US10847344B2 - Charged particle beam control device - Google Patents
Charged particle beam control device Download PDFInfo
- Publication number
- US10847344B2 US10847344B2 US16/437,327 US201916437327A US10847344B2 US 10847344 B2 US10847344 B2 US 10847344B2 US 201916437327 A US201916437327 A US 201916437327A US 10847344 B2 US10847344 B2 US 10847344B2
- Authority
- US
- United States
- Prior art keywords
- terminal
- voltage
- current
- control signal
- resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1472—Deflecting along given lines
- H01J37/1474—Scanning means
- H01J37/1475—Scanning means magnetic
Definitions
- the present invention relates to a charged particle beam control device.
- a deflection coil that deflects a charged particle beam by a magnetic field is used in a charged particle beam control device such as a scanning electron microscope for inspecting a dimension of a fine pattern formed on a sample using the charged particle beam.
- a charged particle beam control device such as a scanning electron microscope for inspecting a dimension of a fine pattern formed on a sample using the charged particle beam.
- a large number of coils are used in the charged particle beam control device, and a deflection amount of the electron beam is controlled for each deflection coil. Therefore, it is necessary to prepare constant current circuits corresponding to the deflection coils.
- each constant current circuit needs to be formed on one substrate.
- a return current similar to the current flowing through the deflection coil flows through a ground on the substrate, so that a variation in a ground potential is often a problem.
- PTL 1 discloses that a constant operation voltage is applied to a load circuit in order to prevent the variation in the ground potential.
- a relationship between a control signal and an output current in the constant current circuit varies due to the variation in the ground potential.
- the current flowing through the deflection coil changes even when the control signal is constant, and irradiation accuracy of an electron beam to a sample is deteriorated.
- PTL 1 describes a problem of the variation in the ground potential.
- the problem specific to the charged particle beam control device that the irradiation accuracy of the electron beam is deteriorated due to the variation in the ground potential and a solution thereof are not mentioned.
- An object of the invention is to prevent the irradiation accuracy of the electron beam from deteriorating due to the variation in the ground potential in the charged particle beam control device.
- a charged particle beam control device includes a constant current source including a current control circuit that supplies a current to a load based on a control signal for setting an amount of the current to be applied to the load, and converts reflected electrons generated by irradiating a sample with a charged particle beam into an electrical signal and processes the electrical signal.
- the current control circuit includes: a current conversion unit that supplies a constant current by adjusting an amount of a current flowing through a current detection resistor based on the control signal; a differential amplification unit to which a voltage of a first ground side terminal of the control signal and a voltage of a second ground side terminal of the current detection resistor are input, and that outputs an output signal proportional to a voltage difference between the voltage of the first ground side terminal and the voltage of the second ground side terminal; and a correction unit to which the output signal output from the differential amplification unit and the control signal are input, and that adds the output signal to the control signal at a predetermined ratio.
- a charged particle beam control device includes a constant current source that supplies a current to a load based on a control signal for setting an amount of the current to be applied to the load, and converts reflected electrons generated by irradiating a sample with a charged particle beam into an electrical signal and processes the electrical signal.
- the constant current source includes: a control signal input unit to which the control signal is supplied and that includes a first ground side terminal serving as a voltage reference of the control signal; and a current control circuit that supplies the current to the load based on the control signal from the control signal input unit.
- the current control circuit includes: a voltage drive transistor that includes a drive terminal, a first terminal and a second terminal and causes a constant current to flow between the first terminal and the second terminal by supplying a drive voltage to the drive terminal; a current detection resistor that is connected between a second ground side terminal and a second load terminal of the load, a first load terminal of the load being connected to the second terminal of the voltage drive transistor; an operational amplifier that supplies the drive voltage to the drive terminal of the voltage drive transistor; and a differential amplification unit to which a voltage of the first ground side terminal and a voltage of the second ground side terminal are input, and that outputs a voltage proportional to a voltage difference between the voltage of the first ground side terminal and the voltage of the second ground side terminal to an output terminal.
- a first terminal of a first resistor is connected to the control signal input unit, a first terminal of a second resistor is connected to the output terminal of the differential amplification unit, second terminals of the first resistor and the second resistor are connected to each other, the second terminal of the first resistor is connected to an inversion input terminal of the operational amplifier, and a third resistor is connected between the inversion input terminal of the operational amplifier and the second load terminal of the load.
- a charged particle beam control device includes a constant current source that supplies a current to a load based on a control signal for setting an amount of the current to be applied to the load, and converts reflected electrons generated by irradiating a sample with a charged particle beam into an electrical signal and processes the electrical signal.
- the constant current source includes: a control signal input unit to which the control signal is supplied and that includes a first ground side terminal serving as a voltage reference of the control signal; and a current control circuit that supplies the current to the load based on the control signal from the control signal input unit.
- the current control circuit includes: a voltage drive transistor that includes a drive terminal, a first terminal and a second terminal and causes a constant current to flow between the first terminal and the second terminal by supplying a drive voltage to the drive terminal; a current detection resistor that is connected between a second ground side terminal and a second load terminal of the load, a first load terminal of the load being connected to the second terminal of the voltage drive transistor; a first operational amplifier that supplies the drive voltage to the drive terminal of the voltage drive transistor; and a differential amplification unit to which a voltage of the first ground side terminal and a voltage of the second ground side terminal are input, and that outputs a voltage proportional to a voltage difference between the voltage of the first ground side terminal and the voltage of the second ground side terminal to an output terminal.
