a meta-surface will be formed in a subsequent process, and second and third regions 17 A 2 and 17 A 3 , on which alignment key patterns 114 and 116 will be formed in a subsequent process.
- the second meta-material layer 1712 is formed on the bottom surface of the transparent substrate 1700 .
- the first meta-surface 1718 and the first alignment key patterns 1714 are formed by patterning the first meta-material layer 1710 using, for example, the method described with reference to FIG. 1B .
- the first cladding layer 1730 is formed, completely covering the first meta-surface 1718 , the first alignment key patterns 1714 , and exposed regions of the upper surface of the transparent substrate 1700 , and the upper surface of the first cladding layer 1730 is planarized. Accordingly, the first meta-surface 1718 , the first alignment key patterns 1714 , and exposed portions of the transparent substrate 1700 are covered by the first cladding layer 1730 .
- the first cladding layer 1730 may be an SOG layer, but is not limited thereto.
- a mask 1740 that covers a portion of the first cladding layer 1730 corresponding to the first meta-surface 1718 and exposes remaining portions of the first cladding layer 1730 , is formed on the first cladding layer 1730 .
- the mask 1740 may be a photo-sensitive film.
- the first light blocking layer 1750 is formed, covering the mask 1740 and exposed portions of the first cladding layer 1730 .
- the first light blocking layer 1750 may be a light absorption layer or a light reflection layer.
- the first light blocking layer 1750 may be, for example, a metal layer or a polymer layer, but is not limited thereto.
- the portion of the first light blocking layer 1750 formed on the mask 1740 is also removed together with the mask 1740 .
- the first light blocking layer 1750 corresponding to the first meta-surface 1718 is removed, and only the first light blocking layer 1750 corresponding to peripheral regions of the first meta-surface 1718 remains.
- the product of FIG. 17F may be turned over, such that the second meta-material layer 1712 is disposed placed above the transparent substrate 1700 .
- the second meta-surface 1738 and the second alignment key patterns 1734 are formed by patterning the second meta-material layer 1712 .
- the second meta-surface 1738 is formed on a location corresponding to the location of the first meta-surface 1718
- the second alignment key patterns 1734 may be formed on locations corresponding to the locations of the first alignment key patterns 1714 .
- the second cladding layer 1770 is formed on the second meta-surface 1738 , the second alignment key patterns 1734 , and exposed portions of the transparent substrate 1700 . Accordingly, all of the second meta-material layer 1712 , the second meta-surface 1738 , the second alignment key patterns 1734 , and exposed portions of the transparent substrate 1700 are covered by the second cladding layer 1770 .
- a mask 1780 is formed only on a region of the second cladding layer 1770 corresponding to the second meta-surface 1738 .
- the mask 1780 may be a photo-sensitive film.
- the second light blocking layer 1790 is formed, covering an upper surface of the mask 1780 and exposed regions of the second cladding layer 1770 .
- the second light blocking layer 1790 may be a light absorption layer or a light reflection layer.
- the second light blocking layer 1790 may be made of the same material as the first light blocking layer 1750 .
- the mask 1780 is removed by using a lift-off process.
- the second light blocking layer 1790 formed on the mask 1780 is also removed together with the mask 1780 .
- a meta-surface optical device having the second meta-surface 1738 and the first meta-surface 1718 respectively on and below the transparent substrate 1700 and that blocks light incident on peripheral regions of the second meta-surface 1738 and the first meta-surface 1718 , may be formed.
- FIG. 18 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment.
- a plurality of meta-surfaces are formed on a transparent substrate 1700 .
- a first meta-material layer 1710 including a first meta-surface 1718 and first alignment key patterns 1714 is formed on the transparent substrate 1700 .
- the first meta-material layer 1710 is covered by a first cladding layer 1730 , and a surface of the first cladding layer 1730 is flat.
- a second meta-material layer 1810 that includes a second meta-surface 1818 and second alignment key patterns 1814 is formed on the first cladding layer 1730 .
- the second meta-surface 1818 may be made of the same material as the first meta-material layer 1710 .
- the second meta-surface 1818 includes a plurality of patterns 1820 .
- the patterns 1820 may have gaps, widths, and heights corresponding to the gaps d 1 , width w 1 , and height h 1 of the patterns 1720 of the first meta-surface 1718 .
- the second meta-material layer 1810 is covered by a second cladding layer 1830 , and a surface of the second cladding layer 1830 is flat.
- a light blocking layer 1850 is arranged on the second cladding layer 1830 .
- the light blocking layer 1850 is arranged on the third cladding layer 1830 except for a region of the second cladding layer 1830 corresponding to the second meta-surface 1818 .
- the light blocking layer 1850 may be one of the light control members that change a progress of light or a direction of progress of light, and may be a light absorption layer or a light reflection layer. Also, the light blocking layer 1850 may be a metal layer or a polymer layer, but is not limited thereto.
- FIGS. 19A through 19E are cross-sectional views of a method of manufacturing the meta-surface optical device of FIG. 18 .
- the first meta-surface 1718 and the first alignment key patterns 1714 are formed by patterning the first meta-material layer 1710 .
- the first meta-surface 1718 and the first alignment key patterns 1714 may be formed, for example, by using a method described with reference to FIG. 1B .
- the first cladding layer 1730 covering the first meta-material layer 1710 is formed, and afterwards, an upper surface of the first cladding layer 1730 is planarized.
- the second meta-material layer 1810 is formed on the first cladding layer 1730 .
- the second meta-material layer 1810 may include the same material as the first meta-material layer 1710 .
- the second meta-surface 1818 and the second alignment key patterns 1814 are formed in the second meta-material layer 1810 by patterning the second meta-material layer 1810 . Accordingly, the second meta-surface 1818 and the second alignment key patterns 1814 are formed on the first cladding layer 1730 .
- the second meta-surface 1818 and the second alignment key patterns 1814 may be formed, for example, by using a method described with reference to FIG. 1B .
- the second meta-surface 1818 may be formed on a location corresponding to the location of the first meta-surface 1718
- the second alignment key patterns 1814 may be formed on locations corresponding to the locations of the first alignment key patterns 1714 .
- the second cladding layer 1830 is formed, covering the second meta-surface 1818 , the second meta-surface 1818 , the second alignment key patterns 1814 , and exposed portions of the first cladding layer 1730 . Accordingly, all of the second meta-surface 1818 , the second alignment key patterns 1814 , and exposed portions of the first cladding layer 1730 are covered by the second cladding layer 1830 .
- the second cladding layer 1830 may include the same material as the first cladding layer 1730 .
- the light blocking layer 1850 is formed on the second cladding layer 1830 .
- the light blocking layer 1850 is formed only on a region of the second cladding layer 1830 .
- the light blocking layer 1850 may be formed on a whole upper surface of the second cladding layer 1830 except for a region of the second cladding layer 1830 corresponding to the second meta-surface 1818 .
- the light blocking layer 1850 may be a light absorption layer or a light reflection layer.
- the light blocking layer 1850 may be, for example, a metal layer or a polymer layer, but is not limited thereto.
- the meta-surface optical device depicted in FIG. 18 may be formed.
- a process of stacking the second meta-material layer 1810 and the second cladding layer 1830 on the second cladding layer 1830 may further be performed at least one times.
- the light blocking layer 1850 may be formed on the uppermost cladding layer.
- FIGS. 20A through 20C are cross-sectional views of a meta-surface optical device according to another exemplary embodiment.
- a separated meta-material layer 2012 is formed on a transparent substrate 2010 .
- the meta-material layer 2012 may include any of various dielectric materials, for example, amorphous silicon a-Si, titanium oxide (for example, TiO 2 ), or silicon nitride (for example, Si 3 N 4 ).
- a meta-surface 2060 is formed between the separated meta-material layers 2012 .
- the meta-surface 2060 includes a plurality of patterns 2040 .
- the patterns 2040 are separated from each other by fifth gaps d 5 , and have a width w 5 and a height h 5 .
- the fifth gaps d 5 and the width w 5 are less than a wavelength of incident light.
- the patterns 2040 may include the same material as the meta-material layer 2012 .
- a light blocking film 2020 is provided on the meta-material layer 2012 .
- the light blocking film 2020 covers a whole upper surface of the meta-material layer 2012 .
- the light blocking film 2020 may be a light reflection layer or a light absorption layer.
- the light blocking film 2020 may be, for example, a metal layer or a polymer layer, but is not limited thereto.
- the light blocking film 2020 of FIG. 20A may be arranged on a bottom surface of the transparent substrate 2010 . Also, as depicted in FIG. 20C , the light blocking film 2020 may be arranged between the transparent substrate 2010 and the meta-material layer 2012 .
