US20150048498A1 - Alignment Structures and Methods of Forming Same - Google Patents
Alignment Structures and Methods of Forming Same Download PDFInfo
- Publication number
- US20150048498A1 US20150048498A1 US13/969,027 US201313969027A US2015048498A1 US 20150048498 A1 US20150048498 A1 US 20150048498A1 US 201313969027 A US201313969027 A US 201313969027A US 2015048498 A1 US2015048498 A1 US 2015048498A1
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- forming
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- ppi
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- molding compound
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- 238000000034 method Methods 0.000 title claims abstract description 79
- 238000000465 moulding Methods 0.000 claims abstract description 47
- 150000001875 compounds Chemical class 0.000 claims abstract description 44
- 239000000758 substrate Substances 0.000 claims abstract description 43
- 238000002161 passivation Methods 0.000 claims abstract description 42
- 230000008569 process Effects 0.000 claims description 37
- 239000004065 semiconductor Substances 0.000 claims description 14
- 229920002120 photoresistant polymer Polymers 0.000 claims description 12
- 238000005520 cutting process Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 7
- 229910052802 copper Inorganic materials 0.000 claims description 7
- 239000010949 copper Substances 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 239000010931 gold Substances 0.000 claims description 7
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- 229910052709 silver Inorganic materials 0.000 claims description 5
- 239000004332 silver Substances 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 4
- 238000007747 plating Methods 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 238000000059 patterning Methods 0.000 claims description 3
- 229920000333 poly(propyleneimine) Polymers 0.000 abstract description 3
- 229910000679 solder Inorganic materials 0.000 description 10
- 239000004020 conductor Substances 0.000 description 9
- 238000001465 metallisation Methods 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 4
- 238000000231 atomic layer deposition Methods 0.000 description 4
- UMIVXZPTRXBADB-UHFFFAOYSA-N benzocyclobutene Chemical compound C1=CC=C2CCC2=C1 UMIVXZPTRXBADB-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000005240 physical vapour deposition Methods 0.000 description 4
- 229920002577 polybenzoxazole Polymers 0.000 description 4
- 238000005530 etching Methods 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 2
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- -1 SOI Chemical compound 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 229920000840 ethylene tetrafluoroethylene copolymer Polymers 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000005499 meniscus Effects 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- QHSJIZLJUFMIFP-UHFFFAOYSA-N ethene;1,1,2,2-tetrafluoroethene Chemical group C=C.FC(F)=C(F)F QHSJIZLJUFMIFP-UHFFFAOYSA-N 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- MSNOMDLPLDYDME-UHFFFAOYSA-N gold nickel Chemical compound [Ni].[Au] MSNOMDLPLDYDME-UHFFFAOYSA-N 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- LQBJWKCYZGMFEV-UHFFFAOYSA-N lead tin Chemical compound [Sn].[Pb] LQBJWKCYZGMFEV-UHFFFAOYSA-N 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012778 molding material Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
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- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/5442—Marks applied to semiconductor devices or parts comprising non digital, non alphanumeric information, e.g. symbols
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- H01L2223/54426—Marks applied to semiconductor devices or parts for alignment
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- H01L2223/54453—Marks applied to semiconductor devices or parts for use prior to dicing
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/023—Redistribution layers [RDL] for bonding areas
- H01L2224/0233—Structure of the redistribution layers
- H01L2224/02331—Multilayer structure
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- H01L2224/034—Manufacturing methods by blanket deposition of the material of the bonding area
- H01L2224/03444—Manufacturing methods by blanket deposition of the material of the bonding area in gaseous form
- H01L2224/0345—Physical vapour deposition [PVD], e.g. evaporation, or sputtering
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/03—Manufacturing methods
- H01L2224/034—Manufacturing methods by blanket deposition of the material of the bonding area
- H01L2224/03444—Manufacturing methods by blanket deposition of the material of the bonding area in gaseous form
- H01L2224/03452—Chemical vapour deposition [CVD], e.g. laser CVD
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/03—Manufacturing methods
- H01L2224/039—Methods of manufacturing bonding areas involving a specific sequence of method steps
- H01L2224/0391—Forming a passivation layer after forming the bonding area
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0401—Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
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- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05005—Structure
- H01L2224/05008—Bonding area integrally formed with a redistribution layer on the semiconductor or solid-state body, e.g.
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- H01L2224/05541—Structure
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- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05569—Disposition the external layer being disposed on a redistribution layer on the semiconductor or solid-state body
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- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05617—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/05624—Aluminium [Al] as principal constituent
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- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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Definitions
- Semiconductor devices are used in a variety of electronic applications, such as personal computers, cell phones, digital cameras, and other electronic equipment, as examples. Semiconductor devices are typically fabricated by sequentially depositing insulating or dielectric layers, conductive layers, and semiconductor layers of material over a semiconductor substrate, and patterning the various material layers using lithography to form circuit components and elements thereon.
- solder ball grid arrays are a technique sometimes used to join substrate, dies or packages, with an array of solder balls deposited on the bonding pads of a first substrate, and with a second substrate, die or package joined at its own bonding pad sites to the first pad via the solder balls.
- a molding compound or other supporting structures may be applied around the connecter structures to provide support, protection, and insulation. In some instances, the connectors and molding compound may be applied to the surface of dies formed on a wafer prior to the die being cut, or singulated for mounting on a board or carrier.
