US11574400B2 - System and method for automated visual inspection - Google Patents

System and method for automated visual inspection Download PDF

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Publication number
US11574400B2
US11574400B2 US17/257,588 US201917257588A US11574400B2 US 11574400 B2 US11574400 B2 US 11574400B2 US 201917257588 A US201917257588 A US 201917257588A US 11574400 B2 US11574400 B2 US 11574400B2
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image
item
inspection
same
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US20210295491A1 (en
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Yonatan HYATT
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Siemens AG
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Inspekto AMV Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/50—Context or environment of the image
    • G06V20/52—Surveillance or monitoring of activities, e.g. for recognising suspicious objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/214—Generating training patterns; Bootstrap methods, e.g. bagging or boosting
    • G06K9/6256—
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/194—Segmentation; Edge detection involving foreground-background segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/255—Detecting or recognising potential candidate objects based on visual cues, e.g. shapes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user
    • G06T2207/20096—Interactive definition of curve of interest
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20112—Image segmentation details
    • G06T2207/20132—Image cropping
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30196—Human being; Person
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30232—Surveillance

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Data Mining & Analysis (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
US17/257,588 2018-07-04 2019-07-02 System and method for automated visual inspection Active 2039-11-18 US11574400B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US17/257,588 US11574400B2 (en) 2018-07-04 2019-07-02 System and method for automated visual inspection

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201862693937P 2018-07-04 2018-07-04
IL260417A IL260417B (en) 2018-07-04 2018-07-04 System and method for automatic visual inspection
IL260417 2018-07-04
US17/257,588 US11574400B2 (en) 2018-07-04 2019-07-02 System and method for automated visual inspection
PCT/IL2019/050734 WO2020008457A1 (fr) 2018-07-04 2019-07-02 Système et procédé pour inspection visuelle automatisée

Publications (2)

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US20210295491A1 US20210295491A1 (en) 2021-09-23
US11574400B2 true US11574400B2 (en) 2023-02-07

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US (1) US11574400B2 (fr)
EP (1) EP3818473A4 (fr)
IL (1) IL260417B (fr)
WO (1) WO2020008457A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11887332B2 (en) * 2021-06-29 2024-01-30 7-Eleven, Inc. Item identification using digital image processing
CN115065708B (zh) * 2022-08-17 2022-11-18 成都秦川物联网科技股份有限公司 基于机器视觉检测的工业物联网系统及其控制方法

Citations (23)

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US20040008880A1 (en) 2002-07-09 2004-01-15 Fujitsu Limited Device and method for inspecting photomasks and products fabricated using the same
US20050062960A1 (en) 2001-09-19 2005-03-24 Olympus Optical Co., Ltd. Semiconductor wafer inspection apparatus
JP2005208890A (ja) 2004-01-22 2005-08-04 Fuji Xerox Co Ltd 検査装置、検査プログラム、検査方法、制御装置、制御プログラム、及び、制御方法
JP4008291B2 (ja) * 2002-06-10 2007-11-14 大日本スクリーン製造株式会社 パターン検査装置、パターン検査方法およびプログラム
US20080181533A1 (en) 2007-01-31 2008-07-31 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Targeted obstrufication of an image
US20080317329A1 (en) 2007-06-20 2008-12-25 Hitachi High-Technologies Corporation Visual Inspection Method and Apparatus and Image Analysis System
US20110107259A1 (en) 2009-11-04 2011-05-05 International Business Machines Corporation Enhanced Slider Bar System
JP4695239B2 (ja) * 1999-01-08 2011-06-08 アプライド マテリアルズ インコーポレイテッド 形状特徴に基づく欠陥検出方法及び装置
US20120128230A1 (en) * 1998-04-21 2012-05-24 Shunji Maeda Defect inspection method and apparatus
US20130177232A1 (en) 2012-01-06 2013-07-11 Keyence Corporation Visual Inspection Device, Visual Inspection Method, And Computer Program
EP2801815A1 (fr) 2012-01-05 2014-11-12 Omron Corporation Procédé de réglage d'une zone d'inspection pour dispositif d'inspection d'image
US20150064813A1 (en) 2013-08-29 2015-03-05 International Business Machines Corporation Microprocessor image correction and method for the detection of potential defects
US20150221077A1 (en) 2014-02-03 2015-08-06 Prosper Creative Co., Ltd. Image inspecting apparatus and image inspecting program
US20150355102A1 (en) * 2014-06-09 2015-12-10 Keyence Corporation Image Inspection Apparatus, Image Inspection Method, Image Inspection Program, Computer-Readable Recording Medium And Recording Device
US9330339B2 (en) 2012-06-11 2016-05-03 Hi-Tech Solutions Ltd. System and method for detecting cargo container seals
US20170220241A1 (en) 2016-01-29 2017-08-03 Onshape Inc. Force touch zoom selection
US9729824B2 (en) * 2012-12-20 2017-08-08 Microsoft Technology Licensing, Llc Privacy camera
TW201730843A (zh) * 2015-12-09 2017-09-01 克萊譚克公司 藉由降低晶粒至晶粒製程雜訊之缺陷信號對雜訊增強
US9886771B1 (en) 2016-05-20 2018-02-06 Ccc Information Services Inc. Heat map of vehicle damage
US20190114756A1 (en) 2017-04-13 2019-04-18 Instrumental, Inc. Method for predicting defects in assembly units
US20190354772A1 (en) * 2016-12-26 2019-11-21 Argosai Teknoloji Anonim Sirketi A method for foreign object debris detection
WO2020100146A1 (fr) 2018-11-18 2020-05-22 Inspekto A.M.V Ltd Optimisation d'un étage de réglage dans un processus d'inspection visuelle automatique
WO2022074085A1 (fr) * 2020-10-07 2022-04-14 Crest Solutions Limited Système de dégagement de ligne

