US10516380B2 - Method and apparatus for detecting RF field strength - Google Patents
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- US10516380B2 US10516380B2 US15/818,097 US201715818097A US10516380B2 US 10516380 B2 US10516380 B2 US 10516380B2 US 201715818097 A US201715818097 A US 201715818097A US 10516380 B2 US10516380 B2 US 10516380B2
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/38—Impedance-matching networks
- H03H7/40—Automatic matching of load impedance to source impedance
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J3/00—Continuous tuning
- H03J3/20—Continuous tuning of single resonant circuit by varying inductance only or capacitance only
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- H04B5/0037—
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B5/00—Near-field transmission systems, e.g. inductive or capacitive transmission systems
- H04B5/70—Near-field transmission systems, e.g. inductive or capacitive transmission systems specially adapted for specific purposes
- H04B5/79—Near-field transmission systems, e.g. inductive or capacitive transmission systems specially adapted for specific purposes for data transfer in combination with power transfer
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
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- U.S. Utility patent application Ser. No. 13/209,420 also claims priority pursuant to 35 U.S.C. ⁇ 120 as a Continuation-In-Part of U.S. Utility patent application Ser. No. 12/462,331, entitled “METHOD AND APPARATUS FOR VARYING AN IMPEDANCE”, filed Aug. 1, 2009, now U.S. Pat. No. 8,081,043, issued on Dec. 20, 2011 (“Related Application”), which is in turn a Division of U.S. Utility patent application Ser. No. 11/601,085, filed Nov. 18, 2006, now U.S. Pat. No. 7,586,385, issued on Sep. 8, 2009 (“Related Patent”) (collectively, “Related References”).
- the subject matter of the Related References, each in its entirety, is expressly incorporated herein by reference.
- the present invention relates generally to detecting RF field strength, and, in particular, to detecting RF field strength in a passive RFID system.
- the amplitude modulated (“AM”) signal broadcast by the reader in an RFID system will be electromagnetically coupled to a conventional antenna, and a portion of the current induced in a tank circuit is extracted by a regulator to provide operating power for all other circuits. Once sufficient stable power is available, the regulator will produce, e.g., a power-on-reset signal to initiate system operation. Thereafter, the method disclosed in the Related References, and the associated apparatus, dynamically varies the capacitance of a variable capacitor component of the tank circuit so as to dynamically shift the f R of the tank circuit to better match the f c of the received RF signal, thus obtaining maximum power transfer in the system.
- the invention disclosed in the Related References focused primarily on quantizing the voltage developed by the tank circuit as the primary means of matching the f R of the tank circuit to the transmission frequency, fc, of the received signal.
- this voltage quantization is, at best, indirectly related to received signal field strength.
- We submit that what is needed now is an effective and efficient method and apparatus for quantizing the received field strength as a function of induced current. It is further desirable to develop this field quantization in a form and manner that is suitable for selectively varying the input impedance of the receiver circuit to maximize received power, especially during normal system operation. Additionally, in light of the power sensitive nature of RFID systems, it is desirable to vary the input impedance with a minimum power loss.
- FIG. 1 illustrates, in block diagram form, an RF receiver circuit having a field strength detector constructed in accordance with an embodiment of our invention
- FIG. 2 illustrates, in block diagram form, a field strength detector circuit constructed in accordance with an embodiment of our invention
- FIG. 3 illustrates, in block schematic form, a more detailed embodiment of the field strength detector circuit shown in FIG. 2 ;
- FIG. 4 illustrates, in flow diagram form, the sequencing of operations in the field strength detector circuit shown in FIG. 3 ;
- FIG. 5 illustrates, in graph form, the response of the field strength detector circuit shown in FIG. 3 to various conditions
- FIG. 6 illustrates, in block schematic form, an RF receiver circuit constructed in accordance with another embodiment of our invention.
- FIG. 7 illustrates, in flow diagram form, the sequencing of the operations in the RF receiver circuit shown in FIG. 6 ;
- FIG. 8 illustrates, in block schematic form, an alternative representation of the impedance represented by the antenna and the tank circuit of the exemplary RFID receiver circuit.
