US10887996B2 - Electronic components coated with a topological insulator - Google Patents
Electronic components coated with a topological insulator Download PDFInfo
- Publication number
- US10887996B2 US10887996B2 US15/815,572 US201715815572A US10887996B2 US 10887996 B2 US10887996 B2 US 10887996B2 US 201715815572 A US201715815572 A US 201715815572A US 10887996 B2 US10887996 B2 US 10887996B2
- Authority
- US
- United States
- Prior art keywords
- coating layer
- topological insulator
- electronic component
- insulator coating
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/18—Packaging or power distribution
- G06F1/183—Internal mounting support structures, e.g. for printed circuit boards, internal connecting means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K5/00—Casings, cabinets or drawers for electric apparatus
- H05K5/06—Hermetically-sealed casings
- H05K5/065—Hermetically-sealed casings sealed by encapsulation, e.g. waterproof resin forming an integral casing, injection moulding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0242—Shape of an individual particle
- H05K2201/026—Nanotubes or nanowires
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/032—Materials
- H05K2201/0323—Carbon
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/125—Inorganic compounds, e.g. silver salt
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/163—Monitoring a manufacturing process
Definitions
- the present disclosure is directed to systems and methods for coating electronic components.
- Electronic components and electrical connections can be sensitive to environmental elements (e.g., temperature, pressure, humidity, etc.). For example, extreme changes in temperature, pressure, and/or humidity, such as experienced in some aerospace applications, can lead to undesirable effects on component or connections. To prevent such effects, these components and connections are often coated to prevent their exposure to the environmental elements, thus increasing their service life.
- environmental elements e.g., temperature, pressure, humidity, etc.
- the components and connections may need to be visible or transparent to a specific wavelength of electromagnetic radiation during normal operation to transmit and receive signals.
- conformal coatings are sometimes used.
- conformal coatings are oftentimes heavy and/or bulky, adding excess weight and/or taking up excessive volume.
- additional weight and volume are undesirable. Therefore, there exists a need for enhanced coatings for electronic components and connections.
- a method for increasing a service lifetime of an electronic component includes applying a topological insulator coating layer on a surface of the electronic component and performing a test on the electronic component with the topological insulator coating layer applied thereto.
- the electronic component with the topological insulator coating layer exhibits at least a 100% improvement during the test when compared to an otherwise equivalent electronic component without the topological insulator layer applied thereto.
- the electronic component with the topological insulator coating layer exhibits at least a 100% improvement during the test when compared to an otherwise equivalent electronic component with a graphene layer applied thereto.
- the test includes at least one of: a waterproofness test, an acetic acid test, a sugar solution test, and a methyl alcohol test.
- the electronic device includes an electronic component that includes an electrical contact, a transformer, a resistor, a capacitor, an inductor, a microprocessor, an integrated circuit, a memory device, a circuit board, or a combination thereof.
- a three-dimensional topological insulator coating layer is disposed on a surface of the electronic component.
- the topological insulator coating layer includes at least one element selected from bismuth and antimony.
- the topological insulator coating layer has a thickness ranging from about 10 nm to about 100 nm.
- the electronic component with the topological insulator coating layer exhibits at least a 1000% improvement during each of multiple tests when compared to an otherwise equivalent electronic component without the topological insulator layer applied thereto.
- the electronic component with the topological insulator coating layer exhibits at least a 1000% improvement during each of multiple tests when compared to an otherwise equivalent electronic component with a graphene layer applied thereto.
- the multiple tests include: a waterproofness test, an acetic acid test, a sugar solution test, and a methyl alcohol test.
- FIG. 1 illustrates a schematic, cross-sectional view of an electrical device, according to an implementation of the present disclosure.
- FIG. 2 illustrates a schematic, cross-sectional view of an electrical device, according to an implementation of the present disclosure.
- FIG. 3 illustrates a schematic, cross-sectional view of an electrical device, according to an implementation of the present disclosure.
- the present disclosure is directed to electronic components having a coating applied thereto.
- the electronic component can be coupled to the interior or exterior of a vehicle such as a spacecraft, airplane, submarine, automobile, building, or other structure.
- Application of the coating can enable the electronic component to be used in air, water, space, a toxic chemical environment, or other environment.
- the coating can be or include a topological insulator (TI). More particularly, a TI coating can be applied to or disposed on an environment-facing surface of the electronic component.
- An “environment-facing” surface refers to any surface that is exposed to the external environment of the component. The environment-facing surface can thus be exposed to various conditions and/or stimuli. For example, in some implementations, the environment-facing surface can be exposed to extreme temperature, pressure, humidity, airborne contaminants, etc. The environment-facing surface can also be exposed to rain, liquid spills, or other accidents that can occur in the vicinity of the electronic component. In some implementations, the environment-facing surface can be exposed to and/or oriented toward the interior of a vehicle or other environment.
- the environment-facing surface can be exposed to and/or oriented toward a passenger compartment and/or cockpit of an airplane cabin.
- the environment-facing surface can be exposed to and/or oriented toward the exterior of a vehicle or other environment.
- the electronic component, with the TI coating applied thereto can be coupled or adhered to the exterior surface of an aircraft.
- the TI coating can provide enhanced protection from environmental exposure without significantly increasing the total volume or mass of the electronic component.
- an electronic component with a TI coating can exhibit an increased water-in-air contact angle on the environment-facing surface of the electronic component and/or increased corrosion resistance compared to an uncoated electronic component or compared to an electronic component with a graphene coating.
- the TI coating can have a reduced thickness and/or improved optical transparency compared to some other coatings (e.g., graphene) that are applied to electronic components.
- the benefit or technical effect of applying a TI coating layer on an environment-facing surface of the electrical component is that the TI coating layer has more variability than a graphene coating layer. More particularly, the TI coating layer can have a different geometry than a graphene coating layer, which is a benefit that allows the TI coating layer to take on different shapes and be applied to different surfaces than a graphene coating layer. Moreover, the dielectric properties of the TI coating layer (e.g., resistance and insulative properties) can be specifically tailored because the TI coating layer involves multiple species, whereas the same properties cannot be tailored in a graphene coating layer.
- the diameter, thickness, and angle of adhesion of the TI coating layer can be modified, whereas the same properties of a graphene coating layer cannot be modified (i.e., they are set).
- the modifications can include different geometrical properties or dopants that are added, which can modify the TI coating layer properties.
- the manufacturing of the TI coating layer can be easier than a graphene coating layer. For example, when using a CVD process, a hydrogen atmosphere needs to be maintained to produce a graphene coating layer, but the hydrogen layer does not need to be maintained to produce the TI coating layer.
- FIG. 1 illustrates a side view of an electrical device 100 .
- the electrical device 100 includes an electronic component 110 .
- the electronic component 110 can be or include an electronic sensor, a radar, an antenna, a dish antenna, a humidity detector, an audio detector, a nuclear detector, a biosensor, or the like.
- the electronic component 110 can be or include one or more electrical contacts, transformers, resistors, capacitors, inductors, microprocessors, integrated circuits, memory devices, circuit boards, or a combination thereof.
- the electronic component 110 includes a circuit board such as a printed circuit board, which can include one or more electronic connections or connectors.
- the electronic component 110 can include or be formed from any suitable material.
- the electronic component 110 can include or be formed from a laminate such as a copper-clad laminate, a resin impregnated B-stage cloth, an epoxy, a liquid photoimageable solder mask ink, and/or a dry film photoimageable solder mask.
