UA69480C2 - Optical device and a method for viewing high-temperature objects - Google Patents

Abstract

An optical system for viewing hot objects (2) is disclosed. The system projects electromagnetic radiation (26) to the part surface and detects the reflected portion. Based on wavelength and/or modulation of the applied illumination, the surface characteristics of the part can be observed (30) without interference from self-emitted radiation.

Description

Description of the invention

This invention relates, in general, to methods and devices for optical observation of 2 high-temperature objects, including objects with significant intrinsic radiation.

In a number of industries, workers still visually inspect high-temperature, glowing objects with their unprotected eyes. However, direct exposure to infrared (IR) radiation can cause physical injury to workers. Accordingly, sometimes use sunscreens that weaken this ray, thereby providing some protection against the action of infrared rays. However, 70 the use of light protection products often restricts the mobility of workers. For example, wearing light protection may limit their ability to physically interact with other non-luminous objects such as instruments, controls, etc.

Conventional optical control devices are also used to monitor and/or control high-temperature objects. For example, in the so-called "passive method" for receiving the beam, 72 caused by the own radiation of high-temperature objects, a signal receiver is used in combination with either CRTs (electron beam tubes) or cameras on charge-coupled devices ( PZ3), or with IR cameras. This approach is analogous to the use of human vision, where said signal receivers actually function as "eyes". However, this passive method is affected by a phenomenon known as the "resonator emitter effect". The effect of the resonator emitter, postulated by Planck in 1900. and proved by Einstein at the beginning of the twentieth century, can mislead visual observers as to the true nature of the observed object. Namely, according to this principle, the concave fragments of the surface of the radiating object look almost like completely black bodies; accordingly, they can be mistaken for convex fragments. In addition, the object itself emits "light", which often carries unwanted information. Images obtained using such a passive method are usually unsuitable for use in automatic visual surveillance systems. Go)

Another method known from the state of the art, the so-called "active method", uses external light sources that irradiate a high-temperature object. A camera is used to collect the reflected beam, as well as the beam caused by the own radiation of high-temperature surfaces. The idea of this active method is to use very strong external radiation to exceed the power of the own radiation. In other words, the reflected ray is in the same spectrum as the prevailing ray due to its own radiation, but it is different in intensity. These external sources of radiation can be made with the ability to illuminate interesting information about the surface, such as contours and depressions in the surface. Such an external beam can be provided by various light-emitting devices, such as high-power lamps or lasers. 325 However, there are several problems associated with this active method. Firstly, there are few light sources capable of exceeding the radiation power of an object with a temperature of 1350°C. Secondly, the radiation itself still creates inconvenience: it degrades the quality of the signal in the reflected beam. The signal-to-noise ratio ( external radiation beam/self radiation beam) is usually low, "unless a very powerful light source is used. Thirdly, such external light sources may C 70 be undesirable in work rooms, because of their high power. c To exceed the power of the own lasers are also used as a light source for the radiation of high-temperature objects. Lasers are able to provide power of extremely high density, which suppresses the significance of the own radiation. For example, in order to exceed the power of the own radiation of the welding bath during laser welding (temperature of about 3000 "С) , which typically emits in the spectrum from 230 nm to the far IR range, in a copper laser is used (which emits from

Me with a wavelength of 55 Ohm). (se) In another known state-of-the-art solution for arc welding (temperature approximately 25007), the typical spectrum of radiation is from 275 nm to the far IR range, AIG lasers (10 bOhm) are used. However, there are significant problems associated with the use of lasers. Although lasers provide a high energy density, the areas irradiated by laser beams are small. Therefore, when using lasers as radiation sources, raster scanning should usually be performed. In addition, these powerful lasers are expensive, bulky, and their use is associated with various dangers. And, in order to work with a system that uses a laser, users must be protected by light protection and other protective equipment.

The use of infrared (IR) sensors or IR cameras in a technical vision system built on 29 applications of the passive method is also limited by a number of factors. First, IR sensors/cameras provide

GF) significantly lower pixel resolution than their counterparts on devices with PZ3. Second, because of its wavelength, infrared radiation cannot be focused as well as visible light. Third, the use of IR sensors/cameras does not solve the previously described problems related to exposure or the effect of the resonator emitter. 60 Attempts were also made to combine passive and active methods, but this approach does not solve the problems caused by the effect of the resonator emitter and its own radiation.