- FIG. 9 illustrates, in block schematic form, an alternative exemplary embodiment of the field strength detector circuit shown in FIG. 3 .
- FIG. 10 illustrates, in block schematic form, an alternative exemplary embodiment of the field strength detector circuit shown in FIG. 3 .
- FIG. 11 illustrates, in block schematic form, an exemplary RFID sub-system containing tag and reader.
- FIG. 1 Shown in FIG. 1 is an RF receiver circuit 10 suitable for use in an RFID application.
- an RF signal electromagnetically coupled to an antenna 12 is received via a tank circuit 14 , the response frequency, f R , f which is dynamically varied by a tuner 16 to better match the transmission frequency, f c of the received RF signal, thus obtaining a maximum power transfer.
- the RMS voltage induced across the tank circuit 14 by the received RF signal is quantized by tuner 16 and the developed quantization employed to control the impedance of the tank circuit 14 .
- the unregulated, AC current induced in the tank circuit 14 by the received RF signal is conditioned by a regulator 18 to provide regulated DC operating power to the receiver circuit 10 .
- a field strength detector 20 also known as a power detector, adapted to develop a field-strength value as a function of the field strength of the received RF signal.
- our field strength detector 20 is adapted to cooperate with the regulator 18 in the development of the field-strength value.
- our field strength detector 20 can be adapted to cooperate with the tuner 16 in controlling the operating characteristics of the tank circuit 14 .
- FIG. 2 Shown by way of example in FIG. 2 is one possible embodiment of our field strength or power detector 20 .
- a shunt type regulator 18 so that, during normal operation, we can use the shunted ‘excess’ current as a reference against which we develop the field-strength value.
- a reference 22 first to develop a shunt current reference value proportional to the shunted current, and then to develop a mirrored current reference value as a function of both the shunted current and a field strength reference current provided by a digitally controlled current source 24 .
- control 26 captures the mirrored current reference value provided by the current reference 22 , compares the captured signal against a predetermined threshold value, and, if the comparison indicates that the field strength reference current is insufficient, increases, in accordance with a predetermined sequence of digital-controlled increments, the field strength reference current; upon the comparison indicating that the field strength reference current is sufficient, control 26 will, at least temporarily, cease operation.
- the digital field-strength value developed by control 26 to control the field strength current source 24 is a function of the current induced in the tank circuit 14 by the received RF signal.
- this digital field-strength value can be employed in various ways. For example, it can be selectively transmitted by the RFID device (using conventional means) back to the reader (not shown) for reference purposes. Such a transaction can be either on-demand or periodic depending on system requirements. Imagine for a moment an application wherein a plurality of RFID tag devices is distributed, perhaps randomly, throughout a restricted, 3-dimensional space, e.g., a loaded pallet.
- the reader is programmed to query, at an initial field strength, all tags “in bulk” and to command all tags that have developed a field-strength value greater than a respective field-strength value to remain ‘silent’.
- the reader will, ultimately, be able to isolate and distinguish those tags most deeply embedded within the space; once these ‘core’ tags have been read, a reverse sequence can be performed to isolate and distinguish all tags within respective, concentric ‘shells’ comprising the space of interest. Although, in all likelihood, these shells will not be regular in either shape or relative volume, the analogy should still be apt.
- FIG. 3 we have illustrated one possible embodiment of our field strength detector 20 a .
- a shunt circuit 18 a to develop a substantially constant operating voltage level across supply node 28 and ground node 30 .
- Shunt regulators of this type are well known in the art, and typically use Zener diodes, an avalanche breakdown diodes, diode-connected MOS devices, and the like.
- current reference 22 in the form of a current mirror circuit 22 a , connected in series with shunt circuit 18 a between nodes 28 and 30 .
- current mirror circuit 22 a comprises a diode-connected reference transistor 32 and a mirror transistor 34 .
- a more sophisticated circuit such as a Widlar current source may be used rather than this basic two-transistor configuration.
