US20170153270A1 - Testing Apparatus Usable In Switchgear Cabinet - Google Patents
Testing Apparatus Usable In Switchgear Cabinet Download PDFInfo
- Publication number
- US20170153270A1 US20170153270A1 US14/955,185 US201514955185A US2017153270A1 US 20170153270 A1 US20170153270 A1 US 20170153270A1 US 201514955185 A US201514955185 A US 201514955185A US 2017153270 A1 US2017153270 A1 US 2017153270A1
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- US
- United States
- Prior art keywords
- shutter assembly
- switchgear cabinet
- electrical conductors
- test apparatus
- interior
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 238000012360 testing method Methods 0.000 title claims abstract description 36
- 239000004020 conductor Substances 0.000 claims abstract description 44
- 230000007246 mechanism Effects 0.000 claims description 11
- 230000003278 mimic effect Effects 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000414 obstructive effect Effects 0.000 description 1
- 230000010399 physical interaction Effects 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3275—Fault detection or status indication
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02B—BOARDS, SUBSTATIONS OR SWITCHING ARRANGEMENTS FOR THE SUPPLY OR DISTRIBUTION OF ELECTRIC POWER
- H02B1/00—Frameworks, boards, panels, desks, casings; Details of substations or switching arrangements
- H02B1/26—Casings; Parts thereof or accessories therefor
- H02B1/30—Cabinet-type casings; Parts thereof or accessories therefor
- H02B1/306—Accessories, e.g. windows
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02B—BOARDS, SUBSTATIONS OR SWITCHING ARRANGEMENTS FOR THE SUPPLY OR DISTRIBUTION OF ELECTRIC POWER
- H02B11/00—Switchgear having carriage withdrawable for isolation
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02B—BOARDS, SUBSTATIONS OR SWITCHING ARRANGEMENTS FOR THE SUPPLY OR DISTRIBUTION OF ELECTRIC POWER
- H02B3/00—Apparatus specially adapted for the manufacture, assembly, or maintenance of boards or switchgear
Definitions
- the disclosed and claimed concept relates generally to electrical interruption equipment and, more particularly, to a testing apparatus that is usable with a switchgear cabinet.
- Circuit interruption equipment is well known in the relevant art for use in interrupting the flow of current in a protected portion of an electrical circuit.
- FIGS. 1-7 One type of circuit interruption system is a withdrawable circuit interruption system such as is depicted generally in FIGS. 1-7 .
- a withdrawable circuit interruption system such as is depicted generally in FIGS. 1-7 .
- Such a system employs a switchgear cabinet 6 and a circuit interruption device 10 that is mountable thereon and removable therefrom.
- the switchgear cabinet 6 has an interior 12 within which the circuit interruption device 10 is receivable through an access port 16 of the switchgear cabinet 6 .
- the switchgear cabinet 6 has a number of electrical conductors 22 within the interior 12 that are covered by a shutter assembly 24 to protect personnel in the vicinity of the switchgear cabinet 6 from contact with the electrical conductors 22 in situations when the circuit interruption device 10 is removed from the interior 12 of the switchgear cabinet 6 .
- the shutter assembly 24 includes a first plate 28 having a plurality of first holes 30 formed therein, a second plate 34 ( FIGS. 2 and 4-5 ) having a plurality of second holes 36 ( FIG. 5 ) formed therein, a pair of abutments 40 A and 40 B affixed to the first plate 28 , and an engagement apparatus 42 that is connected with the first and second plates 28 and 34 .
- the engagement apparatus 42 is depicted in FIGS.
- the first and second plates 28 and 34 are cooperable with channels formed in the walls of the switchgear cabinet 6 to move the shutter assembly 24 between a deployed state, such as is depicted in FIGS. 1-2 and 4 , and an undeployed state, such as is depicted in FIGS. 5-6 .
- the shutter assembly 24 is spring biased toward the deployed state in which the first and second holes 30 and 36 are offset from one another such that the first and second plates 28 and 34 together form a shield between the electrical conductors 22 and the interior 12 of the switchgear cabinet 6 .
- the shutter assembly 24 is therefore in the deployed state and covers the electrical conductors 22 .
- the switchgear cabinet 6 has a support 52 that is movably situated within the interior 12 and that is movable between an extended position such as is depicted in FIG. 1 wherein a portion of the support 52 protrudes from the interior 12 into the exterior 8 of the switchgear cabinet 6 and a number of retracted positions 52 wherein the support 52 is situated within the interior 12 .
- the support 52 includes a pair of telescoping rails 56 A and 56 B
- the circuit interruption device 10 includes a number of lugs 58 foamed on an exterior surface of its housing. The lugs 58 are receivable on the rails 56 A and 56 B, such as when the support 52 is in the extended position shown in FIG.
