US20090160465A1 - Determination of equivalent series resistance - Google Patents
Determination of equivalent series resistance Download PDFInfo
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- US20090160465A1 US20090160465A1 US12/396,215 US39621509A US2009160465A1 US 20090160465 A1 US20090160465 A1 US 20090160465A1 US 39621509 A US39621509 A US 39621509A US 2009160465 A1 US2009160465 A1 US 2009160465A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
- A61N1/00—Electrotherapy; Circuits therefor
- A61N1/18—Applying electric currents by contact electrodes
- A61N1/32—Applying electric currents by contact electrodes alternating or intermittent currents
- A61N1/36—Applying electric currents by contact electrodes alternating or intermittent currents for stimulation
- A61N1/362—Heart stimulators
- A61N1/37—Monitoring; Protecting
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
Definitions
- the present invention relates to measurement techniques and, more specifically, to determination of equivalent series resistance (ESR) effect on high frequency filtering performance of a filtered feed-through assembly.
- ESR equivalent series resistance
- IMDs Implantable medical devices detect and correct a variety of medical conditions in patients.
- exemplary IMDs include implantable pulse generators (IPGs) or implantable cardioverter-defibrillators (ICDs) that deliver electrical stimulation to tissue of a patient.
- IMDs typically include, inter alia, a control module, a capacitor, and a battery. These components are housed in a container that is hermetically sealed to prevent liquid from contacting the electronic components therein.
- a feed-through assembly is coupled to the container. The feed-through assembly forms an aperture in the container, which allows an electrical lead to pass therethrough.
- Electromagnetic interference may affect the operation of an IMD.
- EMI is any electromagnetic disturbance, phenomenon, signal, or emission that causes or can cause an undesired response in an IMD.
- an EMI filter is incorporated into a feed-through assembly.
- a typical filtered feed-through assembly consists of a conductive line, a ferrule, an insulator member (e.g. glass, ceramic etc.), at least one capacitor, and a seal.
- the filtered feed-through assembly is configured such that the seal lines an aperture located in the ferrule.
- the insulator member is placed in the aperture adjacent to the seal.
- the conductive line is connected to the ferrule and the capacitor.
- a lead (e.g. wire) or a terminal pin to the sealed container is inserted through another aperture in the insulator member, which provides an electrical connection to the components within the IMD.
- the filtered feed-through assembly capacitor acts as a low pass filter to prevent EMI from affecting the operation of the IMD.
- a low pass filter allows low frequency signals to pass but prevents high frequency signals from passing therethrough.
- the performance of the EMI filter is determined by insertion loss. Insertion loss results from the insertion of a device in a transmission line, expressed as the reciprocal of the ratio of the signal power delivered to that part of the line following the device to the signal power delivered to that same part before insertion. Insertion loss depends upon the number of components in the EMI filter, impedance value of each EMI filter component, the frequency at which the insertion loss is measured, equivalent series resistance (ESR), and equivalent series induction (ESL).
- ESR equivalent series resistance
- ESL equivalent series induction
- Insertion loss measurement at high frequencies is difficult due to increased noise detected for high frequency signals.
- a radio frequency (RF) shield is welded to the filtered feed-through assembly.
- the RF shield isolates the input and output ends of the filtered feed-through assembly during the test.
- the welding operation and the RF shield itself increase the cost of producing an IMD. Additionally, this insertion loss measurement method cannot be used on a large-scale basis.
- insertion loss may be measured without a RF shield welded to the filtered feed-through assembly.
- this type of insertion loss measurement is unreliable. It is therefore desirable to overcome the limitations associated with conventional testing systems.
