US20160238759A1 - Near infrared optical interference filters with improved transmission - Google Patents
Near infrared optical interference filters with improved transmission Download PDFInfo
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- US20160238759A1 US20160238759A1 US15/046,889 US201615046889A US2016238759A1 US 20160238759 A1 US20160238759 A1 US 20160238759A1 US 201615046889 A US201615046889 A US 201615046889A US 2016238759 A1 US2016238759 A1 US 2016238759A1
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- 230000005540 biological transmission Effects 0.000 title abstract description 15
- 230000003287 optical effect Effects 0.000 title description 15
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 87
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 83
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 81
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 54
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 34
- 239000003989 dielectric material Substances 0.000 claims abstract description 24
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 17
- 229910052681 coesite Inorganic materials 0.000 claims abstract 7
- 229910052906 cristobalite Inorganic materials 0.000 claims abstract 7
- 229910052682 stishovite Inorganic materials 0.000 claims abstract 7
- 229910052905 tridymite Inorganic materials 0.000 claims abstract 7
- 229910020286 SiOxNy Inorganic materials 0.000 claims abstract 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 40
- 239000010703 silicon Substances 0.000 claims description 40
- 229910052710 silicon Inorganic materials 0.000 claims description 38
- 239000000758 substrate Substances 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 35
- 239000007789 gas Substances 0.000 claims description 33
- 230000008569 process Effects 0.000 claims description 27
- 239000001257 hydrogen Substances 0.000 claims description 25
- 229910052739 hydrogen Inorganic materials 0.000 claims description 25
- 238000004544 sputter deposition Methods 0.000 claims description 25
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 23
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 17
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 17
- 150000003376 silicon Chemical class 0.000 claims description 15
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 11
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Chemical compound O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims description 11
- 239000001301 oxygen Substances 0.000 claims description 11
- 229910052760 oxygen Inorganic materials 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 229910052786 argon Inorganic materials 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims description 6
- 239000011261 inert gas Substances 0.000 claims description 6
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 6
- 230000007423 decrease Effects 0.000 abstract description 4
- 238000000151 deposition Methods 0.000 description 16
- 239000000463 material Substances 0.000 description 15
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 15
- 230000008021 deposition Effects 0.000 description 12
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 8
- 238000013461 design Methods 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 238000005984 hydrogenation reaction Methods 0.000 description 6
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 5
- 238000013459 approach Methods 0.000 description 4
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- 238000010521 absorption reaction Methods 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
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- 150000002431 hydrogen Chemical class 0.000 description 2
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- 230000004297 night vision Effects 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 2
- 230000010363 phase shift Effects 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910003202 NH4 Inorganic materials 0.000 description 1
- -1 Ta2O5 Chemical compound 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
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- 150000001875 compounds Chemical class 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000000521 electronic sputter etching Methods 0.000 description 1
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- 239000011159 matrix material Substances 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
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- 239000010409 thin film Substances 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- G02B5/20—Filters
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- G02B5/281—Interference filters designed for the infrared light
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
Definitions
- the following relates to the optical arts, optical filter arts, and related arts.
- a known transmission interference filter employs a stack of alternating silicon and silicon dioxide (SiO 2 ) layers. Such devices are known for use in the short wave and mid wave infrared down to about 1100 nm, as both silicon and SiO 2 are transparent in this range.
- the lower wavelength threshold (corresponding to the upper photon energy threshold) is controlled by the onset of absorption by the silicon, which in its crystalline form has a bandgap of about 1.12 eV.
- a key advantage of silicon in these devices is its high refractive index.
- the spectral profile of an optical interference filter is, among other things, dependent on the angle of illumination. As the angles increase the filters shift to shorter wavelength. This angular shift is dependent on the materials used and the distribution of those materials. Higher refractive index results in less angle shift.
- the amount of angle shift limits the useful bandwidth of the filter when used in optical systems.
- a filter constructed such as to yield low angular shift can have a narrower passband and hence greater noise rejection than one constructed of materials with lower refractive index.
- an interference filter including a layers stack comprising plurality of layers of at least: layers of amorphous hydrogenated silicon with added nitrogen (a-Si:H,N) and layers of one or more dielectric materials having a refractive index lower than the refractive index of the a-Si:H,N.
- the one or more dielectric materials may include, by way of non-limiting example, SiO 2 , silicon suboxide (SiO x ), and/or silicon oxynitride (SiO x N y ).
- the one or more dielectric materials include layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive.
- the a-Si:H,N has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
- the layers stack may be supported by a transparent substrate, such as a glass substrate.
- an interference filter in another illustrative aspect disclosed herein, includes a layers stack comprising alternating a-Si:H,N and silicon based dielectric layers, in which the interference filter has at least one passband with center wavelength in the range 750 1100 nm inclusive, or more preferably in the range 800-1100 nm inclusive.
- the silicon based dielectric layers may comprise, by way of non-limiting example, silicon oxide (SiO x ) layers and/or silicon oxynitride (SiO x N y ) layers.
- the a-Si:H,N has an atomic concentration between 4% and 8% hydrogen and between 2% and 12% nitrogen.
- the layers stack may be supported by a transparent substrate, such as a glass substrate.
- a method of manufacturing an interference filter comprising alternating a-Si:H,N and SiO x layers.
- the method comprises sputtering silicon from a silicon target onto a filter substrate and, during the sputtering, alternating between (i) a process gas including hydrogen and nitrogen in order to deposit a Si:H,N and (ii) a process gas including oxygen in order to deposit SiOx.
- the sputtering may comprise applying a negative bias to the silicon target, and including an inert gas component in both the process gas including hydrogen and nitrogen and the process gas including oxygen.
- the inert gas may, for example, be argon.
- interference filters manufactured by this process are also disclosed.
- an interference filter in another illustrative aspect disclosed herein, includes a layers stack comprising plurality of layers of at least layers of amorphous hydrogenated silicon and layers of one or more dielectric materials having a refractive index lower than the refractive index of the amorphous hydrogenated silicon, including layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive.
- the layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive include one or more layers comprising Si 3 N 4 , SiO x N y with y large enough to provide a refractive index of 1.9 or higher, Ta 2 O 5 , Nb 2 O 5 , or TiO 2 .
