US1194035A - Tile sizing and grading machine - Google Patents

Tile sizing and grading machine Download PDF

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US1194035A
US1194035A US1194035DA US1194035A US 1194035 A US1194035 A US 1194035A US 1194035D A US1194035D A US 1194035DA US 1194035 A US1194035 A US 1194035A
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support
warpage
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F17/00—Printing apparatus or machines of special types or for particular purposes, not otherwise provided for
    • B41F17/24—Printing apparatus or machines of special types or for particular purposes, not otherwise provided for for printing on flat surfaces of polyhedral articles

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  • Patented Arn 8, H916 H916
  • This invention relates to tile grading and war-page testing ma chines and has for an obj ect to produce a new and improved machine of the character illustrated in Patent 1,066,239 issued to lVilliam K. Achert.
  • a further object is to produce a tile grading and warpage testing machine in which means are employed for indicating different degrees of warpage or for grading the tile in accordance with the degree of war-page.
  • Figure 1 is a side elevation of a machine embodying my invention.
  • Fig. 2 is a fragmental sectional view along the line 2-2 of Fig. 1.
  • Fig. 3 is a sectional View along the line 3--3 of Fig. 1, and is shown in connection with a fragmental plan view of the tile supporting table and conveyer.
  • Fig. 4 is a fragmental sectional view along the line 4-t of Fig. 3, portions being broken away and omitted, for convenience of illustration.
  • the apparatus illustrated as an embodiment of my invention includes a tile-grading mechanism, similar to that disclosed in the patent to which I have referred; it also ineludes two separate mechanisms for testing the tiles for warpage, and a conveyer for moving the tiles to be tested, along the machine, so that they are first engaged by the grading mechanism and are then engaged by the successive warpagetesting mechanisms.
  • the tile-grading mechanism 6 illustrated is mounted on the frame 7 of the machine in such a position, that its reciprocating finger S is moved into engagement with the edges of tiles traversing the tile way or tile supporting table of the machine,
  • An endless conveyer 9 is provided for moving tile along the way, and, as illustrated, consists of two separate chains, which are secured together 'warped a marked amount.
  • each chain is located in a slot 13, formed on the frame portion, and is supported by a chain support bar or guide 14,
  • the grading mechanism 6, illustrated, is adapted to stamp each tile graded by it and to indicate by a characteristic mark the size of the tile.
  • Various means may, however, be employed for indicating the size of the tile and it is not essential that they be stamped or marked. After the tile have been engaged by the finger 8 of the grading mechanism and have been stamped for the purpose of indicating their size, they are conveyed to a warpage testing mechanism 16, with which the machine is provided.
  • the mechanism 16 is preferably so adjusted that it will only indicate tiles which are After each tile has been tested by the mechanism 16, it is conveyed along the machine to the warpage testing mechanism 17, which is similar to ad-' the mechanism 16, but is preferably so justed that it will indicate tile which are slightly warped or are warped to a less degree than those indicated by the mechanism 16. It will be understood that any number of warpag'e testing mechanisms may be employed and that each mechanism may be ad jnsted so as .to indicate a di'llercnt degree of tile warpage and that they may occupy any desired position along the tile way with relation to each other, and with relation to the tile grading mechanism 6.
  • the machine is capable of class ing the tiles, tested by it, in three classes; that is, perfect tile, tile warped a slight amount, and tile warped an objectirmable amount.
  • Various means may be employed for indicating to which class each tile belongs, but in the drawings 1 have provided means for stamping and characteristically marking the warped tiles, so that tiles warped a small amount may be readily distinguished from those warped an objectionable amount.
  • Each warpage testing mechanism includes a series of movable pins 18, which extend upwardly through the table 7 and are adapted to be engaged and moved by a tile during the operation of testing it for warpage.
  • the tile supporting plate 15 is cut away to form a depression 19 which is so located that it is bridged by the tile during the testing operation; that is, during the operation of pressing the tile against the projecting points of the pins.
  • Each mechanism also includes means for clamping or holding the tile in place on the tile way, during the testing operation, and means controlled by the pins for indicating warpage of the tile.
  • My invention contemplates employing a plurality of the pins 18 and so arranging them that they engage each tile tested, at points near its edges.
  • the pins are divided into three sets; two end sets and an intermediate set.
  • Three pins are included in each end set and are located on each side of the tile support plate 15, so that they project through portions of the tile way, which form the stationary abutments, against which the ends of the tile are pressed during the testing operation.
  • Two pins 18 are included in the intermediate set and they project upwardly through the depressed portion of the tile plate 15 and are preferably located midway between the outer sets of pins and in such positions that they engage each tile tested at points located near the lateral edges of the tile.
  • each pin 18 is so arranged that each pin operates, during the testing operation, to complete an electric circuit, when it is moved down a pre-determined amount by the tile tested, or when it is not engaged by the tile or is not moved from its normal or upper position.
  • Each pin 18 is supported on the upper end of a pin support rod 21 and is held in place by means of a block 22, which is firmly secured on the pin and forms a removable cap for the supporting rod, since it is provided with an aperture or way into which the upper end of the support rod projects.
  • Each block 22 is also provided with a sight hole 23, which exposes the point of contact between the pin and the support rod, and therefore discloses Whether the pin is in positive engagement with the bar 21 or is moved out of the proper position relatively thereto, by dirt or other foreign material.
  • each rod 21 is reduced in diameter at its upper and lower ends, so as to provide the shoulders 21 and 25, which respectively engage the plates 26 and 27 and thereby limit the motion of the rods.
  • the plate 26 is provided with suitably located apertures, of such diameter that the upper ends, or reduced portions of the rods 21 may pass freely through them without contacting with the plate.
  • the apertures are not large enough to permit the larger portions of the rods to pass therethrough, and consequently the shoulders 2 1 are normally held against the plate by means of coiled springs 28, each of which surrounds the lower reduced portion of one of the rods 21 and is located between a collar 29 on the rod and a plate 31, which is suspended from the plate 27, but is insulated therefrom.
  • the lower ends of the rods 21 extend through apertures formed in the plate 27 which, like the apertures in the plate 26, permit the reduced portion of the rod to pass freely therethrough without contacting with the plate, but they are not of suliicient size to permit the larger portion of the rod to pass.
  • each of the plates 26 and 27 is provided with a sheet 32 of insulating material, through which the reduced portions of the rods 21 project and which is employed for the purpose of holding the rods centrally with relation to the apertures in the plate, to which it is secured, and to thereby prevent the reduced portions from contacting with the plates.
  • the plates 26 and 27 are movable toward and away from each other, so that the positions of the pins 18 above the surface of the tile way may be varied, and so that the amount which each pin is capable of moving without forcing the shoulder 25 of its corresponding support rod into contact with the plate 27, may be varied.
  • the plates 28 and 27 are mounted on the frame portion of the machine in the following manner:
  • a frame 33 is secured to the frame portion 7 by means of bolts 34 and is insulated from the frame portion by means of insulating sleeve-washers 35, which surround the shank portions of the bolts and are located between the bolts and the plate, as illustrated in Fig. 2.
  • Two depending bolts 36 are secured on opposite sidesof the frame 33, and support a plate 37, which extends transversely of the frame 7 of the machine.
  • Each bolt 36 extends through each of the plates 26 and 27 and forms guides for the plates as they are moved toward and away from each other.
  • Sleeves 38 are rigidly secured to the plate 26 and, extending along the bolts, form a guide for the plate during its motion along the bolt, and also aid in holding it firmly in a horizontal position.
  • Two sleeves 39 are secured to the plate 27, and each sleeve is located concentric with one of the bolts 36, surrounds, and slides upon one of the sleeves 38. In this manner the motion of the plate 27 is guided and the plate is held firmly in a horizontal position.
  • the plates 26 and 27 are moved along their supporting bolts by means of a screw bar 40, which is provided with two sets of oppositely located screw threads, one set of which engages a suitably threaded aperture 41 in the plate 26 and the other of which engages a similar aperture 41 in the plate 27.
  • the screw threads are so arranged on the bar 40 that the plates 26 and 27 are moved equal amounts in opposite directions when the bar is turned. (The bar 40 is broken away in Fig.
  • the lower end of the bar is not provided with screw threads and it projects through a longitudinall extending aperture, formed in a screw 42, and is provided at its lower end with a cap 43, which is provided with a graduated scale, as shown in Fig. 2.
  • the rod 40 is also provided with an integrally formed collar 4-4, which is adapted to rest upon the upper end of the screw 42 and to thereby support the rod on the screw 42.
  • the screw 42 is screwed into a suitably threaded aperture in the plate 37 and as shown, is provided at its lower end with a capstan head 45, which is located adjacent to the cap 43.