- FIG. 1 depicts a block diagram of an exemplary testing system
- FIG. 2 is a perspective side view of an exemplary feed-through assembly
- FIG. 3 is a cross-sectional view of an exemplary filtered feed-through assembly
- FIG. 4 is a perspective side view of an exemplary test fixture and a device under test
- FIG. 5 is a portion of an exemplary test fixture with a pin piercing an oxide layer to connect with a ferrule of a filtered feed-through assembly
- FIG. 6 is a graph illustrating insertion loss versus equivalent series resistance for a device evaluated by the testing system of FIG. 1 ;
- FIG. 7 is a flow diagram of a method to predict or estimate insertion loss associated with a feed-through assembly.
- module refers to an application specific integrated circuit (ASIC), an electronic circuit, a processor (shared, dedicated, or group) and memory that execute one or more software or firmware programs, a combinational logic circuit, or other suitable components that provide the described functionality.
- ASIC application specific integrated circuit
- processor shared, dedicated, or group
- memory that execute one or more software or firmware programs, a combinational logic circuit, or other suitable components that provide the described functionality.
- the present invention is directed to measurement of insertion loss related to a device (e.g., filtered feed-through assembly) over a certain frequency range.
- a device e.g., filtered feed-through assembly
- the frequency range of about 450 megahertz (MHz) to about 3 gigahertz (GHz) is used to determine the effectiveness of the low pass filter (e.g., capacitor(s) in the filtered feed-through assembly) disposed in an implantable medical device (IMD).
- IMD implantable medical device
- the present invention relates to measurement of equivalent series resistance (ESR) effect on high frequency filtering performance of a filtered feed-through assembly for a device.
- a set of insertion loss data at a first high frequency e.g. 450 MHz to about 3 GHz
- a set of insertion loss data is generated at a second high frequency (e.g. 2450 MHz) for the filtered feed-through assembly.
- a set of ESR data is generated at a low frequency (e.g. 2 MHz) for the filtered feed-through assembly.
- the set of ESR data at the low frequency is correlated to the insertion loss generated at a first high frequency. This correlation may be graphically represented or tabulated.
- a prediction interval that includes upper and lower limits is superimposed on the graph.
- a specified insertion loss data e.g. 30 dB
- An ESR limit for a low frequency signal is determined based upon the specified insertion loss data and the upper limit of the prediction interval.
- the ESR limit is compared to ESR values of manufactured filtered feed-through assemblies. Filtered feed-through assemblies are of acceptable quality when their ESR value is below the ESR limit. In contrast, filtered feed-through assemblies are rejected that exhibit an ESR value above the ESR limit.
- the present invention increases the accuracy of determining the ESR effect at high frequency signals filtered via a filtered feed-through assembly. Additionally, the present invention reduces the cost of producing an implantable medical device by eliminating welding of a shield to a feed-through assembly. Furthermore, the present invention may be implemented on a mass production scale.
- FIG. 1 depicts a test system 10 that determines ESR effect on high frequency filtering performance of a device under test (DUT).
- Test system 10 includes a control module 12 , a switch matrix 14 , an inductance, capacitance, resistance (LCR) meter or impedance meter 16 (i.e. measurement meter), and a test fixture 18 .
- LCR inductance, capacitance, resistance
- impedance meter 16 i.e. measurement meter
- Control module 12 is typically a computer that includes a parallel port (not shown) connected to bus 20 a .
- the parallel port generally includes 32 lines and 16 input/output ports. Since two lines are associated with a single input/output port, multiple busses may be connected to the parallel port.
- Control module 12 connects to LCR meter 16 and switch matrix 14 via buses 20 a , 20 b , and 20 c respectively.
- Control module 12 inputs a control signal over buses 20 a , 20 b to LCR meter 16 .
- LCR meter 16 is configured to measure and transmit to control module 12 the inductance, capacitance, and resistance associated with a DUT that is connected to test fixture 18 .
- the DUT is a filtered feed-through assembly 30 depicted in FIGS. 2-3 .
- Filtered feed-through assembly 30 consists of one or more conductive lines 25 a - b that include nonpolarized capacitors 26 , a ferrule 32 , and an insulator member (e.g. glass, ceramic etc.) 33 .