- the layers stack includes at least one SiO 2 layer immediately adjacent a layer of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive with no intervening layer of amorphous hydrogenated silicon.
- the amorphous hydrogenated silicon includes nitrogen.
- the amorphous hydrogenated silicon including nitrogen has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
- FIG. 1 diagrammatically shows a sputter deposition system for fabricating near infrared optical interference filters with improved transmission and/or reduced angular shift as disclosed herein.
- FIG. 2 diagrammatically shows the impact of hydrogenation on the optical properties (transmission and refractive index) of amorphous hydrogenated silicon (a-Si:H).
- FIG. 3 diagrammatically shows the impact of nitrogen additive on the optical properties (transmission and refractive index) of a-Si:H of fixed hydrogenation level.
- FIG. 4 diagrammatically shows an interference filter suitably manufactured using the sputter deposition system of FIG. 1 .
- an interference filter comprising a stack of layer units with hydrogenated silicon (a-Si:H) layers is used for operation in the near infrared (800-1250 nm), because the hydrogenation of the silicon decreases the absorption losses (both from intrinsic silicon and disorder induced) sufficiently to provide acceptable filter transmission characteristics in the passband.
- a-Si:H hydrogenated silicon
- narrow band interference filters for high numerical aperture optical systems is a compromise between obtaining high transmission with the low angle shift in the near infrared region where the material characteristics are changing rapidly.
- High transmission corresponds to low extinction coefficient (obtainable with high amounts of hydrogen) while small angle shift is achieved by high refractive index (obtainable with small amounts of hydrogen).
- the disclosed improvement pertains to adding a controlled amount of nitrogen to the a-Si:H layers of Si-based interference filters for use in the near-infrared (800-1100 nm). Said another way, this improvement entails substituting a-Si:H,N for a-Si:H.
- adding nitrogen increases the transmission with a reduced concomitant reduction in refractive index.
- the impact of adding nitrogen on the refractive index is much less than the impact of hydrogenation, especially for nitrogen fractions in the range of 10% nitrogen or lower. Accordingly, this modification enables fabrication of near-infrared interference filters operating in the range 800-1100 nm with improved control of the angular shift, peak transmission and filter bandwidth.
- substituting a-Si:H,N for a-Si:H can provide improved transmission in the passband.
- substituting a-Si:H,N for a-Si:H enables fabrication of near-infrared interference filters with improved transmission in the passband as compared with equivalent a-Si:H-based device having the same refractive index step (and hence the same spectral passband width).
- the inventors have found that in this design paradigm the practical operational range of such filters can be extended down to 750 nm.
- the spectral range encompassed by the disclosed a-Si:H,N based interference filters encompasses passbands of technological importance, such as the 850 nm optical data communications window.
- the angular shift results from the light ray path length through a layer increasing with increasing angular deviation away from normal incidence. This increase in path length corresponds to a change in the phase retardation, which affects constructive/destructive interference so as to introduce the angle shift.
- d L the normal incidence path length through a layer
- d′ L d L /cos( ⁇ L ).
- d L ′ d L / 1 - ( ⁇ n L ) 2 .
- the high refractive index layers are a-Si:H (which could be replaced by a-Si:H,N as disclosed herein) while silicon dioxide (SiO 2 having n ⁇ 1.4-1.5) serves as the low refractive index layers.
- silicon dioxide SiO 2 having n ⁇ 1.4-1.5
- the substitute layer is a dielectric layer that has a refractive index in the range 1.9 to 2.7 inclusive.
- Si-compatible materials providing these values include silicon nitride (Si 3 N 4 having n ⁇ 2.0-2.2), silicon oxynitride (SiO x N y with y large enough to provide a refractive index of 1.9 or higher), tantalum pentoxide (Ta 2 O 5 having n ⁇ 2.1-2.2), niobium pentoxide (Nb 2 O 5 having n ⁇ 2.3-2.4), or titanium dioxide (TiO 2 having n ⁇ 2.6).
- silicon nitride (Si 3 N 4 ) is used.
- the high index a-Si:H or a-Si:H,N layer should have hydrogen (and optionally nitrogen) content sufficient to provide the desired refractive index contrast with the low index layers.
- Optical design software e.g. a ray tracing simulator
- a ray tracing simulator can be used to optimize layer placement and thicknesses for materials with known refractive index in order to achieve desired center band, bandwidth, and angle shift design basis characteristics.
- the illustrative system employs sputter deposition—however, other deposition methods are contemplated, such as vacuum evaporation, electron-beam evaporation, or so forth. In general, either a.c. or d.c. sputtering may be used.
- the illustrative sputter deposition system includes a process chamber 10 containing a sputter target holder 12 and a substrate carousel 14 .
- a silicon target 16 e.g. silicon wafer 16
- One or more substrates 20 are loaded into the substrate carousel 14 .
- the substrate(s) 20 are suitably of a material, such as glass, silica, or alumina, that is transparent in the wavelength range of interest (e.g. 800-1000 nm, or 750-1000 nm).
- sputter deposition energetic particles are directed toward the target 16 (in this case a silicon target 16 ), which particles have sufficient energy to remove (i.e. “sputter”) material off the target, which then transfers (ballistically and/or under the influence of a magnetic or electric field) to the surface of the substrate(s) 20 so as to coat the substrates 20 with the sputtered material.
- the illustrative sputter deposition system employs argon (Ar) gas from an illustrative Ar gas bottle 22 or from another argon source as the energetic particles.
- the substrate(s) 20 are biased more positively as compared with the target 16 , e.g. the substrate(s) 20 are grounded in the illustrative sputter system of FIG. 1 .
- the target 16 is the cathode
- the chamber 10 (and/or the substrate(s) 20 , e.g. in some embodiments the substrate carousel 14 may be grounded) is the anode, of an electric circuit.
- argon is the sputtering gas in the illustrative embodiment, other inert gases that can be ionized could be alternatively used, such as xenon.
- an oxygen (O 2 ) bottle 24 or other oxygen source is provided.
- a hydrogen (H 2 ) bottle 26 or other hydrogen source for example, ammonia, NH 4 , or silane, SiH 4
- a nitrogen (N 2 ) bottle 30 or other nitrogen source are provided.
- a (diagrammatically indicated) gas inlet manifold 32 is provided in order to admit a desired gas mixture into the process chamber 10 during the sputter deposition process.