- FIGS. 21A through 21G are cross-sectional views of a method of manufacturing the meta-surface optical device of FIG. 20A .
- the meta-material layer 2012 and the light blocking layer 2020 are sequentially stacked on the transparent substrate 2010 .
- a mask layer 2030 is formed on the light blocking layer 2020 .
- the mask layer 2030 may be a photo-sensitive film layer.
- the mask layer 2030 includes a pattern region 2030 A including a plurality of patterns 2040 A.
- the patterns 2040 A are separated from each other, and thus, the light blocking layer 2020 is exposed through gaps between the patterns 2040 A.
- the pattern region 2030 A defines a region in which a meta-surface will be formed. Exposed portions of the light blocking layer 2020 are etched in a state in which the mask layer 2030 is present. The etching is continued until the meta-material layer 2012 is exposed.
- the whole pattern region 2030 A of the mask layer 2030 is transferred to the light blocking layer 2020 .
- a pattern region 2020 A formed by transferring the pattern region 2030 A of the mask layer 2030 , is formed in the light blocking layer 2020 on the meta-material layer 2012 .
- the light blocking layer 2020 is used as a mask in a subsequent process. That is, as depicted in FIG. 21E , the meta-material layer 2012 is etched by using the light blocking layer 2020 including the pattern region 2020 A. The etching may be continued until the transparent substrate 2010 is exposed. As a result of the etching, a meta-surface including a plurality of patterns 2040 is formed in the meta-material layer 2012 .
- the pattern region 2020 A is removed from the light blocking layer 2020 by using a stamp 2050 .
- the stamp 2050 may include any of various polymers including polydimethylsiloxane (PDMS).
- the meta-surface optical devices of FIGS. 20B and 20C may be readily formed by changing the locations of the light blocking layer in the process of forming the meta-surface optical element depicted in FIG. 20A .
- the selectivity of the stamp 2050 with respect to the pattern region 2020 A may be increased in the process of removing the pattern region 2020 A using the stamp 2050 .
- FIG. 23 is photographs showing an effect of the use of meta-surface optical devices according to exemplary embodiments.
- the photograph on the left side shows a case in which a conventional optical element is used and the photograph on the right side shows a case in which a meta-surface optical device according to an exemplary embodiment is used.
- this shows that, when a meta-surface optical device, according to an exemplary embodiments is used, the quality of an image (for example, a structured optical pattern) formed by the meta-surface may be increased.
- FIG. 24 shows a case in which a meta-surface region AA 1 and a light control member region AA 2 are correctly aligned in a meta-surface optical device 2300 .
- FIG. 25 shows a case in which a gap EA 1 , having a width D 11 , is present between the meta-surface region AA 1 and the light control member region AA 2 .
- the size of the gap EA 1 may be less than six times a wavelength of incident light. That is, if the size of the gaps EA 1 do not exceed six times of a wavelength of incident light, a zero-order-effect does not occur.
- a wavelength of incident light is 940 nm, and a size of the gap EA 1 is within approximately 5 ⁇ m, as depicted in FIG. 28 , a clean structured optical pattern without a zero-order-effect may be obtained.
- FIG. 26 shows a case in which the light control member region AA 2 overlaps the meta-surface region AA 1 .
- the light control member region AA 2 overlaps the meta-surface region AA 1 by as much as a distance D 22 from a boundary 2330 therebetween, that is, when width D 22 of the overlap of the light control member region AA 2 with the meta-surface region AA 1 is less than ten times the wavelength of incident light, the zero-order-effect may not occur. For example, if a wavelength of incident light is 940 nm, and a width of the overlap is within approximately 9 ⁇ m, a clean structured optical pattern without a zero-order-effect may be obtained.
- FIGS. 27A, 27B, and 27C are photographs showing actually measured results with respect to three alignment states of meta-surfaces and light control members around the meta-surfaces.
- FIG. 27A shows a photograph of a state in which the meta-surface and the light control member are correctly aligned
- FIG. 27B shows a photograph of a state in which a gap having a width of 2.5 ⁇ m is present between the meta-surface and the light control member
- FIG. 27C shows a photograph of a state in which a gap having a width of approximately 5 ⁇ m is present.
- FIGS. 28A, 28B, and 28C are photographs of structured optical patterns obtained using meta surface optical devices aligned as shown in FIGS. 27A, 27B, and 27C , respectively.
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Abstract
Description
- This application claims priority from Korean Patent Application No. 10-2017-0121873, filed on Sep. 21, 2017, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.
- Apparatuses and methods consistent with exemplary embodiments relate to optical elements, and more particularly, to meta-surface optical elements and methods of manufacturing the same.
- In order to overcome the limit of related art optical techniques, a technique that uses a meta-surface has been developed. When an optical part having a meta-surface is used, the size of the element may be reduced, and also, optical efficiency and resolution may be increased as compared to a conventional optical element.
- A meta-surface includes a plurality of patterns. Optical characteristics of a meta-surface vary according to the specific nano-structure patterns used in the meta-surface. A phase delay may be created based on the radius of the patterns of the meta-surface, and a lens may be realized using a meta-surface based on this phase delay.
- One or more exemplary embodiments may provide meta-surface optical elements configured to reduce a zero-order effect.
- One or more exemplary embodiments may provide methods of manufacturing the meta-surface optical elements.
- Additional exemplary aspects will be set forth in part in the description which follows and, in part, will be apparent from the description, or may be learned by practice of the presented exemplary embodiments.
- According to an aspect of an exemplary embodiment, a meta-surface optical element includes a substrate, a first meta-surface arranged on a region of the substrate, and a light control member arranged around the first meta-surface.
- The light control member may be arranged on an upper surface or a bottom surface of the substrate.
- The meta-surface optical element may further include a material layer, that is the same material as the first meta-surface disposed between the light control member and the substrate.
- The meta-surface optical element may further include a material layer completely covering an upper surface of the light control member.
- The meta-surface optical element may further include a second meta-surface on a bottom surface of the substrate.
- At least one second meta-surface may be stacked on the first meta-surface, and the light control member may be arranged around the at least one second meta-surface.
- The light control member may be a light absorption layer or a light reflection layer.
- The light control member may include a plurality of patterns that perform a first operation with respect to light incident thereon different from a second operation performed by the first meta-surface with respect to light incident thereon.
- The light control member may include a first plurality of patterns that perform a first operation with respect to light incident thereon and a second plurality of patterns that perform a second operation, different from the first operation, with respect to light incident thereon, and the first meta-surface may perform a third operation, different from the first operation and the second operation, with respect to light incident thereon.
- The material layer may include alignment key patterns.
- The meta-surface optical element may further include a second light control member around the second meta-surface.
- The second meta-surface may include a plurality of patterns that perform an operation, with respect to light incident thereon, different from an operation performed by the first meta-surface with respect to light incident thereon.
- The first meta-surface and the light control member having a gap therebetween, the gap having a width less than six times a wavelength of incident light. For example the width of the gap may be equal to or less than 5 μm.
- The first meta-surface and the light control member may overlap each other with a width of the overlap being less than ten times a wavelength of incident light. For example, the width of the overlap may be equal to or less than 9 μm.
- According to an aspect of another exemplary embodiment, a method of manufacturing a meta-surface optical element is provided, the method including forming a meta-surface on a substrate and forming alight control member around the meta-surface.
- The light control member may be separated from an upper surface of the substrate.
- The light control member may contact the upper surface of the substrate.
- The light control member may be formed on a bottom surface of the substrate.
- The light control member may be formed on and below the substrate.
- The forming of the meta-surface on the substrate may include sequentially forming first and second meta-surfaces on the substrate.
- The method may further include forming another meta-surface below the substrate.
- The meta-surface and the light control member may be formed on the same surface of the substrate.
- The meta-surface and the light control member may be formed on different surfaces from each other of the substrate.
- The light control member may include a first part that performs a first operation with respect to light incident thereon and a second part that performs a second operation, different from the first operation, with respect to light incident thereon.
- The light control member may include a light absorption layer or a light reflection layer.
- The light control member may include patterns that absorb, reflect, or refract incident light.
- The light control member may be formed to be separate from the meta-surface with a separation distance that is less than six times of a wavelength of incident light. For example, the separation distance may be less than or equal to 5 μm.
- The light control member and the meta-surface may overlap with each other with an overlap width that is less than ten times of a wavelength of incident light. For example, the overlap width may be less than or equal to 9 μm.