- FIGS. 1 through 8 illustrate cross-sectional views of intermediate stages in the manufacturing of an alignment structure in accordance with an embodiment
- FIG. 9 illustrates a process flow of the process illustrated in FIGS. 1 through 8 in accordance with an embodiment
- FIGS. 10A through 10C illustrate top-views of alignment structures in accordance with embodiments
- FIG. 11 illustrates a top-view of a die with alignment structures in accordance with an embodiment
- FIG. 12 illustrates a top-view of a die with alignment structures in accordance with another embodiment
- FIG. 13 illustrates a top-view of multiple dies with alignment structures in accordance with an embodiment.
- Embodiments will be described with respect to a specific context, namely making and using alignment structures useful in, for example, wafer level chip scale package (WLCSP) assemblies. Other embodiments may also be applied, however, to substrates, packages, structures or devices or combinations of any type of integrated circuit device or component.
- WLCSP wafer level chip scale package
- FIGS. 1 through 8 are cross-sectional views of intermediate stages in the manufacturing of an alignment structure in accordance with an embodiment
- FIG. 9 is a process flow of the process shown in FIGS. 1 through 8 .
- FIG. 1 illustrates a semiconductor device 100 in an intermediate stage of manufacture.
- the semiconductor device 100 may include a substrate 102 , metallization layers 104 , a contact pad 106 , a first passivation layer 108 , and a second passivation layer 110 .
- the substrate 102 is a part of a wafer.
- the substrate 102 may be made of a semiconductor material such as silicon, germanium, diamond, or the like.
- compound materials such as silicon germanium, silicon carbide, gallium arsenic, indium arsenide, indium phosphide, silicon germanium carbide, gallium arsenic phosphide, gallium indium phosphide, combinations of these, and the like, may also be used.
- the substrate 102 may be a silicon-on-insulator (SOI) substrate.
- SOI substrate includes a layer of a semiconductor material such as epitaxial silicon, germanium, silicon germanium, SOI, silicon germanium on insulator (SGOI), or combinations thereof.
- the substrate 102 may include active and passive devices (not shown in FIG. 1 ). As one of ordinary skill in the art will recognize, a wide variety of devices such as transistors, capacitors, resistors, combinations of these, and the like may be used to generate the structural and functional requirements of the design for semiconductor device 100 . The devices may be formed using any suitable methods. Only a portion of the substrate 102 is illustrated in the figures, as this is sufficient to fully describe the illustrative embodiments.
- the substrate 102 may also include one or more metallization layers 104 .
- the metallization layers 104 may be formed over the active and passive devices and are designed to connect the various devices to form functional circuitry.
- the metallization layers 104 may be formed of alternating layers of dielectric (e.g., low-k dielectric material) and conductive material (e.g., copper) and may be formed through any suitable process (such as deposition, damascene, dual damascene, or the like).
- FIG. 1 only illustrates one metallization layer 104 , it is within the contemplated scope of the present disclosure that there may be more metallization layers included in the substrate 102 .
- the contact pad 106 may be formed over and in electrical contact with the metallization layers 104 in order to help provide external connections to the active and passive devices.
- the contact pad 106 may be made of aluminum, an aluminum alloy, copper, a copper alloy, nickel, the like, or a combination thereof.
- the contact pad 106 may be formed using a deposition process, such as sputtering, to form a layer of material (not shown). Portions of the layer of material may then be removed through a suitable process, such as photolithographic masking and etching, to form the contact pad 106 . However, any other suitable process may be utilized to form contact pad 106 .
- the contact pad 106 may be formed to have a thickness of between about 0.5 ⁇ m and about 4 ⁇ m.
- a first passivation layer 108 may be formed on the substrate 102 and over the contact pad 106 .
- the first passivation layer 108 may be made of one or more suitable dielectric materials such as silicon oxide, silicon nitride, a polymer such as polyimide, solder resist, polybenzoxazole (PBO), benzocyclobutene (BCB), molding compound, the like, or a combination thereof.
- the first passivation layer 108 may be formed by various processes such as a spin-on process, chemical vapor deposition (CVD), although any suitable process may be utilized.
- the first passivation layer 108 may have a thickness from about 0.5 ⁇ m and about 30 ⁇ m. In some embodiments, a top surface of contact pad 106 and a portion of a bottom surface of the first passivation layer 108 are substantially level.
- an opening may be formed through the first passivation layer 108 to expose at least a portion of the underlying contact pad 106 .
- This opening through the first passivation layer 108 to expose the portion of the underlying contact pad 106 allows for physical and electrical contact between the contact pad 106 and the PPI 118 (discussed further below).
- the opening through the first passivation layer 108 may be formed using a suitable photolithographic mask and etching process, although any other suitable process to expose portions of the contact pad 106 may alternatively be used.
- the second passivation layer 110 may be formed over the contact pad 106 and the first passivation layer 108 .
- the second passivation layer 110 may be formed of similar materials and by similar processes as the first passivation layer 108 described above and the description will not be repeated herein, although the first passivation layer 108 and the second passivation layer 110 need not be the same.
- the second passivation layer 110 may be formed to have a thickness from about 2 ⁇ m and about 30 ⁇ m.
- an opening 112 through the second passivation layer 110 to expose at least a portion of the underlying contact pad 106 may be made.
- the opening 112 through the second passivation layer 110 to the underlying contact pad 106 allows for physical and electrical contact between the contact pad 106 and the subsequently formed seed layer 114 (discussed further below).
- the opening 112 through the second passivation layer 110 may be formed using a suitable photolithographic mask and etching process, although any suitable process to expose portions of the contact pad 106 may be used.
- a seed layer 114 is conformally deposited on the second passivation layer 110 and in the opening 112 as illustrated in FIG. 2 .
- the seed layer 114 may be formed by physical vapor deposition (PVD), CVD, atomic layer deposition (ALD), the like, or a combination thereof.