- the electronic component 110 can include or be formed from a semiconductor material such as Si, Ge, or InP; a metal such as aluminum, stainless steel, gold, silver, or cooper; and/or a dielectric material such as sapphire, SiO 2 , and SiC. Any other suitable materials can also be used.
- the electronic component 110 is depicted schematically in FIG. 1 as having a rectangular cross-section and a flat planar surface.
- the electronic component 110 can have a circular, elliptical, or other cross sectional shape.
- an environment-facing surface 112 of the electronic component 110 can have a curvature, including a convex curvature, a concave curvature, or a periodic or undulating curvature.
- the surface 112 of the electronic component 110 can have one or more electronic subcomponents disposed thereon, creating a textured or irregular surface.
- one or more transformers, resistors, capacitors and/or inductors can be disposed on the surface 112 .
- a coating layer 120 can be applied to or disposed on the surface 112 of the electronic component 110 .
- the coating layer 120 can be or include a non-carbon based topological insulator (TI) 130 .
- topological insulator means a two-dimensional (“2D”) or three-dimensional (“3D”) material with time-reversal symmetry and topologically protected edge states (2D) or surface states (3D).
- 2D topological insulator generally will not conduct current across the surface of the 2D material, but can carry current along the edges of the 2D material.
- a 3D topological insulator generally will not conduct current through the bulk of the 3D material, but can carry current along the surface of the 3D material.
- non-carbon-based topological insulator means a topological insulator whose crystal structure does not include carbon.
- the topological insulator 130 is depicted schematically in FIG. 1 by a line resembling an alkane chain.
- the surface 112 of the electronic component 110 includes electronic subcomponents (e.g., transformers, resistors, capacitors and/or inductors) as mentioned above, the topological insulator 130 can be disposed over the subcomponents.
- One benefit or technical effect of the coating layer 120 be that the coating layer 120 can have a different geometry than a graphene coating layer, allowing the coating layer 120 to take on different shapes and be applied to different surfaces (e.g., of the electrical components), while a graphene coating layer can be incapable of being applied to such surfaces.
- the topological insulator 130 may include at least one element selected from bismuth and antimony.
- the topological insulator 130 can include at least one compound selected from bismuth selenide (Bi 2 Se 3 ), bismuth telluride (Bi 2 Te 3 ), antimony telluride (Sb 2 Te 3 ), boron nitride (BN), bismuth tellurium (BiTe), molybdenite (MoS 2 ), bismuth antimonide (BiSb), mercury telluride (HgTe), cadmium Telluride (CdTe), bismuth selenide (Bi 2 Se 3 ), or a combination thereof.
- non-carbon-based topological insulators 130 can include antimony (Sb), bismuth (Bi), selenium (Se), or tellurium (Te), or combinations thereof.
- some 2D, non-carbon-based topological insulators 130 can include CdTe/HgTe/CdTe quantum wells, AlSb/InAs/GaSb/AlSb quantum wells, Bi bilayers, monolayer low-buckled HgSe, monolayer low-buckled HgTe, strained HgTe, or silicene, or combinations thereof.
- non-carbon-based topological insulators 130 can include antimony (Sb), bismuth (Bi), selenium (Se), or tellurium (Te), or combinations thereof.
- some 3D, non-carbon-based topological insulators 130 can include Bi 1-x Sb x (0 ⁇ x ⁇ 1) (e.g., Bi 0.9 Sb 0.1 ), Bi 1-x Te x (0 ⁇ x ⁇ 1), Bi 1-x Te x (0 ⁇ x ⁇ 1), Sb, Bi 2 Se 3 , Bi 2 Te 3 , Sb 2 Te 3 , Bi 2 Te 2 Se, (Bi,Sb) 2 Te 3 (e.g., (Bi 0.2 Sb 0.8 ) 2 Te 3 ), Bi 2-x Sb x Te 3-y Se y (0 ⁇ x ⁇ 2; 0 ⁇ y ⁇ 3), Bi 2-x Sb x Te 3-y Se y (0 ⁇ x ⁇ 2; 1 ⁇ y ⁇ 3) (e.g., Bi 2 Te 1.95 Se 1.05 , BiSbTe 1.25 Se 1.
- Employing the compounds above can modify the dielectric properties of the topological insulators 130 (e.g., resistance and insulative properties) to allow the properties to be specifically tailored, whereas the same properties cannot be tailored in graphene.
- the diameter, thickness, and angle of adhesion of the topological insulators 130 can be modified, whereas the same properties of graphene cannot be modified (i.e., they are set).
- the coating layer 120 can include a two-dimensional monolayer or a three-dimensional layer having any desired thickness described herein.
- the two-dimensional or three-dimensional topological insulators 130 can have a different geometry than graphene, allowing the topological insulators 130 to be applied to different surfaces than graphene.
- the coating layer 120 can include one or more layers of the topological insulator 130 .
- the layers of the topological insulator 130 can be stacked so that each layer of the plurality of layers physically contacts at least one adjacent layer of the plurality of layers. Any number of topological insulators 130 can be employed.
- the coating layer 120 can include 2 to 25 layers or more of the topological insulator 130 , such as 5 to 20 layers. This enables the TI coating layer 120 to have a different geometry than a graphene coating layer, allowing the TI coating layer 120 to take on different shapes and be applied to different surfaces than a graphene coating layer.
- the non-carbon based topological insulator 130 can be made thicker while still maintaining high thermal conductivity of the two-dimensional material.
- the coating layer 120 can have any suitable thickness that will provide a desired heat transfer away from the electrical component 110 .
- the coating layer 120 can have a thickness ranging from about 10 nm to about 10 ⁇ m, such as about 10 nm to about 1 ⁇ m, about 10 nm to about 100 nm, about 20 nm to about 10 ⁇ m, about 30 nm to about 1 ⁇ m, or about 40 nm to about 100 nm. Any other suitable thicknesses can also be employed.
- the thickness can allow the TI coating layer 120 to have a different geometry than a graphene coating layer, allowing the TI coating layer 120 to take on different shapes and be applied to different surfaces than a graphene coating layer.
- an intermediary insulating material layer (not shown) can be disposed between the surface 112 , including the one or more electronic subcomponents that can be disposed on the surface 112 , and the coating layer 120 .
- the intermediary insulating material layer can be or include an electrical insulating layer, an adhesion layer for improving adhesion between the coating layer 120 and the electrical component 110 , and/or a thermally conductive layer for enhancing thermal conduction between the electrical component 110 and the coating layer 120 .
- the intermediary insulating material layer can be or include an insulating layer selected from an organic or inorganic electrical insulating material, such as a polymer, plastic, silicon dioxide, ceramic, or other suitable material.
- the intermediary insulating material layer can have any suitable thickness, such as, for example, a thickness ranging from about 10 nm to about 10 ⁇ m, such as about 50 nm to about 5 ⁇ m, or about 100 nm to about 1 ⁇ m.
- FIG. 2 illustrates an electrical device 200 including an electronic component 210 .
- the electronic component 210 can be similar to the electronic component 110 discussed above.
- the electronic component 210 can have a coating layer 220 applied to or disposed on an environmentally-facing surface 212 of the electronic component 210 .
