US11367688B2 - Semiconductor package with interposer - Google Patents
Semiconductor package with interposer Download PDFInfo
- Publication number
- US11367688B2 US11367688B2 US17/090,502 US202017090502A US11367688B2 US 11367688 B2 US11367688 B2 US 11367688B2 US 202017090502 A US202017090502 A US 202017090502A US 11367688 B2 US11367688 B2 US 11367688B2
- Authority
- US
- United States
- Prior art keywords
- interposer
- package
- molding layer
- semiconductor chip
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
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- 230000003068 static effect Effects 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
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Definitions
- the inventive concept relates to a semiconductor package, and more particularly, to a semiconductor package including an interposer.
- the inventive concept relates to a semiconductor package including interposers.
- a semiconductor package includes a first package substrate, a first semiconductor chip on the first package substrate, a molding layer covering side walls of the first semiconductor chip and including through holes, an interposer on the first semiconductor chip and the molding layer, conductive connectors in the through holes of the molding layer and connected to the first package substrate and the interposer, and an insulating filler including a first portion that fills the through holes of the molding layer so as to surround side walls of the conductive connectors.
- a semiconductor package includes a package substrate, a semiconductor chip on the package substrate, a molding layer covering side walls of the semiconductor chip and including first trenches, an interposer on the semiconductor chip and the molding layer, the interposer including an interposer substrate and first protrusions protruding from a lower surface of the interposer substrate and extending into the first trenches of the molding layer, and conductive connectors penetrating through the molding layer and connected to the package substrate and the interposer.
- a semiconductor package includes a first package including a first package substrate, a first semiconductor chip on the first package substrate, and a molding layer configured to cover side walls of the first semiconductor chip, an interposer on the first package, conductive connectors in through holes of the molding layer and electrically connecting the interposer to the first package substrate, an insulating filler filling a gap between the interposer and the first package substrate and filling the through holes of the molding layer so as to surround side walls of the conductive connectors, and a second package on the interposer and including a second package substrate and a second semiconductor chip on the second package substrate.
- An upper surface of the molding layer is coplanar with an upper surface of the first semiconductor chip.
- FIG. 1 is a cross-sectional view illustrating a semiconductor package according to example embodiments of the inventive concept
- FIG. 2 is an enlarged view of a portion marked with “E” in FIG. 1 ;
- FIG. 3 is a cross-sectional view illustrating a part of a semiconductor package according to example embodiments of the inventive concept
- FIG. 4 is a cross-sectional view illustrating a semiconductor package according to example embodiments of the inventive concept
- FIG. 5 is a cross-sectional view illustrating a semiconductor package according to example embodiments of the inventive concept
- FIG. 6 is a cross-sectional view illustrating a semiconductor package according to example embodiments of the inventive concept
- FIG. 7 is a cross-sectional view illustrating a semiconductor package according to example embodiments of the inventive concept.
- FIG. 8 is a cross-sectional view illustrating a semiconductor package according to example embodiments of the inventive concept.
- FIGS. 9A to 9G are cross-sectional views illustrating a method of manufacturing a semiconductor package according to example embodiments of the inventive concept.
- FIG. 1 is a cross-sectional view illustrating a semiconductor package 10 according to example embodiments of the inventive concept.
- FIG. 2 is an enlarged view of a portion marked with “ ⁇ ” in FIG. 1 .
- the semiconductor package 10 may include a first package 100 , an interposer 300 provided on the first package 100 , conductive connectors 210 electrically connecting the first package 100 to the interposer 300 , and an insulating filler 220 filled between the first package 100 and the interposer 300 .
- the first package 100 may include a first package substrate 110 , a first semiconductor chip 120 , and a first molding layer 140 .
- the first package 100 may be, for example, a flip chip package in which the first semiconductor chip 120 is mounted on the first package substrate 110 by a face-down manner.
- chip connection terminals 131 are arranged between the first chip pad 121 of the first semiconductor chip 120 and upper pads 116 of the first package substrate 110 , and the chip connection terminals 131 may electrically/physically connect the first chip pads 121 of the first semiconductor chip 120 to the upper pads 116 of the first package substrate 110 .
- the first package substrate 110 may be, for example, a printed circuit board (PCB).
- the first package substrate 110 may include a substrate base 111 including at least one selected from phenol resin, epoxy resin, and polyimide.
- the first package substrate 110 may include the upper pads 116 formed on an upper surface of the substrate base 111 and lower pads 115 formed on a lower surface of the substrate base 111 .