- the seed layer 114 may be made of titanium, copper, tantalum, tungsten, nitrides or oxynitrides thereof, the like, or a combination thereof.
- a post-passivation interconnect (PPI) 118 is formed (step 502 ) as illustrate in FIG. 3 .
- the PPI 118 is formed to extend through the second passivation layer 110 and to extend along the second passivation layer 110 .
- the PPI 118 may provide electrical connection between the contact pad 106 and the subsequently formed connector 32 (see FIG. 2 ).
- the conductive material of the PPI 118 may be deposited over the seed layer 114 and in the opening 112 .
- the conductive material may be formed by an electro-chemical plating process, CVD, ALD, PVD, the like, or a combination thereof.
- the conductive material of the PPI 118 is made of copper, tungsten, aluminum, silver, gold, the like, or a combination thereof.
- a photo resist 116 is formed and patterned on the seed layer 114 and then the PPI 118 is formed in the patterned photo resist 116 .
- the photoresist 116 may be formed by a wet process, such as a spin-on process, or by a dry process, such as by applying a dry film.
- the photo resist is omitted and the conductive material is formed on the seed layer 114 and then patterned to form the PPI 118 .
- FIG. 4 illustrates the removal of the photoresist 116 .
- the photoresist 116 may be removed through a suitable removal process such as ashing or an etch process.
- FIG. 5 illustrates the forming and patterning of a photoresist over the PPI 118 and the seed layer 114 .
- the photoresist 120 may be formed by a wet process, such as a spin-on process, or by a dry process, such as by applying a dry film.
- the photoresist 120 is patterned to form openings 122 and 124 exposing a top surface 118 A of the PPI 118 in the openings 122 and 124 .
- a single opening 124 and a single opening 122 are illustrated in FIG. 5 , there may be more openings 122 and/or 124 depending on the design of the semiconductor device 100 .
- FIG. 6 illustrates the formation of a conductive pillar 126 on the PPI 118 (step 504 ) and the formation of an alignment structure 128 on the PPI 118 (step 506 ).
- the conductive pillar 126 provides electrical connection between the PPI 118 and the subsequently formed connector 132 (see FIG. 8 ).
- the alignment structure 128 provides for alignment of substrate 102 after the substrate 102 is covered by a molding material (see molding compound 130 in FIGS. 7 and 8 ) during the sawing process to singulate the wafer into multiple dies (e.g. dies 200 and 300 in FIGS. 11 through 13 ).
- the conductive material of the conductive pillar 126 and the alignment structure 128 may be deposited on the PPI 118 in the openings 122 and 124 , respectively.
- the conductive material may be formed by an electro-chemical plating process, CVD, ALD, PVD, the like, or a combination thereof.
- the conductive material of the conductive pillar 126 and the alignment structure 128 is made of copper, tungsten, aluminum, silver, gold, the like, or a combination thereof.
- the conductive pillar 126 and the alignment structure 128 are formed at a same time by a same process. In other embodiments, the conductive pillar 126 and the alignment structure 128 are formed at different times by different processes.
- the PPI 118 , the conductive pillar 126 , and the alignment structure 128 have a same material composition.
- FIG. 7 illustrates the removal of the photoresist 120 and the formation of a molding compound 130 (step 508 ) on the PPI 118 and the second passivation layer 110 and surrounding the conductive pillar 126 and the alignment structure 128 .
- the molding compound 130 may protect the conductive pillar 126 and the underlying PPI 118 from subsequent processing.
- the molding compound 130 is a nonconductive material, such as an epoxy, a resin, polyimide, polybenzoxazole (PBO), benzocyclobutene (BCB), a silicone, an acrylate, the like, or a combination thereof.
- the molding compound 130 is dispensed in a liquid form.
- the molding compound 130 may be formed to have a top surface 130 A below top surfaces 126 A and 128 A of the conductive pillar 126 and the alignment structure 128 , respectively.
- the top surfaces 130 A, 128 A, and 126 A are substantially level.
- the molding compound 130 is pressure molded by a molding layer (not shown) and a release layer (not shown).
- the release layer may be made of ethylene tetrafluoroethylene (ETFE), polytetrafluoroethylene (PTFE), the like, or a combination thereof.
- the molding compound 130 may be shaped by the molding layer. The molding process may cause more of the conductive pillar 126 and the alignment structure 128 to extend above the top surface 130 A of the molding compound 130 . In some embodiments, the top surface 130 A of the molding compound 130 is curved after the molding process.
- the molding compound 130 is applied while substantially liquid, and then may be cured through a chemical reaction, such as in an epoxy or resin.
- the molding compound 130 is an ultraviolet (UV) cured polymer applied as a gel or malleable solid capable of being disposed on the PPI 118 and second passivation layer 110 and around or conforming to the surfaces of the conductive pillar 126 and the alignment structure 128 .
- UV ultraviolet
- FIG. 8 illustrates the formation of connector 132 (step 510 ) on the conductive pillar 126 .
- the alignment structure 128 does not have a connector formed over it to allow for the alignment structure 128 to be visible during the singulation process.
- the connector 132 may be a solder ball, a micro bump, a metal pillar, a controlled collapse chip connection (C 4 ) bump, an electroless nickel-electroless palladium-immersion gold technique (ENEPIG) formed bump, or the like.
- the connector 132 may be made of a conductive material such as solder, copper, aluminum, gold, nickel, silver, palladium, tin, the like, or a combination thereof.