- Flow regulators 34 are adjustable to set the flow of Ar, O 2 , H 2 , and N 2 , respectively.
- the process chamber 10 is also connected with a suitable exhaust 36 (e.g.
- Suitable nitrogen gas sources include ammonia (NH 4 ) or hydrazine (N 2 H 4 ).
- NH 4 ammonia
- N 2 H 4 hydrazine
- calibrations should be performed to account for the relative incorporation of nitrogen and hydrogen into the a-Si:H,N layer.
- Process parameters such as substrate temperature, target bias ( ⁇ V), process chamber pressure, total flow rate, and so forth may impact relative incorporate of nitrogen versus hydrogen.
- Two valves VA, VB are provided to switch between depositing SiO 2 and a-Si:H,N.
- valve VA controls admission of oxygen from the oxygen source 24 into the gas inlet manifold 32
- valve VB controls admission of the hydrogen/nitrogen mixture from the hydrogen and nitrogen sources 26 , 30 .
- the valves VA, VB are automated valves whose actuators are controlled by an electronic sputtering controller 40 in accordance with a filter recipe 42 .
- the sputtering controller 40 may comprise digital-to-analog (D/A) converters, a high voltage source, and a microprocessor or microcontroller programmed to operate the D/A converters generate electrical actuation signals to open or close respective valves VA, VB in accordance with the filter recipe 42 and to operate the voltage source to apply the voltage ⁇ V to the target/cathode 16 .
- D/A digital-to-analog
- VA digital-to-analog
- VB high voltage source
- a microprocessor or microcontroller programmed to operate the D/A converters generate electrical actuation signals to open or close respective valves VA, VB in accordance with the filter recipe 42 and to operate the voltage source to apply the voltage ⁇ V to the target/cathode 16 .
- a lower right-hand inset table 50 shown in FIG. 1 summarizes the settings for valves VA, VB to deposit SiO 2 and a-Si:H,N, respectively. To deposit SiO 2 the valve VA is open
- the resulting process gas is an argon/oxygen mixture.
- the valve VA is closed to block the oxygen and the valve VB is opened to admit process gas comprising an argon/hydrogen/nitrogen mixture to the gas inlet manifold 32 .
- the argon source 22 is connected to the gas inlet manifold 32 independently from the valves VA, VB.
- Separate manually operable shut-off valves are typically provided for each gas source 22 , 24 , 26 , 30 to enable manual shut-off of each gas source independently from the automatic valves VA, VB.
- additional gas sources may be provided along with suitable valving.
- an additional nitrogen (N 2 ) bottle 25 or other nitrogen source are provided, controlled by a valve VC, in order to deposit silicon nitride (Si 3 N 4 ) layers.
- Si 3 N 4 silicon nitride
- deposition of Si 3 N 4 is obtained when valve VC is open and both valves VA and VB are closed.
- the silicon component of the silicon nitride is supplied by the silicon-based sputtering target 20 .
- the desired stoichiometry is set by the flow regulator on the nitrogen bottle 25 using suitable calibration runs.
- the target holder 12 may have multiple target slots which are loaded with a silicon target and also another slot loaded with a suitable target containing, e.g., tantalum, niobium, or titanium, for use in depositing the non-silicon containing dielectric layers.
- a suitable target containing e.g., tantalum, niobium, or titanium
- the tantalum, niobium, titanium, et cetera may be provided by a gas source or other source.
- Sputter deposition is initiated by flowing the appropriate process gas via the gas inlet manifold 32 and applying the cathode bias ⁇ V to the target 16 in order to ionize Ar atoms which are driven by the electric field to sputter silicon off the silicon target 16 .
- the particular startup sequence depends upon the particular sputter deposition system and other design considerations: for example, in one approach the process gas flow is first initiated and then the cathode bias ⁇ V is applied to initiate sputter deposition; alternatively, the bias can be applied under an inert gas flow and sputter deposition initiated by admitting the appropriate process gas.
- valves VA and VB are opened and closed in accord with the filter recipe 42 and the valve settings of table 50 in order to alternate between depositing SiO 2 (and/or optionally Si 3 N 4 ) and a-Si:H,N layers.
- the layer thicknesses are controlled based on deposition time and a priori knowledge of deposition rates obtained from calibration depositions.
- Layer compositions are determined based on the process gas mixture controlled by the settings of the flow regulators 34 which are set based on calibration depositions (such calibration deposition should also include process parameters such as substrate temperature, target bias ( ⁇ V), chamber pressure, and total flow rate in the calibration test matrix, as such parameters may also impact layer composition).
- process gas flow and the bias voltage ⁇ V are removed (again, the particular shutdown sequence depends upon the particular deposition system and so forth), the process chamber 10 is brought up to atmospheric pressure, opened, and the coated substrates 20 are unloaded.
- the filter includes the substrate 102 (e.g. the glass, silica, or alumina substrate initially loaded onto the substrate carousel 14 ) and alternating layers of a-Si:H,N 104 and SiO 2 106 and/or Si 3 N 4 108 .
- the layer immediately adjacent the substrate 102 is an a-Si:H,N layer 104 , but in other embodiments a dielectric layer may be immediately adjacent the substrate.
- the topmost layer is an a-Si:H,N layer 104 , but in other embodiments a dielectric layer may be the topmost layer.
- the illustrative stack includes an instance of immediately adjacent SiO 2 /Si 3 N 4 layers, which may be included if in accord with the design.
- the illustrative interference filter 100 includes layer stacks 110 , 112 on opposite sides of the substrate 102 —to manufacture such a device, the sputtering chamber may need to be opened and the substrates “flipped over” on the substrate carousel 14 . (Alternatively, the substrate carousel 14 may be configured to enable such a maneuver to be performed robotically without breaking open the chamber).
- Such a filter with two filter sides 110 , 112 may, for example, be a passband filter in which the stack on one side is a high-pass filter and the stack on the other side is a low-pass filter—a passband is then defined by a wavelength range that is both above the high pass filter cut-off and below the low-pass filter cutoff.
- a known application of this kind of filter is in applications using silicon detectors. These wavelengths are particularly useful in active devices, in which a light source as well as a detector are present. In this spectral region, LEDs and lasers are readily available which are inexpensive, plentiful and efficient. Some major applications include, but are not limited to, infrared gesture controls of human-machine (e.g. computer) interaction, infrared night vision for automobiles, LIDAR, infrared night vision for security cameras and proximity CMOS sensors used in mobile phone and elsewhere. In these applications the useful wavelength is between 700 and 1100 nm. In this range the a-Si:H,N is a high index material suitable for optical applications.
