US20190086442A1 - Test coaxial connector - Google Patents
Test coaxial connector Download PDFInfo
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- US20190086442A1 US20190086442A1 US16/192,578 US201816192578A US2019086442A1 US 20190086442 A1 US20190086442 A1 US 20190086442A1 US 201816192578 A US201816192578 A US 201816192578A US 2019086442 A1 US2019086442 A1 US 2019086442A1
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- Prior art keywords
- coaxial connector
- probe
- test
- switch
- contact
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
- H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
- H01R24/42—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches
- H01R24/46—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency comprising impedance matching means or electrical components, e.g. filters or switches comprising switches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Definitions
- the present disclosure relates to a test coaxial connector, and more specifically, relates to a test coaxial connector that has a probe portion with a small height and that prevents breakage of a switch-equipped coaxial connector even when the test coaxial connector is not properly fitted to the switch-equipped coaxial connector.
- a method for connecting an electronic device and a measuring instrument in measuring characteristics of the electronic device a method in which a switch-equipped coaxial connector provided to the electronic device and a test coaxial connector connected to the measuring instrument are fitted to each other, is widely used. More specifically, a switch-equipped coaxial connector is provided to a wiring portion of a board housed in an electronic device, the wiring portion being to be measured for electric characteristics. For example, in the case where the electronic device is a cellular phone, a switch-equipped coaxial connector is provided between a transmitting/receiving circuit formed on the board and an antenna by surface-mounting. The switch-equipped coaxial connector normally connects the transmitting/receiving circuit and the antenna.
- the switch-equipped coaxial connector disconnects the transmitting/receiving circuit and the antenna from each other and newly connects the transmitting/receiving circuit and the test coaxial connector.
- the transmitting/receiving circuit of the cellular phone and the measuring instrument are connected to each other, so that it is possible to measure characteristics of the cellular phone by the measuring instrument.
- FIG. 6 shows a test coaxial connector 1000 disclosed in International Publication No. WO2010/113536.
- the test coaxial connector 1000 has a structure in which a probe 102 is housed in a conductive housing 101 .
- the probe 102 includes a conductive tubular barrel 103 , and a coil spring 104 and a plunger (central terminal) 105 that are housed in a tubular portion of the barrel 103 .
- the barrel 103 and the plunger 105 are electrically conducted to each other.
- An insulating bushing 106 is provided between the housing 101 and the probe 102 , whereby the housing 101 and the probe 102 are insulated from each other.
- a coaxial cable 108 connected to a measuring instrument 107 is connected to the test coaxial connector 1000 . More specifically, a central conductor 108 a of the coaxial cable 108 is connected to the plunger 105 via the barrel 103 . In addition, a shield conductor 108 b of the coaxial cable 108 is connected to the housing 101 via a conductive adapter 109 .
- the plunger 105 Since the coil spring 104 is provided in the tubular portion of the barrel 103 , the plunger 105 is retractable in the upward direction in the drawing.
- the reason why the plunger 105 is configured to be retractable is to prevent the plunger 105 from breaking a switch-equipped coaxial connector (not shown) due to unnecessary force applied from the plunger 105 to the switch-equipped coaxial connector, when the test coaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector. That is, when the test coaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector, the plunger 105 retracts in the upward direction due to shrinkage of the coil spring 104 , thereby avoiding breakage of the switch-equipped coaxial connector.
- the height of the probe 102 portion is large as indicated by reference sign H in FIG. 6 (reference sign H and a leader line therefor in FIG. 6 are added by the applicant for explanation, and are not shown in the drawing of International Publication No. WO2010/113536).
- the reason why the height H of the probe 102 portion of the test coaxial connector 1000 is made large is as follows.
- Characteristics of an electronic device are measured during manufacture of the electronic device or after completion of the electronic device, and, in some cases, another electronic component having a large height is mounted around a switch-equipped coaxial connector mounted on a board. In this case, if the height H of the probe 102 portion is not large, the other electronic component becomes an obstacle and thus the test coaxial connector 1000 may not be successfully fitted to the switch-equipped coaxial connector.
- a case of the electronic device in which the board is housed is detached before the measurement in some cases.
- a measurement hole is formed in the case in advance, and the probe 102 portion is inserted into the measurement hole before the measurement.
- the height H of the probe 102 portion has to be large.
- the height H of the probe 102 portion of the test coaxial connector 1000 is made large.
- a test coaxial connector is fitted to a switch-equipped connector provided to a board housed in a case, a coaxial cable is drawn to the outside from a gap of the case, and characteristic measurement is conducted. For this measurement, the height of the probe portion of the test coaxial connector has to be small.
- the test coaxial connector 1000 in order to decrease the height H of the probe 102 portion, first, it is necessary to decrease the length of the plunger (central terminal) 105 . Next, the other portion is desired to be made smaller, but, in the test coaxial connector 1000 , it is impossible to decrease the length of the tubular portion of the barrel 103 , since the coil spring 104 is housed in the tubular portion of the barrel 103 .