- the circuit interruption device 10 includes a drive system 54 that is depicted generally in FIG. 3 and that includes a pin 60 that is situated on a pivotable crank 62 .
- the pin 60 is receivable in a notch 63 that is formed in a structure 64 of the switchgear cabinet 6 that is disposed within the interior 12 of the switchgear cabinet 6 .
- the first and second holes 30 and 36 are aligned with one another to thereby uncover the electrical conductors 22 and to permit finger clusters or other connection structures on the advancing face of the circuit interruption device 10 to be electrically engaged with the electrical conductors 22 .
- the bias of the shutter assembly 24 is overcome, and the shutter assembly 24 is translated farther into the interior 12 while moving the shutter assembly 24 from the deployed state to the undeployed state and simultaneously receiving the electrical conductors 22 in the aligned first and second holes 30 and 36 .
- Such a condition is depicted generally in FIG. 6 .
- circuit interruption systems have been generally effective for their intended purposes, they have not been without limitation.
- the shutter assembly 24 is caused by the advancing circuit interruption device 10 to simultaneously move toward the electrical conductors 22 while translating the first and second plates 28 and 34 with respect to one another to move from its deployed state to its undeployed state, the proper operation of the components relies upon the shutter assembly 24 and the electrical conductors 22 being situated in pre-established positions with respect to one another.
- potential limitations with the manufacturing process and damage that may be sustained by the switchgear cabinet 6 during transportation to its final location may result in improper positioning of the electrical conductors 22 or the shutter assembly 24 or both.
- misalignment can be a problem because it can inhibit the circuit interruption device 10 from electrically engaging the electrical conductors 22 and because an attempt to receive the circuit interruption device 10 into the interior 12 can cause the shutter assembly 24 to engage the electrical conductors 22 themselves and thereby cause damage. Additionally or alternatively, such misalignment cannot be observed from the exterior 18 of the switchgear cabinet 6 because of the visually obstructive presence of the circuit interruption device 10 . As is understood from an arrow 65 that is depicted in FIGS. 2 and 6 , the circuit interruption device 10 itself obstructs a view from the exterior 18 of the shutter assembly 24 in its undeployed state. Improvements therefore would be desirable.
- test apparatus 4 that is usable with the switchgear cabinet 6 meets these and other shortcomings known in the relevant art.
- the test apparatus 4 is structured to mimic the operation of the circuit interruption device 10 being received in the interior 12 of the switchgear cabinet 10 by providing a number of structures such as an engagement wall 78 that engages the shutter assembly 24 and moves it from its deployed state to its undeployed state.
- the engagement wall 78 in the test apparatus has a number of openings 86 formed therein that permit the electrical conductors 22 and the relevant portions of the shutter assembly 24 to be viewed from the exterior 18 of the switchgear cabinet 6 .
- an aspect of the disclosed and claimed concept is to provide an improved test apparatus that is usable with a switchgear cabinet and which permits the operation of a shutter assembly in moving between deployed and undeployed states to be observed from the exterior of the switchgear cabinet.
- Another aspect of the disclosed and claimed concept is to provide an improved test apparatus that is usable with a switchgear cabinet in place of a circuit interruption device and that permits the operation of a shutter assembly that otherwise would be blocked from view by a circuit interruption device to instead be observable from the exterior of the switchgear cabinet.
- an aspect of the disclosed and claimed concept is to provide an improved test apparatus that is usable with a switchgear cabinet, the switchgear cabinet having an interior and having an access port through which a circuit interruption device is receivable into the interior from the exterior of the cabinet, the switchgear cabinet having a number of electrical conductors and a shutter assembly that are situated within the interior, the shutter assembly being operable to move the shutter assembly between a deployed state and an undeployed state responsive to the shutter assembly being engaged by the circuit interruption device, the shutter assembly in the deployed state being in a condition covering the number of electrical conductors and resisting the number of electrical conductors from being visually observed through the access port from a location situated at an exterior of the switchgear cabinet, the shutter assembly in the undeployed state being in another condition uncovering the number of electrical conductors.
- the test apparatus can be generally stated as including a frame that can be generally stated as including at least a first wall having a number of openings formed therein, the frame being movable between a first position disengaged from the mechanism and a second position received at least partially in the interior and engaged with the mechanism to move the shutter assembly between the deployed state and the undeployed state and to thereby move the shutter assembly between the condition covering the number of electrical conductors and the another condition uncovering the number of electrical conductors, the number of openings in the second position at least partially overlying the number of electrical conductors and permitting the electrical conductors to be visually observed through the number of openings and through the access port from a location situated at the exterior of the switchgear cabinet.