- i R the current shunted by shunt circuit 18 a via reference transistor 32
- i R similarly, we have designated the current flowing through mirror transistor 34 as i R /IN, wherein, as is known, N is the ratio of the widths of reference transistor 32 and mirror transistor 34 .
- field strength current source 24 is a set of n individual current sources 24 a , each connected in parallel between the supply node 28 and the mirror transistor 34 .
- field strength current source 24 a is adapted to source current at a level corresponding to an n-bit digital control value developed by a counter 38 .
- field strength current source 24 a is potentially capable of sourcing thirty-two distinct reference current levels.
- the initial, minimum reference current level be selected so as to be less than the current carrying capacity of the mirror transistor 34 when the shunt circuit 18 a first begins to shunt excess induced current through reference transistor 32 ; that the maximum reference current level be selected so as to be greater than the current carrying capacity of the mirror transistor 34 when the shunt circuit 18 a is shunting a maximum anticipated amount of excess induced current; and that the intermediate reference current levels be distributed relatively evenly between the minimum and maximum levels.
- alternate schemes may be practicable, and, perhaps, desirable depending on system requirements.
- a conventional analog-to-digital converter (“ADC”) 40 having its input connected to a sensing node 36 , provides a digital output indicative of the field strength reference voltage, v R , developed on sensing node 36 .
- ADC 40 may comprise a comparator circuit adapted to switch from a logic_0 state to a logic_1 when sufficient current is sourced by field strength current source 24 a to raise the voltage on sensing node 36 above a predetermined reference voltage threshold, v 1h .
- ADC 40 may be implemented as a multi-bit ADC capable of providing higher precision regarding the specific voltage developed on sensing node 36 , depending on the requirements of the system.
- Sufficient current may be characterized as that current sourced by the field strength current source 24 a or sunk by mirror transistor 34 such that the voltage on sensing node 36 is altered substantially above or below a predetermined reference voltage threshold, v 1h .
- v 1h is, in its simplest form, one-half of the supply voltage (VDD/2).
- VDD/2 supply voltage
- v 1h may by appropriately modified by altering the widths and lengths of the devices of which the inverter is comprised.
- v 1h may be established by design depending on the system requirements and furthermore, may be programmable by the system.
- a latch 42 captures the output state of ADC 40 in response to control signals provided by a clock/control circuit 44 . If the captured state is logic_0, the clock/control circuit 44 will change counter 38 to change the reference current being sourced by field strength current source 24 a ; otherwise clock/control circuit 44 will, at least temporarily, cease operation. However, notwithstanding, the digital field-strength value developed by counter 38 is available for any appropriate use, as discussed above.
- step 48 the field strength reference voltage, v R , developed on sensing node 36 and digitized by ADC 40 is captured in latch 42 (step 50 ). If the captured field strength reference voltage, v R , is less than (or equal to) the predetermined reference threshold voltage, V tlv clock/control 44 will change counter 38 (step 54 ).
- This process will repeat, changing the reference current sourced by field strength current source 24 a until the captured field strength reference voltage, v R , is greater than the predetermined reference threshold voltage, Vt 1 v (at step 52 ), at which time the process will stop (step 56 ).
- this sweep process can be selectively reactivated as required, beginning each time at either the initial field-strength value or some other selected value within the possible range of values as desired.
- the graph illustrated in FIG. 5 depicts several plots of the voltage developed on sensing node 36 as the field strength detector circuit 20 a sweeps the value of counter 38 according to the flow illustrated in FIG. 4 .
- the curve labeled “A” in FIG. 5 begins at a logic_0 value when the value of counter 38 is at a minimum value such as “1” as an exemplary value.
- Subsequent loops though the sweep loop gradually increase the field strength reference voltage on sensing node 36 until counter 38 reaches a value of “4” as an example.
- FIG. 6 illustrates one possible embodiment where receiver circuit 10 a uses a field strength detector 20 b specially adapted to share with tuner 16 a the control of the tank circuit 14 .