- the a-Si:H,N layers includes between 2% and 8% hydrogen and between 3%-7% nitrogen with the balance being Si. In general, more hydrogen and nitrogen contents provide shorter wavelength operation. In general, nitrogen concentrations as high as 6% to 12% are contemplated.
- the a-Si:H,N layers 104 alternate with SiO 2 layers 106 .
- SiO 2 has advantageous properties for this purpose, including good chemical compatibility with a-Si:H,N and a low refractive index (n ⁇ 1.5) which provides a large refractive index step at the interface with a-Si:H,N.
- the dielectric may not have exact SiO 2 stoichiometry, e.g. the SiO 2 may be replaced by SiO x where x is not precisely two (also referred to herein as “silicon suboxide”).
- a silicon oxynitride (SiO x N y ) layer is contemplated as the dielectric layer in place of SiO 2 .
- SiO x N y silicon oxynitride
- the refractive index of increases with nitrogen content for example, stoichiometric silicon nitride (Si 3 N 4 ) has a refractive index of about 2.0.
- a small amount of nitrogen that is, SiO x N y where x ⁇ 2 and x>>y
- These compounds offer index tailoring that permit the construction of novel material combinations and continuously varying refractive index profiles.
- the thicknesses of the constituent layers are chosen such that, for the design-basis passband center wavelength, the optical path lengths through each layer and reflected at its interface with the next layer constructively combine, that is, are integer multiples of the wavelength.
- the illustrative interference filters include repeating units of two layers, it is contemplated to incorporate three or more layers into the repeating unit, such as an a-Si:H,N layer and two different dielectric layers, to achieve desired passband properties (e.g. center wavelength, FWHM, “flatness” of the passband, et cetera).
- desired passband properties e.g. center wavelength, FWHM, “flatness” of the passband, et cetera.
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Abstract
An interference filter includes a layers stack comprising a plurality of layers of at least: layers of amorphous hydrogenated silicon with added nitrogen (a-Si:H,N) and layers of one or more dielectric materials, such as SiO2, SiOx, SiOxNy, a dielectric material with a higher refractive index in the range 1.9 to 2.7 inclusive, or so forth. The interference filter is designed to have a passband center wavelength in the range 750-1000 nm inclusive. Added nitrogen in the a-Si:H,N layers provides improved transmission in the passband without a large decrease in refractive index observed in a-Si:H with comparable transmission. Layers of a dielectric material with a higher refractive index in the range 1.9 to 2.7 inclusive provide a smaller angle shift compared with a similar interference filter using SiO2 as the low index layers.
Description
- This application claims the benefit of U.S. Provisional Application No. 62/117,598 filed Feb. 18, 2015 and titled “NEAR INFRARED OPTICAL INTERFERENCE FILTERS WITH IMPROVED TRANSMISSION”. U.S. Provisional Application No. 62/117,598 filed Feb. 18, 2015 is incorporated herein by reference in its entirety.
- The following relates to the optical arts, optical filter arts, and related arts.
- A known transmission interference filter employs a stack of alternating silicon and silicon dioxide (SiO2) layers. Such devices are known for use in the short wave and mid wave infrared down to about 1100 nm, as both silicon and SiO2 are transparent in this range. The lower wavelength threshold (corresponding to the upper photon energy threshold) is controlled by the onset of absorption by the silicon, which in its crystalline form has a bandgap of about 1.12 eV. A key advantage of silicon in these devices is its high refractive index. The spectral profile of an optical interference filter is, among other things, dependent on the angle of illumination. As the angles increase the filters shift to shorter wavelength. This angular shift is dependent on the materials used and the distribution of those materials. Higher refractive index results in less angle shift. For narrow band filters the amount of angle shift limits the useful bandwidth of the filter when used in optical systems. In systems with large angular acceptance angles a filter constructed such as to yield low angular shift can have a narrower passband and hence greater noise rejection than one constructed of materials with lower refractive index.
- To extend device operation into the near infrared, it is further known to hydrogenate the silicon, so as to employ alternating layers of hydrogenated amorphous silicon (a-Si:H) and SiO2. By hydrogenating the silicon, the material loss and refractive index are reduced. By this approach, very high performance interference filters operating in the 800-1000 nm range are achievable.
- Some improvements are disclosed herein.
- In one illustrative aspect disclosed herein, an interference filter is disclosed, including a layers stack comprising plurality of layers of at least: layers of amorphous hydrogenated silicon with added nitrogen (a-Si:H,N) and layers of one or more dielectric materials having a refractive index lower than the refractive index of the a-Si:H,N. The one or more dielectric materials may include, by way of non-limiting example, SiO2, silicon suboxide (SiOx), and/or silicon oxynitride (SiOxNy). In some embodiments, the one or more dielectric materials include layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive. In some embodiments the a-Si:H,N has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen. The layers stack may be supported by a transparent substrate, such as a glass substrate.
- In another illustrative aspect disclosed herein, an interference filter includes a layers stack comprising alternating a-Si:H,N and silicon based dielectric layers, in which the interference filter has at least one passband with center wavelength in the range 750 1100 nm inclusive, or more preferably in the range 800-1100 nm inclusive. The silicon based dielectric layers may comprise, by way of non-limiting example, silicon oxide (SiOx) layers and/or silicon oxynitride (SiOxNy) layers. In some embodiments the a-Si:H,N has an atomic concentration between 4% and 8% hydrogen and between 2% and 12% nitrogen. The layers stack may be supported by a transparent substrate, such as a glass substrate.
- In another illustrative aspect disclosed herein, a method of manufacturing an interference filter comprising alternating a-Si:H,N and SiOx layers is disclosed. The method comprises sputtering silicon from a silicon target onto a filter substrate and, during the sputtering, alternating between (i) a process gas including hydrogen and nitrogen in order to deposit a Si:H,N and (ii) a process gas including oxygen in order to deposit SiOx. The sputtering may comprise applying a negative bias to the silicon target, and including an inert gas component in both the process gas including hydrogen and nitrogen and the process gas including oxygen. The inert gas may, for example, be argon. Also disclosed are interference filters manufactured by this process.
