UA98983U - Method for determining the depth of thin nonferromagnetic films with the help of the resonance eddy-current converter - Google Patents
Method for determining the depth of thin nonferromagnetic films with the help of the resonance eddy-current converterInfo
- Publication number
- UA98983U UA98983U UAU201413437U UAU201413437U UA98983U UA 98983 U UA98983 U UA 98983U UA U201413437 U UAU201413437 U UA U201413437U UA U201413437 U UAU201413437 U UA U201413437U UA 98983 U UA98983 U UA 98983U
- Authority
- UA
- Ukraine
- Prior art keywords
- tnf
- magnetic flux
- ecc
- electrical conductivity
- controlled
- Prior art date
Links
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- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
A method for determining the depth of thin nonferromagnetic films (TNF) with the help of the resonance eddy-current converter is that when the eddy-current converter (ECC) is mounted on the surface controlled TNF, the magnetic flux, occurring with this, is localized and caused eddy currents on the TNF surface, vortex currents induce their own oppositely directed magnetic flux, it is engaged with an external magnetic flux, the resulting magnetic flux that causes a EMF change of the measurement transmitter coil, which value is recorded on the display device according to the value recorded signal that is helps decide regarding the monitored parameter. First, ECC circuits settings into the resonance mode is performed without involving the controlled TNF. Nonferromagnetic materials are used as controlled products. The excitation and measuring coils are connected to the respective oscillating circuits, working in the resonance mode. To eliminate the influence of external capacitive actions and to further localize the magnetic flux between the excitation and measuring coils the ground coil is connected, which is located on the unlocked side of the core and it is designed as a single-layer flat spiral, which eliminates the influence of external interference, fields and capacitive influence of TNF. If the TNF electrical conductivity is larger than the electrical conductivity of the basis, then the ECC should be configured into resonate jointly with the controlled TNF, in this case the resonance frequency is given by: EMBED Equation.3 . If TNF electrical conductivity is smaller than the electrical conductivity of the basis, then the ECC should be configured into resonate without the examined film and this resonant frequency is given by: EMBED Equation.3 .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| UAU201413437U UA98983U (en) | 2014-12-15 | 2014-12-15 | Method for determining the depth of thin nonferromagnetic films with the help of the resonance eddy-current converter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| UAU201413437U UA98983U (en) | 2014-12-15 | 2014-12-15 | Method for determining the depth of thin nonferromagnetic films with the help of the resonance eddy-current converter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| UA98983U true UA98983U (en) | 2015-05-12 |
Family
ID=53674853
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| UAU201413437U UA98983U (en) | 2014-12-15 | 2014-12-15 | Method for determining the depth of thin nonferromagnetic films with the help of the resonance eddy-current converter |
Country Status (1)
| Country | Link |
|---|---|
| UA (1) | UA98983U (en) |
-
2014
- 2014-12-15 UA UAU201413437U patent/UA98983U/en unknown
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