- a first terminal of a first resistor is connected to the control signal input unit, a first terminal of a second resistor is connected to the output terminal of the differential amplification unit, second terminals of the first resistor and the second resistor are connected to each other, the second terminal of the first resistor is connected to an inversion input terminal of a second operational amplifier, a third resistor is connected between the inversion input terminal of the second operational amplifier and an output terminal of the second operational amplifier, the output terminal of the second operational amplifier is connected to a non-inversion input terminal of the first operational amplifier, a non-inversion input terminal of the second operational amplifier is connected to the first ground side terminal, and an inversion input terminal of the first operational amplifier is connected to the second load terminal of the load.
- the irradiation accuracy of the electron beam can be prevented from deteriorating due to the variation in the ground potential.
- FIG. 1 is a diagram showing a configuration of a charged particle beam control device.
- FIG. 2 is a circuit diagram showing an example of a configuration of a current control circuit according to a first embodiment.
- FIG. 3 is a schematic view showing an example of a substrate layout.
- FIG. 4 is a circuit diagram showing an example of a configuration of a current control circuit according to a second embodiment.
- FIG. 5 is a circuit diagram showing an example of a configuration of a current control circuit according to a third embodiment.
- a configuration of a charged particle beam control device will be described with reference to FIG. 1 .
- a charged particle beam control device 100 includes an electron gun 101 that performs irradiation with an electron beam (a charged particle beam) 102 , electromagnetic deflectors 103 a to 103 d that deflect the electron beam 102 to scan a surface of a sample 104 and control an orbit of secondary electrons 105 , a reflector 106 that reflects the secondary electrons 105 and the like generated from the sample 104 , a detector 107 that captures tertiary electrons generated from the reflector 106 and converts the tertiary electrons into an electrical signal, and a signal processing and image generation unit 108 that processes the detected electrical signal and generates image information of the sample.
- an electron gun 101 that performs irradiation with an electron beam (a charged particle beam) 102
- electromagnetic deflectors 103 a to 103 d that deflect the electron beam 102 to scan a surface of a sample 104 and control an orbit of secondary electrons 105
- a reflector 106 that reflects the secondary
- the image information generated by the signal processing and image generation unit 108 is supplied to a computer 109 and displayed on a screen of the computer 109 as a sample observation image.
- the charged particle beam control device 100 includes a deflection control unit 110 and a constant current source 111 , and adjusts an amount of a current applied to the electromagnetic deflectors 103 a to 103 d .
- the deflection control unit 110 supplies a control signal for setting the amount of the current applied to the electromagnetic deflectors 103 a to 103 d to the constant current source 111 .
- the constant current source 111 receives the control signal and outputs the current to the electromagnetic deflectors 103 a to 103 d.
- FIG. 1 shows four types of electromagnetic deflectors 103 a to 103 d , the invention is not limited thereto, and more electromagnetic deflectors may be provided.
- the constant current source 111 includes a control signal input unit 2 that receives the control signal from the deflection control unit 110 , current control circuits 1 a and 1 b , and a power supply interface 21 .
- Loads 103 a and 103 b refer to the electromagnetic deflectors 103 a and 103 b in FIG. 1 .
- current control circuits 1 c and 1 d corresponding to the electromagnetic deflectors 103 c and 103 d are omitted.
- a configuration of the current control circuit 1 of the charged particle beam control device 100 according to a first embodiment will be described with reference to FIG. 2 .
- the current control circuit 1 drives the load 103 by flowing a current Id, corresponding to a control signal V 1 supplied from the control signal input unit 2 , to the load 103 .
- the current control circuit 1 includes a current conversion unit 4 , a differential amplification unit 5 and a correction unit 6 .
- a resistor R 2 is included in components of both the current conversion unit 4 and the correction unit 6 .
- the current control circuit 1 detects a potential difference between a ground potential G 1 of the control signal input unit 2 and a ground potential G 2 of a resistor R 1 in the differential amplification unit 5 , and adds the detected potential difference to the current conversion unit 4 via the correction unit 6 . Accordingly, the current Id can be stabilized even when the ground potential G 2 varies with respect to the ground potential G 1 .
- the current conversion unit 4 includes resistors R 1 , R 2 and R 3 , an operational amplifier 11 , an NMOS transistor 12 and a PMOS transistor 13 .
- the control signal V 1 supplied from the control signal input unit 2 is input to the current conversion unit 4 , and the current Id corresponding to the control signal V 1 is supplied to the load 103 , and the current flowing to the load 103 is pulled back to the current conversion unit 4 to cause the current to flow to the ground G 2 via the resistor R 1 .
- the resistor R 2 is connected between an output terminal of the control signal input unit 2 for the control signal V 1 and an inversion input terminal of the operational amplifier 11 .
- the resistor R 3 is connected between the inversion input terminal of the operational amplifier 11 and the load 103 .
- the resistor R 1 is connected between the ground G 2 and a connection point b of the resistor R 3 and the load 103 .
- a voltage same as that of the ground G 1 of the control signal V 1 is input to a non-inversion input terminal of the operational amplifier 11 .
- An output terminal of the operational amplifier 11 is connected to gate terminals of the NMOS transistor 12 and the PMOS transistor 13 .