- test coaxial connector 1000 it is difficult to decrease the height of the probe portion to such a degree that, while the function to prevent breakage of a switch-equipped coaxial connector when the test coaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector is maintained, it is possible to fit the test coaxial connector 1000 to a switch-equipped connector provided to a board housed in a case and to conduct measurement.
- the present disclosure has been made to provide a test coaxial connector that is fitted to a switch-equipped coaxial connector when being used, and includes a housing and a probe housed in the housing.
- the probe is formed of one continuous structure having elasticity, the structure including a contact at or near an end portion thereof and including, at or near another end portion thereof, a connection portion to which a central conductor of a coaxial cable is to be connected.
- a bent portion may be provided between the contact and the connection portion of the probe. In this case, it is possible to exhibit elasticity (spring property) by the bent portion.
- a zigzag portion may be provided between the contact and the connection portion of the probe. In this case, it is possible to exhibit elasticity by the zigzag portion.
- the probe may include a portion having a different diameter or thickness, between the contact and the connection portion. In this case, it is possible to exhibit elasticity by a portion having a small diameter or a portion having a small thickness.
- the contact of the probe may be curled. In this case, it is possible to exhibit elasticity by the curled contact.
- test coaxial connector of the present disclosure since the probe is formed from one continuous structure, it is possible to decrease the height of the probe portion. In addition, since the probe has elasticity, even when the test coaxial connector of the present disclosure is not properly fitted to the switch-equipped coaxial connector, the test coaxial connector does not break the switch-equipped coaxial connector.
- FIG. 1A is a perspective view showing a test coaxial connector according to a first embodiment
- FIG. 1B is an exploded perspective view showing the test coaxial connector
- FIGS. 2A and 2B are each a perspective view showing a probe of the test coaxial connector
- FIG. 3A is a perspective view showing a state before the test coaxial connector is fitted to a switch-equipped coaxial connector
- FIG. 3B is a perspective view showing a state after the test coaxial connector is fitted to the switch-equipped coaxial connector
- FIG. 4A is a cross-sectional view showing the state before the test coaxial connector is fitted to the switch-equipped coaxial connector
- FIG. 4B is a cross-sectional view showing the state after the test coaxial connector is fitted to the switch-equipped coaxial connector
- FIGS. 5A to 5E are cross-sectional views showing probes according to second to sixth embodiments, respectively.
- FIG. 6 is a cross-sectional view showing a test coaxial connector disclosed in International Publication No. WO2010/113536.
- each embodiment represents an embodiment of the present disclosure, and the present disclosure is not limited to the contents of the embodiments.
- the contents described in different embodiments may be combined and implemented, and the implementation contents in that case are also included in the present disclosure.
- the drawings are provided to help the understanding of the embodiments, and the drawings may not be necessarily illustrated strictly.
- the ratios of dimensions of the illustrated components or the ratio of dimensions between the components may not correspond to the ratios of dimensions of those described in the specification.
- the components described in the specification may be omitted in the drawings, or some of the components may be omitted in the drawings.
- FIGS. 1A and 1B show a test coaxial connector 100 according to a first embodiment.
- FIG. 1A is a perspective view of the test coaxial connector 100
- FIG. 1B is an exploded perspective view of the test coaxial connector 100 .
- the test coaxial connector 100 includes a conductive housing 1 .
- the housing 1 is produced from, for example, beryllium copper.
- a tubular fitting portion 1 a for fitting to a switch-equipped connector (not shown) is formed at a front portion of the housing 1 .
- the test coaxial connector 100 includes a conductive probe (central terminal) 2 .
- FIGS. 2A and 2B show the probe 2 .
- FIG. 2A is a perspective view of the probe 2 as seen from the front side
- FIG. 2B is a perspective view of the probe 2 as seen from the rear side.
- the probe 2 is produced from, for example, one plate-shaped beryllium copper.
- the probe 2 has a contact 2 a at a front portion thereof.
- the probe 2 has a cut 2 b as a connection portion for connecting a central conductor 4 a of a later-described coaxial cable 4 , at a rear portion thereof.
- a bent portion 2 c is provided between the contact 2 a and the cut 2 b of the probe 2 is provided by the probe 2 being bent at two locations. Since the bent portion 2 c is provided, the probe 2 exhibits elasticity (spring property).
- the probe 2 is attached to an insulting member 3 formed from a resin. More specifically, a groove 3 a is formed on the insulting member 3 , and the probe 2 is press-fitted into the groove 3 a.
- a tapered annular guide 3 b that is used for positioning in fitting the test coaxial connector 100 to the switch-equipped connector is further formed at a front portion thereof.
- the insulting member 3 to which the probe 2 is attached is crimped with a claw 1 b provided in the housing 1 , and thereby attached to the housing 1 .
- the coaxial cable 4 connected to a measuring instrument (not shown) is connected to the test coaxial connector 100 .
- the coaxial cable 4 is configured to have a four-layer structure having the central conductor 4 a , a first insulating layer 4 b covering the central conductor 4 a , a shield conductor 4 c covering the first insulating layer 4 b , and a second insulating layer 4 d covering the shield conductor 4 c.