- test system 10 also provides more accurate data related to measurement of capacitance, displacement factors, high voltage resistance, and other suitable factors.
- LCR meter 16 inputs a test signal at a certain frequency to switch matrix 14 over conductive lines PH, IH.
- PH is a positive voltage conductive line whereas IH is a positive current conductive line.
- switch matrix 14 selects one of four channels to test one or more conductive lines 25 a - d of a feed-through assembly 30 .
- a first channel is formed by conductive lines N- 7 and N- 6 ;
- a second channel is formed by conductive lines N- 5 and N- 4 ;
- a third channel is formed by conductive lines N- 3 and N- 2 ;
- a fourth channel is formed by conductive lines N- 1 and N.
- Switch matrix 14 then signals a conductive line 25 a over the selected channel.
- a signal is then transmitted from conductive line 25 a to LCR meter 16 over negative voltage conductive line PL and negative current conductive line IL.
- LCR meter 16 determines the ESR for test fixture 18 and the insertion loss at two different high frequencies (e.g. 450 megahertz (MHz) and at 2450 MHz etc.). Generally, a high frequency ranges from about 9 KHz to about 10,000 MHz. The ESR is also measured at 2 MHz for the filtered feed-through assembly.
- the data is transmitted to control module 12 . This process is repeated for a set of filtered feed-through assemblies. Control module 12 then executes regression analysis instructions that correlate insertion loss data obtained at a high frequency to ESR data obtained at a low frequency, as depicted in the graph of FIG. 6 .
- Exemplary regression analysis software is commercially available from Minitab located in State College, Pa. Regression analysis is described in detail by W. Mendenhall and T. Sincich, Statistics For Engineering And the Sciences (4th Ed. 1995), which is incorporated by reference
- Regression analysis determines the prediction interval (PI) for insertion loss, as depicted in FIG. 6 .
- Pl defined by lower and upper limits 40 , 42 , is an interval that quantifies the degree of uncertainty in a future prediction relative to insertion loss of a DUT.
- the formula to calculate the Pl for insertion loss, defined as y, is as follows:
- t is the Student's t-distribution statistic obtained from tabulated data
- t (df, ⁇ ) is the critical value for the Student's t-distribution
- probability of type 1 error 0.01
- n sample size (i.e. number of pieces of data in one sample)
- x is the average value for x
- X 0 ESR measured at a low frequency
- the lower and upper Pl limits 40 , 42 are determined from the confidence level and the standard error of the prediction.
- the Pl is generally wider than a confidence interval because of the added uncertainty involved in predicting a single response versus the mean response.
- the Pl is a discrete determination that is performed at a chosen Xo over a desired ESR range to create a curve.
- Xo is selected over an ESR range such that the upper limit 40 for insertion loss crosses the desired insertion loss specification limit 44 (Y-axis).
- the desired insertion loss limit is ⁇ 30 decibels (dB).
- the ESR limit 46 is determined to be 2.8 ⁇ since this is the point at which upper limit 42 crosses the desired insertion loss limit 44 .
- the value of the Y interval (i.e., insertion loss) is predicted in an iterative manner for a given X 0 (ESR).
- ESR ESR data at a lower frequency (e.g. 2 MHz) and the upper and lower limits for insertion loss.
- the ESR limit is based on a minimum insertion loss requirement.
- ESR limit 46 is used to accept or reject a part. In particular, ESR limit 46 is compared to the ESR exhibited by the DUT. If the ESR of the DUT is below ESR limit 46 , the DUT satisfies quality specifications. However, if the DUT's ESR value exceeds ESR limit 46 , the DUT does not meet quality specifications. DUT's are rejected that exceed ESR limit 46 . In addition to using the ESR limit 46 to determine the quality of a DUT, the ESR value measured on the DUT can also be used to predict the insertion loss of the DUT using the same method.
- FIG. 6 is a flow diagram of one method to determine an ESR limit at a low frequency.