- the connector 132 is formed by initially forming a layer of solder through such commonly used methods such as evaporation, electroplating, printing, solder transfer, ball placement, or the like. Once a layer of solder has been formed on the structure, a reflow may be performed in order to shape the material into the desired bump shape.
- a metal cap layer (not shown) is formed on the top of the conductive pillar 126 before the connector 132 is formed on the metal cap layer.
- the metal cap layer may include nickel, tin, tin-lead, gold, silver, palladium, indium, nickel-palladium-gold, nickel-gold, the like, or a combination thereof and may be formed by a plating process.
- the number of conductive pillars 126 , alignment structures 128 , and connectors 132 in FIG. 8 are only for illustrative purposes and are not limiting. There could be any suitable number of conductive pillars 126 , alignment structures 128 , and connectors 132 .
- FIGS. 10A through 10C illustrate top-views of alignment structures 128 in accordance with embodiments.
- FIG. 10A illustrates an L-shaped alignment structure 128 with portions extending in a first direction and a second direction, with the first direction being substantially perpendicular to the second direction.
- the alignment structure 128 has with a width W 1 , a length L 1 of a first portion, and a length L 2 of a second portion.
- the width W 1 , the length L 1 , and the length L 2 are each from about 20 ⁇ m to about 50 ⁇ m.
- FIG. 10B illustrates a plus-shaped alignment structure 128 which extends in four directions with two portions overlapping each other in each of their respective middle regions and the two portions being substantially perpendicular to each other.
- the first portion having a width W 2 and lengths L 3 and L 6 extending in opposite directions from the second portion.
- the second portion having a width W 3 and lengths L 4 and L 5 extending in opposite directions from the first portion.
- the widths W 2 and W 3 and the lengths L 3 , L 4 , L 5 , and L 6 are each from about 20 ⁇ m to about 50 ⁇ m.
- FIG. 10C illustrates a T-shaped alignment structure 128 which extends in three directions with two portions overlapping each other and the two portions being substantially perpendicular to each other.
- the first portion having a width W 4 and a length L 7 extending from the second portion.
- the second portion having a width W 5 and lengths L 8 and L 9 extending in opposite directions from the first portion.
- the widths W 4 and W 5 and the lengths L 7 , L 8 , and L 9 are each from about 20 ⁇ m to about 50 ⁇ m.
- FIGS. 10A through 10C illustrate three shapes for an alignment structure 128 , any shape of the alignment structure 128 such as a rectangle, a square, a triangle, a hexagon, or the like is within the contemplated scope of the present disclosure.
- FIG. 11 illustrates a top-view of a die 200 with alignment structures 128 and connectors 132 in accordance with an embodiment.
- the die 200 has four sides 200 A, 200 B, 200 C, and 200 D and four alignment structures 128 .
- the sides 200 A and 200 C being opposite each other and substantially parallel and sides 200 B and 200 B being opposite each other and substantially parallel.
- the sides 200 A and 200 C are substantially perpendicular to the sides 200 B and 200 D.
- Each of the alignment structures 128 are a distance D 1 from a first side (e.g. side 200 A in FIG. 11 ) of the die 200 , a distance D 2 from a second side (e.g. side 200 D in FIG.
- the alignment structures 128 have at least one side that is substantially parallel to a side ( 200 A, 200 B, 200 C, or 200 D) of the die 200 .
- FIG. 12 illustrates a top-view of a die 300 with more than one configuration of alignment structure 128 ( 128 _ 1 and 128 _ 2 in FIG. 12 ).
- the alignment structures 128 _ 1 are located near opposite corners of the die 300 and are both L-shaped alignment structures 128 as illustrated in FIG. 10A
- the alignment structures 128 _ 2 are located near opposite corners of the die 300 and are T-shaped alignment structures as illustrated in FIG. 10C .
- the alignment structures 128 _ 1 are used to align the die 300 in the X-direction and the alignment structures 128 _ 2 are used to align the die 300 in the Y-direction.
- the alignment structures 128 _ 1 are used to align the die 300 in the Y-direction and the alignment structures 128 _ 2 are used to align the die 300 in the X-direction. In another embodiment, the alignment structures 128 _ 1 and 128 _ 2 are both used to align the die 300 in the X-direction and the Y-direction. In some embodiments, the alignment structures 128 _ 1 and 128 _ 2 have at least one side that is substantially parallel to a side ( 200 A, 200 B, 200 C, or 200 D) of the die 300 .
- FIG. 13 illustrates a top-view of a wafer 400 with multiple dies 300 on the wafer 400 and each die 300 having alignment structures 128 ( 128 _ 1 and 128 _ 2 in FIG. 13 ) in accordance with an embodiment.
- the dies 300 were formed from a single wafer 400 and were singulated by a cutting apparatus using the alignment structures 128 to align the wafer and the cutting apparatus during the cutting process.
- the cutting apparatus includes a laser saw, a die saw, the like, or a combination thereof to cut through the substrate 102 to separate the dies 300 .
- the molding compound surrounding the conductive pillar and covering the underlying PPI protects and insulates those structures from subsequent processing. Also, applying the molding compound before the dies are singulated is more cost effective and provides better protection to the underlying structures than applying the molding compound after the singulation of the dies. However, the molding compound covers any marks or scribe lines on the wafer/dies and thus the alignment structures extending above the molding compound allow proper alignment of wafer/dies during the singulation process.
- An embodiment is a method of forming an interconnect structure, the method including forming a first post-passivation interconnect (PPI) over a first substrate, forming a second PPI over the first substrate, and forming a first conductive connector on the first PPI.
