TWM653017U - PCB testing fixture - Google Patents

PCB testing fixture Download PDF

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Publication number
TWM653017U
TWM653017U TW112210483U TW112210483U TWM653017U TW M653017 U TWM653017 U TW M653017U TW 112210483 U TW112210483 U TW 112210483U TW 112210483 U TW112210483 U TW 112210483U TW M653017 U TWM653017 U TW M653017U
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circuit board
printed circuit
test
tested
test fixture
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TW112210483U
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Chinese (zh)
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鄭佩芬
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易華電子股份有限公司
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Publication of TWM653017U publication Critical patent/TWM653017U/en

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Abstract

一種印刷電路板測試治具,用以解決習知印刷電路板測試治具對位困難的問題。係包含:一基板,位於一電性測試機與一待測電路板之間,該基板之頂部結合固定於該電性測試機;一測試部,位於該基板底部且相對該待測電路板之數個測試點;及一定位開孔,由該基板之頂面貫穿至底面,且該定位開孔的位置係對應該待測電路板之一安裝部,該安裝部的各邊向外平移一擴張寬度為該定位開孔的邊界,該待測電路板上具有至少一對位記號位於該安裝部之外,且位於該定位開孔的範圍內。藉此可以達成準確對位及測試治具共用等功效。A printed circuit board test fixture is used to solve the problem of difficult alignment of conventional printed circuit board test fixtures. The system includes: a substrate located between an electrical testing machine and a circuit board to be tested, the top of the substrate being coupled and fixed to the electrical testing machine; a testing portion located at the bottom of the substrate and opposite to the circuit board to be tested Several test points; and a positioning opening that penetrates from the top surface to the bottom surface of the substrate, and the position of the positioning opening corresponds to a mounting part of the circuit board to be tested, and each side of the mounting part is translated outward by one The expansion width is the boundary of the positioning opening, and the circuit board to be tested has at least one positioning mark located outside the mounting part and within the range of the positioning opening. This can achieve functions such as accurate alignment and sharing of test fixtures.

Description

印刷電路板測試治具Printed Circuit Board Test Fixture

本創作係關於一種用於印刷電路板製程的輔助裝置,尤其是一種準確對位且共用於各種電路圖案的印刷電路板測試治具。This invention relates to an auxiliary device for the printed circuit board manufacturing process, especially a printed circuit board test fixture that is accurately aligned and used for various circuit patterns.

請參照第1圖,其係一種習知的印刷電路板測試治具9,在電性測試過程中,該印刷電路板測試治具9係位於電性測試機與一待測電路板B之間,電性測試機的測試探針P係穿透該印刷電路板測試治具9,以接觸並測量底下的該待測電路板B,該印刷電路板測試治具9具有至少一攝影窗口91,該至少一攝影窗口91係對位該待測電路板B左或右側的傳輸部,使電性測試機的影像單元能夠透過該至少一攝影窗口91擷取到位於該傳輸部之傳輸孔及對位記號M的影像,係可以用於校準測試探針P的位置,而能夠正確測量到電路板線路之電性。Please refer to Figure 1, which is a conventional printed circuit board testing fixture 9. During the electrical testing process, the printed circuit board testing fixture 9 is located between the electrical testing machine and a circuit board B to be tested. , The test probe P of the electrical testing machine penetrates the printed circuit board test fixture 9 to contact and measure the underlying circuit board B to be tested. The printed circuit board test fixture 9 has at least one photography window 91, The at least one photography window 91 is aligned with the transmission part on the left or right side of the circuit board B to be tested, so that the image unit of the electrical testing machine can capture the transmission holes and the corresponding parts of the transmission part through the at least one photography window 91 The image of the bit mark M can be used to calibrate the position of the test probe P, so that the electrical properties of the circuit board circuit can be accurately measured.