- an internal wiring line 113 for electrically connecting the upper pads 116 to the lower pads 115 may be formed.
- the upper pads 116 and the lower pads 115 may include, for example, a metal such as copper (Cu), aluminum (Al), tungsten (W), titanium (Ti), tantalum (Ta), indium (In), molybdenum (Mo), manganese (Mn), cobalt (Co), tin (Sn), nickel (Ni), magnesium (Mg), rhenium (Re), beryllium (Be), gallium (Ga), or ruthenium (Ru) or an alloy of the above metals.
- a metal such as copper (Cu), aluminum (Al), tungsten (W), titanium (Ti), tantalum (Ta), indium (In), molybdenum (Mo), manganese (Mn), cobalt (Co), tin (Sn), nickel (Ni), magnesium (Mg), rhenium (Re), beryllium (Be), gallium (Ga), or ruthenium (Ru) or an alloy of the above metals.
- the inventive concept is not limited there
- the conductive connectors 210 or the chip connection terminals 131 may be attached to upper pads 116 .
- external connection terminals 400 may be attached to the lower pads 115 .
- the external connection terminals 400 may be, for example, solder balls or bumps.
- the external connection terminals 400 may electrically connect the semiconductor package 10 to an external device.
- the first semiconductor chip 120 may be mounted on the first package substrate 110 .
- the first semiconductor chip 120 includes a semiconductor substrate having an active surface and an inactive surface opposite to each other and may include a semiconductor device layer formed on the active surface of the semiconductor substrate.
- the first semiconductor chip 120 includes a lower surface and an upper surface opposite to each other.
- the first chip pads 121 may be provided on the lower surface of the first semiconductor chip 120 .
- the first chip pads 121 of the first semiconductor chip 120 may be electrically connected to the semiconductor device layer through a wiring structure (not shown).
- the first semiconductor chip 120 may include a volatile memory chip and/or a non-volatile memory chip as a memory chip.
- the volatile memory chip may be, for example, dynamic random access memory (DRAM), static RAM (SRAM), thyristor RAM (TRAM), zero capacitor RAM (ZRAM), or twin transistor RAM (TTRAM).
- the non-volatile memory chip may be, for example, flash memory, magnetic RAM (MRAM), spin-transfer torque MRAM (STT-MRAM), ferroelectric RAM (FRAM), phase change RAM (PRAM), resistive RAM (RRAM), nanotube RRAM, polymer RAM, or insulator resistance change memory.
- the first semiconductor chip 120 may be a non-memory chip.
- the first semiconductor chip 120 as a logic chip may be implemented by an artificial intelligence (AI) semiconductor, a microprocessor, a graphic processor, a signal processor, a network processor, a chipset, an audio codec, a video codec, an application processor, or a system on chip (SoC).
- AI artificial intelligence
- SoC system on chip
- the first semiconductor chip 120 may be mounted on the first package substrate 110 so that one surface of the first semiconductor chip 120 on which the first chip pads 121 are provided faces the first package substrate 110 .
- the first chip pads 121 of the first semiconductor chip 120 may be used as terminals for transmitting input/output data signals of the first semiconductor chip 120 or terminals for power and/or ground of the first semiconductor chip 120 .
- the first molding layer 140 is provided on the first package substrate 110 and may cover at least a part of the first semiconductor chip 120 .
- the first molding layer 140 may protect the first semiconductor chip 120 against an external environment.
- the first molding layer 140 may include an under-fill portion that fills a gap between the first semiconductor chip 120 and the first package substrate 110 and surrounds the chip connection terminals 131 interposed between the first semiconductor chip 120 and the first package substrate 110 .
- the first molding layer 140 may be formed by injecting a proper amount of molding material into the periphery of the first semiconductor chip 120 by an injecting process and hardening the molding material through a hardening process.
- a molding material for forming the first molding layer 140 may include epoxy-group molding resin or polyimide-group molding resin.
- the first molding layer 140 may include epoxy molding compound (EMC).
- the first molding layer 140 may cover side walls of the first semiconductor chip 120 and may not cover the upper surface of the first semiconductor chip 120 .
- an upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 may be planarized (or flattened) surfaces.
- the upper surface of the first molding layer 140 may be coplanar with the upper surface of the first semiconductor chip 120 .
- the interposer 300 may be arranged on the first semiconductor chip 120 and the first molding layer 140 .
- the interposer 300 may include an interposer substrate 310 .
