US20030148065A1 - Miniature reaction chamber template structure for fabrication of nanoscale molecular systems and devices - Google Patents
Miniature reaction chamber template structure for fabrication of nanoscale molecular systems and devices Download PDFInfo
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- US20030148065A1 US20030148065A1 US10/067,167 US6716702A US2003148065A1 US 20030148065 A1 US20030148065 A1 US 20030148065A1 US 6716702 A US6716702 A US 6716702A US 2003148065 A1 US2003148065 A1 US 2003148065A1
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- 238000006243 chemical reaction Methods 0.000 title claims abstract description 41
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 87
- 239000010703 silicon Substances 0.000 claims abstract description 73
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 73
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 claims abstract description 53
- 239000005297 pyrex Substances 0.000 claims abstract description 49
- 239000011521 glass Substances 0.000 claims abstract description 15
- 229910052751 metal Inorganic materials 0.000 claims abstract description 10
- 239000002184 metal Substances 0.000 claims abstract description 10
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 10
- 239000001301 oxygen Substances 0.000 claims abstract description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000002131 composite material Substances 0.000 claims abstract description 4
- 235000012239 silicon dioxide Nutrition 0.000 claims abstract description 3
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 3
- 239000012530 fluid Substances 0.000 claims description 16
- 230000005684 electric field Effects 0.000 claims description 5
- -1 oxygen ions Chemical class 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
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- 238000003780 insertion Methods 0.000 claims 1
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- 150000002739 metals Chemical class 0.000 abstract description 2
- 230000009257 reactivity Effects 0.000 abstract description 2
- 239000000126 substance Substances 0.000 abstract description 2
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- 238000005530 etching Methods 0.000 description 4
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- 238000000034 method Methods 0.000 description 3
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- FKNQFGJONOIPTF-UHFFFAOYSA-N Sodium cation Chemical compound [Na+] FKNQFGJONOIPTF-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000037427 ion transport Effects 0.000 description 2
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- QGRVXEOIASZLIL-UHFFFAOYSA-N 3-phenylbenzene-1,2-dithiol Chemical compound SC1=CC=CC(C=2C=CC=CC=2)=C1S QGRVXEOIASZLIL-UHFFFAOYSA-N 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical compound [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
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- B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
- B32B3/10—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a discontinuous layer, i.e. formed of separate pieces of material
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- B32B17/00—Layered products essentially comprising sheet glass, or glass, slag, or like fibres
- B32B17/06—Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
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- B01J2219/00837—Materials of construction comprising coatings other than catalytically active coatings
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- B01J2219/00891—Feeding or evacuation
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10S977/712—Integrated with dissimilar structures on a common substrate formed from plural layers of nanosized material, e.g. stacked structures
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10S977/72—On an electrically conducting, semi-conducting, or semi-insulating substrate
- Y10S977/721—On a silicon substrate
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
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- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
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- Y10T428/24273—Structurally defined web or sheet [e.g., overall dimension, etc.] including aperture
- Y10T428/24322—Composite web or sheet
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
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- Y10T428/24744—Longitudinal or transverse tubular cavity or cell
Definitions
- FIG. 1 is an enlarged diagram in cross sectional view of a micro-miniature reaction chamber template according to this invention.
- FIG. 5 consists of FIGS. 5A, 5B and 5 C which basically shows a top wafer of silicon which is bonded to a bottom wafer of silicon coated with Pyrex to form a composite structure shown in FIG. 5C. It is noted that in FIG. 5 the co-apertures are rectangular in shape rather than circular as shown in FIG. 4.
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- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Micromachines (AREA)
Abstract
Description
- This invention relates to molecular systems and devices and, more particularly, to a unique micro-miniature reaction chamber template structure utilized to fabricate such devices.
- As one can ascertain, conventional electronics have fundamental limitations in regard to size, speed and so on. Many prominent scientific centers are working on utilizing molecules to provide an alternative for electronic processors. The use of molecules will result, obviously, in extremely small structures, which theoretically are capable of high operating speeds. Thus, the term molecular transistor has been utilized. In regard to such techniques, many centers have been utilizing gallium arsenide, as well as aluminum gallium arsenide with contacts with molecules disposed on the surface of such devices. Essentially, they are using new molecules and old semiconductor devices to try to produce new components. Thus, such researchers have proposed a molecular field effect transistor designated as MOLSET. This is basically a molecular tripod where the molecules form gate, source and drain electrodes with extremely small dimensions such as a spacing of 35 Angstroms between the source and drain and between the source and gate.