- FIG. 1 is a depiction of a circuit interruption device situated on a support of a switchgear cabinet with the support being in an extended position and with a shutter assembly of the switchgear cabinet being in a deployed state;
- FIG. 2 is a view similar to FIG. 1 , except depicting the circuit interruption device at least partially received in an interior of the switchgear cabinet and depicting for reasons of clarity a portion of the support having been removed;
- FIG. 3 is a sectional view as taken along line 3 - 3 of FIG. 2 ;
- FIG. 4 is a depiction of the shutter assembly of FIG. 1 in the deployed state
- FIG. 5 is a view similar to FIG. 4 , except depicting the shutter assembly in an undeployed state;
- FIG. 6 is a view similar to FIG. 2 , except depicting the circuit interruption device fully advanced into the interior and depicting the shutter assembly in the undeployed state of FIG. 5 and with a number of electrical conductors of the switchgear cabinet being received through a plurality of aligned first and second holes formed in the shutter assembly;
- FIG. 7 is a sectional view as taken along line 7 - 7 of FIG. 6 ;
- FIG. 8 is another view of the switchgear cabinet of FIG. 1 , except additionally depicting an improved test apparatus in accordance with the disclosed and claimed concept being spaced from the support;
- FIG. 9 is a view similar to FIG. 8 , except depicting the test apparatus received on the support of the switchgear cabinet;
- FIG. 10 is a view similar to FIG. 9 , except depicting the test apparatus at least partially situated in the interior of the switchgear cabinet and depicting for reasons of clarity a portion of the support having been removed;
- FIG. 11 is a sectional view as taken along line 11 - 11 of FIG. 10 ;
- FIG. 12 is an enlarged view of the indicated portion of FIG. 10 ;
- FIG. 13 is a view similar to FIG. 10 , except depicting the test apparatus fully advanced along the interior of the switchgear cabinet and depicting the shutter assembly in the same undeployed state as is depicted in FIG. 5 with the electrical conductors being received through aligned first and second holes of the shutter assembly; and
- FIG. 14 is a sectional view as taken along line 14 - 14 of FIG. 13 .
- FIGS. 8-14 An improved test apparatus 4 in accordance with the disclosed and claimed concept is depicted in FIGS. 8-14 .
- the test apparatus 4 is usable with the switchgear cabinet 6 that is depicted in FIGS. 1-7 , for example, and advantageously permits the operation of the shutter assembly 24 and its physical interaction with the electrical conductors 22 to be observed from the exterior 18 of the switchgear cabinet 6 .
- the test apparatus 4 is configured to take the place of the circuit interruption device 10 which, for the reasons set forth above, obstructs a view of the shutter assembly 24 and the electrical conductors 22 from the exterior through the access port 16 .
- test apparatus 4 advantageously engages the shutter assembly 24 in the same fashion as would the circuit interruption device 10 , except that the test apparatus 4 is advantageously configured to not obstruct the shutter assembly 24 and the electrical conductors 22 and rather advantageously permits them and their operation to be observed from the exterior 18 of the switchgear cabinet 6 .
- the test apparatus 4 can be said to include a frame 66 that includes a base 70 and a wall apparatus 72 .
- the test apparatus 4 further includes a drive mechanism 76 that is situated on the base 70 and that is cooperable with the structure 64 of the switchgear cabinet 6 to permit the test apparatus 4 to be advanced into the interior 12 and to operate the shutter assembly 24 between the deployed and undeployed states in a fashion similar to the way in which the drive system 54 of the circuit interruption device 10 advanced it to cause the change in state of the shutter assembly 24 .
- the wall apparatus 72 is situated on the base 70 and includes an engagement wall 78 and a pair of sidewalls 82 A and 82 B.
- the engagement wall 78 has a plurality of openings 86 formed therein which can be said to overlie the electrical conductors 22 and the aligned first and second holes 30 and 36 when the test apparatus 4 is fully advanced into the switchgear cabinet 6 and has engaged the shutter assembly 24 and moved it to its undeployed state.
- the wall apparatus 72 further includes a lug apparatus 88 that includes a pair of lugs 90 A and 90 B that are situated on the sidewalls 82 A and 82 B, respectively.
- the lugs 90 A and 90 B are receivable on the rails 56 A and 56 B, respectively, of the support 52 and thus support the test apparatus 4 on the support 52 during movement of the support 52 between the extended and retracted positions, such as is depicted in FIGS. 8-10 and 13 . It is noted that the rail 56 A is removed from FIGS. 10 and 13 for reasons of clarity.