- the interposer substrate 310 may include an interposer substrate base 311 formed of at least one material selected from phenol resin, epoxy resin, and polyimide.
- the interposer substrate 310 may include interposer upper pads 316 and interposer lower pads 315 respectively formed on an upper surface of the interposer substrate base 311 and a lower surface of the interposer substrate base 311 .
- Interposer internal wiring lines 313 for electrically connecting the interposer upper pads 316 to the interposer lower pads 315 may be formed in the interposer substrate base 311 .
- the interposer upper pads 316 and the interposer lower pads 315 may be formed of, for example, a metal such as Cu, Al, W, Ti, Ta, In, Mo, Mn, Co, Sn, Ni, Mg, Re, Be, Ga, or Ru or an alloy of the above metals.
- a metal such as Cu, Al, W, Ti, Ta, In, Mo, Mn, Co, Sn, Ni, Mg, Re, Be, Ga, or Ru or an alloy of the above metals.
- a metal such as Cu, Al, W, Ti, Ta, In, Mo, Mn, Co, Sn, Ni, Mg, Re, Be, Ga, or Ru or an alloy of the above metals.
- a metal such as Cu, Al, W, Ti, Ta, In, Mo, Mn, Co, Sn, Ni, Mg, Re, Be, Ga, or Ru or an alloy of the above metals.
- the inventive concept is not limited thereto.
- the conductive connectors 210 may be spaced apart from the side walls of the first semiconductor chip 120 in a horizontal direction.
- the conductive connectors 210 may be accommodated in through holes 141 of the first molding layer 140 .
- the conductive connectors 210 may extend in a vertical direction, for example, a direction perpendicular to an upper surface of the first package substrate 110 .
- Each of the conductive connectors 210 may have a pillar (or column) shape. Parts of the conductive connectors 210 may protrude from the upper surface of the first molding layer 140 and upper ends of the conductive connectors 210 may be positioned at a level higher than that of the upper surface of the first molding layer 140 .
- Lower ends of the conductive connectors 210 may be connected to the upper pads 116 of the first package substrate 110 and the upper ends of the conductive connectors 210 may be connected to the interposer lower pads 315 on a lower surface of the interposer substrate 310 .
- the conductive connectors 210 may electrically connect the upper pads 116 of the first package substrate 110 to the interposer lower pads 315 of the interposer substrate 310 .
- the conductive connectors 210 may include at least one selected from solder, Al, Cu, Ni, W, platinum (Pt), and gold (Au).
- the insulating filler 220 may include a first portion 221 that fills the through holes 141 of the first molding layer 140 .
- the first portion 221 of the insulating filler 220 may fill a gap between side walls of the conductive connectors 210 and an inner wall of the first molding layer 140 provided by the through holes 141 of the first molding layer 140 .
- the side walls of the conductive connectors 210 may be surrounded by the first portion 221 of the insulating filler 220 .
- the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 may be spaced apart from each other with the first portion 221 of the insulating filler 220 interposed therebetween.
- the insulating filler 220 may at least partially fill the gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 . That is, the insulating filler 220 may entirely fill the gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 and may partially fill the gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 .
- the insulating filler 220 may include a second portion 223 that fills a gap between the first package 100 and the interposer 300 .
- the second portion 223 of the insulating filter 220 may fill a gap between the lower surface of the interposer substrate 310 and the upper surface of the first molding layer 140 and may fill a gap between the lower surface of the interposer substrate 310 and the upper surface of the first semiconductor chip 120 .
- the insulating filler 220 may be formed of under-fill resin formed by a capillary under-fill method. Alternatively, in example embodiments, the insulating filler 220 may be a non-conductive film. In example embodiments, the insulating filler 220 may include a material different from that of the first molding layer 140 .
- the conductive connectors 210 may be protected.
- the interposer 300 may be firmly attached onto the first package 100 .
- a horizontal width of each of the through holes 141 of the first molding layer 140 may be greatest. That is, a width 141 W 1 of an upper end of each of the through holes 141 of the first molding layer 140 may be less than a width 141 W 2 of an intermediate portion of each of the through holes 141 of the first molding layer 140 .
- a width of a lower portion of each of the through holes 141 of the first molding layer 140 increases along the first direction and a width of an upper portion of each of the through holes 141 of the first molding layer 140 is reduced along the first direction, as illustrated.
