US20130251614A1 - Annealing of single crystals - Google Patents

Annealing of single crystals Download PDF

Info

Publication number
US20130251614A1
US20130251614A1 US13/899,708 US201313899708A US2013251614A1 US 20130251614 A1 US20130251614 A1 US 20130251614A1 US 201313899708 A US201313899708 A US 201313899708A US 2013251614 A1 US2013251614 A1 US 2013251614A1
Authority
US
United States
Prior art keywords
single crystal
single crystals
heat treatment
doped
rare
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US13/899,708
Inventor
Dominique Richaud
Alain Iltis
Vladimir Ouspenski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to US13/899,708 priority Critical patent/US20130251614A1/en
Publication of US20130251614A1 publication Critical patent/US20130251614A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/12Halides
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B33/00After-treatment of single crystals or homogeneous polycrystalline material with defined structure
    • C30B33/02Heat treatment

Definitions

  • the invention relates to a heat treatment applied to single crystals of rare-earth halides to improve their mechanical properties, and also to the use of these single crystals treated by the process to produce large-size parts for manufacturing detectors of ionizing radiation and large cleaved parts.
  • the compositions of the single crystals in question in the invention are scintillator materials based on rare-earth halides.
  • the single crystals in question in the present invention are those directly obtained by crystal growth or those obtained by fracture, generally uncontrolled, of larger single crystals, for example obtained by crystal growth.
  • Scintillator detectors are widely used for detecting gamma rays, X-rays, high-energy cosmic rays, charged particles having an energy between 1 keV and 10 MeV, between 1 keV and 1 Gev, between 1 keV and 10 GeV, thermal neutrons (the energy of which is typically less than 0.1 eV).
  • Scintillator detectors are used in numerous applications. Mention may be made, as non-exhaustive examples, of medical imaging (especially positron emission tomography systems, gamma cameras, CT scanners), crude oil exploration (well-logging), equipment for detecting and identifying fissile or radioactive materials, experiments in nuclear and high-energy physics, detectors for astrophysics or else industrial control.
  • a scintillator detector is composed of a scintillator material which converts the energy of the particles or radiation absorbed to ultraviolet or visible or infrared light and a photon collector which captures the light emitted and converts it to an electrical signal.
  • the scintillator materials are in the form of a powder, of single crystals, of transparent polycrystalline ceramics, of glasses, of plastics and of liquids.
  • the single-crystal materials that is to say parts which, on the scale of use, are composed of a single crystal (at most a few crystals), are particularly suitable for producing scintillators.
  • the use of single crystals has several advantages.
  • the single crystals Compared to polycrystalline materials, for parts of large thickness, the single crystals offer a better transparency and therefore a better extraction of the light due to the absence of grain boundaries and defects responsible for the dissipation of light in the solid. In the applications, when it is possible, the single crystals are preferred materials for scintillation.
  • the photon collectors may be photomultiplier tubes or any light converter compatible with the emission wavelength of the material (example: photodiodes, avalanche photodiodes, etc.).
  • Rare-earth halides are materials known in the field of scintillator materials.
  • the article by K. Krämer et al. (Development and characterization of highly efficient new cerium doped rare earth halide scintillator materials, J. Mater. Chem., 2006, 16, pp. 2773-2780), gives several examples of these scintillator crystals doped with cerium and which are characterized by a combination of good scintillation properties such as good energy resolution, a high light yield and a rapid response.
  • LaBr 3 doped with 5 mol % of cerium has an energy resolution of 2.6% under excitation at 662 keV (main gamma emission of 137 Cs), a light yield of 70 000 photons per MeV and a scintillation decay time of 16 ns.
  • cerium-doped Lul 3 which has an energy resolution of 3.3% at 662 keV, a light yield of 95 000 photons per MeV and a scintillation decay time of 24 ns for the main light component.
  • C. van Eijk et al. Development of elpasolite and monoclinic thermal neutron scintillators, 2005 IEEE Nucl. Sci.
  • Cs 2 LiYCl 6 doped with 0.1 mol % of cerium Cs 2 LiLaCl 6 doped with 1 mol % of cerium
  • Rb 2 LiYl 6 doped with 0.5 mol % of cerium Rb 2 LiYl 6 doped with 0.5 mol % of cerium
  • Li 3 YBr 6 doped with 0.5 mol % of cerium which respectively have light yields at 662 keV of 18 000 photons per MeV, 28 000 photons per MeV, 7000 photons per MeV and 6000 photons per MeV.
  • Other non-exhaustive examples of compounds based on rare-earth halides for scintillation cited in the literature are: LaBr 3 doped with praseodymium (J.
  • Rare-earth halides are difficult to produce in the form of single crystals. This is because these compounds are very reactive with oxygen and water vapour. The chemical reaction at high temperature with oxygen and water vapour is irreversible and the crystals must therefore be crystallized in such a way that any reaction with these elements is impossible.
  • the solution is to carry out the crystal growth in a device that is airtight, under vacuum or under an atmosphere that is not reactive with respect to the crystal.
  • Another aspect is the crystal growth, without fracturing and without residual mechanical stresses, of single crystals that are sufficiently large to produce large-size detectors. This is because mechanical stresses of thermal origin are created within the crystals during growth and during cooling in the growth furnace (J. Völkl, “Stress in cooling crystal” in Handbook of Crystal Growth, Ed. North Holland, Edited by D. T. J. Hurle, 1994, ISBN 0-444-81554-6, pp. 821-874).
  • the mechanical stresses may be very high and may even exceed the strength of the materials and cause fracturing of the single crystals into several pieces. Even when the process is optimized to avoid fracturing during crystal growth and cooling, a large portion of residual stresses remain in the single crystals. In the best of cases, these residual stresses are not sufficient to cause fracturing of the crystals but, during the machining steps (for example cutting, milling, turning, polishing, etc.) microcracks develop in the materials and propagate under the effect of the residual stresses, which finally causes fracturing of the single crystals. This problem makes it very difficult to produce single-crystal parts for the production of detectors, especially to produce large-size single-crystal parts.