- a set of insertion loss data at a first high frequency e.g. 450 MHz
- a set of insertion loss data is generated at a second high frequency (e.g. 2450 MHz) for the filtered feed-through assembly.
- a set of ESR data is generated at a low frequency (e.g. 2 MHz) for the filtered feed-through assembly.
- the set of ESR data at a low frequency is correlated to the insertion loss generated at a first high frequency. This correlation may be graphically represented or tabulated.
- the set of insertion loss data is correlated to the set of ESR data.
- a prediction interval that includes upper and lower limits is generated and superimposed on the graph.
- a specified insertion loss value (e.g. 30 dB) is selected. The specified insert in loss value is based upon the desired minimal quality that is sought for a manufactured device (e.g. filtered feed-through assembly).
- an ESR limit for a low frequency signal is determined. The ESR limit is based upon the first insertion loss data and the upper limit of the prediction interval. The ESR limit is then used to reject or accept manufactured feed-through assemblies.
- the present invention has numerous applications. For example, while the figures relate to quadripolar filtered feed-through assemblies, other types of feed-through assemblies may also rely on this process to reliably produce quality feed-through assemblies. Additionally, the operation described herein may be implemented entirely automatically or manually. Moreover, skilled artisans appreciate that measurement techniques are not polarity sensitive. Accordingly, techniques of the invention may be implemented with PH having a negative voltage and PL having a positive voltage. Similarly, IH can possess a negative current and IL can be a positive current. Furthermore, while the present invention describes rejection of a manufactured device (e.g. filtered feed-through assembly etc.) that exceeds an ESR limit, skilled artisans understand that principles of the invention may also be configured in a manner such that a manufactured device is rejected that is below an ESR limit.
- a manufactured device e.g. filtered feed-through assembly etc.
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Abstract
A determination of an equivalent series resistance (ESR) effect for high frequency filtering performance of a filtered feed-through assembly is described. A low frequency signal is introduced to a filtered feed-through assembly. ESR limit of the filtered feed-through is determined based on the low frequency signal.
Description
- This application is a continuation of U.S. patent application Ser. No. 11/236,369, filed Sep. 27, 2005 entitled “Determination of Equivalent Series Resistance”. This application is also related to U.S. patent application Ser. No. 11/235,944 (Attorney docket P22029.00) filed on Sep. 27, 2005 and entitled “DETERMINATION OF EQUIVALENT SERIES RESISTANCE”.
- The present invention relates to measurement techniques and, more specifically, to determination of equivalent series resistance (ESR) effect on high frequency filtering performance of a filtered feed-through assembly.
- Implantable medical devices (IMDs) detect and correct a variety of medical conditions in patients. Exemplary IMDs include implantable pulse generators (IPGs) or implantable cardioverter-defibrillators (ICDs) that deliver electrical stimulation to tissue of a patient. IMDs typically include, inter alia, a control module, a capacitor, and a battery. These components are housed in a container that is hermetically sealed to prevent liquid from contacting the electronic components therein. To connect with the electronic components, a feed-through assembly is coupled to the container. The feed-through assembly forms an aperture in the container, which allows an electrical lead to pass therethrough.
- Electromagnetic interference (EMI) may affect the operation of an IMD. EMI is any electromagnetic disturbance, phenomenon, signal, or emission that causes or can cause an undesired response in an IMD. To address EMI, an EMI filter is incorporated into a feed-through assembly. A typical filtered feed-through assembly consists of a conductive line, a ferrule, an insulator member (e.g. glass, ceramic etc.), at least one capacitor, and a seal. The filtered feed-through assembly is configured such that the seal lines an aperture located in the ferrule. The insulator member is placed in the aperture adjacent to the seal. The conductive line is connected to the ferrule and the capacitor. A lead (e.g. wire) or a terminal pin to the sealed container is inserted through another aperture in the insulator member, which provides an electrical connection to the components within the IMD.