- receiver circuit 10 a uses a field strength detector 20 b specially adapted to share with tuner 16 a the control of the tank circuit 14 .
- the tank circuit 14 so as to dynamically shift the f R of the tank circuit 14 to better match the fc of the received RF signal at antenna 12 .
- FIG. 6 we have shown in FIG. 6 how the embodiment shown in FIG.
- FIG. 7 Shown in FIG. 7 is the operational flow (similar to that illustrated in FIG. 4 in our Related Patent) of our new field strength detector 20 b upon assuming control of tank circuit 14 .
- differentiator 60 will determine the polarity of the change of the previously saved field-strength value with respect to the then-current field-strength value developed in counter 38 (step 66 ). If the polarity is negative (step 68 ), indicating that the current field-strength value is lower than the previously-saved field-strength value, differentiator 60 will assert a change direction signal; otherwise, differentiator 60 will negate the change direction signal (step 70 ). In response, the shared components in tuner 16 a downstream of the multiplexer 58 will change the tuning characteristics of tank circuit 14 (step 72 ) (as fully described in our Related References).
- step 64 the resulting change of field strength, as quantized is the digital field-strength value developed in counter 38 during the next sweep (step 64 ), will be detected and, if higher, will result in a further shift in the f R of the tank circuit 14 in the selected direction or, if lower, will result in a change of direction (step 70 ).
- our invention will selectively allow the receiver 10 a to maximize received field strength even if, as a result of unusual factors, the f R of the tank circuit 14 may not be precisely matched to the fc of the received RF signal, i.e., the reactance of the antenna is closely matched with the reactance of the tank circuit, thus achieving maximum power transfer.
- tuner 16 a it would be unnecessary for tuner 16 a to perform an initial operating sequence as fully described in our Related Patent. Rather, field strength detector 20 b may be used exclusively to perform both the initial tuning of the receiver circuit 10 a as well as the subsequent field strength detection.
- source impedance of antenna 12 and load impedance of tank circuit 14 may be represented alternatively in schematic form as in FIG. 8 , wherein antenna 12 is represented as equivalent source resistance R 5 74 and equivalent source reactance X 5 76 , and tank circuit 14 is represented as equivalent load resistance RL 78 and equivalent, variable load reactance XL 80 .
- FIG. 9 we have illustrated an alternate embodiment of our field strength detector illustrated in FIG. 3 .
- shunt circuit 18 b is used to develop a substantially constant operating voltage level across supply node 28 and ground node 30 .
- the current reference 22 is implemented as a current mirror circuit 22 b connected in series with shunt circuit 18 b between nodes 28 and 30 .
- the field strength current source comprises a resistive component 84 adapted to function as a static resistive pull-up device.
- resistive component 84 adapted to function as a static resistive pull-up device.
- the field strength voltage reference v R developed on sensing node 36 will be drawn to a state near the supply voltage when the mirrored current flowing though transistor 34 is relatively small, e.g. close to zero amps, indicating a weak field strength. As the field strength increases, the current flowing through mirror transistor 34 will increase, and the field strength voltage reference v R developed on sensing node 36 will drop proportionally to the mirrored current flowing through mirror transistor 34 as i R /N.
- ADC 40 having its input connected to sensing node 36 , provides a digital output indicative of the field strength reference voltage, v R , developed on sensing node 36 , as described previously.
- latch 42 captures the output state of ADC 40 in response to control signals provided by a clock/control circuit 44 .
- the ADC 40 may comprise a comparator circuit.
- ADC 40 is adapted to switch from a logic_1 state to a logic_0 when sufficient current is sunk by mirror transistor 34 to lower the voltage on sensing node 36 below a predetermined reference voltage threshold, v 1h .
- ADC 40 may be implemented as a multi-bit ADC capable of providing higher precision regarding the specific voltage developed on sensing node 36 , depending on the requirements of the system.
- Comparator 82 subsequently compares the captured output state held in latch 42 with a value held in counter 38 that is selectively controlled by clock/control circuit 44 .