- a horizontal width of the center of each of the conductive connectors 210 is greatest like in the shape of each of the through holes 141 of the first molding layer 140 . That is, a width of a lower portion of each of the conductive connectors 210 increases along the first direction and a width of an upper portion of each of the conductive connectors 210 is reduced along the first direction, as illustrated.
- FIG. 3 is a cross-sectional view illustrating a part of a semiconductor package according to example embodiments of the inventive concept.
- FIG. 3 illustrates a portion corresponding to an area marked with “II” of FIG. 1 .
- the semiconductor package illustrated in FIG. 3 may be the same as or similar to the semiconductor package 10 described with reference to FIGS. 1 and 2 excluding interposer lower pads 315 a .
- interposer lower pads 315 a for convenience sake, a difference between the semiconductor package illustrated in FIG. 3 and the semiconductor package 10 described with reference to FIGS. 1 and 2 will be mainly described.
- the interposer (refer to 300 of FIG. 1 ) may include the interposer lower pads 315 a provided on the lower surface of the interposer substrate 310 to be connected to the conductive connectors 210 . At least parts of the interposer lower pads 315 a may protrude from the lower surface of the interposer substrate 310 . The interposer lower pads 315 a may entirely protrude from the lower surface of the interposer substrate 310 and may partially protrude from the lower surface of the interposer substrate 310 .
- interposer lower pads 315 a protrude from the interposer substrate base 311 , side walls of the interposer lower pads 315 a may be covered with the insulating filler 220 .
- interposer lower pads 315 a protrude from the lower surface of the interposer substrate 310 , when the conductive connectors 210 are formed by a reflow process, a material that forms the conductive connectors 210 may be more easily attached to the interposer lower pads 315 a.
- FIG. 4 is a cross-sectional view illustrating a semiconductor package 10 a according to example embodiments of the inventive concept.
- the semiconductor package 10 a illustrated in FIG. 4 may be the same as or similar to the semiconductor package 10 described with reference to FIGS. 1 and 2 excluding that an interposer 300 a further includes first protrusions 320 .
- an interposer 300 a further includes first protrusions 320 .
- a difference between the semiconductor package 10 a illustrated in FIG. 4 and the semiconductor package 10 described with reference to FIGS. 1 and 2 will be mainly described.
- the semiconductor package 10 a includes the first package 100 , the interposer 300 a , the conductive connectors 210 , and the insulating filler 220 and the first package 100 may include the first package substrate 110 , the first semiconductor chip 120 , and the first molding layer 140 .
- the first molding layer 140 may include first trenches 143 provided in an upper side toward the interposer 300 a and the interposer 300 a may include the first protrusions 320 inserted into the first trenches 143 of the first molding layer 140 .
- the first protrusions 320 of the interposer 300 a may be columnar to protrude from the lower surface of the interposer substrate 310 and each of the first trenches 143 of the first molding layer 140 may have a shape corresponding to that of each of the first protrusions 320 to accommodate each of the first protrusions 320 .
- the first molding layer 140 may include a plurality of first trenches 143 and the interposer 300 a may include a plurality of first protrusions 320 inserted into the plurality of first trenches 143 .
- the plurality of first trenches 143 may be arranged along an edge of the first molding layer 140 in the outer area of the first molding layer 140 and the plurality of first protrusions 320 may be arranged to correspond to the arrangement of the plurality of first trenches 143 .
- the interposer 300 a may be firmly fixed onto the first package 100 .
- the interposer 300 a and the first package 100 are aligned when the first protrusions 320 of the interposer 300 a are inserted into the first trenches 143 of the first molding layer 140 , when the interposer 300 a is assembled with the first package 100 , misalignment between the interposer 300 a and the first package 100 may be prevented.
- the first protrusions 320 of the interposer 300 a may support the interposer substrate 310 so that the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 by a uniform distance.
- the interposer substrate 310 may be spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 by a distance between about 10 ⁇ m to about 500 ⁇ m.
- a height of each of the first protrusions 320 of the interposer 300 a may be greater than a depth of each of the first trenches 143 of the first molding layer 140 .
- only parts of the first protrusions 320 may be inserted into the first trenches 143 and the other parts of the first protrusions 320 may be positioned above the upper surface of the first molding layer 140 and may be surrounded by the insulating filler 220 .
- the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 by a height of each of the other parts of the first protrusions 320 , a distance between the interposer substrate 310 and the upper surface of the first molding layer 140 may be defined by the first protrusions 320 of the interposer 300 a .