- These and/or other exemplary aspects and advantages will become apparent and more readily appreciated from the following description of exemplary embodiments, taken in conjunction with the accompanying drawings in which:
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FIGS. 1A through 1D are cross-sectional views of a method of manufacturing a meta-surface optical device according to an exemplary embodiment; -
FIGS. 2A through 2C are cross-sectional views of a method of manufacturing a meta-surface optical device according to another exemplary embodiment; -
FIG. 3A is a plan view of a meta-surface optical device according to another exemplary embodiment; -
FIG. 3B is a cross-sectional view taken alongline 3B-3B′ ofFIG. 3A ; -
FIGS. 3C and 3D are cross-sectional views of modifications of the meta-surface optical device ofFIG. 3B ; -
FIG. 3E is a cross-sectional view for explaining an exemplary manufacturing process for obtaining the results ofFIGS. 3C and 3D ; -
FIGS. 4A through 4C are cross-sectional views of a meta-surface optical device according to another exemplary embodiment; -
FIGS. 5 through 13 are cross-sectional views respectively showing operations of meta-surfaces and light control members formed around the meta-surfaces with respect to incident light, according to exemplary embodiments; -
FIG. 14 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment; -
FIGS. 15A through 15D are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device ofFIG. 14 ; -
FIG. 16 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment; -
FIGS. 17A through 17I are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device ofFIG. 16 ; -
FIG. 18 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment; -
FIGS. 19A through 19E are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device ofFIG. 18 ; -
FIGS. 20A through 20C are cross-sectional views of a meta-surface optical device according to another exemplary embodiment; -
FIGS. 21A through 21G are cross-sectional views of an exemplary method of manufacturing the meta-surface optical device ofFIG. 20A ; -
FIG. 22 is a cross-sectional view showing a case in which a material layer having a high adhesion force with respect to a light blocking layer is attached to a surface of a stamp to be attached to a pattern region; -
FIG. 23 is photographs showing an effect of the use of meta-surface optical devices according to exemplary embodiments; -
FIG. 24 is a plan view of an exemplary correct alignment between a meta-surface and a light control member; -
FIG. 25 is a plan view of an exemplary incorrect alignment between a meta-surface and a light control member; -
FIG. 26 is a plan view of another exemplary incorrect alignment between a meta-surface and a light control member; -
FIGS. 27A, 27B, and 27C are photographs illustrating are photographs illustrating three exemplary alignment states of meta-surfaces and light control members; -
FIGS. 28A, 28B, and 28C are photographs of structured optical patterns obtained using meta surface optical devices aligned as shown inFIGS. 27A, 27B, and 27C , respectively. - A meta-surface may be used for any of various applications. However, an undesirable defect may occur as a result of an optical part that includes only a meta-structure.
- Commonly, peripheral light is blocked by an optical part combining an aperture with a module.
- In the case of a meta-surface optical part formed by using a semiconductor process and an integration technique, the assembling cost may be increased and precision may be reduced.
- In particular, in the case of a structured optical pattern like a meta-surface optical part used in a depth sensor, it is important to reduce or remove light that is not used for forming the structured optical pattern, that is, zero-order light or zero-order noise.
- Therefore, in the present exemplary embodiments, a meta-surface optical device including a structure for reducing a zero-order effect, that is, a structure for reducing the effect of zero-order light in a diffractive optical element and a method of manufacturing the meta-surface optical device are described. The method of manufacturing the meta-surface optical element according to the present exemplary embodiment includes (1) a method of using an optical absorption material and (2) a method of forming a multi-functional meta-surface.
- Through combining the various methods described below, various manufacturing methods and meta-surface optical devices may be induced.
- Meta-surface optical devices and methods of manufacturing the meta-surface optical devices will now be described in detail with reference to the accompanying drawings. In the drawings, thicknesses of layers and regions may be exaggerated for clarity of the specification.
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FIG. 1D is a cross-sectional view of a meta-surface optical device according to an exemplary embodiment. - Referring to
FIG. 1D , a meta-surface 118 is formed on a region of asubstrate 110. Thesubstrate 110 may be a material layer that is transparent with respect to light. The meta-surface 118 includes a plurality ofpatterns 120 formed on thesubstrate 110. Thepatterns 120 are separated from each other by first gaps d1. The first gaps d1 by which thepatterns 120 are separated may be constant or may vary. Thepatterns 120 may have various respective widths w1. The widths w1 of thepatterns 120 may be equal to each other or may vary. The first gaps d1 between thepatterns 120 and the widths w1 of thepatterns 120 may be less than a wavelength of light incident on the meta-surface 118. A material layer (hereinafter, a meta-material layer) 112 used for forming the meta-surface 118 is formed on thesubstrate 110 on both sides of the meta-surface 118. The material forming thepatterns 120 may be the same as the material of the meta-material layer 112. The meta-material layer 112 may be a transparent material layer, and may include any of various materials according to the light intended to be incident on the device. The meta-material layer 112 may be formed of any of various dielectric materials, for example, amorphous silicon a-Si, titanium oxide (for example, TiO2), or silicon nitride (for example, Si3N4). The meta-material layer 112 formed on both sides of the meta-surface 118 may respectively include alignmentkey patterns key patterns surface 118. The alignmentkey patterns material layer 112. Metal patterns or embossed patterns may also be formed as alignment key patterns. The metal patterns or the embossed patterns may be formed along or together with the through holes. Portions of thesubstrate 110 are thus exposed through the alignmentkey patterns key patterns light absorption layer 130 may be arranged on the meta-material layer 112. Thelight absorption layer 130 may cover the meta-material layer 112 to prevent light from being incident on the meta-material layer 112. Thelight absorption layer 130 may fill the through holes, to be the alignmentkey patterns material layer 112 around the alignmentkey patterns light absorption layer 130 may be, for example, a photo-definable polymer layer. - Next, a method of manufacturing a meta-surface optical device according to an exemplary embodiment will now be described with reference to
FIGS. 1A through 1D . - Referring to
FIG. 1A , the meta-material layer 112 is formed on thesubstrate 110. Thesubstrate 110 may be formed of a material that is transparent with respect to incident light. The meta-material layer 112 may be formed of the dielectric materials described above. A first region A1, in which the meta-surface 118 (refer toFIG. 1B ) will be formed, and second and third regions AK1 and AK2, in which the alignmentkey patterns material layer 112. One of the second and third regions AK1 and AK2 may be on one side of the first region A1 and the other of the second and third regions AK1 and AK2 may be on the other side of the first region A1. The second and third regions AK1 and AK2 may be symmetrical with respect to the first region A1. - Referring to
FIG. 1B , the meta-surface 118 including thepatterns 120 is formed on the first region A1 in the meta-material layer 112. When the meta-surface 118 is formed, first and second alignmentkey patterns material layer 112. The first and second alignmentkey patterns material layer 112. The meta-surface 118 and the first and second alignmentkey patterns patterns 120 included in the meta-surface 118 may be formed to be separated from each other by the first gaps d1. The first gaps d1 between thepatterns 120 may be constant, as shown, or may vary. Each of thepatterns 120 may have provided widths w1. The widths w1 of thepatterns 120 may be equal to each other, as shown, or may vary. Thepatterns 120 may have a provided height h1. The height h1 of thepatterns 120 may be equal to each other, as shown, or may vary. - Next, as depicted in
FIG. 1C , thelight absorption layer 130 completely covering the meta-material layer 112 and the meta-surface 118 is formed on thesubstrate 110 and on the remaining portions of the meta-material. Thus, thelight absorption layer 130 may also completely cover the first and second alignmentkey patterns light absorption layer 130 may be flat. Next, after a photomask M1 is formed on thelight absorption layer 130 outside a region of the meta-surface 118, thelight absorption layer 130 is removed from the meta-surface 118. As an example, after selectively exposing a region of thelight absorption layer 130 corresponding to the meta-surface 118 by using a general selective photolithography process, only thelight absorption layer 130 in the region of the meta-surface 118 may be removed by developing the exposed region of thelight absorption layer 130. In this manner, as depicted inFIG. 1D , the meta-surface optical device is formed. - Since the
light absorption layer 130 is formed on both sides of the meta-surface 118, light, for example, zero-order light incident on the regions outside the meta-surface 118 may be absorbed by thelight absorption layer 130. Accordingly, a defect, for example, an image of the meta-surface 118 or a bright spot on a boundary of the meta-surface 118 due to zero-order light does not occur on an image region formed by light incident on through the meta-surface 118. - As a result, due to the
light absorption layer 130 provided around the meta-surface 118, the quality of an image region, for example, a structured optical pattern formed by the meta-surface 118 may be increased. Thelight absorption layer 130 is only one example of a light control member, and as described below, there are various types of light control members. - Next, a meta-surface optical device according to another exemplary embodiment will now be described. In this case, a light control member is arranged on a rear side of a substrate.
- Referring to
FIG. 2C , the meta-surface 118 and the alignmentkey patterns substrate 110. The arrangement of the meta-surface 118 and the alignmentkey patterns FIG. 1D . Acladding layer 210 is formed on thesubstrate 110 and over the meta-surface 118 and the alignmentkey patterns cladding layer 210 fills through holes that are the alignmentkey patterns cladding layer 210 covers the meta-material layer 112 and the meta-surface 118. Thecladding layer 210 may be a planarization layer. Thecladding layer 210 may be, for example, a spin-on-glass (SOG) layer, an SiO2 layer or an Si3N4 layer and so on. Alight absorption layer 220 is attached to a bottom surface of thesubstrate 110. Thelight absorption layer 220 may be the same material as thelight absorption layer 130 ofFIG. 1D . Thelight absorption layer 220 is arranged below the meta-material layer 112 and is not arranged below the meta-surface 118. Accordingly, light incident on the meta-material layer 112 outside a region of the meta-surface 118 is absorbed by thelight absorption layer 220. - Next, a method of manufacturing the meta-surface optical device according to another exemplary embodiment will now be described with reference to
FIGS. 2A through 2C . - Referring to
FIG. 2A , the meta-surface 118 and the alignmentkey patterns substrate 110. The meta-surface 118 and the alignmentkey patterns FIGS. 1A and 1B . Next, thecladding layer 210 covering the meta-surface 118, the alignmentkey patterns material layer 112 is formed on thesubstrate 110 and over the meta-surface 118 and the alignmentkey patterns cladding layer 210 may be, for example, an SOG layer. After forming thecladding layer 210, a surface of thecladding layer 210 is flattened. - Next, as depicted in
FIG. 2B , thelight absorption layer 220, completely covering a bottom surface of thesubstrate 110, is formed. Thelight absorption layer 220 may be a photo-definable polymer layer. Next, thelight absorption layer 220 below the meta-surface 118 is removed by patterning thelight absorption layer 220. The patterning of thelight absorption layer 220 may be performed by using any of various nano-processes, such as photolithography, e-beam lithography, nano-imprint, soft-lithography, etc. dry etching, or deposition or a composite of these processes. - In this way, as depicted in
FIG. 2C , the meta-surface optical device may be formed, in which the portions of the bottom surface of thesubstrate 110 adjacent to the portion opposite the meta-surface 118 are covered by thelight absorption layer 220. -
FIG. 3A is a plan view of a meta-surface optical device according to another exemplary embodiment. - Referring to
FIG. 3A , the meta-surface optical device includes afirst region 300A in which a meta-surface is formed and asecond region 300B surrounding thefirst region 300A. Thesecond region 300B performs an operation different from that of thefirst region 300A with respect to incident light. Thefirst region 300A includes a plurality ofpatterns 310 that perform a specific operation with respect to incident light. For example, the specific operation may be an operation of refracting or diffracting the incident light. Also, thesecond region 300B includes a plurality ofpatterns 320. Thepatterns 320 in thesecond region 300B may be light control members that effect the progress of light or change the progress direction of light, and perform an operation different from the operation of thepatterns 310 formed in thefirst region 300A with respect to incident light. Thepatterns 310 in thefirst region 300A constitute a meta-surface. Thepatterns 310 are separated from each other by second gaps d2. The second gaps d2 may have a size less than a wavelength of light incident onto thefirst region 300A. Thepatterns 320 in thesecond region 300B are separated from each other by third gaps d3. The third gaps d3 may be larger or smaller than the second gaps d2. Thepatterns 320 in thesecond region 300B may be provided to cause an operation, for example, absorption, reflection, or high refraction, different from that of the meta-surface with respect to incident light. Here, the phrase “high refraction” denotes a refraction of light incident onto thesecond region 300B so that the light incident on thesecond region 300B deviates from an image region formed by the meta-surface in thefirst region 300A. One of the absorption, reflection, and high refraction may be referred to as a first operation with respect to incident light, while another of the absorption, reflection, and high refraction may be a second operation, and yet another of the absorption, reflection, and high refraction may be a third operation. -
FIG. 3B is a cross-sectional view taken along aline 3B-3B′ ofFIG. 3A . - Referring to
FIG. 3B , patterns, that is, meta-surface patterns 310, are formed in afirst region 300A of atransparent substrate 300 and a plurality ofpatterns 320 are formed in asecond region 300B of atransparent substrate 300. Third gaps d3 and widths w3 of thepatterns 320 in thesecond region 300B may be greater or less than second gaps d2 and widths w2 of thepatterns 310 in thefirst region 300A. A height h2 of thepatterns 310 in thefirst region 300A may be equal to that of thepatterns 320 in thesecond region 300B. - According to another exemplary embodiment, as depicted in
FIG. 3C ,patterns 310 may be arranged in thefirst region 300A ofFIG. 3C , andpatterns 330, having gaps d2 and widths w2 of thefirst patterns 310 ofFIG. 3B , may be arranged in thesecond region 300B ofFIG. 3C . However, as shown inFIG. 3C , the heights of the meta-surface patterns 310 in thefirst region 300A and of thepatterns 320 in thesecond region 300B may be different from each other. For example, a height h11 of the meta-surface patterns 310 in thefirst region 300A may be less than a height h2 of thepatterns 330 in thesecond region 300B.FIG. 3D shows a case opposite to the case ofFIG. 3C . That is, the meta-surface patterns 310 in thefirst region 300A have a height greater than that of thepatterns 320 in thesecond region 300B. - The results of
FIG. 3C orFIG. 3D may be obtained by formingpatterns 370 having the same height over a whole surface of thetransparent substrate 300, as shown inFIG. 3E , and by subsequently selectively etching thepatterns 370 in an unselected region in a state in which a selected region, for example, thefirst region 300A, is protected by a mask M2. Accordingly, the height of thepatterns 370 in the unselected region may be controlled by controlling an etching time. - Alternately, the meta-
surface patterns 310 having different heights from each other may be formed by selectively etching a meta-surface material layer after forming the meta-surface material layer on thetransparent substrate 300; or, the meta-surface patterns 310 having different heights may be formed by processing meta-surface material layers having different heights through any of various processes, as would be understood by one of skill in the art. - As depicted in
FIG. 4A , thepatterns 320, similar to those ofFIG. 3B , may be arranged in thesecond region 300B on a bottom surface of thetransparent substrate 300. As depicted inFIG. 4B , thepatterns 330, similar to those ofFIG. 3C , may be arranged in thesecond region 300B, on the bottom surface of thetransparent substrate 300. As depicted inFIG. 4C , thepatterns 330, similar to those ofFIG. 3D , may be arranged in thesecond region 300B on the bottom surface of thetransparent substrate 300. -
FIGS. 5 through 13 are cross-sectional views respectively showing operations of meta-surfaces and light control members formed around the meta-surfaces with respect to incident light. The meta-surfaces may be the meta-surface patterns 310 formed in thefirst region 300A as described with respect to any of reference toFIGS. 3 and 4 , and the light control members may be thepatterns 320 formed in thesecond region 300B, as described with respect to any ofFIGS. 3 and 4 . - In
FIGS. 5 through 13 , for convenience, the meta-surfaces including a plurality of patterns formed on thetransparent substrate 300 are depicted as a single material layer, and also, the light control members are depicted as a single material layer. -
FIG. 5 shows a case in which both a meta-surface 520 and alight control member 530 are arranged on a surface of asubstrate 510 facing alight source 500, and thelight control member 530 includes patterns configured to reflect incident light. - Referring to
FIG. 5 , of light emitted from thelight source 500, light (illustrated with solid lines) that is sequentially transmitted through the meta-surface 520 and thesubstrate 510 forms animage 540 in a region separated from thesubstrate 510. Theimage 540 may be a structured optical pattern. Of the light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 530 around the meta-surface 520 is reflected by thelight control member 530. -
FIG. 6 shows a case in which both of a meta-surface 520 and alight control member 550 are arranged on a surface of asubstrate 510 facing alight source 500, and thelight control member 550 includes a plurality of patterns configured to absorb incident light. - Referring to
FIG. 6 , of light emitted from thelight source 500, light (illustrated with solid lines) that is sequentially transmitted through the meta-surface 520 and thesubstrate 510 forms animage 540 in a region separated from thesubstrate 510. Of the light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 550 around the meta-surface 520 is absorbed by thelight control member 550. -
FIG. 7 shows a case in which both of a meta-surface 520 and alight control member 560 are arranged on a surface of asubstrate 510 facing alight source 500, and thelight control member 560 includes a plurality of patterns configured to refract incident light away from a region in which animage 540 is formed. - Referring to
FIG. 7 , the operation of the meta-surface 520 is the same as that of the meta-surface 520 ofFIG. 5 . Of light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 560 around the meta-surface 520 is refracted away from the region in which theimage 540 is formed by the light transmitted by meta-surface 520. -
FIG. 8 shows a case in which both a meta-surface 520 and first and secondlight control members substrate 510 facing thelight source 500. According to this exemplary embodiment, the first and secondlight control members meta surface 520 with respect to incident light. - Referring to
FIG. 8 , the operation of the meta-surface 520 is the same as that of the meta-surface 520 ofFIG. 5 . Of light emitted from thelight source 500, light (illustrated with dashed lines) incident on the firstlight control member 530 around the meta-surface 520 is reflected and light (also illustrated with dashed lines) incident on the secondlight control member 550 is absorbed by the secondlight control member 550. -
FIG. 9 shows a case in which a meta-surface 520 and alight control member 530 respectively are arranged on opposite surfaces of asubstrate 510, and thelight control member 530 includes patterns configured to reflect incident light. - Referring to
FIG. 9 , the meta-surface 520 is arranged on a surface (hereinafter, a first surface) of thesubstrate 510 facing thelight source 500. Thelight control member 530 is arranged on a surface (hereinafter, a second surface) of thesubstrate 510 opposite the first surface. - Of light emitted from the
light source 500, light (illustrated with solid lines) that is sequentially transmitted through the meta-surface 520 and thesubstrate 510 forms animage 540 in a region separated from thesubstrate 510. Of the light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 530 around the meta-surface 520 is reflected by thelight control member 530, back towards thelight source 500 after being transmitted through thesubstrate 510. -
FIG. 10 shows a case in which a meta-surface 520 and alight control member 550 are arranged on different surfaces of thesubstrate 510, and thelight control member 550 includes patterns configured to absorb incident light. - Referring to
FIG. 10 , the meta-surface 520 is arranged on the first surface of thesubstrate 510 and thelight control member 550 is arranged on the second surface of thesubstrate 510. The arrangement location of thelight control member 550 is the same as that shown inFIG. 9 . - Of light emitted from the
light source 500, the operation of light (illustrated with solid lines) that has passed through the meta-surface 520 is the same as the operation of the light incident on the meta-surface 520 ofFIG. 9 . Of the light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 550 is absorbed by thelight control member 550 after being transmitted through thesubstrate 510. -
FIG. 11 shows a case in which a meta-surface 520 and alight control member 560 respectively are arranged on different surfaces of thesubstrate 510, and thelight control member 560 includes patterns configured to refract incident light away from the region in which theimage 540 is formed. - Referring to
FIG. 11 , the meta-surface 520 is arranged on the first surface of thesubstrate 510. Thelight control member 560 is arranged on the second surface of thesubstrate 510. The arrangement location of thelight control member 560 may be the same as that shown inFIG. 9 . - Of light emitted from the
light source 500, an operation of light (illustrated with solid lines) that has been transmitted through the meta-surface 520 is the same as the operation of the light transmitted through the meta-surface 520 ofFIG. 9 . Of the light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 560, after being transmitted through thesubstrate 510, is refracted away from theimage 540. -
FIG. 12 shows a case in which a meta-surface 520 is arranged on the first surface of thesubstrate 510 and first and secondlight control members substrate 510, and the first and secondlight control members image 540. - Referring to
FIG. 12 , the locations of arrangements of thelight control members light control members FIGS. 9 through 11 . - The operation of light (illustrated with solid lines) that is transmitted through the meta-
surface 520 is the same as the light incident on the meta-surface 520 ofFIG. 9 . Of the light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 530 is reflected therefrom after being transmitted through thesubstrate 510. Of light emitted from thelight source 500, light (also illustrated with dashed lines) incident on thelight control member 560 is refracted away from theimage 540. -
FIG. 13 shows a case in which a meta-surface 520 is arranged on the first surface of thesubstrate 510 andlight control members substrate 510, and thelight control members - Referring to
FIG. 13 , arrangement locations of thelight control members light control members FIG. 12 . - An operation of the light (illustrated with solid lines) that has been transmitted through the meta-
surface 520 is the same as the light incident on the meta-surface 520 ofFIG. 9 . Of light emitted from thelight source 500, light (illustrated with dashed lines) incident on thelight control member 530 is reflected after being transmitted through thesubstrate 510. Of the light emitted from thelight source 500, light (also illustrated with dashed lines) incident on thelight control member 550 is absorbed by thelight control member 550. -
FIG. 14 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment. - Like reference numerals are used to indicate elements that are identical to the elements described above.
- Referring to
FIG. 14 , the meta-surface patterns 120, the meta-material layer 112, and the alignmentkey patterns FIG. 1B are arranged on thesubstrate 110. The meta-material layer 112, disposed around the meta-surface 118, and the alignmentkey patterns metal film 1410. The through holes, that is, the alignmentkey patterns metal film 1410. That is, all regions on thesubstrate 110 except for the region of the meta-surface 118 are covered by themetal film 1410. Themetal film 1410 may be a light control member that reflects incident light. Accordingly, all light incident on regions around the meta-surface 118 may be reflected by themetal film 1410. Themetal film 1410 may be, for example, an Au film. -
FIGS. 15A through 15D are cross-sectional views of a method of manufacturing the meta-surface optical device ofFIG. 14 . - Referring to
FIG. 15A , as described with reference toFIG. 1B , the meta-surface 118 and the alignmentkey patterns material layer 112 on thesubstrate 110. Next, amask layer 1500 covering the meta-material layer 112, the meta-surface 118, the alignmentkey patterns substrate 110 is formed on thesubstrate 110. Themask layer 1500 may be a photosensitive film. As shown inFIG. 15B , after exposing a portion of themask layer 1500 by using a photolithography process, themask layer 1500 is removed except for the portion covering the meta-surface 118. - Next, as depicted in
FIG. 15C , themetal film 1410 is formed to cover completely the upper surface of themask layer 1500, the meta-material layer 112, the alignmentkey patterns substrate 110. Accordingly, all regions around themask layer 1500 including the upper surface of the remaining portion of themask layer 1500 are covered by themetal film 1410. Afterwards, themask layer 1500 is removed by using a lift-off process. At this point, themetal film 1410 formed on themask layer 1500 is also removed. Themask layer 1500 may be removed by using, for example, an ashing process. - In this way, as depicted in
FIG. 15D , a meta-surface optical device in which themetal film 1410 as a light control member is formed around the meta-surface 118 is formed. -
FIG. 16 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment. -
FIG. 16 shows a case in which meta-surfaces are respectively formed on both surfaces of atransparent substrate 1700. - Referring to
FIG. 16 , a first meta-material layer 1710 is arranged on an upper surface of thesubstrate 1700. The first meta-material layer 1710 includes a first meta-surface 1718 and firstalignment key patterns 1714. The first meta-surface 1718 includes a plurality ofpatterns 1720. Thesubstrate 1700 is exposed through gaps between thepatterns 1720. Thepatterns 1720 are separated by first gaps d1. Each of thepatterns 1720 has a width w1 and a height h1. The first gaps d1 and the width w1 are less than a wavelength of incident light. Afirst cladding layer 1730 is formed to cover the first meta-surface 1718, the firstalignment key patterns 1714, and exposed portions of thesubstrate 1700. A surface of thefirst cladding layer 1730 is flat. Thefirst cladding layer 1730 may be, for example, a spin-on-glass (SOG) layer. A firstlight blocking layer 1750 is arranged on thefirst cladding layer 1730. The firstlight blocking layer 1750 may completely cover an upper surface of thefirst cladding layer 1730 except for a portion of thefirst cladding layer 1730 corresponding to the first meta-surface 1718. The firstlight blocking layer 1750 may be a light absorption layer or a light reflection layer. The firstlight blocking layer 1750 may be a metal layer or a polymer layer. - A second meta-
material layer 1712 is attached to a bottom surface of thetransparent substrate 1700. The second meta-material layer 1712 includes a second meta-surface 1738 and secondalignment key patterns 1734. The secondalignment key patterns 1734 are formed by one and one on both sides of the second meta-surface 1738. The secondalignment key patterns 1734 may be vertically symmetrical, about thetransparent substrate 1700, with respect to the firstalignment key patterns 1714. The first meta-surface 1738 includes a plurality ofpatterns 1760. Thepatterns 1760 are separated by fourth gaps d4, and each has a width w4. The fourth gaps d4 and the width w4 of thepatterns 1760 that constitute the second meta-surface 1738 are less than a wavelength of incident light. The fourth gaps d4 and the width w4 of thepatterns 1760 that constitute the second meta-surface 1738 may be different from the first gaps d1 and the width w1 of thepatterns 1720 that constitute the first meta-surface 1718. The fourth gaps d4 and the width w4 of thepatterns 1760 that respectively constitute the second meta-surface 1738 may be greater than the first gaps d1 and the width w1 of thepatterns 1720 that constitute the first meta-surface 1718. The first meta-surface 1718 and the second meta-surface 1738 may be operated, respectively, as different optical elements from each other with respect to incident light. For example, the first meta-surface 1718 may act as a first refractive optical element and the second meta-surface 1738 may act as a second refractive optical element. For example, the first and second refractive optical elements may be a lens. - Next, a
second cladding layer 1770 is formed, covering the second meta-surface 1738 and the secondalignment key patterns 1734, below the second meta-material layer 1712. Thesecond cladding layer 1770 may include the same material as thefirst cladding layer 1730. A bottom surface of thesecond cladding layer 1770 is flat. A secondlight blocking layer 1790 is attached to the bottom surface of thesecond cladding layer 1770. The secondlight blocking layer 1790 covers the whole bottom surface of thesecond cladding layer 1770 except for a portion of thesecond cladding layer 1770 corresponding to the second meta-surface 1738. The secondlight blocking layer 1790 may be a light absorption layer or a light reflection layer. -
FIGS. 17A through 17I are cross-sectional views of a method of manufacturing the meta-surface optical device ofFIG. 16 . - Referring to
FIG. 17A , the first meta-material layer 1710 is formed on an upper surface of thetransparent substrate 1700. The first meta-material layer 1710 may include any of various dielectric materials, for example, amorphous silicon a-Si, titanium oxide (for example, TiO2), or silicon nitride (for example, Si3N4). The first meta-material layer 1710 may include a first region 17A1, on which a meta-surface will be formed in a subsequent process, and second and third regions 17A2 and 17A3, on which alignmentkey patterns material layer 1712 is formed on the bottom surface of thetransparent substrate 1700. - As depicted in
FIG. 17B , the first meta-surface 1718 and the firstalignment key patterns 1714 are formed by patterning the first meta-material layer 1710 using, for example, the method described with reference toFIG. 1B . - As depicted in
FIG. 17C , thefirst cladding layer 1730 is formed, completely covering the first meta-surface 1718, the firstalignment key patterns 1714, and exposed regions of the upper surface of thetransparent substrate 1700, and the upper surface of thefirst cladding layer 1730 is planarized. Accordingly, the first meta-surface 1718, the firstalignment key patterns 1714, and exposed portions of thetransparent substrate 1700 are covered by thefirst cladding layer 1730. Thefirst cladding layer 1730 may be an SOG layer, but is not limited thereto. - As depicted in
FIG. 17D , amask 1740, that covers a portion of thefirst cladding layer 1730 corresponding to the first meta-surface 1718 and exposes remaining portions of thefirst cladding layer 1730, is formed on thefirst cladding layer 1730. Themask 1740 may be a photo-sensitive film. - As depicted in
FIG. 17E , the firstlight blocking layer 1750 is formed, covering themask 1740 and exposed portions of thefirst cladding layer 1730. The firstlight blocking layer 1750 may be a light absorption layer or a light reflection layer. The firstlight blocking layer 1750 may be, for example, a metal layer or a polymer layer, but is not limited thereto. When themask 1740 is removed by using a lift process, the portion of the firstlight blocking layer 1750 formed on themask 1740 is also removed together with themask 1740. As depicted inFIG. 17F , the firstlight blocking layer 1750 corresponding to the first meta-surface 1718 is removed, and only the firstlight blocking layer 1750 corresponding to peripheral regions of the first meta-surface 1718 remains. - As depicted in
FIG. 17G , the product ofFIG. 17F may be turned over, such that the second meta-material layer 1712 is disposed placed above thetransparent substrate 1700. As described, for example, with reference toFIG. 1B , the second meta-surface 1738 and the secondalignment key patterns 1734, separated from the second meta-surface 1738 in the second meta-material layer 1712, are formed by patterning the second meta-material layer 1712. The second meta-surface 1738 is formed on a location corresponding to the location of the first meta-surface 1718, and the secondalignment key patterns 1734 may be formed on locations corresponding to the locations of the firstalignment key patterns 1714. Thesecond cladding layer 1770 is formed on the second meta-surface 1738, the secondalignment key patterns 1734, and exposed portions of thetransparent substrate 1700. Accordingly, all of the second meta-material layer 1712, the second meta-surface 1738, the secondalignment key patterns 1734, and exposed portions of thetransparent substrate 1700 are covered by thesecond cladding layer 1770. - As depicted in
FIG. 17H , amask 1780 is formed only on a region of thesecond cladding layer 1770 corresponding to the second meta-surface 1738. Themask 1780 may be a photo-sensitive film. The secondlight blocking layer 1790 is formed, covering an upper surface of themask 1780 and exposed regions of thesecond cladding layer 1770. The secondlight blocking layer 1790 may be a light absorption layer or a light reflection layer. The secondlight blocking layer 1790 may be made of the same material as the firstlight blocking layer 1750. After the secondlight blocking layer 1790 is formed, themask 1780 is removed by using a lift-off process. The secondlight blocking layer 1790 formed on themask 1780 is also removed together with themask 1780. - As a result, as depicted in
FIG. 17I , a meta-surface optical device, having the second meta-surface 1738 and the first meta-surface 1718 respectively on and below thetransparent substrate 1700 and that blocks light incident on peripheral regions of the second meta-surface 1738 and the first meta-surface 1718, may be formed. -
FIG. 18 is a cross-sectional view of a meta-surface optical device according to another exemplary embodiment. - A plurality of meta-surfaces are formed on a
transparent substrate 1700. - Referring to
FIG. 18 , a first meta-material layer 1710 including a first meta-surface 1718 and firstalignment key patterns 1714 is formed on thetransparent substrate 1700. The first meta-material layer 1710 is covered by afirst cladding layer 1730, and a surface of thefirst cladding layer 1730 is flat. A second meta-material layer 1810 that includes a second meta-surface 1818 and secondalignment key patterns 1814 is formed on thefirst cladding layer 1730. The second meta-surface 1818 may be made of the same material as the first meta-material layer 1710. The second meta-surface 1818 includes a plurality ofpatterns 1820. Thepatterns 1820 may have gaps, widths, and heights corresponding to the gaps d1, width w1, and height h1 of thepatterns 1720 of the first meta-surface 1718. The second meta-material layer 1810 is covered by asecond cladding layer 1830, and a surface of thesecond cladding layer 1830 is flat. Alight blocking layer 1850 is arranged on thesecond cladding layer 1830. Thelight blocking layer 1850 is arranged on thethird cladding layer 1830 except for a region of thesecond cladding layer 1830 corresponding to the second meta-surface 1818. Thelight blocking layer 1850 may be one of the light control members that change a progress of light or a direction of progress of light, and may be a light absorption layer or a light reflection layer. Also, thelight blocking layer 1850 may be a metal layer or a polymer layer, but is not limited thereto. -
FIGS. 19A through 19E are cross-sectional views of a method of manufacturing the meta-surface optical device ofFIG. 18 . - Referring to
FIG. 19A , after forming the first meta-material layer 1710 on thetransparent substrate 1700, the first meta-surface 1718 and the firstalignment key patterns 1714 are formed by patterning the first meta-material layer 1710. The first meta-surface 1718 and the firstalignment key patterns 1714 may be formed, for example, by using a method described with reference toFIG. 1B . Thefirst cladding layer 1730 covering the first meta-material layer 1710 is formed, and afterwards, an upper surface of thefirst cladding layer 1730 is planarized. The second meta-material layer 1810 is formed on thefirst cladding layer 1730. The second meta-material layer 1810 may include the same material as the first meta-material layer 1710. - Next, as depicted in
FIG. 19B , the second meta-surface 1818 and the secondalignment key patterns 1814 are formed in the second meta-material layer 1810 by patterning the second meta-material layer 1810. Accordingly, the second meta-surface 1818 and the secondalignment key patterns 1814 are formed on thefirst cladding layer 1730. The second meta-surface 1818 and the secondalignment key patterns 1814 may be formed, for example, by using a method described with reference toFIG. 1B . The second meta-surface 1818 may be formed on a location corresponding to the location of the first meta-surface 1718, and the secondalignment key patterns 1814 may be formed on locations corresponding to the locations of the firstalignment key patterns 1714. - As depicted in
FIG. 19C , thesecond cladding layer 1830 is formed, covering the second meta-surface 1818, the second meta-surface 1818, the secondalignment key patterns 1814, and exposed portions of thefirst cladding layer 1730. Accordingly, all of the second meta-surface 1818, the secondalignment key patterns 1814, and exposed portions of thefirst cladding layer 1730 are covered by thesecond cladding layer 1830. Thesecond cladding layer 1830 may include the same material as thefirst cladding layer 1730. - As depicted in
FIG. 19D , thelight blocking layer 1850 is formed on thesecond cladding layer 1830. Thelight blocking layer 1850 is formed only on a region of thesecond cladding layer 1830. Thelight blocking layer 1850 may be formed on a whole upper surface of thesecond cladding layer 1830 except for a region of thesecond cladding layer 1830 corresponding to the second meta-surface 1818. Thelight blocking layer 1850 may be a light absorption layer or a light reflection layer. Thelight blocking layer 1850 may be, for example, a metal layer or a polymer layer, but is not limited thereto. - In this way, the meta-surface optical device depicted in
FIG. 18 may be formed. - Alternatively, before forming the
light blocking layer 1850 inFIG. 19D , as depicted inFIG. 19E , a process of stacking the second meta-material layer 1810 and thesecond cladding layer 1830 on thesecond cladding layer 1830 may further be performed at least one times. At this point, thelight blocking layer 1850 may be formed on the uppermost cladding layer. -
FIGS. 20A through 20C are cross-sectional views of a meta-surface optical device according to another exemplary embodiment. - Referring to
FIG. 20A , a separated meta-material layer 2012 is formed on atransparent substrate 2010. The meta-material layer 2012 may include any of various dielectric materials, for example, amorphous silicon a-Si, titanium oxide (for example, TiO2), or silicon nitride (for example, Si3N4). A meta-surface 2060 is formed between the separated meta-material layers 2012. The meta-surface 2060 includes a plurality ofpatterns 2040. Thepatterns 2040 are separated from each other by fifth gaps d5, and have a width w5 and a height h5. The fifth gaps d5 and the width w5 are less than a wavelength of incident light. Thepatterns 2040 may include the same material as the meta-material layer 2012. Alight blocking film 2020 is provided on the meta-material layer 2012. Thelight blocking film 2020 covers a whole upper surface of the meta-material layer 2012. Thelight blocking film 2020 may be a light reflection layer or a light absorption layer. Thelight blocking film 2020 may be, for example, a metal layer or a polymer layer, but is not limited thereto. - As depicted in
FIG. 20B , thelight blocking film 2020 ofFIG. 20A may be arranged on a bottom surface of thetransparent substrate 2010. Also, as depicted inFIG. 20C , thelight blocking film 2020 may be arranged between thetransparent substrate 2010 and the meta-material layer 2012. -
FIGS. 21A through 21G are cross-sectional views of a method of manufacturing the meta-surface optical device ofFIG. 20A . - Referring to
FIG. 21A , the meta-material layer 2012 and thelight blocking layer 2020 are sequentially stacked on thetransparent substrate 2010. - As depicted in
FIG. 21B , amask layer 2030 is formed on thelight blocking layer 2020. Themask layer 2030 may be a photo-sensitive film layer. Themask layer 2030 includes apattern region 2030A including a plurality ofpatterns 2040A. Thepatterns 2040A are separated from each other, and thus, thelight blocking layer 2020 is exposed through gaps between thepatterns 2040A. Thepattern region 2030A defines a region in which a meta-surface will be formed. Exposed portions of thelight blocking layer 2020 are etched in a state in which themask layer 2030 is present. The etching is continued until the meta-material layer 2012 is exposed. - As a result of the etching, as depicted in
FIG. 21C , thewhole pattern region 2030A of themask layer 2030 is transferred to thelight blocking layer 2020. When themask layer 2030 is removed, as depicted inFIG. 21D , apattern region 2020A, formed by transferring thepattern region 2030A of themask layer 2030, is formed in thelight blocking layer 2020 on the meta-material layer 2012. Thelight blocking layer 2020 is used as a mask in a subsequent process. That is, as depicted inFIG. 21E , the meta-material layer 2012 is etched by using thelight blocking layer 2020 including thepattern region 2020A. The etching may be continued until thetransparent substrate 2010 is exposed. As a result of the etching, a meta-surface including a plurality ofpatterns 2040 is formed in the meta-material layer 2012. - As depicted in
FIGS. 21F and 21G , thepattern region 2020A is removed from thelight blocking layer 2020 by using astamp 2050. Thestamp 2050 may include any of various polymers including polydimethylsiloxane (PDMS). - In this way, the meta-surface optical device depicted in
FIG. 20A is formed. The meta-surface optical devices ofFIGS. 20B and 20C may be readily formed by changing the locations of the light blocking layer in the process of forming the meta-surface optical element depicted inFIG. 20A . - Also, as depicted in
FIG. 22 , when amaterial layer 2200 having a high adhesiveness with respect to thelight blocking layer 2020 is attached to a surface of thestamp 2050 that is attached to thepattern region 2020A, the selectivity of thestamp 2050 with respect to thepattern region 2020A may be increased in the process of removing thepattern region 2020A using thestamp 2050. -
FIG. 23 is photographs showing an effect of the use of meta-surface optical devices according to exemplary embodiments. - The photograph on the left side shows a case in which a conventional optical element is used and the photograph on the right side shows a case in which a meta-surface optical device according to an exemplary embodiment is used.
- Referring to
FIG. 23 , in the left photograph, bright regions, which are defects, are present along a boundary of a region 23A1 corresponding to a meta-surface. However, in the right photograph, the defect is not observed. - Accordingly, this shows that, when a meta-surface optical device, according to an exemplary embodiments is used, the quality of an image (for example, a structured optical pattern) formed by the meta-surface may be increased.
-
FIG. 24 shows a case in which a meta-surface region AA1 and a light control member region AA2 are correctly aligned in a meta-surfaceoptical device 2300. -
FIG. 25 shows a case in which a gap EA1, having a width D11, is present between the meta-surface region AA1 and the light control member region AA2. As depicted inFIG. 28 , in order to obtain a clean structured optical pattern without light-leaking defect, the size of the gap EA1 may be less than six times a wavelength of incident light. That is, if the size of the gaps EA1 do not exceed six times of a wavelength of incident light, a zero-order-effect does not occur. - For example, if a wavelength of incident light is 940 nm, and a size of the gap EA1 is within approximately 5 μm, as depicted in
FIG. 28 , a clean structured optical pattern without a zero-order-effect may be obtained. -
FIG. 26 shows a case in which the light control member region AA2 overlaps the meta-surface region AA1. When the light control member region AA2 overlaps the meta-surface region AA1 by as much as a distance D22 from aboundary 2330 therebetween, that is, when width D22 of the overlap of the light control member region AA2 with the meta-surface region AA1 is less than ten times the wavelength of incident light, the zero-order-effect may not occur. For example, if a wavelength of incident light is 940 nm, and a width of the overlap is within approximately 9 μm, a clean structured optical pattern without a zero-order-effect may be obtained. -
FIGS. 27A, 27B, and 27C are photographs showing actually measured results with respect to three alignment states of meta-surfaces and light control members around the meta-surfaces. -
FIG. 27A , shows a photograph of a state in which the meta-surface and the light control member are correctly aligned;FIG. 27B shows a photograph of a state in which a gap having a width of 2.5 μm is present between the meta-surface and the light control member; andFIG. 27C shows a photograph of a state in which a gap having a width of approximately 5 μm is present. -
FIGS. 28A, 28B, and 28C are photographs of structured optical patterns obtained using meta surface optical devices aligned as shown inFIGS. 27A, 27B, and 27C , respectively. - Referring to
FIG. 28 , when the gaps between the meta-surface and the light control member are 0 μm, 2.5 μm, and 5 μm, respectively, the zero-order-effect was not observed. - While one or more exemplary embodiments have been described with reference to the figures, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope as defined by the following claims.