- clock/control circuit 44 may selectively change the value held in counter 38 to be one of a higher value or a lower value, depending on the algorithm employed.
- clock/control circuit 44 may also selectively reset the value of counter 38 or comparator 82 or both.
- the digital field-strength value developed by counter 38 is available for any appropriate use, as discussed above.
- FIG. 10 we have illustrated another alternate embodiment of our field strength detector illustrated in FIG. 3 .
- shunt circuit 18 c is used to develop a substantially constant operating voltage level across supply node 28 and ground node 30 .
- the current reference 22 is implemented as a resistive component 86 that functions as a static pull-down device.
- the field strength voltage reference v R developed on sensing node 36 will be drawn to a state near the ground node when the current flowing though shunt circuit 18 c is relatively small, e.g. close to zero amps, indicating a weak field strength.
- ADC 40 having its input connected to a sensing node 36 , provides a digital output indicative of the field strength reference voltage, v R , developed on sensing node 36 , as described previously.
- latch 42 captures the output state of ADC 40 in response to control signals provided by a clock/control circuit 44 .
- the ADC 40 may comprise a comparator circuit.
- ADC 40 is adapted to switch from a logic_0 state to a logic_1 when sufficient current is sourced by shunt circuit 18 c to raise the voltage on sensing node 36 above a predetermined reference voltage threshold, v 1h .
- ADC 40 may be implemented as a multi-bit ADC capable of providing higher precision regarding the specific voltage developed on sensing node 36 , depending on the requirements of the system.
- Comparator 82 subsequently compares the captured output state held in latch 42 with a value held in counter 38 that is selectively controlled by clock/control circuit 44 .
- clock/control circuit 44 may selectively change the value held in counter 38 to be one of a higher value or a lower value, depending on the algorithm employed.
- clock/control circuit 44 may also selectively reset the value of counter 38 or comparator 82 or both.
- the digital field-strength value developed by counter 38 is available for any appropriate use, as discussed above.
- our invention may be adapted to sense the environment to which a tag is exposed, as well as sensing changes to that same environment.
- the auto-tuning capability of tuner 16 acting in conjunction with tank circuit 14 detects antenna impedance changes. These impedance changes may be a function of environmental factors such as proximity to interfering substances, e.g., metals or liquids, as well as a function of a reader or receiver antenna orientation.
- our field strength (i.e., received power) detector 20 may be used to detect changes in received power (i.e., field strength) as a function of, for example, power emitted by the reader, distance between tag and reader, physical characteristics of materials or elements in the immediate vicinity of the tag and reader, or the like. Sensing the environment or, at least, changes to the environment is accomplished using one or both of these capabilities.
- the tag 88 of FIG. 11 contains both a source tag antenna 12 (not shown, but see, e.g., FIG. 6 ) and a corresponding load chip tank circuit 14 (not shown, but see, e.g., FIG. 6 ).
- Each contains both resistive and reactive elements as discussed previously (see, e.g., FIG. 8 ).
- a tag 88 containing such a tank circuit 14 mounted on a metallic surface will exhibit antenna impedance that is dramatically different than the same tag 88 in free space or mounted on a container of liquid.
- Table 1 displays exemplary values for impedance variations in both antenna source resistance 74 as well as antenna source reactance 76 as a function of frequency as well as environmental effects at an exemplary frequency:
- the tuner circuit 16 of our invention as disclosed in the Related References automatically adjusts the load impendence by adjusting load reactance 80 (see, e.g., FIG. 8 ) to match source antenna impedance represented by source resistance 74 (see, e.g., FIG. 8 ) and source reactance 76 (see, e.g., FIG. 8 ).
- load reactance 80 see, e.g., FIG. 8
- source reactance 76 see, e.g., FIG. 8
- matching of the chip load impedance and antenna source impedance can be performed automatically in order to achieve maximum power transfer between the antenna and the chip.
- Our invention as disclosed in the Related References contained a digital shift register 90 for selectively changing the value of the load reactive component, in the present case a variable capacitor, until power transfer is maximized.