- the NMOS transistor 12 and the PMOS transistor 13 have drain terminals respectively connected to a positive voltage (+Vc) and a negative voltage ( ⁇ Vc), and source terminals connected to each other.
- the source terminals are connected to one end of the load 103 , and the other end of the load 103 is connected to the connection point b.
- the current Id flowing through the load 103 is equal to a current flowing through the resistor R 1 , and is given by an equation (2) using the resistor R 1 and both end voltages V 2 and G 2 of the resistor R 1 .
- a current error of the current Id generated by the potential difference between the ground G 1 and the ground G 2 is ⁇ G 2 /R 1 by subtracting the equation (3) from the equation (2).
- the differential amplification unit 5 includes a resistor R 5 , a resistor R 6 and an operational amplifier 14 .
- a voltage of the ground G 1 of the control signal input unit 2 and a voltage of the ground G 2 of the resistor R 1 are input to the differential amplification unit 5 .
- the potential difference between the ground G 1 and the ground G 2 (the voltage of the ground G 2 with respect to that of the ground G 1 ) is multiplied (inverted) by ⁇ 1 and a result is output to a point c.
- the resistor R 5 is connected between a wiring L 2 for detecting the voltage of the ground G 2 and an inversion input terminal of the operational amplifier 14 .
- the resistor R 6 is connected between the inversion input terminal and an output terminal of the operational amplifier 14 .
- a wiring L 1 for detecting the voltage of the ground G 1 of the control signal input unit 2 is connected to a non-inversion input terminal of the operational amplifier 14 .
- the dedicated wiring L 1 is preferably used to connect such that a voltage of the non-inversion input terminal of the operational amplifier 14 is identical with the voltage of the ground G 1 to avoid a potential difference in the wiring L 1 .
- the resistor R 5 and the ground G 2 are preferably connected by the wiring L 2 such that no potential difference is generated at both ends of the wiring L 2 .
- the wiring L 2 is preferably wired such that the voltage of the ground G 2 close to a ground side terminal of the resistor R 1 can be obtained on a circuit board.
- the differential amplification unit 5 forms an inversion amplification circuit by causing resistance values of the resistor R 5 and the resistor R 6 to be identical with each other.
- An output signal V 3 at a terminal c is expressed by the following equation (4) based on the voltage of the ground G 1 .
- the correction unit 6 includes the resistor R 2 and a resistor R 4 .
- the control signal V 1 and the output signal V 3 of the differential amplification unit 5 are input to the correction unit 6 , and are connected via the resistor R 2 and the resistor R 4 respectively.
- the control signal V 1 and the output signal V 3 are input to the inversion input terminal of the operational amplifier 11 .
- R 4 has a resistance value same as that of R 3 .
- the current Id flowing through the load 103 is equal to the current flowing through the resistor R 1 , and is given by the following equation using the resistor R 1 and both end voltages V 2 and G 2 of the resistor R 1 .
- the equation (6) is identical with the equation (3). That is, regardless of the voltage of the ground G 2 , the current Id can be uniquely determined by the resistance values of the resistors R 1 , R 2 and R 3 with respect to the control signal V 1 .
- Positive and negative power supply voltages are applied to the operational amplifiers 11 and 14 , and both operational amplifiers can output the positive and negative voltages.
- the operational amplifier 11 drives the NMOS transistor 12 with a positive voltage.
- the operational amplifier 11 drives the PMOS transistor 13 with a negative voltage. Accordingly, by controlling a voltage value of the control signal V 1 to include positive and negative polarities, a source current source and a sink current source can be operated with respect to the load 103 .
- FIG. 3 shows the configuration in which two current control circuits 1 are arranged, three or more current control circuits 1 may be arranged.
- the constant current source 111 includes the control signal input unit 2 , the current control circuits 1 a and 1 b , the loads 103 a and 3 b , and the power supply interface 21 for supplying power supply voltages +Vc and ⁇ Vc of the NMOS transistor 12 and the PMOS transistor 13 of the current control circuits 1 a and 1 b.
- the constant current source 111 generates control signals V 1 a and V 1 b based on the voltage of the ground G 1 in the control signal input unit 2 , and outputs the control signals V 1 a and V 1 b to the current control circuits 1 a and 1 b respectively.
- the control signal input unit 2 may function as a buffer circuit to which analog voltages V 1 a and V 1 b supplied from an outside of the constant current source 111 are input and that supplies the analog voltages V 1 a and V 1 b to the current control circuits 1 a and 1 b respectively.
- control signal input unit 2 may include a DAC circuit. Digital signals supplied from the outside of the constant current source 111 are input to the DAC circuit, and analog signals corresponding to digital values set in the DAC circuit are output as the control signals V 1 a and V 1 b.
- the control signal input unit 2 wires the voltage of the ground G 1 of the control signal input unit 2 to the current control circuits 1 a and 1 b , together with the control signals V 1 a and V 1 b .
- a wiring width is large and a wiring conductor is thick enough in order to provide the same voltage of the ground G 1 to the current control circuits 1 a and 1 b.
- the control signal V 1 a is input to the current control circuit 1 a , and a corresponding current Ida is supplied to the load 103 a .
- the control signal V 1 b is input to the current control circuit 1 b , and a corresponding current Idb is supplied to the load 103 b .