- the upper surface of the first semiconductor chip 120 may be coplanar with the upper surface of the first molding layer 140 , and a distance between the upper surface of the first semiconductor chip 120 and the interposer substrate 310 may also be defined by the first protrusions 320 of the interposer 300 a.
- FIG. 5 is a cross-sectional view illustrating a semiconductor package 10 b according to example embodiments of the inventive concept.
- the semiconductor package 10 b illustrated in FIG. 5 may be the same as or similar to the semiconductor package 10 a described with reference to FIG. 4 excluding that the interposer 300 further includes second protrusions 330 .
- the semiconductor package 10 b illustrated in FIG. 5 may be the same as or similar to the semiconductor package 10 a described with reference to FIG. 4 excluding that the interposer 300 further includes second protrusions 330 .
- the semiconductor package 10 b illustrated in FIG. 5 may be the same as or similar to the semiconductor package 10 a described with reference to FIG. 4 excluding that the interposer 300 further includes second protrusions 330 .
- a difference between the semiconductor package 10 b illustrated in FIG. 5 and the semiconductor package 10 a described with reference to FIG. 4 will be mainly described.
- the semiconductor package 10 b may include the first package 100 , an interposer 300 b , the conductive connectors 210 , and the insulating filler 220 and the first package 100 may include the first package substrate 110 , the first semiconductor chip 120 , and the first molding layer 140 .
- the first semiconductor chip 120 may include second trenches 123 provided in an upper side toward the interposer 300 b and the interposer 300 b may include the second protrusions 330 inserted into the second trenches 123 of the first semiconductor chip 120 .
- the second protrusions 330 of the interposer 300 b may be columnar to protrude from the lower surface of the interposer substrate 310 and each of the second trenches 123 of the first semiconductor chip 120 may have a shape corresponding to that of each of the second protrusions 330 to accommodate each of the second protrusions 330 .
- the first semiconductor chip 120 may include a plurality of second trenches 123 and the interposer 300 b may include a plurality of second protrusions 330 inserted into the plurality of second trenches 123 .
- the plurality of second trenches 123 may be symmetrically arranged based on the center of the first semiconductor chip 120 and the plurality of first protrusions 320 may be arranged to correspond to the arrangement of the plurality of first trenches 143 .
- the interposer 300 b may be firmly fixed onto the first package 100 .
- the interposer 300 b and the first package 100 are aligned when the second protrusions 330 of the interposer 300 b are inserted into the second trenches 123 of the first semiconductor chip 120 , when the interposer 300 b is assembled with the first package 100 , misalignment between the interposer 300 b and the first package 100 may be prevented.
- the second protrusions 330 of the interposer 300 b may support the interposer substrate 310 so that the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 .
- a height of each of the second protrusions 330 of the interposer 300 b may be greater than a depth of each of the second trenches 123 of the first semiconductor chip 120 .
- only parts of the second protrusions 330 may be inserted into the second trenches 123 and the other parts of the second protrusions 330 may be positioned above the upper surface of the first semiconductor chip 120 and may be surrounded by the insulating filler 220 .
- the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 by a height of each of the other parts of the second protrusions 330 , a distance between the interposer substrate 310 and the upper surface of the first semiconductor chip 120 may be defined by the second protrusions 330 of the interposer 300 b .
- the first molding layer 140 may be coplanar with the upper surface of the first semiconductor chip 120 , and a distance between the upper surface of the first molding layer 140 and the interposer substrate 310 may also be defined by the second protrusions 330 of the interposer 300 b.
- the second protrusions 330 of the interposer 300 b may support the interposer substrate 310 so that the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 in cooperation with the first protrusions 320 of the interposer 300 b and may define a distance between the interposer substrate 310 and the first molding layer 140 and a distance between the interposer substrate 310 and the first semiconductor chip 120 .
- FIG. 6 is a cross-sectional view illustrating a semiconductor package 10 c according to example embodiments of the inventive concept.
- the semiconductor package 10 c illustrated in FIG. 6 may be the same as or similar to the semiconductor package 10 a described with reference to FIG. 4 excluding that an interposer 300 c further includes spacers 340 .
- an interposer 300 c further includes spacers 340 .
- the semiconductor package 10 c may include the first package 100 , the interposer 300 c , the conductive connectors 210 , and the insulating filler 220 and the first package 100 may include the first package substrate 110 , the first semiconductor chip 120 , and the first molding layer 140 .