In the past, solving problems related to the glow of high-temperature objects focused on the difference between infrared radiation and visible light. This approach as such appears to be wrong, since a high-temperature object can emit both in the infrared and in the visible spectrum. For example, at a temperature of 12007C, steel emits radiation with a wavelength of 5Onm; that is, steel can emit both red light and in the infrared region of the spectrum. In addition, if the self-radiation is not removed from the received signal, interference caused by this self-radiation impairs the system's ability to obtain detailed and accurate information about this high-temperature object. From the state of the art, an effective means for removing self-radiation from the received signal from a high-temperature object is unknown. Finally, none of the devices known in the prior art are believed to be portable. This fact limits the usefulness of such devices for certain tasks. A portable device would be desirable for users who need to look at high-temperature objects, but who do not need to make quantitative measurements. The external light sources used in known devices are very 7/0 powerful mAbo heavy to be safe and portable. In summary, the approaches used to date are of limited value. This invention overcomes these problems.

According to one aspect of the present invention, an optical system is proposed for determining the characteristics of the surface of a high-temperature object. This optical system includes a radiation source that directs an electromagnetic beam to a high-temperature object (applied EMF). This applied /5 electromagnetic beam "hits" a high-temperature object and is reflected in the direction of the electromagnetic beam detector, together with the electromagnetic beam due to the object's own radiation and the electromagnetic beam due to all external (background) radiation.

At least one component of this reflected applied electromagnetic beam (which interacts with the surface of a high-temperature object) is selectively received by the indicated electromagnetic 2o beam detector. According to one aspect of the present invention, this selectively identifiable reflected electromagnetic beam includes an electromagnetic beam with a wavelength that is determined based on the temperature of the object; in other words, based on the wavelength, it is distinguishable from the prevailing electromagnetic radiation caused by self-radiation and the electromagnetic radiation caused by background radiation. Thus, the acceptance of the specified reflected electromagnetic radiation allows to obtain an image of a high-temperature object, which will be a model of the surface of this object at a low temperature (lower than that at which there is any significant electromagnetic radiation).

According to another aspect of the present invention, the component of the reflected applied electromagnetic beam, which is identified by the specified detector, has a certain characteristic feature ("signature") due to the modulation of the applied electromagnetic beam. In this aspect, the optical system provided in accordance with the present invention further includes an electromagnetic beam modulator. co

In another aspect, this invention is embodied in the form of a hand-held (portable) device. "Mr

Fig. 1 is a diagram illustrating this invention.

Fig. 2 is a graph depicting the wavelengths used in the present invention to distinguish from me) c5 intrinsic radiation. co

Fig. 3 is a diagram illustrating one possible version of the system with a camera and an interference filter.

Fig. 4 is another diagram illustrating one possible version of the system with a camera and an interference filter.

Fig. 5 is another diagram illustrating one possible version of the system with a camera and an interference filter.

Fig. 6 is a graph illustrating the selection of the desired wavelength. "

Figure 7 is a graph illustrating the use of a limiting filter in the present invention. Figure 8 is a graph illustrating the use of power frequency modulation in the present invention. . Fig.9 is a graph illustrating the use of frequency mechanical modulation in the present invention. and?" Fig. 10 is a portable device according to the present invention.

Fig. 11 is a diagram of an embodiment of the present invention with two cameras.

Let's turn to Fig. 1 of the drawings, which shows one of the variants of the implementation of the present invention; it would show a target or object 20 that has its own electromagnetic radiation 22. The object 20 would typically include some part, for example, a carbon steel part, a titanium alloy part, a glass or ceramic part. As is known, in a number of production processes, these parts are heated to temperatures above 900°C. It is also known that at such high temperatures, these parts emit significant radiation, which makes it difficult to view the heated part (that is, the spectrum of the prevailing own electromagnetic radiation). 1 shows a light source 24, which directs an electromagnetic beam 26 to the surface of the object at 20. The beam 26 is the specified applied beam. A certain component of the applied beam 26 is reflected by the detail 20; it is shown in Fig. 1 as a reflected beam 28. Trace note that a certain fraction of the beam 22 due to self-radiation (denoted by position 22) and a certain beam of background radiation dv (Not shown) follows the same path as the reflected beam 28, together with it.