- The filtered feed-through assembly capacitor acts as a low pass filter to prevent EMI from affecting the operation of the IMD. A low pass filter allows low frequency signals to pass but prevents high frequency signals from passing therethrough. The performance of the EMI filter is determined by insertion loss. Insertion loss results from the insertion of a device in a transmission line, expressed as the reciprocal of the ratio of the signal power delivered to that part of the line following the device to the signal power delivered to that same part before insertion. Insertion loss depends upon the number of components in the EMI filter, impedance value of each EMI filter component, the frequency at which the insertion loss is measured, equivalent series resistance (ESR), and equivalent series induction (ESL).
- Insertion loss measurement at high frequencies is difficult due to increased noise detected for high frequency signals. To determine insertion loss at a high frequency, a radio frequency (RF) shield is welded to the filtered feed-through assembly. The RF shield isolates the input and output ends of the filtered feed-through assembly during the test. The welding operation and the RF shield itself increase the cost of producing an IMD. Additionally, this insertion loss measurement method cannot be used on a large-scale basis.
- Alternatively, insertion loss may be measured without a RF shield welded to the filtered feed-through assembly. However, this type of insertion loss measurement is unreliable. It is therefore desirable to overcome the limitations associated with conventional testing systems.
-
FIG. 1 depicts a block diagram of an exemplary testing system; -
FIG. 2 is a perspective side view of an exemplary feed-through assembly; -
FIG. 3 is a cross-sectional view of an exemplary filtered feed-through assembly; -
FIG. 4 is a perspective side view of an exemplary test fixture and a device under test; -
FIG. 5 is a portion of an exemplary test fixture with a pin piercing an oxide layer to connect with a ferrule of a filtered feed-through assembly; -
FIG. 6 is a graph illustrating insertion loss versus equivalent series resistance for a device evaluated by the testing system ofFIG. 1 ; and -
FIG. 7 is a flow diagram of a method to predict or estimate insertion loss associated with a feed-through assembly. - The following description of an embodiment is merely exemplary in nature and is in no way intended to limit the invention, its application, or uses. For purposes of clarity, the same reference numbers are used in the drawings to identify similar elements. As used herein, the term “module” refers to an application specific integrated circuit (ASIC), an electronic circuit, a processor (shared, dedicated, or group) and memory that execute one or more software or firmware programs, a combinational logic circuit, or other suitable components that provide the described functionality.
- Generally, the present invention is directed to measurement of insertion loss related to a device (e.g., filtered feed-through assembly) over a certain frequency range. For example, the frequency range of about 450 megahertz (MHz) to about 3 gigahertz (GHz) is used to determine the effectiveness of the low pass filter (e.g., capacitor(s) in the filtered feed-through assembly) disposed in an implantable medical device (IMD). This insertion loss measurement technique may be used over any other appropriate frequency range for a particular device.
- Specifically, the present invention relates to measurement of equivalent series resistance (ESR) effect on high frequency filtering performance of a filtered feed-through assembly for a device. A set of insertion loss data at a first high frequency (e.g. 450 MHz to about 3 GHz) is determined for a filtered feed-through assembly. A set of insertion loss data is generated at a second high frequency (e.g. 2450 MHz) for the filtered feed-through assembly. A set of ESR data is generated at a low frequency (e.g. 2 MHz) for the filtered feed-through assembly. The set of ESR data at the low frequency is correlated to the insertion loss generated at a first high frequency. This correlation may be graphically represented or tabulated. A prediction interval that includes upper and lower limits is superimposed on the graph. A specified insertion loss data (e.g. 30 dB) is selected for a particular device. An ESR limit for a low frequency signal is determined based upon the specified insertion loss data and the upper limit of the prediction interval. The ESR limit is compared to ESR values of manufactured filtered feed-through assemblies. Filtered feed-through assemblies are of acceptable quality when their ESR value is below the ESR limit. In contrast, filtered feed-through assemblies are rejected that exhibit an ESR value above the ESR limit.
