US20030222700A1 - Level shifter - Google Patents
Level shifter Download PDFInfo
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- US20030222700A1 US20030222700A1 US10/348,880 US34888003A US2003222700A1 US 20030222700 A1 US20030222700 A1 US 20030222700A1 US 34888003 A US34888003 A US 34888003A US 2003222700 A1 US2003222700 A1 US 2003222700A1
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- 210000000352 storage cell Anatomy 0.000 claims description 8
- 230000002085 persistent effect Effects 0.000 claims description 4
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000002955 isolation Methods 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000003190 augmentative effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/0185—Coupling arrangements; Interface arrangements using field effect transistors only
- H03K19/018507—Interface arrangements
- H03K19/018521—Interface arrangements of complementary type, e.g. CMOS
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
- H03K3/356—Bistable circuits
- H03K3/356008—Bistable circuits ensuring a predetermined initial state when the supply voltage has been applied; storing the actual state when the supply voltage fails
Definitions
- the present invention relates in general to data processing systems, and in particular, to the transfer of data signals within integrated circuitry.
- Level shifting receivers translate signals between two voltage supply domains. For example, receivers may translate signals originating from an integrated circuit operating under a lower supply voltage (e.g., 1.8 volts (V)) to an integrated circuit operating with a higher supply voltage (e.g., 2.5 V).
- a lower supply voltage e.g., 1.8 volts (V)
- a higher supply voltage e.g. 2.5 V.
- Prior art circuits have also been designed that permit the isolation of the receiver from the removal of the driver supply voltage.
- prior art level shifter 100 wherein the low-voltage supply is designated as Vdd and the high voltage supply is designated as Vdd_H.
- the data in input signal is buffered by inverters operating under the lower supply voltage Vdd.
- the first inverter is comprised of NFET (N-channel field effect transistor) 301 and PFET(P-channel FET) 302
- the second inverter is comprised of PFET 303 and NFET 304 .
- the complementary outputs of these two inverters are driven to pull-down NFETs 305 and 308 with cross-coupled PFETs 306 and 307 .
- This prior art circuit has the disadvantage that it does not preserve valid signal levels in the event that the voltage Vdd is disabled, i.e., either forced to the same potential as the ground or allowed to degrade over time to the ground potential (for example, portable electronic devices employ nonpersisent power supply domains where the voltage supply is removed from the circuitry to preserve battery power).
- the nodes at the drain of the cross-coupled PFETs will both rise up to within a threshold voltage of the high voltage supply, Vdd_H.
- the level shifter When the level shifter is used in an environment where the low voltage supply can be removed, for instance to save power, the level shifter may be augmented with isolation NFETs, such as NFETs 410 and 412 shown in the level shifter 400 of FIG. 4. Such isolation NFETs help prevent transient events during the removal of the Vdd supply from affecting the state of the level shifter.
- Devices 401 - 404 operate similarly to devices 301 - 304 ; device 409 operates similarly to device 305 ; devices 406 - 407 operate similarly to devices 306 - 307 ; and device 411 operates similarly to device 308 .
- the HOLD signal Prior to the removal of Vdd, the HOLD signal is driven low to isolate the shifter 400 .
- the cross-coupled NFETs 405 and 408 are added.
- Vdd the state of the level shifter 400 when the HOLD signal is removed is maintained.
- the cascaded NFETs 409 / 410 and 411 / 412 limit the performance of the level shifter, primarily limiting the voltage gain range of the output of the shifter.
- the cascaded transistors limit the difference between the supplies Vdd_H and Vdd, and because the transistors are cascaded, they must be large which increases circuit area and power consumption.
- the present invention addresses the foregoing needs by allowing a significantly greater voltage difference between the low and high level power supplies in the implementation of level shifters, and supports the removal of the driver power supply from the low level circuitry while maintaining the integrity of the data signal at the high level circuitry output side. This is accomplished in part by eliminating the cascaded devices in the level shifter.
- One embodiment of the present invention is a level shifter comprising a data input node, a first inverter having its input connected to the data input node, a second inverter connected to an output of the first inverter, a data output node, a latch having its output connected to the data output node, a first NFET connected between an input of the latch and a ground potential, and having its gate electrode connected to an output of the second inverter, and a second NFET connected between the data output node and the ground potential, and having its gate electrode connected to the output of the first inverter.