  • the operation of adjusting the pins 18 is as follows:
  • the screw-bar 40 is turned, by means of its cap 43, so that the plates 26 and 27 move toward each other and respectively engage the shoulders 24 and 25 formed on the rods 21. This clamps the rods in place and holds them rigid with respect to the plates, so that they will move up or down with the plates, as the plates are moved in the same direction.
  • the screw 42 is then turned in the proper direction, so that it raises or lowers the plates 26 and 27, through the agency of the collar 4!: and rod 40, both of which remain stationary, relatively to the plates, until the pins 18 are moved to a position, such that their upper ends are flush with the tile si'lpporting surfaces of the ways,
  • the screw 42 is then clamped in position and the pins 18 are projected the desired amount above the tile supporting surface of the way by turning the screw 40, so as to move the plates 26 and 27 apart.
  • This motion of the plates permits the rods 21 to move upwardly with the plate 26 in response to the pressure of their springs 28 and also renders it possible to move each pin 18 and its rod 21 downwardly, an amount equal to twice the length of the projecting upper end of the pin.
  • the aperture formed in the plate 37, and through which the screw 42 extends, is slotted on diametrically opposite sides and the plate is provided with the usual clamp nuts or screws 46, for clamping the screw 42 in position after the adjustment of the pins has been made.
  • the rods 21 must be accurately machined, so that the distance between the shoulders 24 and 25 is the same on all of the rods, and so that the length of the upper end of each of the rods is the same.
  • the pins 18 must also be carefully machined, so that they are all of the same length. I
  • the bridge 47 the cord or flange members of which project upwardly through the tile supporting table and are yieldingly held in their uppermost positions above the upper ends of the pins 18.
  • the bridge consists" of two cord or flange members 48, which are preferably made of fibrous mater'al, and two transverse mem bore 49, which, for the sake of rigidity, are preferably made of metal.
  • the transverse members are located near the ends of the cord members and the cord members may be rigidly secured thereto in any suitable manner.
  • the bridge is made tiltable by being held in the uppermost position by means of pins 18 yieldingly projected fingers 51, the lower ends of which extend through suitable apertures provided in the frame
  • Each finger is surrounded by a coiled spring 52, which operates between the frame 33 and an adjustable nut carried by the finger, and the upper end of each finger supports one of the transversely extending members a9 of the bridge, but is insulated therefrom by means of an insulating socket 53.
  • the fingers are preferably located centrally with relation to the members 19 and each member is provided with adjusting screws 54. which engage the lower faces of the chain support bars 14, and thereby limit the upward motion of the bridge.
  • the screws 5 1 are provided for the purpose of adjusting the position of the bridge to compensate for the wear of the fiber cord members. As illustrated, the cord members are located on the outside of the chains 9 and immediately adjacent to the depression 19 formed in the tile support plate.
  • a tile is moved, by the coiiperation of the conveyer and one of the conveyer bars 10, up onto the bridge and in position immediately over the depression 19 and the projecting ends of the pins 18.
  • the operating mechanism of the conveyor is so timed that the conveyor comes to rest when a tile is in position on the bridge and remains at rest until the tile has been tested.
  • the tile on the bridge is moved downwardly by means of clamping fingers 55 and is pressed into contact with supporting surfaces or edges provided on removable plates 56, which are so located as to form a portion of the tile way.
  • the tile is a perfect tile it will move all of the pins downwardly, so that their upper ends are flush with the tile supporting edges of the plates 56, and so that the rods 21 are moved out of metallic contact with both of the plates 26 and 27. If the tile is warped it will permit at least one of the pins to occupy its normal position, so that its corresponding rod 21 remains in metallic contact with the plate 26, or it will force at least one of the pins of the center set downwardly, so that its corresponding rod 21 is forced into metallic contact with the plate 27. This, as will hereinafter be described, will actuate the tile marking means and will indicate that the tile is warped a certain degree.
  • the degree of warpage indicated by each tile testing mechanism is determined by the relative positions of the plates 26 and 27 and the amount the pins 18 project above the surface of the tile supporting table, and may be varied by the screw 410, through the agency of the cap 13, as has been previously explained.
  • the cap 4-3 is preferably so graduated that the pins may be elevated relatively small amounts above the tile warping ways, such for example as two or three onethousandths of an inch.
  • the means employed in the illustrated machine for clamping the tiles in place on the plates 56 is similar to the means illustrated in the patent to which I have previously referred.
  • the fingers 55 are removably mounted on a plate 58 which is loosely mounted on the lower end of a reciprocating rod 59, shown broken away in Fig. 2.
  • the rod is actuated through the agency of a lever 61, a link 62 and a bell crank 63, by means of the driving shaft 6 1 of the machine.
  • the bell crank is operatively connected to the link 62 by means of a sleeve 60, mounted on the link and a spring restrained lost motion connection which is clearly described in the before mentioned patent and which prevents the clamp fingers 55 from exerting a breaking pressure on the tile.
  • the plates 56, against which the fingers 55 move a tile, during the testing operation, are removably secured in place on the frame 7 of the machine, so that they can be replaced by plates of different size when it is desired to test tile of different size.
  • the tile marking device employed with each of the testing devices 16 and 17 is similar to that disclosed in the patent, to which I have previously referred, and consists of a type bar 65, an actuating hammer 66 and an electro-magnet 67, which is mounted on the frame of the machine and receives actuating current from any suitable source of supply, such for example as a battery 68.
  • one terminal 69 of the battery is electrically connected to one terminal of each of the magnets by means of Wires 71.
  • Each of the other terminals of the electromagnets 67 is electrically connected by means of a wire 72 to a separate current interrupter, similar to the one illustrated in the patent to which I have referred.
  • Each current interrupter consists of a movable contact 73, to which the wire 72 is connected, and a stationary contact 7 1, which is electrically connected to both of the plates 26 and 27 of one of the corresponding testing mechanisms.
  • Each contact 7 3 is mounted on one of the sleeves 60, which forms a part of the spring restrained lost motion connection and which is actuatedby the bell crank 63 for the purpose of moving the fingers 55 into clamping engagement with the tile to be tested.
  • the contact 73 is so located that it moves into engagement with the contact 74 after the fingers 55 are in clamping engagement with the tile and in this way it completes the electrical connection between the plates 26 and 27 and the 'electro-magnet 67.
  • the plate 31 is electrically connected to the frame portion of the machine, which is electrically connected to the terminal 76 of the battery 68 by means of a wire 77.
  • current flows from the battery 68 through the winding of the electro-magnet 67, when the contact 7 3 is in engagement with the contact 7 1, provided one or more of the pin support rods 21 are moved into electrical contact with one or the other of the plates 26 or 27
  • the pin support rods complete the electrical connection between the plates 26 and 27 and the plate 31, which is shown connected to the frame 7 by a wire 78, and thereby complete the circuit through the frame 7 of the machine and the wire 77.
  • the grading mechanism 6 and the warpage testing mechanisms 16 and 17 are located equal distances apart and are so positioned along the frame 7 that the intermittently moving conveyor first moves atile along the tile way to the proper position with relation to the grading mechanism 6, where it remains stationary during the sizing operation.
  • the tile is then moved by the conveyor to the warpage testing mechanism 16, where it remains stationary during the testing operation, and after it has been tested it is moved to the mechanism 17 which is so adjusted that it will indicate tile war-page not indicated by the mechanism 16.
  • the tile continues its intermittent motion along the frame of the machine after it leaves the mechanism 17 and is finally received, at the tile delivery end of the machine, by the operator or by mechanical means provided for receiving the tile as they are delivered.
  • the relative positions of the grading and testing mechanisms determines the length of each forward movement of the conveyor and consequently means similar to those illustrated in the patent, to which I have previously referred, are provided for varying the amount of motion transmitted-to the conveyer during each of its forward movements. I find it convenient to so proportion the movement of the con-1 usted positions.
  • each tile traversing the machine besides stopping at each of the mechanisms 6, l6 and 17, will stop midway between the grading mechanism 6 and the testing mechanism l6 and midway between the mechanisms 16 and 17, as it, moves along the machine.
  • the tile bars 10 are so spaced along the conveyer that tile on the conveyer will be simultaneously located in the proper operative positions relatively to the grading mechanism and to each of the testing mechanisms.
  • any suitable means may be provided for securing the plates 82 and the shiftable portions of the plate 15 to the frame 7, so that they can be adjusted longitudinally of the frame.
  • the apparatus illustrated I have employed counter-sunk screw-headed bolts for this purpose, which extend through longitudinal slots provided in the frame.
  • the tile grading mechanism 6 is also capable of being shifted longitudinallv of the machine, so that the distance between it and the mechanism 16 can be varied to accommodate the variations in the length of the chains 19. This is accomplished by providing longitudinally extending slots on I,
  • the type bar operating rods 86 are also made adjustable to accommodate the movement of the mechanisms 8 and 17 I have found that it is unnecessary to vary the position of the fulcrum point of the bell crank 63, which operates the plate 58 and the fingers of the mechanism 17, since the connection between the bell crank and the lever 61 is sufliciently flexible to permit the mechanism 17 to be moved to adjusted positions without in any way affecting the operation of the apparatus.