The reflected beam 28 (and the self-radiation beam 22) hits the detector or sensor 30. As (F) will be explained in more detail below, distinguishing the reflected beam 28 from the self-radiation beam 22 (or any other "interference" such as rays of background radiation), the ZO detector can see object 20 as if this object were cold (practically had no radiation of its own). In this embodiment of the present invention, the wavelength of the reflected beam 28 is chosen so that the detector Z0 can distinguish it from the wavelength of the beam 22 of the prevailing self-radiation. More specifically and with reference to FIG. 2, the present invention provides a contoured wavelength of the distinguishable applied beam as a function of the temperature of the object 20. Accordingly, the detector 30 recognizes or detects the reflected beam 28, the wavelength of which is below this curve. The preferred maximum wavelength 65 of the reflected beam 28, different from the specified self-radiation beam (which depends on temperature), is given in Table 1:

and about iv

The above wavelengths are obtained based on the assumption that object 20 is a black body emitter; they will be suitable for all applications because the spectral intensity 2o of the radiation emitted by a real surface at a given temperature and having a certain specific wavelength will always be less than the spectral intensity of the radiation emitted by a black body at the same temperature and wavelength. In one of the variants of the implementation of the present invention, the process of selecting the wavelength of the applied beam (arrow 26) can be determined more precisely as follows (see

O?ivik (1985) Neai Tgapzgeg - A Vavis Arrgoasi, MsOgam-NII)): c 1. Determine the maximum temperature of the object, T. 2. Determine the emissivity of the object, "(T, material), which is a function temperature and material about the object.

C. The spectrum of the self-radiation beam is obtained, based on the black body radiation function: "c) z pn levdt so x v kt -1 " and the emissivity of the material "(T), where: F lo - pi"

Zo c is the speed of light and is), n: Planck's constant

X is the wavelength

K - Boltzmann's constant " is the emissivity - a function of temperature; is obtained empirically. c 70 So, we have the radiation spectrum as:

If the material is known, equation (2) can be reduced to

Ge") V(x, Tutje(POKx, t) (3) o In general, the dependence of K(X, Т) can be represented graphically as it is done in Fig. b, t" with solid lines. For even greater certainty " (T) can, as a rule, be considered a constant value, because o 4. With the help of K(X, T), it is possible to find the critical wavelength of Hsuoi At which the value of K(Houoyut G) is very small compared to the signal intensity of the external irradiating beam p (ldu). Let's note, "2 SCHO du is usually smaller than soi z8-lbayu) u o 99 KO di-ov o where: o po) - the intensity of the external irradiating beam at the wavelength u. в Хж 7 The wavelength used for external irradiation. in t signal/noise ratio for the intensity data of the external irradiating beam and the beam of self-radiation. ud is a certain threshold signal-to-noise ratio that will satisfy the given application. p70) usually depends on the external irradiation device. For example, as indicated above, in 65 a halogen lamp (XX) similar to that shown in fig.b.

Accordingly, the maximum acceptable wavelength for a directed (reflected) electromagnetic beam is the one at which a blackbody emits with a spectral density of energy brightness that is 5x107W/(cmOhm) (power (in watts) per unit area per unit wavelength) at the maximum the temperature of the high-temperature object being observed. Thus, | in the above equation (1) becomes equal to 5x10 "W/cm? (5W/m2). Solving the equation according to A, for the case when T is equal to the maximum temperature of the object being observed, it is possible to determine the maximum permissible length wave for a given object, which can be distinguished from the object's own radiation.

Of course, the choice of Ada must satisfy the spectrum of sensitivity of the sensor-detector ZO. For example, the CCD is sensitive in the range shown in Fig. b6. Hu must be the wavelength that the ZO sensor is able to detect. Shown 70 in Fig. 6 962 is suitable for use at temperatures up to 150070.