- Another embodiment of the present invention is as a data processing system comprising a microprocessor and accompanying circuitry outputting data signals with a voltage swing magnitude of 1.8 volts, level shifter circuitry for converting the voltage swing magnitude of the data signals from 1.8 volts to 3.3 volts, and input/output (I/O) circuitry for receiving the data signals with the voltage swing magnitude of 3.3 volts.
- a microprocessor and accompanying circuitry outputting data signals with a voltage swing magnitude of 1.8 volts
- level shifter circuitry for converting the voltage swing magnitude of the data signals from 1.8 volts to 3.3 volts
- I/O input/output
- Another embodiment of the present invention is as a level shifter comprising first circuitry for receiving a data signal having a voltage swing from ground to 1.8 volts, and second circuitry for converting the data signal to have a voltage swing from ground to 3.3 volts.
- Another embodiment of the present invention is as a level shifter comprising a data input node, a first NOR gate coupled to the data input node, a second NOR gate coupled to an output of the first NOR gate, a storage cell coupled to an output of the second NOR gate, and a data output node coupled to an output of the storage cell.
- FIG. 1 illustrates a level shifter in accordance with an embodiment of the present invention
- FIG. 2 illustrates data processing circuitry implementing the level shifter of FIG. 1;
- FIG. 3 illustrates a prior art level shifter
- FIG. 4 illustrates another prior art level shifter.
- the level shifter of the present invention is applicable to circuits in which the internal circuitry is operated at a voltage which is lower than the voltage required for the I/O drivers and receivers, and also where the voltage to the internal circuitry can be disabled to save power, while the I/O drivers and receivers remain powered and maintain the voltages on the off-chip signals.
- a level shifter 100 operates between two different power supply domains.
- This environment is typical of low-power electronic devices, such as battery-powered devices where conserving energy is particularly important and where the internal logic voltages tend to be low.
- An exemplary application is shown in FIG. 2, where a microprocessor is used in a battery-powered device, where the internal logic is powered by a supply voltage which can be varied from 1.8V to 1V, and is not persistent, and where the I/O drivers and receivers which generate and receive the off-chip signals are powered by a 3.3V supply voltage.
- the present invention is not limited to the use in integrated circuitry of such exact power supply voltages, but is applicable where any level shifter is needed.
- a battery 210 supplies power to a supply suspend control logic 204 embodied within a persistent voltage domain 201 .
- a persistent voltage domain is the collection of all circuitry powered by a voltage which is active at any time in which the device is on; the supply is never switched off, driven to ground, or allowed to degrade below its normal operating range whenever the device is active.
- Select and shutdown signals are received from the supply suspend control logic 204 by the external DC/DC supplies 205 , which supply various voltages to circuits 202 and 203 .
- the Shutdown signal from the supply suspend control logic 204 signals to the external power supply 205 (e.g., DC-to-DC converter) that the power to the logic should be disabled either by forcing the voltage to ground or allowing the voltage level to collapse toward ground over time.
- the Select signals indicate to the external power supply 205 the voltage level at which the logic supply, Vdd, should be maintained.
- Circuitry 202 can be referred to as a nonpersistent low voltage logic supply domain implementing circuitry 206 (e.g., microprocessor logic circuits, memory circuits, clocks, latches, etc.). This nonpersistent low voltage supply domain is referred to as such, since the circuits 206 can be turned off for various reasons as described previously.
- the constant I/O domain 203 implements I/O drivers and receivers 207 for supplying data signals to the off-chip domain. It is typical that such drivers and receivers 207 require higher supply voltages, and thus in this example, a 3.3V supply is utilized by domain 203 , while the lower 1.8-1.0V supply is used by domain 202 .
- level shifters 100 When data signals are transferred from circuitry 206 to drivers and receivers 207 , there is a need for level shifters 100 to transfer the data from the lower voltage supply domain to the higher voltage supply domain. And, as discussed above, there may be a need for these level shifters 100 to operate under conditions where power is terminated from the low voltage logic supply domain 202 .
- Level shifter 100 there is illustrated level shifter 100 in further detail.