  • Cleavage is a distinctive feature that certain single crystals have of fracturing along certain precise crystalline planes when they are subjected to an impact or to a mechanical stress.
  • the cleaved surfaces are extremely flat, even and have no roughness and they may be used for producing very high quality surfaces.
  • the cleavage process is normally disrupted by the formation of numerous macroscopic steps and/or parasitic breaks that do not follow the crystalline cleavage plane.
  • the cleaved surface will then be highly irregular.
  • a good cleaved surface has few or no macroscopic steps and the heights of the steps remain low.
  • a person skilled in the art easily distinguishes a cleaved surface from a surface obtained by crystal growth or by mechanical cutting.
  • the invention described here is a heat treatment which enables the elimination or the reduction of the residual stresses in single crystals after the crystal growth process has been carried out.
  • the heat treatment of the invention is carried out by heating up to the treatment temperature, by maintaining this treatment temperature, then by cooling to ambient temperature.
  • the treatment temperature is slightly below the melting point of the material treated.
  • the gaseous atmosphere during the treatment is protective and makes it possible to prevent the reaction of the treated crystals with oxygen or water vapour.
  • the process according to the invention does not modify the scintillation performance of the annealed single crystals as can be the case in certain processes which are especially applied to the crystals of oxides.
  • the temperature treatment of single crystals of lutetium orthosilicates under reactive atmospheres containing oxygen makes it possible to substantially improve the performances of the materials treated.
  • the treatment is, in this case, carried out at temperatures much lower than the melting point of the treated crystals and the oxygen contained in the treatment atmosphere reacts with the treated materials.
  • the invention described here firstly relates to a process for manufacturing a single crystal comprising a rare-earth halide, having improved machining or cleavage behaviour, said process comprising heat treatment in a furnace, the atmosphere of which is brought, for at least 1 hour, to between 0.70 times T m and 0.995 times T m of a single crystal comprising a rare-earth halide, T m representing the melting point of said single crystal, the temperature gradient at any point in the atmosphere of the furnace being less than 15 K/cm and preferably less than 5 K/cm and more preferably less than 0.5 K/cm during said heat treatment.
  • this treatment enables the relaxation of the residual stresses via plastic rearrangements.
  • well-controlled cooling makes it possible to avoid formation of new residual stresses in the single crystals.
  • the invention can be applied to large-size single crystals, especially having a volume greater than 50 cm 3 , and even greater than 100 cm 3 , and even greater than 300 cm 3 , and even greater than 1850 cm 3 . After carrying out the treatment according to the invention, these single crystals may be machined or cleaved without uncontrolled fracture.
  • the treatment according to the invention makes it possible, via machining or via the cleavage method, to produce large machined or cleaved surfaces with, for example, machined or cleaved surfaces greater than or equal to 5 cm 2 , or even greater than or equal to 9 cm 2 , or even greater than 12 cm 2 , and also, via other methods, to manufacture very large parts with, for example, volumes greater than or equal to 50 cm 3 or even greater than or equal to 1850 cm 3 , on condition that the initial volumes and the initial sizes of the single crystals allow it.
  • the invention relates to a method of heat treatment for eliminating or reducing the residual stresses in single crystals comprising a rare-earth halide.
  • the composition of the single crystal may correspond to the formula A n Ln p X (3p+n) in which Ln represents one or more rare-earth elements, that is to say an element chosen from Y, Sc and the lanthanide series from La to Lu, X represents one or more halogen atoms chosen from Cl, Br and I, and A represents one or more alkali metals such as Li, Na, K, Rb or Cs, n and p are numbers such that n is greater than or equal to zero and less than or equal to 3 and p is greater than or equal to 1.
  • the composition may have the formula A n Ln (p ⁇ x) Ln′ x X (3p+n) in which Ln represents one or more rare-earth elements, that is to say an element taken from Y, Sc and the lanthanide series from La to Lu and more particularly from Y, La, Gd, Lu or a mixture of these elements, Ln′ is a doping element, that is to say a rare-earth element and more particularly an element chosen from Ce, Pr and Eu, x is a number greater than or equal to 0.0005 and less than p. Examples of such crystals are:
  • the use of the treatment process according to the invention makes it possible to prevent fracturing of large brittle single crystals during all the steps in the production line. This treatment also facilitates the production of parts via the cleavage method.
  • the single crystals are placed in high-purity graphite crucibles closed by high-purity graphite lids.
  • the heat treatment according to the invention is carried out in a furnace which has a high thermal homogeneity, so as to effectively reduce the stresses in the single crystals. This is because the presence of high thermal gradients in the furnace during the treatment would lead to the formation of new stresses which could cause fracturing of the crystal.
  • the local temperature gradient is, at any point, less than 15 K/cm, preferably less than 5 K/cm and more preferably less than 0.5 K/cm.
  • This homogeneity in the furnace atmosphere around the part to be treated has the objective of a high temperature homogeneity of the part itself. The part treated is therefore also homogeneous during the period it is held at temperature.
  • the heat treatment according to the invention is carried out in an airtight furnace.
  • the compounds based on rare-earth halides are very reactive at high temperature with oxygen and water vapour and the heat treatment must be carried out under a controlled atmosphere.
  • the atmosphere may be dynamic (continuous pumping under vacuum or gas purging throughout all the steps of the heat treatment) or else static (filling the furnace with gas or putting it under a vacuum at the start of the heat treatment).
  • the atmosphere for the treatment is vacuum or inert gases (with a low residual content of oxygen and of water vapour) such as, for example, nitrogen (N 2 ), helium (He), argon (Ar), or halogen gases such as, for example, chlorine (Cl 2 ), bromine (Br 2 ), iodine (I 2 ), hydrogen chloride (HCl), hydrogen bromide (HBr), hydrogen iodide (HI); hydrogen (H 2 ); or any mixture of these gases.