- the coating layer 220 can include a plurality of nanotubes made from a non-carbon based topological insulator that are substantially horizontal or substantially vertical with respect to the environment-facing surface 212 of the electronic component 210 .
- the coating layer 220 includes a plurality of topological insulator nanotubes 230 oriented horizontally or substantially horizontally on the surface 212 of the electrical component 210 .
- a “horizontal” orientation includes an orientation wherein the long axis of a topological insulator nanotube 230 is oriented parallel to the surface 212 .
- all of the topological insulator nanotubes 230 are depicted as having a long axis oriented parallel to the surface 212 .
- one or more topological insulator nanotubes 230 can have a long axis along line A′ in FIG. 2 or along some other direction that is not parallel to the surface 212 .
- a “substantially horizontal” orientation is an orientation wherein the long axis (A′) of a topological insulator nanotube 230 forms an angle ( ⁇ 1 ) of less than about 45 degrees with a line (A) parallel to the surface 212 of the electrical component 210 .
- the angle ( ⁇ 1 ) is less than about 30 degrees or less than about 15 degrees.
- the angle ( ⁇ 1 ) is between about 0 degrees and about 30 degrees.
- a majority of the topological insulator nanotubes 230 of the coating layer 220 have a horizontal or substantially horizontal orientation. Further, in some implementations, at least about 60 percent, at least about 70 percent, at least about 80 percent, or at least about 90 percent of the topological insulator nanotubes 230 have a horizontal or substantially horizontal orientation.
- the topological insulator nanotubes of the coating layer can be oriented vertically or substantially vertically.
- an electrical device 300 includes an electrical component 310 and a coating layer 320 disposed on an environmentally-facing surface 312 of the electrical component 310 .
- One or more optional layers can be positioned between the surface 312 and the coating layer 320 .
- the coating layer 320 includes a plurality of topological insulator nanotubes 330 oriented vertically or substantially vertically on the surface 312 of the electrical component 310 . Vertical orientation is relative to the surface 312 .
- a “vertical orientation” includes an orientation wherein the long axis of a topological insulator nanotube 330 is oriented perpendicular to the surface 312 .
- all of the topological insulator nanotube 330 are depicted as having a long axis oriented perpendicular to the surface 312 .
- one or more topological insulator nanotubes 330 can have a long axis along line B′ in FIG. 3 or along some other direction that is not perpendicular to the surface 312 .
- a “substantially vertical” orientation is an orientation wherein the long axis (B′) of a topological insulator nanotube forms an angle ( ⁇ 2 ) of less than about 45 degrees with a line (B) perpendicular to the surface of the electrical component 310 .
- the angle ( ⁇ 2 ) is less than about 30 degrees or less than about 15 degrees.
- the angle ( ⁇ 2 ) is between about 0 degrees and about 30 degrees.
- a majority of the topological insulator nanotubes 330 have a vertical or substantially vertical orientation.
- At least about 60 percent, at least about 70 percent, at least about 80 percent, or at least about 90 percent of the topological insulator nanotubes 330 have a vertical or substantially vertical orientation.
- the coating layer described herein can include of a monolayer of topological insulator nanotubes, including a monolayer of horizontally or substantially horizontally oriented topological insulator nanotubes or a monolayer of vertically or substantially vertically oriented topological insulator nanotubes.
- the benefit or technical effect of using TI nanotubes can be that the TI nanotubes have more variability than graphene. More particularly, the TI nanotubes can have a different geometry than graphene, allowing the TI coating layer to take on different shapes and be applied to different surfaces than a graphene coating layer. Moreover, the dielectric properties of the TI nanotubes (e.g., resistance and insulative properties) can be specifically tailored, whereas the same properties cannot be tailored in a graphene coating layer. In addition, the diameter, thickness, and angle of adhesion of the TI nanotubes can be modified, whereas the same properties of a graphene coating layer cannot be modified (i.e., they are set). The modifications can include different geometrical properties or dopants that are added.
- the manufacturing of the TI coating layer can be easier than a graphene coating layer.
- a hydrogen atmosphere needs to be maintained to produce a graphene coating layer, but the hydrogen layer does not need to be maintained to produce the TI coating layer.
- a TI coating layer as described herein can have any thickness not inconsistent with the objectives of the present disclosure.
- the coating layer can have an average thickness of about 300 nm or less, about 200 nm or less, about 100 nm or less, about 50 nm or less, about 10 nm or less, about 5 nm or less, about 3 nm or less, about 2 nm or less, or about 1 nm or less.
- the coating layer described herein can have an average thickness between about 1 nm and about 300 nm, between about 1 nm and about 200 nm, between about 1 nm and about 100 nm, between about 10 nm and about 300 nm, between about 10 nm and about 200 nm, between about 10 nm and about 100 nm, between about 50 nm and about 300 nm, between about 50 nm and about 200 nm, between about 50 nm and about 100 nm, or between about 100 nm and about 300 nm.
- the average thickness of the coating layer can be less than about 50 times the average diameter of the topological insulator nanotubes. In some implementations, the average thickness of the coating layer can less than about 20 times, less than about 10 times, less than about 5 times, less than about 3 times, or less than about 2 times, less than about 1.5 times, or less than about 1 times the average length of the topological insulator nanotubes.
- the coating layer described herein can include or be formed from a plurality of topological insulator platelets connected by micro-wires.
- a plurality of topological insulator platelets can be disposed on the environment-facing surface of the electronic component, and the plurality of topological insulator platelets can be connected by one or more micro-wires.
- the topological insulator platelets can be pre-fabricated separately from the electronic component and subsequently disposed upon the environment-facing surface of the electronic component for subsequent connection by micro-wires.
- the topological insulator platelets have a width or diameter from about 1 ⁇ m to about 2000 ⁇ m, about 50 ⁇ m to about 1800 ⁇ m, about 200 ⁇ m to about 1500 ⁇ m, about 400 ⁇ m to about 1200 ⁇ m, about 1 ⁇ m to about 1500 ⁇ m, about 500 ⁇ m to about 1300 ⁇ m, about 1000 ⁇ m to about 2000 ⁇ m, or about 50 ⁇ m to about 1000 ⁇ m.
- TI platelets can be or include any of the benefits listed above for the TI nanotubes.
- micro-wires of the TI coating layer can be formed from any material not inconsistent with the objectives of the present disclosure.
- the micro-wires are formed from metallic nanoparticles such as gold nanoparticles, polymer microspheres, and/or combinations thereof.
- the micro-wires can be formed from mixed suspensions of gold and sub-micron sized polystyrene latex microspheres. Further, the micro-wires can have any size or shape not inconsistent with the objectives of the present disclosure.
- the micro-wires have a diameter from about 1 nm to about 100 nm, about 10 nm to about 40 nm, about 15 nm to about 50 nm, about 1 nm to about 30 nm, about 15 nm to about 30 nm, or about 15 nm to about 100 nm.
- the micro-wires have a length from about 15 nm to 5 cm, about 100 nm to about 5 cm, about 500 nm to about 5 cm, about 1 ⁇ m to about 5 cm, about 1 mm to about 5 cm, about 15 nm to about 1 cm, about 500 nm to about 1 cm, about 1 cm to about 5 cm, about 1 ⁇ m to about 1 cm, about 1 mm to about 1 cm, or about 5 mm to about 3 cm.
- the micro-wires can be formed by a dielectrophoretic assembly process. These diameters may facilitate manufacturing of the micro-wires.