惟,用於不同產品的待測電路板B,會有範圍大小、形狀不同的線路圖案,導致對位記號M必須隨著線路圖案的分布調整位置,因此,每次更換測試不同產品的待測電路板B時,電性測試機需要先重新定位該對位記號M才能夠進行測試工作,若該對位記號M的位置超出該印刷電路板測試治具9之攝影窗口91的範圍,則電性測試機的影像單元係無法順利取得該對位記號M的影像,而必須更換該印刷電路板測試治具9,導致測試工作延宕,而且對應不同的待測電路板B準備各種測試治具會造成資源浪費及增加生產成本。However, the circuit boards B to be tested used for different products may have circuit patterns of different sizes and shapes, so the alignment mark M must be adjusted according to the distribution of the circuit patterns. Therefore, each time the circuit board B to be tested for a different product is replaced, the electrical tester needs to reposition the alignment mark M before the test can be performed. If the position of the alignment mark M exceeds the range of the photographic window 91 of the printed circuit board test fixture 9, the imaging unit of the electrical tester cannot successfully obtain the image of the alignment mark M, and the printed circuit board test fixture 9 must be replaced, resulting in a delay in the test work. In addition, preparing various test fixtures corresponding to different circuit boards B to be tested will result in a waste of resources and increase in production costs.

有鑑於此,習知的印刷電路板測試治具確實仍有加以改善之必要。In view of this, there is still a need to improve the conventional printed circuit board test fixture.

為解決上述問題,本創作的目的是提供一種印刷電路板測試治具,係可以用於各種線路圖案的電路板產品測試。To solve the above problems, the purpose of this invention is to provide a printed circuit board test fixture that can be used to test circuit board products with various circuit patterns.

本創作的次一目的是提供一種印刷電路板測試治具,係可以提升測試效率及準確度。The secondary purpose of this invention is to provide a printed circuit board test fixture that can improve test efficiency and accuracy.

本創作的又一目的是提供一種印刷電路板測試治具,係可以節省製作各種治具的成本。Another purpose of the present invention is to provide a printed circuit board test fixture that can save the cost of making various fixtures.

本創作全文所述方向性或其近似用語,例如「左」、「右」、「上(頂)」、「下(底)」、「內」、「外」、「側面」等,主要係參考附加圖式的方向,各方向性或其近似用語僅用以輔助說明及理解本創作的各實施例,非用以限制本創作。The directions or similar terms described in the entire text of this creation, such as "left", "right", "up (top)", "down (bottom)", "inside", "outside", "side", etc., are mainly used to refer to the directions of the attached drawings. Each direction or its similar terms are only used to assist in the description and understanding of the various embodiments of this creation, and are not used to limit this creation.

本創作全文所記載的元件及構件使用「一」或「一個」之量詞,僅是為了方便使用且提供本創作範圍的通常意義;於本創作中應被解讀為包括一個或至少一個,且單一的概念也包括複數的情況,除非其明顯意指其他意思。The quantifiers "a" or "an" used in the elements and components described throughout this invention are only for convenience of use and to provide a general meaning of the scope of this invention; they should be interpreted in this invention as including one or at least one, and the concept of a single number also includes the plural case, unless it is obvious that it means otherwise.

本創作的印刷電路板測試治具,包含:一基板,位於一電性測試機與一待測電路板之間,該基板之頂部結合固定於該電性測試機;一測試部,位於該基板底部且相對該待測電路板之數個測試點;及一定位開孔,由該基板之頂面貫穿至底面,且該定位開孔的位置係對應該待測電路板之一安裝部,該安裝部的各邊向外平移一擴張寬度為該定位開孔的邊界,該待測電路板上具有至少一對位記號位於該安裝部之外,且位於該定位開孔的範圍內。The printed circuit board test fixture of the invention comprises: a substrate, located between an electrical tester and a circuit board to be tested, the top of the substrate being fixedly coupled to the electrical tester; a test portion, located at the bottom of the substrate and opposite to a plurality of test points of the circuit board to be tested; and a positioning opening, penetrating from the top surface of the substrate to the bottom surface, and the position of the positioning opening corresponds to a mounting portion of the circuit board to be tested, each side of the mounting portion being translated outwardly by an expansion width equal to the boundary of the positioning opening, and the circuit board to be tested has at least one alignment mark located outside the mounting portion and within the range of the positioning opening.

