US20150061162A1 - Semiconductor structure and manufacturing method thereof - Google Patents
Semiconductor structure and manufacturing method thereof Download PDFInfo
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- US20150061162A1 US20150061162A1 US14/013,503 US201314013503A US2015061162A1 US 20150061162 A1 US20150061162 A1 US 20150061162A1 US 201314013503 A US201314013503 A US 201314013503A US 2015061162 A1 US2015061162 A1 US 2015061162A1
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L24/19—Manufacturing methods of high density interconnect preforms
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- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04105—Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
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- H01L2224/732—Location after the connecting process
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- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
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- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3511—Warping
Definitions
- the disclosure relates to a structure, and more particularly to a semiconductor structure and a manufacturing method of the semiconductor.
- WLP wafer level packaging
- the WLP technology adopts several operations to form a structure that includes multiple layers of different materials stacking on a wafer.
- the WLP technology is crafted in a greater scale and more complicated working environment. Some factors, such as the uniformity within the wafer is critical for each layer disposed on the wafer. An undesirable offset may lead to a malfunction of a to-be-singulated integrated circuit.
- FIG. 1 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIGS. 2A to 2F are cross sectional views of a method placing a dummy block on a WLP semiconductor structure.
- FIGS. 3A to 3D are top views of a WLP in various stages of a method of manufacturing a WLP semiconductor structure in accordance some embodiments of the present disclosure.
- FIGS. 4A to 4G are top views and cross section views of a WLP in various stages of manufacturing in accordance some embodiments of the present disclosure.
- FIGS. 5A to 5E top views and cross section views of a WLP in various stages of manufacturing in accordance some embodiments of the present disclosure.
- FIGS. 6A to 6C are a method of manufacturing a WLP semiconductor structure in accordance some embodiments of the present disclosure.
- FIG. 7 is a WLP semiconductor structure in accordance some embodiments of the present disclosure.
- FIG. 8 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 9A is a top view of a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 9B is a top view of a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 10 is a flow chart including some operations of determining the specified uncovered area.
- FIG. 11 is a drawing of some embodiments having a dummy block placed at the edge of a WLP semiconductor structure.
- FIG. 12 is a WLP semiconductor structure having dummy blocks in a first zone and a second zone.
- FIG. 13 is a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 14 is a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 15 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 16 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- FIG. 17 is a WLP semiconductor structure having a warpage in accordance to some embodiments of the present disclosure.
- FIG. 18 is a WLP semiconductor structure with some dummy blocks disposed on a top surface in accordance to some embodiments of the present disclosure.
- FIG. 19 is a WLP semiconductor structure with RDLs disposed over a top surface in accordance to some embodiments of the present disclosure.
- FIG. 20 is a WLP semiconductor structure having a warpage in accordance to some embodiments of the present disclosure.
- FIG. 21 is a WLP semiconductor structure having a warpage and RDL in accordance to some embodiments of the present disclosure.
- a method is used to improve the process control of a semiconductor structure.
- a warpage of a WLP semiconductor structure is adjustable and the warpage of the WLP semiconductor structure is controlled in a predetermined range.
- the warpage of the WLP semiconductor structure is controlled to be a desired curvature.
- a term “carrier” is referred to a substrate used to carry some semiconductor dies (called dies hereinafter) or other components in a WLP process.
- Shape of the carrier is circular, polygonal or other suitable designs.
- Material of the carrier is silicon, glass, silicon carbide, or other suitable substance.
- the carrier includes a silicon or glass wafer in a circular shape.
- some dummy blocks are disposed on a carrier of a WLP structure for a warpage adjustment or to prevent over-warpage.
- the dummy blocks and some to-be-singulated dies are disposed on a surface of the carrier.
- the warpage of the WLP semiconductor structure is adjusted to have the surface bent convexly.
- some dummy blocks and dies are disposed on a WLP's carrier.
- the coefficient of thermal expansion (CTE) of the dummy blocks is between a CTE of the carrier and a CTE of the dies.
- CTE of the dummy blocks is substantially equal to CTE of the dies.
- CTE is a property of an object. An object's length changes by an amount proportional to the original length and a change in temperature. The unit of CTE is ppm/K, which stands for 10 ⁇ 6 m/m Kelvin.
- FIG. 1 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- dies are attached to a top surface of a carrier.
- dummy blocks are placed on a specified uncovered area of the top surface.
- a molding compound is placed over the top surface.
- an operation of determining the specified uncovered area is introduced before placing the dummy blocks.
- FIGS. 2A-2F are cross sectional views of a method of placing a dummy block on a WLP semiconductor structure.
- FIG. 2A is an operation of providing a carrier 300 .
- the carrier 300 has a surface 302 .
- a light to heat conversion film (LTHC) 301 is placed on the surface 302 of the carrier 300 .
- the LTHC 301 is decomposable after a heat, such as a laser heating, applied on the film and the carrier is thus removed from the structures attached thereon.
- a die attached film (DAF) 308 is formed on the LTHC 301 .
- DAF die attached film
- the DAF 308 is an adhesive and the dies are placed directly on the DAF 308 .
- die 1 is different from die 2 .
- die 1 includes only logic circuitry and die 2 includes memory arrays.
- some dummy blocks 325 are placed on areas that are not covered by the dies.
- a molding compound 600 is placed over the carrier 300 .
- the dies and dummy blocks 325 are surrounded by the molding compound 600 .
- the molding compound has a high thermal conductivity, a low moisture absorption rate, a high flexural strength at board-mounting temperatures, or a combination of these.
- FIGS. 3A to 3D are top views of a WLP in various stages of a method of manufacturing a WLP semiconductor structure in accordance some embodiments of the present disclosure.
- a carrier 300 having a surface 302 is provided.
- the carrier 300 has a circular shape.
- a DAF is disposed on the surface 302 (not labeled because covered by the DAF) to form a new surface 310 on the carrier 300 .
- the new surface 310 is referred as a top surface of the carrier 300 in the present embodiments.
- the top surface 310 is not formed by DAF but by other suitable materials.
- dies 320 are attached on the DAF in an array manner.
- An area 310 A indicates a portion of the top surface 310 that is not covered by the dies 320 .
- dummy blocks 325 are placed on the uncovered area 310 A.
- FIGS. 4A-4G are top views of a WLP in various stages of manufacturing.
- FIG. 4A is a plate 400 with a surface 402 .
- the plate 400 includes LTHC.
- a template 405 is placed on the surface 402 of the plate 400 .
- the template 405 has a predetermined shape corresponding to a WLP semiconductor structure.
- the template 405 is fixed to the surface 402 of the plate 400 .
- some dummy blocks 325 are placed on the surface 402 .
- the dummy blocks 325 include various shapes and sizes.
- an adhesive (not shown in the drawing) is disposed on top of each dummy block 325 .
- the WLP semiconductor structure corresponding to the template 405 is provided.
- the WLP semiconductor structure has some dies 320 placed on a carrier 300 's top surface 310 .
- FIG. 4E is a cross sectional view of plate 400 along line AA′ in FIG. 4C and a cross sectional view of carrier 300 along line BB′ in FIG. 4D .
- the plate 400 is flipped and placed over the carrier 300 .
- the predetermined shape of the template 405 is substantially equal to the area that is covered by dies 320 on the top surface 310 of the carrier 300 .