- the current control circuits 1 a and 1 b return the currents flowing through the loads 103 a and 103 b respectively. The returned currents flow to the power supply interface 21 via a common ground of the constant current source 111 and then to an externally connected power supply circuit via a power supply cable.
- the current Ida indicated by a broken line is a current path that flows through the common ground and that is output from the current control circuit 1 a .
- a voltage of a ground G 2 a of the resistor R 1 in FIG. 2 has a voltage value different from that of the ground G 1 due to an IR drop generated by the flowing of the current Ida.
- the current Idb indicated by a broken line is a current path that flows through the common ground and that is output from the current control circuit 1 b .
- a voltage of a ground G 2 b of the resistor R 2 has a voltage value different from that of the ground G 1 due to an IR drop generated by the flowing of the current Ida and the current Idb.
- the voltage of the ground G 1 is not affected by the IR drop due to the flowing of the currents Ida and Idb, and a stable voltage is obtained. Therefore, a layout is preferably obtained in which the control signal input unit 2 is arranged at a position different from the paths through which the currents Ida and Idb on the common ground flow.
- a slit that divides the common ground between the control signal input unit 2 and the current control circuit 1 a or 1 b is preferably inserted, such that the current Ida or Idb does not flow through the control signal input unit 2 as much as possible.
- a similar effect can also be obtained by forming the ground G 1 of the control signal input unit 2 and the grounds G 2 a and G 2 b in different layers and connecting two grounds by a via or the like.
- the first embodiment provides the charged particle beam control device 100 that includes the constant current source 111 including the current control circuit 1 supplying a current to the load 103 based on the control signal V 1 for setting the amount of the current to be applied to the load 103 , and that converts reflected electrons generated by irradiating the sample 104 with the charged particle beam 102 into an electrical signal and processes the electrical signal.
- the current control circuit 1 includes: the current conversion unit 4 that supplies the constant current Id by adjusting the amount of the current flowing through the current detection resistor R 1 based on the control signal V 1 ; the differential amplification unit 5 to which the voltage of the first ground side terminal G 1 of the control signal V 1 and the voltage of the second ground side terminal G 2 of the current detection resistor R 1 are input, and that outputs the output signal V 3 proportional to the voltage difference between the voltage of the first ground side terminal G 1 and the voltage of the second ground side terminal G 2 ; and the correction unit 6 to which the output signal V 3 output from the differential amplification unit 5 and the control signal V 1 are input, and that adds the output signal V 3 to the control signal V 1 at a predetermined ratio.
- the charged particle beam control device 100 further includes the deflection control unit 110 that generates the control signal V 1 for setting the amount of the current to be applied to the electromagnetic deflector 103 as the load.
- the constant current source 111 further includes the control signal input unit 2 to which the control signal V 1 from the deflection control unit 110 is input.
- the current control circuit 1 supplies the current to the electromagnetic deflector 103 based on the control signal V 1 from the control signal input unit 2 .
- the current conversion unit 4 further includes the operational amplifier 11 .
- the correction unit 6 adds the output signal V 3 to the control signal V 1 at the predetermined ratio using addition circuits ( 11 , R 2 , R 3 and R 4 ) of the operational amplifier 11 .
- the current control circuit 1 includes: the voltage drive transistor 12 that includes a drive terminal (gate terminal), a first terminal ( 12 +Vc side) and a second terminal ( 12 load side) and causes the constant current Id to flow between the first terminal ( 12 +Vc side) and the second terminal ( 12 load side) by supplying a drive voltage ( 11 output voltage) to the drive terminal ( 12 gate terminal, that is, a terminal to which 11 output is connected); a current detection resistor R 1 that is connected between the second ground side terminal G 2 and a second load terminal (b) of the load 103 , a first load terminal ( 12 side) of the load 103 being connected to the second terminal of the voltage drive transistor 12 ; an operational amplifier 11 that supplies the drive voltage to the drive terminal of the voltage drive transistor 12 ; and the differential amplification unit 5 to which the voltage of the first ground side terminal G 1 and the voltage of the voltage of the second ground side terminal G 2 are input, and that outputs the voltage V 3 proportional to the voltage difference between the voltage of the first
- a first terminal ( 2 side) of the first resistor R 2 is connected to the control signal input unit 2 .
- a first terminal ( 5 side) of the second resistor R 4 is connected to the output terminal of the differential amplification unit 5 .
- Second terminals ( 11 inversion input terminal side) of the first resistor R 2 and the second resistor R 4 are connected to each other, and the second terminal of the first resistor R 2 is connected to the inversion input terminal of the operational amplifier 11 .
- the third resistor R 3 is connected between the inversion input terminal of the operational amplifier 11 and the second load terminal of the load 103 .
- the non-inversion input terminal of the operational amplifier 11 is connected to the first ground side terminal G 1 .
- the differential amplification unit 5 inverts the voltage difference between the voltage of the first ground side terminal G 1 and the voltage of the second ground side terminal G 2 by ⁇ 1, and outputs a result to the output terminal (c).
- the second resistor R 4 has a resistance value same as that of the third resistor R 3 .