- the method further includes forming a second conductive connector on the second PPI, and forming a molding compound on top surfaces of the first and second PPIs and surrounding portions of the first and second connectors, a first section of molding compound being laterally between the first and second connectors, the first section of molding compound having a curved top surface.
- PPI post-passivation interconnect
- Another embodiment is a method of forming an interconnect structure, the method includes forming a contact pad on a top surface of a first substrate, forming a first passivation layer on the top surface of the first substrate, the first passivation layer being on a portion of a top surface of the contact pad, and forming a second passivation layer on the first passivation layer, the second passivation layer being on a portion of the top surface of the contact pad.
- the method further includes forming a first post-passivation interconnect (PPI) contacting the top surface of the contact pad and extending along the top surface of the second passivation layer, forming a first connector on the first PPI, depositing a molding compound over the second passivation layer, the first PPI, and the first connector, and applying a pressure mold to the molding compound, the molding compound having a concave meniscus top surface after the applying the pressure mold, the concave meniscus top surface has a concavity length from about 10 ⁇ m to about 50 ⁇ m.
- PPI post-passivation interconnect
- a further embodiment is an interconnect structure including a first post-passivation interconnect (PPI) over a first substrate, a first conductive connector on the first PPI, a second PPI over the first substrate, and a second conductive connector on the second PPI.
- the interconnect structure further includes a molding compound on top surfaces of the first and second PPIs and surrounding portions of the first and second connectors, a first section of molding compound being laterally between the first and second connectors, the first section of molding compound having a curved top surface.
Abstract
Description
- Semiconductor devices are used in a variety of electronic applications, such as personal computers, cell phones, digital cameras, and other electronic equipment, as examples. Semiconductor devices are typically fabricated by sequentially depositing insulating or dielectric layers, conductive layers, and semiconductor layers of material over a semiconductor substrate, and patterning the various material layers using lithography to form circuit components and elements thereon.
- The semiconductor industry continues to improve the integration density of various electronic components (e.g., transistors, diodes, resistors, capacitors, etc.) by continual reductions in minimum feature size, which allow more components to be integrated into a given area. Components of a package may be stacked using conductive connective structures to allow stacked components to communicate with each other, or with external components. For example, solder ball grid arrays are a technique sometimes used to join substrate, dies or packages, with an array of solder balls deposited on the bonding pads of a first substrate, and with a second substrate, die or package joined at its own bonding pad sites to the first pad via the solder balls. A molding compound or other supporting structures may be applied around the connecter structures to provide support, protection, and insulation. In some instances, the connectors and molding compound may be applied to the surface of dies formed on a wafer prior to the die being cut, or singulated for mounting on a board or carrier.
- For a more complete understanding of the present embodiments, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:
-
FIGS. 1 through 8 illustrate cross-sectional views of intermediate stages in the manufacturing of an alignment structure in accordance with an embodiment; -
FIG. 9 illustrates a process flow of the process illustrated inFIGS. 1 through 8 in accordance with an embodiment; -
FIGS. 10A through 10C illustrate top-views of alignment structures in accordance with embodiments; -
FIG. 11 illustrates a top-view of a die with alignment structures in accordance with an embodiment; -
FIG. 12 illustrates a top-view of a die with alignment structures in accordance with another embodiment; and -
FIG. 13 illustrates a top-view of multiple dies with alignment structures in accordance with an embodiment. - Reference will now be made in detail to embodiments illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts. In the drawings, the shape and thickness may be exaggerated for clarity and convenience. This description will be directed in particular to elements forming part of, or cooperating more directly with, methods and apparatus in accordance with the present disclosure. It is to be understood that elements not specifically shown or described may take various forms well known to those skilled in the art. Many alternatives and modifications will be apparent to those skilled in the art, once informed by the present disclosure.
- Reference throughout this specification to “one embodiment” or “an embodiment” means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment. Thus, the appearances of the phrases “in one embodiment” or “in an embodiment” in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be appreciated that the following figures are not drawn to scale; rather, these figures are merely intended for illustration.
- Embodiments will be described with respect to a specific context, namely making and using alignment structures useful in, for example, wafer level chip scale package (WLCSP) assemblies. Other embodiments may also be applied, however, to substrates, packages, structures or devices or combinations of any type of integrated circuit device or component.