- the predetermined shape of the template 405 is not corresponding to the WLP semiconductor structure as in FIG. 4E .
- the dummy blocks 325 are contacted with the top surface 310 of the carrier 300 .
- the dummy blocks 325 are attached on the top surface 310 .
- the dummy block 325 is attached to the top surface 310 by the adhesive pre-disposed on a surface of the dummy blocks 325 .
- FIG. 4G the plate 400 and template 405 in FIG. 4F are removed.
- the dummy blocks 325 are left on the top surface 310 .
- the die 320 has height h 1 and the dummy block 325 has a height h2.
- h 2 is greater than h 1 .
- h 2 is equal to h 1 .
- the method with reference to FIGS. 4A-4G is called as “flip placement” hereinafter.
- a dummy block is placed on a WLP semiconductor substrate by operations referenced with FIGS. 5A to 5E .
- a mask 500 is provided. Some through holes 502 are formed in the mask. In the present embodiments, the through holes 502 have various shapes. In some other embodiments, the through holes 502 are in a same shape. The through holes 502 are arranged in a predetermined pattern corresponding to a WLP semiconductor structure.
- FIG. 5B the WLP semiconductor structure corresponding to the arranged through holes 502 is provided. The WLP has dies 320 on a carrier 300 .
- FIG. 5C is a cross sectional view of the mask 500 along line AA′ in FIG.
- FIG. 5A and a cross sectional view of the WLP semiconductor structure 300 along line BB′ in FIG. 5B .
- the mask 500 is placed over the dies 320 .
- blocks 323 are dropped on the mask 500 .
- Some blocks 322 drop on the through holes 502 and fall on the top surface 310 of the carrier 300 . Because the through holes 502 are arranged over a specified uncovered area of the top surface 310 , the blocks 322 only drop on the specified uncovered area.
- blocks 322 are pressed or pasted into the through holes 502 and fall on the mask 500 .
- dummy blocks 325 are formed on the specified area of the top surface 310 .
- the method with reference to FIGS. 5A-5E is called as “stencil placement” hereinafter.
- a dummy block is pre-formed into a predetermined shape and dimension in corresponding to a WLP semiconductor structure.
- a dummy block 325 is formed.
- the dummy block 325 has several teeth 325 A connected to form a circular ring.
- the circular ring has an inner diameter D.
- the inner diameter D is predetermined to corresponding to a WLP semiconductor structure.
- the WLP semiconductor structure corresponding to the dummy block 325 is provided.
- the WLP semiconductor structure has an outer diameter D′.
- D′ is substantially equal to the inner diameter D of the dummy block 325 in FIG. 6A . In some embodiments, D′ is greater than D.
- D′ is greater than D.
- the dummy block 325 is placed on the edge of the WLP semiconductor structure.
- an operation of curing the dummy block 325 after FIG. 6C is introduced.
- the method with reference to FIGS. 6A-6C is called as “pre-formation” hereinafter.
- the pre-formed dummy block is a circular ring without teeth on its edge.
- the carrier of the WLP semiconductor structure has a quadrilateral shape.
- the pre-formed dummy block has a quadrilateral shape in corresponding to the carrier.
- dummy blocks are placed on a carrier of a WLP semiconductor structure by at least two aforementioned methods. In certain embodiments, some dummy blocks are placed on the carrier by the stencil placement and some other dummy blocks are placed on the carrier by the flip placement. In certain embodiments, a dummy block is placed on an edge of the WLP semiconductor structure by the pre-formation and some dummy blocks are placed over the carrier by the stencil placement.
- a WLP semiconductor structure 100 has some dies 320 and some dummy blocks such as 325 A, 325 B, 325 C and 325 D.
- the dummy block 325 A has a conical shape; the dummy block 325 B has a rectangular shape; the dummy block 325 C has a ring shape; and the dummy block 325 D has a square shape.
- dummy blocks 325 A are placed on the WLP semiconductor structure 100 by the flip placement.
- Dummy blocks 325 B and 325 D are placed on the WLP semiconductor structure 100 by the stencil placement.
- Dummy block 325 C is placed on the WLP semiconductor structure 100 by the pre-formation.
- FIG. 8 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- dies are attached to a top surface of a carrier.
- an operation 103 of determining a specified uncovered area of the top surface is introduced before an operation 104 .
- some dummy blocks are placed on a specified uncovered area of the top surface.
- operation 106 placing a molding compound over the top surface.
- an operation of determining the specified uncovered area is introduced before the operation 102 .
- Determining the specified uncovered area of the top surface includes categorizing dies on a carrier into two different zones or defining different zones on a top surface of the carrier.
- FIG. 9A is a top view of a portion of a WLP structures that is used to show some embodiments for categorizing dies and defining zones of a carrier.
- the dies 320 include an edge die 320 E that is defined as a die that is adjacent to only one or two dies. A die is adjacent to another die when the dies share an edge.
- a length D including D 1 and D 2 on the top surface of the carrier 300 represents a distance measured from an intersection 330 of two edge dies 320 E to the center O.
- An intersection is where two edge dies share a corner. When more than one corner is shared, such as for the edge dies that are also adjacent, only the closest corner to the center is the intersection. While many intersection 330 of two edge dies may be found on one WLP semiconductor structure, the length D is measured from the intersection 330 that is closest to the center O.
- the carrier 300 is a circle and the length D is a portion of a radius of the carrier 300 .
- the length D is an average of lengths D 1 and D 2 from different intersections 330 .
- the length D is the mean value of D 1 and D 2 . When there are more than two different lengths, the length D is the mean value of all different lengths. In some embodiments, the length D is determined to be a peripheral inset distance from the edge of the carrier, as opposed to a distance from the center.
- a boundary 710 is determined to separate the dies 320 into two zones.
- the boundary 710 is a circle having a radius length D.
- a first zone 715 is defined as a region between the origin O and the boundary 710 .
- a second zone 716 is defined as a region between the boundary 710 and the edge of the carrier 300 .
- the boundary is defined by a distance from an edge die to the edge of the carrier.
- the carrier 300 is in a quadrilateral shape. Dies 320 including edge dies 320 E are disposed on the carrier 300 .
- a boundary 710 A is defined by a peripheral inset distance to each edge die 320 E.
- the peripheral inset distance to each edge die is smaller than 20% of the largest dimension of the dummy block to be placed on. For dummy block in a circular shape, the largest dimension is the diameter of the dummy block. For dummy block in a rectangular shape, the largest dimension is the longest edge of the dummy block.
- the peripheral inset distance can be different for each edge die. As in FIG. 9B , there are four different peripheral inset distances, D 1 , D 2 , D 3 , and D 4 to determine the boundary 710 A.
- a coverage ratio of each abovementioned categorized or defined zone is calculated to determine the specified uncovered area.
- the coverage ratio is defined as dividing a total die area in one zone with the carrier's top surface area in the same zone.
- FIG. 10 is a flow chart including some operations of determining the specified uncovered area by considering the coverage ratio of each defined zone.
- a coverage ratio in the first zone 715 is calculated to be as R 1 .
- a coverage ratio in the second zone 716 is calculated to be as R 2 .
- a coverage ratio difference between R 1 and R 2 is calculated.
