TWM649379U - Probe bending device - Google Patents

Abstract

A probe bending device including a probe position adjustment mechanism and a bending mechanism. The probe position adjustment mechanism has a clamp for a probe to slide into. The bending mechanism has a dispensing disc, wherein the dispensing disc has an inclined surface. Before the bending mechanism rotates, the inclined surface for the probe to roll down to a bottom of the dispensing disc to align with the clamp. The center of the rotation trajectory of the bending mechanism is in a different position from the clamp, so the rotation trajectory of the bending mechanism forms an eccentric circle with the rotation trajectory of the probe.

Description

Probe bending device

The invention relates to a probe bending device, particularly a probe bending device using the concept of an eccentric circle.

FIG. 1 shows a traditional probe bending device 10 . The probe bending device 10 includes a needle disc 12 and a probe fixing mechanism 14 . The dial 12 has a groove 122 and a push rod 124 . The groove 122 is used to place the probe 16 . The push rod 124 can adjust the width of the groove 122 to clamp the probe 16 to prevent the probe 16 from falling off. The probe fixing mechanism 14 includes a clamp 142 and a push rod 144 . The clamp 142 has a clamping opening 1422 for clamping the probe 16 to prevent the probe 16 from falling off when bent. The push rod 144 can adjust the jaw 1422 of the clamp 142 to loosen or clamp the probe 16 . The probe 16 can be bent by rotating the dial 12, as shown in Figures 1 and 2. In the probe bending device 10, the center 182 of the rotation track 18 of the needle disk 12 overlaps with the position of the clamp 1422. Therefore, in order to prevent the probe 16 from falling off during the bending process, the needle disk 12 and the probe fixing mechanism 14 are The probe 16 must be clamped, so the structures of the dial 12 and the probe fixing mechanism 14 are relatively complex. Furthermore, when the user uses the probe bending device 10 to perform the probe bending operation, the user must align the probe 16 and place it into the groove 122, so the efficiency is poor.

The purpose of this creation is to propose a probe bending device using the concept of eccentric circles.

A probe bending device includes a probe position adjustment mechanism, a bending mechanism and a bending angle adjustment mechanism. The probe position adjustment mechanism has a clamping mouth and a control member, wherein the clamping mouth allows a probe to slide in, and the control member controls the opening angle of the clamping mouth to determine the length of the probe sliding in. The bending mechanism has a needle placing disk and a rotating shaft, wherein the needle placing disk has an inclined surface, and the rotating shaft can rotate the bending mechanism to bend the probe. Before the bending mechanism rotates, the inclined surface allows the probe to roll down to the bottom of the needle plate to align with the clamp. The bending angle adjustment mechanism is disposed on the rotation path of the bending mechanism and is used to control the rotation angle of the bending mechanism to control the bending angle of the probe. The center of the circle of the rotation track of the bending mechanism and the clamping mouth are at different positions.

The probe bending device of this invention uses the inclined surface to allow the probe to move to an appropriate position by itself, thereby improving the efficiency of the probe bending operation. In addition, the rotation trajectory of the bending mechanism is different from the center of the circle of the rotation trajectory of the probe, so that the probe bending device of the present invention does not require a complicated mechanism to fix or clamp the probe to prevent the probe from falling off.

Figure 3 shows a top view of the probe bending device 20 of the present invention. The probe bending device 20 includes a bending mechanism 22 , a probe position adjustment mechanism 24 , and a bending angle adjustment mechanism 26 . The bending mechanism 22 includes a dial 222, a rotating shaft 224, a bending handle 226 and a position adjustment member 228. The dial 222 has a bottom 2222 and an inclined surface 2224, as shown in Figures 3 and 6 . The inclined surface 2224 allows the probe to roll down to the bottom 2222 of the needle plate 222 to align with the clamp 242 of the probe position adjustment mechanism 24 . In one embodiment, the inclination angle θ of the inclined surface 2224 is approximately 80 to 85 degrees. Since the probe can move by itself to a position aligned with the clamp 242 through the inclined surface 2224, the efficiency of the operation can be improved. FIG. 4 shows a top view of the bending mechanism 22 of FIG. 3 after rotation. The user can rotate the bending mechanism 22 through the rotating shaft 224 and the bending handle 226 to bend the probe. The position adjustment member 228 can adjust the position of the bending mechanism 22 and thereby adjust the first distance D1 between the bending mechanism 22 or the needle plate 222 and the clamp opening 242 . In this embodiment, the position adjustment member 228 includes a screw. By rotating the screw, the bending mechanism 22 can be controlled to move forward or backward in the horizontal direction, but the invention is not limited thereto. As shown in Figure 4, after the bending mechanism 22 rotates, there is a second distance D2 between the bending mechanism 22 or the needle disc 222 and the clamp 242, where the first distance D1 is approximately 2.2~ of the second distance D2. 3.5 times.

The probe position adjustment mechanism 24 has a clamping opening 242, a control member 244, and a position adjustment member 246. The clamp 242 is opened to allow a probe to slide in. In one embodiment, the clamp 242 can be made of a harder material to avoid damage when the probe is bent. The control member 244 is used to control the opening angle of the clamp 242 to determine the length of the probe sliding into the clamp 242 . In this embodiment, the control member 244 includes a screw, and the opening angle of the clamp 242 can be controlled by rotating the screw, but the present invention is not limited thereto. The position adjustment member 246 can adjust the position of the probe position adjustment mechanism 24 and thereby adjust the first distance D1 between the clamp mouth 242 and the bending mechanism 22 . In this embodiment, the position adjustment member 246 includes a screw. By rotating the screw, the probe position adjustment mechanism 24 can be controlled to move forward or backward in the horizontal direction, but the present invention is not limited thereto.