- the central conductor 4 a of the coaxial cable 4 is fitted into the cut 2 b of the probe 2 and thereby fixed and electrically connected.
- the shield conductor 4 c of the coaxial cable 4 is crimped with a claw 1 c provided in the housing 1 , and thereby fixed and electrically connected to the housing 1 .
- the entire coaxial cable 4 is crimped with a claw 1 d provided in the housing 1 , and thereby fixed to the housing 1 .
- the probe 2 is composed of only one structure without using a barrel or a coil spring, and thus it is possible to decrease the height H of the probe 2 portion shown in FIG. 1A .
- the bent portion 2 c is provided by the probe 2 being bent at two locations, and thus the probe 2 has elasticity (spring property). Therefore, when the test coaxial connector 100 is not properly fitted to the switch-equipped coaxial connector, the contact 2 a of the probe 2 retracts in the upward direction owing to the elasticity, so that it is possible to avoid breakage of the switch-equipped coaxial connector.
- test coaxial connector 100 having the above structure according to the present embodiment, for example, by the following method.
- the central conductor 4 a of the coaxial cable 4 is fitted into the cut 2 b of the probe 2 , and thereby fixed and electrically connected.
- the probe 2 is press-fitted into the groove 3 a of the insulting member 3 and thereby attached.
- the insulting member 3 to which the probe 2 has been attached is crimped with the claw 1 b and thereby attached to the housing 1 .
- the shield conductor 4 c of the coaxial cable 4 is crimped with the claw 1 c and thereby electrically connected to the housing 1 .
- FIG. 3A is a perspective view showing a state before the test coaxial connector 100 is fitted to the switch-equipped coaxial connector 500 .
- FIG. 3B is a perspective view showing a state after the test coaxial connector 100 is fitted to the switch-equipped coaxial connector 500 .
- FIG. 4A is a cross-sectional view showing the state before the test coaxial connector 100 is fitted to the switch-equipped coaxial connector 500 .
- FIG. 4B is a cross-sectional view showing the state after the test coaxial connector 100 is fitted to the switch-equipped coaxial connector 500 .
- the reference signs for the components that are not relevant to the description in this part may be omitted.
- the test coaxial connector 100 is fitted to the switch-equipped coaxial connector 500 .
- the switch-equipped coaxial connector 500 is an element that is not included in the present disclosure.
- the switch-equipped coaxial connector 500 is surface-mounted on a land electrode, which is formed on a board (not shown) housed in an electronic device, by means of solder reflow or the like.
- the switch-equipped coaxial connector 500 includes a case 50 formed from a resin.
- a first terminal electrode 53 , a second terminal electrode 54 , and a third terminal electrode 55 are formed on the bottom surface of the case 50 .
- the first terminal electrode 53 is connected to a transmitting/receiving circuit of the electronic device.
- the second terminal electrode 54 is connected to an antenna of the electronic device.
- the third terminal electrode 55 is connected to ground of the electronic device.
- a conductive and tubular fitting portion 56 for fitting to the fitting portion 1 a of the test coaxial connector 100 is formed on the upper surface of the switch-equipped coaxial connector 500 .
- the fitting portion 56 is connected to the third terminal electrode 55 .
- a movable terminal 57 and a fixed terminal 58 are disposed in a space within the fitting portion 56 .
- the movable terminal 57 is formed so as to be integrated with the first terminal electrode 53 .
- the fixed terminal 58 is formed so as to be integrated with the second terminal electrode 54 .
- FIG. 4A when the test coaxial connector 100 is not fitted to the switch-equipped coaxial connector 500 , the movable terminal 57 and the fixed terminal 58 are connected to each other.
- the transmitting/receiving circuit and the antenna of the electronic device are connected to each other via a path connecting the first terminal electrode 53 , the movable terminal 57 , the fixed terminal 58 , and the second terminal electrode 54 .
- the transmitting/receiving circuit and the antenna of the electronic device become disconnected from each other, and the transmitting/receiving circuit and the measuring instrument become connected to each other via a path connecting the first terminal electrode 53 , the movable terminal 57 , the probe 2 , and the central conductor 4 a of the coaxial cable 4 .
- the bent portion 2 c is formed by the probe 2 being bent at two locations, so that the probe 2 has elasticity (spring property).
- the probe 2 retracts upward at the time when the probe 2 comes into contact with a portion other than the movable terminal 57 of the switch-equipped coaxial connector 500 , so that breakage of the switch-equipped coaxial connector 500 by the probe 2 is prevented.
- FIG. 5 shows a probe 22 of a test coaxial connector according to the second embodiment.
- a zigzag portion 22 c is formed between a contact 22 a and a cut 22 b for connecting the shield conductor 4 c of the coaxial cable 4 .
- the probe 22 has elasticity (spring property) since the zigzag portion 22 c is formed in the probe 2 .