- Devices 101 , 104 , 105 , 106 , 110 , 111 , 113 , and 114 are NFET CMOS (complementary metal-oxide semiconductor) devices, while devices 102 , 103 , 107 , 108 , 109 , and 112 are PFET CMOS devices.
- the present invention may also be utilized with other types of switching circuits with equivalent functionality.
- PFETs 102 and 103 and NFETs 101 and 104 form a NOR gate.
- HOLD high, the output node 120 of this gate is held low.
- HOLD low, the output node 120 of the gate is the logical inversion of the input DATA IN.
- PFETs 107 and 108 and NFETs 105 and 106 form a NOR gate.
- HOLD high, the output node 121 of this gate is held low.
- HOLD is low, the output node 121 of the gate has the same value as the signal DATA IN.
- PFETs 109 and 112 and NFETs 111 and 113 form a cross-coupled inverter which is a storage cell.
- NFET 110 When HOLD is low and the output node 121 of the NOR formed by NFETs 105 and 106 and PFETs 107 and 108 is high, NFET 110 is turned on and the input node 122 to the inverter formed by PFET 112 and NFET 113 is driven low, and the output DATA OUT is driven high.
- the inverter formed by NFET 111 and PFET 109 reinforces this condition.
- the HOLD signal is activated to a high state. This effectively isolates level shifter 100 from the Vdd power supply and isolates the low power circuits from the higher power supply circuits, and in turn maintaining the state of the data signal present in the level shifter.
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Abstract
A level shifter having a data input node, a first inverter having its input connected to the data input node, a second inverter connected to an output of the first inverter, a data output node, a latch having its output connected to the data output node, a first NFET connected between an input of the latch and a ground potential, and having its gate electrode connected to an output of the second inverter, and a second NFET connected between the data output node and the ground potential, and having its gate electrode connected to the output of the first inverter. The level shifter provides for a conversion of a data signal from a power supply domain of 1.8 volts to one of 3.3 volts.
Description
- The present invention relates in general to data processing systems, and in particular, to the transfer of data signals within integrated circuitry.
- Level shifting receivers translate signals between two voltage supply domains. For example, receivers may translate signals originating from an integrated circuit operating under a lower supply voltage (e.g., 1.8 volts (V)) to an integrated circuit operating with a higher supply voltage (e.g., 2.5 V). Prior art circuits have also been designed that permit the isolation of the receiver from the removal of the driver supply voltage.
- Referring to FIG. 3, there is illustrated prior
art level shifter 100, wherein the low-voltage supply is designated as Vdd and the high voltage supply is designated as Vdd_H. The data in input signal is buffered by inverters operating under the lower supply voltage Vdd. The first inverter is comprised of NFET (N-channel field effect transistor) 301 and PFET(P-channel FET) 302, while the second inverter is comprised ofPFET 303 and NFET 304. The complementary outputs of these two inverters are driven to pull-down 305 and 308 withNFETs 306 and 307. This prior art circuit has the disadvantage that it does not preserve valid signal levels in the event that the voltage Vdd is disabled, i.e., either forced to the same potential as the ground or allowed to degrade over time to the ground potential (for example, portable electronic devices employ nonpersisent power supply domains where the voltage supply is removed from the circuitry to preserve battery power). In particular, as the supply degrades toward ground, the nodes at the drain of the cross-coupled PFETs will both rise up to within a threshold voltage of the high voltage supply, Vdd_H.cross-coupled PFETs - In addition, as the voltage Vdd is degrading toward ground, one cannot be certain that the inverters powered by Vdd will maintain their relative order: whichever signal amongst the output of the first inverter, formed by
301 and 302, and the output of the second inverter, formed bydevices 303 and 304, which was initially higher in voltage may, as the supply degrades, become lower in voltage. This change in the relative maximum voltage signal increases power consumption and may cause the output DATA OUT to change state.devices - When the level shifter is used in an environment where the low voltage supply can be removed, for instance to save power, the level shifter may be augmented with isolation NFETs, such as NFETs 410 and 412 shown in the
level shifter 400 of FIG. 4. Such isolation NFETs help prevent transient events during the removal of the Vdd supply from affecting the state of the level shifter. Devices 401-404 operate similarly to devices 301-304;device 409 operates similarly todevice 305; devices 406-407 operate similarly to devices 306-307; anddevice 411 operates similarly todevice 308. Prior to the removal of Vdd, the HOLD signal is driven low to isolate theshifter 400. To hold the state of the various signals within thelevel shifter 400, the 405 and 408 are added. Thus when Vdd is removed, the state of thecross-coupled NFETs level shifter 400 when the HOLD signal is removed is maintained. However, thecascaded NFETs 409/410 and 411/412 limit the performance of the level shifter, primarily limiting the voltage gain range of the output of the shifter. There are two major problems with this prior art circuit due to the cascaded transistors: the cascaded transistors limit the difference between the supplies Vdd_H and Vdd, and because the transistors are cascaded, they must be large which increases circuit area and power consumption. - Thus, there is a need in the art for a level shifter that overcomes the aforementioned deficiencies, thus providing a gain in the active voltage range of the Vdd supply.