- The present invention increases the accuracy of determining the ESR effect at high frequency signals filtered via a filtered feed-through assembly. Additionally, the present invention reduces the cost of producing an implantable medical device by eliminating welding of a shield to a feed-through assembly. Furthermore, the present invention may be implemented on a mass production scale.
-
FIG. 1 depicts atest system 10 that determines ESR effect on high frequency filtering performance of a device under test (DUT).Test system 10 includes acontrol module 12, aswitch matrix 14, an inductance, capacitance, resistance (LCR) meter or impedance meter 16 (i.e. measurement meter), and atest fixture 18. -
Control module 12 is typically a computer that includes a parallel port (not shown) connected tobus 20 a. The parallel port generally includes 32 lines and 16 input/output ports. Since two lines are associated with a single input/output port, multiple busses may be connected to the parallel port.Control module 12 connects toLCR meter 16 andswitch matrix 14 viabuses Control module 12 inputs a control signal overbuses LCR meter 16.LCR meter 16 is configured to measure and transmit to controlmodule 12 the inductance, capacitance, and resistance associated with a DUT that is connected to testfixture 18. - In one embodiment, the DUT is a filtered feed-through
assembly 30 depicted inFIGS. 2-3 . Filtered feed-throughassembly 30 consists of one or moreconductive lines 25 a-b that includenonpolarized capacitors 26, aferrule 32, and an insulator member (e.g. glass, ceramic etc.) 33.FIGS. 4-5 depict test fixture's 18 set of pogo pins 34 include spear points 38 that are configured to pierce anoxide layer 36. At least onepogo pin 34 directly contacts ferrule 32 to securely form a ground connection. The secure ground connection assists in detecting and measuring more accurate data than conventional systems. In addition to providing accurate insertion loss and ESR data,test system 10 also provides more accurate data related to measurement of capacitance, displacement factors, high voltage resistance, and other suitable factors. -
LCR meter 16 inputs a test signal at a certain frequency to switchmatrix 14 over conductive lines PH, IH. PH is a positive voltage conductive line whereas IH is a positive current conductive line. Based upon the signal fromLCR meter 16,switch matrix 14 selects one of four channels to test one or moreconductive lines 25 a-d of a feed-throughassembly 30. A first channel is formed by conductive lines N-7 and N-6; a second channel is formed by conductive lines N-5 and N-4; a third channel is formed by conductive lines N-3 and N-2; and a fourth channel is formed by conductive lines N-1 andN. Switch matrix 14 then signals aconductive line 25 a over the selected channel. A signal is then transmitted fromconductive line 25 a toLCR meter 16 over negative voltage conductive line PL and negative current conductive line IL.LCR meter 16 determines the ESR fortest fixture 18 and the insertion loss at two different high frequencies (e.g. 450 megahertz (MHz) and at 2450 MHz etc.). Generally, a high frequency ranges from about 9 KHz to about 10,000 MHz. The ESR is also measured at 2 MHz for the filtered feed-through assembly. The data is transmitted to controlmodule 12. This process is repeated for a set of filtered feed-through assemblies.Control module 12 then executes regression analysis instructions that correlate insertion loss data obtained at a high frequency to ESR data obtained at a low frequency, as depicted in the graph ofFIG. 6 . Exemplary regression analysis software is commercially available from Minitab located in State College, Pa. Regression analysis is described in detail by W. Mendenhall and T. Sincich, Statistics For Engineering And the Sciences (4th Ed. 1995), which is incorporated by reference, in relevant parts. - An example of simple regression analysis is presented below. Regression analysis determines the prediction interval (PI) for insertion loss, as depicted in
FIG. 6 . Pl, defined by lower andupper limits -
- where,
t is the Student's t-distribution statistic obtained from tabulated data,
t (df,α) is the critical value for the Student's t-distribution,
df=(n−2) is the degree of freedom,
=probability oftype 1 error=0.01,
n=sample size (i.e. number of pieces of data in one sample)
x =is the average value for x,
X0=ESR measured at a low frequency, -
-
y =the average value of insertion loss data -
- ŷ=predicted value of y for a given x
-
- The lower and upper Pl limits 40, 42 are determined from the confidence level and the standard error of the prediction. The Pl is generally wider than a confidence interval because of the added uncertainty involved in predicting a single response versus the mean response. The Pl is a discrete determination that is performed at a chosen Xo over a desired ESR range to create a curve. In the present example, Xo is selected over an ESR range such that the
upper limit 40 for insertion loss crosses the desired insertion loss specification limit 44 (Y-axis). In this example, the desired insertion loss limit is −30 decibels (dB). From this data, theESR limit 46 is determined to be 2.8Ω since this is the point at whichupper limit 42 crosses the desiredinsertion loss limit 44. - Using the above formula, the value of the Y interval (i.e., insertion loss) is predicted in an iterative manner for a given X0 (ESR). Table 1 summarizes ESR data at a lower frequency (e.g. 2 MHz) and the upper and lower limits for insertion loss.