  • Nitrogen and argon atmospheres are particularly suitable as these gases can be handled easily.
  • the pertinent treatment temperatures are between 0.70 times T m and 0.995 times T m .
  • the temperature range between 0.9 times and 0.995 times T m is preferred.
  • the duration of the temperature hold must be long enough to allow thermal homogenization within the single crystals and also elimination of the residual stresses by plastic deformation as the accomplishment of the two mechanisms is highly dependent on time (kinetic aspect of the phenomena involved).
  • the sizes of the single crystals have a great influence on the treatment time necessary to successfully carry out these two mechanisms: the larger the sizes are, the longer the temperature hold time will be. It is advisable that the treatment temperature be maintained between 1 to 120 hours, depending on the sizes of the single crystals to be treated. Hold times between 15 hours and 24 hours are particularly suitable.
  • the heating and cooling rates must be well controlled in order to avoid the formation of temperature gradients (between the edges and the centre) and therefore the formation of mechanical stresses of thermal origin. This aspect is particularly important for the cooling as too rapid a cooling will lead to the formation of new stresses and will destroy the positive effect of the heat treatment. Very slow cooling rates may be used, however the heat treatment duration will then be very long which will considerably increase the cost of the treatment process. The rates are chosen so as to optimize both the efficiency (elimination or reduction of the stresses) and the duration of the annealing cycle.
  • the heating and cooling rates of the atmosphere in the furnace are chosen between 1 K/h and 30 K/h.
  • Rates between 1 K/h and 10 K/h are particularly suitable.
  • the temperature of the furnace before the heat treatment of at least one hour, the temperature of the furnace is raised to the temperature of the heat treatment with a rate between 1 K/h and 30 K/h.
  • the temperature decrease rate between the temperature of the heat treatment and 100° C. is between 1 K/h and 30 K/h.
  • the temperature decrease rate between 100° C. and ambient temperature is less critical, but it is nevertheless recommended to continue to cool slowly. Respecting these temperature rises and decreases makes it possible to limit the risks of fracture.
  • the conditions which have just been given for the heat treatment must be applied simultaneously throughout the whole environment of the part to be treated in order to induce a high temperature homogeneity for the whole of the part to be treated (the whole crystal or one of its blocks obtained by fracturing), and not only over one of its parts.
  • the invention results in large-size single crystals that are cleaved without unwanted cracking or breaking.
  • perfect cleavage along the crystallographic planes (10 1 0) may be carried out on a single crystal of hexagonal crystal structure having a P6 3 /m space group, which includes, in particular, LaCl 3 , CeCl 3 , NdCl 3 , PrCl 3 , SmCl 3 , EuCl 3 , GdCl 3 , LaBr 3 , CeBr 3 , PrBr 3 , and also the mixtures of at least two of these halides (especially LaCl 3 and LaBr 3 , this mixture possibly being doped by a dopant such as Ce or Pr), these halides possibly being doped by a dopant such as Ce or Pr, and this being for a large single crystal (volume greater than 50 cm 3 and even greater than 1850 cm 3 ).
  • the invention also allows the machining of large single crystals or of blocks of single crystals without unwanted cracking or breaking.
  • the machining operations comprise, for example, cutting, milling, turning and polishing.
  • the heat treatment according to the invention may advantageously be carried out in the absence of oxygen and water, depending on the degree of sensitivity to oxidation of the crystal, such as, for example, under vacuum, or in an inert atmosphere such as under nitrogen or under argon.
  • the iodide is more sensitive than the bromide which is itself more sensitive than the chloride. The importance of the precautions to be taken from this point of view therefore follow this order.
  • the melting point of LaBr 3 is 788° C. (1061 K).
  • a non-fractured single crystal of LaBr 3 :Ce was produced and cooled to ambient temperature.
  • the crystal was placed in a high-purity graphite crucible.
  • the crucible was closed by a high-purity graphite lid.
  • the crucible containing the crystal was then introduced into the heat treatment furnace.
  • the furnace was hermetically sealed and an inert atmosphere was set up inside the latter by means of a continuous purge of high-purity nitrogen (flow rate of 20 L/min).
  • the heat treatment consisted of a heating ramp of 10 K/h followed by a temperature hold at 710° C.
  • the single crystal was fractured into several pieces.
  • One of these single-crystal pieces was sufficiently large (volume greater than 50 cm 3 ) to allow the production of large-size detectors.
  • the piece was treated by the process according to the invention.
  • the piece was loaded into a high-purity graphite crucible closed by a high-purity graphite lid.
  • the crucible containing the crystal was loaded into a heat treatment furnace.
  • the furnace was hermetically sealed and an inert atmosphere was set up inside the latter by means of a continuous purge of high-purity nitrogen (flow rate of 20 l/min).
  • the heat treatment consisted of a heating ramp of 10 K/h followed by a temperature hold at 710° C.
  • the melting point of LaCl 3 is 860° C. (1133 K).
  • a non-fractured single crystal of LaCl 3 :Ce was produced and cooled to ambient temperature.
  • the crystal was placed in a high-purity graphite crucible closed by a high-purity graphite lid.
  • the crucible containing the crystal was then introduced into the heat treatment furnace.
  • the furnace was hermetically sealed and an inert atmosphere was set up inside the latter by means of a continuous purge of high-purity nitrogen (flow rate of 20 l/min).
  • the heat treatment applied consisted of a heating ramp of 10 K/h followed by a temperature hold at 800° C.
  • Example 2 As in the case of Example 2, a single crystal fractured in several large blocks during the growth was used. Examination of the blocks showed that they could be used for producing parts of large volume. No heat treatment was applied to the blocks before their machining. During the machining operations, the appearance of fractures which propagated in the material was observed. The production of large parts was then impossible.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