- This digital value of the matched impendence may be used either internally by the tag 88 , or read and used by the reader 92 , to discern relative environmental information to which the tag 88 is exposed.
- tag 88 may contain a calibrated look-up-table within the clock/control circuit 44 which may be accessed to determine the relevant environmental information.
- a RFID reader 92 may issue commands (see transaction 1 in FIG. 11 ) to retrieve (see transaction 2 in FIG. 11 ) the values contained in digital shift register 90 via conventional means, and use that retrieved information to evaluate the environment to which tag 88 is exposed.
- the evaluation could be as simple as referencing fixed data in memory that has already been stored and calibrated, or as complex as a software application running on the reader or its connected systems for performing interpretive evaluations.
- counter 38 will contain the digital representation developed by our field strength detector 20 of the RF signal induced current, and may be used either internally by the tag 88 , or read and used by the reader 92 , to discern relative environmental information to which the tag 88 is exposed.
- reader 92 may issue a command to the tag 88 (see transaction 1 in FIG.
- this digital value of the field strength stored in the counter 38 may be used either internally by the tag 88 , or read and used by the reader 92 , to discern relative environmental information to which the tag 88 is exposed.
- tag 88 may contain a calibrated look-up-table within the clock and control block 44 which may be accessed to determine the relevant environmental information.
- an RFID reader may issue commands to retrieve the values contained in digital shift register 90 , and use that retrieved information to evaluate the environment to which tag 88 is exposed.
- the evaluation could be as simple as referencing fixed data in memory that has already been stored and calibrated, or as complex as a software application running on the reader or its connected systems for performing interpretive evaluations.
- the combining of the technologies enables a user to sense the environment to which a tag 88 is exposed as well as sense changes to that same environment.
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Abstract
Description
TABLE 1 |
Antenna Impedance Variations |
In free air | 860 MHz | 910 MHz | 960 MHz | ||
Rs | 1.9 | 2.5 | 3.7 | ||
Xs | 124 | 136 | 149 | ||
@910 MHz | Free Air | On Water | On Metal | ||
Rs | 2.5 | 26 | 1.9 | ||
Xs | 146 | 136 | 27 | ||
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US16/724,659 US10917064B2 (en) | 2006-11-18 | 2019-12-23 | Method and apparatus for detecting RF field strength |
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US11/601,085 US7586385B2 (en) | 2006-11-18 | 2006-11-18 | Method and apparatus for varying an impedance |
US12/462,331 US8081043B2 (en) | 2006-11-18 | 2009-08-01 | Method and apparatus for varying an impedance |
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US201161485732P | 2011-05-13 | 2011-05-13 | |
US13/209,420 US8749319B2 (en) | 2006-11-18 | 2011-08-14 | Method and apparatus for detecting RF field strength |
US14/150,392 US9825608B2 (en) | 2006-11-18 | 2014-01-08 | Method and apparatus for detecting RF field strength |
US15/818,097 US10516380B2 (en) | 2006-11-18 | 2017-11-20 | Method and apparatus for detecting RF field strength |
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US9048819B2 (en) * | 2006-11-18 | 2015-06-02 | RF Micron, Inc. | Method and apparatus for detecting RF field strength |
US8826473B2 (en) | 2011-07-19 | 2014-09-09 | Hill-Rom Services, Inc. | Moisture detection system |
DE102012015406A1 (en) * | 2012-08-01 | 2014-02-06 | Gantner Electronic Gmbh | Method and device for optimizing the RFID field of an access control device |
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US20180076789A1 (en) | 2018-03-15 |
US10917064B2 (en) | 2021-02-09 |
US20110300808A1 (en) | 2011-12-08 |
US10476467B2 (en) | 2019-11-12 |
US9825608B2 (en) | 2017-11-21 |
US20140120836A1 (en) | 2014-05-01 |
US20170302247A9 (en) | 2017-10-19 |
US20190097598A1 (en) | 2019-03-28 |
US8749319B2 (en) | 2014-06-10 |
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