- The present invention addresses the foregoing needs by allowing a significantly greater voltage difference between the low and high level power supplies in the implementation of level shifters, and supports the removal of the driver power supply from the low level circuitry while maintaining the integrity of the data signal at the high level circuitry output side. This is accomplished in part by eliminating the cascaded devices in the level shifter.
- One embodiment of the present invention is a level shifter comprising a data input node, a first inverter having its input connected to the data input node, a second inverter connected to an output of the first inverter, a data output node, a latch having its output connected to the data output node, a first NFET connected between an input of the latch and a ground potential, and having its gate electrode connected to an output of the second inverter, and a second NFET connected between the data output node and the ground potential, and having its gate electrode connected to the output of the first inverter.
- Another embodiment of the present invention is as a data processing system comprising a microprocessor and accompanying circuitry outputting data signals with a voltage swing magnitude of 1.8 volts, level shifter circuitry for converting the voltage swing magnitude of the data signals from 1.8 volts to 3.3 volts, and input/output (I/O) circuitry for receiving the data signals with the voltage swing magnitude of 3.3 volts.
- Another embodiment of the present invention is as a level shifter comprising first circuitry for receiving a data signal having a voltage swing from ground to 1.8 volts, and second circuitry for converting the data signal to have a voltage swing from ground to 3.3 volts.
- Another embodiment of the present invention is as a level shifter comprising a data input node, a first NOR gate coupled to the data input node, a second NOR gate coupled to an output of the first NOR gate, a storage cell coupled to an output of the second NOR gate, and a data output node coupled to an output of the storage cell.
- The foregoing has outlined rather broadly the features and technical advantages of the present invention in order that the detailed description of the invention that follows may be better understood. Additional features and advantages of the invention will be described hereinafter which form the subject of the claims of the invention.
- For a more complete understanding of the present invention, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:
- FIG. 1 illustrates a level shifter in accordance with an embodiment of the present invention;
- FIG. 2 illustrates data processing circuitry implementing the level shifter of FIG. 1;
- FIG. 3 illustrates a prior art level shifter; and
- FIG. 4 illustrates another prior art level shifter.
- In the following description, numerous specific details are set forth to provide a thorough understanding of the present invention. However, it will be obvious to those skilled in the art that the present invention may be practiced without such specific details. In other instances, well-known circuits have been shown in block diagram form in order not to obscure the present invention in unnecessary detail. For the most part, details concerning timing considerations and the like have been omitted in as much as such details are not necessary to obtain a complete understanding of the present invention and are within the skills of persons of ordinary skill in the relevant art.
- Refer now to the drawings wherein depicted elements are not necessarily shown to scale and wherein like or similar elements are designated by the same reference numeral through the several views.
- The level shifter of the present invention is applicable to circuits in which the internal circuitry is operated at a voltage which is lower than the voltage required for the I/O drivers and receivers, and also where the voltage to the internal circuitry can be disabled to save power, while the I/O drivers and receivers remain powered and maintain the voltages on the off-chip signals.