The invention relates to a process for manufacturing a single crystal comprising a rare-earth halide, having improved machining or cleavage behaviour, comprising heat treatment in a furnace, the atmosphere of which is brought, for at least 1 hour, to between 0.70 times Tm and 0.995 times Tm of a single crystal comprising a rare-earth halide, Tm representing the melting point of said single crystal, the temperature gradient at any point in the atmosphere of the furnace being less than 15 K/cm for said heat treatment. After carrying out the treatment according to the invention, the single crystals may be machined or cleaved without uncontrolled fracture. The single crystals may be used in a medical imaging device, especially a positron emission tomography system or a gamma camera or a CT scanner, for crude oil exploration, for detection and identification of fissile or radioactive materials, for nuclear and high-energy physics, for astrophysics or for industrial control.

Description

  • The invention relates to a heat treatment applied to single crystals of rare-earth halides to improve their mechanical properties, and also to the use of these single crystals treated by the process to produce large-size parts for manufacturing detectors of ionizing radiation and large cleaved parts. The compositions of the single crystals in question in the invention are scintillator materials based on rare-earth halides.
  • The single crystals in question in the present invention are those directly obtained by crystal growth or those obtained by fracture, generally uncontrolled, of larger single crystals, for example obtained by crystal growth. Scintillator detectors are widely used for detecting gamma rays, X-rays, high-energy cosmic rays, charged particles having an energy between 1 keV and 10 MeV, between 1 keV and 1 Gev, between 1 keV and 10 GeV, thermal neutrons (the energy of which is typically less than 0.1 eV).
  • Scintillator detectors are used in numerous applications. Mention may be made, as non-exhaustive examples, of medical imaging (especially positron emission tomography systems, gamma cameras, CT scanners), crude oil exploration (well-logging), equipment for detecting and identifying fissile or radioactive materials, experiments in nuclear and high-energy physics, detectors for astrophysics or else industrial control.
  • A scintillator detector is composed of a scintillator material which converts the energy of the particles or radiation absorbed to ultraviolet or visible or infrared light and a photon collector which captures the light emitted and converts it to an electrical signal. The scintillator materials are in the form of a powder, of single crystals, of transparent polycrystalline ceramics, of glasses, of plastics and of liquids. The single-crystal materials, that is to say parts which, on the scale of use, are composed of a single crystal (at most a few crystals), are particularly suitable for producing scintillators. The use of single crystals has several advantages. Compared to polycrystalline materials, for parts of large thickness, the single crystals offer a better transparency and therefore a better extraction of the light due to the absence of grain boundaries and defects responsible for the dissipation of light in the solid. In the applications, when it is possible, the single crystals are preferred materials for scintillation. The photon collectors may be photomultiplier tubes or any light converter compatible with the emission wavelength of the material (example: photodiodes, avalanche photodiodes, etc.).
  • Rare-earth halides are materials known in the field of scintillator materials. The article by K. Krämer et al. (Development and characterization of highly efficient new cerium doped rare earth halide scintillator materials, J. Mater. Chem., 2006, 16, pp. 2773-2780), gives several examples of these scintillator crystals doped with cerium and which are characterized by a combination of good scintillation properties such as good energy resolution, a high light yield and a rapid response. For example, in this publication, LaBr3 doped with 5 mol % of cerium has an energy resolution of 2.6% under excitation at 662 keV (main gamma emission of 137Cs), a light yield of 70 000 photons per MeV and a scintillation decay time of 16 ns. Another example cited is cerium-doped Lul3 which has an energy resolution of 3.3% at 662 keV, a light yield of 95 000 photons per MeV and a scintillation decay time of 24 ns for the main light component. Also, the publication by C. van Eijk et al. (Development of elpasolite and monoclinic thermal neutron scintillators, 2005 IEEE Nucl. Sci. Symp. Conf. Record, 1, pp. 239-243) has the properties of compounds based on rare-earth halides for the simultaneous detection of neutrons and gamma rays. For example, Rb2LiYBr6 doped with 0.5 mol % of Ce has a light yield of 18 000 photons per MeV at 662 keV and a light yield of 65 000 photons per neutron (thermal neutrons). Other examples taken from the same article are Cs2LiYCl6 doped with 0.1 mol % of cerium, Cs2LiLaCl6 doped with 1 mol % of cerium, Rb2LiYl6 doped with 0.5 mol % of cerium, and Li3YBr6 doped with 0.5 mol % of cerium which respectively have light yields at 662 keV of 18 000 photons per MeV, 28 000 photons per MeV, 7000 photons per MeV and 6000 photons per MeV. Other non-exhaustive examples of compounds based on rare-earth halides for scintillation cited in the literature are: LaBr3 doped with praseodymium (J. Glodo et al., IEEE Nucl. Sci. Symp. Conf. Record, 2005, pp. 98-101), GdBr3 doped with cerium (E. V. D. van Loef et al., Optics Communications, 189, 2001, pp. 297-304), LuCl3 and LuBr3 doped with cerium (O. Guillot-Noël et al., J. Luminescence, 85, 1999, pp. 21-35), RbGd2Br7 doped with cerium (W. Moses et al., Nucl. Instruments and Methods in Physics Research, A, 537, 2005, pp. 317-320), Cs2LiYCl6 doped with praseodymium (E. V. D. van Loef et al., IEEE Trans. Nucl. Sci., 52, 5, 2005, pp. 1819-1822), K2LaBr5 doped with cerium (U. N. Roy et al., “Hard X-Ray and Gamma-Ray Detector Physics VII”, Proceedings of the SPIE, 5922, 2005, pp. 30-34).
  • Rare-earth halides are difficult to produce in the form of single crystals. This is because these compounds are very reactive with oxygen and water vapour. The chemical reaction at high temperature with oxygen and water vapour is irreversible and the crystals must therefore be crystallized in such a way that any reaction with these elements is impossible. The solution is to carry out the crystal growth in a device that is airtight, under vacuum or under an atmosphere that is not reactive with respect to the crystal. Another aspect is the crystal growth, without fracturing and without residual mechanical stresses, of single crystals that are sufficiently large to produce large-size detectors. This is because mechanical stresses of thermal origin are created within the crystals during growth and during cooling in the growth furnace (J. Völkl, “Stress in cooling crystal” in Handbook of Crystal Growth, Ed. North Holland, Edited by D. T. J. Hurle, 1994, ISBN 0-444-81554-6, pp. 821-874).
  • The mechanical stresses may be very high and may even exceed the strength of the materials and cause fracturing of the single crystals into several pieces. Even when the process is optimized to avoid fracturing during crystal growth and cooling, a large portion of residual stresses remain in the single crystals. In the best of cases, these residual stresses are not sufficient to cause fracturing of the crystals but, during the machining steps (for example cutting, milling, turning, polishing, etc.) microcracks develop in the materials and propagate under the effect of the residual stresses, which finally causes fracturing of the single crystals. This problem makes it very difficult to produce single-crystal parts for the production of detectors, especially to produce large-size single-crystal parts. The effect of the residual stresses in also important in the case of producing parts by the cleavage method. Cleavage is a distinctive feature that certain single crystals have of fracturing along certain precise crystalline planes when they are subjected to an impact or to a mechanical stress. The cleaved surfaces are extremely flat, even and have no roughness and they may be used for producing very high quality surfaces. In the single crystals that contain residual stresses, the cleavage process is normally disrupted by the formation of numerous macroscopic steps and/or parasitic breaks that do not follow the crystalline cleavage plane. The cleaved surface will then be highly irregular. A good cleaved surface has few or no macroscopic steps and the heights of the steps remain low. A person skilled in the art easily distinguishes a cleaved surface from a surface obtained by crystal growth or by mechanical cutting.