據此,本創作的印刷電路板測試治具,藉由搜尋範圍擴大的該定位開孔,擷取位於該待測電路板之安裝部周遭的對位記號,係可以快速且準確定位該待測電路板以進行電性測試,另外,對於不同線路圖案的電路板產品能夠共用測試治具,以搜尋對位記號且順利定位,係具有降低準備治具成本及節省更換治具時間等功效。Accordingly, the printed circuit board test fixture of the present invention can quickly and accurately locate the circuit board to be tested for electrical testing by capturing the alignment marks around the mounting portion of the circuit board to be tested through the positioning opening with an expanded search range. In addition, circuit board products with different circuit patterns can share the test fixture to search for alignment marks and locate smoothly, which has the effect of reducing the cost of preparing the fixture and saving the time of replacing the fixture.

其中,該電性測試機的數個測試探針係穿透該基板並露出於該測試部,該數個測試探針分別接觸並測試該數個測試點。如此,該數個測試探針係可以正確對位該數個測試點,分別測試線路的短路、開路狀態及電子元件的電性參數,係具有提升測試效率及準確度的功效。The electrical tester has several test probes that penetrate the substrate and are exposed in the test section. The test probes contact and test the test points respectively. In this way, the test probes can be correctly aligned with the test points to test the short circuit and open circuit states of the circuits and the electrical parameters of the electronic components respectively, which has the effect of improving the test efficiency and accuracy.

其中,該定位開孔之該擴張寬度為2~4毫米。如此,透過該定位開孔係可以觀察該安裝部的全部區域及其周圍的線路圖案,對於各種電路板產品的線路圖案,仍能夠搜尋到不同位置的對位記號,係具有共用測試治具的功效。Wherein, the expansion width of the positioning opening is 2-4 mm. In this way, through the positioning opening, the entire area of the mounting part and the circuit patterns around it can be observed. For the circuit patterns of various circuit board products, alignment marks at different positions can still be searched. This is because there is a common test fixture. effect.

其中,該電性測試機之一影像單元透過該定位開孔向下拍攝位於該基板下方之該待測電路板,該影像單元的視野範圍包括該安裝部、該安裝部周遭的線路圖案及該至少一對位記號。如此,該影像單元拍攝的影像係可以用於判斷該待測電路板是否移動至正確的測試位置,係具有提升測試對位效率的功效。Among them, an imaging unit of the electrical tester shoots the circuit board to be tested located below the substrate through the positioning opening downward, and the field of view of the imaging unit includes the mounting portion, the circuit pattern around the mounting portion, and the at least one alignment mark. In this way, the image captured by the imaging unit can be used to determine whether the circuit board to be tested is moved to the correct test position, which has the effect of improving the test alignment efficiency.

其中,該至少一對位記號及該線路圖案的材質為導電金屬。如此,製造導電線路可以同時產生對位記號,且金屬材質相對容易被偵測辨識,係具有簡化製程及輔助測試對位的功效。Wherein, the material of the at least alignment mark and the circuit pattern is conductive metal. In this way, alignment marks can be produced at the same time when manufacturing conductive circuits, and metal materials are relatively easy to detect and identify, which has the effect of simplifying the manufacturing process and assisting in test alignment.

其中,該至少一對位記號的輪廓近似一三角形,該至少一對位記號之一寬度是該三角形的高或邊長,該寬度是0.25~0.3毫米。如此,該三角形係可以與周遭長條狀的導電線路及方形或圓形的焊接點做出區隔,係具有避免識別錯誤的功效。The contour of the at least one alignment mark is approximately a triangle, and a width of the at least one alignment mark is the height or side length of the triangle, and the width is 0.25-0.3 mm. In this way, the triangle can be distinguished from the surrounding long strip-shaped conductive lines and square or round welding points, which has the effect of avoiding recognition errors.

其中,該至少一對位記號具有一弧邊。如此,該弧邊可以配合周遭的線路圖案或安裝位置,係具有避免識別錯誤的功效。The at least one alignment mark has an arc edge, so that the arc edge can match the surrounding circuit pattern or installation position, thereby having the effect of avoiding recognition errors.