The radiation source 24 can take a number of forms, but it must be capable of generating a beam of the desired detectable wavelength. In other words, if in order to distinguish the reflected beam 28 from the beam 22" of the object's own radiation, a wavelength of b45nm or less is required, then the radiation source 24 must generate an electromagnetic beam with a wavelength of b645nm or less. One 75 acceptable source of radiation 24 is a halogen lamp that emits electromagnetic radiation mostly at wavelengths of 435nm, 55nm and 575nm.Other preferred sources of radiation are fluorescent lamps and xenon lamps.

In the case of a laser illuminator, due to the coherent nature of the laser beam, the desired laser wavelength should be set according to Table 1 above.

The laser can also be used as a point source of radiation. The ZO detector can be used to receive information corresponding to a point irradiated by a laser. When connected to a guidance mechanism such as a mirror system, lasers can be used to produce a raster-scanned image. Due to the use of certain optics, such as a beam expander, the lasers of the present invention can also be used as zone sources of radiation, if these zones are relatively small. at

With certain optics, lasers can also be used for structural irradiation (arc lines, straight lines, single lines or series of lines). This structural irradiation can be used to determine the contours of high-temperature objects according to the present invention. Multiple lasers can be used for a series of points, lines, or zones. (av)

Of course, the intensity of the electromagnetic radiation applied by the radiation source 24 (and the distances between the source 24, the object 22 and the detector 30) must be such that the signal 09 of sufficient intensity arrives at the detector 30. "AND

It will be clear to those skilled in the art that the present invention can be practiced using other irradiation methods, such as frontal irradiation, bright field or dark field irradiation, and back irradiation F (transparent irradiation). Irradiation can be collimated or scattered, monochromatic or (Ce) colored, structural and non-structural. Schemes that combine different types of exposure can be used.

A system in which the ZO detector perceives several wavelengths of the reflected beam 28 is also possible, if only all selected wavelengths satisfy the specified criteria.

It will also be clear to those skilled in the art that in combination with the structures implemented in accordance with the present invention, additional optical means can be used, such as (but not limited to) lenses, mirrors, optical fibers, diffusers, collimators, condensers, prisms, borescopes, endoscopes and light guides. These optical means "can be used together with an irradiation device (a source of irradiating radiation and a modulator) to direct the beam to the irradiated high-temperature object(s) with irradiation of a plurality of points, or with irradiation of a plurality of objects, or in any other irradiating (o) structure. These optical means can also be used in conjunction with signal receivers to receive co-beam signals from high-temperature object(s), for example, to overcome spatial limitations or change the viewing angle. d» Let us now turn to detector 30; preference is given to the detector represented by the sensor on PZ33. because 50 The CCD sensor is usually sensitive to wavelengths from Zbonm to 100 Ohm. Some modern image sensors, such as ICs on advanced "blue" CCDs, are sensitive to wavelengths between 175nm and 100Ohm. 2 Of course, the detector 30 must be able to detect the reflected beam 25 of the desired wavelength. In the preferred embodiment, the interference filter 32 blocks virtually all electromagnetic radiation caused by the object's own radiation (and reflected electromagnetic radiation whose wavelength does not correspond to the specified desired wavelength).

The interference filter 32 may be positioned in front of the detector lens 34 as best shown

IF) in Fig. 3, or between the lens 34 and the image sensor 36, as shown in Fig. 4. It may also include several interference filters 38 located in front of the pixels 40 of the image sensor, as shown in Fig.5. It is also clear to those skilled in the art that the design shown in FIG. 5 can be modified to facilitate the use of multiple wavelengths of the irradiating beam. In this case, different interference filters 38 will be located in front of the pixels 40, some of which will work at one wavelength, and some at another. In such a design, different pixels will be sensitive to signals at different wavelengths. You can make a certain group of pixels, such as 2x3 or ХХ1, in which all pixels will be equipped with different interference filters. This distribution is similar to the distribution in IS on color PZ3. It is also possible to have one type of interference filter 65 in one area of the image sensor and another in another area.

It is also possible to facilitate the use of multiple wavelengths by using multiple image sensors in the camera, with different interference filters placed in front of the different image sensors. A prism is used to direct the optical beam to all the specified image sensors. This design is similar to the design of the Z-crystal color camera based on PZ3.