  • In the case of single crystals based on rare-earth halides, the question of fracturing is extremely important as these materials have the characteristic of being very brittle. An illustration of the brittleness of these compounds is given in the article by K. Findley et al. (“Fracture and deformation behaviour of common and novel scintillating single crystals”, Proceedings of SPIE, The International Society for Optical Engineering, 2007, vol 6707, pp. 6707 06) which shows that the cerium-doped LaBr3 crystals have a very low fracture toughness. Obtaining large-size parts and parts with large cleaved surfaces is therefore a problem that is particularly difficult to solve for this type of single crystals.
  • The invention described here is a heat treatment which enables the elimination or the reduction of the residual stresses in single crystals after the crystal growth process has been carried out. The heat treatment of the invention is carried out by heating up to the treatment temperature, by maintaining this treatment temperature, then by cooling to ambient temperature. The treatment temperature is slightly below the melting point of the material treated. The gaseous atmosphere during the treatment is protective and makes it possible to prevent the reaction of the treated crystals with oxygen or water vapour.
  • The process according to the invention does not modify the scintillation performance of the annealed single crystals as can be the case in certain processes which are especially applied to the crystals of oxides. For example, as is described in U.S. Pat. No. 7,151,261, the temperature treatment of single crystals of lutetium orthosilicates under reactive atmospheres containing oxygen makes it possible to substantially improve the performances of the materials treated. The treatment is, in this case, carried out at temperatures much lower than the melting point of the treated crystals and the oxygen contained in the treatment atmosphere reacts with the treated materials.
  • The invention described here firstly relates to a process for manufacturing a single crystal comprising a rare-earth halide, having improved machining or cleavage behaviour, said process comprising heat treatment in a furnace, the atmosphere of which is brought, for at least 1 hour, to between 0.70 times Tm and 0.995 times Tm of a single crystal comprising a rare-earth halide, Tm representing the melting point of said single crystal, the temperature gradient at any point in the atmosphere of the furnace being less than 15 K/cm and preferably less than 5 K/cm and more preferably less than 0.5 K/cm during said heat treatment.
  • It appears that this treatment enables the relaxation of the residual stresses via plastic rearrangements. After this step, well-controlled cooling makes it possible to avoid formation of new residual stresses in the single crystals. The invention can be applied to large-size single crystals, especially having a volume greater than 50 cm3, and even greater than 100 cm3, and even greater than 300 cm3, and even greater than 1850 cm3. After carrying out the treatment according to the invention, these single crystals may be machined or cleaved without uncontrolled fracture. The treatment according to the invention makes it possible, via machining or via the cleavage method, to produce large machined or cleaved surfaces with, for example, machined or cleaved surfaces greater than or equal to 5 cm2, or even greater than or equal to 9 cm2, or even greater than 12 cm2, and also, via other methods, to manufacture very large parts with, for example, volumes greater than or equal to 50 cm3 or even greater than or equal to 1850 cm3, on condition that the initial volumes and the initial sizes of the single crystals allow it.
  • The invention relates to a method of heat treatment for eliminating or reducing the residual stresses in single crystals comprising a rare-earth halide. In particular, the composition of the single crystal may correspond to the formula AnLnpX(3p+n) in which Ln represents one or more rare-earth elements, that is to say an element chosen from Y, Sc and the lanthanide series from La to Lu, X represents one or more halogen atoms chosen from Cl, Br and I, and A represents one or more alkali metals such as Li, Na, K, Rb or Cs, n and p are numbers such that n is greater than or equal to zero and less than or equal to 3 and p is greater than or equal to 1.
  • In particular, the composition may have the formula AnLn(p−x)Ln′xX(3p+n) in which Ln represents one or more rare-earth elements, that is to say an element taken from Y, Sc and the lanthanide series from La to Lu and more particularly from Y, La, Gd, Lu or a mixture of these elements, Ln′ is a doping element, that is to say a rare-earth element and more particularly an element chosen from Ce, Pr and Eu, x is a number greater than or equal to 0.0005 and less than p. Examples of such crystals are:
      • LaCl3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula);
      • LnBr3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula);
      • LaBr3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula);
      • GdBr3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula);
      • LazLn(1−z)X3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula), z possibly varying from 0 to 1, Ln being a rare earth other than La, X being a halogen such as mentioned previously;
      • LazGd(1−z)Br3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula), z possibly varying from 0 to 1;
      • LazLu(1−z)Br3, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. p=1 and x=0.001 to 0.5 in the formula), z possibly varying from 0 to 1;
      • LnzLn″(1−z)X3(1−y)X′3y in which Ln and Ln″ are two different rare earths, X and X′ being two different halogens, in particular CI, Br or I, z possibly varying from 0 to 1, and y possibly varying from 0 to 1;
      • RbGd2Br7, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. n=1, p=2 and x=0.002 to 1 in the formula);
      • RbLn2Cl7, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. n=1, p=2 and x=0.002 to 1 in the formula);
      • RbLn2Br7, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. n=1, p=2 and x=0.002 to 1 in the formula);
      • CsLn2Cl7, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. n=1, p=2 and x=0.002 to 1 in the formula);
      • CsLn2Br7, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. n=1, p=2 and x=0.002 to 1 in the formula); - K2LaCl5, which may especially be doped with 0.1 to 50 mol % of Ce (i.e.
  • n=2, p=1 and x=0.001 to 0.5 in the formula);
      • K2Lal5, which may especially be doped with 0.1 to 50 mol % of Ce (i.e. n=2, p=1 and x=0.001 to 0.5 in the formula) and
      • Cs(2−z)RbzLiLnX6, where X is either Cl or Br or I, Ln is Y or Gd or Lu or Sc or La, where z is greater than or equal to 0 and less than or equal to 2.
  • Crystals which may be doped with different molar percentages of Ce (i.e. n=3, p=1 and 0.0005≦x<1 in the formula).
  • The use of the treatment process according to the invention makes it possible to prevent fracturing of large brittle single crystals during all the steps in the production line. This treatment also facilitates the production of parts via the cleavage method.
  • As is presented in WO 3106741, it is preferable to use graphite crucibles for handling rare-earth halides. For the heat treatment according to the invention, the single crystals are placed in high-purity graphite crucibles closed by high-purity graphite lids.
  • The heat treatment according to the invention is carried out in a furnace which has a high thermal homogeneity, so as to effectively reduce the stresses in the single crystals. This is because the presence of high thermal gradients in the furnace during the treatment would lead to the formation of new stresses which could cause fracturing of the crystal. In the furnace, the local temperature gradient is, at any point, less than 15 K/cm, preferably less than 5 K/cm and more preferably less than 0.5 K/cm. This homogeneity in the furnace atmosphere around the part to be treated has the objective of a high temperature homogeneity of the part itself. The part treated is therefore also homogeneous during the period it is held at temperature.
  • It is recalled that in the crystal growth processes for single crystals based on a rare-earth halide, the environment of the crystal has high temperature gradients, well above 15 K/cm.
  • The heat treatment according to the invention is carried out in an airtight furnace. The compounds based on rare-earth halides are very reactive at high temperature with oxygen and water vapour and the heat treatment must be carried out under a controlled atmosphere. The atmosphere may be dynamic (continuous pumping under vacuum or gas purging throughout all the steps of the heat treatment) or else static (filling the furnace with gas or putting it under a vacuum at the start of the heat treatment). The atmosphere for the treatment is vacuum or inert gases (with a low residual content of oxygen and of water vapour) such as, for example, nitrogen (N2), helium (He), argon (Ar), or halogen gases such as, for example, chlorine (Cl2), bromine (Br2), iodine (I2), hydrogen chloride (HCl), hydrogen bromide (HBr), hydrogen iodide (HI); hydrogen (H2); or any mixture of these gases. Nitrogen and argon atmospheres are particularly suitable as these gases can be handled easily.