其中,該至少一對位記號另具有一外框,該外框內部為記號本體及一填補圖案。如此,該外框用於保護記號免於蝕刻或清洗的破壞,及該填補圖案用於填補線路圖案的空缺,係具有保護記號之形狀完整的功效。The at least one alignment mark has an outer frame, and the inner part of the outer frame is the mark body and a filling pattern. Thus, the outer frame is used to protect the mark from being damaged by etching or cleaning, and the filling pattern is used to fill the vacancy of the circuit pattern, which has the effect of protecting the shape of the mark.

其中,該外框的輪廓近似一三角形。如此,該外框係可以配合周遭的線路圖案並使形狀做出區隔,係具有提升識別度及保護記號的功效。The outline of the outer frame is approximately a triangle. In this way, the outer frame can match the surrounding circuit patterns and differentiate the shape, which has the effect of improving recognition and protecting marks.

其中,該外框的輪廓近似一梯形。如此,該外框係可以配合周遭的線路圖案並使形狀做出區隔,係具有提升識別度及保護記號的功效。Wherein, the outline of the outer frame is approximately a trapezoid. In this way, the outer frame can match the surrounding circuit patterns and differentiate the shape, which has the effect of improving recognition and protecting marks.

其中,該外框的輪廓近似一四邊形。如此,該外框係可以配合周遭的線路圖案並使形狀做出區隔,係具有提升識別度及保護記號的功效。Wherein, the outline of the outer frame is approximately a quadrilateral. In this way, the outer frame can match the surrounding circuit patterns and differentiate the shape, which has the effect of improving recognition and protecting marks.

其中,該外框具有至少一弧邊,對應該安裝部的邊界。如此,該外框係可以配合該安裝部的輪廓,係具有保護記號及周遭線路的功效。Wherein, the outer frame has at least one arc edge corresponding to the boundary of the installation part. In this way, the outer frame can match the contour of the installation part and has the function of protecting the mark and surrounding circuits.

其中,該外框具有至少一內直角,對應該安裝部的直角邊界。如此,該外框係可以配合該安裝部的輪廓,係具有保護記號及周遭線路的功效。The outer frame has at least one inner right angle corresponding to the right angle boundary of the mounting portion. Thus, the outer frame can match the outline of the mounting portion and has the function of protecting the mark and surrounding circuits.

為讓本創作之上述及其他目的、特徵及優點能更明顯易懂,下文特舉本創作之較佳實施例,並配合所附圖式作詳細說明;此外,在不同圖式中標示相同符號者視為相同,會省略其說明。In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the following is a preferred embodiment of the present invention and a detailed description with accompanying drawings; in addition, the same symbols are marked in different drawings. are considered to be the same and their description will be omitted.

請參照第2圖所示,其係本創作印刷電路板測試治具的較佳實施例,係包含一基板1、一測試部2及一定位開孔3,該基板1係位於一電性測試機與一待測電路板B之間,該測試部2位於該基板1底部且相對該待測電路板B,該定位開孔3係由該基板1之頂面貫穿至底面。Please refer to Figure 2, which is a preferred embodiment of the printed circuit board test fixture of the present invention. It includes a substrate 1, a test portion 2 and a positioning opening 3. The substrate 1 is located in an electrical test Between the machine and a circuit board B to be tested, the test portion 2 is located at the bottom of the substrate 1 and relative to the circuit board B to be tested. The positioning opening 3 penetrates from the top surface of the substrate 1 to the bottom surface.

該基板1之頂部結合固定於該電性測試機,且該基板1之底部係依據該待測電路板B的尺寸、圖案及測試點位置等條件做配置,例如:該基板1的長寬較佳略大於該待測電路板B的線路圖案範圍,該基板1的中央部位較佳對準該待測電路板B之一安裝部S,其中,該安裝部S係用於安裝電子元件,該安裝部S周遭係圍繞分布該待測電路板B上的數條導電線路C,使電子元件的引腳能夠在該安裝部S電性連接該數條導電線路C,對該數條導電線路C通電係可以使電子元件運作,還可以透過該數條導電線路C測試電子元件的電性功能。在測試過程中,數個該待測電路板B係依序對準該基板1,以接受該電性測試機的測量。The top of the substrate 1 is fixedly coupled to the electrical tester, and the bottom of the substrate 1 is configured according to the size, pattern and test point position of the circuit board B to be tested. For example, the length and width of the substrate 1 are preferably slightly larger than the circuit pattern range of the circuit board B to be tested, and the central part of the substrate 1 is preferably aligned with a mounting portion S of the circuit board B to be tested, wherein the mounting portion S is used to mount electronic components, and the mounting portion S is surrounded by a plurality of conductive lines C on the circuit board B to be tested, so that the pins of the electronic components can be electrically connected to the plurality of conductive lines C at the mounting portion S. The electronic components can be operated by energizing the plurality of conductive lines C, and the electrical function of the electronic components can also be tested through the plurality of conductive lines C. During the test process, a plurality of the circuit boards B to be tested are aligned with the substrate 1 in sequence to be measured by the electrical tester.

該測試部2的位置係對應該待測電路板B上的數個測試點T,而該數個測試點T可以是該數條導電線路C的末端,如第2圖所示,該數條導電線路C係可以由該安裝部S向上或向下延伸至該待測電路板B的邊緣,使該數個測試點T分別排列於該待測電路板B的上緣及下緣,則該測試部2對應該數個測試點T位於該基板1底面的上、下兩側,如此,對分布於該待測電路板B外側的該數個測試點T進行測試,係可以減少對該待測電路板B中央的線路圖案造成損傷。The position of the test section 2 corresponds to a plurality of test points T on the circuit board B to be tested, and the plurality of test points T may be the ends of the plurality of conductive lines C. As shown in FIG. 2 , the plurality of conductive lines C may extend upward or downward from the mounting portion S to the edge of the circuit board B to be tested, so that the plurality of test points T are arranged at the upper edge and the lower edge of the circuit board B to be tested, respectively. Then, the test section 2 is located at the upper and lower sides of the bottom surface of the substrate 1 corresponding to the plurality of test points T. In this way, by testing the plurality of test points T distributed on the outer side of the circuit board B to be tested, damage to the circuit pattern in the center of the circuit board B to be tested may be reduced.

該電性測試機的數個測試探針係穿透該基板1並露出於該測試部2,當該待測電路板B移動至定位並對準該基板1時,該數個測試探針係能夠透過該測試部2正確對位及接觸該數個測試點T,以分別測試該數條導電線路C的短路、開路狀態或已安裝電子元件的電性參數。The several test probes of the electrical tester penetrate the substrate 1 and are exposed at the test part 2. When the circuit board B to be tested is moved to be positioned and aligned with the substrate 1, the several test probes can be correctly aligned and contact the several test points T through the test part 2 to respectively test the short circuit, open circuit status of the several conductive lines C or the electrical parameters of the installed electronic components.

該定位開孔3的位置係對應該待測電路板B的該安裝部S,如第2圖所示,該定位開孔3的面積大於該安裝部S,透過該定位開孔3係可以由上往下看到位於該基板1底下的該待測電路板B,並觀察該安裝部S的全部區域及其周圍的線路圖案,該定位開孔3的邊界係可以由該安裝部S的四邊向外分別往上、下、左、右擴張,詳言之,該安裝部S的各邊係向外平移一擴張寬度E成為該定位開孔3的邊界,該擴張寬度E可以是2~4毫米,較佳為3毫米。The position of the positioning opening 3 corresponds to the mounting part S of the circuit board B to be tested. As shown in Figure 2, the area of the positioning opening 3 is larger than the mounting part S. Through the positioning opening 3, it can be Look down at the circuit board to be tested B located under the substrate 1, and observe the entire area of the mounting portion S and the circuit pattern around it. The boundary of the positioning opening 3 can be determined by the four sides of the mounting portion S. Expand outwards upward, downward, left, and right respectively. Specifically, each side of the mounting portion S is translated outward by an expansion width E to become the boundary of the positioning opening 3. The expansion width E can be 2 to 4 mm, preferably 3 mm.