- In another illustrative aspect disclosed herein, an interference filter includes a layers stack comprising plurality of layers of at least layers of amorphous hydrogenated silicon and layers of one or more dielectric materials having a refractive index lower than the refractive index of the amorphous hydrogenated silicon, including layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive. In some embodiments, the layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive include one or more layers comprising Si3N4, SiOxNy with y large enough to provide a refractive index of 1.9 or higher, Ta2O5, Nb2O5, or TiO2. In some embodiments the layers stack includes at least one SiO2 layer immediately adjacent a layer of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive with no intervening layer of amorphous hydrogenated silicon. In some embodiments the amorphous hydrogenated silicon includes nitrogen. In some such embodiments the amorphous hydrogenated silicon including nitrogen has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
-
FIG. 1 diagrammatically shows a sputter deposition system for fabricating near infrared optical interference filters with improved transmission and/or reduced angular shift as disclosed herein. -
FIG. 2 diagrammatically shows the impact of hydrogenation on the optical properties (transmission and refractive index) of amorphous hydrogenated silicon (a-Si:H). -
FIG. 3 diagrammatically shows the impact of nitrogen additive on the optical properties (transmission and refractive index) of a-Si:H of fixed hydrogenation level. -
FIG. 4 diagrammatically shows an interference filter suitably manufactured using the sputter deposition system ofFIG. 1 . - As previously noted, an interference filter comprising a stack of layer units with hydrogenated silicon (a-Si:H) layers is used for operation in the near infrared (800-1250 nm), because the hydrogenation of the silicon decreases the absorption losses (both from intrinsic silicon and disorder induced) sufficiently to provide acceptable filter transmission characteristics in the passband. With brief reference to
FIG. 2 , it is recognized herein that this approach for the near-infrared has a substantial disadvantage. As seen in diagrammaticFIG. 2 , for a fixed wavelength in the infrared (e.g. in the range 800-1100 nm), increasing hydrogenation of the a-Si:H (that is to say, increasing the hydrogen content of the a-Si:H) does decrease the loss—however it also decreases the refractive index of the a-Si:H as diagrammatically depicted inFIG. 2 . - The performance of narrow band interference filters for high numerical aperture optical systems is a compromise between obtaining high transmission with the low angle shift in the near infrared region where the material characteristics are changing rapidly. High transmission corresponds to low extinction coefficient (obtainable with high amounts of hydrogen) while small angle shift is achieved by high refractive index (obtainable with small amounts of hydrogen).
- With brief reference to
FIG. 3 , the disclosed improvement pertains to adding a controlled amount of nitrogen to the a-Si:H layers of Si-based interference filters for use in the near-infrared (800-1100 nm). Said another way, this improvement entails substituting a-Si:H,N for a-Si:H. As diagrammatically shown inFIG. 3 , for a fixed wavelength in the infrared (e.g. in the range 800-1100 nm), and for a given (fixed) level of hydrogenation, adding nitrogen increases the transmission with a reduced concomitant reduction in refractive index. The impact of adding nitrogen on the refractive index is much less than the impact of hydrogenation, especially for nitrogen fractions in the range of 10% nitrogen or lower. Accordingly, this modification enables fabrication of near-infrared interference filters operating in the range 800-1100 nm with improved control of the angular shift, peak transmission and filter bandwidth. - On the other hand, for a given passband width, substituting a-Si:H,N for a-Si:H can provide improved transmission in the passband. In this approach, substituting a-Si:H,N for a-Si:H enables fabrication of near-infrared interference filters with improved transmission in the passband as compared with equivalent a-Si:H-based device having the same refractive index step (and hence the same spectral passband width). Indeed, the inventors have found that in this design paradigm the practical operational range of such filters can be extended down to 750 nm.
- The skilled artisan will recognize that the spectral range encompassed by the disclosed a-Si:H,N based interference filters encompasses passbands of technological importance, such as the 850 nm optical data communications window.
- In some interference filters applications operating in this range, another consideration is the angle shift of the passband. Conceptually, the angular shift results from the light ray path length through a layer increasing with increasing angular deviation away from normal incidence. This increase in path length corresponds to a change in the phase retardation, which affects constructive/destructive interference so as to introduce the angle shift. If the normal incidence path length through a layer is dL, then the path length though the layer at an angle θL in the material (measured off the normal, i.e. θL=0 for normal incidence) is d′L=dL/cos(θL). As θL is related to the angle-of-incidence θ of light impinging upon the interference filter according to Snell's law, and assuming the ambient is air (n=1), this leads to θL=arcsin(θ/nL) where nL is the refractive index of the layer. Using the identity cos(u)=√{square root over (1−(sin(u))2)} enables this to be written as
-
- It is thus seen that the angular shift effect is made worse by a small refractive index nL of the layer.
- In conventional interference filter design, it is typically desired to maximize the refractive index contrast between the high index layers and the low index layers. In silicon-based interference filters, the high refractive index layers are a-Si:H (which could be replaced by a-Si:H,N as disclosed herein) while silicon dioxide (SiO2 having n˜1.4-1.5) serves as the low refractive index layers. However, it is disclosed herein to obtain reduced angular shift in interference filters operating in the 750-1000 nm range by substituting a higher refractive index material for SiO2 in some or all low index layers of the interference filter. In some contemplated embodiments, the substitute layer is a dielectric layer that has a refractive index in the range 1.9 to 2.7 inclusive. Some suitable Si-compatible materials providing these values include silicon nitride (Si3N4 having n˜2.0-2.2), silicon oxynitride (SiOxNy with y large enough to provide a refractive index of 1.9 or higher), tantalum pentoxide (Ta2O5 having n˜2.1-2.2), niobium pentoxide (Nb2O5 having n˜2.3-2.4), or titanium dioxide (TiO2 having n˜2.6). In illustrative embodiments shown herein, silicon nitride (Si3N4) is used. The high index a-Si:H or a-Si:H,N layer should have hydrogen (and optionally nitrogen) content sufficient to provide the desired refractive index contrast with the low index layers.