  • At temperatures close to the melting point of the material, the residual elastic stresses may be relaxed via plastic rearrangements. The heat treatment temperature is chosen as a function of the melting point (denoted Tm) of the material treated and is expressed in kelvin (Tm [K]=273+Tm[° C.]). The pertinent treatment temperatures are between 0.70 times Tm and 0.995 times Tm. The temperature range between 0.9 times and 0.995 times Tm is preferred. The duration of the temperature hold must be long enough to allow thermal homogenization within the single crystals and also elimination of the residual stresses by plastic deformation as the accomplishment of the two mechanisms is highly dependent on time (kinetic aspect of the phenomena involved). At the same time, the sizes of the single crystals have a great influence on the treatment time necessary to successfully carry out these two mechanisms: the larger the sizes are, the longer the temperature hold time will be. It is advisable that the treatment temperature be maintained between 1 to 120 hours, depending on the sizes of the single crystals to be treated. Hold times between 15 hours and 24 hours are particularly suitable.
  • Because the heat transfer coefficients of the materials control the transfer of heat in the single crystals, the heating and cooling rates must be well controlled in order to avoid the formation of temperature gradients (between the edges and the centre) and therefore the formation of mechanical stresses of thermal origin. This aspect is particularly important for the cooling as too rapid a cooling will lead to the formation of new stresses and will destroy the positive effect of the heat treatment. Very slow cooling rates may be used, however the heat treatment duration will then be very long which will considerably increase the cost of the treatment process. The rates are chosen so as to optimize both the efficiency (elimination or reduction of the stresses) and the duration of the annealing cycle. For the heat treatment according to the invention, the heating and cooling rates of the atmosphere in the furnace are chosen between 1 K/h and 30 K/h. Rates between 1 K/h and 10 K/h are particularly suitable. Thus, in the process according to the invention, before the heat treatment of at least one hour, the temperature of the furnace is raised to the temperature of the heat treatment with a rate between 1 K/h and 30 K/h. For the cooling which follows the heat treatment of at least one hour, the temperature decrease rate between the temperature of the heat treatment and 100° C. is between 1 K/h and 30 K/h. The temperature decrease rate between 100° C. and ambient temperature is less critical, but it is nevertheless recommended to continue to cool slowly. Respecting these temperature rises and decreases makes it possible to limit the risks of fracture.
  • The conditions which have just been given for the heat treatment must be applied simultaneously throughout the whole environment of the part to be treated in order to induce a high temperature homogeneity for the whole of the part to be treated (the whole crystal or one of its blocks obtained by fracturing), and not only over one of its parts.
  • The invention results in large-size single crystals that are cleaved without unwanted cracking or breaking. In particular, perfect cleavage along the crystallographic planes (10 10) may be carried out on a single crystal of hexagonal crystal structure having a P63/m space group, which includes, in particular, LaCl3, CeCl3, NdCl3, PrCl3, SmCl3, EuCl3, GdCl3, LaBr3, CeBr3, PrBr3, and also the mixtures of at least two of these halides (especially LaCl3 and LaBr3, this mixture possibly being doped by a dopant such as Ce or Pr), these halides possibly being doped by a dopant such as Ce or Pr, and this being for a large single crystal (volume greater than 50 cm3 and even greater than 1850 cm3).
  • The invention also allows the machining of large single crystals or of blocks of single crystals without unwanted cracking or breaking. The machining operations comprise, for example, cutting, milling, turning and polishing. The heat treatment according to the invention may advantageously be carried out in the absence of oxygen and water, depending on the degree of sensitivity to oxidation of the crystal, such as, for example, under vacuum, or in an inert atmosphere such as under nitrogen or under argon. In particular, for a given rare earth, the iodide is more sensitive than the bromide which is itself more sensitive than the chloride. The importance of the precautions to be taken from this point of view therefore follow this order.
  • EXAMPLE 1 Heat treatment of an LaBr3 Single Crystal Doped with 5 mol % of Cerium
  • The melting point of LaBr3 is 788° C. (1061 K). A non-fractured single crystal of LaBr3:Ce was produced and cooled to ambient temperature. The crystal was placed in a high-purity graphite crucible. The crucible was closed by a high-purity graphite lid. The crucible containing the crystal was then introduced into the heat treatment furnace. The furnace was hermetically sealed and an inert atmosphere was set up inside the latter by means of a continuous purge of high-purity nitrogen (flow rate of 20 L/min). The heat treatment consisted of a heating ramp of 10 K/h followed by a temperature hold at 710° C. (983 K) (0.93 times the melting point Tm of LaBr3) for 24 hours, then by a cooling ramp of 10 K/h down to ambient temperature. After the treatment, the single crystal was removed from the crucible and no fracture was visible. The single crystal was then machined to produce a 2″×2″ part (cylinder having a diameter of 2″ and a height of 2″, remember that 1″=2.54 cm) and a 3″33 3″ part for producing scintillator detectors. During the machining, no cracking was observed: the residual stresses had been removed during the heat treatment.
  • EXAMPLE 2 Heat Treatment of a Piece Derived from a Fractured Single Crystal of LaBr3 Doped with 5 mol % of Cerium
  • At the end of the crystal growth process, the single crystal was fractured into several pieces. One of these single-crystal pieces was sufficiently large (volume greater than 50 cm3) to allow the production of large-size detectors. In order to prevent fracturing while machining, the piece was treated by the process according to the invention. The piece was loaded into a high-purity graphite crucible closed by a high-purity graphite lid. The crucible containing the crystal was loaded into a heat treatment furnace. The furnace was hermetically sealed and an inert atmosphere was set up inside the latter by means of a continuous purge of high-purity nitrogen (flow rate of 20 l/min). The heat treatment consisted of a heating ramp of 10 K/h followed by a temperature hold at 710° C. (983 K) (0.93 times the melting point Tm of LaBr3) for 24 hours, then by a cooling ramp of 10 K/h down to ambient temperature. After the treatment, the piece was removed from the crucible and no fracture was visible. The piece was then machined to produce 2″×2″ parts (cylinder having a diameter of 2″ and a height of 2″). No fracture appeared during the machining operations.
  • EXAMPLE 3 Heat Treatment of an LaCl3 Single Crystal Doped with 10 mol % of Cerium
  • The melting point of LaCl3 is 860° C. (1133 K). A non-fractured single crystal of LaCl3:Ce was produced and cooled to ambient temperature. The crystal was placed in a high-purity graphite crucible closed by a high-purity graphite lid. The crucible containing the crystal was then introduced into the heat treatment furnace. The furnace was hermetically sealed and an inert atmosphere was set up inside the latter by means of a continuous purge of high-purity nitrogen (flow rate of 20 l/min). The heat treatment applied consisted of a heating ramp of 10 K/h followed by a temperature hold at 800° C. (1073 K) (0.95 times the melting point of Tm of LaCl3), for 24 hours, then by a cooling ramp of 10 K/h down to ambient temperature. After the treatment, no fracturing was visible in the single crystal. During the machining no fracture appeared and several 3″×3″ parts were obtained (cylinder having a diameter of 3″ and a height of 3″).
  • EXAMPLE 4 (Comparative Example) Machining of a Non-Annealed Crystal of LaBr3 doped with 5 mol % of Cerium
  • As in the case of Example 2, a single crystal fractured in several large blocks during the growth was used. Examination of the blocks showed that they could be used for producing parts of large volume. No heat treatment was applied to the blocks before their machining. During the machining operations, the appearance of fractures which propagated in the material was observed. The production of large parts was then impossible.

Claims (9)

1-12. (canceled)
13. Single crystal comprising a rare-earth halide that comprises a cleaved surface greater than 5 cm2.
14. Single crystal according to claim 13, comprising a cleaved surface greater than 12 cm2.
15. Single crystal according to claim 13, wherein it has a hexagonal crystal structure with a P63/m space group, the cleaved surface corresponding to the crystallographic planes (10 10).
16. Single crystal according to claim 13, wherein the single crystal has a volume greater than 1850 cm3.
17. Single crystal comprising a rare-earth halide that comprises a machined surface greater than 5 cm2.
18. Single crystal according to claim 17 comprising a machined surface greater than 12 cm2.
19. Single crystal according to claim 17, wherein it has a hexagonal crystal structure with a P63/m space group, the cleaved surface corresponding to the crystallographic planes (10 10).
20. Single crystal according to claim 17, wherein the single crystal has a volume greater than 1850 cm3.
US13/899,708 2008-03-31 2013-05-22 Annealing of single crystals Abandoned US20130251614A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US13/899,708 US20130251614A1 (en) 2008-03-31 2013-05-22 Annealing of single crystals

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
FR0852072 2008-03-31
FR0852072A FR2929296B1 (en) 2008-03-31 2008-03-31 RECOVERED MONOCRYSTALS
US12/121,459 US8470089B2 (en) 2008-03-31 2008-05-15 Annealing of single crystals
US13/899,708 US20130251614A1 (en) 2008-03-31 2013-05-22 Annealing of single crystals

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US12/121,459 Continuation US8470089B2 (en) 2008-03-31 2008-05-15 Annealing of single crystals

Publications (1)

Publication Number Publication Date
US20130251614A1 true US20130251614A1 (en) 2013-09-26

Family

ID=40089898

Family Applications (2)

Application Number Title Priority Date Filing Date
US12/121,459 Expired - Fee Related US8470089B2 (en) 2008-03-31 2008-05-15 Annealing of single crystals
US13/899,708 Abandoned US20130251614A1 (en) 2008-03-31 2013-05-22 Annealing of single crystals

Family Applications Before (1)

Application Number Title Priority Date Filing Date
US12/121,459 Expired - Fee Related US8470089B2 (en) 2008-03-31 2008-05-15 Annealing of single crystals

Country Status (2)

Country Link
US (2) US8470089B2 (en)
FR (1) FR2929296B1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101167247B1 (en) * 2008-01-28 2012-07-23 삼성전자주식회사 Method for updating a recommend user group adaptively and apparatus thereof
US8153982B1 (en) * 2008-06-25 2012-04-10 Radiation Monitoring Devices, Inc. Yttrium-containing scintillator compositions, devices and methods
US20100224798A1 (en) * 2008-09-11 2010-09-09 Stichting Voor De Technische Wetenschappen Scintillator based on lanthanum iodide and lanthanum bromide
FR3033467B1 (en) * 2015-03-05 2017-03-03 Ermes CAMERA SUITABLE FOR WORKING IN A RADIOACTIVE ENVIRONMENT.
CN109988577B (en) * 2017-12-27 2020-12-25 有研稀土新材料股份有限公司 Rare earth halide scintillating material and application thereof
CN109576789A (en) * 2018-12-29 2019-04-05 厦门中烁光电科技有限公司 The processing method of cerium dopping rare earth halide monocrystalline
CN110560189B (en) * 2019-10-21 2022-02-01 河北工业大学 Hydrated liquid drop separation method and device based on y-cut lithium niobate chip

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080047482A1 (en) * 2006-08-23 2008-02-28 Venkataramani Venkat Subramani Single crystal scintillator materials and methods for making the same