- The art is in its infancy, as one can ascertain. For example, see an article in theNew York Times, Jan. 1, 2002 entitled, “Scientists Find that Tiny Pipes Offer Big Payoffs”. This article discusses new technology known as microfluidics. This technology then utilizes silicon tubes, which are used to pump fluid in various directions and essentially operate like valves and so on.
- It is an objective to provide a unique micro-miniature template structure for the fabrication of nanoscale molecular systems and devices.
- The structure contemplated is composed of multiple layers of silicon, which are either doped or intrinsic, Pyrex and various metals. Silicon may or may not be totally or partially covered with silicon dioxide. The Pyrex is chosen to be suitable for field assisted bonding to silicon and the various metal layers are selected for their adherence to silicon or Pyrex, as well as their conductivity and chemical reactivity.
- The basic structure is made to contain a number of tubes or fluidic pipes of varying cross sections in which a portion of the cross section is formed in the silicon and a second portion of the cross section may be formed in the Pyrex. It is also within the scope of this invention to form the cross section in two pieces of silicon separated by a thin layer of Pyrex. In any event, the use of field assisted bond between silicon and Pyrex makes the use of sodium ion transport in the Pyrex during the bonding process and it is possible by shaping the Pyrex layer to leave internal conductive paths. It is also possible to leave in the Pyrex oxygen ions at the surface that were previously linked to the sodium ions, but can now be exposed for attachment to various organic molecules.
- The use of various planes of the silicon structure makes it possible to obtain cavities of differing shapes during etching depending on the crystallographic orientation of the chosen planes. In addition, the extent of etching can also be controlled by the use of degenerately doped silicon layers and the conductivity selective etch. Moreover, the use of a particular crystallographic plane makes possible the construction of sharp edges for a localized high electric field. It is clear that specific areas of the silicon can be chosen to have dangling bonds to promote localized reactions enabling a nanostructure to form in a specific spot within the reaction chamber. Such localized reaction areas may also be formed using various layers of metal on either the silicon or the glass structure. In addition, the various fluidic pipes can also be formed if so desired at right angles to the main fluidic pipes enabling the injection of liquids at varying places within the reaction chamber structure.
- If the field assisted bonding is performed in either a vacuum (or an inert atmosphere), the dangling oxygen bonds are exposed after the two layers are joined. After the voltage is lowered and the temperature is reduced to room ambient, various fluids can be introduced through the right angle conduit and allowed to reach the dangling oxygen bonds (or other localized metal surfaces) to allow the reaction to proceed at the desired places. Reaction of an appropriate voltage can also (by means of the highly localized electric fluid) cause the reaction to terminate at the junction.
- FIG. 1 is an enlarged diagram in cross sectional view of a micro-miniature reaction chamber template according to this invention.
- FIG. 2 shows the template of FIG. 1 utilizing micropipes.
- FIG. 3 is an extremely enlarged view of a vertical and horizontal array of micropipes forming an X-Y matrix to provide localized reaction sites at the cross points of the matrix.
- FIG. 4 consists of FIGS. 4A, 4B and4C and basically shows a wafer of Pyrex which is eventually bonded to a wafer of silicon to form a composite structure as shown in FIG. 4A.
- FIG. 5 consists of FIGS. 5A, 5B and5C which basically shows a top wafer of silicon which is bonded to a bottom wafer of silicon coated with Pyrex to form a composite structure shown in FIG. 5C. It is noted that in FIG. 5 the co-apertures are rectangular in shape rather than circular as shown in FIG. 4.
- FIG. 6 consists of FIGS. 6A, 6B and6C and shows an alternate embodiment of a coated silicon wafer using vertical conduits to enable fluid placement.
- FIG. 7 consists of FIGS. 7A, 7B and7C and again shows a top wafer of silicon bonded to a wafer of silicon which is coated with Pyrex having pipes or micropipes for enhancing reactions.