The bending angle adjustment mechanism 26 is disposed on the rotation path of the bending mechanism 22 to control the rotation angle of the bending mechanism 22 and thereby control the bending angle of the probe. In the embodiment of FIG. 3 and FIG. 4 , the bending angle adjustment mechanism 26 includes two positioning blocks 262 and 268 and two screws 264 and 266 , but the invention is not limited thereto. Screws 264 and 266 are respectively provided on the positioning blocks 262 and 268. By rotating the screws 264 and 266, the length of the parts of the screws 264 and 266 protruding from the positioning blocks 262 and 268 can be adjusted to determine the starting position of the bending mechanism 22 before rotation. The starting position and the end position after rotation are used to control the bending angle of the probe.

Figure 5 is used to illustrate the concept of eccentric circles used in this creation. During the process of bending the probe, the rotation trajectory 40 of the probe will be centered on the clamping opening 242 . At the same time, the center 32 of the rotation track 30 of the bending mechanism 22 will deviate from the center of the rotation track 40, that is, the rotation tracks 30 and 40 will form an eccentric circle. Since the center 32 of the rotation track 30 of the bending mechanism 22 and the clamping mouth 242 are at different positions, during the process of bending the probe, the probe will be pushed to the clamping mouth 242, thereby preventing the probe from falling off. In other words, the probe bending device 20 of the present invention uses the concept of an eccentric circle to bend the probe, so there is no need for a complicated structure for clamping the probe, and the structure of the probe bending device 20 is relatively simple.

Figures 6 to 8 illustrate the process of bending the probe. As shown in Figure 6, the user can place the probe 50 on the inclined surface 2224 of the dial 222. No matter where the probe 50 is placed on the inclined surface 2224, the probe 50 will automatically roll down to the dial. The bottom 2222 of 222 is aligned with the clamp 242 of the probe position adjustment mechanism 24 . After the probe 50 rolls down to the bottom 2222 and the bending mechanism 22 moves to the starting position before rotation, the probe 50 is pushed to the clamp 242 so that the probe 50 slides into the clamp 242, as shown in Figure 7 Show. The user can adjust the opening angle of the clamp 242 to determine the length of the probe 50 sliding into the clamp 242, that is, adjust the position of the bending point of the probe 50. After pushing the probe 50 into the clamping opening 242, the user rotates the bending mechanism 22 to bend the probe 50, as shown in FIG. 8 .

The above are only examples of the present invention, and do not limit the present invention in any form. Although the present invention has been disclosed as above in the form of embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field, Without departing from the scope of the technical solution of this invention, the technical content disclosed above can be used to make slight changes or modifications to equivalent embodiments with equivalent changes. However, any content that does not deviate from the technical solution of this invention shall be based on the technical essence of this invention. Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the technical solution of this invention.

10: Probe bending device 12: Place the needle plate 122: Groove 124:Putter 14: Probe fixing mechanism 142: Fixture 1422: clamp mouth 144:Putter 16:Probe 18: Rotation trajectory 182:center of circle 20:Probe bending device 22: Bending mechanism 222:Place the dial 2222:Bottom 2224: Inclined surface 224:Rotating axis 226:Bent handle 228: Position adjustment component 24: Probe position adjustment mechanism 242:Clamp mouth 244:Control components 246: Position adjustment component 26: Bending angle adjustment mechanism 262: Positioning block 264:Screw 266:Screw 268: Positioning block 30: Rotation trajectory 32: center of circle 40: Rotation trajectory 50:Probe D1: first distance D2: second distance

Figure 1 shows a conventional probe bending device. FIG. 2 shows a schematic diagram of the probe bending device of FIG. 1 bending the probe. Figure 3 shows a top view of the probe bending device of the present invention. Figure 4 shows a top view of the bending mechanism of Figure 3 after rotation. Figure 5 is used to illustrate the concept of eccentric circles used in this creation. Figure 6 shows a side view of the dial in Figure 3. FIG. 7 shows a schematic diagram of the probe bending device of FIG. 3 being inserted into the probe. FIG. 8 shows a schematic diagram of the probe bending device of FIG. 7 bending the probe.

20:Probe bending device

22: Bending mechanism

222:Place the dial

2222:Bottom

2224: Inclined surface

224:Rotating axis

226:Bent handle

228: Position adjustment component

24: Probe position adjustment mechanism

242:Clamp mouth

244:Control components

246: Position adjustment component

26: Bending angle adjustment mechanism

262: Positioning block

264:Screw

266:Screw

268: Positioning block

D1: first distance

Claims (3)

A probe bending device, including: A probe position adjustment mechanism has a clamp and a control member, wherein the clamp is for a probe to slide in, and the control member controls the opening angle of the clamp to determine the length of the probe; A bending mechanism has a needle disk and a rotating shaft, wherein the needle disk has an inclined surface, and the rotating shaft can rotate the bending mechanism to bend the probe. Before the bending mechanism rotates, the inclined surface A surface for the probe to roll down to the bottom of the needle tray to align with the clamp; and A bending angle adjustment mechanism is provided on the rotation path of the bending mechanism to control the rotation angle of the bending mechanism to control the bending angle of the probe; Wherein, the center of the rotation track of the bending mechanism and the clamping mouth are at different positions. The probe bending device of claim 1, wherein before the bending mechanism rotates, the needle placing disk and the clamping mouth have a first distance, and after the bending mechanism rotates, the needle placing disk and the clamping mouth There is a second distance, and the first distance is 2.2 to 3.5 times the second distance. For example, the probe bending device of claim 1, wherein the bevel angle of the inclined surface is 80 to 85 degrees.