UA58836U - Eddy-current method for determination of depth of defect and residual thickness of not damaged layer of thin-wall constructions made of non-ferromagnetic materials - Google Patents

Eddy-current method for determination of depth of defect and residual thickness of not damaged layer of thin-wall constructions made of non-ferromagnetic materials

Info

Publication number
UA58836U
UA58836U UAU201011948U UAU201011948U UA58836U UA 58836 U UA58836 U UA 58836U UA U201011948 U UAU201011948 U UA U201011948U UA U201011948 U UAU201011948 U UA U201011948U UA 58836 U UA58836 U UA 58836U
Authority
UA
Ukraine
Prior art keywords
defect
eddy
depth
determination
residual thickness
Prior art date
Application number
UAU201011948U
Other languages
Russian (ru)
Ukrainian (uk)
Inventor
Валентин Николаевич Учанин
Original Assignee
Физико-Механический Институт Им. Г.В. Карпенко Нан Украины
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Физико-Механический Институт Им. Г.В. Карпенко Нан Украины filed Critical Физико-Механический Институт Им. Г.В. Карпенко Нан Украины
Priority to UAU201011948U priority Critical patent/UA58836U/en
Publication of UA58836U publication Critical patent/UA58836U/en

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Abstract

Eddy-current method for determination of depth of defect and residual thickness of not affected layer of thin-wall constructions made of non-ferromagnetic materials at which one determines linear distribution of amplitude of signal of vortex-current transformer along the defect revealed at orientation of eddy-current transformer at which projection of centers of counter-connected windings of vortex-current transformer to controlled surface in line of defect, one determines coordinates of two points on linear distribution in which amplitude of signal of defect has maximal values and by distance between the points with maximal amplitude one determines length of defect, depth of defect and respective residual thickness of not affected layer are determined by correlation dependences plotted for determination of value of length of defect.
UAU201011948U 2010-10-08 2010-10-08 Eddy-current method for determination of depth of defect and residual thickness of not damaged layer of thin-wall constructions made of non-ferromagnetic materials UA58836U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
UAU201011948U UA58836U (en) 2010-10-08 2010-10-08 Eddy-current method for determination of depth of defect and residual thickness of not damaged layer of thin-wall constructions made of non-ferromagnetic materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
UAU201011948U UA58836U (en) 2010-10-08 2010-10-08 Eddy-current method for determination of depth of defect and residual thickness of not damaged layer of thin-wall constructions made of non-ferromagnetic materials

Publications (1)

Publication Number Publication Date
UA58836U true UA58836U (en) 2011-04-26

Family

ID=50832702

Family Applications (1)

Application Number Title Priority Date Filing Date
UAU201011948U UA58836U (en) 2010-10-08 2010-10-08 Eddy-current method for determination of depth of defect and residual thickness of not damaged layer of thin-wall constructions made of non-ferromagnetic materials

Country Status (1)

Country Link
UA (1) UA58836U (en)

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