- the interposer 300 c may include the spacers 340 that contact the upper surface of the first semiconductor chip 120 .
- the spacers 340 may be columnar to protrude from the lower surface of the interposer substrate 310 .
- the interposer 300 c may include a plurality of spacers 340 having the same height. A lower surface of each of the plurality of spacers 340 contact the upper surface of the first semiconductor chip 120 and side walls of each of the plurality of spacers 340 may be surrounded by the insulating filler 220 .
- the spacers 340 of the interposer 300 c may define the distance between the upper surface of the first semiconductor chip 120 and the interposer substrate 310 and may define the distance between the upper surface of the first molding layer 140 on the same plane as the upper surface of the first semiconductor chip 120 and the interposer substrate 310 . That is, the spacers 340 of the interposer 300 c may support the interposer substrate 310 so that the interposer substrate 310 is spaced apart from the upper surface of the first semiconductor chip 120 by a uniform distance.
- the spacers 340 of the interposer 300 c may support the interposer substrate 310 so that the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 in cooperation with the first protrusions 320 of the interposer 300 c and may define the distance between the interposer substrate 310 and the first molding layer 140 and the distance between the interposer substrate 310 and the first semiconductor chip 120 .
- the spacers 340 of the interposer 300 c , the first protrusions 320 , and the second protrusions 330 may support the interposer substrate 310 so that the interposer substrate 310 is spaced apart from the upper surface of the first molding layer 140 and the upper surface of the first semiconductor chip 120 in cooperation with each other and may define the distance between the interposer substrate 310 and the first molding layer 140 and the distance between the interposer substrate 310 and the first semiconductor chip 120 .
- FIG. 7 is a cross-sectional view illustrating a semiconductor package 10 d according to example embodiments of the inventive concept.
- the semiconductor package 10 d illustrated in FIG. 7 may be the same as or similar to the semiconductor package 10 described with reference to FIG. 1 excluding that the semiconductor package 10 d illustrated in FIG. 7 further includes an embedded semiconductor device 160 .
- an embedded semiconductor device 160 hereinafter, for convenience sake, a difference between the semiconductor package 10 d illustrated in FIG. 7 and the semiconductor package 10 described with reference to FIG. 1 will be mainly described.
- the semiconductor package 10 d may further includes the embedded semiconductor device 160 embedded in the first package substrate 110 .
- the embedded semiconductor device 160 may be accommodated in a recess portion of the first package substrate 110 .
- the embedded semiconductor device 160 may be attached onto a bottom surface of the recess portion by an adhesive film 163 .
- An embedded insulating layer 170 that covers at least a part of the embedded semiconductor device 160 may be provided in the recess portion of the first package substrate 110 .
- the embedded semiconductor device 160 may be electrically connected to the first semiconductor chip 120 .
- the embedded semiconductor device 160 may be accommodated in the recess portion of the first package substrate 110 so that one surface on which pads 161 are provided faces the first semiconductor chip 120 .
- Connection terminals 133 may be arranged between the pads 161 of the embedded semiconductor device 160 and the first chip pads 121 of the first semiconductor chip 120 .
- the embedded semiconductor device 160 may be electrically connected to the first semiconductor chip 120 through the connection terminals 133 .
- the embedded semiconductor device 160 may be a memory chip, a logic chip, an active element, or a passive element. In example embodiments, the embedded semiconductor device 160 may be a different kind of semiconductor chip from the first semiconductor chip 120 . For example, when the first semiconductor chip 120 is the logic chip such as an application processor (AP), the embedded semiconductor device 160 may be the memory chip.
- AP application processor
- FIG. 8 is a cross-sectional view illustrating a semiconductor package 10 e according to example embodiments of the inventive concept.
- the semiconductor package 10 e illustrated in FIG. 8 may be the same as or similar to the semiconductor package 10 described with reference to FIG. 1 excluding that the semiconductor package 10 e illustrated in FIG. 8 further includes a second package 400 .
- a difference between the semiconductor package 10 e illustrated in FIG. 8 and the semiconductor package 10 described with reference to FIG. 1 will be mainly described.
- the semiconductor package 10 e may further include the first package 100 , the interposer 300 stacked on the first package 100 , and the second package 400 stacked on the interposer 300 .
- the semiconductor package 10 may be a package on package type semiconductor package in which the first package 100 and the second package 400 respectively form a lower package and an upper package.
- the second package 400 may include a second package substrate 410 , a second semiconductor chip 420 on the second package substrate 410 , and a second molding layer 440 that covers at least a part of the second semiconductor chip 420 .