- Referring to FIG. 2, a
level shifter 100 operates between two different power supply domains. This environment is typical of low-power electronic devices, such as battery-powered devices where conserving energy is particularly important and where the internal logic voltages tend to be low. An exemplary application is shown in FIG. 2, where a microprocessor is used in a battery-powered device, where the internal logic is powered by a supply voltage which can be varied from 1.8V to 1V, and is not persistent, and where the I/O drivers and receivers which generate and receive the off-chip signals are powered by a 3.3V supply voltage. Note that the present invention is not limited to the use in integrated circuitry of such exact power supply voltages, but is applicable where any level shifter is needed. In such devices, it is important that during the removal of the internal logic voltage supply, that the circuit which receives signals from the internal logic domain and translates these signals to the I/O supply domain not generate transient signals or glitches, generate indeterminate output levels, or burn excessive power, which are all possible with the 300 and 400 shown in FIGS. 3 and 4. During the collapse of the internal logic supply voltage when the supply is disabled, the voltage on the given signal may temporarily rise in voltage prior to falling. This temporary rise in voltage level may cause theprior art circuits 300 and 400 to glitch, go indeterminate, or burn power. The present invention, as shown in FIGS. 1 and 2, allows the receiver to continue to generate valid I/O voltage domain outputs when the internal logic domain signals become invalid.prior art circuits - In FIG. 2, a
battery 210 supplies power to a supply suspendcontrol logic 204 embodied within apersistent voltage domain 201. In this context, a persistent voltage domain is the collection of all circuitry powered by a voltage which is active at any time in which the device is on; the supply is never switched off, driven to ground, or allowed to degrade below its normal operating range whenever the device is active. Select and shutdown signals are received from the supply suspendcontrol logic 204 by the external DC/DC supplies 205, which supply various voltages to 202 and 203. The Shutdown signal from the supply suspendcircuits control logic 204 signals to the external power supply 205 (e.g., DC-to-DC converter) that the power to the logic should be disabled either by forcing the voltage to ground or allowing the voltage level to collapse toward ground over time. The Select signals indicate to theexternal power supply 205 the voltage level at which the logic supply, Vdd, should be maintained.Circuitry 202 can be referred to as a nonpersistent low voltage logic supply domain implementing circuitry 206 (e.g., microprocessor logic circuits, memory circuits, clocks, latches, etc.). This nonpersistent low voltage supply domain is referred to as such, since thecircuits 206 can be turned off for various reasons as described previously. The constant I/O domain 203 implements I/O drivers andreceivers 207 for supplying data signals to the off-chip domain. It is typical that such drivers andreceivers 207 require higher supply voltages, and thus in this example, a 3.3V supply is utilized bydomain 203, while the lower 1.8-1.0V supply is used bydomain 202. - When data signals are transferred from
circuitry 206 to drivers andreceivers 207, there is a need forlevel shifters 100 to transfer the data from the lower voltage supply domain to the higher voltage supply domain. And, as discussed above, there may be a need for theselevel shifters 100 to operate under conditions where power is terminated from the low voltagelogic supply domain 202. - Referring to FIG. 1, there is illustrated
level shifter 100 in further detail. 101, 104, 105, 106, 110, 111, 113, and 114 are NFET CMOS (complementary metal-oxide semiconductor) devices, whileDevices 102, 103, 107, 108, 109, and 112 are PFET CMOS devices. However, the present invention may also be utilized with other types of switching circuits with equivalent functionality.devices - PFETs 102 and 103 and NFETs 101 and 104 form a NOR gate. When HOLD is high, the
output node 120 of this gate is held low. When HOLD is low, theoutput node 120 of the gate is the logical inversion of the input DATA IN. 107 and 108 and NFETs 105 and 106 form a NOR gate. When HOLD is high, thePFETs output node 121 of this gate is held low. When HOLD is low, theoutput node 121 of the gate has the same value as the signal DATA IN. 109 and 112 and NFETs 111 and 113 form a cross-coupled inverter which is a storage cell. When HOLD is high, both NOR gates have a low output value,PFETs 110 and 114 are off, and the cross-coupled inverter maintains the state of the output DATA OUT. When HOLD is low and theNFETs output node 120 of the NOR formed by 101 and 104 and PFETs 102 and 103 is high,NFETs NFET 114 is turned on and the output DATA OUT is pulled low. The inverter formed byNFET 111 andPFET 109 reinforces this condition. When HOLD is low and theoutput node 121 of the NOR formed by 105 and 106 and PFETs 107 and 108 is high,NFETs NFET 110 is turned on and theinput node 122 to the inverter formed byPFET 112 andNFET 113 is driven low, and the output DATA OUT is driven high. The inverter formed byNFET 111 andPFET 109 reinforces this condition. - In either instance, if the Vdd power supply is to be removed, first the HOLD signal is activated to a high state. This effectively isolates
level shifter 100 from the Vdd power supply and isolates the low power circuits from the higher power supply circuits, and in turn maintaining the state of the data signal present in the level shifter. - Although the present invention and its advantages have been described in detail, it should be understood that various changes, substitutions and alterations can be made herein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (27)
1. A level shifter comprising:
a data input node;
a first inverter having its input connected to the data input node;
a second inverter connected to an output of the first inverter;
a data output node;
a latch having its output connected to the data output node;
a first NFET connected between an input of the latch and a ground potential, the first NFET having its gate electrode connected to an output of the second inverter; and
a second NFET connected between the data output node and the ground potential, the second NFET having its gate electrode connected to the output of the first inverter.