  • the means includes an extensible connecting rod 87, which is employed for actuating the bell crank (33 of the mechanism 16 and which is pivotally con nected to the bell crank and to the crank disk 88, carried by the driving shaft 64L.
  • an extensible connecting rod 87 which is employed for actuating the bell crank (33 of the mechanism 16 and which is pivotally con nected to the bell crank and to the crank disk 88, carried by the driving shaft 64L.
  • Tile to be graded are placed on the intermittently moving conveyer so that one edge of each tile is engaged by one of the tile bars 10.
  • the conveyer operates so that it moves each tile to a position under the grading mechanism and opposite to the end of the grading finger 8. hen a tile is in this position the finger moves into contact with one of its edges, and the mechanism operates to indicate the size of the tile.
  • the conveyer advances and moves it onto the bridge and over the pins 18 of the mechanism 16. This movement of the conveyer also advances another tile to position under the grading mechanisms and the machine operates to grade a tile during the time it operates to test the first tile for warpage.
  • the tile on the bridge is first engaged by the fingers 55 and is then moved downwardly against the edges of the plates 56 and in contact with the upper ends of the pins 18.
  • the contact 73 is moved into contact with the contact 74, so that one or another of the rods 21 may complete the operating circuit of the electromagnet 67 by remaining in contact with the plate 26 or engaging plate 27. If the circuit is completed the electro-magnet aetuates its armature and stamps the tile to indicate that it is warped to a marked degree.
  • the conveyer then advances the first tile until it is moved onto the bridge of the mechanism l7.
  • the conveyer moves a tile under the grading mechanism 6 and advances a tile, which has been graded, to a position on the bridge of the mechanism 16.
  • the operation of the mechanism 17 is similar to that of the mechanism 16, except that it is so adjusted that it indicates tile which are warped a less amount than will be indicated by the mechanism 16. After the tile has been tested by the mechanism 17 it is moved toward the delivery end of the machine, and other tile are moved to position on the bridge of the mechanism.
  • the driving mechanisms of the tile grading and warpage testing mechanisms are so arranged that the mechanisms operate simultaneously and consequently the machine illustrated, in effect, grades and tests a tile for warpage each time the conveyer is zulvanced.
  • a way along which tile are movable, separate warpage testing mechanisms located along the way, for simultaneously grading tile in accordance with their various degrees of warpage a conveyer for moving tile along the way, into engagement with one mechanism and then the other and for simultaneously moving a tile into engagement with each mechanism, driving means for periodically actuating the conveyer, separate clamping means for forcing each tile into engagement with each of said mechanisms, and means actuated by said driving means for periodically and simultaneously actuating each clamping means during periods of rest of the conveyer.
  • means for grading tile in accordance with the degree of their warpage comprising a mechanism for indicating a determined degree of warpage, a second mechanism for indicating a diflerent determined degree of warpage from that indicated by the first mechanism and means for simultaneously moving a tile into engagement with each mechanism.
  • means for grading tile in accordance with the degree of their warpage comprising, cooperating sets of movable pins for engaging the tile, a separate indicating mechanism controlled by each. set of pins and periodically moving means for moving tile to be tested into engagement with one and then the other of said sets of pins.
  • I11 an apparatus of the character described, means for grading tile in accordance with the degree of their warpage, comprising two sets of movable pins for engaging the tile, a separate indicating mechanism controlled by each set of pins, and periodically moving means for moving tile to be tested into engagement with one and then the other of said sets of pins and for simultaneously moving tile into operative posi tions with relation to each set of pins.
  • warpage testing means comprising separate cooperating sets of movable pins for engaging the tile, separate indicating mechanisms controlled by each set of pins, means for moving tile to be tested into engagement with one and then the other set of pins and separate sets of reciprocable fingers for simultaneously pressing til-e into engagement with each set of pins during the testing operation.
  • means for grading tile in accordance with the degree of their warpage comprising separate sets of movable pins for engaging tile to be tested, a separate indicating mechanism controlled by each set of pins, means for moving the tile to be tested into engagement with one and then the other of said sets of pins and for simultaneously moving tile into operative positions with relation to each set of pins and a separate periodically moving means for pressing tile into engagement with each set of pins.
  • a separate indicating mechanism for each set of pins an intermittently moving conveyer for moving tile from an operative position, with relation to one set of pins, to an operative position with relation tothe other set, a sepa rate device for pressing tile, moved by the conveyer, into engagement with each set of pins during periods of rest of the conveyer, means for intermittently moving the conveyer, means for periodically actuating said devices, separate electrical devices controlled respectively by each set of pins for actuating each its respective warpage indicating mechanism, electric circuits including said pins and said devices, a circuit interrupter included in each circuit and means for moving said interru iters to circuit closing positions during periods of rest of said conveyer.
  • a machine for testing the warpage of tile a way along which tile are movable, separate tile supports located at intervals along the way, separate sets of cooperating pins adapted to be engaged by tile on each support, a conveyer for advancing tile along the way, means for intermittently moving the conveyer, separate devices for pressing tile against the supports and into engagement with the pins, means for simultaneously actuating said devices during periods of rest of the conveyer, a war-page testing indicating mechanism for each set of pins, a separate electrical device controlled by each set of pins for actuating each mechanism, a separate electric circuit including pins of each set and each electrical device, a separate current interrupter located in each circuit, and means for simultaneously moving said interrupters to circuit closing posi tions during periods of rest of the conveyer.
  • a machine for testing tile comprising, a tile way along which tile are movable, warpage indicating pins n-ojecting upwardly through the way, yieldingly supported means for guiding tile moving along the way to positions above the projecting ends of the pins and means for depressing said yieldingly supported means and moving the tile into engagement with the pins.
  • a tile way means for moving tile along the way, a pin projecting upwardly through the way, a movable bridge, yieldingly projected above the projecting end of the pin, for guiding tile traversing the way to a position above the pin, and means for depressing the bridge and thereby moving the tile downwardly into engagement with the pin.
  • a tile way a tile support, means for moving tile along the way, a movable bridge, located in the path of travel of tile on the way, for guiding the tile to a position above the support, yielding supports for the bridge and means for depressing the bridge and moving the tile onto the support.
  • a tile support In an apparatus of the character described, a tile support, a pin projecting therethrough, a movable bridge for guiding tile to a position above the support and the projecting end of the pin, means for yieldingly supporting the bridge, means for mov-' ing a tile onto the bridge and means for engaging a tile on the bridge and for depressing the bridge and thereby pressing the tile down against the support.
  • a tile support In an apparatus of the character described, a tile support, a pin projecting above the support, means for moving tile along the support, a tiltable bridge for guiding tile to positions above the support, means for yieldingly supporting the bridge and means for moving the bridge and pressing the tile supported thereon against the support.
  • a tile way a tile support, means for moving tile along the way, a pin projecting upwardly through the support, a bridge for guiding tile traversing the way to a position above the support, and comprising longitudinally extending tile supporting members which project upwardly through the support, and transversely extending end members secured to the longitudinal members, yieldingly mounted pins on which the end members are loosely supported and means for engaging a tile on the bridge, depressing the bridge and pressing the tile engaged against the support.
  • a tile way means for moving tile along the way, a tile support, pins projecting upwardly through the support, a bridge having tile supporting members projecting upwardly through the support, for guiding the tiles to a position above the pins, yieldingly mounted pins on which said bridge is loosely mounted and means for pressing a tile on the bridge against the support and into engagement with the pins.
  • a tile support In a warpage testing mechanism, a tile support, pins projecting beyond the tile supporting surface of the support and capable of being engaged by a tile located on the support, yieldingly supported rods on which said pins are mounted, plates for limiting the motion of the rods, a warpage indicating mechanism, an electrical device for actuating said mechanism, and a circuit including said rods, said plates and said electrical device.
  • a tile support In a warpage indicating machine, a tile support, a pin projecting above the surface of the support and adapted to be engaged by a tile passing over the support, a rod on which said pin is mounted, adj ustable plates located adjacent to said pin and adapted to movably mount said rod and to limit the motion of said rod, said rod being electrically insulated from said plates for intermediate positions of its movement, means for yieldingly holding the rod into electrical contact with one of said plates, a warpage indicating mechanism, an electrical device for actuating said mechanism and a circuit including said plates, said rod and said electrical device.
  • a pin In a warpage indicating device, a pin, a support rod for the pin, having plate engaging shoulders formed thereon, plates through which said rod projects, means adapted to yieldingly maintain said rod in contact with one of said plates, and means for varying the positions of the plates relatively to each other for the purpose of adjusting the position of the rod and pin.