- the coating layer can be disposed directly on the surface of the electronic component.
- the coating layer can be bonded or adhered to the surface of the electronic component.
- the bonding can include chemical bonding, physical bonding, covalent bonding, ionic bonding, hydrogen bonding, electrostatic interactions, and van der Waals interactions.
- the coating layer described herein can be bonded or adhered to the surface of the electronic component with an adhesion energy of at least about 75 mJ/m 2 or at least about 100 mJ/m 2 , when measured by scanning electron microscopy (SEM) according to the method of Zong et al., “Direct measurement of graphene adhesion on silicon surface by intercalation of nanoparticles,” J. Appl.
- the blister is provided by disposing a so-called wedge particle or intercalated nanoparticle between the coating layer and the substrate, as taught by Zong et al.
- the wedge particle can include a gold or silver nanoparticle having a diameter between about 10 nm and about 100 nm, where the wedge particle is disposed between the electronic component and the coating layer for measurement purposes.
- the coating layer is bonded or adhered to the surface of the electronic component with an adhesion energy of at least about 150 mJ/m 2 when measured as described herein.
- the coating layer is bonded or adhered to a surface of an electronic component with an adhesion energy between about 50 mJ/m 2 and about 300 mJ/m 2 or between about 100 mJ/m 2 and about 200 mJ/m 2 .
- the coating layer described herein resists delamination or other detachment from the electronic component over time, including when exposed to adverse environmental conditions, such as extreme temperatures, high humidity, dust, or electromagnetic radiation exposure, or when exposed to variations or cycles of exposure to such conditions.
- the coating layer is continuous or substantially continuous across the entire surface of the electronic component.
- the insulating material layer can include or be formed from a polymeric material such as a plastic or rubber material.
- the insulating material layer can include or be formed from bi-layer graphene (BLG) or graphene oxide.
- the insulating material layer can include or be formed from an inorganic material such as silicon dioxide or a ceramic.
- Graphene has limits due to its fixed physical properties, whereas the TI properties can be varied. In another case involving a clean silicon surface, silicon dioxide would be easier to implement. Ceramics are also a useful alternative, as they are highly insulative, very tough, and easy to incorporate.
- the insulating layer can have an average thickness of about 10 ⁇ m or less, about 1 ⁇ m or less, or about 500 nm or less. In some implementations, the insulating layer can have an average thickness from about 100 nm to about 10 ⁇ m, about 500 nm to about 10 ⁇ m, or about 100 nm to about 1 ⁇ m. These thickness values may facilitate manufacturing.
- the coated electronic component described herein can exhibit one or more desired properties.
- the electronic component with a topological insulator coating can exhibit a high optical transparency, including in the visible region of the electromagnetic spectrum.
- optical transparency is relative to the total amount of incident radiation in a given wavelength range.
- Optical transparency can be measured with a broad spectral source or a narrow spectral source.
- optical transparency is measured with a spectrometer such as a BECKMAN spectrometer.
- the coating layer can exhibit an optical transparency of at least about 60 percent, at least about 70 percent, at least about 80%, at least about 90%, or at least about 95% at wavelengths from about 350 nm and about 750 nm. In some implementations, the coating layer can exhibit an optical transparency from about 60% to about 99.99% or about 70% to about 95% at wavelengths from about 350 nm and about 750 nm. Moreover, in some implementations, the coating layer can exhibit an optical transparency from about 60% to about 99.99% or about 75% to about 95% at wavelengths from about 200 nm and about 800 nm or about 220 nm to about 350 nm.
- the coating layer can exhibit high water resistance.
- the coating layer can exhibit a water-in-air contact angle of at least about 95 degrees, at least about 100 degrees, or at least about 110 degrees on the environment-facing surface of the electronic component.
- the coating layer can exhibit a water-in-air contact angle from about 95 degrees to about 130 degrees, about 95 degrees to about 125 degrees, about 95 degrees to about 110 degrees, about 95 degrees to about 105 degrees, or about 95 degrees to about 100 degrees.
- the water-in-air contact angle can be measured by a static sessile drop method or a dynamic sessile drop method using a contact angle goniometer.
- the coating layer can exhibit a high mechanical hardness, stiffness, or resistance to compression.
- the coating layer can exhibit a tensile modulus of up to about 2 TPa or up to about 1 TPa, when measured by nanoindentation in an atomic force microscope (AFM) according to the method described in Lee et al., “Measurement of the Elastic Properties and Intrinsic Strength of Monolayer Graphene,” Science, volume 321, number 5887, pages 385-388 (18 Jul. 2008).
- the coating layer is disposed on an electronic component having a plurality of circular wells (diameter of about 1 ⁇ m to 1.5 ⁇ m, depth of about 500 nm). The coating layer deposited over the wells can form a series of free-standing membranes.
- the coated electronic component can exhibit a tensile modulus of up to about 500 Gpa, up to about 100 Gpa, up to about 50 GPa, or up to about 30 GPa when measured by nanoindentation.
- the coated electronic component can exhibit a tensile modulus from about 1 GPa to about 1 Tpa, about 500 GPa to about 1 TPa, or about 10 GPa to about 30 GPa when measured by nanoindentation in an atomic force microscope.
- the TI coating can have one or more of the following features:
- a method of coating the electronic component can include applying a layer of a topological insulator on the environment-facing surface of the electronic component to provide the TI coating layer. Moreover, the method can include applying a layer of electrically insulating material on the environment-facing surface of the electronic component, and the layer of insulating material can be positioned between the environment-facing surface and the TI coating layer.
- TI coating layer can applied using vapor deposition.
- Vapor deposition can include chemical vapor deposition (CVD).
- CVD can be used to provide the TI coating layer including one or more topological insulator sheets.
- one or more of atmospheric pressure CVD, ultrahigh vacuum CVD, or hot filament (or hot wire or catalytic) CVD can be used.
- the CVD method can include applying the TI coating layer from one or more carbon-containing gas-phase reactants.
- the gas-phase reactant can be or include a hydrocarbon.
- the gas-phase reactant can be or include benzene, ethane, methane, or a combination or mixture thereof.
- the gas-phase reactant can be provided in a carrier gas such as H 2 .
- applying the TI coating layer can be carried out using catalytic vapor phase deposition.
- Catalytic vapor deposition can be used to provide the TI coating layer including a layer of topological insulator nanotubes having a vertical or substantially vertical orientation.
- the catalytic vapor phase deposition method can include applying metal catalyst particles on a surface of the electronic component.
- the metal catalyst particles can be disposed on the electronic component in an array, such as an ordered array of equally spaced particles.
- the size of the metal catalyst particles can be selected to obtain a desired topological insulator nanotube diameter.
- the metal catalyst particles can have an average diameter ranging from about 1 nm to about 20 nm, about 1 nm to about 10 nm, or less than about 1 nm.
- the metal catalyst particles can be or include one or more transition metals, including pure metals, metal alloys, or mixtures of metals (e.g., nickel particles, or a noble metal such as gold or silver).
- the catalytic vapor phase deposition method can include introducing the electronic component into a vacuum chamber and heating the electronic component.
- the electronic component including a layer of metal catalyst particles can be heated in the vacuum chamber to a temperature between about 600° C. and about 800° C.
- connecting the plurality of topological insulator platelets can be carried out by a dielectrophoretic method.