- the coverage ratio difference is compared with a predetermined value P. If the coverage ratio difference is greater than P, a specified uncovered area is determined in operation 810 .
- the specified uncovered area is determined to be a location in a zone with the lower coverage ratio. For example, if the coverage ratio in the first zone 715 is greater than the coverage ratio in the second zone 716 , i.e. R 1 >R 2 , the specified uncovered area is located in the second zone 716 .
- the predetermined value P is about 30%.
- the first zone's coverage ratio is about 81% and the second zone's coverage ratio is about 37%.
- a coverage ratio difference between the two zones is about 47%, which is grater than P.
- Some locations in the second zone 716 are determined to be an uncovered area for placing a dummy block or dummy blocks thereon.
- the coverage ratio, R2, of the second zone is increased after placing the dummy block on the uncovered area.
- R 2 is increased to about 51%.
- the coverage ratio difference between the first and second zone is reduced to be about 30%, which is equal to P. As such, warpage of the WLP semiconductor structure is adjusted.
- the predetermined value P is smaller than 30%, and is, for example, 25%, 16%, 10%, etc.
- the predetermined value P is about 10%.
- the first zone's coverage ratio is about 76% and the second zone's coverage ratio is about 91%.
- a coverage ratio difference between the two zones is about 15%, which is grater than P.
- Some locations in the first zone 715 are determined to be an uncovered area for placing a dummy block or dummy blocks thereon.
- the coverage ratio, R1, of the first zone 715 is increased after placing the dummy block on the uncovered area. In this example, R 1 is increased to about 85%.
- the coverage ratio difference between the first and second zone is reduced to be about 6%, which is smaller than P. As such, warpage of the WLP semiconductor structure is adjusted.
- FIG. 11 is a top view of a WLP semiconductor structure having a dummy block at the edge.
- a boundary 710 is selected to define the WLP semiconductor structure into a first zone 715 and a zone 716 .
- the zone 716 is between the boundary 710 and the WLP's edge.
- a dummy block 325 is placed in the second zone 716 and close to the edge of the WLP semiconductor structure. The dummy block 325 increases the area coverage ratio in the second zone 716 . Thus, warpage of the WLP semiconductor structure is adjusted.
- the specified uncovered area is determined to be in various locations in both zones.
- a top surface of a WLP semiconductor structure is defined into a first zone and a second zone.
- the first zone has an area coverage ratio about 89%.
- the second zone has an area coverage ratio about 67%.
- the coverage ratio difference is about 22%.
- the predetermined value P is about 13%.
- Some locations in the first zone are defined as a first uncovered area and some locations in the second zone are defined as a second uncovered area.
- Dummy blocks are placed on the first uncovered area to increase the area coverage ratio from about 89% to 93%.
- Some other dummy blocks are placed on the second uncovered area to increase the area coverage ratio from about 67% to about 83%.
- the coverage ratio difference is reduced from about 22% to about 10% (93%-83%).
- the specified uncovered area is determined to be in some locations covering both zones.
- FIG. 12 is a WLP semiconductor structure having dummy blocks in both a first zone 715 and a second zone 716 . Dummy blocks 325 A are placed in the first zone 715 . Some dummy blocks, such as 325 B are placed in the second zone 716 . Some dummy blocks, such as 325 C are placed across the boundary 710 .
- FIG. 13 is a WLP semiconductor structure 100 having a carrier 300 .
- the carrier 300 has a center 304 .
- Some dies 320 are placed on the carrier 300 .
- Dummy blocks such as 325 are placed symmetrically to the center 304 .
- the specified uncovered area is arranged in a random manner on WLP semiconductor structure.
- FIG. 14 is a WLP semiconductor structure 100 having a carrier 300 .
- the carrier 300 has a center 304 . Dies 320 are placed on the carrier 300 . Dummy blocks such as 325 are placed randomly to the center 304 . There is no specific pattern for the arrangement of the specified covered area.
- FIG. 15 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- operation 102 some dies are attached to a top surface of a carrier.
- an operation 102 A of determining a CTE of a dummy block is introduced before an operation 104 .
- operation 104 some dummy blocks are placed on a specified uncovered area of the top surface.
- operation 106 depositing a molding compound over the top surface.
- the operation 102 A is introduced before the operation 102 .
- the CTE of the dummy block is determined by a CTE of the dies and a CTE of the carrier.
- the CTE of the dummy block is between the CTE of the dies and the CTE of the carrier.
- the dies are made with silicon, which has a CTE around 3 ppm/K.
- the carrier is glass made with silicon dioxide, which has a CTE between around 3 ppm/K and 11 ppm/K. in other embodiments, the material of the dummy block has a CTE around 2.5 ppm/K.
- the dummy block is a rubber or a polymer material such as epoxy, polyimide, polybenzoxazole (PBO), and the like.
- the CTE of the dummy block is substantially equal to the CTE of the dies.
- the dies are made with silicon, which has a CTE around 3 ppm/K.
- the carrier is glass made with silicon dioxide, which has a CTE around 3.7 ppm/K.
- the material of the dummy block has a CTE around 3 ppm/K.
- an operation of determining a CTE of the carrier is introduced before the operation 102 .
- an effective CTE of the dies in the operation 102 and the molding compound in the operation 106 determine the CTE of the carrier.
- the effective CTE is calculated in accordance with the CTE of each element and the weighting factor of that element.
- the dies are silicon having a CTE around 3 ppm/K; the molding compound is an epoxy, which has a CTE around 55 ppm/K.
- the effective CTE is calculated by the following formula:
- Eeff Effective Yonug's Modulus
- V1 and V2 is respectively a volume fraction of a first material and a second material.
- the first material is silicon and the second material is molding compound.
- E1 and E2 is the Young's modulus of the first material and the second material.
- A1 and A2 is the CTE of the first material and the second material.
- a method of manufacturing a semiconductor structure includes several operations.
- One operation includes attaching a plurality of dies to a top surface of a carrier.
- On operation includes placing a plurality of dummy blocks on a specified uncovered area of the top surface.
- One operation includes placing a molding compound over the top surface of the carrier.
- the plurality of dummy blocks has a coefficient of thermal expansion (CTE) between a CTE of the plurality of dies and the carrier.
- CTE coefficient of thermal expansion
- FIG. 16 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure.
- operation 102 some dies are attached to a top surface of a carrier.
- operation 104 some dummy blocks are placed on a specified uncovered area of the top surface.
- operation 106 depositing a molding compound over the top surface.
- an operation of determining the specified uncovered area is introduced before placing the dummy block thereon.
- the molding compound is grounded to have the dummy block and the dies exposed.
- a redistribution layer (RDL) is placed on the molding compound and electrically connected with the dies.
- RDL redistribution layer
- the RDL is formed with gold, silver, copper, nickel, tungsten, aluminum, and/or alloys, or other suitable materials.
- the operation of forming an RDL includes forming a conductive material on the molding compound and pattering the conductive material into conductive interconnects. It is required to have a controlled warpage for the WLP semiconductor structure in order to patterning the conductive material into a desired pattern of the RDL.
- Warpage of a WLP semiconductor structure is defined as in FIG. 17 .
- An exemplary WLP semiconductor structure 100 has a highest point 710 and a lowest point 705 on its surface.