- Moreover, to obtain a desired low angle shift for a design-specification angle it may be sufficient to replace only some SiO2 layers of the stack with the higher index dielectric material (e.g. Si3N4). Optical design software (e.g. a ray tracing simulator) can be used to optimize layer placement and thicknesses for materials with known refractive index in order to achieve desired center band, bandwidth, and angle shift design basis characteristics.
- With reference now to
FIG. 1 , a suitable manufacturing system is described. The illustrative system employs sputter deposition—however, other deposition methods are contemplated, such as vacuum evaporation, electron-beam evaporation, or so forth. In general, either a.c. or d.c. sputtering may be used. The illustrative sputter deposition system includes aprocess chamber 10 containing asputter target holder 12 and asubstrate carousel 14. For the illustrative deposition, a silicon target 16 (e.g. silicon wafer 16) is mounted in thesputter target holder 12. One ormore substrates 20 are loaded into thesubstrate carousel 14. The substrate(s) 20 are suitably of a material, such as glass, silica, or alumina, that is transparent in the wavelength range of interest (e.g. 800-1000 nm, or 750-1000 nm). - In sputter deposition, energetic particles are directed toward the target 16 (in this case a silicon target 16), which particles have sufficient energy to remove (i.e. “sputter”) material off the target, which then transfers (ballistically and/or under the influence of a magnetic or electric field) to the surface of the substrate(s) 20 so as to coat the
substrates 20 with the sputtered material. The illustrative sputter deposition system employs argon (Ar) gas from an illustrativeAr gas bottle 22 or from another argon source as the energetic particles. An ionizing electric field generated by applying a negative bias (−V) to thetarget 16 in order to ionize argon atoms which then bombard the negatively biasedtarget 16 under influence of the electric field generated by the −V voltage bias in order to produce the sputtering. The substrate(s) 20, on the other hand, are biased more positively as compared with thetarget 16, e.g. the substrate(s) 20 are grounded in the illustrative sputter system ofFIG. 1 . In this illustrative configuration, thetarget 16 is the cathode, and the chamber 10 (and/or the substrate(s) 20, e.g. in some embodiments thesubstrate carousel 14 may be grounded) is the anode, of an electric circuit. While argon is the sputtering gas in the illustrative embodiment, other inert gases that can be ionized could be alternatively used, such as xenon. - To deposit silicon dioxide, an oxygen (O2)
bottle 24 or other oxygen source is provided. To deposit amorphous hydrogenated silicon with nitrogen additive (a-Si:H,N), a hydrogen (H2)bottle 26 or other hydrogen source (for example, ammonia, NH4, or silane, SiH4) and a nitrogen (N2)bottle 30 or other nitrogen source are provided. A (diagrammatically indicated)gas inlet manifold 32 is provided in order to admit a desired gas mixture into theprocess chamber 10 during the sputter deposition process.Flow regulators 34 are adjustable to set the flow of Ar, O2, H2, and N2, respectively. Theprocess chamber 10 is also connected with a suitable exhaust 36 (e.g. with scrubbers or the like) to discharge gas from thechamber 10. It is contemplated to substitute other gas sources for the illustrative O2, H2, and N2 bottles. Other suitable nitrogen gas sources include ammonia (NH4) or hydrazine (N2H4). When using a gas source such as ammonia or hydrazine which includes both nitrogen and hydrogen, calibrations should be performed to account for the relative incorporation of nitrogen and hydrogen into the a-Si:H,N layer. Process parameters such as substrate temperature, target bias (−V), process chamber pressure, total flow rate, and so forth may impact relative incorporate of nitrogen versus hydrogen. Two valves VA, VB are provided to switch between depositing SiO2 and a-Si:H,N. The valve VA controls admission of oxygen from theoxygen source 24 into thegas inlet manifold 32, while the valve VB controls admission of the hydrogen/nitrogen mixture from the hydrogen andnitrogen sources electronic sputtering controller 40 in accordance with afilter recipe 42. For example, the sputteringcontroller 40 may comprise digital-to-analog (D/A) converters, a high voltage source, and a microprocessor or microcontroller programmed to operate the D/A converters generate electrical actuation signals to open or close respective valves VA, VB in accordance with thefilter recipe 42 and to operate the voltage source to apply the voltage −V to the target/cathode 16. A lower right-hand inset table 50 shown inFIG. 1 summarizes the settings for valves VA, VB to deposit SiO2 and a-Si:H,N, respectively. To deposit SiO2 the valve VA is open to admit oxygen to thegas inlet manifold 32 while the valve VB is closed to turn off the hydrogen and nitrogen sources. The resulting process gas is an argon/oxygen mixture. To deposit a-Si:H,N the valve VA is closed to block the oxygen and the valve VB is opened to admit process gas comprising an argon/hydrogen/nitrogen mixture to thegas inlet manifold 32. Note that theargon source 22 is connected to thegas inlet manifold 32 independently from the valves VA, VB. Separate manually operable shut-off valves (not shown) are typically provided for eachgas source - If it is further desired to substitute a higher refractive index material for some of the low index layers, additional gas sources may be provided along with suitable valving. In the illustrative system of
FIG. 1 , an additional nitrogen (N2)bottle 25 or other nitrogen source are provided, controlled by a valve VC, in order to deposit silicon nitride (Si3N4) layers. As further indicated in the table 50, deposition of Si3N4 is obtained when valve VC is open and both valves VA and VB are closed. As with deposition of SiO2, the silicon component of the silicon nitride is supplied by the silicon-basedsputtering target 20. The desired stoichiometry is set by the flow regulator on thenitrogen bottle 25 using suitable calibration runs. Although not shown inFIG. 1 , it will be appreciated that a similar setup could be used to deposit SiOxNy with refractive index of 1.9 or higher, by opening both valves VA, VC with valve VB closed. To substitute a dielectric layer that does not contain silicon (e.g. Ta2O5, Nb2O5, or TiO2), thetarget holder 12 may have multiple target slots which are loaded with a silicon target and also another slot loaded with a suitable target containing, e.g., tantalum, niobium, or titanium, for use in depositing the non-silicon containing dielectric layers. Alternatively, the tantalum, niobium, titanium, et cetera may be provided by a gas source or other source. - An illustrative interference filter fabrication process suitably performed using the fabrication system of
