US20050098722A1 - Target support and method for ion production enhancement - Google Patents

Target support and method for ion production enhancement Download PDF

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Publication number
US20050098722A1
US20050098722A1 US11/005,940 US594004A US2005098722A1 US 20050098722 A1 US20050098722 A1 US 20050098722A1 US 594004 A US594004 A US 594004A US 2005098722 A1 US2005098722 A1 US 2005098722A1
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ion source
matrix
mass spectrometer
based ion
ion
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US11/005,940
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Jean-Luc Truche
Jian Bai
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Individual
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Individual
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Priority claimed from US10/080,879 external-priority patent/US6825462B2/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409Sample holders or containers
    • H01J49/0418Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0477Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample using a hot fluid

Definitions

  • the invention relates generally to the field of mass spectrometry and more particularly toward a heated target support to provide enhanced analtye ions in an atmospheric pressure matrix assisted laser desorption/ionization (AP-MALDI) mass spectrometer.
  • AP-MALDI atmospheric pressure matrix assisted laser desorption/ionization
  • the techniques have also had success on a broad based level of compounds including peptides, proteins, carbohydrates, oligosaccharides, natural products, cationic drugs, organoarsenic compounds, cyclic glucans, taxol, taxol derivatives, metalloporphyrins, porphyrins, kerogens, cyclic siloxanes, aromatic polyester dendrimers, oligodeoxynucleotides, polyaromatic hydrocarbons, polymers and lipids.
  • compounds including peptides, proteins, carbohydrates, oligosaccharides, natural products, cationic drugs, organoarsenic compounds, cyclic glucans, taxol, taxol derivatives, metalloporphyrins, porphyrins, kerogens, cyclic siloxanes, aromatic polyester dendrimers, oligodeoxynucleotides, polyaromatic hydrocarbons, polymers and lipids.
  • the analyte and matrix in solution is applied to a probe or target substrate
  • the solvent evaporates the analyte and matrix co-precipitate out of solution to form a solid solution of the analyte in the matrix on the target substrate.
  • the co-precipitate is then irradiated with a short laser pulse inducing the accumulation of a large amount of energy in the co-precipitate through electronic excitation or molecular vibration of the matrix molecules.
  • the matrix dissipates the energy by desorption, carrying along the analyte into the gaseous phase. During this desorption process, ions are formed by charge transfer between the photo-excited matrix and analyte.
  • the MALDI technique of ionization is performed using a time-of-flight analyzer, although other mass analyzers such as an ion trap, an ion cyclotron resonance mass spectrometer and quadrupole time-of-flight are also used. These analyzers, however, must operate under high vacuum, which among other things may limit the target throughput, reduce resolution, capture efficiency, and make testing targets more difficult and expensive to perform.
  • AP-MALDI a technique referred to as AP-MALDI.
  • This technique employs the MALDI technique of ionization, but at atmospheric pressure.
  • the MALDI and the AP-MALDI ionization techniques have much in common. For instance, both techniques are based on the process of pulsed laser beam desorption/ionization of a solid-state target material resulting in production of gas phase analyte molecular ions.
  • AP-MALDI can provide detection of a molecular mass up to 10 6 Da from a target size in the attamole range.
  • levels of sensitivity become increasingly important
  • Various structural and instrument changes have been made to MALDI mass spectrometers in an effort to improve sensitivity. Additions of parts and components, however, provides for increased instrument cost.
  • attempts have been made to improve sensitivity by altering the analyte matrix mixed with the target.
  • sensitivity of the AP MALDI source has been limited by a number of factors including the geometry of the target as well as its position relative to the capillary, the laser beam energy density on the target surface, and the general flow dynamics of the system.
  • sensitivity of the AP-MALDI mass spectrometers for increased and efficient ion enhancement.
  • the present invention relates to an apparatus and method for use with a mass spectrometer.
  • the invention provides an ion production and enhancement system for producing and enhancing analyte ions in a mass spectrometer.
  • the mass spectrometer of the present invention provides an ion production and enhancement system that comprises a matrix based ion source with a heated target support for enhancing analyte ions produced by the ion source, an ion transport system adjacent to or integrated with the ion production and enhancement system for transporting the enhanced analtye ions, and a detector downstream from the transport system for detecting the enhanced analyte ions.
  • the method of the present invention comprises enhancing analyte ions produced from a matrix based ion source by heating a target support and a region adjacent to the target support and detecting the enhanced analyte ions with a detector.
  • FIG. 1A shows general block diagram of a mass spectrometer.
  • FIG. 1B shows a second general block diagram of a mass spectrometer.
  • FIG. 2A shows a first embodiment of the present invention.
  • FIG. 2B shows another embodiment of the invention shown in FIG. 2A .
  • FIG. 3A shows a second embodiment of the present invention.
  • FIG. 3B shows another embodiment of the invention shown in FIG. 3A .
  • FIG. 4 shows a perspective view of the first embodiment of the invention.
  • FIG. 5 shows an exploded view of the first embodiment of the invention.
  • FIG. 6 shows a cross sectional view of the first embodiment of the invention.
  • FIG. 7 shows a cross sectional view of a prior art device.
  • FIG. 8 shows a cross sectional view of the first embodiment of the invention and illustrates how the method of the present invention operates.
  • FIG. 9 shows the analysis results of a femto molar peptide mixture without heat supplied by the present invention.
  • FIG. 10 shows analysis results of a femto molar peptide mixture with the addition of heat supplied by the present invention to the analyte ions produced by the ion source in the ionization region adjacent to the collecting capillary.
  • adjacent means, near, next to or adjoining. Something adjacent may also be in contact with another component, surround the other component, be spaced from the other component or contain a portion of the other component For instance, a capillary that is adjacent to a conduit may be spaced next to the conduit, may contact the conduit, may surround or be surrounded by the conduit, may contain the conduit or be contained by the conduit, may adjoin the conduit or may be near the conduit.
  • conduit refers to any sleeve, transport device, dispenser, nozzle, hose, pipe, plate, pipette, port, connector, tube, coupling, container, housing, structure or apparatus that may be used to direct a heated gas or gas flow toward a defined region in space such as an ionization region.
  • the “conduit” may be designed to enclose a capillary or portion of a capillary that receives analyte ions from an ion source.
  • the term should be interpreted broadly, however, to also include any device, or apparatus that may be oriented toward the ionization region and which can provide a heated gas flow toward or into ions in the gas phase and/or in the ionization region.
  • the term could also include a concave or convex plate with an aperture that directs a gas flow toward the ionization region.
  • the term “enhance” refers to any external physical stimulus such as heat, energy, light, or temperature change, etc. that makes a substance more easily characterized or identified.
  • a heated gas may be applied to “enhance” ions.
  • the ions increase their kinetic energy, potentials or motions and are declustered or vaporized. Ions in this state are more easily detected by a mass analyzer. It should be noted that when the ions are “enhanced”, the number of ions detected is enhanced since a higher number of analyte ions are sampled through a collecting capillary and carried to a mass analyzer or detector.
  • Ion source refers to any source that produces analyte ions. Ion sources may include other sources besides AP-MALDI ion sources such as electron impact (herein after referred to as EI), chemical ionization (CI) and other ion sources known in the art.
  • EI electron impact
  • CI chemical ionization
  • the term “ion source” refers to the laser, target substrate, and target to be ionized on the target substrate.
  • the target substrate in AP-MALDI may include a grid for target deposition. Spacing between targets on such grids is around 1-10 mm. Approximately 0.5 to 2 microliters is deposited on each site on the grid.
  • the term “ionization region” refers to the area between the ion source and the collecting capillary.
  • the term refers to the analyte ions produced by the ion source that reside in that region and which have not yet been channeled into the collecting capillary.
  • This term should be interpreted broadly to include ions in, on, about or around the target support as well as ions in the heated gas phase above and around the target support and collecting capillary.
  • the ionization region in AP MALDI is around 1-5 mm in distance from the ion source (target substrate) to a collecting capillary (or a volume of 1-5 mm 3 ).
  • the distance from the target substrate to the conduit is important to allow ample gas to flow from the conduit toward the target and target substrate. For instance, if the conduit is too close to the target or target substrate, then arcing takes place when voltage is applied. If the distance is too far, then there is no efficient ion collection.
  • an “ion enhancement system” refers to any device, apparatus or components used to enhance analyte ions. The term does not include directly heating a capillary to provide conductive heat to an ion stream.
  • an “ion enhancement system” comprises a conduit and a gas source.
  • An ion enhancement system may also include other devices well known in the art such as a laser, infrared red device, ultraviolet source or other similar type devices that may apply heat or energy to ions released into the ionization region or in the gas phase.
  • ion production and enhancement system refers to any device, apparatus or components used to produce and enhance analyte ions.
  • a heated target support can be used to both provide for ion production and enhancement.
  • the term does not include directly heating a capillary to provide conductive heat to an ion stream.
  • the ion production and enhancement system may further comprise an ion source and an ion enhancement system.
  • the ion source and the ion enhancement system can be separate devices or integrated, part of or comprise the same apparatus.
  • ion transport system refers to any device, apparatus, machine, component, capillary, that shall aid in the transport, movement, or distribution of analyte ions from one position to another.
  • the term is broad based to include ion optics, skimmers, capillaries, conducting elements and conduits.
  • matrix based refers to an ion source or mass spectrometer that does not require the use of a drying gas, curtain gas, or desolvation step. For instance, some systems require the use of such gases to remove solvent or cosolvent that is mixed with the analyte. These systems often use volatile liquids to help form smaller droplets. The above term applies to both nonvolatile liquids and solid materials in which the sample is dissolved. The term includes the use of a cosolvent. Cosolvents may be volatile or nonvolatile, but must not render the final matrix material capable of evaporating in vacuum.
  • Such materials would include, and not be limited to m-nitrobenzyl alcohol (NBA), glycerol, triethanolamine (TEA), 2,4-dipentylphenol, 1,5-dithiothrietol/dierythritol (magic bullet), 2-nitrophenyl octyl ether (NPOE), thioglycerol, nicotinic acid, cinnamic acid, 2,5-dihydroxy benzoic acid (DHB), 3,5-dimethoxy-4-hydroxycinnamic acid (sinpinic acid), ⁇ -cyano-4-hydroxycinnamic acid (CCA), 3-methoxy-4-hydroxycinnamic acid (ferulic acid),), monothioglycerol, carbowax, 2-(4-hydroxyphenylazo)benzoic acid (HABA), 3,4-dihydroxycinnamic acid (caffeic acid), 2-amino-4-methyl-5-nitropyridine with their cosolvents and derivatives.
  • gas flow refers to any gas that is directed in a defined direction in a mass spectrometer.
  • the term should be construed broadly to include monatomic, diatomic, triatomic and polyatomic molecules that can be passed or blown through a conduit.
  • the term should also be construed broadly to include mixtures, impure mixtures, or contaminants.
  • the term includes both inert and non-inert matter. Common gases used with the present invention could include and not be limited to ammonia, carbon dioxide, helium, fluorine, argon, xenon, nitrogen, air etc.
  • gas source refers to any apparatus, machine, conduit, or device that produces a desired gas or gas flow. Gas sources often produce regulated gas flow, but this is not required.
  • capillary or “collecting capillary” shall be synonymous and will conform with the common definition(s) in the art.
  • the term should be construed broadly to include any device, apparatus, orifice, tube, hose or conduit that may receive ions.
  • detector refers to any device, apparatus, machine, component, or system that can detect an ion. Detectors may or may not include hardware and software. In a mass spectrometer the common detector includes and/or is coupled to a mass analyzer.
  • FIG. 1A shows a general block diagram of a mass spectrometer.
  • the block diagram is not to scale and is drawn in a general format because the present invention may be used with a variety of different types of mass spectrometers.
  • the mass spectrometer 1 of the present invention comprises an ion production and enhancement system 37 , an ion transport system 6 and a detector 11 .
  • the ion production and enhancement system 37 may comprise an ion source 3 and ion enhancement system 2 as one integrated part (See FIG. 1A ) or as separate components (See FIG. 1B ).
  • the ion source 3 may be located in a number of positions or locations.
  • a variety of ion sources may be used with the present invention.