- Line WW′ is used as a baseline to measure a vertical distance to the highest point 710 and the lowest point 705 .
- the highest point 710 has a distance L 2 from line WW′ and the lowest point 705 has a distance L 1 from line WW.
- Warpage of the WLP semiconductor structure is defined by subtracting L 2 from L 1 .
- some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 0, which means that the WLP semiconductor structure has a flat surface. In some embodiments, some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 100 ⁇ m, which means that the top surface (where the dummy is put on) of the WLP semiconductor structure is convex by 100 ⁇ m. In contrast, a negative wargape value means that the top surface of the WLP semiconductor structure in concave. In some embodiments, some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 250.
- some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 500.
- the WLP semiconductor structure 100 has a warpage between about 0 and 500.
- a convex top surface of the WLP semiconductor structure provides a larger window for the proceeding patterning and metallization process.
- FIG. 18 is a WLP semiconductor structure 100 in accordance to some embodiments of the present disclosure.
- the WLP semiconductor structure 100 has a carrier 300 .
- the carrier 300 has some dies 320 on a top surface 310 of the carrier 300 .
- Some dummy blocks 325 are disposed on the top surface 310 .
- a molding compound 600 is on the top surface 310 and surrounds the dies and dummy blocks 325 .
- the dummy blocks 325 adjust the warpage of the WLP semiconductor structure 100 .
- the top surface 310 is substantially flat.
- the WLP semiconductor structure has a total coverage that is defined as dividing the area covered by the dies 320 with the area of the top surface 310 . In certain embodiments, the total coverage is between about 30% to about 95%.
- the dummy block include silicon, silicon oxide, silicon nitride, aluminum oxide, metal alloy, solder paste and other suitable material.
- the dummy block has a CTE between about 2.5 ppm/K and 10 ppm/K.
- FIG. 19 is a WLP semiconductor structure 100 in accordance to some embodiments of the present disclosure.
- the WLP semiconductor structure 100 has a dielectric 610 on the molding compound 600 .
- the dielectric 610 includes silicon oxide, silicon oxynitride, silicon nitride, epoxy, polyimide, PBO, and other suitable material.
- the conductive pillar 525 is electrically connected with a die 325 at one end.
- the conductive pillar is formed with a conductive material such as gold, silver, copper, nickel, tungsten, aluminum, tin and/or alloys thereof.
- An RDL 550 is on the dielectric 610 .
- the RDL 550 is connected with the conductive pillar 525 at one end.
- FIG. 20 is a WLP semiconductor structure in accordance to some embodiments of the present disclosure.
- the WLP semiconductor structure is similar to the WLP semiconductor structure 100 in FIG. 16 .
- the WLP semiconductor structure has a dummy block 325 at edges of the carrier 300 .
- the dummy block 325 is a ring around the edge and it shows as two blocks in a cross sectional view as in FIG. 18 .
- the WLP semiconductor structure has a warpage because CTE mismatch. The warpage is adjusted by the dummy block to have a desired shape. In some embodiments as in FIG. 18 , the warpage of the WLP semiconductor structure is adjusted to make the top surface 310 become a convex surface.
- FIG. 21 is a WLP semiconductor structure in accordance to some embodiments of the present disclosure.
- the WLP semiconductor structure has a warpage and has RDL 550 on a dielectric 610 .
- a method of manufacturing a semiconductor structure includes several operations.
- the method includes attaching a plurality of dies to a top surface of a carrier; placing a dummy block on a specified uncovered area of the top surface; and depositing a molding compound over the top surface of the carrier.
- the dummy block has a coefficient of thermal expansion (CTE) between a CTE of the dies and the carrier.
- a method of manufacturing a semiconductor structure includes determining the specified uncovered area.
- a method of manufacturing a semiconductor structure includes categorizing the plurality of dies into two different zones.
- a method of manufacturing a semiconductor structure includes several operations.
- An operation includes placing a plurality of dies on a carrier.
- An operation includes defining a first zone and a second zone in a top surface of the carrier.
- An operation includes calculating a first coverage ratio in the first zone.
- An operation includes calculating a second coverage ratio in the second zone.
- An operation includes disposing a dummy block on a specified location of the top surface of the carrier if the difference between the first coverage ratio and the second coverage ratio is greater than a predetermined value.
- An operation includes forming a molding compound on the carrier.
- a method of manufacturing a semiconductor structure includes calculating an efficient coefficient of thermal expansion of the semiconductor structure.
- a method of manufacturing a semiconductor structure includes defining a boundary between the first zone and the second zone.
- a method of manufacturing a semiconductor structure includes defining a boundary between the first zone and the second zone includes determining a length on the top surface of the carrier, wherein the length is a shortest distance measured from an intersection of two edge dies to a center of the carrier.
- a semiconductor wafer level package has several features.
- a feature includes a carrier.
- a feature includes several dies on the carrier.
- a feature includes a dummy block on a specified location on the carrier not covered by a die.
- a feature includes a molding compound on the carrier.
Abstract
Description
- The disclosure relates to a structure, and more particularly to a semiconductor structure and a manufacturing method of the semiconductor.
- Presently, the electronic equipments are indispensable from our daily life. Consumers increasingly demand more processing power, lower electrical power usage and cheaper devices. As the electronic industry strive to meet these demands, miniaturization, resulting in more complicated and denser configurations, extends the number of chips per wafer, the number of transistors per chip, and reduces power usage. As the electronic components are made lighter, smaller, more multifunctional, more powerful, more reliable and less expensive, a wafer level packaging (WLP) technology has been gaining in popularity. The WLP technology combines dies having different functionalities at a wafer level, and is widely applied in order to meet continuous demands toward the miniaturization and higher functions of the electronic components.
- The WLP technology adopts several operations to form a structure that includes multiple layers of different materials stacking on a wafer. In contrast to a traditional packaging technology, the WLP technology is crafted in a greater scale and more complicated working environment. Some factors, such as the uniformity within the wafer is critical for each layer disposed on the wafer. An undesirable offset may lead to a malfunction of a to-be-singulated integrated circuit.
- As the size of the wafer used in the WLP technology becomes greater, there are more challenges to the yield of the manufacturing. As such, improvements in the structure and method for a WLP continue to be sought.
- Aspects of the present disclosure are best understood from the following detailed description when read with the accompanying figures. It is emphasized that, in accordance with the standard practice in the industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion.