-
FIGS. 1 through 8 are cross-sectional views of intermediate stages in the manufacturing of an alignment structure in accordance with an embodiment, andFIG. 9 is a process flow of the process shown inFIGS. 1 through 8 . -
FIG. 1 illustrates asemiconductor device 100 in an intermediate stage of manufacture. Thesemiconductor device 100 may include asubstrate 102,metallization layers 104, acontact pad 106, afirst passivation layer 108, and asecond passivation layer 110. In an embodiment, thesubstrate 102 is a part of a wafer. Thesubstrate 102 may be made of a semiconductor material such as silicon, germanium, diamond, or the like. Alternatively, compound materials such as silicon germanium, silicon carbide, gallium arsenic, indium arsenide, indium phosphide, silicon germanium carbide, gallium arsenic phosphide, gallium indium phosphide, combinations of these, and the like, may also be used. Additionally, thesubstrate 102 may be a silicon-on-insulator (SOI) substrate. Generally, an SOI substrate includes a layer of a semiconductor material such as epitaxial silicon, germanium, silicon germanium, SOI, silicon germanium on insulator (SGOI), or combinations thereof. - The
substrate 102 may include active and passive devices (not shown inFIG. 1 ). As one of ordinary skill in the art will recognize, a wide variety of devices such as transistors, capacitors, resistors, combinations of these, and the like may be used to generate the structural and functional requirements of the design forsemiconductor device 100. The devices may be formed using any suitable methods. Only a portion of thesubstrate 102 is illustrated in the figures, as this is sufficient to fully describe the illustrative embodiments. - The
substrate 102 may also include one ormore metallization layers 104. Themetallization layers 104 may be formed over the active and passive devices and are designed to connect the various devices to form functional circuitry. Themetallization layers 104 may be formed of alternating layers of dielectric (e.g., low-k dielectric material) and conductive material (e.g., copper) and may be formed through any suitable process (such as deposition, damascene, dual damascene, or the like). AlthoughFIG. 1 only illustrates onemetallization layer 104, it is within the contemplated scope of the present disclosure that there may be more metallization layers included in thesubstrate 102. - The
contact pad 106 may be formed over and in electrical contact with themetallization layers 104 in order to help provide external connections to the active and passive devices. Thecontact pad 106 may be made of aluminum, an aluminum alloy, copper, a copper alloy, nickel, the like, or a combination thereof. Thecontact pad 106 may be formed using a deposition process, such as sputtering, to form a layer of material (not shown). Portions of the layer of material may then be removed through a suitable process, such as photolithographic masking and etching, to form thecontact pad 106. However, any other suitable process may be utilized to formcontact pad 106. Thecontact pad 106 may be formed to have a thickness of between about 0.5 μm and about 4 μm. - A
first passivation layer 108 may be formed on thesubstrate 102 and over thecontact pad 106. Thefirst passivation layer 108 may be made of one or more suitable dielectric materials such as silicon oxide, silicon nitride, a polymer such as polyimide, solder resist, polybenzoxazole (PBO), benzocyclobutene (BCB), molding compound, the like, or a combination thereof. Thefirst passivation layer 108 may be formed by various processes such as a spin-on process, chemical vapor deposition (CVD), although any suitable process may be utilized. Thefirst passivation layer 108 may have a thickness from about 0.5 μm and about 30 μm. In some embodiments, a top surface ofcontact pad 106 and a portion of a bottom surface of thefirst passivation layer 108 are substantially level. - After the
first passivation layer 108 has been formed, an opening may be formed through thefirst passivation layer 108 to expose at least a portion of theunderlying contact pad 106. This opening through thefirst passivation layer 108 to expose the portion of theunderlying contact pad 106 allows for physical and electrical contact between thecontact pad 106 and the PPI 118 (discussed further below). The opening through thefirst passivation layer 108 may be formed using a suitable photolithographic mask and etching process, although any other suitable process to expose portions of thecontact pad 106 may alternatively be used. - The
second passivation layer 110 may be formed over thecontact pad 106 and thefirst passivation layer 108. Thesecond passivation layer 110 may be formed of similar materials and by similar processes as thefirst passivation layer 108 described above and the description will not be repeated herein, although thefirst passivation layer 108 and thesecond passivation layer 110 need not be the same. Thesecond passivation layer 110 may be formed to have a thickness from about 2 μm and about 30 μm. - After the
second passivation layer 110 has been formed, anopening 112 through thesecond passivation layer 110 to expose at least a portion of theunderlying contact pad 106 may be made. Theopening 112 through thesecond passivation layer 110 to theunderlying contact pad 106 allows for physical and electrical contact between thecontact pad 106 and the subsequently formed seed layer 114 (discussed further below). Theopening 112 through thesecond passivation layer 110 may be formed using a suitable photolithographic mask and etching process, although any suitable process to expose portions of thecontact pad 106 may be used. - After the opening through the
second passivation layer 110 has been formed, aseed layer 114 is conformally deposited on thesecond passivation layer 110 and in theopening 112 as illustrated inFIG. 2 . Theseed layer 114 may be formed by physical vapor deposition (PVD), CVD, atomic layer deposition (ALD), the like, or a combination thereof. Theseed layer 114 may be made of titanium, copper, tantalum, tungsten, nitrides or oxynitrides thereof, the like, or a combination thereof. - After the
seed layer 114 is formed, a post-passivation interconnect (PPI) 118 is formed (step 502) as illustrate inFIG. 3 . ThePPI 118 is formed to extend through thesecond passivation layer 110 and to extend along thesecond passivation layer 110. ThePPI 118 may provide electrical connection between thecontact pad 106 and the subsequently formed connector 32 (seeFIG. 2 ). The conductive material of thePPI 118 may be deposited over theseed layer 114 and in theopening 112. The conductive material may be formed by an electro-chemical plating process, CVD, ALD, PVD, the like, or a combination thereof. In an embodiment, the conductive material of thePPI 118 is made of copper, tungsten, aluminum, silver, gold, the like, or a combination thereof. In some embodiments, a photo resist 116 is formed and patterned on theseed layer 114 and then thePPI 118 is formed in the patterned photo resist 116. Thephotoresist 116 may be formed by a wet process, such as a spin-on process, or by a dry process, such as by applying a dry film. In other embodiments, the photo resist is omitted and the conductive material is formed on theseed layer 114 and then patterned to form thePPI 118. -