  • the ion enhancement system 2 may comprise a conduit 9 and a gas source 7 .
  • the ion enhancement system 2 should not be interpreted to be limited to just these two configurations or embodiments.
  • the ion transport system 6 is adjacent to the ion enhancement system 2 and may also comprise a collecting capillary 5 or any ion optics, conduits or devices that may transport analyte ions and that are well known in the art.
  • FIG. 1B shows a second general block diagram of a mass spectrometer.
  • the block diagram is not to scale and is drawn in a general format, because the present invention may be used with a variety of different types of mass spectrometers.
  • the mass spectrometer 1 of the present invention comprises the ion source 3 , the ion enhancement system 2 , the ion transport system 6 and the detector 11 .
  • the ion enhancement system 2 may be interposed between the ion source 3 and the ion detector 11 or may comprise part of the ion source 3 and/or part of the ion transport system 6 .
  • the ion source 3 may be located in a number of positions or locations.
  • a variety of ion sources may be used with the present invention.
  • EI, CI or other ion sources well known in the art may be used with the invention.
  • the ion enhancement system 2 may comprise a conduit 9 and a gas source 7 . Further details of the ion enhancement system 2 are provided in FIGS. 2-3 .
  • the ion enhancement system 2 should not be interpreted to be limited to just these two configurations or embodiments.
  • the ion transport system 6 is adjacent to the ion enhancement system 2 and may comprise a collecting capillary 5 or any ion optics, conduits or devices that may transport analyte ions and that are well known in the art.
  • FIG. 2A shows a cross-sectional view of a first embodiment of the invention.
  • the figure shows the present invention applied to an AP-MALDI mass spectrometer system.
  • the figure shows the invention with a source housing 14 .
  • the use of the source housing 14 to enclose the ion source and system is optional. Certain parts, components and systems may or may not be under vacuum. These techniques and structures are well known in the art.
  • the ion source 3 comprises a laser 4 , a deflector 8 and a target support 10 .
  • a target 13 is applied to the target support 10 in a matrix material well known in the art.
  • the laser 4 provides a laser beam that is deflected by the deflector 8 toward the target 13 .
  • the target 13 is then ionized and the analyte ions are released as an ion plume into an ionization region 15 .
  • the ionization region 15 is located between the ion source 3 and the collecting capillary 5 .
  • the ionization region 15 comprises the space and area located in the area between the ion source 3 and the collecting capillary 5 .
  • This region contains the ions produced by ionizing the sample that are vaporized into a gas phase. This region can be adjusted in size and shape depending upon how the ion source 3 is arranged relative to the collecting capillary 5 . Most importantly, located in this region are the analyte ions produced by ionization of the target 13 .
  • the collecting capillary 5 is located downstream from the ion source 3 and may comprise a variety of material and designs that are well known in the art
  • the collecting capillary 5 is designed to receive and collect analyte ions produced from the ion source 3 that are discharged as an ion plume into the ionization region 15 .
  • the collecting capillary 5 has an aperture and/or elongated bore 12 that receives the analyte ions and transports them to another capillary or location.
  • the collecting capillary 5 is connected to a main capillary 18 that is under vacuum and further downstream.
  • the collecting capillary 5 may be supported in place by an optional insulator 17 .
  • Other structures and devices well known in the art may be used to support the collecting capillary 5 .
  • the conduit 9 provides a flow of heated gas toward the ions in the ionization region 15 .
  • the heated gas interacts with the analyte ions in the ionization region 15 to enhance the analyte ions and allow them to be more easily detected by the detector 11 (not shown in FIG. 2 ).
  • These ions include the ions that exist in the heated gas phase.
  • the detector 11 is located further downstream in the mass spectrometer (see FIG. 1 ).
  • the conduit 9 may comprise a variety of materials and devices well known in the art.
  • the conduit 9 may comprise a sleeve, transport device, dispenser, nozzle, hose, pipe, pipette, port, connector, tube, coupling, container, housing, structure or apparatus that is used to direct a heated gas or gas flow toward a defined region in space or location such as the ionization region 15 . It is important to the invention that conduit 9 be positioned sufficiently close to the target 13 and the target support 10 so that a sufficient amount of heated gas can be applied to the ions in the ionization region 15 .
  • the gas source 7 provides the heated gas to the conduit 9 .
  • the gas source 7 may comprise any number of devices to provide heated gas. Gas sources are well known in the art and are described elsewhere.
  • the gas source 7 may be a separate component as shown in FIGS. 2-3 or may be integrated with a coupling 23 (shown in FIG. 4 ) that operatively joins the collecting capillary 5 , the conduit 9 and the main capillary 18 .
  • the gas source 7 may provide a number of gases to the conduit 9 .
  • gases such as nitrogen, argon, xenon, carbon dioxide, air, helium etc. may be used with the present invention.
  • the gas need not be inert and should be capable of carrying a sufficient quantity of energy or heat.
  • Other gases well known in the art that contain these characteristic properties may also be used with the present invention.
  • FIG. 2B shows another embodiment of the invention shown in FIG. 2A .
  • This embodiment includes the use of an optional heating device 16 that supplies heat to the target support 10 .
  • the heating device 16 may be used with or without the conduit 9 and associated parts.
  • the heating device 16 may be used with the capillary 5 and may serve the dual purpose of ion production and enhancement Ion enhancement is obtained by applying heat to the ionization region 15 .
  • the heating device 16 supplies heat to the target support 10 .
  • the heat then enhances the ions in the ionization region 15 produced from ionization of the target 13 .
  • the heating device 16 also provide for the ionization of the target 13 .
  • any heating device known in the art may be used to supply heat to the target support 10 .
  • Such heating devices may include and are not limited to conductive and radiative heating devices, an embedded heater, a heated fluid, a hot plate and a heated holder.
  • FIG. 3A shows a cross sectional view of a second embodiment of the present invention.
  • the conduit 9 may be oriented in any number of positions to direct gas toward the ionization region 15 .
  • FIG. 3 in particular shows the conduit 9 in detached mode from the collecting capillary 5 . It is important to the invention that the conduit 9 be capable of directing a sufficient flow of heated gas to provide enhancement to the analyte ions located in the ionization region 15 .
  • the conduit 9 can be positioned from around 1-5 mm in distance from the target 13 or the target support 10 .
  • the heated gas applied to the target 13 and the target support 10 should be in the temperature range of about 60-150 degrees Celsius.
  • the gas flow rate should be approximately 2-15 L/minute.
  • FIG. 3B shows another embodiment of the invention shown in FIG. 3A .
  • This embodiment includes the use of the optional heating device 16 that supplies heat to the target support 10 .
  • the heating device 16 may be used with or without the conduit 9 and associated parts.
  • the heating device 16 may be used with the capillary 5 and may serve the dual purpose of ion production and enhancement. Ion enhancement is obtained by applying heat to the ionization region 15 .
  • the heating device 16 supplies heat to the target support 10 .
  • the heat then enhances the ions in the ionization region 15 produced from ionization of the target 13 .
  • the heating device 16 also provide for the ionization of the target 13 .
  • FIGS. 2 and 4 - 7 illustrate the first embodiment of the invention.
  • the conduit 9 is designed to enclose the collecting capillary 5 .
  • the conduit 9 may enclose all of the collecting capillary 5 or a portion of it However, it is important that the conduit 9 be adjacent to the collecting capillary end 20 so that heated gas can be delivered to the analyte ions located in the ionization region 15 before they enter or are collected by the collecting capillary 5 .
  • FIGS. 1-6 and 8 show only a few embodiments of the present invention and are employed for illustrative purposes only. They should not be interpreted as narrowing the broad scope of the invention.
  • the conduit 9 may be a separate component or may comprise a part of the coupling 23 .
  • FIGS. 4-6 show the conduit 9 as a separate component.
  • FIGS. 4-6 show coupling 23 and its design for joining the collecting capillary 5 , the main capillary 18 , and the conduit 9 .
  • the coupling 23 is designed for attaching to a fixed support 31 (shown in FIGS. 7 and 8 ).
  • the coupling 23 comprises a spacer 33 , a housing 35 , and a capillary cap 34 (See FIG. 5 ).
  • the capillary cap 34 and the spacer 33 are designed to fit within the housing 35 .
  • the spacer 33 is designed to apply pressure to the capillary cap 34 so that a tight seal is maintained between the capillary cap 34 and the main capillary 18 .
  • the capillary cap 34 is designed to receive the main capillary 18 .
  • a small gap 36 is defined between the spacer 33 and the capillary cap 34 (See FIG. 6 ). The small gap 36 allows gas to flow from the gas source 7 into the collecting capillary 5 as opposed to out of the housing 35 as is accomplished with prior art devices.
  • An optional centering device 40 may be provided between the collecting capillary 5 and the conduit 9 .
  • the centering device 40 may comprise a variety of shapes and sizes. It is important that the centering device 40 regulate the flow of gas that is directed into the ionization region 15 .
  • FIGS. 4-6 show the centering device as a triangular plastic insert. However, other designs and devices may be employed between the conduit 9 and the collecting capillary 5 .
  • the detector 11 is located downstream from the ion source 3 and the conduit 9 .
  • the detector 11 may be a mass analyzer or other similar device well known in the art for detecting the enhanced analyte ions that were collected by the collecting capillary 5 and transported to the main capillary 18 .
  • the detector 11 may also comprise any computer hardware and software that are well known in the art and which may help in detecting enhanced analyte ions.
  • FIG. 7 shows a cross sectional view of a prior art device.
  • the collecting capillary 5 is connected to the main capillary 18 by the capillary cap 34 .
  • the capillary cap is designed for receiving the main capillary 18 and is disposed in the housing 35 .
  • the housing 35 connects directly to the fixed support 31 .
  • the gas source 7 provides the gas through the channels 38 defined between the housing 35 and the capillary cap 34 .
  • the gas flows from the gas source 7 into the channel 38 through a passageway 24 and then into an ionization chamber 30 .
  • the gas is released into the ionization chamber 30 and serves no purpose at this point.
  • FIG. 8 shows a cross sectional view of the first embodiment of the present invention, with the conduit 9 positioned between the ion source 3 and the gas source 7 .
  • the conduit 9 operates to carry the heated gas from the gas source 7 to the collecting capillary end 20 .
  • the method of the present invention produces enhanced analyte ions for ease of detection in the mass spectrometer 1 .
  • the method comprises heating analyte ions located in the ionization region 15 adjacent to the collecting capillary 5 with a directed gas to make them more easily detectable by the detector 11 .
  • Gas is produced by the gas source 7 , directed through the channels 38 and the small gap 36 . From there the gas is carried into an annular space 42 defined between the conduit 9 and the collecting capillary 5 .
  • the heated gas then contacts the optional centering device 40 (not shown in FIG. 8 ).
  • the centering device 40 is disposed between the collecting capillary 5 and the conduit 9 and shaped in a way to regulate the flow of gas to the ionization region 15 .
  • Gas flows out of the conduit 9 into the ionization region 15 adjacent to the collecting capillary end 20 .
  • the analyte ions in the ionization region 15 are heated by the gas that is directed into this region.
  • Analyte ions that are then enhanced are collected by the collecting capillary 5 , carried to the main capillary 18 and then sent to the detector 11 . It should be noted that after heat has been added to the analyte ions adjacent to the source, the detection limits and signal quality improve dramatically.
  • a Bruker Esquire-LC ion trap mass spectrometer was used for AP-MALDI studies.
  • the mass spectrometer ion optics were modified (one skimmer, dual octapole guide with partitioning) and the ion sampling inlet of the instrument consisted of an ion sampling capillary extension with a conduit concentric to a capillary extension.
  • the ion sampling inlet received a gas flow of 4-10 L/min. of heated nitrogen.
  • a laser beam (337.1 nm, at 10 Hz) was delivered by a 400 micron fiber through a single focusing lens onto the target. The laser power was estimated to be around 50 to 70 uJ.
  • the data was obtained by using Ion Charge Control by setting the maximum trapping time to 300 ms (3 laser shots) for the mass spectrometer scan spectrum. Each spectrum was an average of 8 micro scans for 400 to 2200 AMU.
  • the matrix used was an 8 mM alpha-cyano-4-hydroxy-cinnamic acid in 25% methanol, 12% TPA, 67% water with 1% acetic acid.
  • Matrix targets were premixed and 0.5 ul of the matrix/target mixture was applied onto a gold plated stainless steel target Targets used included trypsin digest of bovine serum albumin and standard peptide mixture containing angiotensin I and II bradykinin, and fibrinopeptide A.
  • FIG. 9 shows the results without the addition of heated gas to the target or ionization region. The figure does not show the existence of sharp peaks (ion enhancement) at the higher m/z ratios.
  • FIG. 10 shows the results with the addition of the heated gas to the target in the ionization region.
  • the figure shows the existence of the sharp peaks (ion enhancement) at the higher m/z ratios.