- the voltage of the ground G 2 of the resistor R 1 in the current control circuit 1 has a difference with respect to the voltage of the ground G 1 of the control signal, particularly due to the returned current from the load flowing through the common ground on the substrate, a highly stable constant current can be supplied to the load 103 by the configuration of the current control circuit 1 to which the differential amplification unit 5 and the correction unit 6 are added. Accordingly, an irradiation position of the electron beam 102 to the sample 104 can be controlled with high accuracy, and a sample image having high resolution can be generated.
- a configuration of the current control circuit 1 of the charged particle beam control device 100 according to a second embodiment will be described with reference to FIG. 4 .
- the current control circuit 1 according to the second embodiment includes the current conversion unit 4 , the differential amplification unit 5 and the correction unit 6 .
- the second embodiment is different from the first embodiment in that a non-inversion input terminal of the operational amplifier 11 is connected to a ground side terminal of the resistor R 1 in the current conversion unit 4 , and the differential amplification unit 5 includes resistors R 7 and R 8 and an operational amplifier 15 .
- Other parts of the configuration are the same as those of the current control circuit 1 according to the first embodiment.
- the current Id flowing through the load 103 is equal to a current flowing through the resistor R 1 , and is given by an equation (8) using the resistor R 1 and both end voltages V 2 and G 2 of the resistor R 1 .
- a current error of the current Ida generated by a potential difference between the ground G 1 and the ground G 2 is G 2 ⁇ R 3 /(R 2 ⁇ R 1 ) ⁇ by subtracting the equation (9) from the equation (8).
- the voltage of the ground G 1 of the control signal V 1 and the voltage of the ground G 2 of the resistor R 1 are input to the differential amplification unit 5 , the potential difference between the ground G 1 and the ground G 2 (the voltage of the ground G 2 with respect to that of the ground G 1 ) is doubled and a result is output to the point c.
- the ground side terminal of the resistor R 1 is connected to a non-inversion input terminal of the operational amplifier 15 by the wiring L 2 .
- the resistor R 7 is connected between the wiring L 1 to which the voltage of the ground G 1 of the control signal input unit 2 is supplied and an inversion input terminal of the operational amplifier 15 .
- the resistor R 8 is connected between the inversion input terminal of the operational amplifier 15 and an output terminal of the operational amplifier 15 .
- the wiring L 2 preferably has a large wiring width to avoid a potential variation due to the IR drop such that a voltage of the non-inversion input terminal of the operational amplifier 15 is identical with the voltage of the ground G 2 .
- the wiring L 1 preferably has a large wiring width to avoid the IR drop in the wiring L 1 such that the voltage of the ground G 1 is supplied to the resistor R 7 .
- the resistors R 7 and R 8 have the same resistance value to form a non-inversion amplification circuit, and whereby the output signal V 3 at the point c is expressed by the following equation (9) based on the voltage of the ground G 1 .
- the control signal V 1 and the output signal V 3 of the differential amplification unit 5 are input to the correction unit 6 , and are connected via the resistor R 2 and the resistor R 4 respectively.
- the control signal V 1 and the output signal V 3 are supplied to the inversion input terminal of the operational amplifier 11 .
- R 4 uses a resistance value same as that of R 2 .
- the current Id flowing through the load 103 is equal to the current flowing through the resistor R 1 , and is given by an equation (11) using the resistor R 1 and both end voltages V 2 and G 2 of the resistor R 1 .
- the equation (11) is identical with the equation (9). That is, regardless of the voltage of the ground G 2 , the current Id can be uniquely determined by the resistance values of the resistors R 1 , R 2 and R 3 with respect to the control signal V 1 .
- Positive and negative power supply voltages are applied to the operational amplifiers 11 and 15 , and both operational amplifiers can output the positive and negative voltages.
- the operational amplifier 11 drives the NMOS transistor 12 with a positive voltage.
- the operational amplifier 11 drives the PMOS transistor 13 with a negative voltage.
- An arbitrary current can be supplied to the load 103 by controlling the magnitude and polarity of the voltage of the control signal V 1 .
- the non-inversion input terminal of the operational amplifier 11 is connected to the second ground side terminal G 2 .
- the differential amplification unit 5 doubles the voltage difference between the voltage of the first ground side terminal G 1 and the voltage of the second ground side terminal G 2 , and outputs a result to the output terminal (c).
- the second resistor R 4 has a resistance same as that of the first resistor R 2 .
- the non-inversion input terminal of the operational amplifier 11 is close to the ground side terminal of the resistor R 1 , so that the effect of facilitating an wiring layout of the substrate is obtained.
- a configuration of the current control circuit 1 of the charged particle beam control device 100 according to a third embodiment will be described with reference to FIG. 5 .
- the current control circuit 1 includes the current conversion unit 4 , the differential amplification unit 5 and the correction unit 6 .
- the current conversion unit 4 includes resistors R 1 , R 2 and R 9 , operational amplifiers 15 and 16 , the NMOS transistor 12 and the PMOS transistor 13 .
- the control signal V 1 supplied from the control signal input unit 2 is input to the current conversion unit 4 , the current Id corresponding to the control signal V 1 is supplied to the load 103 , and the current flowing to the load 103 is pulled back to the current conversion unit 4 to cause the current to flow to the ground G 2 via the resistor R 1 .
- the resistor R 2 is connected between an output terminal of the control signal V 1 of the control signal input unit 2 and an inversion input terminal of the operational amplifier 16 .
- the resistor R 9 is connected between the inversion input terminal of the operational amplifier 16 and an output terminal of the operational amplifier 16 .