-
TABLE 1 Tabulated data for a filtered feed-through assembly Prediction Limit For Prediction Limit For X0 (ESR Insertion Loss at 450 MHz Insertion Loss at 450 MHz at 2 MHz) Ω (Lower Limit) (Upper Limit) 2.3 −43.9578 −33.9257 2.4 −43.1368 −33.1196 2.5 −42.3326 −32.3272 2.6 −41.5451 −31.5485 2.7 −40.7741 −30.7837 2.75 −40.3948 −30.4065 2.8 −40.0196 −30.0329 2.85 −39.6484 −29.6628 2.9 −39.2813 −29.2963 2.95 −38.9182 −28.9333 3 −38.5592 −28.5739 - The ESR limit is based on a minimum insertion loss requirement.
ESR limit 46 is used to accept or reject a part. In particular,ESR limit 46 is compared to the ESR exhibited by the DUT. If the ESR of the DUT is belowESR limit 46, the DUT satisfies quality specifications. However, if the DUT's ESR value exceedsESR limit 46, the DUT does not meet quality specifications. DUT's are rejected that exceedESR limit 46. In addition to using theESR limit 46 to determine the quality of a DUT, the ESR value measured on the DUT can also be used to predict the insertion loss of the DUT using the same method. -
FIG. 6 is a flow diagram of one method to determine an ESR limit at a low frequency. Atoperation 110, a set of insertion loss data at a first high frequency (e.g. 450 MHz) is determined for a filtered feed-through assembly. At operation 120, a set of insertion loss data is generated at a second high frequency (e.g. 2450 MHz) for the filtered feed-through assembly. Atoperation 130, a set of ESR data is generated at a low frequency (e.g. 2 MHz) for the filtered feed-through assembly. The set of ESR data at a low frequency is correlated to the insertion loss generated at a first high frequency. This correlation may be graphically represented or tabulated. Atoperation 140, the set of insertion loss data is correlated to the set of ESR data. Atoperation 150, a prediction interval that includes upper and lower limits is generated and superimposed on the graph. Atoperation 160, a specified insertion loss value (e.g. 30 dB) is selected. The specified insert in loss value is based upon the desired minimal quality that is sought for a manufactured device (e.g. filtered feed-through assembly). Atoperation 170, an ESR limit for a low frequency signal is determined. The ESR limit is based upon the first insertion loss data and the upper limit of the prediction interval. The ESR limit is then used to reject or accept manufactured feed-through assemblies. - The present invention has numerous applications. For example, while the figures relate to quadripolar filtered feed-through assemblies, other types of feed-through assemblies may also rely on this process to reliably produce quality feed-through assemblies. Additionally, the operation described herein may be implemented entirely automatically or manually. Moreover, skilled artisans appreciate that measurement techniques are not polarity sensitive. Accordingly, techniques of the invention may be implemented with PH having a negative voltage and PL having a positive voltage. Similarly, IH can possess a negative current and IL can be a positive current. Furthermore, while the present invention describes rejection of a manufactured device (e.g. filtered feed-through assembly etc.) that exceeds an ESR limit, skilled artisans understand that principles of the invention may also be configured in a manner such that a manufactured device is rejected that is below an ESR limit.