- the second package substrate 410 may be, for example, the PCB.
- the second package substrate 410 may include upper pads and lower pads respectively formed on an upper surface of the second package substrate 410 and a lower surface of the second package substrate 410 .
- the second package substrate 410 may be electrically connected to the interposer 300 through connection terminals 490 interposed between the lower pads of the second package substrate 410 and the interposer upper pads 316 of the interposer 300 .
- the second semiconductor chip 420 may be mounted on the second package substrate 410 by, for example, a face-up manner.
- second chip pads 421 of the second semiconductor chip 420 may be electrically connected to the upper pads of the second package substrate 410 through conductive wires 430 .
- the inventive concept is not limited thereto and the second semiconductor chip 420 may be mounted on the second package substrate 410 by a flip chip manner.
- the second semiconductor chip 420 may be electrically connected to the first semiconductor chip 120 or an external connection terminal 400 through the interposer 300 .
- the first semiconductor chip 120 may be a different kind of semiconductor chip from the second semiconductor chip 420 .
- the second semiconductor chip 420 may be the memory chip.
- the semiconductor package 10 may be a system in package in which different kinds of semiconductor chips are electrically connected and operate as one system.
- the first semiconductor chip 120 may be the same kind of semiconductor chip as the second semiconductor chip 420 .
- FIGS. 9A to 9G are cross-sectional views illustrating a method of manufacturing a semiconductor package according to example embodiments of the inventive concept.
- a method of manufacturing the semiconductor package 10 c illustrated in FIG. 6 will be described with reference to FIGS. 9A to 9G .
- the first semiconductor chip 120 is mounted on the first package substrate 110 .
- the first semiconductor chip 120 may be attached onto the first package substrate 110 so that the first chip pads 121 face the upper surface of the first package substrate 110 .
- the first chip pads 121 of the first semiconductor chip 120 may be electrically connected to the upper pads 116 of the first package substrate 110 through the chip connection terminals 131 .
- the first package substrate 110 may have a PCB strip structure in which a plurality of PCBs are connected to each other and a plurality of first semiconductor chips 120 may be mounted on the first package substrate 110 .
- the conductive connectors 210 are formed on the first package substrate 110 .
- the conductive connectors 210 are spaced apart from the side walls of the first semiconductor chip 120 in the horizontal direction and may be formed on the upper pads 116 of the first package substrate 110 .
- the conductive connectors 210 may be, for example, solder balls, solder bumps, or conductive posts.
- the first molding layer 140 for molding the first semiconductor chip 120 is formed.
- the first molding layer 140 may be formed on the upper surface of the first package substrate 110 so as to cover the first semiconductor chip 120 and the conductive connectors 210 .
- the first molding layer 140 is formed through a molded under-fill process and may fill the gap between the first semiconductor chip 120 and the first package substrate 110 .
- a process of polishing the resultant material of FIG. 9B is performed.
- a part of the first molding layer 140 , a part of the first semiconductor chip 120 , and parts of the conductive connectors 210 may be removed.
- the upper surface of the first semiconductor chip 120 , the upper surface of the first molding layer 140 , and upper surfaces of the conductive connectors 210 may be planarized (or flattened).
- the upper surface of the first semiconductor chip 120 , the upper surface of the first molding layer 140 , and the upper surfaces of the conductive connectors 210 may be provided on the same plane.
- the polishing process may be a grinding process performed by using a diamond wheel, an etch-back process, or a chemical mechanical polishing process.
- a part of the first semiconductor chip 120 may be removed by the polishing process so that a thickness of the first semiconductor chip 120 may be reduced.
- the first trenches 143 may be formed by removing a part of the first molding layer 140 .
- the first trenches 143 may be formed by, for example, a laser drilling process or an etching process.
- the interposer 300 is arranged on the first molding layer 140 and the first semiconductor chip 120 . As the first protrusions 320 of the interposer 300 are inserted into the first trenches 143 of the first molding layer 140 , the interposer 300 may be aligned on the first molding layer 140 . When the interposer 300 is arranged on the first molding layer 140 , by the first protrusions 320 and the spacers 340 of the interposer 300 , the interposer substrate 310 may be spaced apart from the upper surface of the first molding layer 140 by a uniform distance.
- a plurality of interposers 300 may be arranged on the plurality of first semiconductor chips 120 on the first package substrate 110 .