Patent Citations (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120128230A1 (en) * 1998-04-21 2012-05-24 Shunji Maeda Defect inspection method and apparatus
JP4695239B2 (ja) * 1999-01-08 2011-06-08 アプライド マテリアルズ インコーポレイテッド 形状特徴に基づく欠陥検出方法及び装置
US20050062960A1 (en) 2001-09-19 2005-03-24 Olympus Optical Co., Ltd. Semiconductor wafer inspection apparatus
JP4008291B2 (ja) * 2002-06-10 2007-11-14 大日本スクリーン製造株式会社 パターン検査装置、パターン検査方法およびプログラム
US20040008880A1 (en) 2002-07-09 2004-01-15 Fujitsu Limited Device and method for inspecting photomasks and products fabricated using the same
JP2005208890A (ja) 2004-01-22 2005-08-04 Fuji Xerox Co Ltd 検査装置、検査プログラム、検査方法、制御装置、制御プログラム、及び、制御方法
US20080181533A1 (en) 2007-01-31 2008-07-31 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Targeted obstrufication of an image
US20120155741A1 (en) 2007-06-20 2012-06-21 Hisae Shibuya Visual Inspection Method And Apparatus And Image Analysis System
US20080317329A1 (en) 2007-06-20 2008-12-25 Hitachi High-Technologies Corporation Visual Inspection Method and Apparatus and Image Analysis System
US20110107259A1 (en) 2009-11-04 2011-05-05 International Business Machines Corporation Enhanced Slider Bar System
EP2801815A1 (fr) 2012-01-05 2014-11-12 Omron Corporation Procédé de réglage d'une zone d'inspection pour dispositif d'inspection d'image
US20130177232A1 (en) 2012-01-06 2013-07-11 Keyence Corporation Visual Inspection Device, Visual Inspection Method, And Computer Program
US9330339B2 (en) 2012-06-11 2016-05-03 Hi-Tech Solutions Ltd. System and method for detecting cargo container seals
US9729824B2 (en) * 2012-12-20 2017-08-08 Microsoft Technology Licensing, Llc Privacy camera
US20150064813A1 (en) 2013-08-29 2015-03-05 International Business Machines Corporation Microprocessor image correction and method for the detection of potential defects
US20150221077A1 (en) 2014-02-03 2015-08-06 Prosper Creative Co., Ltd. Image inspecting apparatus and image inspecting program
US20150355102A1 (en) * 2014-06-09 2015-12-10 Keyence Corporation Image Inspection Apparatus, Image Inspection Method, Image Inspection Program, Computer-Readable Recording Medium And Recording Device
TW201730843A (zh) * 2015-12-09 2017-09-01 克萊譚克公司 藉由降低晶粒至晶粒製程雜訊之缺陷信號對雜訊增強
US20170220241A1 (en) 2016-01-29 2017-08-03 Onshape Inc. Force touch zoom selection
US9886771B1 (en) 2016-05-20 2018-02-06 Ccc Information Services Inc. Heat map of vehicle damage
US20190354772A1 (en) * 2016-12-26 2019-11-21 Argosai Teknoloji Anonim Sirketi A method for foreign object debris detection
US20190114756A1 (en) 2017-04-13 2019-04-18 Instrumental, Inc. Method for predicting defects in assembly units
WO2020100146A1 (fr) 2018-11-18 2020-05-22 Inspekto A.M.V Ltd Optimisation d'un étage de réglage dans un processus d'inspection visuelle automatique
WO2022074085A1 (fr) * 2020-10-07 2022-04-14 Crest Solutions Limited Système de dégagement de ligne

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Islam et al., "Enhanced Automatic Surface and Structural Flaw Inspection and Categorization Using Image Processing Both for Flat and Textured Ceramic Tiles", International Journal of Computer Applications, Jun. 2012, 48(3), pp. 1-10, Foundation of Computer Science, New York, NY, USA.

Also Published As

Publication number Publication date
IL260417B (en) 2021-10-31
WO2020008457A1 (fr) 2020-01-09
US20210295491A1 (en) 2021-09-23
IL260417A (en) 2018-11-29
EP3818473A1 (fr) 2021-05-12
EP3818473A4 (fr) 2021-08-25

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