2. The level shifter as recited in claim 1 , further comprising:
a first switching device connected between the output of the first inverter and the ground potential, wherein the first switching device receives a hold signal at its gate electrode.
3. The level shifter as recited in claim 1 , further comprising:
a first switching device connected between the output of the second inverter and the ground potential, wherein the first switching device receives a hold signal at its gate electrode.
4. The level shifter as recited in claim 2 , further comprising:
a second switching device connected between the output of the second inverter and the ground potential, wherein the second switching device receives the hold signal at its gate electrode.
5. The level shifter as recited in claim 1 , further comprising:
a first switching device connected between the first inverter and a first power supply having a first potential, wherein the first switching device receives a hold signal at its gate electrode.
6. The level shifter as recited in claim 1 , further comprising:
a first switching device connected between the second inverter and a first power supply having a first potential, wherein the first switching device receives a hold signal at its gate electrode.
7. The level shifter as recited in claim 6 , further comprising:
a second switching device connected between the first inverter and the first power supply having the first potential, wherein the second switching device receives the hold signal at its gate electrode.
8. The level shifter as recited in claim 4 , further comprising:
a third switching device connected between the first inverter and a first power supply having a first potential, wherein the third switching device receives the hold signal at its gate electrode; and
a fourth switching device connected between the second inverter and the first power supply having the first potential, wherein the fourth switching device receives the hold signal at its gate electrode.
9. The level shifter as recited in claim 1 , wherein the first and second inverters are energized by a first power supply having a first potential, and wherein the latch is energized by a second power supply having a second potential.
10. The level shifter as recited in claim 9 , wherein the first potential is 1.8 volts, and the second potential is 3.3 volts.
11. The level shifter as recited in claim 1 , further comprising circuitry for isolating the first and second inverters from the latch.
12. A level shifter comprising:
first circuitry for receiving a data signal having a voltage swing from ground to 1.8 volts;
second circuitry for converting the data signal to have a voltage swing from ground to 3.3 volts; and
an output node for outputting the data signal with the voltage swing from ground to 3.3 volts.
13. The level shifter as recited in claim 12 , further comprising:
circuitry for isolating the first circuitry from the second circuitry after the data signal has been converted to have the voltage swing from ground to 3.3 volts.
14. The level shifter as recited in claim 13 , further comprising:
circuitry for disconnecting the first circuitry from a power supply providing the voltage swing from ground to 1.8 volts.
15. The level shifter as recited in claim 12 , wherein the first circuitry comprises first and second NOR gates and wherein the second circuitry comprises a storage cell.
16. A data processing system comprising:
a microprocessor and accompanying circuitry outputting data signals with a voltage swing magnitude of 1.8 volts;
level shifter circuitry for converting the voltage swing magnitude of the data signals from 1.8 volts to 3.3 volts; and
input/output circuitry for receiving the data signals with the voltage swing magnitude of 3.3 volts.
17. The system as recited in claim 16 , wherein the level shifter circuitry further comprises:
first circuitry for receiving the data signals having a voltage swing from ground to 1.8 volts; and
second circuitry for converting the data signals to have a voltage swing from ground to 3.3 volts.
18. The system as recited in claim 17 , further comprising:
circuitry for isolating the first circuitry from the second circuitry after the data signals have been converted to have the voltage swing from ground to 3.3 volts.
19. The system as recited in claim 18 , further comprising:
circuitry for disconnecting the first circuitry from a power supply providing the voltage swing from ground to 1.8 volts.
20. The system as recited in claim 16 , wherein the level shifter circuitry further comprises:
a data input node for receiving the data signals;
a first inverter having its input connected to the data input node;
a second inverter connected to an output of the first inverter;
a data output node;
a latch having its output connected to the data output node;
a first switch connected between an input of the latch and a ground potential, and having its gate electrode connected to an output of the second inverter; and
a second switch connected between the data output node and the ground potential, and having its gate electrode connected to the output of the first inverter.
21. The system as recited in claim 20 , further comprising circuitry for isolating the first and second inverters from the latch.
22. A level shifter comprising:
a data input node;
a first NOR gate coupled to the data input node;
a second NOR gate coupled to an output of the first NOR gate;
a storage cell coupled to an output of the second NOR gate; and
a data output node coupled to an output of the storage cell.
23. The level shifter as recited in claim 22 , further comprising a first NFET coupled between the first NOR gate and the second NOR gate.
24. The level shifter as recited in claim 23 , further comprising a second NFET coupled to the output of the first NOR gate and to the data output node.
25. The level shifter as recited in claim 22 , wherein the first and second NOR gates are powered by a first voltage supply, and wherein the storage cell is powered by a second voltage supply, wherein the first and second voltage supplies have different voltages.
26. The level shifter as recited in claim 23 , wherein the first and second NOR gates are configured to receive a hold signal.
27. The level shifter as recited in claim 22 , wherein the first NOR gate receives a hold signal and a nonpersistent low voltage data signal, and generates a first NOR output signal, wherein the second NOR gate receiver the hold signal and the first NOR output signal, and generates a second NOR output signal, the level shifter further comprising circuitry for coupling the first NOR output signal and the second NOR output signal to complimentary inputs of the storage cell generating a persistent high voltage data signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/348,880 US20030222700A1 (en) | 2002-05-30 | 2003-01-22 | Level shifter |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/159,484 US6717452B2 (en) | 2002-05-30 | 2002-05-30 | Level shifter |
| US10/348,880 US20030222700A1 (en) | 2002-05-30 | 2003-01-22 | Level shifter |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US10/159,484 Division US6717452B2 (en) | 2002-05-30 | 2002-05-30 | Level shifter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US20030222700A1 true US20030222700A1 (en) | 2003-12-04 |
Family
ID=29582911
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US10/159,484 Expired - Fee Related US6717452B2 (en) | 2002-05-30 | 2002-05-30 | Level shifter |
| US10/348,880 Abandoned US20030222700A1 (en) | 2002-05-30 | 2003-01-22 | Level shifter |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US10/159,484 Expired - Fee Related US6717452B2 (en) | 2002-05-30 | 2002-05-30 | Level shifter |
Country Status (1)
| Country | Link |
|---|---|
| US (2) | US6717452B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013085520A1 (en) * | 2011-12-08 | 2013-06-13 | Intel Corporation | Voltage compensated level-shifter |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100908654B1 (en) * | 2002-11-27 | 2009-07-21 | 엘지디스플레이 주식회사 | Level shifter and latch with built-in |
| US7349835B2 (en) * | 2004-09-21 | 2008-03-25 | Atrenta, Inc. | Method, system and computer program product for generating and verifying isolation logic modules in design of integrated circuits |
| US7091746B2 (en) * | 2004-10-07 | 2006-08-15 | Promos Technologies Inc. | Reduced device count level shifter with power savings |
| US7245152B2 (en) * | 2005-05-02 | 2007-07-17 | Atmel Corporation | Voltage-level shifter |