Specialists will also understand the use of limiting filters instead of interference filters in this case. The critical wavelength of the transmission curve of the limiting filter must correspond to the desired wavelength. This approach is illustrated in Fig. 7. A single desired wavelength or multiple wavelengths may be used in such a scheme. In the case of multiple wavelengths, signals that are transported on all selected wavelengths will be treated as a combined signal. 70 Distortions of the image of a high-temperature object come from various sources. The approach described above solves the problem of the distorting effects of IR light and resonator emitters. Another task is to creatively solve the problem of distortion associated with "mirage", the effect of optical flickering caused by localized inhomogeneities of air density. This phenomenon is often observed by drivers of vehicles on a hot summer day. It seems that the road surface is "floating" and "swaying". This 7/5 Mirage effect prevents accurate measurements from high-temperature objects when forming their images.

According to the present invention, the controlled air flow 43 around the high-temperature object 20 reduces the temperature gradient around this high-temperature object to eliminate the distortion caused by the non-uniform air density. The air stream 43 is heated to such a certain pre-selected temperature as not to cause a negative effect on the temperature distribution of this high-temperature object. To avoid localized inhomogeneity of air density, the velocity of this air flow must be greater than approximately 0.01 m/s.

In another embodiment of the present invention, which is also illustrated in Fig. 1 of the drawings, a signal modulator 42 is used to impose an identifying "print" on the applied beam 26. In other words, in this variant of the implementation of the invention, the electromagnetic beam from the source 24 has a certain identifying characteristic feature (other than just the wavelength), or "signature" that makes it possible to distinguish the reflected electromagnetic beam 28 from the own electromagnetic beam 227, due to its own i) radiation object

This variant of implementation is also schematically shown in Fig. 8. In this embodiment, the power applied to the radiation source 24 is modulated by a frequency modulator 44. This FM "signature" will be characteristic of the radiated beam 46 generated by the source 24. This beam is subsequently directed to the surface of the high-temperature object 20 The reflected signal 48 is received by the detector 30 and is demodulated by the frequency demodulator 50 (using the signal processing unit), based on the corresponding preset modulation frequency, getting rid of the unmodulated beam 52, i.e. caused by the object's own radiation. Processing of the demodulated signal can be performed by hardware or software, or a combination of both. The specified frequency modulation can be a certain sequence of frequencies, so that the applied (directed at the object) beam will acquire the character of a periodic rectangular oscillation, or it can be a dynamic modulation that causes a certain sinusoidal oscillation of a variable frequency and can be detected and demodulated as a reflected beam.

The modulation can also be implemented mechanically, using a shutter with a mechanical drive to obtain a "pulsating" irradiating beam, as shown in Fig. 9, or as a sinusoidal oscillation with the intensity of the beam. . The devices, in which the specified variants of the present invention are embodied, can be mobile, partly and or completely. In one case, the signal receiver is mobile, while the irradiating device and the high-temperature object remain stationary. Otherwise, both the signal receiver and the irradiating device are mobile, and the high-temperature object is stationary. It would also be possible to move the high-temperature object, while the signal receiver and the irradiating device will be stationary or mobile. It is also possible to use two signal receivers or two irradiating devices in one system, and one device will be mobile, and the other - stationary. In another embodiment, this invention is implemented in the form of a hand-held (portable) device 58. Let us turn to Fig. 10 of the drawings, where a portable camera 60 is shown, which has a beam projection source 62 and an interference filter 64. The camera 60, which can be digital or analog, is used as a specified signal receiver. An interference filter 64 (mainly for a wavelength of 435 nm) is located in front of the lens. The external projection source 62 of the beam generates the applied beam and emits with a significant intensity (in this example, with a wavelength of 435 nm). The source 62 of the beam can be attached to the surface of the camera 60 or can be made in the form of a separate block, in order to provide several angles of irradiation. The camera 60 may use magnetic tape, RAM, or any other suitable storage device, or it may be used simply as a display monitor. The video signal may be exported to a television, monitor, or PC. The portable device 58 may be powered by batteries or source of alternating current. This device can be used to observe high-temperature processes or objects in accordance with the present invention, that is, by directing the desired beam at the high-temperature object and viewing the image (after the beam due to the self-emission of this object has been filtered object) using the camera.