- a voltage same as that of the ground G 1 of the control signal input unit 2 is input to a non-inversion input terminal of the operational amplifier 16 .
- the output terminal of the operational amplifier 16 is connected to a non-inversion input terminal of the operational amplifier 15 .
- the inversion input terminal of the operational amplifier 15 is connected to the load 103 .
- the resistor R 1 is connected between the ground G 2 and the connection point b of the inversion input terminal of the operational amplifier 15 and the load 103 .
- the output terminal of the operational amplifier 15 is connected to gate terminals of the NMOS transistor 12 and the PMOS transistor 13 .
- the NMOS transistor 12 and the PMOS transistor 13 have drain terminals respectively connected to a positive voltage (+Vc) and a negative voltage ( ⁇ Vc), and source terminals connected to each other.
- the source terminals of both transistors are connected to one end of the load 103 , and the other end of the load 103 is connected to the point b.
- the current Id flowing through the load 103 is equal to a current flowing through the resistor R 1 , and is given by an equation (13) using the resistor R 1 and both end voltages V 2 and G 2 of the resistor R 1 .
- a current error of the current Id generated by a potential difference between the ground G 1 and the ground G 2 is ⁇ G 2 /R 1 by subtracting the equation (14) from the equation (13).
- the differential amplification unit 5 has a configuration same as that of the first embodiment of the invention, and includes the resistors R 5 and R 6 and the operational amplifier 14 .
- the voltage of the ground G 1 of the control signal input unit 2 and the voltage of the ground G 2 of the resistor R 1 are input to the differential amplification unit 5 .
- the potential difference between the ground G 1 and the ground G 2 (the voltage of the ground G 2 with respect to that of the ground G 1 ) is multiplied (inverted) by ⁇ 1 and a result is output to the point c.
- the resistor R 5 is connected between the wiring L 2 that detects the voltage of the ground side terminal (the ground G 2 ) of the resistor R 1 and the inversion input terminal of the operational amplifier 14 .
- the resistor R 6 is connected between the inversion input terminal of the operational amplifier 14 and the output terminal of the operational amplifier 14 .
- the voltage of the ground G 1 of the control signal input unit 2 is supplied to the non-inversion input terminal of the operational amplifier 14 via the wiring L 1 .
- the resistors R 5 and R 6 have the same resistance value to form an inversion amplification circuit, and the output signal V 3 is expressed by a following equation (15) based on the voltage of the ground G 1 .
- the correction unit 6 includes part of components of the current conversion unit 4 , and includes the resistors R 2 , R 4 and R 9 and the operational amplifier 16 .
- the control signal V 1 and the output signal V 3 of the differential amplification unit 5 are input to the correction unit 6 , and are connected via the resistor R 2 and the resistor R 4 respectively.
- the control signal V 1 and the output signal V 3 are supplied to the inversion input terminal of the operational amplifier 16 .
- V 2 When the control signal V 1 having the ground potential G 1 as a reference ground and the output signal V 3 of the differential amplification unit 5 are input to the current conversion unit 4 , the voltage V 2 at the point b is given by an equation (16) by an addition circuit including the operational amplifier 16 and the resistors R 2 , R 4 and R 9 as well as a non-inversion amplification circuit including the operational amplifier 15 .
- the current Id flowing through the load 103 is equal to the current flowing through the resistor R 1 , and is given by an equation (17) using the resistor R 1 and both end voltages V 2 and G 2 of the resistor R 1 .
- the equation (18) indicates that a relationship between the control signal V 1 and the current Id can be expressed only by the resistor R 1 , and the current Id can be determined with respect to the control signal V 1 regardless of the voltage of the ground G 2 of the resistor R 1 .
- Positive and negative power supply voltages are applied to the operational amplifiers 14 , 15 and 16 , and the operational amplifiers can output the positive and negative voltages.
- the operational amplifier 15 drives the NMOS transistor 12 with a positive voltage.
- the operational amplifier 15 drives the PMOS transistor 13 with a negative voltage.
- An arbitrary current can be supplied to the load by controlling the magnitude and polarity of the voltage of the control signal V 1 .
- the third embodiment provides the charged particle beam control device 100 that includes the constant current source 111 that supplies a current to the load 103 based on a control signal V 1 for setting the amount of the current to be applied to the load 103 , and that converts reflected electrons generated by irradiating the sample 104 with the charged particle beam 102 into an electrical signal and processes the electrical signal.
- the constant current source 111 includes: the control signal input unit 2 to which the control signal V 1 is supplied and that includes the first ground side terminal G 1 serving as a voltage reference of the control signal V 1 ; and the current control circuit 1 that supplies the current to the load 103 based on the control signal from the control signal input unit 2 .
- the current control circuit 1 includes: the voltage drive transistor 12 that includes the drive terminal (gate terminal), the first terminal ( 12 +Vc side) and the second terminal ( 12 load side) and causes the constant current Id to flow between the first terminal ( 12 +Vc side) and the second terminal ( 12 load side) by supplying the drive voltage ( 11 output voltage) to the drive terminal ( 12 gate terminal, that is, a terminal to which 11 output is connected); the current detection resistor R 1 that is connected between the second ground side terminal G 2 and the second load terminal (b) of the load, the first load terminal ( 12 side) of the load 103 being connected to the second terminal of the voltage drive transistor 12 ; the first operational amplifier 15 that supplies the drive voltage to the drive terminal of the voltage drive transistor 12 ; and the differential amplification unit 5 to which the voltage of the first ground side terminal G 1 and the voltage of the second ground side terminal G 2 are input, and that outputs the voltage V 3 proportional to a voltage difference between the voltage of the first ground side terminal G 1 and the voltage of the second ground side terminal G 2 to the
- the first terminal ( 2 side) of the first resistor R 2 is connected to the control signal input unit 2 .