- the electronic component with topological insulator platelets disposed on the environment-facing surface can be subjected to dielectrophoresis with a distance between electrodes from about 1 ⁇ m to more than about 1 cm, depending on the desired length of microwiring.
- Nanoparticles formed from a material selected for specific properties such as conductivity can then be introduced into a chamber above the electrodes.
- the nanoparticles can include gold nanoparticles having a diameter between about 15 nm and about 30 nm. Alternating voltage can then be applied to the dielectrophoretic chamber.
- Alternating voltage of about 50 V to about 250 V with a frequency of about 50 Hz to about 200 Hz can be applied to the electrodes. Applying alternating voltage can result in the formation of thin, metallic fibers. Regions of topological insulator platelets, can form islands on an otherwise homogeneous substrate, causing micro-wire growth in the direction of the platelets and connecting the platelets to both electrodes.
- micro-wires can be formed by a dielectrophoretic assembly process described in Hermanson et al. “Dielectrophoretic Assembly of Electrically Functional Microwires from Nanoparticle Suspensions,” Science, vol. 294 (5544), pages 1082-1086 (2001).
- the method of coating the electronic component can also include removing a portion of the TI coating layer. Removal of a portion of the TI coating layer can result in a smoother or more uniform environment-facing surface of the TI coating layer.
- the method can also include applying a layer of electrically insulating material on the environment-facing surface of the electronic component, where the layer of insulating material is positioned between the environment-facing surface and the TI coating layer.
- the electrically insulating layer can be formed by dip coating or spray coating.
- the electrical device can exhibit at least a 100% or at least a 1000% improvement in environmental testing performance compared to an otherwise equivalent electrical device with no coating layer or an otherwise equivalent electronic device with a graphene coating layer.
- the environmental testing performance includes performance in one or more (e.g., one, two, three, or all four) of a waterproofness test, an acetic acid test, a sugar solution test, and a methyl alcohol test.
- the electrical device with the TI coating layer can exhibit at least a 100% improvement, at least a 1000% improvement, at least a 2000% improvement, at least a 5000% improvement, or at least a 10,000% improvement in a waterproofness test when compared to an otherwise equivalent electrical device with no coating layer and/or when compared to an otherwise equivalent electronic device with a graphene coating layer.
- the improvement in the waterproofness test can be less when compared to the otherwise equivalent electronic device with the graphene coating layer than when compared to the otherwise equivalent device with no coating layer.
- the improvement in the waterproofness test can be about 250% when compared to the otherwise equivalent device with no coating layer and about 150% when compared to the otherwise equivalent electronic device with the graphene coating layer.
- the electrical device with the TI coating layer can exhibit at least a 100% improvement, at least a 1000% improvement, at least a 2000% improvement, at least a 5000% improvement, or at least a 10,000% improvement in an acetic acid test when compared to an otherwise equivalent electrical device with no coating layer and/or when compared to an otherwise equivalent electronic device with a graphene coating layer.
- the improvement in the acetic acid test can be less when compared to the otherwise equivalent electronic device with the graphene coating layer than when compared to the otherwise equivalent device with no coating layer.
- the improvement in the acetic acid test can be about 250% when compared to the otherwise equivalent device with no coating layer and about 150% when compared to the otherwise equivalent electronic device with the graphene coating layer.
- the electrical device with the TI coating layer can exhibit at least a 100% improvement, at least a 1000% improvement, at least a 2000% improvement, at least a 5000% improvement, or at least a 10,000% improvement in a sugar solution test when compared to an otherwise equivalent electrical device with no coating layer and/or when compared to an otherwise equivalent electronic device with a graphene coating layer.
- the improvement in the sugar solution test can be less when compared to the otherwise equivalent electronic device with the graphene coating layer than when compared to the otherwise equivalent device with no coating layer.
- the improvement in the sugar solution test can be about 250% when compared to the otherwise equivalent device with no coating layer and about 150% when compared to the otherwise equivalent electronic device with the graphene coating layer.
- the electrical device with the TI coating layer can exhibit at least a 100% improvement, at least a 1000% improvement, at least a 2000% improvement, at least a 5000% improvement, or at least a 10,000% improvement in a methyl alcohol test when compared to an otherwise equivalent electrical device with no coating layer and/or when compared to an otherwise equivalent electronic device with a graphene coating layer.
- the improvement in the methyl alcohol test can be less when compared to the otherwise equivalent electronic device with the graphene coating layer than when compared to the otherwise equivalent device with no coating layer.
- the improvement in the methyl alcohol test can be about 250% when compared to the otherwise equivalent device with no coating layer and about 150% when compared to the otherwise equivalent electronic device with the graphene coating layer.
- the environmental testing performance of an electronic apparatus can be measured as set forth in Environmental Conditions and Test Procedures for Airborne Equipment, Document DO-160 issued by RTCA, Inc., the entirety of which is hereby incorporated by reference.
- An electronic component with a TI coating layer is prepared as follows.
- a TI coating layer including a flat planar TI sheet is applied to a surface of a cleaned electronic component by disposing the electronic component in a CVD chamber and exposing the electronic component to CVD deposition conditions.
- the electronic component can also have an electrically insulating layer disposed on its surface prior to deposition of the TI coating layer.
- the deposition of the TI coating layer is carried out at 500° C. for approximately 100 minutes in an atmosphere of 100 Torr partial pressure benzene, ethane or methane and 1 Torr partial pressure H 2 , at a total pressure of approximately 101 Torr.
- the thickness of the resulting TI coating layer is approximately 100 nm.
- a thinner TI coating layer can be obtained by reducing the deposition time. Further, the deposition time can be selected using information obtained from a microbalance disposed in the chamber and arranged to determine the mass of material deposited on the electronic component as described hereinabove. Because the geometry of the TI is different from graphene, the TI coating layer can be applied to different surfaces than a graphene coating layer. In other words, TIs can take on different shapes than graphene can. Because there are different elements in the TIs, the CVD process can be simplified. Because graphene is only carbon, the hydrogen atmosphere needs to be maintained. It can be possible to grow the TI without the partial gas pressure in the CVD chamber. Also, because there are multiple species involved, the actual dielectric properties of the layer (and therefore the resistance or insulative properties) can be tailored for the TI coating layer.
- An electronic component with a TI coating layer is prepared as follows.
- a TI coating layer including vertically or substantially vertically oriented nanotubes made from a non-carbon based topological insulator is applied to a surface of a cleaned electronic component by disposing the electronic component in a CVD chamber and exposing the electronic component to catalytic vapor deposition conditions.
- the electronic component can also have an electrically insulating layer disposed on its surface prior to deposition of the TI coating layer.
- the deposition of the TI coating layer is carried out at an electronic component temperature of about 700° C. for approximately 100 minutes in an atmosphere of 100 Torr partial pressure acetylene or ethylene and 5 Torr partial pressure N 2 or NH 3 , at a total pressure of approximately 105 Torr.
- An array of nickel particles having a diameter of about 10 nm is disposed on the electronic component for the catalytic formation of the nanotubes.
- the resulting nanotubes are aligned and have an average diameter of about 10 nm and an average length of about 100 nm.
- the average thickness of the TI coating layer is approximately 20 nm.
- the use of the TI can allow different geometries than graphene.
- the TI also has different electrical properties than graphene.