In yet another implementation, several signal receivers, such as cameras, can be used in the same system, which provide observation of a high-temperature object from several observation points. Using 65 Multiple cameras can contribute to the formation of a stereo image, which gives a three-dimensional image of a high-temperature object. Multiple cameras can also be used to use multiple wavelength values - then each camera will demodulate a signal carried on the same wavelength.

In another embodiment, graphically presented in Fig. 11, this invention can be used for the protection of persons who must interact with high-temperature objects. More specifically, this system uses two cameras, 70 and 72, to capture the same field of view, one capturing a normal image 74, which may be color or black and white, and the other capturing an image 76 using the present invention. using a beam splitter 77 and an interference filter 79. In a normal image 74, a high-temperature object 78 glows. The glowing object 78 can be 70 identified using a suitable device, such as (but not limited to!) a portable processor 82 for processing signals. After identifying the high-temperature object 78, the normal images of this glowing object can be replaced by their room-temperature counterparts (cut from 76 and inserted into 74). This synthesized image will be displayed to those who need to see everything in this field of view. The display 80 can be a monitor, television, or any other display device, including reflective glasses. To identify high-temperature objects in said synthesized image, these high-temperature objects may be accompanied by some marking, such as (but not limited to) a red flashing outline.

Example

As an example of one of the variants of the implementation of the present invention, the following can be given: 1. The external source of irradiation is a halogen lamp. A halogen lamp emits at three main wavelengths: 435 nm, 55 nm and 575 nm. The beam with a wavelength of 435 nm is the most effective in this option, since it is the most distant from the beam caused by the high-temperature object's own radiation. In order for the proper radiation of a high-temperature object to overlap the wavelength of 435 nm, its temperature must be 18007"C or higher, assuming that this high-temperature object is close in its characteristics to a black body. 2. The rays of an external radiation source are directed to the indicated high-temperature object "object i) and interacts with the surface of this high-temperature object. The reflected light from the halogen lamp (with all three separate wavelengths), the radiation due to the high-temperature object's own radiation, and any other radiation present are mixed together. о зо 3 .This mixed beam is then passed through an interference filter with an operating wavelength of 435nm. That is, only a beam with a wavelength of 435nm can pass through this filter. Any other beam will be retained. This interference filter can be located in front of the lens or in front of the sensor "E image. 4. Just a beam with a pre-selected wavelength, in this one case - 435nm, can reach the image sensor (22). so 5. The specified high-temperature object will be perceived by the image sensor, say, IS on PZ3, as if its temperature were room temperature. 6. Subsequently, the demodulated signal from a beam with a wavelength of 435 nm is converted into an electronic signal. 7. This electronic signal may be processed by a CPU, recorded on a specific medium, displayed on a monitor for human observation, or subjected to any other form of processing. .

Fo z i ha le (Se) ge 2 7 so 50 28. Ai rf-UN s Zo che DU ev

FIG. 1

F) name) 60 b5 i voo 8 04 or i voochi i i: ochi i u it" that Y i ra r Kk i i a Zo a ko i Ty mln sh 20 o control of vetknkovtrh obehtiv r, ri 7 z

Shk Ka i miy,! ra 7 re r4 r y y o l1o0a OO ZO 0

Temigratuwa (C)

Fig. 294

FIG. 3 6 oi with 7 o)

FIG. 4 o yo | iy « -0 v o 7 Ge) y « yu i FIG. 5 7 s. "» . p and KO) at 15002С p lo TSI and and ukashi a

F! NO y, Sensitivity of PZZ (Se) t PO and Me VO) at 1000 pi x ih y / SHCI Mn tn 0) at 500C be 0 dob pt Vobpt bolt with FIG. 6

MU p

And 44 KO) at 150022

F) The level of the limiting PAS. of the HY filter

А Ш How КО) at 10006С 60 g and in m let y

I ch i x KO.) at 50092 400 pt VOOpt 12O0pt 65

24 46 c) o Zhan | AND

MODULATOR

44

FREQUENCY -eE

DEMODULE TOR DETECTOR I

In what and 7 FIG. 8

Iv| ROTARY in optical Goi "dr SHUTTER ; "3 g" a yo Ge) -- - U

FREQUENCY DETECTOR | "Fri ----NN

DEMODULATOR U

, with be. 58 o

Fig. lo v /d not a seam WHAT

CHVA | «c) 65 ShK s-e vo (ee) « gy (o)