| US7245172B2 (en) * | 2005-11-08 | 2007-07-17 | International Business Machines Corporation | Level shifter apparatus and method for minimizing duty cycle distortion |
| US7348813B1 (en) * | 2005-12-02 | 2008-03-25 | Cirrus Logic, Inc. | Circuits and methods for reducing the effects of level shifter delays in systems operating in multiple voltage domains |
| US7525367B2 (en) * | 2006-10-05 | 2009-04-28 | International Business Machines Corporation | Method for implementing level shifter circuits for integrated circuits |
| US20080084231A1 (en) * | 2006-10-05 | 2008-04-10 | International Business Machines Corporation | Method for Implementing Level Shifter Circuits and Low Power Level Shifter Circuits for Integrated Circuits |
| KR100788356B1 (en) * | 2006-10-26 | 2008-01-02 | 동부일렉트로닉스 주식회사 | Single-Supply Level Translator with Large Voltage Difference |
| JP5203791B2 (en) * | 2008-04-18 | 2013-06-05 | ルネサスエレクトロニクス株式会社 | Level shift circuit |
| US7777522B2 (en) * | 2008-07-31 | 2010-08-17 | Freescale Semiconductor, Inc. | Clocked single power supply level shifter |
| US8421516B2 (en) * | 2009-10-23 | 2013-04-16 | Arm Limited | Apparatus and method providing an interface between a first voltage domain and a second voltage domain |
| JP2011223052A (en) * | 2010-04-02 | 2011-11-04 | Seiko Epson Corp | Level shifter and control method of the same |
| US9948303B2 (en) | 2016-06-30 | 2018-04-17 | Qualcomm Incorporated | High speed voltage level shifter |
| US9859893B1 (en) | 2016-06-30 | 2018-01-02 | Qualcomm Incorporated | High speed voltage level shifter |
| US9647660B1 (en) * | 2016-08-05 | 2017-05-09 | Arm Limited | Apparatus and method for universal high range level shifting |
| US10535386B2 (en) | 2017-05-23 | 2020-01-14 | Arm Limited | Level shifter with bypass |
| US10574236B2 (en) | 2017-08-21 | 2020-02-25 | Arm Limited | Level shifter with bypass control |
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| US5469080A (en) * | 1994-07-29 | 1995-11-21 | Sun Microsytems, Inc. | Low-power, logic signal level converter |
| US5917339A (en) * | 1995-12-29 | 1999-06-29 | Hyundai Elecronics Industries Co., Ltd. | Mixed voltage input buffer |
| US6046621A (en) * | 1996-09-30 | 2000-04-04 | Advanced Micro Devices, Inc. | Differential signal generator with dynamic beta ratios |
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| US5153451A (en) * | 1991-08-19 | 1992-10-06 | Motorola, Inc. | Fail safe level shifter |
| JP3194636B2 (en) * | 1993-01-12 | 2001-07-30 | 三菱電機株式会社 | Level conversion circuit, microcomputer for emulator with built-in level conversion circuit, piggyback microcomputer with built-in level conversion circuit, emulation system with built-in level conversion circuit, and LSI test system with built-in level conversion circuit |
| US5324996A (en) * | 1993-02-16 | 1994-06-28 | Ast Research, Inc. | Floating fault tolerant input buffer circuit |
| JP3335700B2 (en) * | 1993-03-30 | 2002-10-21 | 富士通株式会社 | Level converter and semiconductor integrated circuit |
-
2002
- 2002-05-30 US US10/159,484 patent/US6717452B2/en not_active Expired - Fee Related
-
2003
- 2003-01-22 US US10/348,880 patent/US20030222700A1/en not_active Abandoned
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5469080A (en) * | 1994-07-29 | 1995-11-21 | Sun Microsytems, Inc. | Low-power, logic signal level converter |
| US5917339A (en) * | 1995-12-29 | 1999-06-29 | Hyundai Elecronics Industries Co., Ltd. | Mixed voltage input buffer |
| US6046621A (en) * | 1996-09-30 | 2000-04-04 | Advanced Micro Devices, Inc. | Differential signal generator with dynamic beta ratios |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013085520A1 (en) * | 2011-12-08 | 2013-06-13 | Intel Corporation | Voltage compensated level-shifter |
| US8912823B2 (en) | 2011-12-08 | 2014-12-16 | Intel Corporation | Voltage compensated level-shifter |
Also Published As
| Publication number | Publication date |
|---|---|
| US6717452B2 (en) | 2004-04-06 |
| US20030222699A1 (en) | 2003-12-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| STCB | Information on status: application discontinuation |
Free format text: EXPRESSLY ABANDONED -- DURING EXAMINATION |