- the lugs 90 A and 90 B are mirror images of one another, as are the rails 56 A and 56 B.
- the drive mechanism 76 includes an arm 92 that is pivotably situated on the base 70 and further includes a lock 94 that is depicted in FIG. 12 as including a plunger that is movable between a locked position that is depicted in solid lines and an unlocked position that is depicted in dashed lines in FIG. 12 .
- the plunger 95 in the locked position is received in a receptacle 96 ( FIG. 13 ), and in so doing the lock 94 retains the arm 92 in a disengaged position such as is depicted generally in FIGS. 8-12 .
- FIGS. 12 As can be understood from FIGS.
- the drive mechanism 76 further includes a crank 97 that is mechanically connected with and operated by the arm 92 and that is pivotable with respect to the base 70 .
- the crank 97 is pivotable to move a pin 98 of the drive mechanism 76 that is situated on the free end of the crank 97 between a first position disengaged from the notch 63 formed on the structure 64 and a second position engaged with the notch 63 .
- the plunger 95 when the plunger 95 is moved to the unlocked position that is depicted in dashed lines in FIG. 12 , the plunger 95 is withdrawn from the receptacle 96 , and the arm 92 can be pivoted with respect to the base 70 from the disengaged position that is depicted generally in FIGS. 8-12 to an engaged position that is depicted generally in FIGS. 13-14 .
- the plunger 95 is spring-biased toward the locked position that is depicted in solid lines.
- the engagement wall 78 mechanically engages the abutments 40 A and 40 B, and the base 70 mechanically engages the push bar 46 , and such mechanical engagement between the structures of the test apparatus 4 and the corresponding engaged structures of the shutter assembly 24 causes the shutter assembly 24 to be moved to its undeployed state.
- the first and second holes 30 and 36 become aligned with one another and the electrical conductors are received through the aligned pairs of first and second holes 30 and 36 in the undeployed state of the shutter assembly 24 .
- the operation of the shutter assembly 24 in moving between the deployed and undeployed states can be observed through the openings 86 from the exterior 18 of the switchgear cabinet 6 and through the access port 16 .
- the interplay between the shutter assembly 24 and the electrical conductors 22 can likewise be observed. That is, the shutter assembly 24 can be visually observed moving between the deployed and undeployed states, and the electrical conductors 22 can be observed being received in the aligned pairs of first and second holes 30 and 36 , and this can be observed through the openings 86 from the exterior 18 of the switchgear cabinet 6 and through the access port 16 .
- test apparatus 4 with its openings 86 formed therein advantageously permits the shutter assembly 24 and the electrical conductors 22 to be observed from the exterior 18 of the switchgear cabinet 6 , which enables problems with the switchgear cabinet 6 to be identified prior to the circuit interruption device 10 being racked into the interior 12 , thereby avoiding greater damage to the switchgear cabinet 6 .
- the proper functioning of the shutter assembly 24 and its proper cooperation with the electrical conductors 22 can likewise be observed, which advantageously reduces the risk to nearby personnel due to possible electrical shorts within the interior 12 such as might be occasioned by switching the circuit interruption device 10 to its ON condition or by simply racking the circuit interruption device 10 into the interior 12 if the shutter assembly 24 or the electrical conductors 22 were not working or cooperating properly.
- the improved test apparatus 4 is inexpensive to manufacture and functions in the same way as the circuit interruption device 10 being received in the interior 12 and becoming engaged with the shutter assembly 24 .
- the test apparatus 4 thus advantageously provides a low cost system for checking the operation of the switchgear cabinet 6 . Other advantageous will be apparent.
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Abstract
Description
- Field
- The disclosed and claimed concept relates generally to electrical interruption equipment and, more particularly, to a testing apparatus that is usable with a switchgear cabinet.
- Related Art
- Circuit interruption equipment is well known in the relevant art for use in interrupting the flow of current in a protected portion of an electrical circuit. Numerous types of such circuit interruption devices exist and can include circuit breakers, vacuum interrupters, and numerous other types of devices known for such purposes.