EXTERNAL PROJECTOR

C5 "1-4 DIRECTED BEAM (Se)

BEAM SPLITTER 26 shk g - "FI prin " 74 28 z Y Z

INTERFERENCE-

DISPLAY y-t 1 ND FILTER s 8o. AND HIGH TEMPERATURE - CAMERA 2 OOBJECT and PROCESSOR FOR

BEAM PROCESSING

SIGNALS OF BNIA ZV.

Claims (19)

Formula of the invention ChK" , I and i so 1. An optical system for forming an image of the surface of a certain object, which has a certain characteristic and prevailing spectrum of its own electromagnetic radiation, which depends on the temperature, which includes: a source of electromagnetic radiation for directing an electromagnetic beam to the specified object; an electromagnetic radiation detector that selectively detects a certain spectral component of the Specified directed electromagnetic radiation, which is reflected by the surface of the specified object and is directed to the specified electromagnetic radiation detector; and the specified reflected (F) component of directed electromagnetic radiation has a wavelength that differs from the wavelength of the GI wave, which corresponds to the specified prevailing spectrum of own electromagnetic radiation, so that this reflected component can be distinguished from the specified own electromagnetic radiation, because Based on the wavelength. 2. Optical system according to claim 1, which includes a video recording device. C. The optical system of claim 1, wherein said electromagnetic radiation detector is a charge-coupled device. 4. The optical system according to claim 1, in which the specified source of electromagnetic radiation is selected from b5 of the Group, which consists of halogen lamps, fluorescent lamps and xenon lamps. 5. The optical system according to claim 1, in which the specified source of electromagnetic radiation is a laser. 6. The optical system according to claim 5, in which the specified laser performs zonal irradiation. 7. Optical system according to claim 5, which additionally includes a set of mirrors for directing the beam from the indicated source of electromagnetic radiation. 8. The optical system according to claim 5, in which the specified laser performs structured irradiation. 9. The optical system according to claim 1, in which the specified detector detects a certain set of wavelengths of the reflected electromagnetic beam. 10. The optical system according to claim 3, in which the specified charge-coupled device is sensitive to wavelengths in the range of 175-1000 nm. 70 11. The optical system according to claim 1, which additionally includes an interference filter used together with the specified electromagnetic radiation detector. 12. The optical system according to claim 11, in which the said interference filter does not pass almost all the electromagnetic radiation caused by its own radiation. 13. Optical system according to claim 1, which additionally includes a limiting filter used together with /5 specified electromagnetic beam detector. 14. The optical system according to claim 1, which additionally includes an air flow regulator, which provides air supply to the specified object to eliminate distortion caused by non-uniformity of air density. 15. The optical system according to claim 1, which additionally includes a frequency modulator used in conjunction with said source of electromagnetic radiation to modulate the frequency of said directed electromagnetic beam, and which further includes a demodulator used in conjunction with said detector of electromagnetic radiation. 16. The optical system according to claim 1, which additionally includes means for obtaining a "pulsating" directed electromagnetic beam. 17. The optical system according to claim 1, in which the specified source of electromagnetic radiation is a certain set of sources of electromagnetic radiation. 18. The optical system according to claim 1, in which the specified electromagnetic radiation detector is a certain i) set of electromagnetic radiation detectors. 19. An optical system for forming an image of the surface of a certain high-temperature object, which has a certain characteristic prevailing spectrum of its own electromagnetic radiation, which includes: Video camera; an interference filter used together with the specified video camera, which does not pass almost all rays from the specified spectrum of its own electromagnetic radiation; and a light source attached to the specified camera. Official Bulletin "Industrial Property". Book 1 "Inventions, useful models, topographies of integrated me) microcircuits", 2004, M 9, 15.09.2004. State Department of Intellectual Property of the Ministry of Education and Science of Ukraine. - and? (o) se) sh" (ee) (42) ime) 60 b5