- FIG. 8 consists of8A, 8B and 8C and basically shows a top wafer of silicon secured to a wafer of silicon coated with Pyrex and which has alternate channel configurations disposed throughout.
- FIG. 9 consists of9A, 9B and 9C and basically shows a device according to this invention whereby the devices uses localized sharp pointed reaction areas disposed along the through channels to enable higher voltage reactions to occur at the tips of the pointed reaction areas.
- Referring to FIG. 1, there is shown an example of a basic structure according to this invention. In FIG. 1 a layer of silicon11 is bonded to a layer of Pyrex glass 10, which in turn is bonded to another layer of silicon 12. The silicon is bonded to the Pyrex layer 10 by means of a field-assisted bond. The field-assisted bond is formed by applying pressure between the silicon and the Pyrex under the influence of a voltage, which causes the silicon molecules to migrate into the glass molecules, forming a strong bond. As one knows, Pyrex glass contains sodium and the use of Pyrex for layer 11 makes the use of sodium ion transport during the bonding process to bond to the silicon. One can also shape the Pyrex layer 10 so that one can form internal conducting paths. Thus, FIG. 1 shows the two pieces of silicon 11 and 12 separated by a center portion, which is a thin layer of Pyrex 10.
- Referring to FIG. 2, there is shown the structure of FIG. 1, which includes a top layer of
silicon 21, a bottom layer ofsilicon 22 and a layer ofPyrex 20. In the layer ofPyrex 20 there is shown a plurality of microtubes as 30 and 31. These microtubes are formed by etching or other processing of the glass, which is well known. It is also understood that such microtubes can also be formed in the silicon by etching the similar products. The microtubes are pipes or channels between 1 to 10 mils in diameter and can be produced by active ion etching. In this manner, fluids containing molecules can be injected into themicrotubes 30. It is also envisioned that there will be an X-Y matrix of microtubes whereby each of the microtubes form an X-Y grid and therefore fluids can be injected at any point in X-Y grid to enable a fluid to reach a cross point or a local area. At this local area, there would be a small spot or opening. At this spot, there would be dangling oxygen bonds. These dangling oxygen bonds are, of course, utilized to enable one now to couple organic molecule to the dangling oxygen bonds so as to utilize the structure shown in FIGS. 1 and 2 as a template for connecting organic molecules to the silicon structure. One can therefore produce organic devices, such as electronic devices or other conducting devices. The organic molecules that can be employed would be molecules like biphenyldithiol and biphenydiamine, as well as diphenyls. Such compounds are soluble in alcohol and ether and are used in organic synthesis. Therefore, the fluids that can be used to transport these compounds are alcohol and ether as well as other solvents. In any event, the important aspect of the invention is that one utilizes Pyrex with various layers of silicon structures. The use of Pyrex enables the transport of sodium ions and Pyrex oxygen ions at the surface that were previously lined to sodium ions are now exposed so they can be attached to various organic molecules. - Referring to FIG. 3 there is shown an extremely enlarged view of a series of micropipes, which are formed in the Pyrex or the silicon. As we can see, there are
micropipes micropipes 43 and 44 oriented in the horizontal direction. The intersection between pipe 44 andpipe 45 creates across point 40, which is a localized area in the glass or silicon, where fluid can be introduced to the pipe. At the localized area, the molecule will exist and by the use of electric fields or other devices, one can now cause the migration of sodium ions and therefore produce oxygen ions which are dangling at that location. One can now attach a molecule for a specific spot on the silicon structure shown as FIGS. 1 and 2. It is understood that FIG. 3 is an enlarged view and the matrix contains thousands of micropipes developed in the structures of FIG. 1 and FIG. 2. - Referring to FIG. 5, which consists of FIGS. 5A, 5B and5C, is shown an alternate embodiment of a micro-miniature reaction chamber template circuit according to this invention. FIG. 5A shows a top wafer which is fabricated from silicon. The
wafer 61 has rectangular channels ormicropipes silicon wafer 66, which is coated withPyrex glass 65. ThePyrex glass 65 is bonded to or otherwise deposited on thesilicon wafer 66 and has correspondingchannels Pyrex layer 65, thus having a silicon wafer separated by aPyrex layer 65 bonded to anothersilicon wafer 66. There are three channels orpipes 68, which are directed from one side to the other side, where each through channel can accommodate a fluid flow, as described above. - Referring to FIG. 6, which consists of FIGS. 6A, 6B and6C, there is shown in FIG. 6A a