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FIG. 1 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIGS. 2A to 2F are cross sectional views of a method placing a dummy block on a WLP semiconductor structure. -
FIGS. 3A to 3D are top views of a WLP in various stages of a method of manufacturing a WLP semiconductor structure in accordance some embodiments of the present disclosure. -
FIGS. 4A to 4G are top views and cross section views of a WLP in various stages of manufacturing in accordance some embodiments of the present disclosure. -
FIGS. 5A to 5E top views and cross section views of a WLP in various stages of manufacturing in accordance some embodiments of the present disclosure. -
FIGS. 6A to 6C are a method of manufacturing a WLP semiconductor structure in accordance some embodiments of the present disclosure. -
FIG. 7 is a WLP semiconductor structure in accordance some embodiments of the present disclosure. -
FIG. 8 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 9A is a top view of a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 9B is a top view of a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 10 is a flow chart including some operations of determining the specified uncovered area. -
FIG. 11 is a drawing of some embodiments having a dummy block placed at the edge of a WLP semiconductor structure. -
FIG. 12 is a WLP semiconductor structure having dummy blocks in a first zone and a second zone. -
FIG. 13 is a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 14 is a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 15 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 16 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. -
FIG. 17 is a WLP semiconductor structure having a warpage in accordance to some embodiments of the present disclosure. -
FIG. 18 is a WLP semiconductor structure with some dummy blocks disposed on a top surface in accordance to some embodiments of the present disclosure. -
FIG. 19 is a WLP semiconductor structure with RDLs disposed over a top surface in accordance to some embodiments of the present disclosure. -
FIG. 20 is a WLP semiconductor structure having a warpage in accordance to some embodiments of the present disclosure. -
FIG. 21 is a WLP semiconductor structure having a warpage and RDL in accordance to some embodiments of the present disclosure. - The manufacturing and use of the embodiments are discussed in details below. It should be appreciated, however, that the embodiments provide many applicable inventive concepts that can be embodied in a wide variety of specific contexts. It is to be understood that the following disclosure provides many different embodiments or examples for implementing different features of various embodiments. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting.
- Further, it is understood that several processing steps and/or features of a device may be only briefly described. Also, additional processing steps and/or features can be added, and certain of the following processing steps and/or features can be removed or changed while still implementing the claims. Thus, the following description should be understood to represent examples only, and are not intended to suggest that one or more steps or features is required.
- In addition, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.
- In the present disclosure, a method is used to improve the process control of a semiconductor structure. In the method, a warpage of a WLP semiconductor structure is adjustable and the warpage of the WLP semiconductor structure is controlled in a predetermined range. In some embodiments, the warpage of the WLP semiconductor structure is controlled to be a desired curvature.
- In the present disclosure, a term “carrier” is referred to a substrate used to carry some semiconductor dies (called dies hereinafter) or other components in a WLP process. Shape of the carrier is circular, polygonal or other suitable designs. Material of the carrier is silicon, glass, silicon carbide, or other suitable substance. In some embodiments, the carrier includes a silicon or glass wafer in a circular shape.
- In the present disclosure, some dummy blocks are disposed on a carrier of a WLP structure for a warpage adjustment or to prevent over-warpage. The dummy blocks and some to-be-singulated dies are disposed on a surface of the carrier. In some embodiments, the warpage of the WLP semiconductor structure is adjusted to have the surface bent convexly.
- In some embodiments, some dummy blocks and dies are disposed on a WLP's carrier. The coefficient of thermal expansion (CTE) of the dummy blocks is between a CTE of the carrier and a CTE of the dies. In certain embodiments, CTE of the dummy blocks is substantially equal to CTE of the dies. In the present disclosure, the term “CTE” is a property of an object. An object's length changes by an amount proportional to the original length and a change in temperature. The unit of CTE is ppm/K, which stands for 10−6 m/m Kelvin.
-
FIG. 1 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. Inoperation 102, dies are attached to a top surface of a carrier. Inoperation 104, dummy blocks are placed on a specified uncovered area of the top surface. Inoperation 106, a molding compound is placed over the top surface. In some embodiments, an operation of determining the specified uncovered area is introduced before placing the dummy blocks. The various operations ofFIG. 1 are discussed below in more detail in association with cross sectional views corresponding to the operations of the flow diagram. -
FIGS. 2A-2F are cross sectional views of a method of placing a dummy block on a WLP semiconductor structure.FIG. 2A is an operation of providing acarrier 300. Thecarrier 300 has asurface 302. InFIG. 2B , a light to heat conversion film (LTHC) 301 is placed on thesurface 302 of thecarrier 300. TheLTHC 301 is decomposable after a heat, such as a laser heating, applied on the film and the carrier is thus removed from the structures attached thereon. InFIG. 2C , a die attached film (DAF) 308 is formed on theLTHC 301. InFIG. 2D , some dies, such as die 1 and die 2 in the drawing are placed on theDAF 308. In some embodiments, theDAF 308 is an adhesive and the dies are placed directly on theDAF 308. In some embodiments, die 1 is different from die 2. For example, die 1 includes only logic circuitry and die 2 includes memory arrays. InFIG. 2E , some dummy blocks 325 are placed on areas that are not covered by the dies. InFIG. 2F , amolding compound 600 is placed over thecarrier 300. The dies and dummy blocks 325 are surrounded by themolding compound 600. The molding compound has a high thermal conductivity, a low moisture absorption rate, a high flexural strength at board-mounting temperatures, or a combination of these. -
FIGS. 3A to 3D are top views of a WLP in various stages of a method of manufacturing a WLP semiconductor structure in accordance some embodiments of the present disclosure. InFIG. 3A , acarrier 300 having asurface 302 is provided. Thecarrier 300 has a circular shape. InFIG. 3B , a DAF is disposed on the surface 302 (not labeled because covered by the DAF) to form anew surface 310 on thecarrier 300. Thenew surface 310 is referred as a top surface of thecarrier 300 in the present embodiments. In some other embodiments, thetop surface 310 is not formed by DAF but by other suitable materials. InFIG. 3C , dies 320 are attached on the DAF in an array manner. Anarea 310A indicates a portion of thetop surface 310 that is not covered by the dies 320. InFIG. 3D , dummy blocks 325 are placed on the uncoveredarea 310A. In the present embodiments with reference toFIG. 3D , there are several dummy blocks 325 placed on the uncoveredarea 310A. - A dummy block is placed on a carrier of a WLP semiconductor structure in various ways.