- the first terminal ( 5 side) of the second resistor R 4 is connected to the output terminal of the differential amplification unit 5 .
- Second terminals ( 16 inversion input terminal side) of the first resistor R 2 and the second resistor R 4 are connected to each other, and the second terminal of the first resistor R 2 is connected to the inversion input terminal of the second operational amplifier 16 .
- the third resistor R 9 is connected between the inversion input terminal of the second operational amplifier 16 and the output terminal of the second operational amplifier 15 .
- the output terminal of the second operational amplifier 16 and the non-inversion input terminal of the first operational amplifier 15 are connected.
- the non-inversion input terminal of the second operational amplifier 16 is connected to the first ground side terminal G 1 .
- the inversion input terminal of the first operational amplifier 15 is connected to the second load terminal (b) of the load 103 .
- the charged particle beam control device 100 further includes the deflection control unit 110 that generates the control signal for setting the amount of the current to be applied to the electromagnetic deflector 103 as the load.
- the control signal V 1 from the deflection control unit 110 is input to the control signal input unit 2 .
- the current control circuit 1 supplies the current to the electromagnetic deflector 103 based on the control signal V 1 from the control signal input unit 2 .
- the differential amplification unit 5 inverts the voltage difference between the voltage of the first ground side terminal G 1 and the voltage of the second ground side terminal G 2 by ⁇ 1, and outputs a result to the output terminal (c).
- the second resistor R 4 and the third resistor R 9 have resistance values same as that of the first resistor R 2 .
- the third embodiment since the voltage polarity of the control signal generated by the deflection control unit 110 is identical with the polarity of the current output to the load, the effect of facilitating the control algorithm of the deflection control unit 110 is obtained.
- the resistance R 3 is not a sufficiently large value as compared with the resistor R 1 , the current Id increases or decreases greatly due to the amount of the current flowing through the resistor R 3 .
- the circuit design in the third embodiment is easy since all the currents Id flow through the resistor R 1 .
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
- Amplifiers (AREA)
Abstract
Description
V2=−V1×(R3/R2) Equation (1)
Id=(V2−G2)/R1=−V1×{R3/(R2×R1)}−G2/R1 Equation (2)
Id=−V1×{R3/(R2×R1)} Equation (3)
V3=−G2×(R6/R5)=−G2 Equation (4)
V2=−R3×(V1/R2+V3/R4)=−R3×(V1/R2−G2/R3)=−V1×(R3/R2)+G2 Equation (5)
Id=(V2−G2)/R1=−V1×{R3/(R2×R1)} Equation (6)
V2=−V1×(R3/R2)+G2×(R2+R3)/R2 Equation (7)
Id=(V2−G2)/R1=−(V1−G2)×{R3/(R2×R1)} Equation (8)
Id=−V1×{R3/(R2×R1)} Equation (9)
V3=G2×(1+R8/R7)=2×G2 Equation (9)
V2=−V1×(R3/R2)+G2×(1+R3/R2−R3/R4)=−V1×(R3/R2)+G2 Equation (10)
Id=(V2−G2)/R1=−V1×{R3/(R2×R1)} Equation (11)
V2=−V1×(R9/R2) Equation (12)
Id=(V2−G2)/R1=−V1×{R9/(R2×R1)}−G2/R1 Equation (13)
Id=−V1×{R9/(R2×R1)} Equation (14)
V3=−G2×(R6/R5)=−G2 Equation (15)
V2=−R9×(V1/R2+V3/R4)=−R9×(V1/R2−G2/R4)=−V1×(R9/R2)+G2×(R9/R4) Equation (16)
Id=(V2−G2)/R1=−V1×{R9/(R2×R1)}+G2×(R9/R4−1)/R4 Equation (17)
Id=−V1/R1 Equation (18)
Claims (10)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018-111493 | 2018-06-12 | ||
| JP2018111493A JP7128667B2 (en) | 2018-06-12 | 2018-06-12 | Charged particle beam controller |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20190378686A1 US20190378686A1 (en) | 2019-12-12 |
| US10847344B2 true US10847344B2 (en) | 2020-11-24 |
Family
ID=68764627
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US16/437,327 Active US10847344B2 (en) | 2018-06-12 | 2019-06-11 | Charged particle beam control device |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US10847344B2 (en) |
| JP (1) | JP7128667B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220037109A1 (en) * | 2020-07-31 | 2022-02-03 | Hitachi High-Tech Corporation | Charged particle beam device and method of measuring electrical noise |
| US20220270847A1 (en) * | 2019-08-07 | 2022-08-25 | Hitachi High-Tech Corporation | Charged particle beam device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112117495B (en) | 2020-10-20 | 2025-02-18 | 深圳吉阳智能科技有限公司 | Lamination equipment, method and lamination structure |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4145649A (en) * | 1976-02-19 | 1979-03-20 | Systron-Donner Corporation | Amplitude insensitive voltage-to-current converter and method for conversion |
| US20140062321A1 (en) * | 2012-08-28 | 2014-03-06 | Micron Technology, Inc. | Self-identifying solid-state transducer modules and associated systems and methods |