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Abstract

The present invention relates to an apparatus and method for use with a mass spectrometer. The ion production and enhancement system of the present invention is used to enhance analyte ions for ease of detection in a mass spectrometer. The method of the invention compromises producing and enhancing analyte ions with an ion production and enhancement system and detecting the enhanced analyte ions with a detector.

Description

    CROSS-REFERENCE TO RELATED APPLICATIONS
  • This Nonprovisional application for patent is a Continuation-in-Part of U.S. Nonprovisional application Ser. No. 10/080,879, which was filed on Feb. 22, 2002. U.S. Nonprovisional application for patent Ser. No. 10/1080,879 is also hereby incorporated by reference in its entirety.
  • TECHNICAL FIELD
  • The invention relates generally to the field of mass spectrometry and more particularly toward a heated target support to provide enhanced analtye ions in an atmospheric pressure matrix assisted laser desorption/ionization (AP-MALDI) mass spectrometer.
  • BACKGROUND
  • Most complex biological and chemical targets require the application of complementary multidimensional analysis tools and methods to compensate for target and matrix interferences. Correct analysis and separation is important to obtain reliable quantitative and qualitative information about a target. In this regard, mass spectrometers have been used extensively as detectors for various separation methods. However, until recently most spectral methods provided fragmentation patterns that were too complicated for quick and efficient analysis. The introduction of atmospheric pressure ionization (API) and matrix assisted laser desorption ionization (MALDI) has improved results substantially. For instance, these methods provide significantly reduced fragmentation patterns and high sensitivity for analysis of a wide variety of volatile and non-volatile compounds. The techniques have also had success on a broad based level of compounds including peptides, proteins, carbohydrates, oligosaccharides, natural products, cationic drugs, organoarsenic compounds, cyclic glucans, taxol, taxol derivatives, metalloporphyrins, porphyrins, kerogens, cyclic siloxanes, aromatic polyester dendrimers, oligodeoxynucleotides, polyaromatic hydrocarbons, polymers and lipids.
  • According to the MALDI method of ionization, the analyte and matrix in solution is applied to a probe or target substrate As the solvent evaporates, the analyte and matrix co-precipitate out of solution to form a solid solution of the analyte in the matrix on the target substrate. The co-precipitate is then irradiated with a short laser pulse inducing the accumulation of a large amount of energy in the co-precipitate through electronic excitation or molecular vibration of the matrix molecules. The matrix dissipates the energy by desorption, carrying along the analyte into the gaseous phase. During this desorption process, ions are formed by charge transfer between the photo-excited matrix and analyte.
  • Conventionally, the MALDI technique of ionization is performed using a time-of-flight analyzer, although other mass analyzers such as an ion trap, an ion cyclotron resonance mass spectrometer and quadrupole time-of-flight are also used. These analyzers, however, must operate under high vacuum, which among other things may limit the target throughput, reduce resolution, capture efficiency, and make testing targets more difficult and expensive to perform.
  • To overcome the above-mentioned disadvantages in MALDI, a technique referred to as AP-MALDI has been developed. This technique employs the MALDI technique of ionization, but at atmospheric pressure. The MALDI and the AP-MALDI ionization techniques have much in common. For instance, both techniques are based on the process of pulsed laser beam desorption/ionization of a solid-state target material resulting in production of gas phase analyte molecular ions.
  • AP-MALDI can provide detection of a molecular mass up to 106 Da from a target size in the attamole range. In addition, as large groups of proteins, peptides or other compounds are being processed and analyzed by these instruments, levels of sensitivity become increasingly important Various structural and instrument changes have been made to MALDI mass spectrometers in an effort to improve sensitivity. Additions of parts and components, however, provides for increased instrument cost. In addition, attempts have been made to improve sensitivity by altering the analyte matrix mixed with the target. These additions and changes, however, have provided limited improvements in sensitivity with added cost. More recently, the qualitative and quantitative effects of heat on performance of AP-MALDI has been studied and assessed. In particular, it is believed that the performance of an unheated (room temperature) AP-MALDI source is quite poor due to the large and varying clusters produced in the analyte ions. These large clusters are formed and stabilized by collisions at atmospheric pressure. The results of different AP-MALDI matrixes to different levels of heat have been studied. In particular, studies have focused on heating the transfer capillary near the source. These studies show some limited improvement in overall instrument sensitivity. A drawback of this technique is that heating and thermal conductivity of the system is limited by the materials used in the capillary. Furthermore, sensitivity of the AP MALDI source has been limited by a number of factors including the geometry of the target as well as its position relative to the capillary, the laser beam energy density on the target surface, and the general flow dynamics of the system. Thus, there is a need to improve the sensitivity and results of AP-MALDI mass spectrometers for increased and efficient ion enhancement.
  • SUMMARY OF THE INVENTION
  • The present invention relates to an apparatus and method for use with a mass spectrometer. The invention provides an ion production and enhancement system for producing and enhancing analyte ions in a mass spectrometer. The mass spectrometer of the present invention provides an ion production and enhancement system that comprises a matrix based ion source with a heated target support for enhancing analyte ions produced by the ion source, an ion transport system adjacent to or integrated with the ion production and enhancement system for transporting the enhanced analtye ions, and a detector downstream from the transport system for detecting the enhanced analyte ions.
  • The method of the present invention comprises enhancing analyte ions produced from a matrix based ion source by heating a target support and a region adjacent to the target support and detecting the enhanced analyte ions with a detector.
  • BRIEF DESCRIPTION OF THE FIGURES
  • The invention is described in detail below with reference to the following figures:
  • FIG. 1A shows general block diagram of a mass spectrometer.
  • FIG. 1B shows a second general block diagram of a mass spectrometer.
  • FIG. 2A shows a first embodiment of the present invention.
  • FIG. 2B shows another embodiment of the invention shown in FIG. 2A.
  • FIG. 3A shows a second embodiment of the present invention.
  • FIG. 3B shows another embodiment of the invention shown in FIG. 3A.
  • FIG. 4 shows a perspective view of the first embodiment of the invention.
  • FIG. 5 shows an exploded view of the first embodiment of the invention.
  • FIG. 6 shows a cross sectional view of the first embodiment of the invention.
  • FIG. 7 shows a cross sectional view of a prior art device.
  • FIG. 8 shows a cross sectional view of the first embodiment of the invention and illustrates how the method of the present invention operates.
  • FIG. 9 shows the analysis results of a femto molar peptide mixture without heat supplied by the present invention.
  • FIG. 10 shows analysis results of a femto molar peptide mixture with the addition of heat supplied by the present invention to the analyte ions produced by the ion source in the ionization region adjacent to the collecting capillary.
  • DETAILED DESCRIPTION OF THE INVENTION
  • Before describing the invention in detail, it must be noted that, as used in this specification and the appended claims, the singular forms “a,” “an,” and “the” include plural referents unless the context clearly dictates otherwise. Thus, for example, reference to “a conduit” includes more than one “conduit”. Reference to a “matrix” includes more than one “matrix” or a mixture of “matrixes”. In describing and claiming the present invention, the following terminology will be used in accordance with the definitions set out below.
  • The term “adjacent” means, near, next to or adjoining. Something adjacent may also be in contact with another component, surround the other component, be spaced from the other component or contain a portion of the other component For instance, a capillary that is adjacent to a conduit may be spaced next to the conduit, may contact the conduit, may surround or be surrounded by the conduit, may contain the conduit or be contained by the conduit, may adjoin the conduit or may be near the conduit.
  • The term “conduit” or “heated conduit” refers to any sleeve, transport device, dispenser, nozzle, hose, pipe, plate, pipette, port, connector, tube, coupling, container, housing, structure or apparatus that may be used to direct a heated gas or gas flow toward a defined region in space such as an ionization region. In particular, the “conduit” may be designed to enclose a capillary or portion of a capillary that receives analyte ions from an ion source. The term should be interpreted broadly, however, to also include any device, or apparatus that may be oriented toward the ionization region and which can provide a heated gas flow toward or into ions in the gas phase and/or in the ionization region. For instance, the term could also include a concave or convex plate with an aperture that directs a gas flow toward the ionization region.
  • The term “enhance” refers to any external physical stimulus such as heat, energy, light, or temperature change, etc. that makes a substance more easily characterized or identified. For example, a heated gas may be applied to “enhance” ions. The ions increase their kinetic energy, potentials or motions and are declustered or vaporized. Ions in this state are more easily detected by a mass analyzer. It should be noted that when the ions are “enhanced”, the number of ions detected is enhanced since a higher number of analyte ions are sampled through a collecting capillary and carried to a mass analyzer or detector.
  • The term “ion source” or “source” refers to any source that produces analyte ions. Ion sources may include other sources besides AP-MALDI ion sources such as electron impact (herein after referred to as EI), chemical ionization (CI) and other ion sources known in the art. The term “ion source” refers to the laser, target substrate, and target to be ionized on the target substrate. The target substrate in AP-MALDI may include a grid for target deposition. Spacing between targets on such grids is around 1-10 mm. Approximately 0.5 to 2 microliters is deposited on each site on the grid.