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4535243A (en) * 1983-03-17 1985-08-13 Imatron Associates X-ray detector for high speed X-ray scanning system
US4958080A (en) * 1988-10-06 1990-09-18 Schlumberger Technology Corporation Lutetium orthosilicate single crystal scintillator detector
IT1278142B1 (en) * 1995-07-13 1997-11-17 Consiglio Nazionale Ricerche SURGICAL PROBE FOR LOCATION OF TUMORS FOR LAPAROSCOPIC OR INTRACAVITARY USE.
WO1999061880A2 (en) 1998-04-24 1999-12-02 Digirad Corporation Integrated radiation detector probe
NL1014401C2 (en) * 2000-02-17 2001-09-04 Stichting Tech Wetenschapp Cerium-containing inorganic scintillator material.
FR2840926B1 (en) * 2002-06-12 2005-03-04 Saint Gobain Cristaux Detecteu USE OF A CRUSH WITH CARBON FOR CRYSTAL GROWTH COMPRISING A RARE EARTH HALIDE
WO2004044613A2 (en) * 2002-11-12 2004-05-27 The Trustees Of The University Of Pennsylvania Lanthanum halide scintillators for time-of-flight 3-d pet
FR2847594B1 (en) * 2002-11-27 2004-12-24 Saint Gobain Cristaux Detecteu PREPARATION OF RARE EARTH HALIDE BLOCKS
FR2855830B1 (en) * 2003-06-05 2005-07-08 Stichting Tech Wetenschapp SCINTILLATION CRYSTALS OF THE RARE EARTH IODIDE TYPE
US7238946B2 (en) * 2003-06-27 2007-07-03 Siemens Medical Solutions Usa, Inc. Nuclear imaging system using scintillation bar detectors and method for event position calculation using the same
US7173247B2 (en) * 2003-09-24 2007-02-06 Radiation Monitoring Devices, Inc. Lu1-xI3:Cex—a scintillator for gamma ray spectroscopy and time-of-flight PET
US20050067579A1 (en) * 2003-09-30 2005-03-31 Katsutoshi Tsuchiya Nuclear medicine imaging apparatus
US7084403B2 (en) * 2003-10-17 2006-08-01 General Electric Company Scintillator compositions, and related processes and articles of manufacture
US7576329B2 (en) * 2003-10-17 2009-08-18 General Electric Company Scintillator compositions, and related processes and articles of manufacture
US7115872B2 (en) * 2003-12-10 2006-10-03 John William Bordynuik Portable radiation detector and method of detecting radiation
US7151261B2 (en) * 2004-01-09 2006-12-19 Crystal Photonics, Incorporated Method of enhancing performance of cerium doped lutetium orthosilicate crystals and crystals produced thereby
EP1553430A1 (en) * 2004-01-09 2005-07-13 Stichting Voor De Technische Wetenschappen High light yield thermal neutron scintillators
FR2869115B1 (en) 2004-04-14 2006-05-26 Saint Gobain Cristaux Detecteu RARE EARTH-BASED SCINTILLATOR MATERIAL WITH REDUCED NUCLEAR BACKGROUND NOISE
US7081626B2 (en) * 2004-06-02 2006-07-25 The Regents Of The University Of California Apparatus and method for temperature correction and expanded count rate of inorganic scintillation detectors
JP4365762B2 (en) * 2004-09-30 2009-11-18 株式会社日立製作所 Nuclear medicine diagnostic apparatus and method for cooling nuclear medicine diagnostic apparatus
PT103200B (en) * 2004-09-30 2006-08-24 Taguspark-Soc. Prom.Desenv.Parq.Ci.Tec.Area Lisboa POSITRON EMISSION TOMOGRAPHY SYSTEM (PET)
DE102004061867B4 (en) * 2004-12-22 2008-09-11 Siemens Ag X-ray detector with optically transparent curing adhesive
US7202477B2 (en) * 2005-03-04 2007-04-10 General Electric Company Scintillator compositions of cerium halides, and related articles and processes
US20060226368A1 (en) * 2005-03-30 2006-10-12 General Electric Company Scintillator compositions based on lanthanide halides and alkali metals, and related methods and articles
US8299436B2 (en) * 2005-06-29 2012-10-30 General Electric Company High energy resolution scintillators having high light output
CA2622381C (en) 2005-09-16 2014-05-20 Stichting Voor De Technische Wetenschappen High light yield fast scintillator
US20070131866A1 (en) * 2005-12-14 2007-06-14 General Electric Company Activated alkali metal rare earth halides and articles using same
US7294840B2 (en) * 2006-03-01 2007-11-13 Nucsafe, Inc. Apparatus and method for reducing microphonic susceptibility in a radiation detector
US7388206B2 (en) * 2006-06-16 2008-06-17 Ge Homeland Protection, Inc. Pulse shape discrimination method and apparatus for high-sensitivity radioisotope identification with an integrated neutron-gamma radiation detector
US7759647B2 (en) * 2007-01-24 2010-07-20 Siemens Medical Solutions Usa, Inc. PET imaging system with APD-based PET detectors and three-dimensional positron-confining magnetic field
US7723687B2 (en) * 2007-07-03 2010-05-25 Radiation Monitoring Devices, Inc. Lanthanide halide microcolumnar scintillators
US7626178B2 (en) * 2007-12-03 2009-12-01 General Electric Company Integrated neutron-gamma radiation detector with adaptively selected gamma threshold
US7767975B2 (en) * 2007-12-04 2010-08-03 Saint-Gobain Cristaux Et Detecteurs Ionizing radiation detector
US20100224798A1 (en) * 2008-09-11 2010-09-09 Stichting Voor De Technische Wetenschappen Scintillator based on lanthanum iodide and lanthanum bromide

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080047482A1 (en) * 2006-08-23 2008-02-28 Venkataramani Venkat Subramani Single crystal scintillator materials and methods for making the same

Also Published As

Publication number Publication date
US8470089B2 (en) 2013-06-25
FR2929296B1 (en) 2011-01-21
US20090246495A1 (en) 2009-10-01
FR2929296A1 (en) 2009-10-02

Similar Documents

Publication Publication Date Title
US20130251614A1 (en) Annealing of single crystals
US7332028B2 (en) Method for manipulating a rare earth chloride or bromide or iodide in a crucible comprising carbon
JP6449851B2 (en) Manufacture of elpasolite scintillator materials
JP5389328B2 (en) Single crystal for scintillator containing Pr, its manufacturing method, radiation detector and inspection apparatus
EP3592825B1 (en) Garnet scintillator co-doped with monovalent ion
US20140061537A1 (en) Multi-doped lutetium based oxyorthosilicate scintillators having improved photonic properties
US20230002927A1 (en) Li+ doped metal halide scintillation crystal with zero-dimensional perovskite structure, preparation method and use thereof
US10125312B2 (en) Divalent-ion-doped single crystal alkali halide scintillators
Lindsey et al. Multi-ampoule Bridgman growth of halide scintillator crystals using the self-seeding method
CN117552106B (en) Rare earth-based zero-dimensional perovskite halide scintillation monocrystal as well as preparation method and application thereof
Boatner et al. Improved lithium iodide neutron scintillator with Eu2+ activation: The elimination of Suzuki-Phase precipitates
CN108441960A (en) Divalent metal is co-doped with lutetium aluminum carbuncle crystal preparation method with cerium
CN108441959A (en) Mix Cerium aluminate gadolinium lutetium garnet crystal preparation method
CN105908257B (en) Calcium ytterbium ion is co-doped with YAG fast flashing crystal and preparation method thereof
CN106048725B (en) Silicon ytterbium ion is co-doped with YAG fast flashing crystal and preparation method thereof
CN106149054A (en) Mix Cerium aluminate gadolinium yttrogarnet high temperature scintillation crystal and preparation method thereof
Sarukura et al. Czochralski growth of oxides and fluorides
CN108893779A (en) A kind of calcium ions and magnesium ions and cerium co-doped yttrium aluminium garnet scintillation crystal and preparation method thereof
JP2011225742A (en) Raw material purification device and method of manufacturing single crystal for scintillator
Chen et al. Transparent BaCl 2: Eu 2+ glass-ceramic scintillator
CN110004485A (en) A kind of scintillation crystal and preparation method thereof of rare earth element cerium dopping
RU2795600C2 (en) Garnet scintillator solegated with a monovalent ion
JP7178043B2 (en) LSO-based scintillator crystal
JP2009256119A (en) Instrument for distilling raw material and production method of crystal for scintillator
Lindsey The crystal growth of cesium cerium chloride scintillator for X-ray and Gamma-ray spectroscopy applications

Legal Events

Date Code Title Description
STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION