UA117542C2 - SYSTEM FOR DETERMINATION OF ELECTROMAGNETIC FIELD AND MATERIAL STRUCTURE AND METHOD FOR DETERMINING ELECTROMAGNETIC FIELD AND MATERIAL MATERIAL - Google Patents

SYSTEM FOR DETERMINATION OF ELECTROMAGNETIC FIELD AND MATERIAL STRUCTURE AND METHOD FOR DETERMINING ELECTROMAGNETIC FIELD AND MATERIAL MATERIAL

Info

Publication number
UA117542C2
UA117542C2 UAA201706107A UAA201706107A UA117542C2 UA 117542 C2 UA117542 C2 UA 117542C2 UA A201706107 A UAA201706107 A UA A201706107A UA A201706107 A UAA201706107 A UA A201706107A UA 117542 C2 UA117542 C2 UA 117542C2
Authority
UA
Ukraine
Prior art keywords
electromagnetic field
electromagnetic
determining
fields
measure
Prior art date
Application number
UAA201706107A
Other languages
Ukrainian (uk)
Inventor
Олександр Григорович Калениченко
Юрій Олександрович Калениченко
Олена Олександрівна Рембач
Original Assignee
Олександр Григорович Калениченко
Юрій Олександрович Калениченко
Олена Олександрівна Рембач
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Олександр Григорович Калениченко, Юрій Олександрович Калениченко, Олена Олександрівна Рембач filed Critical Олександр Григорович Калениченко
Priority to UAA201706107A priority Critical patent/UA117542C2/en
Priority to PCT/UA2018/000024 priority patent/WO2018231186A1/en
Publication of UA117542C2 publication Critical patent/UA117542C2/en
Priority to US16/820,632 priority patent/US11656191B2/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables

Abstract

Група винаходів належить до електромагнітних методів дослідження структури електромагнітного поля і матеріалу і може знайти широке застосування в різних областях науки і техніки. Система для визначення структури електромагнітного поля і матеріалу об'єкта містить послідовно з'єднані блок джерел енергії, електромагнітний перетворювач; аналізатори частот гармоніки; засоби вимірювань; блок порівняння; блок вимірювання; маніпулятор. Спосіб визначення структури електромагнітного поля і матеріалу об'єкта, полягає у збудженні квантової системи матеріалу, що досліджується, виміру фізичних величин, які характеризують властивості джерела збудження і електромагнітного поля джерела випромінювання, і по встановлених зв'язках, залежностях і відношеннями між ними, виділяють із електромагнітної хвилі фотони і визначають їх хвильову структуру. Технічним результатом винаходу є підвищення точності і достовірності результатів вимірювань електронної структури кристалічної решітки, по якій визначають фізико-механічні параметри об'єктів, можливість вимірювання в змінних електромагнітних полях магнітних характеристик матеріалів досліджуваного об'єкта, визначених в постійних полях, розширення діапазону фізичних величин, що вимірюються.The group of inventions relates to electromagnetic methods for the study of the structure of the electromagnetic field and material and can find wide application in various fields of science and technology. The system for determining the structure of the electromagnetic field and the material of the object contains a series of connected sources of energy sources, electromagnetic converter; harmonic frequency analyzers; measuring instruments; block of comparison; unit of measurement; manipulator. The method of determining the structure of the electromagnetic field and the material of the object is to excite the quantum system of the material being investigated, to measure the physical quantities that characterize the properties of the excitation source and the electromagnetic field of the radiation source, and to allocate the established relationships, dependencies and relationships between them from the electromagnetic wave photons and determine their wave structure. The technical result of the invention is to improve the accuracy and reliability of the measurement results of the electronic structure of the crystal lattice, which determine the physical and mechanical parameters of the objects, the ability to measure in the alternating electromagnetic fields the magnetic characteristics of the materials of the object under investigation, defined in constant fields, expanding the range of physical quantities, that are being measured.

UAA201706107A 2017-06-16 2017-06-16 SYSTEM FOR DETERMINATION OF ELECTROMAGNETIC FIELD AND MATERIAL STRUCTURE AND METHOD FOR DETERMINING ELECTROMAGNETIC FIELD AND MATERIAL MATERIAL UA117542C2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
UAA201706107A UA117542C2 (en) 2017-06-16 2017-06-16 SYSTEM FOR DETERMINATION OF ELECTROMAGNETIC FIELD AND MATERIAL STRUCTURE AND METHOD FOR DETERMINING ELECTROMAGNETIC FIELD AND MATERIAL MATERIAL
PCT/UA2018/000024 WO2018231186A1 (en) 2017-06-16 2018-03-23 System and method for determining the structure of electromagnetic field and object material
US16/820,632 US11656191B2 (en) 2017-06-16 2020-03-16 System and method for non-ionizing non-destructive detection of structural defects in materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
UAA201706107A UA117542C2 (en) 2017-06-16 2017-06-16 SYSTEM FOR DETERMINATION OF ELECTROMAGNETIC FIELD AND MATERIAL STRUCTURE AND METHOD FOR DETERMINING ELECTROMAGNETIC FIELD AND MATERIAL MATERIAL

Publications (1)

Publication Number Publication Date
UA117542C2 true UA117542C2 (en) 2018-08-10

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
UAA201706107A UA117542C2 (en) 2017-06-16 2017-06-16 SYSTEM FOR DETERMINATION OF ELECTROMAGNETIC FIELD AND MATERIAL STRUCTURE AND METHOD FOR DETERMINING ELECTROMAGNETIC FIELD AND MATERIAL MATERIAL

Country Status (2)

Country Link
UA (1) UA117542C2 (en)
WO (1) WO2018231186A1 (en)

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CN111506991A (en) * 2020-04-08 2020-08-07 武汉大学 Magnetic force modeling method and system for magnetic suspension turntable and storage medium

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CN110231394B (en) * 2019-06-19 2023-06-13 中国石油大学(华东) Irregular crack imaging method of non-ferromagnetic material based on alternating current electromagnetic field

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US4058762A (en) 1976-06-04 1977-11-15 The Babcock & Wilcox Company Method and apparatus for magnetic inspection through adjustable pulsed alternating and direct current magnetic fields
SU894545A1 (en) 1980-03-05 1981-12-30 Всесоюзный научно-исследовательский институт разработки и эксплуатации нефтепромысловых труб Electromagnetic structuroscope
DE3813739A1 (en) * 1988-04-23 1989-11-02 Fraunhofer Ges Forschung METHOD FOR THE DESTRUCTION-FREE MEASUREMENT OF MAGNETIC PROPERTIES OF A TEST BODY AND DEVICE FOR DESTRUCTION-FREE MEASUREMENT OF MAGNETIC PROPERTIES OF A TEST BODY
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111506991A (en) * 2020-04-08 2020-08-07 武汉大学 Magnetic force modeling method and system for magnetic suspension turntable and storage medium
CN111506991B (en) * 2020-04-08 2022-04-29 武汉大学 Magnetic force modeling method and system for magnetic suspension turntable and storage medium

Also Published As

Publication number Publication date
WO2018231186A1 (en) 2018-12-20

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