  • a warpage indicating device a frame, a warpage indicating pin, a support rod for the pin having plate engaging shoulders, plates movably mounted on the frame for limiting the motion of the rod, guides for the plates, means for moving the plates in the same direction along the guides or for moving the plates in opposite directions along the guides for the purpose of adjusting the position of the pin.
  • a tile way a conveyer for moving tile along the way, a plurality of warpage testing mechanisms located at intervals along the way, each mechanism being ad justed to respond to a different degree of tile warpage, indicating devices controlled by the mechanisms, means for intermittently moving the conveyer and means for simul taneously actuating all of said mechanisms during periods of rest of the conveyer.
  • a way along which tile are movable two sets of war-page testing pins located along the way, a separate indicating device controlled by each set of pins, an intermittently movable conveyer for moving tile along the way and for simultaneously moving a tile to a testing position, with relation to each set of pins, and separate periodically moving means for simultaneously pressing a tile onto each set of pins during periods of rest of said conveyer.
  • a way along which tile to be tested are movable, two sets of movable warpage testing pins spaced along the way, an electrically actuated indicating device controlled by each set of pins, an intermittently moving conveyer for moving tile along the way and for simultaneously moving a tile into testing position, with relation to each set of pins, a separate set of periodically moving fingers for simultaneously pressing a tile against each set of pins during periods of rest of said conveyer, and an electric circuit controlled by each set of pins, including the corresponding indicating device and a circuit breaker included in each circuit and actuated by the operating means of the cor responding set of fingers.
  • a warpage testing mechanism a tile support, a plurality of movable pins projecting beyond the tile-supporting surface of the support and capable of being engaged by a tile located on the support, a warpage indicating mechanism, an electrical device for actuating the mechanism, an electric circuit for controlling the operation of the device, a make and break device for controlling the operation of the circuit, periodically actuated fingers for pressing tile to be tested against the support and against said movable pins, means for actuating said fingers and for actuating said make and break device, a yielding support for each pin included in said electric circuit, and means,'included in said circuit for limiting the motion of the pins, said means being electrically insulated from the pin supports, when the pins are located in an intermediate position, and in electrical contact with the supports when the pins are located at one extreme position or the other.
  • a support for engaging the edges of tiles to be tested, a plurality of movable pins for engaging the edges of the supported face of a tile engaged by the support, a movable bridge located adjacent to the support, a conveyer for moving tile onto the bridge, means for pressing tile on the bridge against the support and into engagement with said pins, means for intermittently actuating the conveyer, means for actuating said tile pressing means during periods of rest of the conveyer and an indicating mechanism controlled by said means.
  • a sizing mechanism for tile a warpage testing mechanism for indicating a determined degree of tile warpage, a second warpage testing mechanism for indicatinga different degree of warpage from that indicated by the first warpage testing mechanism, periodically moving means for moving tile to'be tested into engagement with one and then the other of said mechanisms and for simultaneously moving tile into engagement with each of said mechanisms and' means for simultaneously actuating all Of said mechanisms during periods of rest of said tile moving means.
  • a way along which tile are movable two sets of movable pins projecting above the way and in the path of tile traveling along the way, a separate movable bridge for guiding tile to a position above each set of pins, an electric circuit controlled by each set of pins, an electrically actuated indicat ing device controlled by each circuit, an intermittently moving conveyer for conveying tile along the way from one set of pins to the other and for simultaneously moving a tile in position on each bridge, a separate set of periodically moving fingers for engaging a tile located on each bridge and for pressing it downwardly against the corresponding set of pins, a circuit breaker in cluded in said circuit, and means, actuated by the actuating means of said fingers, for
  • a support for tile to be tested a pin projecting above said support and movable to a position below the support, means yieldingly projected above the support and above the projecting end of said pin, for supporting tile above the support and above the projecting end of the pin, motion limiting means for said pin, an indicating device, an electrically actuated device for actuating said indicating device, an electric circuit including said electric device and controlled by the cooperation of said motion limiting means and said pin, and means for engaging a tile on said yieldingly projecting means and for moving it into engagement with said pin and ontosaid support.
  • a support for tile to be tested a set of movable pins for engaging the edges only of a tile to be tested and projecting above the tile supporting face of said support and capable of being moved by a tile on the support below the supporting face of the support, a separate movable support rod for each pm, oppositely located plates for limiting the motion of said rods and for contacting with the rods when they are in one extreme position or the other, an indicating device, electrical means for actuating said device, and an electric circuit for controlling the operation of said means, including both of said plates, said rods being located in series in said circuit and adapted to close said circult by engaging one or the other of said plates when controlled by said pins.
  • a tile support a set of movable pins projecting above the support and capable of being moved to a position below the support by a tile on the support, a separate support rod for each pin, oppositely located plates for engaging the support rods and for limiting the motion of the pins in both directions, an indicating device, electrical means for actuating said device, an electric circuit for controlling the operation of said electrical means, and including said plates and said support rods, said support rods being so arranged that each rod is capable of closing the circuit When in engagement with one or the other of said plates, and means for adjusting the positions of the plates relatively to each other, for varying the position of the support rods.
  • a Warpage indicating device a Way along which tile are movable, a tile support located on the Way, a pin projecting above the tile support and capable of being moved by a tile on the support to a position below the tile supporting face of the support, a movable bridge, projecting beyond the tile Way, for guiding a tile to a position'above the support and above the projecting end of the pin, a movable support rod for the pin, motion limiting plates for limiting the mo tion of the support rod and the pm, an indicating device, means, controlled by the E. W. MCCALLISTER, WV. THORNTON Boenn'r.

Description

.C. F. KOCH.
TILE SIZING AND GRADING MACHINE.
APPLICATION FILED SEPT.-25, I9I2- Patented A11 8, 1.916.
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C. F. KOCH.
TILE SiZING AND GRADING MACHINE.
APPLICATiON FILED SEPT. 25. 1912.
Patelited Aug. 8, 1916.
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C. F. KGCH.
TILE SIZING AND GRADING MACHINE.
APPLICATION FILED SEPT. 25; 1912- 1 ,1 94,035. PatGntGdAug. 8,1916.
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CHARLES F. KOCH,
OF CINCINNATI,
OHIO.
TILE SIZING AND GRADING MACHINE.
Specification of Letters Patent.
Patented Arn 8, H916.
Application filed September 25, 1912. Serial No. 722,198.
To all 10 from it may concern:
Be it known that I, CHARLES'F. Keen, a citizen of the United States of America, and resident of Cincinnati, county of Hamilton, and State of Ohio, have invented certain new and useful Improvements in Tile Sizing and Grading Machines, of which the following is a specification.
This invention relates to tile grading and war-page testing ma chines and has for an obj ect to produce a new and improved machine of the character illustrated in Patent 1,066,239 issued to lVilliam K. Achert.
A further object is to produce a tile grading and warpage testing machine in which means are employed for indicating different degrees of warpage or for grading the tile in accordance with the degree of war-page.
These and other objects I attain in a ma chine embodying the features herein described, and illustrated in the drawings accompanying and forming a part of this application.
In the drawings; Figure 1 is a side elevation of a machine embodying my invention. Fig. 2 is a fragmental sectional view along the line 2-2 of Fig. 1. Fig. 3 is a sectional View along the line 3--3 of Fig. 1, and is shown in connection with a fragmental plan view of the tile supporting table and conveyer. Fig. 4 is a fragmental sectional view along the line 4-t of Fig. 3, portions being broken away and omitted, for convenience of illustration.
The apparatus illustrated as an embodiment of my invention includes a tile-grading mechanism, similar to that disclosed in the patent to which I have referred; it also ineludes two separate mechanisms for testing the tiles for warpage, and a conveyer for moving the tiles to be tested, along the machine, so that they are first engaged by the grading mechanism and are then engaged by the successive warpagetesting mechanisms.
Referring more particularly to the drawings, throughout the separate views of which like numerals indicate the same parts: The tile-grading mechanism 6 illustrated, is mounted on the frame 7 of the machine in such a position, that its reciprocating finger S is moved into engagement with the edges of tiles traversing the tile way or tile supporting table of the machine, An endless conveyer 9 is provided for moving tile along the way, and, as illustrated, consists of two separate chains, which are secured together 'warped a marked amount.
by means of tile bars 10, and are mounted on rotatable gear wheels 12, journaled on the frame portion of the machine. The upper leg of each chain is located in a slot 13, formed on the frame portion, and is supported by a chain support bar or guide 14,
similar to those illustrated. in the above 'i'nentioned patent, for imparting lnterniittent motion to the conveyer, but it will be understood. that other and various means may be employed for imparting the desired motion to the corweycr.
