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Application filed by Харківський Державний Університет, Харьковский государственный университетfiledCriticalХарківський Державний Університет
Priority to UA4652444ApriorityCriticalpatent/UA11880A1/en
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The method includes passing flow of X-ray radiation through dielectric substance, measuring of level of electromagnetic oscillations excited at that the t medium, by level of those one makes conclusion on intensity of X-ray radiation. To simplify method and to increase effectiveness of measurements of X-ray radiation from resonance amplifier of charged particles dielectric substance is chosen solid, measurement is carried out at frequency equal or multiple of working frequency of the accelerator.
UA4652444A1988-12-261988-12-26Method for measurement of intensity of x-ray radiation
UA11880A1
(en)