請參照第2及3圖所示,該待測電路板B上具有至少一對位記號M,該電性測試機藉由辨識該至少一對位記號M的位置,係可以確認該待測電路板B是否移動至定位,使該測試部2對準該數個測試點T而能夠準確進行測試,詳言之,該至少一對位記號M位於該安裝部S之外,且位於該定位開孔3的範圍內,使該電性測試機之一影像單元透過該定位開孔3由上往下拍攝該基板1下方之該待測電路板B時,能夠擷取該安裝部S、該安裝部S周遭的線路圖案及該至少一對位記號M的影像,該影像可用於判斷該待測電路板B是否移動至正確的測試位置。該至少一對位記號M的材質與周遭導電線路較佳為相同的導電金屬。Please refer to Figures 2 and 3. The circuit board B to be tested has at least one alignment mark M. The electrical tester can confirm whether the circuit board B to be tested has been moved to a position by identifying the position of the at least one alignment mark M, so that the test section 2 can be aligned with the plurality of test points T to accurately perform the test. Specifically, the at least one alignment mark M is located outside the mounting section S and within the range of the positioning opening 3. When an imaging unit of the electrical tester photographs the circuit board B to be tested below the substrate 1 from top to bottom through the positioning opening 3, it can capture the image of the mounting section S, the circuit pattern around the mounting section S, and the at least one alignment mark M. The image can be used to determine whether the circuit board B to be tested has been moved to a correct test position. The material of the at least one alignment mark M is preferably the same conductive metal as the surrounding conductive lines.

請參照第3~6圖所示,該至少一對位記號M的輪廓較佳近似一三角形,係可以與周遭長條狀的導電線路及方形或圓形的焊接點做出區隔,具有避免識別錯誤的作用。該至少一對位記號M之一寬度W可以是該三角形的高或邊長,該寬度W可以是0.25~0.3毫米,又,該至少一對位記號M可以包含至少一弧邊以配合周遭的線路圖案或安裝位置,該弧邊的曲率半徑可以是2毫米。該至少一對位記號M還可以包括一外框,用於保護記號的形狀完整,減少受到蝕刻或清洗的破壞,如第3圖所示,該外框的輪廓係與內部記號本體相似的三角框,係可以凸顯記號而容易被辨識,該外框還可以是其他形狀;如第4圖所示,該外框的輪廓近似一梯形,該梯形的斜邊係形成弧線以配合該安裝部S的邊界;如第5圖所示,該外框的輪廓近似一四邊形,並包含至少二斜邊,該外框所包圍的區域除了辨識用的三角記號,還可以形成一填補圖案用於填補線路圖案的空缺,以保護鄰近的記號;如第6圖所示,當該安裝部S的邊界形狀為直角時,該外框的輪廓還可以形成內直角取代原本的弧線邊,以對應該安裝部S的邊界。惟,本創作之該至少一對位記號M的形狀及外框型式不以上述實施例為限。Please refer to Figures 3 to 6. The outline of the at least alignment mark M is preferably similar to a triangle, which can be separated from the surrounding strip-shaped conductive lines and square or circular welding points, and has the ability to avoid Identify the role of errors. A width W of the at least one alignment mark M may be the height or side length of the triangle, and the width W may be 0.25 to 0.3 mm. In addition, the at least one alignment mark M may include at least one arc edge to match the surrounding Depending on the circuit pattern or installation location, the radius of curvature of the arc edge may be 2 mm. The at least alignment mark M may also include an outer frame for protecting the integrity of the mark's shape and reducing damage from etching or cleaning. As shown in Figure 3, the outline of the outer frame is a triangle similar to the internal mark body. The frame can highlight the mark and be easily recognized. The outer frame can also be of other shapes; as shown in Figure 4, the outline of the outer frame is approximately a trapezoid, and the hypotenuse of the trapezoid forms an arc to match the mounting portion S The boundary; as shown in Figure 5, the outline of the outer frame is approximately a quadrilateral and contains at least two hypotenuses. In addition to the triangle marks for identification, the area enclosed by the outer frame can also form a filling pattern for filling lines. There are gaps in the pattern to protect adjacent marks; as shown in Figure 6, when the boundary shape of the mounting part S is a right angle, the outline of the outer frame can also form an inner right angle to replace the original arc edge to correspond to the mounting part S. Boundary of S. However, the shape and outer frame type of the at least alignment mark M of this invention are not limited to the above embodiment.