FIGS. 4A-4G are top views of a WLP in various stages of manufacturing.FIG. 4A is aplate 400 with asurface 402. Theplate 400 includes LTHC. InFIG. 4B , atemplate 405 is placed on thesurface 402 of theplate 400. Thetemplate 405 has a predetermined shape corresponding to a WLP semiconductor structure. In some embodiments, thetemplate 405 is fixed to thesurface 402 of theplate 400. InFIG. 4C , some dummy blocks 325 are placed on thesurface 402. The dummy blocks 325 include various shapes and sizes. In some embodiments, an adhesive (not shown in the drawing) is disposed on top of eachdummy block 325. InFIG. 4D , the WLP semiconductor structure corresponding to thetemplate 405 is provided. The WLP semiconductor structure has some dies 320 placed on acarrier 300'stop surface 310.FIG. 4E is a cross sectional view ofplate 400 along line AA′ inFIG. 4C and a cross sectional view ofcarrier 300 along line BB′ inFIG. 4D . Theplate 400 is flipped and placed over thecarrier 300. The predetermined shape of thetemplate 405 is substantially equal to the area that is covered by dies 320 on thetop surface 310 of thecarrier 300. In other embodiments, the predetermined shape of thetemplate 405 is not corresponding to the WLP semiconductor structure as inFIG. 4E . InFIG. 4F , the dummy blocks 325 are contacted with thetop surface 310 of thecarrier 300. The dummy blocks 325 are attached on thetop surface 310. In some embodiments, thedummy block 325 is attached to thetop surface 310 by the adhesive pre-disposed on a surface of the dummy blocks 325. - In
FIG. 4G , theplate 400 andtemplate 405 inFIG. 4F are removed. Thus, the dummy blocks 325 are left on thetop surface 310. Thedie 320 has height h1 and thedummy block 325 has a height h2. In the present embodiments, h2 is greater than h1. In some other embodiments, h2 is equal to h1. The method with reference toFIGS. 4A-4G is called as “flip placement” hereinafter. - In some embodiments, a dummy block is placed on a WLP semiconductor substrate by operations referenced with
FIGS. 5A to 5E . InFIG. 5A , amask 500 is provided. Some throughholes 502 are formed in the mask. In the present embodiments, the throughholes 502 have various shapes. In some other embodiments, the throughholes 502 are in a same shape. The throughholes 502 are arranged in a predetermined pattern corresponding to a WLP semiconductor structure. InFIG. 5B , the WLP semiconductor structure corresponding to the arranged throughholes 502 is provided. The WLP has dies 320 on acarrier 300.FIG. 5C is a cross sectional view of themask 500 along line AA′ inFIG. 5A and a cross sectional view of theWLP semiconductor structure 300 along line BB′ inFIG. 5B . Themask 500 is placed over the dies 320. InFIG. 5D , blocks 323 are dropped on themask 500. Some blocks 322 drop on the throughholes 502 and fall on thetop surface 310 of thecarrier 300. Because the throughholes 502 are arranged over a specified uncovered area of thetop surface 310, the blocks 322 only drop on the specified uncovered area. In some embodiments, blocks 322 are pressed or pasted into the throughholes 502 and fall on themask 500. InFIG. 5E , dummy blocks 325 are formed on the specified area of thetop surface 310. The method with reference toFIGS. 5A-5E is called as “stencil placement” hereinafter. - In some embodiments, a dummy block is pre-formed into a predetermined shape and dimension in corresponding to a WLP semiconductor structure. In
FIG. 6A , adummy block 325 is formed. Thedummy block 325 hasseveral teeth 325A connected to form a circular ring. The circular ring has an inner diameter D. The inner diameter D is predetermined to corresponding to a WLP semiconductor structure. InFIG. 6B , the WLP semiconductor structure corresponding to thedummy block 325 is provided. The WLP semiconductor structure has an outer diameter D′. D′ is substantially equal to the inner diameter D of thedummy block 325 inFIG. 6A . In some embodiments, D′ is greater than D. InFIG. 6C , thedummy block 325 is placed on the edge of the WLP semiconductor structure. In some embodiments, an operation of curing thedummy block 325 afterFIG. 6C is introduced. The method with reference toFIGS. 6A-6C is called as “pre-formation” hereinafter. - In some embodiments, the pre-formed dummy block is a circular ring without teeth on its edge. In some embodiments, the carrier of the WLP semiconductor structure has a quadrilateral shape. Thus, the pre-formed dummy block has a quadrilateral shape in corresponding to the carrier.
- In some embodiments, dummy blocks are placed on a carrier of a WLP semiconductor structure by at least two aforementioned methods. In certain embodiments, some dummy blocks are placed on the carrier by the stencil placement and some other dummy blocks are placed on the carrier by the flip placement. In certain embodiments, a dummy block is placed on an edge of the WLP semiconductor structure by the pre-formation and some dummy blocks are placed over the carrier by the stencil placement.
- In
FIG. 7 , aWLP semiconductor structure 100 has some dies 320 and some dummy blocks such as 325A, 325B, 325C and 325D. Thedummy block 325A has a conical shape; thedummy block 325B has a rectangular shape; thedummy block 325C has a ring shape; and thedummy block 325D has a square shape. In some embodiments, dummy blocks 325A are placed on theWLP semiconductor structure 100 by the flip placement. Dummy blocks 325B and 325D are placed on theWLP semiconductor structure 100 by the stencil placement.Dummy block 325C is placed on theWLP semiconductor structure 100 by the pre-formation. -
FIG. 8 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. Inoperation 102, dies are attached to a top surface of a carrier. In the present method, anoperation 103 of determining a specified uncovered area of the top surface is introduced before anoperation 104. In theoperation 104, some dummy blocks are placed on a specified uncovered area of the top surface. Inoperation 106, placing a molding compound over the top surface. In some embodiments, an operation of determining the specified uncovered area is introduced before theoperation 102. - Determining the specified uncovered area of the top surface includes categorizing dies on a carrier into two different zones or defining different zones on a top surface of the carrier.
FIG. 9A is a top view of a portion of a WLP structures that is used to show some embodiments for categorizing dies and defining zones of a carrier. There are several dies 320 placed on acarrier 300. The center of the WLP semiconductor structure is labeled as “O” is the drawing. The dies 320 include anedge die 320E that is defined as a die that is adjacent to only one or two dies. A die is adjacent to another die when the dies share an edge. A length D including D1 and D2 on the top surface of thecarrier 300 represents a distance measured from an intersection 330 of two edge dies 320E to the center O. An intersection is where two edge dies share a corner. When more than one corner is shared, such as for the edge dies that are also adjacent, only the closest corner to the center is the intersection. While many intersection 330 of two edge dies may be found on one WLP semiconductor structure, the length D is measured from the intersection 330 that is closest to the center O. In some embodiments, thecarrier 300 is a circle and the length D is a portion of a radius of thecarrier 300. In some embodiments when D1 is different from D2, the length D is an average of lengths D1 and D2 from different intersections 330. The length D is the mean value of D1 and D2. When there are more than two different lengths, the length D is the mean value of all different lengths. In some embodiments, the length D is determined to be a peripheral inset distance from the edge of the carrier, as opposed to a distance from the center. - A
boundary 710 is determined to separate the dies 320 into two zones. For a circular carrier, theboundary 710 is a circle having a radius length D. Afirst zone 715 is defined as a region between the origin O and theboundary 710. Asecond zone 716 is defined as a region between theboundary 710 and the edge of thecarrier 300. - In some embodiments, the boundary is defined by a distance from an edge die to the edge of the carrier. As in
FIG. 9B , thecarrier 300 is in a quadrilateral shape. Dies 320 including edge dies 320E are disposed on thecarrier 300. Aboundary 710A is defined by a peripheral inset distance to each edge die 320E. In certain embodiments, the peripheral inset distance to each edge die is smaller than 20% of the largest dimension of the dummy block to be placed on. For dummy block in a circular shape, the largest dimension is the diameter of the dummy block. For dummy block in a rectangular shape, the largest dimension is the longest edge of the dummy block. The peripheral inset distance can be different for each edge die. As inFIG. 9B , there are four different peripheral inset distances, D1, D2, D3, and D4 to determine theboundary 710A. - In some embodiments, a coverage ratio of each abovementioned categorized or defined zone is calculated to determine the specified uncovered area. The coverage ratio is defined as dividing a total die area in one zone with the carrier's top surface area in the same zone.