FIG. 4 illustrates the removal of thephotoresist 116. Thephotoresist 116 may be removed through a suitable removal process such as ashing or an etch process. -
FIG. 5 illustrates the forming and patterning of a photoresist over thePPI 118 and theseed layer 114. Thephotoresist 120 may be formed by a wet process, such as a spin-on process, or by a dry process, such as by applying a dry film. Thephotoresist 120 is patterned to formopenings top surface 118A of thePPI 118 in theopenings single opening 124 and asingle opening 122 are illustrated inFIG. 5 , there may bemore openings 122 and/or 124 depending on the design of thesemiconductor device 100. -
FIG. 6 illustrates the formation of aconductive pillar 126 on the PPI 118 (step 504) and the formation of analignment structure 128 on the PPI 118 (step 506). Theconductive pillar 126 provides electrical connection between thePPI 118 and the subsequently formed connector 132 (seeFIG. 8 ). Thealignment structure 128 provides for alignment ofsubstrate 102 after thesubstrate 102 is covered by a molding material (seemolding compound 130 inFIGS. 7 and 8 ) during the sawing process to singulate the wafer into multiple dies (e.g. dies 200 and 300 inFIGS. 11 through 13 ). The conductive material of theconductive pillar 126 and thealignment structure 128 may be deposited on thePPI 118 in theopenings conductive pillar 126 and thealignment structure 128 is made of copper, tungsten, aluminum, silver, gold, the like, or a combination thereof. In some embodiments, theconductive pillar 126 and thealignment structure 128 are formed at a same time by a same process. In other embodiments, theconductive pillar 126 and thealignment structure 128 are formed at different times by different processes. In an embodiment, thePPI 118, theconductive pillar 126, and thealignment structure 128 have a same material composition. -
FIG. 7 illustrates the removal of thephotoresist 120 and the formation of a molding compound 130 (step 508) on thePPI 118 and thesecond passivation layer 110 and surrounding theconductive pillar 126 and thealignment structure 128. Themolding compound 130 may protect theconductive pillar 126 and theunderlying PPI 118 from subsequent processing. In an embodiment, themolding compound 130 is a nonconductive material, such as an epoxy, a resin, polyimide, polybenzoxazole (PBO), benzocyclobutene (BCB), a silicone, an acrylate, the like, or a combination thereof. In some embodiments, themolding compound 130 is dispensed in a liquid form. In some embodiments, themolding compound 130 may be formed to have atop surface 130A belowtop surfaces conductive pillar 126 and thealignment structure 128, respectively. In another embodiment, thetop surfaces - In an embodiment, the
molding compound 130 is pressure molded by a molding layer (not shown) and a release layer (not shown). The release layer may be made of ethylene tetrafluoroethylene (ETFE), polytetrafluoroethylene (PTFE), the like, or a combination thereof. Themolding compound 130 may be shaped by the molding layer. The molding process may cause more of theconductive pillar 126 and thealignment structure 128 to extend above thetop surface 130A of themolding compound 130. In some embodiments, thetop surface 130A of themolding compound 130 is curved after the molding process. - In some embodiments, the
molding compound 130 is applied while substantially liquid, and then may be cured through a chemical reaction, such as in an epoxy or resin. In some other embodiments themolding compound 130 is an ultraviolet (UV) cured polymer applied as a gel or malleable solid capable of being disposed on thePPI 118 andsecond passivation layer 110 and around or conforming to the surfaces of theconductive pillar 126 and thealignment structure 128. -
FIG. 8 illustrates the formation of connector 132 (step 510) on theconductive pillar 126. As illustrated, thealignment structure 128 does not have a connector formed over it to allow for thealignment structure 128 to be visible during the singulation process. Theconnector 132 may be a solder ball, a micro bump, a metal pillar, a controlled collapse chip connection (C4) bump, an electroless nickel-electroless palladium-immersion gold technique (ENEPIG) formed bump, or the like. Theconnector 132 may be made of a conductive material such as solder, copper, aluminum, gold, nickel, silver, palladium, tin, the like, or a combination thereof. In an embodiment in which theconnector 132 is a solder bump, theconnector 132 is formed by initially forming a layer of solder through such commonly used methods such as evaporation, electroplating, printing, solder transfer, ball placement, or the like. Once a layer of solder has been formed on the structure, a reflow may be performed in order to shape the material into the desired bump shape. In some embodiments, a metal cap layer (not shown) is formed on the top of theconductive pillar 126 before theconnector 132 is formed on the metal cap layer. The metal cap layer may include nickel, tin, tin-lead, gold, silver, palladium, indium, nickel-palladium-gold, nickel-gold, the like, or a combination thereof and may be formed by a plating process. - The number of
conductive pillars 126,alignment structures 128, andconnectors 132 inFIG. 8 are only for illustrative purposes and are not limiting. There could be any suitable number ofconductive pillars 126,alignment structures 128, andconnectors 132. -
FIGS. 10A through 10C illustrate top-views ofalignment structures 128 in accordance with embodiments.FIG. 10A illustrates an L-shapedalignment structure 128 with portions extending in a first direction and a second direction, with the first direction being substantially perpendicular to the second direction. Thealignment structure 128 has with a width W1, a length L1 of a first portion, and a length L2 of a second portion. In some embodiments, the width W1, the length L1, and the length L2 are each from about 20 μm to about 50 μm. -
FIG. 10B illustrates a plus-shapedalignment structure 128 which extends in four directions with two portions overlapping each other in each of their respective middle regions and the two portions being substantially perpendicular to each other. The first portion having a width W2 and lengths L3 and L6 extending in opposite directions from the second portion. The second portion having a width W3 and lengths L4 and L5 extending in opposite directions from the first portion. In some embodiments, the widths W2 and W3 and the lengths L3, L4, L5, and L6 are each from about 20 μm to about 50 μm. -