FIG. 1 is described next. Initially, allgas sources process chamber 10 is brought to atmospheric pressure and opened, thetarget 16 is loaded onto thetarget holder 12, and the substrate(s) 20 are loaded onto thesubstrate carousel 14. Theprocess chamber 10 is then closed and drawn down to a target vacuum level. As further setup, theflow regulators 34 are manually set to the desired flow rates. (Alternatively, it is contemplated for the flow regulators to be under automatic control of the sputteringcontroller 40, in which case the regulators are suitably set in accordance with values provided in the filter recipe). - Sputter deposition is initiated by flowing the appropriate process gas via the
gas inlet manifold 32 and applying the cathode bias −V to thetarget 16 in order to ionize Ar atoms which are driven by the electric field to sputter silicon off thesilicon target 16. The particular startup sequence depends upon the particular sputter deposition system and other design considerations: for example, in one approach the process gas flow is first initiated and then the cathode bias −V is applied to initiate sputter deposition; alternatively, the bias can be applied under an inert gas flow and sputter deposition initiated by admitting the appropriate process gas. - During sputtering, valves VA and VB (and optionally VC) are opened and closed in accord with the
filter recipe 42 and the valve settings of table 50 in order to alternate between depositing SiO2 (and/or optionally Si3N4) and a-Si:H,N layers. The layer thicknesses are controlled based on deposition time and a priori knowledge of deposition rates obtained from calibration depositions. Layer compositions are determined based on the process gas mixture controlled by the settings of theflow regulators 34 which are set based on calibration depositions (such calibration deposition should also include process parameters such as substrate temperature, target bias (−V), chamber pressure, and total flow rate in the calibration test matrix, as such parameters may also impact layer composition). After deposition of the stack of interference filter layers is completed, process gas flow and the bias voltage −V are removed (again, the particular shutdown sequence depends upon the particular deposition system and so forth), theprocess chamber 10 is brought up to atmospheric pressure, opened, and thecoated substrates 20 are unloaded. - With reference to
FIG. 4 , a diagrammatic representation of a thusly fabricatedinterference filter 100 is shown. The filter includes the substrate 102 (e.g. the glass, silica, or alumina substrate initially loaded onto the substrate carousel 14) and alternating layers of a-Si:H,N 104 and SiO2 106 and/or Si3N4 108. In theillustrative interference filter 100 the layer immediately adjacent thesubstrate 102 is an a-Si:H,N layer 104, but in other embodiments a dielectric layer may be immediately adjacent the substrate. In theillustrative interference filter 100 the topmost layer is an a-Si:H,N layer 104, but in other embodiments a dielectric layer may be the topmost layer. The illustrative stack includes an instance of immediately adjacent SiO2/Si3N4 layers, which may be included if in accord with the design. Theillustrative interference filter 100 includes layer stacks 110, 112 on opposite sides of thesubstrate 102—to manufacture such a device, the sputtering chamber may need to be opened and the substrates “flipped over” on thesubstrate carousel 14. (Alternatively, thesubstrate carousel 14 may be configured to enable such a maneuver to be performed robotically without breaking open the chamber). Such a filter with twofilter sides - A known application of this kind of filter is in applications using silicon detectors. These wavelengths are particularly useful in active devices, in which a light source as well as a detector are present. In this spectral region, LEDs and lasers are readily available which are inexpensive, plentiful and efficient. Some major applications include, but are not limited to, infrared gesture controls of human-machine (e.g. computer) interaction, infrared night vision for automobiles, LIDAR, infrared night vision for security cameras and proximity CMOS sensors used in mobile phone and elsewhere. In these applications the useful wavelength is between 700 and 1100 nm. In this range the a-Si:H,N is a high index material suitable for optical applications. The typical index in this range is 3.3˜3.5, whereas by comparison TiO2 has refractive index of only about 2.3˜2.4. In some suitable embodiments, the a-Si:H,N layers includes between 2% and 8% hydrogen and between 3%-7% nitrogen with the balance being Si. In general, more hydrogen and nitrogen contents provide shorter wavelength operation. In general, nitrogen concentrations as high as 6% to 12% are contemplated.
- In the illustrative embodiments, the a-Si:H,N layers 104 alternate with SiO2 layers 106. SiO2 has advantageous properties for this purpose, including good chemical compatibility with a-Si:H,N and a low refractive index (n˜1.5) which provides a large refractive index step at the interface with a-Si:H,N. However, it is contemplated to substitute another dielectric layer for the SiO2 layer. For example, the dielectric may not have exact SiO2 stoichiometry, e.g. the SiO2 may be replaced by SiOx where x is not precisely two (also referred to herein as “silicon suboxide”).
- As another example, a silicon oxynitride (SiOxNy) layer is contemplated as the dielectric layer in place of SiO2. In general, when adding nitrogen to go from SiOx to SiOxNy the refractive index of increases with nitrogen content: for example, stoichiometric silicon nitride (Si3N4) has a refractive index of about 2.0. However, a small amount of nitrogen (that is, SiOxNy where x˜2 and x>>y) is contemplated to improve interface quality between the a-Si:H,
N layer 104 and the adjacent dielectric layer. These compounds offer index tailoring that permit the construction of novel material combinations and continuously varying refractive index profiles. - Some suitable design methods for designing the constitutent layer thicknesses the given refractive indices of the constituent layers are based on the following. In general, the wavelength λ in the layer is given by λ=λ0/n where λ0 is the free space wavelength and n is the refractive index. Reflection from a surface of higher refractive index introduces a 180° phase shift, while no phase shift is introduced by reflection from a surface of lower refractive index. Using these principles and given the refractive indices of the constituent layers, the thicknesses of the constituent layers are chosen such that, for the design-basis passband center wavelength, the optical path lengths through each layer and reflected at its interface with the next layer constructively combine, that is, are integer multiples of the wavelength. More elaborate interference filter design techniques for choosing the constituent layer thicknesses (and refractive indices if these are also optimized parameters) are given in: H. Angus Macleod, T
HIN -FILM OPTICAL FILTERS , FOURTH EDITION (Series in Optics and Optoelectronics, CRC Press 2010). - While the illustrative interference filters include repeating units of two layers, it is contemplated to incorporate three or more layers into the repeating unit, such as an a-Si:H,N layer and two different dielectric layers, to achieve desired passband properties (e.g. center wavelength, FWHM, “flatness” of the passband, et cetera).