- the precise diameter, thickness, and angle of adhesion of the TI can be modified, whereas the same properties of graphene are set and cannot be changed. The modifications can include different geometrical properties or can include dopants into the nanotubes.
- An electronic component with a TI coating layer is prepared as follows.
- a plurality of TI platelets are applied to an environment-facing surface of an electronic component.
- the electronic component can also have an electrically insulating layer disposed on its surface prior to deposition of the TI platelets.
- the component is then subjected to dielectrophoresis, with the gap between the electrodes varying from 10-100 ⁇ m, depending on the desired length of the micro-wires.
- the micro-wires form after introduction of a suspension of gold nanoparticles having a diameter of 15-30 nm into a thin chamber above planar metallic electrodes.
- An alternating voltage of 50 to 250 V and 50 to 200 Hz is applied to the planar electrodes, resulting the in the formation of thin metallic fibers.
- Conductive TI platelets form small islands on an otherwise homogeneous substrate, causing micro-wire growth in the direction of the platelets, connecting the platelets to both electrodes.
- the manufacturing of the TI platelets is easier than the manufacturing of similar graphene platelets. Unlike with graphene, no additives are needed to make the TI conductive.
- energy bands are defined by energies that can be determined by spectroscopically measuring the bandgap in the solid, for example, according to known spectroscopic methods, such as wavelength modulation spectroscopy. Generally, photons having energy values that lie below the bandgap will transmit through the solid while photons having energy values at or above the bandgap will be strongly absorbed. In wavelength modulation spectroscopy, the relative absorption of the photons is correlated with the band density of states.
- the energy bands describe electron behavior within the solid.
- electron energy can be described as a function of the electron's wave-vector as the electron travels through the solid.
- Macroscopic behavior of many electrons in the solid electric conductivity, thermal conductivity, and the like—result from the band structure.
- the geometric construction of solids do not have an effect on the band structure.
- very thin solids such as graphene, not only does the solid's geometry change but so too does its band structure. That is, for thin solids, the electron behavior changes as the geometry of the solid changes.
- whether a solid is a defined as a “2D-” or “3D-structure” depends on the solid's band structure.
- graphene is monoatomic and its 2D band structure only exists when it is one atomic layer thick.
- the addition of more atomic layers i.e., from single-layer graphene to few-layer graphene not only increases graphene's thickness, but also changes its band structure toward its 3D configuration.
- topological insulators comprise several different atoms and can be molecularly engineered.
- a topological insulator largely maintains its 2D band structure even as the material's thickness is changed.
Abstract
Description
Γ=ΛEh(w/a)4 or .gamma.=.lambda.*Eh(w/a)4 (1),
where lambda (Λ) is a geometrical factor equal to 1/16, E is 0.5 TPa, h is the thickness of the coating layer, w is a central blister displacement equal to the diameter of an intercalated nanoparticle, and a is a blister radius measured by SEM. The blister is provided by disposing a so-called wedge particle or intercalated nanoparticle between the coating layer and the substrate, as taught by Zong et al. The wedge particle can include a gold or silver nanoparticle having a diameter between about 10 nm and about 100 nm, where the wedge particle is disposed between the electronic component and the coating layer for measurement purposes. In some implementations, the coating layer is bonded or adhered to the surface of the electronic component with an adhesion energy of at least about 150 mJ/m2 when measured as described herein. In some implementations, the coating layer is bonded or adhered to a surface of an electronic component with an adhesion energy between about 50 mJ/m2 and about 300 mJ/m2 or between about 100 mJ/m2 and about 200 mJ/m2. In some implementations, the coating layer described herein resists delamination or other detachment from the electronic component over time, including when exposed to adverse environmental conditions, such as extreme temperatures, high humidity, dust, or electromagnetic radiation exposure, or when exposed to variations or cycles of exposure to such conditions. Further, in some implementations, the coating layer is continuous or substantially continuous across the entire surface of the electronic component.
F=Σ 0(Πa)(Δ/a)+E(q 3a)(Δ/a)3 or
F=.sigma..sub.0(.pi.a)(.delta./a)+E(q.sup.3a)(.delta./a).sup.3 (2),
where F is applied force, Σ0 is the pretension in the coating layer, a is the membrane diameter, Δ is the deflection at the center point, E is the tensile modulus, and q is a dimensionless constant equal to 1.02. For measurement purposes, the coating layer is disposed on an electronic component having a plurality of circular wells (diameter of about 1 μm to 1.5 μm, depth of about 500 nm). The coating layer deposited over the wells can form a series of free-standing membranes. Mechanical properties are measured by indenting the center of each free-standing membrane with an AFM, as taught by Lee et al. In some implementations, the coated electronic component can exhibit a tensile modulus of up to about 500 Gpa, up to about 100 Gpa, up to about 50 GPa, or up to about 30 GPa when measured by nanoindentation. The coated electronic component can exhibit a tensile modulus from about 1 GPa to about 1 Tpa, about 500 GPa to about 1 TPa, or about 10 GPa to about 30 GPa when measured by nanoindentation in an atomic force microscope.
Claims (30)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/815,572 US10887996B2 (en) | 2017-11-16 | 2017-11-16 | Electronic components coated with a topological insulator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/815,572 US10887996B2 (en) | 2017-11-16 | 2017-11-16 | Electronic components coated with a topological insulator |
Publications (2)
Publication Number | Publication Date |
---|---|
US20190150289A1 US20190150289A1 (en) | 2019-05-16 |
US10887996B2 true US10887996B2 (en) | 2021-01-05 |
Family
ID=66432867
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US15/815,572 Active 2038-08-22 US10887996B2 (en) | 2017-11-16 | 2017-11-16 | Electronic components coated with a topological insulator |
Country Status (1)
Country | Link |
---|---|
US (1) | US10887996B2 (en) |
Citations (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5508489A (en) | 1993-10-20 | 1996-04-16 | United Technologies Corporation | Apparatus for multiple beam laser sintering |
US6815636B2 (en) | 2003-04-09 | 2004-11-09 | 3D Systems, Inc. | Sintering using thermal image feedback |
US7515986B2 (en) | 2007-04-20 | 2009-04-07 | The Boeing Company | Methods and systems for controlling and adjusting heat distribution over a part bed |