FIG. 10C illustrates a T-shapedalignment structure 128 which extends in three directions with two portions overlapping each other and the two portions being substantially perpendicular to each other. The first portion having a width W4 and a length L7 extending from the second portion. The second portion having a width W5 and lengths L8 and L9 extending in opposite directions from the first portion. In some embodiments, the widths W4 and W5 and the lengths L7, L8, and L9 are each from about 20 μm to about 50 μm. AlthoughFIGS. 10A through 10C illustrate three shapes for analignment structure 128, any shape of thealignment structure 128 such as a rectangle, a square, a triangle, a hexagon, or the like is within the contemplated scope of the present disclosure. -
FIG. 11 illustrates a top-view of a die 200 withalignment structures 128 andconnectors 132 in accordance with an embodiment. Thedie 200 has foursides alignment structures 128. Thesides sides sides sides alignment structures 128 are a distance D1 from a first side (e.g.side 200A inFIG. 11 ) of thedie 200, a distance D2 from a second side (e.g.side 200D inFIG. 11 ) of thedie 200, a distance D3 from a firstadjacent alignment structure 128, and a distance D4 from a secondadjacent alignment structure 128. In some embodiments, the distances D1, D2, D3, and D4 are greater than or equal to about 200 μm. In an embodiment, each of the distances D1 and D2 are less than each of the distances D3 and D4. In some embodiments, thealignment structures 128 have at least one side that is substantially parallel to a side (200A, 200B, 200C, or 200D) of thedie 200. -
FIG. 12 illustrates a top-view of a die 300 with more than one configuration of alignment structure 128 (128_1 and 128_2 inFIG. 12 ). In some embodiments, the alignment structures 128_1 are located near opposite corners of thedie 300 and are both L-shapedalignment structures 128 as illustrated inFIG. 10A , and the alignment structures 128_2 are located near opposite corners of thedie 300 and are T-shaped alignment structures as illustrated inFIG. 10C . In an embodiment, the alignment structures 128_1 are used to align thedie 300 in the X-direction and the alignment structures 128_2 are used to align thedie 300 in the Y-direction. In another embodiment, the alignment structures 128_1 are used to align thedie 300 in the Y-direction and the alignment structures 128_2 are used to align thedie 300 in the X-direction. In another embodiment, the alignment structures 128_1 and 128_2 are both used to align thedie 300 in the X-direction and the Y-direction. In some embodiments, the alignment structures 128_1 and 128_2 have at least one side that is substantially parallel to a side (200A, 200B, 200C, or 200D) of thedie 300. -
FIG. 13 illustrates a top-view of awafer 400 with multiple dies 300 on thewafer 400 and each die 300 having alignment structures 128 (128_1 and 128_2 inFIG. 13 ) in accordance with an embodiment. In an embodiment, the dies 300 were formed from asingle wafer 400 and were singulated by a cutting apparatus using thealignment structures 128 to align the wafer and the cutting apparatus during the cutting process. In some embodiments, the cutting apparatus includes a laser saw, a die saw, the like, or a combination thereof to cut through thesubstrate 102 to separate the dies 300. - It has been found that the molding compound surrounding the conductive pillar and covering the underlying PPI protects and insulates those structures from subsequent processing. Also, applying the molding compound before the dies are singulated is more cost effective and provides better protection to the underlying structures than applying the molding compound after the singulation of the dies. However, the molding compound covers any marks or scribe lines on the wafer/dies and thus the alignment structures extending above the molding compound allow proper alignment of wafer/dies during the singulation process.
- An embodiment is a method of forming an interconnect structure, the method including forming a first post-passivation interconnect (PPI) over a first substrate, forming a second PPI over the first substrate, and forming a first conductive connector on the first PPI. The method further includes forming a second conductive connector on the second PPI, and forming a molding compound on top surfaces of the first and second PPIs and surrounding portions of the first and second connectors, a first section of molding compound being laterally between the first and second connectors, the first section of molding compound having a curved top surface.
- Another embodiment is a method of forming an interconnect structure, the method includes forming a contact pad on a top surface of a first substrate, forming a first passivation layer on the top surface of the first substrate, the first passivation layer being on a portion of a top surface of the contact pad, and forming a second passivation layer on the first passivation layer, the second passivation layer being on a portion of the top surface of the contact pad. The method further includes forming a first post-passivation interconnect (PPI) contacting the top surface of the contact pad and extending along the top surface of the second passivation layer, forming a first connector on the first PPI, depositing a molding compound over the second passivation layer, the first PPI, and the first connector, and applying a pressure mold to the molding compound, the molding compound having a concave meniscus top surface after the applying the pressure mold, the concave meniscus top surface has a concavity length from about 10 μm to about 50 μm.
- A further embodiment is an interconnect structure including a first post-passivation interconnect (PPI) over a first substrate, a first conductive connector on the first PPI, a second PPI over the first substrate, and a second conductive connector on the second PPI. The interconnect structure further includes a molding compound on top surfaces of the first and second PPIs and surrounding portions of the first and second connectors, a first section of molding compound being laterally between the first and second connectors, the first section of molding compound having a curved top surface.
- Although the present embodiments and their advantages have been described in detail, it should be understood that various changes, substitutions, and alterations can be made herein without departing from the spirit and scope of the disclosure as defined by the appended claims. Moreover, the scope of the present application is not intended to be limited to the particular embodiments of the process, machine, manufacture, composition of matter, means, methods, and steps described in the specification. As one of ordinary skill in the art will readily appreciate from the disclosure, processes, machines, manufacture, compositions of matter, means, methods, or steps, presently existing or later to be developed, that perform substantially the same function or achieve substantially the same result as the corresponding embodiments described herein may be utilized according to the present disclosure. Accordingly, the appended claims are intended to include within their scope such processes, machines, manufacture, compositions of matter, means, methods, or steps.
Claims (21)
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US20160268224A1 (en) | 2016-09-15 |
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