Харківський Національний Автомобільно-Дорожній Університет
Борис Іванович Левандовський
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Analysing Materials By The Use Of Radiation
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Abstract
A method for determination of interface energy in acicular crystals with a bamboo structure is disclosed according to which the value of energy is determined by measuring the parameters of electric field acting on a specimen when the specimen is broken along grain boundaries under three-dimension scanning in a field ion microscope, at that an unknown quantity is calculated by formulas according to the known relevant characteristics of the specimen's crystal lattice and the measured parameters.
UAU201405711U2014-05-272014-05-27Method for determination of interface energy in acicular crystals with a bamboo structure
UA93787U
(en)
Method for evaluating degree of crystalline orientation of polycrystalline silicon, method for selecting polycrystalline silicon rod, polycrystalline silicon rod, polycrystalline silicon ingot, and method for manufacturing monocrystalline silicon