  • The term “ionization region” refers to the area between the ion source and the collecting capillary. In particular, the term refers to the analyte ions produced by the ion source that reside in that region and which have not yet been channeled into the collecting capillary. This term should be interpreted broadly to include ions in, on, about or around the target support as well as ions in the heated gas phase above and around the target support and collecting capillary. The ionization region in AP MALDI is around 1-5 mm in distance from the ion source (target substrate) to a collecting capillary (or a volume of 1-5 mm3). The distance from the target substrate to the conduit is important to allow ample gas to flow from the conduit toward the target and target substrate. For instance, if the conduit is too close to the target or target substrate, then arcing takes place when voltage is applied. If the distance is too far, then there is no efficient ion collection.
  • The term “ion enhancement system” refers to any device, apparatus or components used to enhance analyte ions. The term does not include directly heating a capillary to provide conductive heat to an ion stream. For example, an “ion enhancement system” comprises a conduit and a gas source. An ion enhancement system may also include other devices well known in the art such as a laser, infrared red device, ultraviolet source or other similar type devices that may apply heat or energy to ions released into the ionization region or in the gas phase.
  • The term “ion production and enhancement system” refers to any device, apparatus or components used to produce and enhance analyte ions. For instance, a heated target support can be used to both provide for ion production and enhancement. The term does not include directly heating a capillary to provide conductive heat to an ion stream. The ion production and enhancement system may further comprise an ion source and an ion enhancement system. The ion source and the ion enhancement system can be separate devices or integrated, part of or comprise the same apparatus.
  • The term “ion transport system” refers to any device, apparatus, machine, component, capillary, that shall aid in the transport, movement, or distribution of analyte ions from one position to another. The term is broad based to include ion optics, skimmers, capillaries, conducting elements and conduits.
  • The terms “matrix based”, or “matrix based ion source” refers to an ion source or mass spectrometer that does not require the use of a drying gas, curtain gas, or desolvation step. For instance, some systems require the use of such gases to remove solvent or cosolvent that is mixed with the analyte. These systems often use volatile liquids to help form smaller droplets. The above term applies to both nonvolatile liquids and solid materials in which the sample is dissolved. The term includes the use of a cosolvent. Cosolvents may be volatile or nonvolatile, but must not render the final matrix material capable of evaporating in vacuum. Such materials would include, and not be limited to m-nitrobenzyl alcohol (NBA), glycerol, triethanolamine (TEA), 2,4-dipentylphenol, 1,5-dithiothrietol/dierythritol (magic bullet), 2-nitrophenyl octyl ether (NPOE), thioglycerol, nicotinic acid, cinnamic acid, 2,5-dihydroxy benzoic acid (DHB), 3,5-dimethoxy-4-hydroxycinnamic acid (sinpinic acid), α-cyano-4-hydroxycinnamic acid (CCA), 3-methoxy-4-hydroxycinnamic acid (ferulic acid),), monothioglycerol, carbowax, 2-(4-hydroxyphenylazo)benzoic acid (HABA), 3,4-dihydroxycinnamic acid (caffeic acid), 2-amino-4-methyl-5-nitropyridine with their cosolvents and derivatives. In particular the term refers to MALDI, AP-MALDI, fast atom/ion bombardment (FAB) and other similar systems that do not require a volatile solvent and may be operated above, at, and below atmospheric pressure.
  • The term “gas flow”, “gas”, or “directed gas” refers to any gas that is directed in a defined direction in a mass spectrometer. The term should be construed broadly to include monatomic, diatomic, triatomic and polyatomic molecules that can be passed or blown through a conduit. The term should also be construed broadly to include mixtures, impure mixtures, or contaminants. The term includes both inert and non-inert matter. Common gases used with the present invention could include and not be limited to ammonia, carbon dioxide, helium, fluorine, argon, xenon, nitrogen, air etc.
  • The term “gas source” refers to any apparatus, machine, conduit, or device that produces a desired gas or gas flow. Gas sources often produce regulated gas flow, but this is not required.
  • The term “capillary” or “collecting capillary” shall be synonymous and will conform with the common definition(s) in the art. The term should be construed broadly to include any device, apparatus, orifice, tube, hose or conduit that may receive ions.
  • The term “detector” refers to any device, apparatus, machine, component, or system that can detect an ion. Detectors may or may not include hardware and software. In a mass spectrometer the common detector includes and/or is coupled to a mass analyzer.
  • The invention is described with reference to the figures. The figures are not to scale, and in particular, certain dimensions may be exaggerated for clarity of presentation.
  • FIG. 1A shows a general block diagram of a mass spectrometer. The block diagram is not to scale and is drawn in a general format because the present invention may be used with a variety of different types of mass spectrometers. The mass spectrometer 1 of the present invention comprises an ion production and enhancement system 37, an ion transport system 6 and a detector 11. The ion production and enhancement system 37 may comprise an ion source 3 and ion enhancement system 2 as one integrated part (See FIG. 1A) or as separate components (See FIG. 1B). The ion source 3 may be located in a number of positions or locations. In addition, a variety of ion sources may be used with the present invention. For instance, EI, CI or other ion sources well known in the art may be used with the invention. In one embodiment of the present invention (FIGS. 1B and 2A), the ion enhancement system 2 may comprise a conduit 9 and a gas source 7. The ion enhancement system 2 should not be interpreted to be limited to just these two configurations or embodiments. The ion transport system 6 is adjacent to the ion enhancement system 2 and may also comprise a collecting capillary 5 or any ion optics, conduits or devices that may transport analyte ions and that are well known in the art.
  • FIG. 1B shows a second general block diagram of a mass spectrometer. The block diagram is not to scale and is drawn in a general format, because the present invention may be used with a variety of different types of mass spectrometers. The mass spectrometer 1 of the present invention comprises the ion source 3, the ion enhancement system 2, the ion transport system 6 and the detector 11. The ion enhancement system 2 may be interposed between the ion source 3 and the ion detector 11 or may comprise part of the ion source 3 and/or part of the ion transport system 6.
  • As described above, the ion source 3 may be located in a number of positions or locations. In addition, a variety of ion sources may be used with the present invention. For instance, EI, CI or other ion sources well known in the art may be used with the invention. The ion enhancement system 2 may comprise a conduit 9 and a gas source 7. Further details of the ion enhancement system 2 are provided in FIGS. 2-3. The ion enhancement system 2 should not be interpreted to be limited to just these two configurations or embodiments. The ion transport system 6 is adjacent to the ion enhancement system 2 and may comprise a collecting capillary 5 or any ion optics, conduits or devices that may transport analyte ions and that are well known in the art.
  • FIG. 2A shows a cross-sectional view of a first embodiment of the invention. The figure shows the present invention applied to an AP-MALDI mass spectrometer system. For simplicity, the figure shows the invention with a source housing 14. The use of the source housing 14 to enclose the ion source and system is optional. Certain parts, components and systems may or may not be under vacuum. These techniques and structures are well known in the art.
  • The ion source 3 comprises a laser 4, a deflector 8 and a target support 10. A target 13 is applied to the target support 10 in a matrix material well known in the art. The laser 4 provides a laser beam that is deflected by the deflector 8 toward the target 13. The target 13 is then ionized and the analyte ions are released as an ion plume into an ionization region 15.
  • The ionization region 15 is located between the ion source 3 and the collecting capillary 5. The ionization region 15 comprises the space and area located in the area between the ion source 3 and the collecting capillary 5. This region contains the ions produced by ionizing the sample that are vaporized into a gas phase. This region can be adjusted in size and shape depending upon how the ion source 3 is arranged relative to the collecting capillary 5. Most importantly, located in this region are the analyte ions produced by ionization of the target 13.
  • The collecting capillary 5 is located downstream from the ion source 3 and may comprise a variety of material and designs that are well known in the art The collecting capillary 5 is designed to receive and collect analyte ions produced from the ion source 3 that are discharged as an ion plume into the ionization region 15. The collecting capillary 5 has an aperture and/or elongated bore 12 that receives the analyte ions and transports them to another capillary or location. In FIG. 2 the collecting capillary 5 is connected to a main capillary 18 that is under vacuum and further downstream. The collecting capillary 5 may be supported in place by an optional insulator 17. Other structures and devices well known in the art may be used to support the collecting capillary 5.
  • Important to the invention is the conduit 9. The conduit 9 provides a flow of heated gas toward the ions in the ionization region 15. The heated gas interacts with the analyte ions in the ionization region 15 to enhance the analyte ions and allow them to be more easily detected by the detector 11 (not shown in FIG. 2). These ions include the ions that exist in the heated gas phase. The detector 11 is located further downstream in the mass spectrometer (see FIG. 1). The conduit 9 may comprise a variety of materials and devices well known in the art. For instance, the conduit 9 may comprise a sleeve, transport device, dispenser, nozzle, hose, pipe, pipette, port, connector, tube, coupling, container, housing, structure or apparatus that is used to direct a heated gas or gas flow toward a defined region in space or location such as the ionization region 15. It is important to the invention that conduit 9 be positioned sufficiently close to the target 13 and the target support 10 so that a sufficient amount of heated gas can be applied to the ions in the ionization region 15.
  • The gas source 7 provides the heated gas to the conduit 9. The gas source 7 may comprise any number of devices to provide heated gas. Gas sources are well known in the art and are described elsewhere. The gas source 7 may be a separate component as shown in FIGS. 2-3 or may be integrated with a coupling 23 (shown in FIG. 4) that operatively joins the collecting capillary 5, the conduit 9 and the main capillary 18. The gas source 7, may provide a number of gases to the conduit 9. For instance, gases such as nitrogen, argon, xenon, carbon dioxide, air, helium etc. may be used with the present invention. The gas need not be inert and should be capable of carrying a sufficient quantity of energy or heat. Other gases well known in the art that contain these characteristic properties may also be used with the present invention.
  • FIG. 2B shows another embodiment of the invention shown in FIG. 2A. This embodiment includes the use of an optional heating device 16 that supplies heat to the target support 10. The heating device 16 may be used with or without the conduit 9 and associated parts. In other words, the heating device 16 may be used with the capillary 5 and may serve the dual purpose of ion production and enhancement Ion enhancement is obtained by applying heat to the ionization region 15. The heating device 16 supplies heat to the target support 10. The heat then enhances the ions in the ionization region 15 produced from ionization of the target 13. It is within the scope of the invention that the heating device 16 also provide for the ionization of the target 13. However, it is standard in the industry to use the laser 4 (as shown in FIGS. 2A-2B, 3A-3B) to ionize such targets. Any heating device known in the art may be used to supply heat to the target support 10. Such heating devices may include and are not limited to conductive and radiative heating devices, an embedded heater, a heated fluid, a hot plate and a heated holder.
  • FIG. 3A shows a cross sectional view of a second embodiment of the present invention. The conduit 9 may be oriented in any number of positions to direct gas toward the ionization region 15. FIG. 3 in particular shows the conduit 9 in detached mode from the collecting capillary 5. It is important to the invention that the conduit 9 be capable of directing a sufficient flow of heated gas to provide enhancement to the analyte ions located in the ionization region 15. The conduit 9 can be positioned from around 1-5 mm in distance from the target 13 or the target support 10. The heated gas applied to the target 13 and the target support 10 should be in the temperature range of about 60-150 degrees Celsius. The gas flow rate should be approximately 2-15 L/minute.
  • FIG. 3B shows another embodiment of the invention shown in FIG. 3A. This embodiment includes the use of the optional heating device 16 that supplies heat to the target support 10. The heating device 16 may be used with or without the conduit 9 and associated parts. In other words, the heating device 16 may be used with the capillary 5 and may serve the dual purpose of ion production and enhancement. Ion enhancement is obtained by applying heat to the ionization region 15. The heating device 16 supplies heat to the target support 10. The heat then enhances the ions in the ionization region 15 produced from ionization of the target 13. It is within the scope of the invention that the heating device 16 also provide for the ionization of the target 13. However, it is standard in the industry to use the laser 4 (as shown in FIGS. 2A-2B, 3A-3B) to ionize such targets. Any heating device known in the art may be used to supply heat to the target support 10.
  • FIGS. 2 and 4-7 illustrate the first embodiment of the invention. The conduit 9 is designed to enclose the collecting capillary 5. The conduit 9 may enclose all of the collecting capillary 5 or a portion of it However, it is important that the conduit 9 be adjacent to the collecting capillary end 20 so that heated gas can be delivered to the analyte ions located in the ionization region 15 before they enter or are collected by the collecting capillary 5. FIGS. 1-6 and 8, show only a few embodiments of the present invention and are employed for illustrative purposes only. They should not be interpreted as narrowing the broad scope of the invention. The conduit 9 may be a separate component or may comprise a part of the coupling 23. FIGS. 4-6 show the conduit 9 as a separate component.
  • FIGS. 4-6 show coupling 23 and its design for joining the collecting capillary 5, the main capillary 18, and the conduit 9. The coupling 23 is designed for attaching to a fixed support 31 (shown in FIGS. 7 and 8). The coupling 23 comprises a spacer 33, a housing 35, and a capillary cap 34 (See FIG. 5). The capillary cap 34 and the spacer 33 are designed to fit within the housing 35. The spacer 33 is designed to apply pressure to the capillary cap 34 so that a tight seal is maintained between the capillary cap 34 and the main capillary 18. The capillary cap 34 is designed to receive the main capillary 18. A small gap 36 is defined between the spacer 33 and the capillary cap 34 (See FIG. 6). The small gap 36 allows gas to flow from the gas source 7 into the collecting capillary 5 as opposed to out of the housing 35 as is accomplished with prior art devices.
  • An optional centering device 40 may be provided between the collecting capillary 5 and the conduit 9. The centering device 40 may comprise a variety of shapes and sizes. It is important that the centering device 40 regulate the flow of gas that is directed into the ionization region 15. FIGS. 4-6 show the centering device as a triangular plastic insert. However, other designs and devices may be employed between the conduit 9 and the collecting capillary 5.
  • Referring now to FIGS. 1-8, the detector 11 is located downstream from the ion source 3 and the conduit 9. The detector 11 may be a mass analyzer or other similar device well known in the art for detecting the enhanced analyte ions that were collected by the collecting capillary 5 and transported to the main capillary 18. The detector 11 may also comprise any computer hardware and software that are well known in the art and which may help in detecting enhanced analyte ions.
  • Having described the invention and components in some detail, a description of how the invention operates is in order.
  • FIG. 7 shows a cross sectional view of a prior art device. The collecting capillary 5 is connected to the main capillary 18 by the capillary cap 34. The capillary cap is designed for receiving the main capillary 18 and is disposed in the housing 35. The housing 35 connects directly to the fixed support 31. Note that the gas source 7 provides the gas through the channels 38 defined between the housing 35 and the capillary cap 34. The gas flows from the gas source 7 into the channel 38 through a passageway 24 and then into an ionization chamber 30. The gas is released into the ionization chamber 30 and serves no purpose at this point.
  • FIG. 8 shows a cross sectional view of the first embodiment of the present invention, with the conduit 9 positioned between the ion source 3 and the gas source 7. The conduit 9 operates to carry the heated gas from the gas source 7 to the collecting capillary end 20. The method of the present invention produces enhanced analyte ions for ease of detection in the mass spectrometer 1. The method comprises heating analyte ions located in the ionization region 15 adjacent to the collecting capillary 5 with a directed gas to make them more easily detectable by the detector 11. Gas is produced by the gas source 7, directed through the channels 38 and the small gap 36. From there the gas is carried into an annular space 42 defined between the conduit 9 and the collecting capillary 5. The heated gas then contacts the optional centering device 40 (not shown in FIG. 8). The centering device 40 is disposed between the collecting capillary 5 and the conduit 9 and shaped in a way to regulate the flow of gas to the ionization region 15. Gas flows out of the conduit 9 into the ionization region 15 adjacent to the collecting capillary end 20. The analyte ions in the ionization region 15 are heated by the gas that is directed into this region. Analyte ions that are then enhanced are collected by the collecting capillary 5, carried to the main capillary 18 and then sent to the detector 11. It should be noted that after heat has been added to the analyte ions adjacent to the source, the detection limits and signal quality improve dramatically. This result is quite unexpected. For instance, since no solvent is used with AP-MALDI and MALDI ion sources and mass spectrometers, desolvation and/or application of a gas would not be expected to be effective in enhancing ion detection in matrix based ion sources and mass spectrometers. However, it is believed that the invention operates by the fact that large ion clusters are broken down to produce bare analyte ions that are more easily detectable. In addition, the application of heat also helps with sample evaporation.
  • It is to be understood that while the invention has been described in conjunction with the specific embodiments thereof, that the foregoing description as well as the examples that follow are intended to illustrate and not limit the scope of the invention. Other aspects, advantages and modifications within the scope of the invention will be apparent to those skilled in the art to which the invention pertains.
  • All patents, patent applications, and publications infra and supra mentioned herein are hereby incorporated by reference in their entireties.
  • EXAMPLE 1
  • A Bruker Esquire-LC ion trap mass spectrometer was used for AP-MALDI studies. The mass spectrometer ion optics were modified (one skimmer, dual octapole guide with partitioning) and the ion sampling inlet of the instrument consisted of an ion sampling capillary extension with a conduit concentric to a capillary extension. The ion sampling inlet received a gas flow of 4-10 L/min. of heated nitrogen. A laser beam (337.1 nm, at 10 Hz) was delivered by a 400 micron fiber through a single focusing lens onto the target. The laser power was estimated to be around 50 to 70 uJ. The data was obtained by using Ion Charge Control by setting the maximum trapping time to 300 ms (3 laser shots) for the mass spectrometer scan spectrum. Each spectrum was an average of 8 micro scans for 400 to 2200 AMU. The matrix used was an 8 mM alpha-cyano-4-hydroxy-cinnamic acid in 25% methanol, 12% TPA, 67% water with 1% acetic acid. Matrix targets were premixed and 0.5 ul of the matrix/target mixture was applied onto a gold plated stainless steel target Targets used included trypsin digest of bovine serum albumin and standard peptide mixture containing angiotensin I and II bradykinin, and fibrinopeptide A. Temperature of the gas phase in the vicinity of the target (ionization region) was 25 degrees Celsius. FIG. 9 shows the results without the addition of heated gas to the target or ionization region. The figure does not show the existence of sharp peaks (ion enhancement) at the higher m/z ratios.
  • EXAMPLE 2
  • The same targets were prepared and used as described above except that heated gas was applied to the target (ionization region) at around 100 degrees Celsius. FIG. 10 shows the results with the addition of the heated gas to the target in the ionization region. The figure shows the existence of the sharp peaks (ion enhancement) at the higher m/z ratios.

Claims (21)

1-64. (canceled)
65. A matrix-based ion source comprising:
a heating device for supplying conductive or radiative heat to a target support.
66. The matrix based ion source of claim 65, wherein said heating device is a conductive heating device.
67. The matrix based ion source of claim 65, wherein said heating device is a radiative heating device.
68. The matrix based ion source of claim 65, wherein said heating device contains an embedded heater.
69. The matrix based ion source of claim 65, wherein said heating device contains a heated fluid.
70. The matrix based ion source of claim 65, wherein said heating device is a hot plate.
71. The matrix based ion source of claim 65, wherein said heating device is a heated target support plate holder.
72. The matrix based ion source of claim 65, wherein said matrix based ion source is a matrix assisted laser desorption ionization (MALDI) ion source.
73. The matrix based ion source of claim 65, wherein said matrix based ion source is an atmospheric pressure (AP) MALDI ion source.
74. The matrix based ion source of claim 65, wherein said matrix based ion source is a fast atom bombardment (FAB) ion source.
75. The matrix based ion source of claim 65, further comprising a target support.
76. The matrix based ion source of claim 65, further comprising an ion collection capillary.
77. A mass spectrometer system, comprising:
a) a matrix-based ion source comprising a heating device for supplying conductive or radiative heat to a target support;
b) a mass spectrometer downstream from said matrix-based ion source; and
c) an ion detector downstream from said mass spectrometer.
78. The mass spectrometer system of claim 77, wherein said mass spectrometer system comprises a time of flight mass analyzer.
79. The mass spectrometer system of claim 77, wherein said mass spectrometer system comprises an ion trap.
80. The mass spectrometer system of claim 77, wherein said mass spectrometer system comprises an ion cyclotron resonance mass spectrometer.
81. The mass spectrometer system of claim 77, wherein said mass spectrometer system comprises a quadrupole time-of-flight mass analyzer.
82. A method for producing analyte ions using a matrix-based ion source, comprising:
heating a target support of said matrix-based ion source using conductive or radiative heat;
ionizing a sample in said matrix-based ion source to produce analyte ions; and
transporting said analyte ions out of said ion source.
83. The method of claim 82, wherein said ionizing employs a laser.
84. The method of claim 82, further comprising transporting said analyte ions to a to an ion detector.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050072918A1 (en) * 2002-02-22 2005-04-07 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151090A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151091A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050161613A1 (en) * 2002-02-22 2005-07-28 Jean-Luc Truche Apparatus and method for ion production enhancement
US20060054807A1 (en) * 2004-09-15 2006-03-16 Phytronix Technologies, Inc. Ionization source for mass spectrometer
US20070033116A1 (en) * 2005-01-14 2007-02-08 Murray David K User interface for tax-return preparation

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6858841B2 (en) * 2002-02-22 2005-02-22 Agilent Technologies, Inc. Target support and method for ion production enhancement
US7095016B2 (en) * 2003-04-29 2006-08-22 Sri International Direct liquid injection inlet to a laser photoionization apparatus
US20040217277A1 (en) * 2003-04-30 2004-11-04 Goodley Paul C. Apparatus and method for surface activation and selective ion generation for MALDI mass spectrometry
WO2005114691A2 (en) * 2004-05-21 2005-12-01 Whitehouse Craig M Charged droplet sprayers
US7361890B2 (en) * 2004-07-02 2008-04-22 Griffin Analytical Technologies, Inc. Analytical instruments, assemblies, and methods
US20060097150A1 (en) * 2004-10-26 2006-05-11 Joyce Timothy H Functionalized target support and method
JP4494175B2 (en) * 2004-11-30 2010-06-30 新光電気工業株式会社 Semiconductor device
US7262841B2 (en) 2005-03-17 2007-08-28 Agilent Technologies, Inc. Laser alignment for ion source
USRE44887E1 (en) 2005-05-19 2014-05-13 Perkinelmer Health Sciences, Inc. Sample component trapping, release, and separation with membrane assemblies interfaced to electrospray mass spectrometry
US7872225B2 (en) * 2006-08-25 2011-01-18 Perkinelmer Health Sciences, Inc. Sample component trapping, release, and separation with membrane assemblies interfaced to electrospray mass spectrometry
WO2011133516A1 (en) 2010-04-19 2011-10-27 Battelle Memorial Institute Electrohydrodynamic spraying
GB2550199B (en) * 2016-05-13 2021-12-22 Micromass Ltd Enclosure for Ambient Ionisation Ion Source
US11335546B2 (en) * 2017-11-28 2022-05-17 Hamamatsu Photonics K.K. Laser desorption/ionization method, mass spectrometry method, sample support body, and manufacturing method of sample support body

Citations (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components
US4098589A (en) * 1976-12-22 1978-07-04 United Technologies Corporation Catalytic reaction apparatus
US4383171A (en) * 1980-11-17 1983-05-10 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Particle analyzing method and apparatus
US4531056A (en) * 1983-04-20 1985-07-23 Yale University Method and apparatus for the mass spectrometric analysis of solutions
US4766741A (en) * 1987-01-20 1988-08-30 Helix Technology Corporation Cryogenic recondenser with remote cold box
US4796433A (en) * 1988-01-06 1989-01-10 Helix Technology Corporation Remote recondenser with intermediate temperature heat sink
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
US4885076A (en) * 1987-04-06 1989-12-05 Battelle Memorial Institute Combined electrophoresis-electrospray interface and method
US4933548A (en) * 1985-04-24 1990-06-12 Compagnie Generale Des Matieres Nucleaires Method and device for introducing samples for a mass spectrometer
US4968885A (en) * 1987-03-06 1990-11-06 Extrel Corporation Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
US4988879A (en) * 1987-02-24 1991-01-29 The Board Of Trustees Of The Leland Stanford Junior College Apparatus and method for laser desorption of molecules for quantitation
US4999493A (en) * 1990-04-24 1991-03-12 Vestec Corporation Electrospray ionization interface and method for mass spectrometry
US5022379A (en) * 1990-05-14 1991-06-11 Wilson Jr James C Coaxial dual primary heat exchanger
US5027379A (en) * 1990-02-22 1991-06-25 Bp America Inc. Method for identifying drilling mud filtrate invasion of a core sample from a subterranean formation
US5208458A (en) * 1991-11-05 1993-05-04 Georgia Tech Research Corporation Interface device to couple gel electrophoresis with mass spectrometry using sample disruption
US5272337A (en) * 1992-04-08 1993-12-21 Martin Marietta Energy Systems, Inc. Sample introducing apparatus and sample modules for mass spectrometer
US5285064A (en) * 1987-03-06 1994-02-08 Extrel Corporation Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
US5290761A (en) * 1992-10-19 1994-03-01 E. I. Du Pont De Nemours And Company Process for making oxide superconducting films by pulsed excimer laser ablation
US5560216A (en) * 1995-02-23 1996-10-01 Holmes; Robert L. Combination air conditioner and pool heater
US5652427A (en) * 1994-02-28 1997-07-29 Analytica Of Branford Multipole ion guide for mass spectrometry
US5742050A (en) * 1996-09-30 1998-04-21 Aviv Amirav Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis
US5808300A (en) * 1996-05-10 1998-09-15 Board Of Regents, The University Of Texas System Method and apparatus for imaging biological samples with MALDI MS
US5825026A (en) * 1996-07-19 1998-10-20 Bruker-Franzen Analytik, Gmbh Introduction of ions from ion sources into mass spectrometers
US5869832A (en) * 1997-10-14 1999-02-09 University Of Washington Device and method for forming ions
US6040575A (en) * 1998-01-23 2000-03-21 Analytica Of Branford, Inc. Mass spectrometry from surfaces
US6105501A (en) * 1998-06-10 2000-08-22 Flex Products, Inc. High resolution lithographic printing plate suitable for imaging with laser-discharge article and method
US6107626A (en) * 1997-10-14 2000-08-22 The University Of Washington Device and method for forming ions
US6154608A (en) * 1998-12-11 2000-11-28 Alpha-Western Corporation Dry element water heater
US6383346B2 (en) * 1996-03-22 2002-05-07 Canon Kabushiki Kaisha Method for forming thin films
US20020053522A1 (en) * 2000-07-25 2002-05-09 Cumings John P. Method for shaping a nanotube and a nanotube shaped thereby
US20020074517A1 (en) * 2000-12-15 2002-06-20 Andrew Krutchinsky High capacity and scanning speed system for sample handling and analysis
US20020121594A1 (en) * 2001-03-02 2002-09-05 Yang Wang Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
US20020172767A1 (en) * 2001-04-05 2002-11-21 Leonid Grigorian Chemical vapor deposition growth of single-wall carbon nanotubes
US20030003595A1 (en) * 1998-11-23 2003-01-02 Aviv Amirav Mass spectrometer method and apparatus for analyzing a sample in a solution
US6504150B1 (en) * 1999-06-11 2003-01-07 Perseptive Biosystems, Inc. Method and apparatus for determining molecular weight of labile molecules
US20030160167A1 (en) * 2002-02-22 2003-08-28 Jean-Luc Truche Target support and method for ion production enhancement
US6683300B2 (en) * 2001-09-17 2004-01-27 Science & Engineering Services, Inc. Method and apparatus for mass spectrometry analysis of common analyte solutions
US6753523B1 (en) * 1998-01-23 2004-06-22 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
US20040217277A1 (en) * 2003-04-30 2004-11-04 Goodley Paul C. Apparatus and method for surface activation and selective ion generation for MALDI mass spectrometry
US6822230B2 (en) * 2002-12-23 2004-11-23 Agilent Technologies, Inc. Matrix-assisted laser desorption/ionization sample holders and methods of using the same
US6825462B2 (en) * 2002-02-22 2004-11-30 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US6838663B2 (en) * 2002-05-31 2005-01-04 University Of Florida Methods and devices for laser desorption chemical ionization
US20050035287A1 (en) * 2003-06-09 2005-02-17 Charles Jolliffe Mass spectrometer interface
US20050056776A1 (en) * 2000-06-09 2005-03-17 Willoughby Ross C. Laser desorption ion source
US20050151091A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151090A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050160165A1 (en) * 2004-01-20 2005-07-21 International Business Machines Corporation Network management using short message service
US20050161613A1 (en) * 2002-02-22 2005-07-28 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050194530A1 (en) * 2004-03-08 2005-09-08 Rohan Thakur Titanium ion transfer components for use in mass spectrometry
US20050211911A1 (en) * 2002-09-18 2005-09-29 Fischer Steven M Apparatus and method for sensor control and feedback
US20060054807A1 (en) * 2004-09-15 2006-03-16 Phytronix Technologies, Inc. Ionization source for mass spectrometer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1900569C3 (en) 1969-01-07 1976-01-08 Varian Mat Gmbh, 2800 Bremen Solid-state ion source
DE2227392C2 (en) * 1972-06-06 1983-01-13 Motan Gmbh, 7972 Isny Water heater
US5272138A (en) * 1988-02-12 1993-12-21 The Biomembrane Institute Naturally occurring gangliosides containing de-N-acetyl-sialic acid and their applications as modifiers of cell physiology
US5498545A (en) 1994-07-21 1996-03-12 Vestal; Marvin L. Mass spectrometer system and method for matrix-assisted laser desorption measurements
US6175112B1 (en) 1998-05-22 2001-01-16 Northeastern University On-line liquid sample deposition interface for matrix assisted laser desorption ionization-time of flight (MALDI-TOF) mass spectroscopy
US5917185A (en) 1997-06-26 1999-06-29 Iowa State University Research Foundation, Inc. Laser vaporization/ionization interface for coupling microscale separation techniques with mass spectrometry
US6147345A (en) * 1997-10-07 2000-11-14 Chem-Space Associates Method and apparatus for increased electrospray ion production
US6140639A (en) 1998-05-29 2000-10-31 Vanderbilt University System and method for on-line coupling of liquid capillary separations with matrix-assisted laser desorption/ionization mass spectrometry
US5965884A (en) 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
US6849847B1 (en) 1998-06-12 2005-02-01 Agilent Technologies, Inc. Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis
US6610976B2 (en) * 2001-08-28 2003-08-26 The Rockefeller University Method and apparatus for improved signal-to-noise ratio in mass spectrometry
US20040238754A1 (en) * 2001-09-17 2004-12-02 Baranov Vladimir I. Method and apparatus for cooling and focusing ions

Patent Citations (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components
US4098589A (en) * 1976-12-22 1978-07-04 United Technologies Corporation Catalytic reaction apparatus
US4383171A (en) * 1980-11-17 1983-05-10 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Particle analyzing method and apparatus
US4531056A (en) * 1983-04-20 1985-07-23 Yale University Method and apparatus for the mass spectrometric analysis of solutions
US4933548A (en) * 1985-04-24 1990-06-12 Compagnie Generale Des Matieres Nucleaires Method and device for introducing samples for a mass spectrometer
US4766741A (en) * 1987-01-20 1988-08-30 Helix Technology Corporation Cryogenic recondenser with remote cold box
US4988879A (en) * 1987-02-24 1991-01-29 The Board Of Trustees Of The Leland Stanford Junior College Apparatus and method for laser desorption of molecules for quantitation
US4968885A (en) * 1987-03-06 1990-11-06 Extrel Corporation Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
US5285064A (en) * 1987-03-06 1994-02-08 Extrel Corporation Method and apparatus for introduction of liquid effluent into mass spectrometer and other gas-phase or particle detectors
US4885076A (en) * 1987-04-06 1989-12-05 Battelle Memorial Institute Combined electrophoresis-electrospray interface and method
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
US4796433A (en) * 1988-01-06 1989-01-10 Helix Technology Corporation Remote recondenser with intermediate temperature heat sink
US5027379A (en) * 1990-02-22 1991-06-25 Bp America Inc. Method for identifying drilling mud filtrate invasion of a core sample from a subterranean formation
US4999493A (en) * 1990-04-24 1991-03-12 Vestec Corporation Electrospray ionization interface and method for mass spectrometry
US5022379A (en) * 1990-05-14 1991-06-11 Wilson Jr James C Coaxial dual primary heat exchanger
US5208458A (en) * 1991-11-05 1993-05-04 Georgia Tech Research Corporation Interface device to couple gel electrophoresis with mass spectrometry using sample disruption
US5272337A (en) * 1992-04-08 1993-12-21 Martin Marietta Energy Systems, Inc. Sample introducing apparatus and sample modules for mass spectrometer
US5290761A (en) * 1992-10-19 1994-03-01 E. I. Du Pont De Nemours And Company Process for making oxide superconducting films by pulsed excimer laser ablation
US5652427A (en) * 1994-02-28 1997-07-29 Analytica Of Branford Multipole ion guide for mass spectrometry
US5962851A (en) * 1994-02-28 1999-10-05 Analytica Of Branford, Inc. Multipole ion guide for mass spectrometry
US5560216A (en) * 1995-02-23 1996-10-01 Holmes; Robert L. Combination air conditioner and pool heater
US6383346B2 (en) * 1996-03-22 2002-05-07 Canon Kabushiki Kaisha Method for forming thin films
US5808300A (en) * 1996-05-10 1998-09-15 Board Of Regents, The University Of Texas System Method and apparatus for imaging biological samples with MALDI MS
US5825026A (en) * 1996-07-19 1998-10-20 Bruker-Franzen Analytik, Gmbh Introduction of ions from ion sources into mass spectrometers
US5742050A (en) * 1996-09-30 1998-04-21 Aviv Amirav Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis
US5869832A (en) * 1997-10-14 1999-02-09 University Of Washington Device and method for forming ions
US6107626A (en) * 1997-10-14 2000-08-22 The University Of Washington Device and method for forming ions
US6040575A (en) * 1998-01-23 2000-03-21 Analytica Of Branford, Inc. Mass spectrometry from surfaces
US6753523B1 (en) * 1998-01-23 2004-06-22 Analytica Of Branford, Inc. Mass spectrometry with multipole ion guides
US6105501A (en) * 1998-06-10 2000-08-22 Flex Products, Inc. High resolution lithographic printing plate suitable for imaging with laser-discharge article and method
US20030003595A1 (en) * 1998-11-23 2003-01-02 Aviv Amirav Mass spectrometer method and apparatus for analyzing a sample in a solution
US6154608A (en) * 1998-12-11 2000-11-28 Alpha-Western Corporation Dry element water heater
US6504150B1 (en) * 1999-06-11 2003-01-07 Perseptive Biosystems, Inc. Method and apparatus for determining molecular weight of labile molecules
US20050056776A1 (en) * 2000-06-09 2005-03-17 Willoughby Ross C. Laser desorption ion source
US20020053522A1 (en) * 2000-07-25 2002-05-09 Cumings John P. Method for shaping a nanotube and a nanotube shaped thereby
US20020074517A1 (en) * 2000-12-15 2002-06-20 Andrew Krutchinsky High capacity and scanning speed system for sample handling and analysis
US20020121594A1 (en) * 2001-03-02 2002-09-05 Yang Wang Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
US20020172767A1 (en) * 2001-04-05 2002-11-21 Leonid Grigorian Chemical vapor deposition growth of single-wall carbon nanotubes
US6683300B2 (en) * 2001-09-17 2004-01-27 Science & Engineering Services, Inc. Method and apparatus for mass spectrometry analysis of common analyte solutions
US20050072918A1 (en) * 2002-02-22 2005-04-07 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151090A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US6825462B2 (en) * 2002-02-22 2004-11-30 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US20050161613A1 (en) * 2002-02-22 2005-07-28 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151091A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US6858841B2 (en) * 2002-02-22 2005-02-22 Agilent Technologies, Inc. Target support and method for ion production enhancement
US20050077464A1 (en) * 2002-02-22 2005-04-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20030160167A1 (en) * 2002-02-22 2003-08-28 Jean-Luc Truche Target support and method for ion production enhancement
US6838663B2 (en) * 2002-05-31 2005-01-04 University Of Florida Methods and devices for laser desorption chemical ionization
US20050211911A1 (en) * 2002-09-18 2005-09-29 Fischer Steven M Apparatus and method for sensor control and feedback
US6822230B2 (en) * 2002-12-23 2004-11-23 Agilent Technologies, Inc. Matrix-assisted laser desorption/ionization sample holders and methods of using the same
US20040217277A1 (en) * 2003-04-30 2004-11-04 Goodley Paul C. Apparatus and method for surface activation and selective ion generation for MALDI mass spectrometry
US20050035287A1 (en) * 2003-06-09 2005-02-17 Charles Jolliffe Mass spectrometer interface
US20050160165A1 (en) * 2004-01-20 2005-07-21 International Business Machines Corporation Network management using short message service
US20050194530A1 (en) * 2004-03-08 2005-09-08 Rohan Thakur Titanium ion transfer components for use in mass spectrometry
US20060054807A1 (en) * 2004-09-15 2006-03-16 Phytronix Technologies, Inc. Ionization source for mass spectrometer

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7078682B2 (en) * 2002-02-22 2006-07-18 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US20050077464A1 (en) * 2002-02-22 2005-04-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151090A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050151091A1 (en) * 2002-02-22 2005-07-14 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050161613A1 (en) * 2002-02-22 2005-07-28 Jean-Luc Truche Apparatus and method for ion production enhancement
US20050072918A1 (en) * 2002-02-22 2005-04-07 Jean-Luc Truche Apparatus and method for ion production enhancement
US7091482B2 (en) * 2002-02-22 2006-08-15 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US7132670B2 (en) * 2002-02-22 2006-11-07 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US7135689B2 (en) * 2002-02-22 2006-11-14 Agilent Technologies, Inc. Apparatus and method for ion production enhancement
US20060054807A1 (en) * 2004-09-15 2006-03-16 Phytronix Technologies, Inc. Ionization source for mass spectrometer
US7321116B2 (en) * 2004-09-15 2008-01-22 Phytronix Technologies, Inc. Ionization source for mass spectrometer
US7582863B2 (en) 2004-09-15 2009-09-01 Phytronix Technologies, Inc. Sample support for desorption
US20070033116A1 (en) * 2005-01-14 2007-02-08 Murray David K User interface for tax-return preparation

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