綜上所述,本創作的印刷電路板測試治具,藉由搜尋範圍擴大的該定位開孔,擷取位於該待測電路板之安裝部周遭的對位記號,係可以快速且準確定位該待測電路板以進行電性測試,另外,對於不同線路圖案的電路板產品能夠共用測試治具,以搜尋對位記號且順利定位,係具有降低準備治具成本及節省更換治具時間等功效。In summary, the printed circuit board test fixture of the present invention can quickly and accurately locate the circuit board to be tested for electrical testing by capturing the alignment marks around the mounting portion of the circuit board to be tested through the positioning opening with an expanded search range. In addition, circuit board products with different circuit patterns can share the test fixture to search for alignment marks and locate smoothly, which has the effect of reducing the cost of preparing the fixture and saving the time of replacing the fixture.

雖然本創作已利用上述較佳實施例揭示,然其並非用以限定本創作,任何熟習此技藝者在不脫離本創作之精神和範圍之內,相對上述實施例進行各種更動與修改仍屬本創作所保護之技術範疇,因此本創作之保護範圍當包含後附之申請專利範圍所記載的文義及均等範圍內之所有變更。Although the present invention has been disclosed using the above-mentioned preferred embodiments, they are not intended to limit the present invention. Any person skilled in the art may make various changes and modifications to the above-mentioned embodiments without departing from the spirit and scope of the present invention, and these changes and modifications are still within the technical scope protected by the present invention. Therefore, the protection scope of the present invention shall include all changes within the meaning and equivalent scope recorded in the attached patent application scope.

﹝本創作﹞ 1:基板 2:測試部 3:定位開孔 B:待測電路板 S:安裝部 C:導電線路 T:測試點 E:擴張寬度 M:對位記號 W:寬度 ﹝習用﹞ 9:印刷電路板測試治具 91:攝影窗口 B:待測電路板 P:測試探針 M:對位記號﹝Original creation﹞ 1: Substrate 2: Test section 3: Positioning opening B: Circuit board to be tested S: Mounting section C: Conductive line T: Test point E: Expansion width M: Alignment mark W: Width ﹝Practice﹞ 9: Printed circuit board test fixture 91: Photo window B: Circuit board to be tested P: Test probe M: Alignment mark

[第1圖] 一種習知印刷電路板測試治具的使用情形圖。 [第2圖] 本創作較佳實施例的上視圖。 [第3圖] 如第2圖所示的A區域對位記號放大圖。 [第4圖] 如第3圖所示對位記號的另一實施例圖。 [第5圖] 如第3圖所示對位記號的另一實施例圖。 [第6圖] 如第3圖所示對位記號的另一實施例圖。 [Figure 1] A diagram showing a use of a known printed circuit board test fixture. [Figure 2] A top view of a preferred embodiment of the invention. [Figure 3] An enlarged view of the alignment mark of region A shown in Figure 2. [Figure 4] Another embodiment of the alignment mark shown in Figure 3. [Figure 5] Another embodiment of the alignment mark shown in Figure 3. [Figure 6] Another embodiment of the alignment mark shown in Figure 3.

1:基板 1:Substrate

2:測試部 2: Testing Department

3:定位開孔 3: Positioning holes

B:待測電路板 B: Circuit board to be tested

S:安裝部 S: Installation Department

C:導電線路 C: Conductive lines

T:測試點 T: test point

E:擴張寬度 E: Expand width

M:對位記號 M: Counterpoint mark

Claims (13)