The grading mechanism 6, illustrated, is adapted to stamp each tile graded by it and to indicate by a characteristic mark the size of the tile. Various means may, however, be employed for indicating the size of the tile and it is not essential that they be stamped or marked. After the tile have been engaged by the finger 8 of the grading mechanism and have been stamped for the purpose of indicating their size, they are conveyed to a warpage testing mechanism 16, with which the machine is provided.
The mechanism 16 is preferably so adjusted that it will only indicate tiles which are After each tile has been tested by the mechanism 16, it is conveyed along the machine to the warpage testing mechanism 17, which is similar to ad-' the mechanism 16, but is preferably so justed that it will indicate tile which are slightly warped or are warped to a less degree than those indicated by the mechanism 16. It will be understood that any number of warpag'e testing mechanisms may be employed and that each mechanism may be ad jnsted so as .to indicate a di'llercnt degree of tile warpage and that they may occupy any desired position along the tile way with relation to each other, and with relation to the tile grading mechanism 6. With the arrangement of warpage testing mechanisms illustrated, the machine is capable of class ing the tiles, tested by it, in three classes; that is, perfect tile, tile warped a slight amount, and tile warped an objectirmable amount. Various means may be employed for indicating to which class each tile belongs, but in the drawings 1 have provided means for stamping and characteristically marking the warped tiles, so that tiles warped a small amount may be readily distinguished from those warped an objectionable amount.
As illustrated, the tile warpage testing mechanisms are similar to each other and consequently only one will be described in detail. Each warpage testing mechanism includes a series of movable pins 18, which extend upwardly through the table 7 and are adapted to be engaged and moved by a tile during the operation of testing it for warpage. The tile supporting plate 15 is cut away to form a depression 19 which is so located that it is bridged by the tile during the testing operation; that is, during the operation of pressing the tile against the projecting points of the pins. Each mechanism also includes means for clamping or holding the tile in place on the tile way, during the testing operation, and means controlled by the pins for indicating warpage of the tile.
My invention contemplates employing a plurality of the pins 18 and so arranging them that they engage each tile tested, at points near its edges. As illustrated, the pins are divided into three sets; two end sets and an intermediate set. Three pins are included in each end set and are located on each side of the tile support plate 15, so that they project through portions of the tile way, which form the stationary abutments, against which the ends of the tile are pressed during the testing operation. Two pins 18 are included in the intermediate set and they project upwardly through the depressed portion of the tile plate 15 and are preferably located midway between the outer sets of pins and in such positions that they engage each tile tested at points located near the lateral edges of the tile. It will be understood that no center pin is employed, and that consequently, the machine indicates warpage at the edges of the tile only. Tiles warped a slight amount in the centers only and having unwarped edges are not considered objectionable since such warpage is not apparent and is therefore not detrimental. For this reason my machine is an improvement over machines employing center pins, since a slight amount of warpage at the center of a tile will cause such machines to indicate that the tile is warped an objectionable amount, when in fact it is as good as a perfect tile for all practical purposes. Tiles warped an objectionable amount at the center are bound to be warped along one of their edges, and consequently will be indicated as warped tile by my machine.
The pins 18 are so arranged that each pin operates, during the testing operation, to complete an electric circuit, when it is moved down a pre-determined amount by the tile tested, or when it is not engaged by the tile or is not moved from its normal or upper position.
Each pin 18 is supported on the upper end of a pin support rod 21 and is held in place by means of a block 22, which is firmly secured on the pin and forms a removable cap for the supporting rod, since it is provided with an aperture or way into which the upper end of the support rod projects. Each block 22 is also provided with a sight hole 23, which exposes the point of contact between the pin and the support rod, and therefore discloses Whether the pin is in positive engagement with the bar 21 or is moved out of the proper position relatively thereto, by dirt or other foreign material.
The longitudinal motion of the pin supporting rods 21, occasioned by pressure of tile on the ends of the pins 18 during the testing operation, is limited by means of plates 26 and 27 through which each rod 21 projects. Each rod 21 is reduced in diameter at its upper and lower ends, so as to provide the shoulders 21 and 25, which respectively engage the plates 26 and 27 and thereby limit the motion of the rods. The plate 26 is provided with suitably located apertures, of such diameter that the upper ends, or reduced portions of the rods 21 may pass freely through them without contacting with the plate. The apertures, however, are not large enough to permit the larger portions of the rods to pass therethrough, and consequently the shoulders 2 1 are normally held against the plate by means of coiled springs 28, each of which surrounds the lower reduced portion of one of the rods 21 and is located between a collar 29 on the rod and a plate 31, which is suspended from the plate 27, but is insulated therefrom. The lower ends of the rods 21 extend through apertures formed in the plate 27 which, like the apertures in the plate 26, permit the reduced portion of the rod to pass freely therethrough without contacting with the plate, but they are not of suliicient size to permit the larger portion of the rod to pass. WVith this arrangement the shoulders 25 of the rods contact with the plate 27 when the pins 18 are moved downwardly, and the plate 27 there fore limits the downward motion of the pins. Each of the plates 26 and 27 is provided with a sheet 32 of insulating material, through which the reduced portions of the rods 21 project and which is employed for the purpose of holding the rods centrally with relation to the apertures in the plate, to which it is secured, and to thereby prevent the reduced portions from contacting with the plates. The plates 26 and 27 are movable toward and away from each other, so that the positions of the pins 18 above the surface of the tile way may be varied, and so that the amount which each pin is capable of moving without forcing the shoulder 25 of its corresponding support rod into contact with the plate 27, may be varied.
The plates 28 and 27 are mounted on the frame portion of the machine in the following manner: A frame 33 is secured to the frame portion 7 by means of bolts 34 and is insulated from the frame portion by means of insulating sleeve-washers 35, which surround the shank portions of the bolts and are located between the bolts and the plate, as illustrated in Fig. 2. Two depending bolts 36 are secured on opposite sidesof the frame 33, and support a plate 37, which extends transversely of the frame 7 of the machine. Each bolt 36 extends through each of the plates 26 and 27 and forms guides for the plates as they are moved toward and away from each other. Sleeves 38 are rigidly secured to the plate 26 and, extending along the bolts, form a guide for the plate during its motion along the bolt, and also aid in holding it firmly in a horizontal position. Two sleeves 39 are secured to the plate 27, and each sleeve is located concentric with one of the bolts 36, surrounds, and slides upon one of the sleeves 38. In this manner the motion of the plate 27 is guided and the plate is held firmly in a horizontal position.
The plates 26 and 27 are moved along their supporting bolts by means of a screw bar 40, which is provided with two sets of oppositely located screw threads, one set of which engages a suitably threaded aperture 41 in the plate 26 and the other of which engages a similar aperture 41 in the plate 27. (See Figs. 2 and 4.) The screw threads are so arranged on the bar 40 that the plates 26 and 27 are moved equal amounts in opposite directions when the bar is turned. (The bar 40 is broken away in Fig. 4 and a portion is omitted from the drawing for convenience of illustration.) The lower end of the bar is not provided with screw threads and it projects through a longitudinall extending aperture, formed in a screw 42, and is provided at its lower end with a cap 43, which is provided with a graduated scale, as shown in Fig. 2. The rod 40 is also provided with an integrally formed collar 4-4, which is adapted to rest upon the upper end of the screw 42 and to thereby support the rod on the screw 42. The screw 42 is screwed into a suitably threaded aperture in the plate 37 and as shown, is provided at its lower end with a capstan head 45, which is located adjacent to the cap 43.
The operation of adjusting the pins 18 is as follows: The screw-bar 40 is turned, by means of its cap 43, so that the plates 26 and 27 move toward each other and respectively engage the shoulders 24 and 25 formed on the rods 21. This clamps the rods in place and holds them rigid with respect to the plates, so that they will move up or down with the plates, as the plates are moved in the same direction. The screw 42 is then turned in the proper direction, so that it raises or lowers the plates 26 and 27, through the agency of the collar 4!: and rod 40, both of which remain stationary, relatively to the plates, until the pins 18 are moved to a position, such that their upper ends are flush with the tile si'lpporting surfaces of the ways, The screw 42 is then clamped in position and the pins 18 are projected the desired amount above the tile supporting surface of the way by turning the screw 40, so as to move the plates 26 and 27 apart. This motion of the plates permits the rods 21 to move upwardly with the plate 26 in response to the pressure of their springs 28 and also renders it possible to move each pin 18 and its rod 21 downwardly, an amount equal to twice the length of the projecting upper end of the pin. In the apparatus illustrated the aperture formed in the plate 37, and through which the screw 42 extends, is slotted on diametrically opposite sides and the plate is provided with the usual clamp nuts or screws 46, for clamping the screw 42 in position after the adjustment of the pins has been made. It will of course be understood that the rods 21 must be accurately machined, so that the distance between the shoulders 24 and 25 is the same on all of the rods, and so that the length of the upper end of each of the rods is the same. The pins 18 must also be carefully machined, so that they are all of the same length. I
The upper projecting ends of the would prevent the tiles'from being moved along the tile way and into position over the depression 19, unless means were provided for raising the tiles so that they clear the pins as they are moved to position across the depression 19. In the machine illustrated I have provided a bridge 47, the cord or flange members of which project upwardly through the tile supporting table and are yieldingly held in their uppermost positions above the upper ends of the pins 18. As illustrated, the bridge consists" of two cord or flange members 48, which are preferably made of fibrous mater'al, and two transverse mem bore 49, which, for the sake of rigidity, are preferably made of metal. The transverse members are located near the ends of the cord members and the cord members may be rigidly secured thereto in any suitable manner. The bridge is made tiltable by being held in the uppermost position by means of pins 18 yieldingly projected fingers 51, the lower ends of which extend through suitable apertures provided in the frame Each finger is surrounded by a coiled spring 52, which operates between the frame 33 and an adjustable nut carried by the finger, and the upper end of each finger supports one of the transversely extending members a9 of the bridge, but is insulated therefrom by means of an insulating socket 53. The fingers are preferably located centrally with relation to the members 19 and each member is provided with adjusting screws 54. which engage the lower faces of the chain support bars 14, and thereby limit the upward motion of the bridge. The screws 5 1 are provided for the purpose of adjusting the position of the bridge to compensate for the wear of the fiber cord members. As illustrated, the cord members are located on the outside of the chains 9 and immediately adjacent to the depression 19 formed in the tile support plate.
During the operation of the machine a tile is moved, by the coiiperation of the conveyer and one of the conveyer bars 10, up onto the bridge and in position immediately over the depression 19 and the projecting ends of the pins 18. The operating mechanism of the conveyor is so timed that the conveyor comes to rest when a tile is in position on the bridge and remains at rest until the tile has been tested. During the testing operation the tile on the bridge is moved downwardly by means of clamping fingers 55 and is pressed into contact with supporting surfaces or edges provided on removable plates 56, which are so located as to form a portion of the tile way. If the tile is a perfect tile it will move all of the pins downwardly, so that their upper ends are flush with the tile supporting edges of the plates 56, and so that the rods 21 are moved out of metallic contact with both of the plates 26 and 27. If the tile is warped it will permit at least one of the pins to occupy its normal position, so that its corresponding rod 21 remains in metallic contact with the plate 26, or it will force at least one of the pins of the center set downwardly, so that its corresponding rod 21 is forced into metallic contact with the plate 27. This, as will hereinafter be described, will actuate the tile marking means and will indicate that the tile is warped a certain degree. The degree of warpage indicated by each tile testing mechanism is determined by the relative positions of the plates 26 and 27 and the amount the pins 18 project above the surface of the tile supporting table, and may be varied by the screw 410, through the agency of the cap 13, as has been previously explained. The cap 4-3 is preferably so graduated that the pins may be elevated relatively small amounts above the tile warping ways, such for example as two or three onethousandths of an inch.
The means employed in the illustrated machine for clamping the tiles in place on the plates 56 is similar to the means illustrated in the patent to which I have previously referred. The fingers 55 are removably mounted on a plate 58 which is loosely mounted on the lower end of a reciprocating rod 59, shown broken away in Fig. 2. The rod is actuated through the agency of a lever 61, a link 62 and a bell crank 63, by means of the driving shaft 6 1 of the machine. The bell crank is operatively connected to the link 62 by means of a sleeve 60, mounted on the link and a spring restrained lost motion connection which is clearly described in the before mentioned patent and which prevents the clamp fingers 55 from exerting a breaking pressure on the tile.
The plates 56, against which the fingers 55 move a tile, during the testing operation, are removably secured in place on the frame 7 of the machine, so that they can be replaced by plates of different size when it is desired to test tile of different size.
The tile marking device employed with each of the testing devices 16 and 17 is similar to that disclosed in the patent, to which I have previously referred, and consists of a type bar 65, an actuating hammer 66 and an electro-magnet 67, which is mounted on the frame of the machine and receives actuating current from any suitable source of supply, such for example as a battery 68.
As illustrated, one terminal 69 of the battery is electrically connected to one terminal of each of the magnets by means of Wires 71. Each of the other terminals of the electromagnets 67 is electrically connected by means of a wire 72 to a separate current interrupter, similar to the one illustrated in the patent to which I have referred.
Each current interrupter consists of a movable contact 73, to which the wire 72 is connected, and a stationary contact 7 1, which is electrically connected to both of the plates 26 and 27 of one of the corresponding testing mechanisms. Each contact 7 3 is mounted on one of the sleeves 60, which forms a part of the spring restrained lost motion connection and which is actuatedby the bell crank 63 for the purpose of moving the fingers 55 into clamping engagement with the tile to be tested. The contact 73 is so located that it moves into engagement with the contact 74 after the fingers 55 are in clamping engagement with the tile and in this way it completes the electrical connection between the plates 26 and 27 and the 'electro-magnet 67. The plate 31 is electrically connected to the frame portion of the machine, which is electrically connected to the terminal 76 of the battery 68 by means of a wire 77. During the testing operation current flows from the battery 68 through the winding of the electro-magnet 67, when the contact 7 3 is in engagement with the contact 7 1, provided one or more of the pin support rods 21 are moved into electrical contact with one or the other of the plates 26 or 27 The pin support rods complete the electrical connection between the plates 26 and 27 and the plate 31, which is shown connected to the frame 7 by a wire 78, and thereby complete the circuit through the frame 7 of the machine and the wire 77.
hen a warped tile is tested and one or more of the pins 18 remain in their uppermost position, or are forced by the tile to their lowest position, one or the other, or both, of the plates 26 and 27 are placed in metallic circuit with the frame 7 by means of their engagement with the shoulders of the pin-supporting rods 21, and through the agency of the wire 77; consequently current flows from the battery 68 through one of the wires 71, the winding of the corresponding electro-magnct 67, the corresponding wire 72, the contacts 73 and 74:, one or the other or both of the plates 26 and 27, the plate 31, and the wire 78, back to the battery. This completes the operating circuit of the electro-magnet 67 and causes it to actuate the warpage indicating mechanism, it being understood that the contact 73 of the circuit breaker is moved into engagement with the contact 74.
The grading mechanism 6 and the warpage testing mechanisms 16 and 17 are located equal distances apart and are so positioned along the frame 7 that the intermittently moving conveyor first moves atile along the tile way to the proper position with relation to the grading mechanism 6, where it remains stationary during the sizing operation. The tile is then moved by the conveyor to the warpage testing mechanism 16, where it remains stationary during the testing operation, and after it has been tested it is moved to the mechanism 17 which is so adjusted that it will indicate tile war-page not indicated by the mechanism 16. The tile continues its intermittent motion along the frame of the machine after it leaves the mechanism 17 and is finally received, at the tile delivery end of the machine, by the operator or by mechanical means provided for receiving the tile as they are delivered. The relative positions of the grading and testing mechanisms determines the length of each forward movement of the conveyor and consequently means similar to those illustrated in the patent, to which I have previously referred, are provided for varying the amount of motion transmitted-to the conveyer during each of its forward movements. I find it convenient to so proportion the movement of the con-1 usted positions.
veyer that each tile traversing the machine, besides stopping at each of the mechanisms 6, l6 and 17, will stop midway between the grading mechanism 6 and the testing mechanism l6 and midway between the mechanisms 16 and 17, as it, moves along the machine. The tile bars 10 are so spaced along the conveyer that tile on the conveyer will be simultaneously located in the proper operative positions relatively to the grading mechanism and to each of the testing mechanisms.
In order to provide for wear, which may be encountered between the links of the conveyer chains 9, and the consequent lengthening of the distances between the tile bars 10 on the conveyer, I have provided means for shifting the positions of the grading mechanism 6, and the warpage testing mechanism 17 with relation to the warp-age testing mechanism 16. As illustrated, longitudinally extending slots 80 are provided in the frame 7 of the machine for receiving the bolts which secure the yoke 81 to the frame, (see Fig. 3) and similar slots are also provided in the frame for the bolts 34, so
that the tile clamping devices and the plates 26 and 27, together with the cooperating parts of the mechanism 17 may be shifted to different positions along the frame and then rigidly secured in place in their ad- With such a constructlon it is necessary to provide means for varying the positions of the apertures through which the upper ends of the pins 18 project, so that the pins may be maintained vertically in all adjustments of the plates 26 and 27. This is accomplished in the illustrated apparatus by providing shiftable plates or strips 82 which extend from a point indicated at 83 in Fig. 3, to the rear or tile delivery end of the machine. The plates 56 are mounted on the plates 82 and are consequently shiftable with them. The plate 15, along which the tile move during the operation of themachine, is also cut at some point, as is indicated at 85 in Fig. 3 and the rear portion of it is capable of being adjusted longitudinally of the frame for the purpose of maintaining the intermediate set of pins 18 in the proper position. Any suitable means may be provided for securing the plates 82 and the shiftable portions of the plate 15 to the frame 7, so that they can be adjusted longitudinally of the frame. In the apparatus illustrated I have employed counter-sunk screw-headed bolts for this purpose, which extend through longitudinal slots provided in the frame. The tile grading mechanism 6 is also capable of being shifted longitudinallv of the machine, so that the distance between it and the mechanism 16 can be varied to accommodate the variations in the length of the chains 19. This is accomplished by providing longitudinally extending slots on I,
the frame 7, through which the holding bolts of the mechanism 6 extend. The type bar operating rods 86, fully described in the patent to which reference has been made, are also made adjustable to accommodate the movement of the mechanisms 8 and 17 I have found that it is unnecessary to vary the position of the fulcrum point of the bell crank 63, which operates the plate 58 and the fingers of the mechanism 17, since the connection between the bell crank and the lever 61 is sufliciently flexible to permit the mechanism 17 to be moved to adjusted positions without in any way affecting the operation of the apparatus.