- The description of the invention is merely exemplary in nature and, thus, variations that do not depart from the gist of the invention are intended to be within the scope of the invention. Such variations are not to be regarded as a departure from the spirit and scope of the invention.
Claims (8)
1. A test system comprising:
a test fixture which includes a block; and
a plurality of pins coupled to the block, each pin includes a sharp distal tip;
a switch matrix coupled to the test fixture through at least one channel;
a measurement meter coupled to the switch matrix and the test fixture via at least two wires; and
a control module coupled to the switch matrix and the measurement meter, wherein the sharp distal tip of each pin configured to pierce an oxide layer over a ferrule of a feed-through assembly to securely form a ground connection.
2. The test system of claim 1 wherein the plurality of pins directly contact one of a conductive line and the ferrule of the feed-through assembly.
3. The test system of claim 1 wherein the measurement meter provides an alternating current signal to the switch matrix.
4. The test system of claim 1 wherein the control module executes instructions related to:
determining insertion loss data at a high frequency;
determining a set of ESR data at a low frequency;
determining an ESR limit at a low frequency;
determining an ESR value for a manufactured filtered feed-through assembly; and
determining quality of the manufactured filtered feed-through assembly based upon the ESR limit.
5. A method comprising:
determining an ESR limit at a low frequency;
determining an ESR value for a manufactured filtered feed-through assembly; and
determining quality of the manufactured filtered feed-through assembly based upon the ESR limit.
6. The method of claim 1 further comprising:
forming a secure ground connection between a ferrule of the filtered feed-through assembly and a pin of a test fixture.
7. The method of claim 1 further comprising:
rejecting the feed-through assembly that exceeds an acceptable ESR limit.
8. A method comprising:
determining an ESR limit at a low frequency;
determining an ESR value for a manufactured filtered feed-through assembly;
determining quality of the manufactured filtered feed-through assembly based upon the ESR limit;
forming a secure ground connection between a ferrule of the filtered feed-through assembly and a pin of a test fixture;
rejecting the feed-through assembly that exceeds an acceptable ESR limit.
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US11/236,369 US7538563B2 (en) | 2005-09-27 | 2005-09-27 | Determination of equivalent series resistance |
US12/396,215 US7816928B2 (en) | 2005-09-27 | 2009-03-02 | Determination of equivalent series resistance |
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CN107748293A (en) * | 2017-10-18 | 2018-03-02 | 国家电网公司 | Ground wire, test system and method |
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US7538563B2 (en) * | 2005-09-27 | 2009-05-26 | Medtronic, Inc. | Determination of equivalent series resistance |
TW201326774A (en) * | 2011-12-19 | 2013-07-01 | Hon Hai Prec Ind Co Ltd | Lens electrical testing system and testing method thereof |
CN105425044B (en) * | 2015-12-01 | 2019-01-11 | 中国科学院西安光学精密机械研究所 | Matrix automatic impedance tester and test method |
CN107462786B (en) * | 2017-06-28 | 2019-08-20 | 山东航天电子技术研究所 | A kind of matrix comprehensive tester and test method |
CN107478930A (en) * | 2017-08-04 | 2017-12-15 | 久心医疗科技(苏州)有限公司 | Defibrillator performance automatic checkout system and method |
CN108594015A (en) * | 2018-04-17 | 2018-09-28 | 中北大学 | Cable static impedance auto testing instrument and test method |
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US7816928B2 (en) | 2010-10-19 |
US7538563B2 (en) | 2009-05-26 |
US20070069742A1 (en) | 2007-03-29 |
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