top wafer 70 fabricated from silicon. Thewafer 70 again hassemi-rectangular channels silicon 75 coated with a layer ofPyrex 76 and havingcorresponding channel top wafer 70 secured to thebottom wafer 75 at the Pyrex layer by an electro-assisted bond. As one can see a molecule containing fluid can be introduced through thevertical conduits 71 to flow into thepipes 76 as shown in FIG. 6C. - Referring to FIG. 7 which consists of FIGS. 7A, 7B and7C, there is shown a
top wafer 80 of silicon havingsemicircular apertures 84, 85 and 86 directed from one side of the wafer to the other side of the wafer. FIG. 7B shows a bottom wafer ofsilicon 83 which is covered with a layer ofPyrex 82 which is deposited on the silicon. Thesilicon wafer 83depressions depressions 84, 85 and 86. Thetop wafer 80 is bonded toPyrex layer 82 which is bonded tosilicon layer 83 to form the structure shown in FIG. 7C. The through holes 88 or pipes are formed as above. - Referring to FIG. 8, which consists of FIGS. 8A, 8B and8C, there is shown again a wafer of
silicon 90. In this instance there arechannels channel 93, but provide areas in which an organic fluid can flow. FIG. 8B shows a bottom wafer ofsilicon 97 coated with Pyrex glass to form correspondingchannels top wafer 90 joined to thebottom wafer 91 via thePyrex layer 95. It is seen from FIG. 8 that all the channels are not through channels, but are channels which are used to circulate fluid in any desired manner through the structure. However, there is a through path from one end to the other as from 91A and 92A to 93A. - Referring to FIG. 9 which consists of FIGS. 9A, 9B and9C, there is shown in FIG. 9A a silicon wafer 116 having through
channels silicon wafer 110 having a Pyrex layer deposited thereon. Thesilicon wafer 110 has correspondingchannels 104A, 105A and 106A. Each channel has localized high field reaction areas designated by 102 and 103. These high field reaction areas are basically points which are tips which are directed along the apertures as 106 and 104, and which will produce high electric fields where the voltage is applied between the silicon and Pyrex between the wafer. These high electric fields which are produced at the tips will enable the efficient reaction areas to occur at the localized tip areas, plus each of the tips as 102 and 103 terminates in a sharp point. As one can understand, when a voltage is applied between the chips, the sharp points will basically create high voltage fields, which are localized and whereby reactions can take place as indicated above. - It is also understood that localized reaction areas may also be formed using layers of metal under the silicon or the glass structure. The layers of metal can be, for example, layers of aluminum, gold, and so on. These metal layers can also be formed into pipes, and therefore provide reaction areas.
Claims (17)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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US10/067,167 US7189378B2 (en) | 2002-02-04 | 2002-02-04 | Miniature reaction chamber template structure for fabrication of nanoscale molecular systems and devices |
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Application Number | Priority Date | Filing Date | Title |
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US10/067,167 US7189378B2 (en) | 2002-02-04 | 2002-02-04 | Miniature reaction chamber template structure for fabrication of nanoscale molecular systems and devices |
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US20030148065A1 true US20030148065A1 (en) | 2003-08-07 |
US7189378B2 US7189378B2 (en) | 2007-03-13 |
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Cited By (2)
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US20060124230A1 (en) * | 2003-06-16 | 2006-06-15 | Isabelle Chartier | Method of bonding microstructured substrates |
CN101863449A (en) * | 2010-06-21 | 2010-10-20 | 东南大学 | Encapsulation method of MEMS infrared sensor with infrared focusing function |
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US20100116429A1 (en) * | 2008-11-10 | 2010-05-13 | George Edward Berkey | Method for layered glass micro-reactor fabrication |
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US4392362A (en) * | 1979-03-23 | 1983-07-12 | The Board Of Trustees Of The Leland Stanford Junior University | Micro miniature refrigerators |
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CN101863449A (en) * | 2010-06-21 | 2010-10-20 | 东南大学 | Encapsulation method of MEMS infrared sensor with infrared focusing function |
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