- It will be appreciated that various of the above-disclosed and other features and functions, or alternatives thereof, may be desirably combined into many other different systems or applications. It will be further appreciated that various presently unforeseen or unanticipated alternatives, modifications, variations or improvements therein may be subsequently made by those skilled in the art which are also intended to be encompassed by the following claims.
Claims (34)
1. An interference filter comprising:
a layers stack comprising plurality of layers of at least:
layers of amorphous hydrogenated silicon with added nitrogen (a-Si:H,N) and
layers of one or more dielectric materials having a refractive index lower than the refractive index of the a-Si:H,N.
2. The interference filter of claim 1 wherein the one or more dielectric materials include SiO2.
3. The interference filter of claim 1 wherein the one or more dielectric materials include a silicon suboxide (SiOx).
4. The interference filter of claim 1 wherein the one or more dielectric layers include a silicon oxynitride (SiOxNy).
5. The interference filter of claim 1 wherein the layers of one or more dielectric materials include layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive.
6. The interference filter of claim 5 wherein the layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive include one or more layers comprising Si3N4, SiOxNy with y large enough to provide a refractive index of 1.9 or higher, Ta2O5, Nb2O5, or TiO2.
7. The interference filter of claim 6 wherein the layers of one or more dielectric materials further include SiO2 layers.
8. The interference filter of claim 1 wherein the layers stack is configured to have a passband center wavelength in the range 800-1100 nm inclusive.
9. The interference filter of claim 1 wherein the layers stack is configured to have a passband center wavelength in the range 750-1100 nm inclusive.
10. The interference filter of claim 1 wherein the a-Si:H,N has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
11. The interference filter of claim 1 further comprising:
a transparent substrate supporting the layers stack.
12. The interference filter of claim 11 wherein the transparent substrate comprises a glass substrate.
13. The interference filter of claim 11 wherein the layers stack includes a first layers stack on one side of transparent substrate and a second layers stack on the opposite side of the transparent substrate.
14. The interference filter of claim 13 wherein the first layers defines a low pass filter with a low pass cutoff wavelength, the second layers stack defines a high pass filter with a high pass cutoff wavelength, and the interference filter has a passband defined between the high pass cutoff wavelength and the low pass cutoff wavelength.
15. An interference filter comprising:
a layers stack comprising alternating a-Si:H,N and silicon based dielectric layers;
wherein the interference filter has at least one passband with center wavelength in the range 750-1100 nm inclusive.
16. The interference filter of claim 15 having at least one passband with center wavelength in the range of 800-1100 nm inclusive.
17. The interference filter of claim 15 wherein the passband center wavelength is 850 nm.
18. The interference filter of claim 15 wherein the silicon based dielectric layers comprise silicon oxide (SiOx) layers.
19. The interference filter of claim 18 wherein the silicon oxide (SiOx) layers comprise stoichiometric SiO2 layers.
20. The interference filter of claim 15 wherein the silicon based dielectric layers comprise silicon oxidenitride (SiOxNy) layers.
21. The interference filter of claim 15 wherein the a-Si:H,N has an atomic concentration between 4% and 8% hydrogen and between 2% and 12% nitrogen.
22. The interference filter of claim 15 further comprising:
a transparent substrate supporting the layers stack.
23. The interference filter of claim 22 wherein the transparent substrate comprises a glass substrate.
24. A method of manufacturing an interference filter comprising alternating a-Si:H,N and SiOx layers, the method comprising:
sputtering silicon from a silicon target onto a filter substrate; and
during the sputtering, alternating between (i) a process gas including hydrogen and nitrogen in order to deposit a-Si:H,N and (ii) a process gas including oxygen in order to deposit SiOx.
25. The method of claim 24 wherein the sputtering comprises:
applying a negative bias to the silicon target; and
including an inert gas component in both (i) the process gas including hydrogen and nitrogen and (ii) the process gas including oxygen.
26. The method of claim 25 wherein the inert gas is argon.
27. The method of claim 24 wherein the sputtering and the alternating are configured to manufacture the interference filter having a passband center wavelength in the range 800-1000 nm inclusive.
28. The method of claim 24 wherein the sputtering and the alternating are configured to manufacture the interference filter having a passband center wavelength in the range 750-1000 nm inclusive.
29. An interference filter comprising:
a layers stack comprising plurality of layers of at least:
layers of amorphous hydrogenated silicon and
layers of one or more dielectric materials having a refractive index lower than the refractive index of the amorphous hydrogenated silicon including layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive.
30. The interference filter of claim 29 wherein the layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive include one or more layers comprising Si3N4, SiOxNy with y large enough to provide a refractive index of 1.9 or higher, Ta2O5, Nb2O5, or TiO2.
31. The interference filter of claim 29 wherein the layers of one or more dielectric materials further include SiO2 layers.
32. The interference filter of claim 31 wherein the layers stack includes at least one SiO2 layer immediately adjacent a layer of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive with no intervening layer of amorphous hydrogenated silicon.
33. The interference filter of claim 29 wherein the amorphous hydrogenated silicon includes nitrogen.
34. The interference filter of claim 33 wherein the amorphous hydrogenated silicon including nitrogen has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
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US17/835,495 US20220299688A1 (en) | 2015-02-18 | 2022-06-08 | Near infrared optical interference filters with improved transmission |
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US20220299688A1 (en) | 2022-09-22 |
US20190212484A1 (en) | 2019-07-11 |
KR20230140612A (en) | 2023-10-06 |
EP3259626A1 (en) | 2017-12-27 |
EP3839585A3 (en) | 2021-09-01 |
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TW201643478A (en) | 2016-12-16 |
EP4163683B1 (en) | 2024-07-24 |
KR20170117533A (en) | 2017-10-23 |
CN107209306B (en) | 2020-10-20 |
CN107209306A (en) | 2017-09-26 |
EP3259626B1 (en) | 2021-04-21 |
EP3839585B1 (en) | 2022-11-09 |
EP3839585A2 (en) | 2021-06-23 |
JP2018506076A (en) | 2018-03-01 |
CN112285817A (en) | 2021-01-29 |
TWI743031B (en) | 2021-10-21 |
US11372144B2 (en) | 2022-06-28 |
WO2016134122A1 (en) | 2016-08-25 |
JP6920994B2 (en) | 2021-08-18 |
KR102583883B1 (en) | 2023-09-27 |
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