- a reflow process is performed so that the conductive connectors 210 are attached to the interposer lower pads 315 of the interposer substrate 310 .
- a material that forms the conductive connectors 210 is melted in a liquid state and then hardened.
- an upper portion of the material transformed to be convex due to surface tension and may be attached to the interposer lower pads 315 formed of a metal.
- the material that forms the conductive connectors 210 may be hardened in a state of being attached to the interposer lower pads 315 .
- the conductive connectors 210 are extended to be attached to the lower pads 115 and a volume of the conductive connectors 210 is partially reduced while the conductive connectors 210 are changed from the liquid to a solid. Accordingly, a gap may be formed between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 .
- the insulating filter 220 is formed.
- the insulating filler 220 may fill a gap between the interposer 300 and the first molding layer 140 and a gap between the interposer 300 and the first semiconductor chip 120 .
- the plurality of interposers 300 may be attached onto the package substrate 110 through the insulating filler 220 .
- the insulating filler 220 may fill a gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 .
- an insulating filling material may be injected through a gap between adjacent interposers 300 .
- the insulating filling material may be injected by using a nozzle.
- the insulating filling material may flow to the gap between the interposer 300 and the first molding layer 140 , the gap between the interposer 300 and the first semiconductor chip 120 , and the gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 by capillary action.
- the insulating filler 220 that fills the gap between the interposer 300 and the first molding layer 140 , the gap between the interposer 300 and the first semiconductor chip 120 , and the gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 may be formed.
- the insulating filler 220 may be formed of a non-conductive film.
- the non-conductive film may be arranged on the lower surface of the interposer 300 . Then, when a thermo-compression process is performed on the non-conductive film, a material that forms the non-conductive film may flow to fill the gap between the interposer 300 and the first molding layer 140 , the gap between the interposer 300 and the first semiconductor chip 120 , and the gap between the side walls of the conductive connectors 210 and the inner wall of the first molding layer 140 .
- a singulation process of cutting off the resultant material illustrated in FIG. 9G along the scribe lane SL by using a sawing blade is performed so that the individualized semiconductor package 10 c may be completed as illustrated in FIG. 6 .
- a laser drilling process for exposing the connectors covered with a molding layer is performed. While the laser drilling process is performed, a problem in which an oxide is formed on surfaces of the connectors or a foreign substance resides around the connectors frequently occurs.
- the laser drilling process for exposing the conductive connectors 210 may be omitted. Since the laser drilling process is omitted, adhesion reliability between the first package substrate 110 and the interposer 300 using the conductive connectors 210 may improve, manufacturing processes of the semiconductor package 10 may be simplified, and manufacturing expenses of the semiconductor package 10 may be reduced.
- the thickness of the first semiconductor chip 120 may be reduced during the polishing process for exposing the conductive connectors 210 , the light, thin, and simplified semiconductor package 10 c may be provided.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
Claims (20)
Priority Applications (1)
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US17/835,768 US11798889B2 (en) | 2019-12-11 | 2022-06-08 | Methods of manufacturing semiconductor packages |
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KR10-2019-0164801 | 2019-12-11 | ||
KR1020190164801A KR20210073958A (en) | 2019-12-11 | 2019-12-11 | Semiconductor package |
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US17/835,768 Continuation US11798889B2 (en) | 2019-12-11 | 2022-06-08 | Methods of manufacturing semiconductor packages |
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US20210183777A1 US20210183777A1 (en) | 2021-06-17 |
US11367688B2 true US11367688B2 (en) | 2022-06-21 |
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US17/835,768 Active US11798889B2 (en) | 2019-12-11 | 2022-06-08 | Methods of manufacturing semiconductor packages |
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KR (1) | KR20210073958A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220302035A1 (en) * | 2019-12-11 | 2022-09-22 | Samsung Electronics Co., Ltd. | Semiconductor package with interposer |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI768552B (en) * | 2020-11-20 | 2022-06-21 | 力成科技股份有限公司 | Stacked semiconductor package and packaging method thereof |
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2019
- 2019-12-11 KR KR1020190164801A patent/KR20210073958A/en not_active Application Discontinuation
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- 2020-11-05 US US17/090,502 patent/US11367688B2/en active Active
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Also Published As
Publication number | Publication date |
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US20220302035A1 (en) | 2022-09-22 |
US20210183777A1 (en) | 2021-06-17 |
US11798889B2 (en) | 2023-10-24 |
KR20210073958A (en) | 2021-06-21 |
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