-
FIG. 10 is a flow chart including some operations of determining the specified uncovered area by considering the coverage ratio of each defined zone. Inoperation 802, a coverage ratio in thefirst zone 715 is calculated to be as R1. Inoperation 804, a coverage ratio in thesecond zone 716 is calculated to be as R2. Inoperation 806, a coverage ratio difference between R1 and R2 is calculated. Inoperation 808, the coverage ratio difference is compared with a predetermined value P. If the coverage ratio difference is greater than P, a specified uncovered area is determined inoperation 810. The specified uncovered area is determined to be a location in a zone with the lower coverage ratio. For example, if the coverage ratio in thefirst zone 715 is greater than the coverage ratio in thesecond zone 716, i.e. R1>R2, the specified uncovered area is located in thesecond zone 716. - In some embodiments, the predetermined value P is about 30%. In one example, the first zone's coverage ratio is about 81% and the second zone's coverage ratio is about 37%. A coverage ratio difference between the two zones is about 47%, which is grater than P. Some locations in the
second zone 716 are determined to be an uncovered area for placing a dummy block or dummy blocks thereon. The coverage ratio, R2, of the second zone is increased after placing the dummy block on the uncovered area. In the example, R2 is increased to about 51%. Thus, the coverage ratio difference between the first and second zone is reduced to be about 30%, which is equal to P. As such, warpage of the WLP semiconductor structure is adjusted. In some embodiments, the predetermined value P is smaller than 30%, and is, for example, 25%, 16%, 10%, etc. - In some embodiments, the predetermined value P is about 10%. In one example, the first zone's coverage ratio is about 76% and the second zone's coverage ratio is about 91%. A coverage ratio difference between the two zones is about 15%, which is grater than P. Some locations in the
first zone 715 are determined to be an uncovered area for placing a dummy block or dummy blocks thereon. The coverage ratio, R1, of thefirst zone 715 is increased after placing the dummy block on the uncovered area. In this example, R1 is increased to about 85%. Thus, the coverage ratio difference between the first and second zone is reduced to be about 6%, which is smaller than P. As such, warpage of the WLP semiconductor structure is adjusted. -
FIG. 11 is a top view of a WLP semiconductor structure having a dummy block at the edge. Aboundary 710 is selected to define the WLP semiconductor structure into afirst zone 715 and azone 716. Thezone 716 is between theboundary 710 and the WLP's edge. Adummy block 325 is placed in thesecond zone 716 and close to the edge of the WLP semiconductor structure. Thedummy block 325 increases the area coverage ratio in thesecond zone 716. Thus, warpage of the WLP semiconductor structure is adjusted. - In some embodiments, the specified uncovered area is determined to be in various locations in both zones. For example, a top surface of a WLP semiconductor structure is defined into a first zone and a second zone. The first zone has an area coverage ratio about 89%. The second zone has an area coverage ratio about 67%. The coverage ratio difference is about 22%. The predetermined value P is about 13%. Some locations in the first zone are defined as a first uncovered area and some locations in the second zone are defined as a second uncovered area. Dummy blocks are placed on the first uncovered area to increase the area coverage ratio from about 89% to 93%. Some other dummy blocks are placed on the second uncovered area to increase the area coverage ratio from about 67% to about 83%. Thus, the coverage ratio difference is reduced from about 22% to about 10% (93%-83%).
- In some embodiments, the specified uncovered area is determined to be in some locations covering both zones.
FIG. 12 is a WLP semiconductor structure having dummy blocks in both afirst zone 715 and asecond zone 716. Dummy blocks 325A are placed in thefirst zone 715. Some dummy blocks, such as 325B are placed in thesecond zone 716. Some dummy blocks, such as 325C are placed across theboundary 710. - In the present disclosure, there is no limitation on the arrangement of the specified uncovered area or dummy blocks on the WLP semiconductor structure as long as the warpage of the WLP semiconductor structure is adjusted to a desired range. In some embodiments, the specified uncovered area is arranged symmetrically to a center of a WLP semiconductor structure.
FIG. 13 is aWLP semiconductor structure 100 having acarrier 300. Thecarrier 300 has acenter 304. Some dies 320 are placed on thecarrier 300. Dummy blocks such as 325 are placed symmetrically to thecenter 304. In some embodiments, the specified uncovered area is arranged in a random manner on WLP semiconductor structure.FIG. 14 is aWLP semiconductor structure 100 having acarrier 300. Thecarrier 300 has acenter 304. Dies 320 are placed on thecarrier 300. Dummy blocks such as 325 are placed randomly to thecenter 304. There is no specific pattern for the arrangement of the specified covered area. -
FIG. 15 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. Inoperation 102, some dies are attached to a top surface of a carrier. In the present method, anoperation 102A of determining a CTE of a dummy block is introduced before anoperation 104. In theoperation 104, some dummy blocks are placed on a specified uncovered area of the top surface. Inoperation 106, depositing a molding compound over the top surface. In some embodiments, theoperation 102A is introduced before theoperation 102. - In some embodiments, the CTE of the dummy block is determined by a CTE of the dies and a CTE of the carrier. The CTE of the dummy block is between the CTE of the dies and the CTE of the carrier. In certain embodiments, the dies are made with silicon, which has a CTE around 3 ppm/K. The carrier is glass made with silicon dioxide, which has a CTE between around 3 ppm/K and 11 ppm/K. in other embodiments, the material of the dummy block has a CTE around 2.5 ppm/K. In certain embodiments, the dummy block is a rubber or a polymer material such as epoxy, polyimide, polybenzoxazole (PBO), and the like.
- In some embodiments, the CTE of the dummy block is substantially equal to the CTE of the dies. In certain embodiments, the dies are made with silicon, which has a CTE around 3 ppm/K. The carrier is glass made with silicon dioxide, which has a CTE around 3.7 ppm/K. The material of the dummy block has a CTE around 3 ppm/K.
- In some embodiments, an operation of determining a CTE of the carrier is introduced before the
operation 102. In certain embodiments, an effective CTE of the dies in theoperation 102 and the molding compound in theoperation 106 determine the CTE of the carrier. The effective CTE is calculated in accordance with the CTE of each element and the weighting factor of that element. For example, in certain embodiments, the dies are silicon having a CTE around 3 ppm/K; the molding compound is an epoxy, which has a CTE around 55 ppm/K. The effective CTE is calculated by the following formula: -
Alpha(effective CTE)=(V1*E1*A1+V2*E2*A2)/(Eeff); - wherein the Eeff (Effective Yonug's Modulus)=V1E1+V2E2; V1 and V2 is respectively a volume fraction of a first material and a second material. In some embodiments, the first material is silicon and the second material is molding compound. E1 and E2 is the Young's modulus of the first material and the second material. A1 and A2 is the CTE of the first material and the second material.
- According to some embodiments of the present disclosure, a method of manufacturing a semiconductor structure includes several operations. One operation includes attaching a plurality of dies to a top surface of a carrier. On operation includes placing a plurality of dummy blocks on a specified uncovered area of the top surface. One operation includes placing a molding compound over the top surface of the carrier. The plurality of dummy blocks has a coefficient of thermal expansion (CTE) between a CTE of the plurality of dies and the carrier.
-
FIG. 16 is a flow diagram of a method of manufacturing a WLP semiconductor structure in accordance with some embodiments of the present disclosure. Inoperation 102, some dies are attached to a top surface of a carrier. Inoperation 104, some dummy blocks are placed on a specified uncovered area of the top surface. Inoperation 106, depositing a molding compound over the top surface. In some embodiments, an operation of determining the specified uncovered area is introduced before placing the dummy block thereon. In operation 108, the molding compound is grounded to have the dummy block and the dies exposed. Inoperation 110, a redistribution layer (RDL) is placed on the molding compound and electrically connected with the dies. - The RDL is formed with gold, silver, copper, nickel, tungsten, aluminum, and/or alloys, or other suitable materials. The operation of forming an RDL includes forming a conductive material on the molding compound and pattering the conductive material into conductive interconnects. It is required to have a controlled warpage for the WLP semiconductor structure in order to patterning the conductive material into a desired pattern of the RDL.
