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Application filed by Донбаський Гірничо-Металургійний Інститут, Донбасский горно-металлургический институт, Алчевський Металургійний Комбінат, Алчевский металлургический комбинатfiledCriticalДонбаський Гірничо-Металургійний Інститут
Priority to UA4453378ApriorityCriticalpatent/UA11385A1/en
Publication of UA11385A1publicationCriticalpatent/UA11385A1/en
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications
(AREA)
Abstract
The invention relates to defectoscopes. Defectoscope includes light source optically connected to photoelectric transformer output of which is connected to registration device. Defectoscope additionally includes device for scanning light-sensitive surface of photoelectric transformer.