I11 Fig. 1 I have shown an improved means for varying the pressure transmitted by the fingers 55 of the two clamping plates 58. The means, as illustrated, includes an extensible connecting rod 87, which is employed for actuating the bell crank (33 of the mechanism 16 and which is pivotally con nected to the bell crank and to the crank disk 88, carried by the driving shaft 64L. By varying the length of the connecting rod 87 the positions of both of the sleeves are va- -ried relatively to their mounting 1inks62,
and consequently the tension of the restraining springs with which they cooperate is also varied.
The operation of the apparatus is somewhat as follows: Tile to be graded are placed on the intermittently moving conveyer so that one edge of each tile is engaged by one of the tile bars 10. The conveyer operates so that it moves each tile to a position under the grading mechanism and opposite to the end of the grading finger 8. hen a tile is in this position the finger moves into contact with one of its edges, and the mechanism operates to indicate the size of the tile. After the tile has been marked by the grading mechanism, the conveyer advances and moves it onto the bridge and over the pins 18 of the mechanism 16. This movement of the conveyer also advances another tile to position under the grading mechanisms and the machine operates to grade a tile during the time it operates to test the first tile for warpage. During the warpage testing operation the tile on the bridge is first engaged by the fingers 55 and is then moved downwardly against the edges of the plates 56 and in contact with the upper ends of the pins 18. As the tile is moved down against the fingers the contact 73 is moved into contact with the contact 74, so that one or another of the rods 21 may complete the operating circuit of the electromagnet 67 by remaining in contact with the plate 26 or engaging plate 27. If the circuit is completed the electro-magnet aetuates its armature and stamps the tile to indicate that it is warped to a marked degree. The conveyer then advances the first tile until it is moved onto the bridge of the mechanism l7. Simultaneously with this opera tion the conveyer moves a tile under the grading mechanism 6 and advances a tile, which has been graded, to a position on the bridge of the mechanism 16. The operation of the mechanism 17 is similar to that of the mechanism 16, except that it is so adjusted that it indicates tile which are warped a less amount than will be indicated by the mechanism 16. After the tile has been tested by the mechanism 17 it is moved toward the delivery end of the machine, and other tile are moved to position on the bridge of the mechanism. The driving mechanisms of the tile grading and warpage testing mechanisms are so arranged that the mechanisms operate simultaneously and consequently the machine illustrated, in effect, grades and tests a tile for warpage each time the conveyer is zulvanced.
In accordance with the United States patent statutes I have illustrated and described the preferred embodiment of my invention, but, I desire it to be imderstood that various changes, modifications and substitutions may be made in the details of construction without departing from the spirit and scope of my invention, as set forth in the appended claims.
\Vhat I claim is:
1. In an apparatus of the character described, a way along which tile are movable, separate warpage testing mechanisms located along the way, for simultaneously grading tile in accordance with their various degrees of warpage, a conveyer for moving tile along the way, into engagement with one mechanism and then the other and for simultaneously moving a tile into engagement with each mechanism, driving means for periodically actuating the conveyer, separate clamping means for forcing each tile into engagement with each of said mechanisms, and means actuated by said driving means for periodically and simultaneously actuating each clamping means during periods of rest of the conveyer.
2. In an apparatus of the character described. means for grading tile in accordance with the degree of their warpage and comprising a mechanism for indicating a determined degree of warpage, a second mechanism for indicating a diflerent determined degree of warpage from that indicated by the first mechanism and means for simultaneously moving a tile into engagement with each mechanism.
3. In an apparatus of the character described, means for grading tile in accordance with the degree of their warpage, comprising, cooperating sets of movable pins for engaging the tile, a separate indicating mechanism controlled by each. set of pins and periodically moving means for moving tile to be tested into engagement with one and then the other of said sets of pins.
4. I11 an apparatus of the character described, means for grading tile in accordance with the degree of their warpage, comprising two sets of movable pins for engaging the tile, a separate indicating mechanism controlled by each set of pins, and periodically moving means for moving tile to be tested into engagement with one and then the other of said sets of pins and for simultaneously moving tile into operative posi tions with relation to each set of pins.
5. In an apparatus of the character described, warpage testing means comprising separate cooperating sets of movable pins for engaging the tile, separate indicating mechanisms controlled by each set of pins, means for moving tile to be tested into engagement with one and then the other set of pins and separate sets of reciprocable fingers for simultaneously pressing til-e into engagement with each set of pins during the testing operation.
6. In a machine oil the character described, means for grading tile in accordance with the degree of their warpage, comprising separate sets of movable pins for engaging tile to be tested, a separate indicating mechanism controlled by each set of pins, means for moving the tile to be tested into engagement with one and then the other of said sets of pins and for simultaneously moving tile into operative positions with relation to each set of pins and a separate periodically moving means for pressing tile into engagement with each set of pins.
7. In a machine for grading tile in accordance with the degree of their warpage, separate supports for tile to be tested, a separate set of movable pins for engaging tile on each support, means for moving tile to be tested from one support to the other, and separate periodically moving means for simultaneously pressing a tile against each support during each testing operation.
8. In a machine for grading tile in accordance with the degree of their war-page, separate supports for tile to be tested, a separate set of movable pins for engaging tile on each support, a conveyer for moving tile from one support to the other and for simultaneously moving a tile to each sup port, separate periodically moving devices for simultaneously pressing tile against said supports and their corresponding sets of pins, means for intermittently moving said conveyer and means for actuating said devices during periods of rest of said conveyer.
9. In a machine for testing the warpage of tile, separate sets of movable warpage testing pins, separate indicating mechanisms controlled by each set of pins, a conveyer for simultaneously moving tile to operative posit1ons with relation to each set of pins,
separate periodically moving means for pressing a tile into engagement with each set of pins, and for rendering each set oi pins operative in controlling its respective indicating device, means for intermittently moving the conveyer and means for actuating both oi said tile pressing means during periods of rest of the conveyer.
10. In a \varpage testing mechanism for tile, separate sets of movable pins adapted to contact the edges of the tile, a separate indicating mechanism for each set of pins, an intermittently moving conveyer for moving tile from an operative position, with relation to one set of pins, to an operative position with relation tothe other set, a sepa rate device for pressing tile, moved by the conveyer, into engagement with each set of pins during periods of rest of the conveyer, means for intermittently moving the conveyer, means for periodically actuating said devices, separate electrical devices controlled respectively by each set of pins for actuating each its respective warpage indicating mechanism, electric circuits including said pins and said devices, a circuit interrupter included in each circuit and means for moving said interru iters to circuit closing positions during periods of rest of said conveyer.
11. In a machine for testing the warpage of tile, a way along which tile are movable, separate tile supports located at intervals along the way, separate sets of cooperating pins adapted to be engaged by tile on each support, a conveyer for advancing tile along the way, means for intermittently moving the conveyer, separate devices for pressing tile against the supports and into engagement with the pins, means for simultaneously actuating said devices during periods of rest of the conveyer, a war-page testing indicating mechanism for each set of pins, a separate electrical device controlled by each set of pins for actuating each mechanism, a separate electric circuit including pins of each set and each electrical device, a separate current interrupter located in each circuit, and means for simultaneously moving said interrupters to circuit closing posi tions during periods of rest of the conveyer.
12. A machine for testing tile comprising, a tile way along which tile are movable, warpage indicating pins n-ojecting upwardly through the way, yieldingly supported means for guiding tile moving along the way to positions above the projecting ends of the pins and means for depressing said yieldingly supported means and moving the tile into engagement with the pins.
13. In a machine for testing the warpage of tile, a tile way, means for moving tile along the way, a pin projecting upwardly through the way, a movable bridge, yieldingly projected above the projecting end of the pin, for guiding tile traversing the way to a position above the pin, and means for depressing the bridge and thereby moving the tile downwardly into engagement with the pin.