一種印刷電路板測試治具,包含: 一基板,位於一電性測試機與一待測電路板之間,該基板之頂部結合固定於該電性測試機; 一測試部,位於該基板底部且相對該待測電路板之數個測試點;及 一定位開孔,由該基板之頂面貫穿至底面,且該定位開孔的位置係對應該待測電路板之一安裝部,該安裝部的各邊向外平移一擴張寬度為該定位開孔的邊界,該待測電路板上具有至少一對位記號位於該安裝部之外,且位於該定位開孔的範圍內。 A printed circuit board test fixture comprises: a substrate, located between an electrical tester and a circuit board to be tested, the top of the substrate being fixedly coupled to the electrical tester; a test portion, located at the bottom of the substrate and opposite to a plurality of test points of the circuit board to be tested; and a positioning opening, penetrating from the top surface of the substrate to the bottom surface, and the position of the positioning opening corresponds to a mounting portion of the circuit board to be tested, each side of the mounting portion is translated outwardly by an expansion width as the boundary of the positioning opening, and the circuit board to be tested has at least one alignment mark located outside the mounting portion and within the range of the positioning opening. 如請求項1之印刷電路板測試治具,其中,該電性測試機的數個測試探針係穿透該基板並露出於該測試部,該數個測試探針分別接觸並測試該數個測試點。As in claim 1, a printed circuit board test fixture, wherein a plurality of test probes of the electrical test machine penetrate the substrate and are exposed at the test portion, and the plurality of test probes contact and test the plurality of test points respectively. 如請求項1之印刷電路板測試治具,其中,該定位開孔之該擴張寬度為2~4毫米。For example, the printed circuit board test fixture of claim 1, wherein the expansion width of the positioning opening is 2 to 4 mm. 如請求項1之印刷電路板測試治具,其中,該電性測試機之一影像單元透過該定位開孔向下拍攝位於該基板下方之該待測電路板,該影像單元的視野範圍包括該安裝部、該安裝部周遭的線路圖案及該至少一對位記號。A printed circuit board test fixture as claimed in claim 1, wherein an imaging unit of the electrical test machine photographs the circuit board to be tested located below the substrate downward through the positioning opening, and the field of view of the imaging unit includes the mounting portion, the circuit pattern around the mounting portion, and the at least one alignment mark. 如請求項4之印刷電路板測試治具,其中,該至少一對位記號及該線路圖案的材質為導電金屬。A printed circuit board test fixture as claimed in claim 4, wherein the material of the at least one alignment mark and the circuit pattern is a conductive metal. 如請求項4之印刷電路板測試治具,其中,該至少一對位記號的輪廓近似一三角形,該至少一對位記號之一寬度是該三角形的高或邊長,該寬度是0.25~0.3毫米。A printed circuit board test fixture as claimed in claim 4, wherein the outline of the at least one alignment mark is approximately a triangle, a width of the at least one alignment mark is the height or side length of the triangle, and the width is 0.25 to 0.3 mm. 如請求項6之印刷電路板測試治具,其中,該至少一對位記號具有一弧邊。The printed circuit board test fixture of claim 6, wherein the at least one alignment mark has an arc edge. 如請求項4之印刷電路板測試治具,其中,該至少一對位記號另具有一外框,該外框內部為記號本體及一填補圖案。The printed circuit board test fixture of claim 4, wherein the at least one alignment mark further has an outer frame, and inside the outer frame are the mark body and a filling pattern. 如請求項8之印刷電路板測試治具,其中,該外框的輪廓近似一三角形。The printed circuit board test fixture of claim 8, wherein the outline of the outer frame is approximately a triangle. 如請求項8之印刷電路板測試治具,其中,該外框的輪廓近似一梯形。The printed circuit board test fixture of claim 8, wherein the outline of the outer frame is approximately a trapezoid. 如請求項8之印刷電路板測試治具,其中,該外框的輪廓近似一四邊形。The printed circuit board test fixture of claim 8, wherein the outline of the outer frame is approximately a quadrilateral. 如請求項9~11中任一項之印刷電路板測試治具,其中,該外框具有至少一弧邊,對應該安裝部的邊界。The printed circuit board test fixture of any one of claims 9 to 11, wherein the outer frame has at least one arc edge corresponding to the boundary of the mounting part. 如請求項9~11中任一項之印刷電路板測試治具,其中,該外框具有至少一內直角,對應該安裝部的直角邊界。The printed circuit board test fixture of any one of claims 9 to 11, wherein the outer frame has at least one inner right angle corresponding to the right angle boundary of the mounting part.
TW112210483U 2023-09-27 2023-09-27 PCB testing fixture TWM653017U (en)

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