- Warpage of a WLP semiconductor structure is defined as in
FIG. 17 . An exemplaryWLP semiconductor structure 100 has ahighest point 710 and alowest point 705 on its surface. Line WW′ is used as a baseline to measure a vertical distance to thehighest point 710 and thelowest point 705. Thehighest point 710 has a distance L2 from line WW′ and thelowest point 705 has a distance L1 from line WW. Warpage of the WLP semiconductor structure is defined by subtracting L2 from L1. Warpage in a positive value means the top surface of theWLP semiconductor structure 100 is bent convexly as inFIG. 17 . In one example, the warpage is 200 μm, which means L2−L1=200 μm. When the warpage is a negative value, theWLP semiconductor structure 100 is concave. - In some embodiments, some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 0, which means that the WLP semiconductor structure has a flat surface. In some embodiments, some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 100 μm, which means that the top surface (where the dummy is put on) of the WLP semiconductor structure is convex by 100 μm. In contrast, a negative wargape value means that the top surface of the WLP semiconductor structure in concave. In some embodiments, some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 250. In some embodiments, some dummy dies are placed on the WLP semiconductor structure to make the warpage of the WLP semiconductor structure substantially equal to 500. In some embodiments, the
WLP semiconductor structure 100 has a warpage between about 0 and 500. In certain embodiments, a convex top surface of the WLP semiconductor structure provides a larger window for the proceeding patterning and metallization process. -
FIG. 18 is aWLP semiconductor structure 100 in accordance to some embodiments of the present disclosure. TheWLP semiconductor structure 100 has acarrier 300. Thecarrier 300 has some dies 320 on atop surface 310 of thecarrier 300. Some dummy blocks 325 are disposed on thetop surface 310. Amolding compound 600 is on thetop surface 310 and surrounds the dies and dummy blocks 325. The dummy blocks 325 adjust the warpage of theWLP semiconductor structure 100. In the present embodiments, thetop surface 310 is substantially flat. - The WLP semiconductor structure has a total coverage that is defined as dividing the area covered by the dies 320 with the area of the
top surface 310. In certain embodiments, the total coverage is between about 30% to about 95%. - In certain embodiments, the dummy block include silicon, silicon oxide, silicon nitride, aluminum oxide, metal alloy, solder paste and other suitable material. The dummy block has a CTE between about 2.5 ppm/K and 10 ppm/K.
-
FIG. 19 is aWLP semiconductor structure 100 in accordance to some embodiments of the present disclosure. TheWLP semiconductor structure 100 has a dielectric 610 on themolding compound 600. The dielectric 610 includes silicon oxide, silicon oxynitride, silicon nitride, epoxy, polyimide, PBO, and other suitable material. There are severalconductive pillars 525 in the dielectric 610. Theconductive pillar 525 is electrically connected with adie 325 at one end. The conductive pillar is formed with a conductive material such as gold, silver, copper, nickel, tungsten, aluminum, tin and/or alloys thereof. AnRDL 550 is on the dielectric 610. TheRDL 550 is connected with theconductive pillar 525 at one end. -
FIG. 20 is a WLP semiconductor structure in accordance to some embodiments of the present disclosure. The WLP semiconductor structure is similar to theWLP semiconductor structure 100 inFIG. 16 . The WLP semiconductor structure has adummy block 325 at edges of thecarrier 300. Thedummy block 325 is a ring around the edge and it shows as two blocks in a cross sectional view as inFIG. 18 . The WLP semiconductor structure has a warpage because CTE mismatch. The warpage is adjusted by the dummy block to have a desired shape. In some embodiments as inFIG. 18 , the warpage of the WLP semiconductor structure is adjusted to make thetop surface 310 become a convex surface. -
FIG. 21 is a WLP semiconductor structure in accordance to some embodiments of the present disclosure. The WLP semiconductor structure has a warpage and hasRDL 550 on a dielectric 610. - According to some embodiments of the present disclosure, a method of manufacturing a semiconductor structure includes several operations. The method includes attaching a plurality of dies to a top surface of a carrier; placing a dummy block on a specified uncovered area of the top surface; and depositing a molding compound over the top surface of the carrier. The dummy block has a coefficient of thermal expansion (CTE) between a CTE of the dies and the carrier.
- In certain embodiments, a method of manufacturing a semiconductor structure includes determining the specified uncovered area.
- In certain embodiments, a method of manufacturing a semiconductor structure includes categorizing the plurality of dies into two different zones.
- According to some embodiments of the present disclosure, a method of manufacturing a semiconductor structure includes several operations. An operation includes placing a plurality of dies on a carrier. An operation includes defining a first zone and a second zone in a top surface of the carrier. An operation includes calculating a first coverage ratio in the first zone. An operation includes calculating a second coverage ratio in the second zone. An operation includes disposing a dummy block on a specified location of the top surface of the carrier if the difference between the first coverage ratio and the second coverage ratio is greater than a predetermined value. An operation includes forming a molding compound on the carrier.
- In certain embodiments, a method of manufacturing a semiconductor structure includes calculating an efficient coefficient of thermal expansion of the semiconductor structure.
- In certain embodiments, a method of manufacturing a semiconductor structure includes defining a boundary between the first zone and the second zone.
- In certain embodiments, a method of manufacturing a semiconductor structure includes defining a boundary between the first zone and the second zone includes determining a length on the top surface of the carrier, wherein the length is a shortest distance measured from an intersection of two edge dies to a center of the carrier.
- According to some embodiments of the present disclosure, a semiconductor wafer level package has several features. A feature includes a carrier. A feature includes several dies on the carrier. A feature includes a dummy block on a specified location on the carrier not covered by a die. A feature includes a molding compound on the carrier.
- The methods and features of this invention have been sufficiently described in the above examples and descriptions. It should be understood that any changes, substitutions, alterations or modifications without departing from the spirit of the invention are intended to be covered in the protection scope of the present disclosure.
- Moreover, the scope of the present application is not intended to be limited to the particular embodiments of the process, machine, manufacture, and composition of matter, means, methods and steps described in the specification. As those skilled in the art will readily appreciate form the disclosure of the present disclosure, processes, machines, manufacture, compositions of matter, means, methods, or steps, presently existing or later to be developed, that perform substantially the same function or achieve substantially the same result as the corresponding embodiments described herein may be utilized according to the present disclosure.
- Accordingly, the appended claims are intended to include within their scope such as processes, machines, manufacture, and compositions of matter, means, methods or steps. In addition, each claim constitutes a separate embodiment, and the combination of various claims and embodiments are within the scope of the invention.
Claims (20)
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US11133257B2 (en) | 2013-05-28 | 2021-09-28 | Intel Corporation | Bridge interconnection with layered interconnect structures |
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US20160071744A1 (en) * | 2013-10-02 | 2016-03-10 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device and manufacturing method thereof |
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