1-1. In a warpage testing mechanism, a tile way, a tile support, means for moving tile along the way, a movable bridge, located in the path of travel of tile on the way, for guiding the tile to a position above the support, yielding supports for the bridge and means for depressing the bridge and moving the tile onto the support.
15. In an apparatus of the character described, a tile support, a pin projecting therethrough, a movable bridge for guiding tile to a position above the support and the projecting end of the pin, means for yieldingly supporting the bridge, means for mov-' ing a tile onto the bridge and means for engaging a tile on the bridge and for depressing the bridge and thereby pressing the tile down against the support.
16. In an apparatus of the character described, a tile support, a pin projecting above the support, means for moving tile along the support, a tiltable bridge for guiding tile to positions above the support, means for yieldingly supporting the bridge and means for moving the bridge and pressing the tile supported thereon against the support. i
17 In a warpage testing machine, a tile way, a tile support, means for moving tile along the way, a pin projecting upwardly through the support, a bridge for guiding tile traversing the way to a position above the support, and comprising longitudinally extending tile supporting members which project upwardly through the support, and transversely extending end members secured to the longitudinal members, yieldingly mounted pins on which the end members are loosely supported and means for engaging a tile on the bridge, depressing the bridge and pressing the tile engaged against the support.
18. In a warpage testing mechanism, a tile way, means for moving tile along the way, a tile support, pins projecting upwardly through the support, a bridge having tile supporting members projecting upwardly through the support, for guiding the tiles to a position above the pins, yieldingly mounted pins on which said bridge is loosely mounted and means for pressing a tile on the bridge against the support and into engagement with the pins.
. 19. In a warpage testing mechanism, a tile support, pins projecting beyond the tile supporting surface of the support and capable of being engaged by a tile located on the support, yieldingly supported rods on which said pins are mounted, plates for limiting the motion of the rods, a warpage indicating mechanism, an electrical device for actuating said mechanism, and a circuit including said rods, said plates and said electrical device.
20. In a warpage indicating machine, a tile support, a pin projecting above the surface of the support and adapted to be engaged by a tile passing over the support, a rod on which said pin is mounted, adj ustable plates located adjacent to said pin and adapted to movably mount said rod and to limit the motion of said rod, said rod being electrically insulated from said plates for intermediate positions of its movement, means for yieldingly holding the rod into electrical contact with one of said plates, a warpage indicating mechanism, an electrical device for actuating said mechanism and a circuit including said plates, said rod and said electrical device.
21. In a warpage indicating device, a pin, a support rod for the pin, having plate engaging shoulders formed thereon, plates through which said rod projects, means adapted to yieldingly maintain said rod in contact with one of said plates, and means for varying the positions of the plates relatively to each other for the purpose of adjusting the position of the rod and pin.
22. In a warpage indicating device, a frame, a warpage indicating pin, a support rod for the pin having plate engaging shoulders, plates movably mounted on the frame for limiting the motion of the rod, guides for the plates, means for moving the plates in the same direction along the guides or for moving the plates in opposite directions along the guides for the purpose of adjusting the position of the pin.
23. In a mechanism of the character described, a tile way, a conveyer for moving tile along the way, a plurality of warpage testing mechanisms located at intervals along the way, each mechanism being ad justed to respond to a different degree of tile warpage, indicating devices controlled by the mechanisms, means for intermittently moving the conveyer and means for simul taneously actuating all of said mechanisms during periods of rest of the conveyer.
24. In a mechanism of the character described, a way along which tile are movable, two sets of war-page testing pins located along the way, a separate indicating device controlled by each set of pins, an intermittently movable conveyer for moving tile along the way and for simultaneously moving a tile to a testing position, with relation to each set of pins, and separate periodically moving means for simultaneously pressing a tile onto each set of pins during periods of rest of said conveyer.
In an apparatus of the character described, a way along which tile to be tested are movable, two sets of movable warpage testing pins spaced along the way, an electrically actuated indicating device controlled by each set of pins, an intermittently moving conveyer for moving tile along the way and for simultaneously moving a tile into testing position, with relation to each set of pins, a separate set of periodically moving fingers for simultaneously pressing a tile against each set of pins during periods of rest of said conveyer, and an electric circuit controlled by each set of pins, including the corresponding indicating device and a circuit breaker included in each circuit and actuated by the operating means of the cor responding set of fingers.
26. In a warpage testing mechanism, a tile support, a plurality of movable pins projecting beyond the tile-supporting surface of the support and capable of being engaged by a tile located on the support, a warpage indicating mechanism, an electrical device for actuating the mechanism, an electric circuit for controlling the operation of the device, a make and break device for controlling the operation of the circuit, periodically actuated fingers for pressing tile to be tested against the support and against said movable pins, means for actuating said fingers and for actuating said make and break device, a yielding support for each pin included in said electric circuit, and means,'included in said circuit for limiting the motion of the pins, said means being electrically insulated from the pin supports, when the pins are located in an intermediate position, and in electrical contact with the supports when the pins are located at one extreme position or the other.
27. In a warpage testing mechanism, a support for engaging the edges of tiles to be tested, a plurality of movable pins for engaging the edges of the supported face of a tile engaged by the support, a movable bridge located adjacent to the support, a conveyer for moving tile onto the bridge, means for pressing tile on the bridge against the support and into engagement with said pins, means for intermittently actuating the conveyer, means for actuating said tile pressing means during periods of rest of the conveyer and an indicating mechanism controlled by said means.
28. In a machine of the character described, a sizing mechanism for tile, a warpage testing mechanism for indicating a determined degree of tile warpage, a second warpage testing mechanism for indicatinga different degree of warpage from that indicated by the first warpage testing mechanism, periodically moving means for moving tile to'be tested into engagement with one and then the other of said mechanisms and for simultaneously moving tile into engagement with each of said mechanisms and' means for simultaneously actuating all Of said mechanisms during periods of rest of said tile moving means.
29. In a mechanism of the character described, a way along which tile are movable, two sets of movable pins projecting above the way and in the path of tile traveling along the way, a separate movable bridge for guiding tile to a position above each set of pins, an electric circuit controlled by each set of pins, an electrically actuated indicat ing device controlled by each circuit, an intermittently moving conveyer for conveying tile along the way from one set of pins to the other and for simultaneously moving a tile in position on each bridge, a separate set of periodically moving fingers for engaging a tile located on each bridge and for pressing it downwardly against the corresponding set of pins, a circuit breaker in cluded in said circuit, and means, actuated by the actuating means of said fingers, for
moving said circuit breaker to the closed position, during the pressing operation of said fingers.
30. In a warpage testing apparatus, a support for tile to be tested, a pin projecting above said support and movable to a position below the support, means yieldingly projected above the support and above the projecting end of said pin, for supporting tile above the support and above the projecting end of the pin, motion limiting means for said pin, an indicating device, an electrically actuated device for actuating said indicating device, an electric circuit including said electric device and controlled by the cooperation of said motion limiting means and said pin, and means for engaging a tile on said yieldingly projecting means and for moving it into engagement with said pin and ontosaid support.
31. In a war-page testing apparatus, a support for tile to be tested, a set of movable pins for engaging the edges only of a tile to be tested and projecting above the tile supporting face of said support and capable of being moved by a tile on the support below the supporting face of the support, a separate movable support rod for each pm, oppositely located plates for limiting the motion of said rods and for contacting with the rods when they are in one extreme position or the other, an indicating device, electrical means for actuating said device, and an electric circuit for controlling the operation of said means, including both of said plates, said rods being located in series in said circuit and adapted to close said circult by engaging one or the other of said plates when controlled by said pins.
32. In an apparatus of the character described, a tile support, a set of movable pins projecting above the support and capable of being moved to a position below the support by a tile on the support, a separate support rod for each pin, oppositely located plates for engaging the support rods and for limiting the motion of the pins in both directions, an indicating device, electrical means for actuating said device, an electric circuit for controlling the operation of said electrical means, and including said plates and said support rods, said support rods being so arranged that each rod is capable of closing the circuit When in engagement with one or the other of said plates, and means for adjusting the positions of the plates relatively to each other, for varying the position of the support rods.
33. In a Warpage indicating device, a Way along which tile are movable, a tile support located on the Way, a pin projecting above the tile support and capable of being moved by a tile on the support to a position below the tile supporting face of the support, a movable bridge, projecting beyond the tile Way, for guiding a tile to a position'above the support and above the projecting end of the pin, a movable support rod for the pin, motion limiting plates for limiting the mo tion of the support rod and the pm, an indicating device, means, controlled by the E. W. MCCALLISTER, WV. THORNTON Boenn'r.
Copies of this patent may be obtained for five cents each, by addressing the Commissioner of Patents. Washington, D. G.
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