US20100140723A1 (en) | 2003-03-25 | 2010-06-10 | Kulite Semiconductor Products, Inc. | Nanotube and graphene semiconductor structures with varying electrical properties |
US20120138887A1 (en) | 2010-12-07 | 2012-06-07 | The Board Of Trustees Of The Leland Stanford Junior University | Electrical and Optical Devices Incorporating Topological Materials Including Topological Insulators |
WO2013086227A1 (en) | 2011-12-09 | 2013-06-13 | Jds Uniphase Corporation | Varying beam parameter product of a laser beam |
CN103454602A (en) * | 2013-09-11 | 2013-12-18 | 北京大学 | Magnetic field measuring meter based on topological insulator and magnetic field measuring method |
CN103553000A (en) | 2013-10-26 | 2014-02-05 | 西南交通大学 | Method for preparing topological insulator Bi2Se3 and perovskite oxide La0.7Sr0.3MnO3 composite structure |
US20140199542A1 (en) | 2013-01-14 | 2014-07-17 | The Boeing Company | Graphene Coated Optical Elements |
US20140216513A1 (en) * | 2011-09-23 | 2014-08-07 | United Technologies Corporation | High zt thermoelectric with reversible junction |
US20150165556A1 (en) | 2013-12-16 | 2015-06-18 | General Electric Company | Diode laser fiber array for powder bed fabrication or repair |
US20150174695A1 (en) | 2013-12-20 | 2015-06-25 | Arcam Ab | Method for additive manufacturing |
US20150255184A1 (en) * | 2014-03-10 | 2015-09-10 | The Boeing Company | Graphene coated electronic components |
US20150257308A1 (en) | 2014-03-10 | 2015-09-10 | The Boeing Company | Graphene-based thermal management systems |
US20160082617A1 (en) | 2014-09-22 | 2016-03-24 | The Boeing Company | Nanotube particle device and method for using the same |
US9296007B2 (en) | 2013-07-12 | 2016-03-29 | The Boeing Company | Methods and apparatuses for forming large-area carbon coatings |
US20160158889A1 (en) | 2013-12-16 | 2016-06-09 | General Electric Company | Control of solidification in laser powder bed fusion additive manufacturing using a diode laser fiber array |
US20160204376A1 (en) * | 2014-08-05 | 2016-07-14 | Boe Technology Group Co., Ltd. | Barrier Film Layer, Photoelectric Device Comprising the Barrier Film Layer, and Manufacturing Method of the Photoelectric Device |
US20160364062A1 (en) | 2014-08-05 | 2016-12-15 | Boe Technology Group Co., Ltd. | Conductive Thin Film, Touch Panel and Method for Manufacturing the Same, and Display Device |
US20170090119A1 (en) | 2015-09-24 | 2017-03-30 | Nlight, Inc. | Beam parameter product (bpp) control by varying fiber-to-fiber angle |
US9630209B2 (en) | 2013-07-12 | 2017-04-25 | The Boeing Company | Methods of making large-area carbon coatings |
US9632542B2 (en) | 2013-05-02 | 2017-04-25 | The Boeing Company | Touch screens comprising graphene layers |
US20170173737A1 (en) | 2015-12-17 | 2017-06-22 | Stratasys, Inc. | Additive manufacturing method using a plurality of synchronized laser beams |
US20170194144A1 (en) | 2014-09-12 | 2017-07-06 | The Regents Of The University Of California | High performance thin films from solution processible two-dimensional nanoplates |
US9748345B2 (en) | 2015-06-15 | 2017-08-29 | National Technology & Engineering Solutions Of Sandia, Llc | Modification of electrical properties of topological insulators |
CN107620034A (en) | 2017-07-20 | 2018-01-23 | 西南交通大学 | One kind prepares transparent Bi2Se3The method of film |
-
2017
- 2017-11-16 US US15/815,572 patent/US10887996B2/en active Active
Patent Citations (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5508489A (en) | 1993-10-20 | 1996-04-16 | United Technologies Corporation | Apparatus for multiple beam laser sintering |
US20100140723A1 (en) | 2003-03-25 | 2010-06-10 | Kulite Semiconductor Products, Inc. | Nanotube and graphene semiconductor structures with varying electrical properties |
US6815636B2 (en) | 2003-04-09 | 2004-11-09 | 3D Systems, Inc. | Sintering using thermal image feedback |
US7515986B2 (en) | 2007-04-20 | 2009-04-07 | The Boeing Company | Methods and systems for controlling and adjusting heat distribution over a part bed |
US20120138887A1 (en) | 2010-12-07 | 2012-06-07 | The Board Of Trustees Of The Leland Stanford Junior University | Electrical and Optical Devices Incorporating Topological Materials Including Topological Insulators |
US20140216513A1 (en) * | 2011-09-23 | 2014-08-07 | United Technologies Corporation | High zt thermoelectric with reversible junction |
US20160116679A1 (en) | 2011-12-09 | 2016-04-28 | Lumentum Operations Llc | Varying beam parameter product of a laser beam |
WO2013086227A1 (en) | 2011-12-09 | 2013-06-13 | Jds Uniphase Corporation | Varying beam parameter product of a laser beam |
US20140199542A1 (en) | 2013-01-14 | 2014-07-17 | The Boeing Company | Graphene Coated Optical Elements |
US9632542B2 (en) | 2013-05-02 | 2017-04-25 | The Boeing Company | Touch screens comprising graphene layers |
US9732418B2 (en) | 2013-07-12 | 2017-08-15 | The Boeing Company | Methods and apparatuses for forming large-area carbon coatings |
US9296007B2 (en) | 2013-07-12 | 2016-03-29 | The Boeing Company | Methods and apparatuses for forming large-area carbon coatings |
US9630209B2 (en) | 2013-07-12 | 2017-04-25 | The Boeing Company | Methods of making large-area carbon coatings |
US20170306476A1 (en) | 2013-07-12 | 2017-10-26 | The Boeing Company | Methods and apparatuses for forming large-area carbon coatings |
US20160168692A1 (en) | 2013-07-12 | 2016-06-16 | The Boeing Company | Methods and apparatuses for forming large-area carbon coatings |
CN103454602A (en) * | 2013-09-11 | 2013-12-18 | 北京大学 | Magnetic field measuring meter based on topological insulator and magnetic field measuring method |
CN103553000A (en) | 2013-10-26 | 2014-02-05 | 西南交通大学 | Method for preparing topological insulator Bi2Se3 and perovskite oxide La0.7Sr0.3MnO3 composite structure |
US20160158889A1 (en) | 2013-12-16 | 2016-06-09 | General Electric Company | Control of solidification in laser powder bed fusion additive manufacturing using a diode laser fiber array |
US20150165556A1 (en) | 2013-12-16 | 2015-06-18 | General Electric Company | Diode laser fiber array for powder bed fabrication or repair |
US20150174695A1 (en) | 2013-12-20 | 2015-06-25 | Arcam Ab | Method for additive manufacturing |
US20150257308A1 (en) | 2014-03-10 | 2015-09-10 | The Boeing Company | Graphene-based thermal management systems |
US20150255184A1 (en) * | 2014-03-10 | 2015-09-10 | The Boeing Company | Graphene coated electronic components |
US20160204376A1 (en) * | 2014-08-05 | 2016-07-14 | Boe Technology Group Co., Ltd. | Barrier Film Layer, Photoelectric Device Comprising the Barrier Film Layer, and Manufacturing Method of the Photoelectric Device |
US20160364062A1 (en) | 2014-08-05 | 2016-12-15 | Boe Technology Group Co., Ltd. | Conductive Thin Film, Touch Panel and Method for Manufacturing the Same, and Display Device |
US20170194144A1 (en) | 2014-09-12 | 2017-07-06 | The Regents Of The University Of California | High performance thin films from solution processible two-dimensional nanoplates |
US20160082617A1 (en) | 2014-09-22 | 2016-03-24 | The Boeing Company | Nanotube particle device and method for using the same |
US9748345B2 (en) | 2015-06-15 | 2017-08-29 | National Technology & Engineering Solutions Of Sandia, Llc | Modification of electrical properties of topological insulators |