- FIG. 5B shows a probe 32 of a test coaxial connector according to the third embodiment.
- a rounded bent portion 32 c is formed between a contact 32 a and a cut 32 b .
- the probe 32 has elasticity since the rounded bent portion 32 c is formed in the probe 22 .
- FIG. 5C shows a probe 42 of a test coaxial connector according to the fourth embodiment.
- a contact 42 a is formed in a curled shape.
- the probe 42 has elasticity since the contact 42 a is formed in a curled shape.
- the contact 42 a of the probe 42 is not formed at an end portion of the probe 42 but formed near the end portion.
- FIG. 5D shows a probe 52 of a test coaxial connector according to the fifth embodiment.
- a bent portion 52 c is formed between a contact 52 a and a cut 52 b , and the contact 52 a is formed in a curled shape.
- the probe 52 has elasticity since the bent portion 52 c is formed in the probe 52 and the contact 52 a is formed in a curled shape.
- the contact 52 a of the probe 52 is not formed at an end portion of the probe 52 but formed near the end portion.
- FIG. 5E shows a probe 62 of a test coaxial connector according to the sixth embodiment.
- a bent portion 62 c is formed between a contact 62 a and a cut 62 b , and the thickness of the bent portion 62 c is smaller than that of the other portions.
- the probe 62 has elasticity since the bent portion 62 c is formed in the probe 62 and the thickness of the bent portion 62 c is smaller.
- the probes 2 to 62 are formed of plate-like structures, but may be formed of rod-like structures instead.
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Abstract
Description
- This application claims benefit of priority to International Patent Application No. PCT/JP2017/018593, filed May 17, 2017, and to Japanese Patent Application No. 2016-105189, filed May 26, 2016, the entire contents of each are incorporated herein by reference.
- The present disclosure relates to a test coaxial connector, and more specifically, relates to a test coaxial connector that has a probe portion with a small height and that prevents breakage of a switch-equipped coaxial connector even when the test coaxial connector is not properly fitted to the switch-equipped coaxial connector.
- As a method for connecting an electronic device and a measuring instrument in measuring characteristics of the electronic device, a method in which a switch-equipped coaxial connector provided to the electronic device and a test coaxial connector connected to the measuring instrument are fitted to each other, is widely used. More specifically, a switch-equipped coaxial connector is provided to a wiring portion of a board housed in an electronic device, the wiring portion being to be measured for electric characteristics. For example, in the case where the electronic device is a cellular phone, a switch-equipped coaxial connector is provided between a transmitting/receiving circuit formed on the board and an antenna by surface-mounting. The switch-equipped coaxial connector normally connects the transmitting/receiving circuit and the antenna.
- When the test coaxial connector is fitted to the switch-equipped coaxial connector, the switch-equipped coaxial connector disconnects the transmitting/receiving circuit and the antenna from each other and newly connects the transmitting/receiving circuit and the test coaxial connector. As a result, the transmitting/receiving circuit of the cellular phone and the measuring instrument are connected to each other, so that it is possible to measure characteristics of the cellular phone by the measuring instrument.
- Such a test coaxial connector is disclosed in International Publication No. WO2010/113536.
FIG. 6 shows a testcoaxial connector 1000 disclosed in International Publication No. WO2010/113536. - The test
coaxial connector 1000 has a structure in which aprobe 102 is housed in aconductive housing 101. Theprobe 102 includes a conductivetubular barrel 103, and acoil spring 104 and a plunger (central terminal) 105 that are housed in a tubular portion of thebarrel 103. Thebarrel 103 and theplunger 105 are electrically conducted to each other. - An
insulating bushing 106 is provided between thehousing 101 and theprobe 102, whereby thehousing 101 and theprobe 102 are insulated from each other. Acoaxial cable 108 connected to ameasuring instrument 107 is connected to the testcoaxial connector 1000. More specifically, acentral conductor 108 a of thecoaxial cable 108 is connected to theplunger 105 via thebarrel 103. In addition, ashield conductor 108 b of thecoaxial cable 108 is connected to thehousing 101 via aconductive adapter 109. - Since the
coil spring 104 is provided in the tubular portion of thebarrel 103, theplunger 105 is retractable in the upward direction in the drawing. The reason why theplunger 105 is configured to be retractable is to prevent theplunger 105 from breaking a switch-equipped coaxial connector (not shown) due to unnecessary force applied from theplunger 105 to the switch-equipped coaxial connector, when the testcoaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector. That is, when the testcoaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector, theplunger 105 retracts in the upward direction due to shrinkage of thecoil spring 104, thereby avoiding breakage of the switch-equipped coaxial connector. - In the test
coaxial connector 1000, generally, the height of theprobe 102 portion is large as indicated by reference sign H inFIG. 6 (reference sign H and a leader line therefor inFIG. 6 are added by the applicant for explanation, and are not shown in the drawing of International Publication No. WO2010/113536). The reason why the height H of theprobe 102 portion of the testcoaxial connector 1000 is made large is as follows. - Characteristics of an electronic device are measured during manufacture of the electronic device or after completion of the electronic device, and, in some cases, another electronic component having a large height is mounted around a switch-equipped coaxial connector mounted on a board. In this case, if the height H of the
probe 102 portion is not large, the other electronic component becomes an obstacle and thus the testcoaxial connector 1000 may not be successfully fitted to the switch-equipped coaxial connector. - In addition, when characteristics of the electronic device are measured after completion of the electronic device, a case of the electronic device in which the board is housed is detached before the measurement in some cases. In some cases, a measurement hole is formed in the case in advance, and the
probe 102 portion is inserted into the measurement hole before the measurement. In order to insert theprobe 102 portion into the measurement hole and conduct the measurement, the height H of theprobe 102 portion has to be large. - Due to the above reason, the height H of the
probe 102 portion of the testcoaxial connector 1000 is made large. - In measurement of characteristics of the electronic device, in order to achieve high measurement accuracy, it is necessary to conduct the measurement under the same conditions as in an actual use state. Therefore, in a state where the case of the electronic device is detached, high measurement accuracy is not achieved in some cases. Also, when a measurement hole is provided in the case for measurement of characteristics, a problem that waterproofness of the electronic device is not maintained, a problem that the measurement hole is not preferable in terms of appearance, and the like arise.
