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Application filed by Інститут фізики напівпровідників НАН України, Институт физики полупроводников НАН УкраиныfiledCriticalІнститут фізики напівпровідників НАН України
Priority to UA98084500ApriorityCriticalpatent/UA31389A/en
Publication of UA31389ApublicationCriticalpatent/UA31389A/en
The invention relates to the field of measuring instruments and can be used for measurement of temperature in thermal, atomic, wind- and hydro-power engineering, low temperature physics, oil and gas extraction industry, household equipment, foodstuff industry, scientific research, medicine and other areas of science and engineering. The appliance for temperature measurement has sensitive pn-transition, body and contacts.
UA98084500A1998-08-191998-08-19Appliance for temperature measurement
UA31389A
(en)
The Temperature Dependence of the Electronic Properties of the Electronic Properties of Intrinsic Silicon (In German) A. Ichimiya and R. Uyeda, Determination of Phase Angles and Absoute Values of the Structure Potential V 0002 of Cadmium S from Equal Thickness Fringes in Electron Micrographs
Thermal resistance of microelectronic packages. Part 1: Recommended method 1012 (thermal characteristics) for MIL-STD-883. Part 2: Summary of analyses and experimental data for thermal test packages and MIL-M-38510 packages