- One type of circuit interruption system is a withdrawable circuit interruption system such as is depicted generally in
FIGS. 1-7 . Such a system employs aswitchgear cabinet 6 and acircuit interruption device 10 that is mountable thereon and removable therefrom. Theswitchgear cabinet 6 has aninterior 12 within which thecircuit interruption device 10 is receivable through anaccess port 16 of theswitchgear cabinet 6. Theswitchgear cabinet 6 has a number ofelectrical conductors 22 within theinterior 12 that are covered by ashutter assembly 24 to protect personnel in the vicinity of theswitchgear cabinet 6 from contact with theelectrical conductors 22 in situations when thecircuit interruption device 10 is removed from theinterior 12 of theswitchgear cabinet 6. As employed herein, the expression “a number of” and variations thereof shall refer broadly to any non-zero quantity, including a quantity of one. As can be seen inFIGS. 1-2 and 4-6 , theshutter assembly 24 includes afirst plate 28 having a plurality offirst holes 30 formed therein, a second plate 34 (FIGS. 2 and 4-5 ) having a plurality of second holes 36 (FIG. 5 ) formed therein, a pair ofabutments first plate 28, and anengagement apparatus 42 that is connected with the first andsecond plates engagement apparatus 42 is depicted inFIGS. 4-5 as including apush bar 46 and a pair oflinks push bar 46 and the first andsecond plates second plates switchgear cabinet 6 to move theshutter assembly 24 between a deployed state, such as is depicted inFIGS. 1-2 and 4 , and an undeployed state, such as is depicted inFIGS. 5-6 . Theshutter assembly 24 is spring biased toward the deployed state in which the first andsecond holes second plates electrical conductors 22 and theinterior 12 of theswitchgear cabinet 6. - When the
circuit interruption device 10 is removed from theinterior 12, theshutter assembly 24 is therefore in the deployed state and covers theelectrical conductors 22. - As is best shown in
FIG. 1 , theswitchgear cabinet 6 has asupport 52 that is movably situated within theinterior 12 and that is movable between an extended position such as is depicted inFIG. 1 wherein a portion of thesupport 52 protrudes from theinterior 12 into theexterior 8 of theswitchgear cabinet 6 and a number of retractedpositions 52 wherein thesupport 52 is situated within theinterior 12. Thesupport 52 includes a pair oftelescoping rails circuit interruption device 10 includes a number oflugs 58 foamed on an exterior surface of its housing. Thelugs 58 are receivable on therails support 52 is in the extended position shown inFIG. 1 , wherein the shutter assembly is in its deployed state. As therails interior 12 with thecircuit interruption device 10 situated thereon, thecircuit interruption device 10 is advanced farther into and along theinterior 12 and begins to approach theshutter assembly 24, as is indicated generally inFIG. 2 wherein thecircuit interruption device 10 has not yet made physical contact with theshutter assembly 24. - The
circuit interruption device 10 includes adrive system 54 that is depicted generally inFIG. 3 and that includes apin 60 that is situated on apivotable crank 62. Thepin 60 is receivable in anotch 63 that is formed in astructure 64 of theswitchgear cabinet 6 that is disposed within theinterior 12 of theswitchgear cabinet 6. - As the
crank 62 is pivoted (in the clockwise direction from the perspective ofFIGS. 3 and 7 ), thepin 60 is received in thenotch 63, and thecircuit interruption device 10 is advanced farther into theinterior 12 to a point where thecircuit interruption device 10 physically engages theabutments push bar 46. Further advancement of thecircuit interruption device 10 into theinterior 12 causes theshutter assembly 24 to be corresponding advanced toward theelectrical conductors 22 and to move theshutter assembly 24 from its deployed state to its undeployed state that is depicted generally inFIGS. 5 and 6 . In the undeployed state, the first andsecond holes electrical conductors 22 and to permit finger clusters or other connection structures on the advancing face of thecircuit interruption device 10 to be electrically engaged with theelectrical conductors 22. It thus can be understood that by advancing thecircuit interruption device 10 into theinterior 12 by operating thedrive system 54 to engage thepin 60 in thenotch 63 and to simultaneously engage the advancing wall of thecircuit interruption device 10 with theshutter assembly 24, the bias of theshutter assembly 24 is overcome, and theshutter assembly 24 is translated farther into theinterior 12 while moving theshutter assembly 24 from the deployed state to the undeployed state and simultaneously receiving theelectrical conductors 22 in the aligned first andsecond holes FIG. 6 . - While such circuit interruption systems have been generally effective for their intended purposes, they have not been without limitation. For instance, since the
shutter assembly 24 is caused by the advancingcircuit interruption device 10 to simultaneously move toward theelectrical conductors 22 while translating the first andsecond plates shutter assembly 24 and theelectrical conductors 22 being situated in pre-established positions with respect to one another. However, it is understood that potential limitations with the manufacturing process and damage that may be sustained by theswitchgear cabinet 6 during transportation to its final location may result in improper positioning of theelectrical conductors 22 or theshutter assembly 24 or both. Such misalignment can be a problem because it can inhibit thecircuit interruption device 10 from electrically engaging theelectrical conductors 22 and because an attempt to receive thecircuit interruption device 10 into theinterior 12 can cause theshutter assembly 24 to engage theelectrical conductors 22 themselves and thereby cause damage. Additionally or alternatively, such misalignment cannot be observed from theexterior 18 of theswitchgear cabinet 6 because of the visually obstructive presence of thecircuit interruption device 10. As is understood from anarrow 65 that is depicted inFIGS. 2 and 6, thecircuit interruption device 10 itself obstructs a view from theexterior 18 of theshutter assembly 24 in its undeployed state. Improvements therefore would be desirable. - An improved
test apparatus 4 that is usable with theswitchgear cabinet 6 meets these and other shortcomings known in the relevant art. Thetest apparatus 4 is structured to mimic the operation of thecircuit interruption device 10 being received in theinterior 12 of theswitchgear cabinet 10 by providing a number of structures such as anengagement wall 78 that engages theshutter assembly 24 and moves it from its deployed state to its undeployed state. Theengagement wall 78 in the test apparatus has a number ofopenings 86 formed therein that permit theelectrical conductors 22 and the relevant portions of theshutter assembly 24 to be viewed from theexterior 18 of theswitchgear cabinet 6. - Accordingly, an aspect of the disclosed and claimed concept is to provide an improved test apparatus that is usable with a switchgear cabinet and which permits the operation of a shutter assembly in moving between deployed and undeployed states to be observed from the exterior of the switchgear cabinet.
- Another aspect of the disclosed and claimed concept is to provide an improved test apparatus that is usable with a switchgear cabinet in place of a circuit interruption device and that permits the operation of a shutter assembly that otherwise would be blocked from view by a circuit interruption device to instead be observable from the exterior of the switchgear cabinet.
- Accordingly, an aspect of the disclosed and claimed concept is to provide an improved test apparatus that is usable with a switchgear cabinet, the switchgear cabinet having an interior and having an access port through which a circuit interruption device is receivable into the interior from the exterior of the cabinet, the switchgear cabinet having a number of electrical conductors and a shutter assembly that are situated within the interior, the shutter assembly being operable to move the shutter assembly between a deployed state and an undeployed state responsive to the shutter assembly being engaged by the circuit interruption device, the shutter assembly in the deployed state being in a condition covering the number of electrical conductors and resisting the number of electrical conductors from being visually observed through the access port from a location situated at an exterior of the switchgear cabinet, the shutter assembly in the undeployed state being in another condition uncovering the number of electrical conductors. The test apparatus can be generally stated as including a frame that can be generally stated as including at least a first wall having a number of openings formed therein, the frame being movable between a first position disengaged from the mechanism and a second position received at least partially in the interior and engaged with the mechanism to move the shutter assembly between the deployed state and the undeployed state and to thereby move the shutter assembly between the condition covering the number of electrical conductors and the another condition uncovering the number of electrical conductors, the number of openings in the second position at least partially overlying the number of electrical conductors and permitting the electrical conductors to be visually observed through the number of openings and through the access port from a location situated at the exterior of the switchgear cabinet.
- A further understanding of the disclosed and claimed concept can be gained from the following Description when read in conjunction with the accompanying drawings in which:
-
FIG. 1 is a depiction of a circuit interruption device situated on a support of a switchgear cabinet with the support being in an extended position and with a shutter assembly of the switchgear cabinet being in a deployed state; -
FIG. 2 is a view similar toFIG. 1 , except depicting the circuit interruption device at least partially received in an interior of the switchgear cabinet and depicting for reasons of clarity a portion of the support having been removed; -
FIG. 3 is a sectional view as taken along line 3-3 ofFIG. 2 ; -
FIG. 4 is a depiction of the shutter assembly ofFIG. 1 in the deployed state; -
FIG. 5 is a view similar toFIG. 4 , except depicting the shutter assembly in an undeployed state; -
FIG. 6 is a view similar toFIG. 2 , except depicting the circuit interruption device fully advanced into the interior and depicting the shutter assembly in the undeployed state ofFIG. 5 and with a number of electrical conductors of the switchgear cabinet being received through a plurality of aligned first and second holes formed in the shutter assembly; -
FIG. 7 is a sectional view as taken along line 7-7 ofFIG. 6 ; -
FIG. 8 is another view of the switchgear cabinet ofFIG. 1 , except additionally depicting an improved test apparatus in accordance with the disclosed and claimed concept being spaced from the support; -
FIG. 9 is a view similar toFIG. 8 , except depicting the test apparatus received on the support of the switchgear cabinet; -
FIG. 10 is a view similar toFIG. 9 , except depicting the test apparatus at least partially situated in the interior of the switchgear cabinet and depicting for reasons of clarity a portion of the support having been removed; -
FIG. 11 is a sectional view as taken along line 11-11 ofFIG. 10 ; -
FIG. 12 is an enlarged view of the indicated portion ofFIG. 10 ; -
FIG. 13 is a view similar toFIG. 10 , except depicting the test apparatus fully advanced along the interior of the switchgear cabinet and depicting the shutter assembly in the same undeployed state as is depicted inFIG. 5 with the electrical conductors being received through aligned first and second holes of the shutter assembly; and -
FIG. 14 is a sectional view as taken along line 14-14 ofFIG. 13 . - Similar numerals refer to similar parts throughout the specification.
- An improved
test apparatus 4 in accordance with the disclosed and claimed concept is depicted inFIGS. 8-14 . Thetest apparatus 4 is usable with theswitchgear cabinet 6 that is depicted inFIGS. 1-7 , for example, and advantageously permits the operation of theshutter assembly 24 and its physical interaction with theelectrical conductors 22 to be observed from theexterior 18 of theswitchgear cabinet 6. In effect, thetest apparatus 4 is configured to take the place of thecircuit interruption device 10 which, for the reasons set forth above, obstructs a view of theshutter assembly 24 and theelectrical conductors 22 from the exterior through theaccess port 16. As will be set forth in greater detail below, thetest apparatus 4 advantageously engages theshutter assembly 24 in the same fashion as would thecircuit interruption device 10, except that thetest apparatus 4 is advantageously configured to not obstruct theshutter assembly 24 and theelectrical conductors 22 and rather advantageously permits them and their operation to be observed from theexterior 18 of theswitchgear cabinet 6. - As can be understood from
FIGS. 8 and 9 , thetest apparatus 4 can be said to include aframe 66 that includes abase 70 and awall apparatus 72. Thetest apparatus 4 further includes adrive mechanism 76 that is situated on thebase 70 and that is cooperable with thestructure 64 of theswitchgear cabinet 6 to permit thetest apparatus 4 to be advanced into the interior 12 and to operate theshutter assembly 24 between the deployed and undeployed states in a fashion similar to the way in which thedrive system 54 of thecircuit interruption device 10 advanced it to cause the change in state of theshutter assembly 24. - The
wall apparatus 72 is situated on thebase 70 and includes anengagement wall 78 and a pair ofsidewalls engagement wall 78 has a plurality ofopenings 86 formed therein which can be said to overlie theelectrical conductors 22 and the aligned first andsecond holes test apparatus 4 is fully advanced into theswitchgear cabinet 6 and has engaged theshutter assembly 24 and moved it to its undeployed state. - The
wall apparatus 72 further includes alug apparatus 88 that includes a pair oflugs sidewalls lugs rails support 52 and thus support thetest apparatus 4 on thesupport 52 during movement of thesupport 52 between the extended and retracted positions, such as is depicted inFIGS. 8-10 and 13 . It is noted that therail 56A is removed fromFIGS. 10 and 13 for reasons of clarity. Thelugs rails - The
drive mechanism 76 includes anarm 92 that is pivotably situated on thebase 70 and further includes alock 94 that is depicted inFIG. 12 as including a plunger that is movable between a locked position that is depicted in solid lines and an unlocked position that is depicted in dashed lines inFIG. 12 . Theplunger 95 in the locked position is received in a receptacle 96 (FIG. 13 ), and in so doing thelock 94 retains thearm 92 in a disengaged position such as is depicted generally inFIGS. 8-12 . As can be understood fromFIGS. 11 and 14 , thedrive mechanism 76 further includes a crank 97 that is mechanically connected with and operated by thearm 92 and that is pivotable with respect to thebase 70. Thecrank 97 is pivotable to move apin 98 of thedrive mechanism 76 that is situated on the free end of thecrank 97 between a first position disengaged from thenotch 63 formed on thestructure 64 and a second position engaged with thenotch 63. When thelock 94 is in the locked position ofFIGS. 8-10 and 12 , theplunger 95 is received in the receptacle 96, and thepin 98 remains in a condition unreceived in thenotch 63. However, when theplunger 95 is moved to the unlocked position that is depicted in dashed lines inFIG. 12 , theplunger 95 is withdrawn from the receptacle 96, and thearm 92 can be pivoted with respect to the base 70 from the disengaged position that is depicted generally inFIGS. 8-12 to an engaged position that is depicted generally inFIGS. 13-14 . In the depicted exemplary embodiment, theplunger 95 is spring-biased toward the locked position that is depicted in solid lines. - When the
arm 92 is pivoted from the disengaged position depicted generally inFIGS. 10-11 to the engaged position depicted generally inFIGS. 13-14 , the engagement of thepin 98 with thenotch 63 formed in thestructure 64 causes theengagement wall 78 and the base 70 to engage theabutments push bar 46 in a fashion similar to the way in which thecircuit interruption device 10 engages theabutments push bar 46 when it is situated on thesupport 52 and is being advanced along the interior 12. That is, theengagement wall 78 mechanically engages theabutments push bar 46, and such mechanical engagement between the structures of thetest apparatus 4 and the corresponding engaged structures of theshutter assembly 24 causes theshutter assembly 24 to be moved to its undeployed state. As mentioned elsewhere herein, the first andsecond holes second holes shutter assembly 24. Since theopenings 86 formed in theengagement wall 78 are aligned with theelectrical conductors 22 and the aligned first andsecond holes shutter assembly 24 in moving between the deployed and undeployed states can be observed through theopenings 86 from theexterior 18 of theswitchgear cabinet 6 and through theaccess port 16. The interplay between theshutter assembly 24 and theelectrical conductors 22 can likewise be observed. That is, theshutter assembly 24 can be visually observed moving between the deployed and undeployed states, and theelectrical conductors 22 can be observed being received in the aligned pairs of first andsecond holes openings 86 from theexterior 18 of theswitchgear cabinet 6 and through theaccess port 16. - It thus can be seen that the
test apparatus 4 with itsopenings 86 formed therein advantageously permits theshutter assembly 24 and theelectrical conductors 22 to be observed from theexterior 18 of theswitchgear cabinet 6, which enables problems with theswitchgear cabinet 6 to be identified prior to thecircuit interruption device 10 being racked into the interior 12, thereby avoiding greater damage to theswitchgear cabinet 6. Additionally, the proper functioning of theshutter assembly 24 and its proper cooperation with theelectrical conductors 22 can likewise be observed, which advantageously reduces the risk to nearby personnel due to possible electrical shorts within the interior 12 such as might be occasioned by switching thecircuit interruption device 10 to its ON condition or by simply racking thecircuit interruption device 10 into the interior 12 if theshutter assembly 24 or theelectrical conductors 22 were not working or cooperating properly. Theimproved test apparatus 4 is inexpensive to manufacture and functions in the same way as thecircuit interruption device 10 being received in the interior 12 and becoming engaged with theshutter assembly 24. Thetest apparatus 4 thus advantageously provides a low cost system for checking the operation of theswitchgear cabinet 6. Other advantageous will be apparent. - While specific embodiments of the disclosed concept have been described in detail, it will be appreciated by those skilled in the art that various modifications and alternatives to those details could be developed in light of the overall teachings of the disclosure. Accordingly, the particular arrangements disclosed are meant to be illustrative only and not limiting as to the scope of the disclosed concept which is to be given the full breadth of the claims appended and any and all equivalents thereof.
Claims (6)
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US14/955,185 US9671425B1 (en) | 2015-12-01 | 2015-12-01 | Testing apparatus usable in switchgear cabinet |
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US14/955,185 US9671425B1 (en) | 2015-12-01 | 2015-12-01 | Testing apparatus usable in switchgear cabinet |
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US9671425B1 US9671425B1 (en) | 2017-06-06 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6205017B1 (en) * | 2000-01-21 | 2001-03-20 | Eaton Corporation | Switchgear assembly with front accessible slide-in fixed power switch |
US7141747B2 (en) * | 2004-12-06 | 2006-11-28 | Siemens Aktiengesellschaft | Switching apparatus having a withdrawable-part rack and a lockable power circuit breaker |
US7903393B2 (en) * | 2003-09-11 | 2011-03-08 | Siemens Aktiengesellschaft | Lockable shutter for withdrawable racks of low-voltage power circuit breakers |
US20160036204A1 (en) * | 2013-03-14 | 2016-02-04 | Schneider Electric USA, Inc. | Independent shutter system for rack-in breakers |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4202028A (en) | 1978-11-27 | 1980-05-06 | General Electric Company | Ground and test apparatus with indicia means |
-
2015
- 2015-12-01 US US14/955,185 patent/US9671425B1/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6205017B1 (en) * | 2000-01-21 | 2001-03-20 | Eaton Corporation | Switchgear assembly with front accessible slide-in fixed power switch |
US7903393B2 (en) * | 2003-09-11 | 2011-03-08 | Siemens Aktiengesellschaft | Lockable shutter for withdrawable racks of low-voltage power circuit breakers |
US7141747B2 (en) * | 2004-12-06 | 2006-11-28 | Siemens Aktiengesellschaft | Switching apparatus having a withdrawable-part rack and a lockable power circuit breaker |
US20160036204A1 (en) * | 2013-03-14 | 2016-02-04 | Schneider Electric USA, Inc. | Independent shutter system for rack-in breakers |
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