| JP2014134862A (en) | 2013-01-08 | 2014-07-24 | Renesas Electronics Corp | Semiconductor device |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5559515A (en) * | 1978-10-27 | 1980-05-06 | Hitachi Ltd | Constant current circuit |
| JPS5696307A (en) * | 1979-12-28 | 1981-08-04 | Jeol Ltd | Constant-current circuit |
| JP2000223412A (en) * | 1999-02-03 | 2000-08-11 | Advantest Corp | Charged particle beam exposure apparatus and exposure method |
| JP4719628B2 (en) * | 2006-06-13 | 2011-07-06 | 株式会社日立ハイテクノロジーズ | Scanning electron microscope |
| JP4814747B2 (en) * | 2006-08-30 | 2011-11-16 | セイコーNpc株式会社 | Constant voltage circuit |
| JP6102295B2 (en) * | 2013-02-05 | 2017-03-29 | 株式会社リコー | Constant current circuit |
| DE102015210941B9 (en) * | 2015-06-15 | 2019-09-19 | Carl Zeiss Microscopy Gmbh | Particle beam apparatus and method for operating a particle beam device |
-
2018
- 2018-06-12 JP JP2018111493A patent/JP7128667B2/en active Active
-
2019
- 2019-06-11 US US16/437,327 patent/US10847344B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4145649A (en) * | 1976-02-19 | 1979-03-20 | Systron-Donner Corporation | Amplitude insensitive voltage-to-current converter and method for conversion |
| US20140062321A1 (en) * | 2012-08-28 | 2014-03-06 | Micron Technology, Inc. | Self-identifying solid-state transducer modules and associated systems and methods |
| JP2014134862A (en) | 2013-01-08 | 2014-07-24 | Renesas Electronics Corp | Semiconductor device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220270847A1 (en) * | 2019-08-07 | 2022-08-25 | Hitachi High-Tech Corporation | Charged particle beam device |
| US20220037109A1 (en) * | 2020-07-31 | 2022-02-03 | Hitachi High-Tech Corporation | Charged particle beam device and method of measuring electrical noise |
| US11735395B2 (en) * | 2020-07-31 | 2023-08-22 | Hitachi High-Tech Corporation | Charged particle beam device and method of measuring electrical noise |
Also Published As
| Publication number | Publication date |
|---|---|
| US20190378686A1 (en) | 2019-12-12 |
| JP7128667B2 (en) | 2022-08-31 |
| JP2019215976A (en) | 2019-12-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10847344B2 (en) | Charged particle beam control device | |
| US6313704B1 (en) | Multi-stage signal amplifying circuit | |
| JP4464418B2 (en) | Ramp waveform generation circuit and circuit pattern inspection apparatus using the same | |
| US7482829B2 (en) | Electric power applying circuit and test apparatus | |
| JPH04212067A (en) | Dual-path wide-band high-precision data collecting system | |
| US20070103174A1 (en) | Direct current test apparatus | |
| CN101772708A (en) | voltage conversion circuit | |
| US20090121150A1 (en) | Electrostatic deflection control circuit and method of electronic beam measuring apparatus | |
| KR102842058B1 (en) | Apparatus for reducing offset of hall sensor and apparatus for controlling lens module | |
| JP5829745B1 (en) | Radiation measurement equipment | |
| US7545156B2 (en) | Test circuit and test method that includes supplying a current to a plurality of light-receiving elements | |
| JP5438161B2 (en) | DA converter | |
| TWI783306B (en) | charged particle beam device | |
| JP7337723B2 (en) | Current supply circuit and resistance measuring device | |
| JP2019133789A (en) | Measurement inspection equipment | |
| US11764033B2 (en) | High voltage power supply | |
| JP2008203075A (en) | Absorption current detector for charged particle beam device | |
| US10031537B2 (en) | Differential probe with common-mode offset | |
| JP5190103B2 (en) | Voltage generator, current generator | |
| EP2733465A1 (en) | Sensor signal processing using translinear mesh | |
| US20250391628A1 (en) | Calibration of digital analog converter to control deflectors in charged particle beam system | |
| EP3995801B1 (en) | Bridge sensor biasing and readout system | |
| JP3643517B2 (en) | Constant current power supply | |
| RU2688223C1 (en) | Differential operational amplifier | |
| CN119213690A (en) | Sensor amplifier circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| AS | Assignment |
Owner name: HITACHI HIGH-TECHNOLOGIES CORPORATION, JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:MURAKAMI, SHINICHI;LI, WEN;TAKAHASHI, HIROYUKI;AND OTHERS;REEL/FRAME:049565/0488 Effective date: 20190507 |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION |
|
| AS | Assignment |
Owner name: HITACHI HIGH-TECH CORPORATION, JAPAN Free format text: CHANGE OF NAME;ASSIGNOR:HITACHI HIGH-TECHNOLOGIES CORPORATION;REEL/FRAME:052225/0894 Effective date: 20200214 |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED |
|
| STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
| MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 4 |