Claims (31)
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US18/472,662 US20240012178A1 (en) | 2017-09-21 | 2023-09-22 | Meta-surface optical element and method of manufacturing the same |
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Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10795168B2 (en) | 2017-08-31 | 2020-10-06 | Metalenz, Inc. | Transmissive metasurface lens integration |
US20200386911A1 (en) * | 2019-06-05 | 2020-12-10 | Applied Materials, Inc. | Apertures for flat optical devices |
WO2021021671A1 (en) * | 2019-07-26 | 2021-02-04 | Metalenz, Inc. | Aperture-metasurface and hybrid refractive-metasurface imaging systems |
US11163114B2 (en) * | 2019-08-23 | 2021-11-02 | Globalfoundries U.S. Inc. | Waveguide structures |
US20220221741A1 (en) * | 2021-01-12 | 2022-07-14 | Samsung Electronics Co., Ltd. | Meta-optical device and electronic apparatus including the same |
US11454808B2 (en) | 2019-05-07 | 2022-09-27 | Samsung Electronics Co., Ltd. | Metalens and optical apparatus including the same |
US20230144948A1 (en) * | 2021-11-05 | 2023-05-11 | Samsung Electronics Co., Ltd. | Optical device and method of manufacturing the same |
US11906698B2 (en) | 2017-05-24 | 2024-02-20 | The Trustees Of Columbia University In The City Of New York | Broadband achromatic flat optical components by dispersion-engineered dielectric metasurfaces |
US11927769B2 (en) | 2022-03-31 | 2024-03-12 | Metalenz, Inc. | Polarization sorting metasurface microlens array device |
WO2024156795A1 (en) * | 2023-01-25 | 2024-08-02 | Nil Technology Aps | Apparatus including a lens configuration having stacked metasurfaces, and methods for fabricating the same |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20230101230A (en) | 2021-12-29 | 2023-07-06 | 포항공과대학교 산학협력단 | Meta surface manufacturing apparatus, manufacturing method and meta surface using nanocomposite |
KR102576656B1 (en) | 2021-06-23 | 2023-09-07 | 포항공과대학교 산학협력단 | Meta surface manufacturing apparatus, manufacturing method and meta surface using nanocomposite |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20150085522A1 (en) * | 2013-09-24 | 2015-03-26 | Samsung Display Co., Ltd. | Backlight assembly, display apparatus having the same and method of manufacturing the same |
US20200018684A1 (en) * | 2016-09-22 | 2020-01-16 | Imec Vzw | Particle Detection Using Thin Lenses |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003273456A (en) | 2002-03-14 | 2003-09-26 | Japan Science & Technology Corp | Two-dimensional photonic crystal face emitting laser |
WO2005093466A1 (en) * | 2004-03-26 | 2005-10-06 | Sony Corporation | Microlens array substrate and production method therefor |
JP4736821B2 (en) * | 2006-01-24 | 2011-07-27 | 株式会社日立製作所 | Pattern forming method and pattern forming apparatus |
JP4338211B2 (en) | 2007-08-08 | 2009-10-07 | キヤノン株式会社 | Structure with photonic crystal, surface emitting laser |
KR100925614B1 (en) | 2007-12-05 | 2009-11-06 | 삼성전기주식회사 | Liquid crystal lens having a aspherical optical properties |
WO2011100070A1 (en) * | 2010-02-12 | 2011-08-18 | The Regents Of The University Of California | Metamaterial-based optical lenses |
KR101875771B1 (en) * | 2011-12-02 | 2018-07-09 | 삼성디스플레이 주식회사 | Mask for photolithography, manufacturing method thereof and manufacturing method of substrate using the mask |
FR3007148B1 (en) * | 2013-06-17 | 2016-11-25 | Centre Nat De La Rech Scient - Cnrs | ANGULAR OPTICAL FILTERING ELEMENT FOR ANGULAR FILTERING WITH CONTROLLED ANGULAR SELECTIVITY |
US9482796B2 (en) * | 2014-02-04 | 2016-11-01 | California Institute Of Technology | Controllable planar optical focusing system |
JP5779290B1 (en) | 2014-03-28 | 2015-09-16 | Hoya株式会社 | Mask blank, phase shift mask manufacturing method, phase shift mask, and semiconductor device manufacturing method |
KR102252049B1 (en) | 2014-08-04 | 2021-05-18 | 삼성디스플레이 주식회사 | Mask for photolithography, method of manufacturing the same and method of manufacturing substrate using the same |
KR101542109B1 (en) | 2014-08-19 | 2015-08-12 | 숭실대학교산학협력단 | Multi-Spectrum Filter And Method of Making The Same |
KR20160084949A (en) * | 2015-01-06 | 2016-07-15 | 삼성디스플레이 주식회사 | Photo mask, and method of manufacturing thin film transistor substrate using the same |
US9995930B2 (en) | 2015-04-08 | 2018-06-12 | Samsung Electronics Co., Ltd. | Focusing device comprising a plurality of scatterers and beam scanner and scope device |
WO2016167052A1 (en) | 2015-04-15 | 2016-10-20 | 三菱電機株式会社 | Electromagnetic wave detector, electromagnetic wave detector array, and gas analyzing apparatus |
US20170235162A1 (en) | 2015-07-13 | 2017-08-17 | Purdue Research Foundation | Time-varying metasurface structure |
US9685765B2 (en) * | 2015-08-31 | 2017-06-20 | Sandia Corporation | High quality-factor fano metasurface comprising a single resonator unit cell |
-
2017
- 2017-09-21 KR KR1020170121873A patent/KR20190033283A/en not_active Application Discontinuation
-
2018
- 2018-06-27 US US16/020,434 patent/US20190086579A1/en not_active Abandoned
- 2018-09-13 EP EP18194336.6A patent/EP3460535B1/en active Active
-
2021
- 2021-10-12 US US17/499,170 patent/US11808918B2/en active Active
-
2023
- 2023-09-22 US US18/472,662 patent/US20240012178A1/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20150085522A1 (en) * | 2013-09-24 | 2015-03-26 | Samsung Display Co., Ltd. | Backlight assembly, display apparatus having the same and method of manufacturing the same |
US20200018684A1 (en) * | 2016-09-22 | 2020-01-16 | Imec Vzw | Particle Detection Using Thin Lenses |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11906698B2 (en) | 2017-05-24 | 2024-02-20 | The Trustees Of Columbia University In The City Of New York | Broadband achromatic flat optical components by dispersion-engineered dielectric metasurfaces |
US11988844B2 (en) | 2017-08-31 | 2024-05-21 | Metalenz, Inc. | Transmissive metasurface lens integration |
US11579456B2 (en) | 2017-08-31 | 2023-02-14 | Metalenz, Inc. | Transmissive metasurface lens integration |
US10795168B2 (en) | 2017-08-31 | 2020-10-06 | Metalenz, Inc. | Transmissive metasurface lens integration |
US11454808B2 (en) | 2019-05-07 | 2022-09-27 | Samsung Electronics Co., Ltd. | Metalens and optical apparatus including the same |
US20200386911A1 (en) * | 2019-06-05 | 2020-12-10 | Applied Materials, Inc. | Apertures for flat optical devices |
US12044821B2 (en) * | 2019-06-05 | 2024-07-23 | Applied Materials, Inc. | Apertures for flat optical devices |
WO2021021671A1 (en) * | 2019-07-26 | 2021-02-04 | Metalenz, Inc. | Aperture-metasurface and hybrid refractive-metasurface imaging systems |
US11978752B2 (en) | 2019-07-26 | 2024-05-07 | Metalenz, Inc. | Aperture-metasurface and hybrid refractive-metasurface imaging systems |
US11822122B2 (en) | 2019-08-23 | 2023-11-21 | Globalfoundries U.S. Inc. | Waveguide structures |
US11163114B2 (en) * | 2019-08-23 | 2021-11-02 | Globalfoundries U.S. Inc. | Waveguide structures |
US20220221741A1 (en) * | 2021-01-12 | 2022-07-14 | Samsung Electronics Co., Ltd. | Meta-optical device and electronic apparatus including the same |
US12066696B2 (en) * | 2021-01-12 | 2024-08-20 | Samsung Electronics Co., Ltd. | Meta-optical device and electronic apparatus including the same |
US20230144948A1 (en) * | 2021-11-05 | 2023-05-11 | Samsung Electronics Co., Ltd. | Optical device and method of manufacturing the same |
US11927769B2 (en) | 2022-03-31 | 2024-03-12 | Metalenz, Inc. | Polarization sorting metasurface microlens array device |
WO2024156795A1 (en) * | 2023-01-25 | 2024-08-02 | Nil Technology Aps | Apparatus including a lens configuration having stacked metasurfaces, and methods for fabricating the same |
Also Published As
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EP3460535A2 (en) | 2019-03-27 |
EP3460535A3 (en) | 2019-10-23 |
US11808918B2 (en) | 2023-11-07 |
EP3460535B1 (en) | 2024-04-03 |
KR20190033283A (en) | 2019-03-29 |
US20240012178A1 (en) | 2024-01-11 |
US20220026605A1 (en) | 2022-01-27 |
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