- Therefore, a method is conceivable in which a test coaxial connector is fitted to a switch-equipped connector provided to a board housed in a case, a coaxial cable is drawn to the outside from a gap of the case, and characteristic measurement is conducted. For this measurement, the height of the probe portion of the test coaxial connector has to be small.
- For example, in the test
coaxial connector 1000, in order to decrease the height H of theprobe 102 portion, first, it is necessary to decrease the length of the plunger (central terminal) 105. Next, the other portion is desired to be made smaller, but, in the testcoaxial connector 1000, it is impossible to decrease the length of the tubular portion of thebarrel 103, since thecoil spring 104 is housed in the tubular portion of thebarrel 103. - In addition, in order to decrease the height H of the
probe 102 portion, it is also conceivable to omit thecoil spring 104. However, in this case, if the testcoaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector, the switch-equipped coaxial connector is broken. Thus, it is impossible to adopt omission of thecoil spring 104. - Specifically, in the structure of the existing test
coaxial connector 1000, it is difficult to decrease the height of the probe portion to such a degree that, while the function to prevent breakage of a switch-equipped coaxial connector when the testcoaxial connector 1000 is not properly fitted to the switch-equipped coaxial connector is maintained, it is possible to fit the testcoaxial connector 1000 to a switch-equipped connector provided to a board housed in a case and to conduct measurement. - The present disclosure has been made to provide a test coaxial connector that is fitted to a switch-equipped coaxial connector when being used, and includes a housing and a probe housed in the housing. The probe is formed of one continuous structure having elasticity, the structure including a contact at or near an end portion thereof and including, at or near another end portion thereof, a connection portion to which a central conductor of a coaxial cable is to be connected.
- A bent portion may be provided between the contact and the connection portion of the probe. In this case, it is possible to exhibit elasticity (spring property) by the bent portion.
- A zigzag portion may be provided between the contact and the connection portion of the probe. In this case, it is possible to exhibit elasticity by the zigzag portion.
- The probe may include a portion having a different diameter or thickness, between the contact and the connection portion. In this case, it is possible to exhibit elasticity by a portion having a small diameter or a portion having a small thickness.
- The contact of the probe may be curled. In this case, it is possible to exhibit elasticity by the curled contact.
- In the test coaxial connector of the present disclosure, since the probe is formed from one continuous structure, it is possible to decrease the height of the probe portion. In addition, since the probe has elasticity, even when the test coaxial connector of the present disclosure is not properly fitted to the switch-equipped coaxial connector, the test coaxial connector does not break the switch-equipped coaxial connector.
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FIG. 1A is a perspective view showing a test coaxial connector according to a first embodiment, andFIG. 1B is an exploded perspective view showing the test coaxial connector; -
FIGS. 2A and 2B are each a perspective view showing a probe of the test coaxial connector; -
FIG. 3A is a perspective view showing a state before the test coaxial connector is fitted to a switch-equipped coaxial connector, andFIG. 3B is a perspective view showing a state after the test coaxial connector is fitted to the switch-equipped coaxial connector; -
FIG. 4A is a cross-sectional view showing the state before the test coaxial connector is fitted to the switch-equipped coaxial connector, andFIG. 4B is a cross-sectional view showing the state after the test coaxial connector is fitted to the switch-equipped coaxial connector; -
FIGS. 5A to 5E are cross-sectional views showing probes according to second to sixth embodiments, respectively; and -
FIG. 6 is a cross-sectional view showing a test coaxial connector disclosed in International Publication No. WO2010/113536. - Hereinafter, modes for carrying out the present disclosure will be described with reference to the drawings.
- Each embodiment represents an embodiment of the present disclosure, and the present disclosure is not limited to the contents of the embodiments. In addition, the contents described in different embodiments may be combined and implemented, and the implementation contents in that case are also included in the present disclosure. The drawings are provided to help the understanding of the embodiments, and the drawings may not be necessarily illustrated strictly. For example, the ratios of dimensions of the illustrated components or the ratio of dimensions between the components may not correspond to the ratios of dimensions of those described in the specification. The components described in the specification may be omitted in the drawings, or some of the components may be omitted in the drawings.
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FIGS. 1A and 1B show a testcoaxial connector 100 according to a first embodiment.FIG. 1A is a perspective view of the testcoaxial connector 100, andFIG. 1B is an exploded perspective view of the testcoaxial connector 100. - The test
coaxial connector 100 includes aconductive housing 1. Thehousing 1 is produced from, for example, beryllium copper. A tubularfitting portion 1 a for fitting to a switch-equipped connector (not shown) is formed at a front portion of thehousing 1. - The test
coaxial connector 100 includes a conductive probe (central terminal) 2.FIGS. 2A and 2B show theprobe 2.FIG. 2A is a perspective view of theprobe 2 as seen from the front side, andFIG. 2B is a perspective view of theprobe 2 as seen from the rear side. - The
probe 2 is produced from, for example, one plate-shaped beryllium copper. Theprobe 2 has acontact 2 a at a front portion thereof. In addition, theprobe 2 has acut 2 b as a connection portion for connecting acentral conductor 4 a of a later-describedcoaxial cable 4, at a rear portion thereof. Furthermore, abent portion 2 c is provided between thecontact 2 a and thecut 2 b of theprobe 2 is provided by theprobe 2 being bent at two locations. Since thebent portion 2 c is provided, theprobe 2 exhibits elasticity (spring property). - The
probe 2 is attached to aninsulting member 3 formed from a resin. More specifically, a groove 3 a is formed on theinsulting member 3, and theprobe 2 is press-fitted into the groove 3 a. - On the
insulting member 3, a taperedannular guide 3 b that is used for positioning in fitting the testcoaxial connector 100 to the switch-equipped connector is further formed at a front portion thereof. Theinsulting member 3 to which theprobe 2 is attached is crimped with aclaw 1 b provided in thehousing 1, and thereby attached to thehousing 1. - The
coaxial cable 4 connected to a measuring instrument (not shown) is connected to the testcoaxial connector 100. Thecoaxial cable 4 is configured to have a four-layer structure having thecentral conductor 4 a, a first insulatinglayer 4 b covering thecentral conductor 4 a, ashield conductor 4 c covering the first insulatinglayer 4 b, and a secondinsulating layer 4 d covering theshield conductor 4 c. - The
central conductor 4 a of thecoaxial cable 4 is fitted into thecut 2 b of theprobe 2 and thereby fixed and electrically connected. Theshield conductor 4 c of thecoaxial cable 4 is crimped with aclaw 1 c provided in thehousing 1, and thereby fixed and electrically connected to thehousing 1. Furthermore, the entirecoaxial cable 4 is crimped with aclaw 1 d provided in thehousing 1, and thereby fixed to thehousing 1. - In the test
coaxial connector 100 having the above structure according to the present embodiment, theprobe 2 is composed of only one structure without using a barrel or a coil spring, and thus it is possible to decrease the height H of theprobe 2 portion shown inFIG. 1A . In addition, in the testcoaxial connector 100, thebent portion 2 c is provided by theprobe 2 being bent at two locations, and thus theprobe 2 has elasticity (spring property). Therefore, when the testcoaxial connector 100 is not properly fitted to the switch-equipped coaxial connector, thecontact 2 a of theprobe 2 retracts in the upward direction owing to the elasticity, so that it is possible to avoid breakage of the switch-equipped coaxial connector. - It is possible to produce the test
coaxial connector 100 having the above structure according to the present embodiment, for example, by the following method. - First, the
central conductor 4 a of thecoaxial cable 4 is fitted into thecut 2 b of theprobe 2, and thereby fixed and electrically connected. - Next, the
probe 2 is press-fitted into the groove 3 a of theinsulting member 3 and thereby attached. - Next, the
insulting member 3 to which theprobe 2 has been attached is crimped with theclaw 1 b and thereby attached to thehousing 1. - Next, the
shield conductor 4 c of thecoaxial cable 4 is crimped with theclaw 1 c and thereby electrically connected to thehousing 1. - Finally, the entire
coaxial cable 4 is crimped with theclaw 1 d and thereby attached to thehousing 1, whereby the testcoaxial connector 100 is completed. - Next, an example of a method for using the test
coaxial connector 100, that is, an example of a method for fitting the testcoaxial connector 100 to a switch-equipped coaxial connector (receptacle) 500, will be described with reference toFIGS. 3A, 3B, 4A , and 4B.FIG. 3A is a perspective view showing a state before the testcoaxial connector 100 is fitted to the switch-equippedcoaxial connector 500.FIG. 3B is a perspective view showing a state after the testcoaxial connector 100 is fitted to the switch-equippedcoaxial connector 500.FIG. 4A is a cross-sectional view showing the state before the testcoaxial connector 100 is fitted to the switch-equippedcoaxial connector 500.FIG. 4B is a cross-sectional view showing the state after the testcoaxial connector 100 is fitted to the switch-equippedcoaxial connector 500. In the drawings, the reference signs for the components that are not relevant to the description in this part may be omitted. - The test
coaxial connector 100 is fitted to the switch-equippedcoaxial connector 500. The switch-equippedcoaxial connector 500 is an element that is not included in the present disclosure. The switch-equippedcoaxial connector 500 is surface-mounted on a land electrode, which is formed on a board (not shown) housed in an electronic device, by means of solder reflow or the like. - The switch-equipped
coaxial connector 500 includes acase 50 formed from a resin. A firstterminal electrode 53, a secondterminal electrode 54, and a thirdterminal electrode 55 are formed on the bottom surface of thecase 50. The firstterminal electrode 53 is connected to a transmitting/receiving circuit of the electronic device. The secondterminal electrode 54 is connected to an antenna of the electronic device. The thirdterminal electrode 55 is connected to ground of the electronic device. - A conductive and tubular
fitting portion 56 for fitting to thefitting portion 1 a of the testcoaxial connector 100 is formed on the upper surface of the switch-equippedcoaxial connector 500. Thefitting portion 56 is connected to the thirdterminal electrode 55. - In a space within the
fitting portion 56, amovable terminal 57 and a fixedterminal 58 are disposed. Themovable terminal 57 is formed so as to be integrated with the firstterminal electrode 53. In addition, the fixedterminal 58 is formed so as to be integrated with the secondterminal electrode 54. As shown inFIG. 4A , when the testcoaxial connector 100 is not fitted to the switch-equippedcoaxial connector 500, themovable terminal 57 and the fixedterminal 58 are connected to each other. As a result, when the testcoaxial connector 100 is not fitted to the switch-equippedcoaxial connector 500, the transmitting/receiving circuit and the antenna of the electronic device are connected to each other via a path connecting the firstterminal electrode 53, themovable terminal 57, the fixedterminal 58, and the secondterminal electrode 54. - Also, as shown in
FIG. 4B , when thefitting portion 56 is fitted to thefitting portion 1 a such that the testcoaxial connector 100 is fitted to the switch-equippedcoaxial connector 500, thecontact 2 a of theprobe 2 presses down themovable terminal 57, so that themovable terminal 57 and the fixedterminal 58 become disconnected from each other and themovable terminal 57 and theprobe 2 become connected to each other. As a result, the transmitting/receiving circuit and the antenna of the electronic device become disconnected from each other, and the transmitting/receiving circuit and the measuring instrument become connected to each other via a path connecting the firstterminal electrode 53, themovable terminal 57, theprobe 2, and thecentral conductor 4 a of thecoaxial cable 4. - As described above, in the
probe 2 of the present embodiment, thebent portion 2 c is formed by theprobe 2 being bent at two locations, so that theprobe 2 has elasticity (spring property). Thus, if the positions of the switch-equippedcoaxial connector 500 and the testcoaxial connector 100 are displaced such that the switch-equippedcoaxial connector 500 and the testcoaxial connector 100 are not properly fitted to each other, theprobe 2 retracts upward at the time when theprobe 2 comes into contact with a portion other than themovable terminal 57 of the switch-equippedcoaxial connector 500, so that breakage of the switch-equippedcoaxial connector 500 by theprobe 2 is prevented. - Hereinafter, second to sixth embodiments will be described. In each of the second to sixth embodiments, the shape of the
probe 2 of the testcoaxial connector 100 according to the first embodiment is changed. The other components of the second to sixth embodiments are the same as those of the first embodiment. Therefore, only the probe is shown in the drawing showing each embodiment. -
FIG. 5 shows aprobe 22 of a test coaxial connector according to the second embodiment. - In the
probe 22, azigzag portion 22 c is formed between acontact 22 a and acut 22 b for connecting theshield conductor 4 c of thecoaxial cable 4. Theprobe 22 has elasticity (spring property) since thezigzag portion 22 c is formed in theprobe 2. -
FIG. 5B shows aprobe 32 of a test coaxial connector according to the third embodiment. - In the
probe 32, a roundedbent portion 32 c is formed between acontact 32 a and acut 32 b. Theprobe 32 has elasticity since the roundedbent portion 32 c is formed in theprobe 22. -
FIG. 5C shows aprobe 42 of a test coaxial connector according to the fourth embodiment. - In the
probe 42, acontact 42 a is formed in a curled shape. Theprobe 42 has elasticity since thecontact 42 a is formed in a curled shape. Thecontact 42 a of theprobe 42 is not formed at an end portion of theprobe 42 but formed near the end portion. -
FIG. 5D shows aprobe 52 of a test coaxial connector according to the fifth embodiment. - In the
probe 52, abent portion 52 c is formed between acontact 52 a and acut 52 b, and thecontact 52 a is formed in a curled shape. Theprobe 52 has elasticity since thebent portion 52 c is formed in theprobe 52 and thecontact 52 a is formed in a curled shape. Thecontact 52 a of theprobe 52 is not formed at an end portion of theprobe 52 but formed near the end portion. -
FIG. 5E shows aprobe 62 of a test coaxial connector according to the sixth embodiment. - In the
probe 62, abent portion 62 c is formed between acontact 62 a and acut 62 b, and the thickness of thebent portion 62 c is smaller than that of the other portions. Theprobe 62 has elasticity since thebent portion 62 c is formed in theprobe 62 and the thickness of thebent portion 62 c is smaller. - The embodiments of the present disclosure have been described above. However, the present disclosure is not limited to the above contents, and various modifications may be made according to the principles of the present disclosure.
- For example, in the first to sixth embodiments, the
probes 2 to 62 are formed of plate-like structures, but may be formed of rod-like structures instead.
Claims (8)
Applications Claiming Priority (3)
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JP2016105189 | 2016-05-26 | ||
JP2016-105189 | 2016-05-26 | ||
PCT/JP2017/018593 WO2017204062A1 (en) | 2016-05-26 | 2017-05-17 | Coaxial connector for inspection |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2017/018593 Continuation WO2017204062A1 (en) | 2016-05-26 | 2017-05-17 | Coaxial connector for inspection |
Publications (2)
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US20190086442A1 true US20190086442A1 (en) | 2019-03-21 |
US10436816B2 US10436816B2 (en) | 2019-10-08 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US16/192,578 Active US10436816B2 (en) | 2016-05-26 | 2018-11-15 | Test coaxial connector |
Country Status (3)
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US (1) | US10436816B2 (en) |
CN (1) | CN209570612U (en) |
WO (1) | WO2017204062A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10910739B2 (en) * | 2018-12-21 | 2021-02-02 | Hirose Electric Co., Ltd. | Coaxial cable connector provided with a housing comprising paired crimping pieces |
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JPH065158A (en) * | 1992-02-28 | 1994-01-14 | Sprecher Energ Ag | Winding method for winding-energy storing spring in driving mechanism of high-voltage or medium-voltage circuit breaker and circuit breaker for performing winding method thereof |
JP2004362832A (en) * | 2003-06-02 | 2004-12-24 | Sumitomo Wiring Syst Ltd | Terminal fitting |
JP2008198532A (en) * | 2007-02-14 | 2008-08-28 | Itt Mfg Enterp Inc | Connector for ffc/fpc |
JP2011119174A (en) * | 2009-12-07 | 2011-06-16 | Hirose Electric Co Ltd | Antenna installation method, and coaxial connector used for the same |
Family Cites Families (5)
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JP2584689Y2 (en) * | 1992-06-23 | 1998-11-05 | 本多通信工業株式会社 | Thin coaxial connector |
FR2828022B1 (en) * | 2001-07-27 | 2003-11-21 | Framatome Connectors Int | INTEGRATED ASSEMBLY COMPRISING AN ANTENNA AND A SWITCH |
JP2007139712A (en) * | 2005-11-22 | 2007-06-07 | Nhk Spring Co Ltd | Probe holder and probe unit |
KR101183809B1 (en) | 2009-04-01 | 2012-09-17 | 가부시키가이샤 무라타 세이사쿠쇼 | Coaxial connector for inspection |
JP2011106980A (en) * | 2009-11-18 | 2011-06-02 | Advantest Corp | Probe card |
-
2017
- 2017-05-17 WO PCT/JP2017/018593 patent/WO2017204062A1/en active Application Filing
- 2017-05-17 CN CN201790000867.4U patent/CN209570612U/en active Active
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2018
- 2018-11-15 US US16/192,578 patent/US10436816B2/en active Active
Patent Citations (5)
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JPH065158A (en) * | 1992-02-28 | 1994-01-14 | Sprecher Energ Ag | Winding method for winding-energy storing spring in driving mechanism of high-voltage or medium-voltage circuit breaker and circuit breaker for performing winding method thereof |
JP2004362832A (en) * | 2003-06-02 | 2004-12-24 | Sumitomo Wiring Syst Ltd | Terminal fitting |
JP2008198532A (en) * | 2007-02-14 | 2008-08-28 | Itt Mfg Enterp Inc | Connector for ffc/fpc |
JP2011119174A (en) * | 2009-12-07 | 2011-06-16 | Hirose Electric Co Ltd | Antenna installation method, and coaxial connector used for the same |
US8414328B2 (en) * | 2009-12-07 | 2013-04-09 | Hirose Electric Co., Ltd. | Method of installing antenna and coaxial connector |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US10910739B2 (en) * | 2018-12-21 | 2021-02-02 | Hirose Electric Co., Ltd. | Coaxial cable connector provided with a housing comprising paired crimping pieces |
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US10436816B2 (en) | 2019-10-08 |
WO2017204062A1 (en) | 2017-11-30 |
CN209570612U (en) | 2019-11-01 |
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