US20170090119A1 (en) | 2015-09-24 | 2017-03-30 | Nlight, Inc. | Beam parameter product (bpp) control by varying fiber-to-fiber angle |
US20170173737A1 (en) | 2015-12-17 | 2017-06-22 | Stratasys, Inc. | Additive manufacturing method using a plurality of synchronized laser beams |
CN107620034A (en) | 2017-07-20 | 2018-01-23 | 西南交通大学 | One kind prepares transparent Bi2Se3The method of film |
Non-Patent Citations (25)
Title |
---|
"Topological Insulator Bi2Se3/Si-Nanowire-Based p-n Junction Diode for High-Performance Near-Infrared Photodetector", Biswajit Das, Nirmalya S. Das, Samrat Sarkar, Biplab K. Chatterjee, and Kalyan K. Chattopadhyay, ACS Appl. Mater. Interfaces 2017, 9, 22788-22798. (Year: 2017). * |
Ando et al., "Topological Insulator Materials," Journal of the Physical Society of Japan, Invited Review Papers, 2013, pp. 1-36. |
CN 103454602 A Google Patents (Year: 2013). * |
Du et al., "Robustness of topological surface states against strong disorder observed in Bi2Te3 nanotubes," Physical Review B 93, 195402 (2016), 10 pages. |
Gu, "Chapter 2—Laser Additive Manufacturing (AM): Classification, Processing Philosophy, and Metallurgical Mechanisms," Laser Additive Manufacturing of High-Performance Materials, 2015, XVII, pp. 15-24. |
Guo et al., "Selective-Area Van der Waals epitaxy of topological insulator grid nanostructures for broadband transparent flexible electrodes," Advanced Materials, 2013, 25, 5959-5964. |
Hasan et al., "Colloquium: Topological Insulators," The Amer. Phys. Soc., Reviews of Modern Physics, vol. 82, Oct.-Dec. 2010, pp. 3045-3067. |
Hills et al., "From Graphene and Topological Insulators to Weyl Semimetals," WSPC/Instruction File, 2015, pp. 1-33. |
Hla, "Single Atom Extraction by Scanning Tunneling Microscope Tip-Crash and Nanoscale Surface Engineering," Nanoscale & Quantum Phenomena Institute, Physics & Astronomy Department, Ohio University, Athens, OH, date unknown, pp. 1-15. |
Hla, "STM Single Atom/Molecule Manipulation and Its Application to Nanoscience and Technology," Critical Review article, J. Vac. Sci. Tech, 2005, p. 1-12. |
Khanikaev et al., Photonic Topological Insulators, Nature Materials, vol. 12, Mar. 2013, pp. 233-239. |
Kong et al., "Opportunities in Chemistry and Materials Science for Topological Insulators and Their Nanostructures," Nature Chemistry, vol. 3, Nov. 2011, pp. 845-849. |
Kuzmenko et al., Universal Dynamical Conductance in Graphite, DPMC, University of Geneva, Switzerland, 2007, pp. 1-5. |
Li et al., "Marginal Topological Properties of Graphene: a Comparison with Topological Insulators," DPMC, University of Geneva, Switzerland, 2012, pp. 1-9. |
Mak et al., "Optical Spectroscopy of Graphene: From the Far Infrared to the Ultraviolet," Solid State Communications, 152 (2012), 1341-1349. |
Mingareev et al., "Laser Additive Manufacturing Going Mainstream," Optics and Photonics News, Feb. 2017, 8 pages. |
Moore, "The Birth of Topological Insulators," Nature, vol. 464, Insight Perspective (2010), pp. 194-198. |
Peng et al., "Topological Insulator Nanostructures for Near-Infrared Transparent Flexible Electrodes," Nature Chemistry, vol. 4, Apr. 2012, pp. 281-286. |
Qi et all, "Topological Insulators and Superconductors," arXiv:1008.2026v1 [cond-mat.mes-hall], (2010), pp. 1-54. |
Wikipedia, "Carbon Nanotube," https://en.wikipedia.org/wiki/Carbon_Nanotube, 22 pages. |
Wikipedia, "Nanometre," https://en.wikipedia.org/wiki/Nanometre, 2 pages. |
Wikipedia, Graphene, https://en.wikipedia.org/wiki/Graphene, 29 pages, downloaded Nov. 15, 2017. |
Wikipedia, Scanning Tunneling Microscope, https://en.wikipedia.org/wiki/Scanning_Tunneling_Microscope, 9 pages. |
Zhang, "Viewpoint: Topological States of Quantum Matter," American Physical Society, Physics 1, 6 (2008), 3 pages. |
Zhu et al., "Optical Transmittal of Multilayer Graphene," EPL, 108 (2014) 17007, 4 pages. |
Also Published As
Publication number | Publication date |
---|---|
US20190150289A1 (en) | 2019-05-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10839975B2 (en) | Graphene coated electronic components | |
Siegel et al. | Properties of gold nanostructures sputtered on glass | |
He et al. | Nanostructured transparent conductive films: Fabrication, characterization and applications | |
Banszerus et al. | Identifying suitable substrates for high-quality graphene-based heterostructures | |
Cho et al. | Outstanding low temperature thermoelectric power factor from completely organic thin films enabled by multidimensional conjugated nanomaterials | |
US9174414B2 (en) | Graphene based structures and methods for shielding electromagnetic radiation | |
Michel et al. | Self-healing electrodes for dielectric elastomer actuators | |
US20110036829A1 (en) | Planar heating element obtained using dispersion of fine carbon fibers in water and process for producing the planar heating element | |
Rehman et al. | Highly flexible and electroforming free resistive switching behavior of tungsten disulfide flakes fabricated through advanced printing technology | |
Ghasemian et al. | Ultra-thin lead oxide piezoelectric layers for reduced environmental contamination using a liquid metal-based process | |
Kumar et al. | Laser patterned, high-power graphene paper resistor with dual temperature coefficient of resistance | |
Koppert et al. | Structural and physical properties of highly piezoresistive nickel containing hydrogenated carbon thin films | |
KR20160065141A (en) | Performance enhanced heat spreader | |
KR20160130985A (en) | Graphene-based thermal management systems | |
EP3530618A1 (en) | Graphite/graphene complex material, heat-collecting body, heat-transfer body, thermal radiation body and thermal radiation system | |
Zhu et al. | Piezoresistive strain sensor based on monolayer molybdenum disulfide continuous film deposited by chemical vapor deposition | |
Parmar et al. | Coexisting 1T/2H polymorphs, reentrant resistivity behavior, and charge distribution in Mo S 2− hBN 2D/2D composite thin films | |
US10887996B2 (en) | Electronic components coated with a topological insulator | |
CN110087867B (en) | Flexible substrate with plasma particle surface coating and preparation method thereof | |
US20170284612A1 (en) | Method of manufacturing hexagonal boron nitride laminates | |
Ramachandran et al. | Conduction mechanisms in P (VDF-TrFE)/gold nanowire composites: tunnelling and thermally-activated hopping process near the percolation threshold | |
US20170239854A1 (en) | Method of manufacturing hexagonal boron nitride laminates | |
Morimoto et al. | Temperature dependence of plasmon resonance in single-walled carbon nanotubes | |
KR101980961B1 (en) | Heat dissipation film using multi layered structure of graphene and inorganic nano particle, and method of fabricating thereof | |
Cuenca et al. | Dielectric spectroscopy of hydrogen-treated hexagonal boron nitride ceramics |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
AS | Assignment |
Owner name: THE BOEING COMPANY, ILLINOIS Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:HUNT, JEFFREY H.;LI, ANGELA W.;HOWE, WAYNE R.;SIGNING DATES FROM 20171019 TO 20171117;REEL/FRAME:044160/0628 |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: ADVISORY ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |