TWM638335U - All-fiber 3D tomography system - Google Patents

All-fiber 3D tomography system Download PDF

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TWM638335U
TWM638335U TW111212001U TW111212001U TWM638335U TW M638335 U TWM638335 U TW M638335U TW 111212001 U TW111212001 U TW 111212001U TW 111212001 U TW111212001 U TW 111212001U TW M638335 U TWM638335 U TW M638335U
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optical
light
fiber
incident light
collimator
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蔡宗霖
郭俊毅
陳律名
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高科晶捷自動化股份有限公司
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一種全光纖三維斷層掃描系統包括掃頻雷射器、第一光耦合器、第一光循環器、第一光準直器、第一凸透鏡、電控衰減器、第二光循環器、第二光準直器、第二凸透鏡、第二光耦合器與平衡偵測器。全光纖三維斷層掃描系統包括掃頻雷射器能夠利用擷取光學訊號以獲取影像之技術且採用全光纖之線路架構,可對光學散射介質如生物組織等快速進行線或面掃描,以獲得高解析度的三維圖像。An all-fiber three-dimensional tomographic scanning system includes a swept frequency laser, a first optical coupler, a first optical circulator, a first optical collimator, a first convex lens, an electronically controlled attenuator, a second optical circulator, a second A light collimator, a second convex lens, a second light coupler and a balance detector. The all-fiber 3D tomography system includes frequency-sweeping lasers that can use the technology of capturing optical signals to obtain images and adopts an all-fiber line structure, which can quickly perform line or surface scanning on optical scattering media such as biological tissues to obtain high-resolution images. high resolution 3D imagery.

Description

全光纖三維斷層掃描系統All-fiber 3D tomography system

一種光學檢視系統,尤指一種全光纖三維斷層掃描系統,能夠利用擷取光學訊號以獲取影像之技術且採用全光纖之線路架構,可對光學散射介質如生物組織等快速進行線或面掃描,以獲得高解析度的三維圖像。An optical inspection system, especially an all-fiber three-dimensional tomographic scanning system, which can use the technology of capturing optical signals to obtain images and adopts an all-fiber circuit structure, which can quickly perform line or area scanning on optical scattering media such as biological tissues, etc. to obtain high-resolution 3D images.

在許多當前行業中,檢查微小結構的表面或獲得三維資訊是非常重要的。在光干涉領域中,當參考光束和掃描光束的路徑長度彼此一致時發生干涉。更具體地,干涉產生條件是光源同調長度(coherence length)。當路徑長度差小於光源同調長度時,將發生光學干涉。非透明標本可以用邁克爾遜干涉儀(Michelson interferometer)或米勞干涉儀(Mirau interferometer)檢查。透明樣品也可以通過干涉法測量。In many current industries, it is very important to inspect the surface of tiny structures or to obtain three-dimensional information. In the field of optical interference, interference occurs when the path lengths of the reference and scanning beams coincide with each other. More specifically, the interference generation condition is the coherence length of the light source. Optical interference occurs when the path length difference is less than the source coherence length. Non-transparent specimens can be examined with a Michelson interferometer or a Mirau interferometer. Transparent samples can also be measured by interferometry.

邁克爾遜干涉儀是光學干涉儀中最常用的配置之一。通過使用分束器(beam splitter),光源被分為兩個路徑。兩個光束都被反射回分束器,然後分束器合併並產生干涉。所產生的未導向回光源的干涉圖樣通常會導向到某類型的光電偵測器(detector)或照相機。對於干涉儀的不同應用,兩個光路可以具有不同的長度,或者可以包含光學元件甚至被測材料。光源向分束器提供初始光束,該分束器將初始光分成兩束。將兩個光束之一照射到樣品上,將另一個光束照射到反射鏡中以形成參考路徑。在兩個光束反射回到分束器之後,它們將被合併並導向到偵測器,從而在偵測器上生成干涉圖案。The Michelson interferometer is one of the most commonly used configurations in optical interferometers. By using a beam splitter, the light source is split into two paths. Both beams are reflected back to the beam splitter, which then combines and interferes. The resulting interference pattern, which is not directed back to the light source, is usually directed to some type of photodetector or camera. For different applications of the interferometer, the two optical paths can have different lengths, or can contain optical components or even the material being measured. A light source provides an initial light beam to a beam splitter, which splits the initial light into two beams. One of the two beams is shone onto the sample and the other is shone into the mirror to form a reference path. After the two beams reflect back to the beam splitter, they are combined and directed to a detector, where an interference pattern is generated.

米勞(Mira)干涉儀是另一種常用的光學干涉儀配置。米勞干涉儀的工作原理與邁克爾遜干涉儀相同。兩者之間的區別在於參考臂(reference arm)的實際位置。米勞干涉儀的參考臂位於顯微鏡物鏡組件內光源向透鏡L產生初始光束,透鏡將光束折射到分束器以產生兩個光束。一個光束被照射到樣品中,另一光束被反射回透鏡L上的半反射鏡。可以應用另一種光學系統來組合兩個光束以生成干涉圖樣。例如,如果樣本可以是透明的,則在樣本下方配置另一個光學系統。如果樣本是不透明的,則應在樣本上方配置具有反射鏡以收集兩個光束的光學系統。A Mira interferometer is another commonly used optical interferometer configuration. Millau interferometers work on the same principle as Michelson interferometers. The difference between the two is the actual position of the reference arm. The reference arm of the Millau interferometer is located inside the microscope objective assembly. The light source produces an initial beam to a lens L, which refracts the beam to a beam splitter to produce two beams. One beam is shone into the sample and the other beam is reflected back to the half mirror on the lens L. Another optical system can be applied to combine the two beams to generate an interference pattern. For example, if the sample can be transparent, another optical system is configured below the sample. If the sample is opaque, an optical system with mirrors to collect the two beams should be placed above the sample.

儘管邁克爾遜森干涉儀和米勞干涉儀都被廣泛使用,但是僅使用一個光束探測樣本,並且使用參考光束會產生干擾。因此,在兩種情況下,來自光源的光最多只有一半可以到達樣品表面。這極大地限制了在樣品表面上檢測精細特徵的能力。此外,參考路徑對系統至關重要,這將導致邁克爾遜干涉儀的複雜性。儘管可以使用米勞干涉儀獲得干涉結果,但在非透明樣品中,由於必須使用背散射光進行干涉,因此進一步降低照射在樣品上的光強度,並且容易丟失樣品深度和厚度的資訊。Although both Michelson and Millau interferometers are widely used, only one beam is used to probe the sample, and using a reference beam creates interference. Therefore, in both cases at most only half of the light from the light source can reach the sample surface. This greatly limits the ability to detect fine features on the sample surface. Furthermore, the reference path is critical to the system, which leads to the complexity of the Michelson interferometer. Although interference results can be obtained using a Millau interferometer, in non-transparent samples, backscattered light must be used for interference, which further reduces the light intensity irradiated on the sample and easily loses information about the depth and thickness of the sample.

是以,如何解決上述現有技術之問題與缺失,即為相關業者所亟欲研發之課題所在。Therefore, how to solve the problems and deficiencies of the above-mentioned prior art is the subject that the related industry is eager to research and develop.

本創作提供一種全光纖三維斷層掃描系統,尤用以對待觀測物高速進行三維斷層掃描,全光纖三維斷層掃描系統包括掃頻雷射器、第一光耦合器、第一光學掃描模組、第二光學掃描模組、第二光耦合器與平衡偵測器。掃頻雷射器用以發射出不同波長之雷射光線。第一光耦合器以光纖連接至掃頻雷射器,第一光耦合器用以接收掃頻雷射器所發射出之初始入射光線,並且將其分路為第一入射光線與第二入射光線,其中第一入射光線之光線數量為第二入射光線之40~60倍。第一光學掃描模組以光纖連接至第一光耦合器以接收第一入射光線,其中第一入射光線射向待觀測物以產生第一反射光線。第二光學掃描模組以光纖連接至第一光耦合器以接收第二入射光線,其中第二入射光線射向一平面鏡以產生第二反射光線。第二光耦合器以光纖連接至第一光學掃描模組與第二光學掃描模組以分別將第一反射光線與第二反射光線予以合併,其中該第二光耦合器之兩輸出口輸出同樣光線數量之第一目標光線與第二目標光線且彼此進行光學干涉效應。平衡偵測器以光纖連接至第二光耦合器之兩輸出口,以接收第一目標光線與第二目標光線,且在進行信號處理後輸出光學量測信號。This creation provides an all-fiber three-dimensional tomographic scanning system, especially for high-speed three-dimensional tomographic scanning of the object to be observed. The all-fiber three-dimensional tomographic scanning system includes a frequency-sweeping laser, a first optical coupler, a first optical scanning module, a second Two optical scanning modules, a second optical coupler and a balance detector. Frequency-swept lasers are used to emit laser light of different wavelengths. The first optical coupler is connected to the frequency-sweeping laser with an optical fiber, and the first optical coupler is used to receive the initial incident light emitted by the frequency-sweeping laser, and split it into the first incident light and the second incident light , wherein the number of first incident rays is 40 to 60 times that of the second incident rays. The first optical scanning module is connected to the first optical coupler by an optical fiber to receive the first incident light, wherein the first incident light is sent to the object to be observed to generate the first reflected light. The second optical scanning module is connected to the first optical coupler by an optical fiber to receive the second incident light, wherein the second incident light is sent to a plane mirror to generate the second reflected light. The second optical coupler is connected to the first optical scanning module and the second optical scanning module by optical fibers to combine the first reflected light and the second reflected light respectively, wherein the two output ports of the second optical coupler output the same The first target light and the second target light of the light quantity perform optical interference effect with each other. The balance detector is connected to two output ports of the second optical coupler by optical fibers to receive the first target light and the second target light, and output an optical measurement signal after signal processing.

在本創作之一實施例中,第一光學掃描模組包括第一光循環器、第一光準直器、第一凸透鏡與電控衰減器。第一光循環器以光纖連接至第一光耦合器以接收第一入射光線,其中第一入射光線從第一光循環器之第一端口進入且從第二端口出去。第一光準直器以光纖連接至第一光循環器之第二端口,第一光準直器用以將第一入射光線之發散光轉變為平行光。第一凸透鏡設置於第一光準直器之前方,其中第一入射光線會通過第一光準直器且通過第一凸透鏡而射向待觀測物,以產生第一反射光線。電控衰減器,其輸入口以光纖連接至第一光循環器之第三端口以接收第一反射光線且根據一衰減參數值予以衰減。In an embodiment of the present invention, the first optical scanning module includes a first optical circulator, a first optical collimator, a first convex lens and an electronically controlled attenuator. The first optical circulator is connected to the first optical coupler by an optical fiber to receive the first incident light, wherein the first incident light enters from the first port of the first optical circulator and exits from the second port. The first optical collimator is connected to the second port of the first optical circulator by an optical fiber, and the first optical collimator is used for converting the divergent light of the first incident light into parallel light. The first convex lens is disposed in front of the first light collimator, wherein the first incident light passes through the first light collimator and passes through the first convex lens to the object to be observed, so as to generate the first reflected light. The input port of the electronically controlled attenuator is connected to the third port of the first optical circulator by optical fiber to receive the first reflected light and attenuate it according to an attenuation parameter value.

在本創作之一實施例中,第二光學掃描模組包括第二光循環器、第二光準直器與第二凸透鏡。第二光循環器以光纖連接至第一光耦合器以接收第二入射光線,其中第二入射光線從第二光循環器之第一端口進入且從第二端口出去。第二光準直器以光纖連接至第第二光循環器之第二端口,第二光準直器用以將第二入射光線之發散光轉變為平行光。第二凸透鏡設置於第二光準直器之前方,其中第二入射光線會通過第二光準直器且通過第二凸透鏡而射向一平面鏡,以產生第二反射光線。In an embodiment of the present invention, the second optical scanning module includes a second optical circulator, a second optical collimator, and a second convex lens. The second optical circulator is connected to the first optical coupler by an optical fiber to receive the second incident light, wherein the second incident light enters from the first port of the second optical circulator and exits from the second port. The second optical collimator is connected to the second port of the second optical circulator by an optical fiber, and the second optical collimator is used for converting the divergent light of the second incident light into parallel light. The second convex lens is arranged in front of the second light collimator, wherein the second incident light passes through the second light collimator and passes through the second convex lens to a plane mirror to generate a second reflected light.

在本創作之一實施例中,第二光耦合器之兩輸入口以光纖分別連接至電控衰減器之輸出口與第二光循環器之第三端口以分別將第一反射光線與第二反射光線予以合併。In one embodiment of the present invention, the two input ports of the second optical coupler are respectively connected to the output port of the electronically controlled attenuator and the third port of the second optical circulator with optical fibers so as to separate the first reflected light and the second optical circulator respectively. The reflected rays are combined.

在本創作之一實施例中,第一入射光線與第二入射光線分別同時到達待觀測物與平面鏡。In an embodiment of the present invention, the first incident light and the second incident light respectively reach the object to be observed and the plane mirror at the same time.

在本創作之一實施例中,第一反射光線與第二反射光線同時到達第二光耦合器。In one embodiment of the present invention, the first reflected light and the second reflected light reach the second optical coupler at the same time.

在本創作之一實施例中,電控衰減器之該衰減參數值係根據待觀測物之種類而來手動或自動設定。In one embodiment of the present invention, the attenuation parameter value of the electronically controlled attenuator is manually or automatically set according to the type of the object to be observed.

綜上所述,本創作所揭露之全光纖三維斷層掃描系統能夠帶來以下功效: 1.        可對光學散射介質如生物組織等快速進行線或面掃描,以獲得高解析度的三維圖像; 2.        透過光纖線更容易且更準確地架設整個光學斷層掃系統;以及 3.        具有高彈性的擴充能力、掃描的高解析度與高效率。 To sum up, the all-fiber 3D tomography system disclosed in this creation can bring the following effects: 1. It can quickly perform line or surface scanning on optical scattering media such as biological tissues to obtain high-resolution three-dimensional images; 2. It is easier and more accurate to set up the entire optical tomography system through fiber optic lines; and 3. It has high elastic expansion capability, high resolution and high efficiency of scanning.

底下藉由具體實施例詳加說明,當更容易瞭解本創作之目的、技術內容、特點及其所達成之功效。The detailed description of the specific embodiments below will make it easier to understand the purpose, technical content, characteristics and effects of this creation.

為能解決先前技術的問題,創作人經過多年的研究及開發,據以改善現有產品的詬病,後續將詳細介紹本創作如何以一種全光纖三維斷層掃描系統來達到最有效率的功能訴求。In order to solve the problems of the previous technology, the creator has gone through years of research and development to improve the shortcomings of the existing products. The follow-up will introduce in detail how this creation uses an all-fiber 3D tomography system to achieve the most efficient functional demands.

光學同調斷層攝影術(Optical Coherence Tomography,OCT)可以對晶圓或皮膚組織產生非侵入性的三維深層影像,其基礎是利用麥克森干涉儀之原理,將參考端之反射光束及待檢物之反射光束在重合時所產生之相位變化,形成一干涉現象,用以對待檢組織形成一三維深層影像,但傳統的光學同調斷層攝影術(Optical Coherence Tomography,OCT)的干涉影像品質或待檢物的三維資訊仍有待提升。Optical coherence tomography (Optical Coherence Tomography, OCT) can produce non-invasive three-dimensional deep images of wafers or skin tissues. The phase change produced by the coincidence of the reflected beams forms an interference phenomenon, which is used to form a three-dimensional deep image of the tissue to be inspected, but the interference image quality of traditional Optical Coherence Tomography (OCT) or the object to be inspected 3D information still needs to be improved.

請參閱第一圖,第一圖係為本創作的全光纖三維斷層掃描系統之區塊示意圖。如圖所示,本揭露內容之全光纖三維斷層掃描系統100,採用全光纖線路來架構整個光學系統以充分發揮光纖之優勢,尤適用以對待觀測物高速進行三維斷層掃描之領域,可以大幅地保留待觀測物的深度和厚度的資訊。全光纖三維斷層掃描系統100包括掃頻雷射器110、第一光耦合器120、第一光學掃描模組130、第二光學掃描模組140、第二光耦合器150與平衡偵測器160。Please refer to the first picture. The first picture is a block diagram of the all-fiber 3D tomographic scanning system created by the author. As shown in the figure, the all-fiber 3D tomography system 100 of this disclosure adopts all-fiber lines to construct the entire optical system to give full play to the advantages of optical fibers. Keep the depth and thickness information of the object to be observed. The all-fiber 3D tomography system 100 includes a frequency-sweeping laser 110 , a first optical coupler 120 , a first optical scanning module 130 , a second optical scanning module 140 , a second optical coupler 150 and a balance detector 160 .

進一步來說,掃頻雷射器110用以在不同時間發射出不同波長之雷射光線(頻譜相當寬),且掃頻雷射器110的光源為低同調準直光源(Low Coherence Light Source),其主要用以產生一初始光束,它可以達到很高的解析度。第一光耦合器120以光纖連接至掃頻雷射器110,第一光耦合器120用以接收掃頻雷射器110所發射出之初始入射光線IL,並且將初始入射光線IL分路為第一入射光線TL1與第二入射光線TL2,其中第一入射光線TL1之光線數量為第二入射光線TL2之40~60倍,而在本實施例中是以49倍來運作,但不以49倍為限。第一光學掃描模組130以光纖連接至第一光耦合器120以接收第一入射光線TL1,其中第一入射光線TL1射向待觀測物TA以產生第一反射光線BL1,其中待觀測物TA依照實際使用情況可以是晶圓、皮膚或其它物品。Further, the frequency-sweeping laser 110 is used to emit laser light of different wavelengths at different times (the spectrum is quite wide), and the light source of the frequency-sweeping laser 110 is a low coherence collimated light source (Low Coherence Light Source) , which is mainly used to generate an initial beam, which can achieve very high resolution. The first optical coupler 120 is connected to the frequency-sweeping laser 110 by an optical fiber, and the first optical coupler 120 is used for receiving the initial incident light IL emitted by the frequency-sweeping laser 110, and splitting the initial incident light IL into The first incident light TL1 and the second incident light TL2, wherein the light quantity of the first incident light TL1 is 40 to 60 times that of the second incident light TL2, and in this embodiment is 49 times to operate, but not 49 times the limit. The first optical scanning module 130 is connected to the first optical coupler 120 with an optical fiber to receive the first incident light TL1, wherein the first incident light TL1 is directed to the object to be observed TA to generate the first reflected light BL1, wherein the object to be observed TA Depending on the actual usage, it can be wafers, skins or other items.

此外,第二光學掃描模組140以光纖連接至第一光耦合器120以接收第二入射光線TL2,其中第二入射光線TL2射向一平面鏡MA以產生第二反射光線BL2。上述之第一入射光線TL1與第二入射光線TL2分別同時到達待觀測物TA與平面鏡MA,或是實質上同時到達。第二光耦合器150以光纖連接至第一光學掃描模組130與第二光學掃描模組140以分別將第一反射光線BL1與第二反射光線BL2予以合併,其中第二光耦合器150之兩輸出口會輸出同樣光線數量之第一目標光線PL1與第二目標光線PL2且第一目標光線PL1與第二目標光線PL2彼此進行光學干涉效應。上述之第一反射光線BL1與第二反射光線BL2同時到達第二光耦合器150。平衡偵測器160係以光纖連接至第二光耦合器150之兩輸出口,以接收第一目標光線PL1與第二目標光線PL2,且在進行信號處理後輸出光學量測信號TML,其為具有三維資訊的干涉影像。根據上述說明可知,本創作之全光纖三維斷層掃描系統100係利用擷取光學訊號以獲取影像之技術且採用全光纖之線路架構,可對光學散射介質如生物組織等快速進行線或面掃描,以獲得高解析度的三維圖像。In addition, the second optical scanning module 140 is connected to the first optical coupler 120 by an optical fiber to receive the second incident light TL2 , wherein the second incident light TL2 is directed to a plane mirror MA to generate the second reflected light BL2 . The above-mentioned first incident light TL1 and second incident light TL2 reach the object to be observed TA and the plane mirror MA at the same time respectively, or arrive at substantially the same time. The second optical coupler 150 is connected to the first optical scanning module 130 and the second optical scanning module 140 to combine the first reflected light BL1 and the second reflected light BL2 respectively, wherein the second optical coupler 150 The two output ports output the first target light PL1 and the second target light PL2 with the same light quantity, and the first target light PL1 and the second target light PL2 have an optical interference effect with each other. The first reflected light BL1 and the second reflected light BL2 reach the second optical coupler 150 at the same time. The balance detector 160 is connected to the two output ports of the second optical coupler 150 with an optical fiber to receive the first target light PL1 and the second target light PL2, and output an optical measurement signal TML after signal processing, which is Interferometric images with 3D information. According to the above description, it can be seen that the all-fiber 3D tomography system 100 of the present invention uses the technology of capturing optical signals to obtain images and adopts an all-fiber circuit structure, which can quickly perform line or area scanning on optical scattering media such as biological tissues. to obtain high-resolution 3D images.

接下來,將進一步詳細說明全光纖三維斷層掃描系統100。Next, the all-fiber three-dimensional tomography system 100 will be further described in detail.

請參考圖二,第二圖係為本創作的全光纖三維斷層掃描系統之細部區塊示意圖。第一光學掃描模組130包括第一光循環器132、第一光準直器134、第一凸透鏡136與電控衰減器138。第一光循環器132以光纖連接至第一光耦合器120以接收第一入射光線TL1,其中第一入射光線TL1從第一光循環器132之第一端口進入且從第二端口出去。第一光準直器134以光纖連接至第一光循環器132之第二端口以接收第一入射光線TL1,並且第一光準直器係用以將第一入射光線TL1之發散光轉變為平行光。用以聚焦的第一凸透鏡136設置於第一光準直器134之前方,其中第一入射光線TL1會通過第一光準直器134且通過第一凸透鏡136而射向待觀測物TA,以產生第一反射光線BL1。電控衰減器138之輸入口以光纖連接至第一光循環器132之第三端口以接收第一反射光線BL1且根據一衰減參數值予以衰減,亦即減少其光線量。電控衰減器138之衰減參數值係根據待觀測物TA之種類而來手動或自動設定,以能彈性調整第一反射光線BL1的數量,藉此以優化整個全光纖三維斷層掃描系統100。Please refer to Figure 2, which is a schematic diagram of the detailed blocks of the all-fiber 3D tomographic scanning system created by the author. The first optical scanning module 130 includes a first optical circulator 132 , a first optical collimator 134 , a first convex lens 136 and an electronically controlled attenuator 138 . The first optical circulator 132 is connected to the first optical coupler 120 by an optical fiber to receive the first incident light TL1 , wherein the first incident light TL1 enters from the first port of the first optical circulator 132 and exits from the second port. The first light collimator 134 is connected to the second port of the first optical circulator 132 with an optical fiber to receive the first incident light TL1, and the first light collimator is used to convert the divergent light of the first incident light TL1 into Parallel light. The first convex lens 136 for focusing is arranged in front of the first light collimator 134, wherein the first incident light TL1 will pass through the first light collimator 134 and pass through the first convex lens 136 to the object to be observed TA, so as to A first reflected light ray BL1 is generated. The input port of the electronically controlled attenuator 138 is connected to the third port of the first optical circulator 132 by an optical fiber to receive the first reflected light BL1 and attenuate it according to an attenuation parameter value, that is, reduce the light quantity. The attenuation parameter value of the electronically controlled attenuator 138 is manually or automatically set according to the type of the object TA to be observed, so as to flexibly adjust the quantity of the first reflected light BL1, thereby optimizing the entire all-fiber 3D tomography system 100 .

此外,第二光學掃描模組140包括第二光循環器142、第二光準直器144與第二凸透鏡146。第二光循環器142以光纖連接至第一光耦合器120以接收第二入射光線TL2,其中第二入射光線TL2從第二光循環器142之第一端口進入且從第二端口出去。第二光準直器144以光纖連接至第二光循環器142之第二端口以接收第二入射光線TL2,第二光準直器144用以將第二入射光線TL2之發散光轉變為平行光。用以聚焦的第二凸透鏡146設置於第二光準直器144之前方,其中第二入射光線TL2會通過第二光準直器144且通過第二凸透鏡146而射向一平面鏡MA,以產生第二反射光線BL2。接下來,第二光耦合器150之兩輸入口以光纖分別連接至電控衰減器138之輸出口與第二光循環器142之第三端口以分別將第一反射光線BL1與第二反射光線BL2予以合併。In addition, the second optical scanning module 140 includes a second optical circulator 142 , a second optical collimator 144 and a second convex lens 146 . The second optical circulator 142 is connected to the first optical coupler 120 by an optical fiber to receive the second incident light TL2, wherein the second incident light TL2 enters from the first port of the second optical circulator 142 and exits from the second port. The second optical collimator 144 is connected to the second port of the second optical circulator 142 with an optical fiber to receive the second incident light TL2, and the second optical collimator 144 is used to convert the divergent light of the second incident light TL2 into parallel Light. The second convex lens 146 for focusing is arranged in front of the second light collimator 144, wherein the second incident light TL2 will pass through the second light collimator 144 and pass through the second convex lens 146 to a plane mirror MA to generate The second reflected ray BL2. Next, the two input ports of the second optical coupler 150 are respectively connected to the output port of the electronically controlled attenuator 138 and the third port of the second optical circulator 142 with optical fibers so as to separate the first reflected light BL1 and the second reflected light BL2 is merged.

由上述可知,在使用光纖線路作為全光纖三維斷層掃描系統100之主要連接線路之系統環境下,第一入射光線TL1與第二入射光線TL2之光線路徑為等價相同,並且第一反射光線BL1與第二反射光線BL2之光線路徑也是等價相同。其中雷射能量90%以上集中於樣品上,且瞬間只有輸出單一波長,雷射能量由單一波長持有,不像傳統OCT雷射能量由多波長共享,因此,本創作最後所偵測到的干涉影像也會比傳統OCT的干涉影像更好。From the above, it can be seen that in the system environment where the optical fiber line is used as the main connection line of the all-fiber 3D tomography system 100, the light paths of the first incident light TL1 and the second incident light TL2 are equivalent and the same, and the first reflected light BL1 It is also equivalent to the ray path of the second reflected ray BL2. Among them, more than 90% of the laser energy is concentrated on the sample, and only a single wavelength is output in an instant. The laser energy is held by a single wavelength, unlike traditional OCT laser energy that is shared by multiple wavelengths. Therefore, the final detection of this creation The interference image will also be better than the interference image of traditional OCT.

本創作採用全光纖線路的斷層掃瞄系統可以應用於非金屬物品的光學同調斷層掃描。例如,本創作可以應用於半導體製造工業中的非金屬物品的缺陷檢查和尺寸計量,其中非金屬物品例如為晶圓、透明膠、玻璃或塑膠薄膜。在本創作中,由於光學的高容許能力的特性,因此可以獲得整個待觀測物的微米或甚至是亞微米尺寸的資訊。此外,通過使用本創作,也可以檢查薄膜表面的平坦度、表面粗糙度或薄膜厚度,其它關於非金屬物品的資訊都可以透過建構三維影像來獲取。The tomographic scanning system using all optical fiber lines in this creation can be applied to the optical coherent tomographic scanning of non-metallic objects. For example, the invention can be applied to defect inspection and dimensional metrology of non-metallic objects such as wafers, transparent glue, glass or plastic films in the semiconductor manufacturing industry. In this invention, due to the high admissibility of optics, micron or even sub-micron size information of the entire object to be observed can be obtained. In addition, by using this creation, it is also possible to check the flatness, surface roughness or film thickness of the film surface, and other information about non-metallic objects can be obtained by constructing a 3D image.

綜上所述,本創作所揭露之全光纖三維斷層掃描系統能夠帶來以下功效: 1.        可對光學散射介質如生物組織等快速進行線或面掃描,以獲得高解析度的三維圖像; 2.        透過光纖線更容易且更準確地架設整個光學斷層掃系統;以及 3.        具有高彈性的擴充能力、掃描的高解析度與高效率。 To sum up, the all-fiber 3D tomography system disclosed in this creation can bring the following effects: 1. It can quickly perform line or surface scanning on optical scattering media such as biological tissues to obtain high-resolution three-dimensional images; 2. It is easier and more accurate to set up the entire optical tomography system through fiber optic lines; and 3. It has high elastic expansion capability, high resolution and high efficiency of scanning.

唯以上所述者,僅為本創作之較佳實施例而已,並非用來限定本創作實施之範圍。故即凡依本創作申請範圍所述之特徵及精神所為之均等變化或修飾,均應包括於本創作之申請專利範圍內。Only the above-mentioned ones are only preferred embodiments of this creation, and are not used to limit the scope of implementation of this creation. Therefore, all equal changes or modifications based on the characteristics and spirit described in the scope of application for this creation shall be included in the scope of patent application for this creation.

100:全光纖三維斷層掃描系統 110:掃頻雷射器 120:第一光耦合器 130:第一光學掃描模組 132:第一光循環器 134:第一光準直器 136:第一凸透鏡 138:電控衰減器 140:第二光學掃描模組 142:第二光循環器 144:第二光準直器 146:第二凸透鏡 150:第二光耦合器 160:平衡偵測器 IL:初始入射光線 TL1:第一入射光線 TL2:第二入射光線 BL1:第一反射光線 BL2:第二反射光線 PL1:第一目標光線 PL2:第二目標光線 TML:光學量測信號 TA:待觀測物 MA:平面鏡 100: All-fiber 3D tomography system 110:Sweep frequency laser 120: The first optocoupler 130: The first optical scanning module 132: The first optical circulator 134: The first light collimator 136: The first convex lens 138: Electric control attenuator 140: Second optical scanning module 142: Second optical circulator 144: Second light collimator 146: second convex lens 150: Second optocoupler 160:Balance detector IL: initial incident ray TL1: first incident ray TL2: second incident ray BL1: first reflected ray BL2: second reflected ray PL1: first target ray PL2: second target ray TML: optical measurement signal TA: object to be observed MA: plane mirror

第一圖係為本創作的全光纖三維斷層掃描系統之區塊示意圖。 第二圖係為本創作的全光纖三維斷層掃描系統之細部區塊示意圖。 The first picture is a block diagram of the all-fiber 3D tomographic scanning system created by the author. The second picture is a schematic diagram of the detailed blocks of the all-fiber 3D tomographic scanning system created by the author.

100:全光纖三維斷層掃描系統 100: All-fiber 3D tomography system

110:掃頻雷射器 110:Sweep frequency laser

120:第一光耦合器 120: The first optocoupler

130:第一光學掃描模組 130: The first optical scanning module

132:第一光循環器 132: The first optical circulator

134:第一光準直器 134: The first light collimator

136:第一凸透鏡 136: The first convex lens

138:電控衰減器 138: Electric control attenuator

140:第二光學掃描模組 140: Second optical scanning module

142:第二光循環器 142: Second optical circulator

144:第二光準直器 144: Second light collimator

146:第二凸透鏡 146: second convex lens

150:第二光耦合器 150: Second optocoupler

160:平衡偵測器 160:Balance detector

IL:初始入射光線 IL: initial incident ray

TL1:第一入射光線 TL1: first incident ray

TL2:第二入射光線 TL2: second incident ray

BL1:第一反射光線 BL1: first reflected ray

BL2:第二反射光線 BL2: second reflected ray

PL1:第一目標光線 PL1: first target ray

PL2:第二目標光線 PL2: second target ray

TML:光學量測信號 TML: optical measurement signal

TA:待觀測物 TA: object to be observed

MA:平面鏡 MA: plane mirror

Claims (7)

一種全光纖三維斷層掃描系統,尤用以對一待觀測物高速進行三維斷層掃描,該全光纖三維斷層掃描系統包括:一掃頻雷射器,其用以發射出不同波長之雷射光線;一第一光耦合器,其以光纖連接至該掃頻雷射器,該第一光耦合器用以接收該掃頻雷射器所發射出之一初始入射光線,並且將其分路為一第一入射光線與一第二入射光線,其中該第一入射光線之光線數量為該第二入射光線之40~60倍;一第一光學掃描模組,其以光纖連接至該第一光耦合器以接收該第一入射光線,其中該第一入射光線射向該待觀測物,以產生一第一反射光線;一第二光學掃描模組,其以光纖連接至該第一光耦合器以接收該第二入射光線,其中該第二入射光線射向一平面鏡,以產生一第二反射光線;一第二光耦合器,其以光纖連接至該第一光學掃描模組與該第二光學掃描模組以分別將該第一反射光線與該第二反射光線予以合併,其中該第二光耦合器之兩輸出口輸出同樣光線數量之一第一目標光線與一第二目標光線且彼此進行光學干涉效應;以及一平衡偵測器,其以光纖連接至該第二光耦合器之兩輸出口,以接收該第一目標光線與該第二目標光線,且在進行信號處理後輸出一光學量測信號。 An all-fiber three-dimensional tomographic scanning system, especially for high-speed three-dimensional tomographic scanning of an object to be observed, the all-fiber three-dimensional tomographic scanning system includes: a frequency-sweeping laser, which is used to emit laser light of different wavelengths; The first optical coupler is connected to the frequency-sweeping laser with an optical fiber, and the first optical coupler is used to receive an initial incident light emitted by the frequency-sweeping laser and split it into a first incident light and a second incident light, wherein the light quantity of the first incident light is 40 to 60 times that of the second incident light; a first optical scanning module, which is connected to the first optical coupler with an optical fiber to receiving the first incident light, wherein the first incident light is directed towards the object to be observed to generate a first reflected light; a second optical scanning module, which is connected to the first optical coupler with an optical fiber to receive the The second incident light, wherein the second incident light is sent to a plane mirror to generate a second reflected light; a second optical coupler, which is connected to the first optical scanning module and the second optical scanning module with an optical fiber to combine the first reflected light and the second reflected light respectively, wherein the two output ports of the second optical coupler output a first target light and a second target light of the same light quantity and optically interfere with each other effect; and a balance detector, which is connected to the two output ports of the second optical coupler with an optical fiber, to receive the first target light and the second target light, and output an optical measurement after signal processing Signal. 如請求項1所述之全光纖三維斷層掃描系統,其中該第一光學掃描模組包括:一第一光循環器,其以光纖連接至該第一光耦合器以接收該第一入射光線,其中該第一入射光線從該第一光循環器之第一端口進入且從第二端口出去; 一第一光準直器,其以光纖連接至該第一光循環器之第二端口,該第一光準直器用以將該第一入射光線之發散光轉變為平行光;一第一凸透鏡,其設置於該第一光準直器之前方,其中該第一入射光線會通過該第一光準直器且通過該第一凸透鏡而射向該待觀測物,以產生一第一反射光線;以及一電控衰減器,其輸入口以光纖連接至該第一光循環器之第三端口以接收該第一反射光線且根據一衰減參數值予以衰減。 The all-fiber 3D tomographic scanning system as described in claim 1, wherein the first optical scanning module includes: a first optical circulator, which is connected to the first optical coupler with an optical fiber to receive the first incident light, wherein the first incident light enters from a first port of the first optical circulator and exits from a second port; A first optical collimator, which is connected to the second port of the first optical circulator with an optical fiber, the first optical collimator is used to convert the divergent light of the first incident light into parallel light; a first convex lens , which is arranged in front of the first light collimator, wherein the first incident light will pass through the first light collimator and pass through the first convex lens to the object to be observed, so as to generate a first reflected light ; and an electronically controlled attenuator, the input port of which is connected to the third port of the first optical circulator by optical fiber to receive the first reflected light and attenuate it according to an attenuation parameter value. 如請求項2所述之全光纖三維斷層掃描系統,其中該第二光學掃描模組包括:一第二光循環器,其以光纖連接至該第一光耦合器以接收該第二入射光線,其中該第二入射光線從該第二光循環器之第一端口進入且從第二端口出去;一第二光準直器,其以光纖連接至該第二光循環器之第二端口,該第二光準直器用以將該第二入射光線之發散光轉變為平行光;以及一第二凸透鏡,其設置於該第二光準直器之前方,其中該第二入射光線會通過該第二光準直器且通過該第二凸透鏡而射向一平面鏡,以產生二第一反射光線。 The all-fiber three-dimensional tomographic scanning system as described in Claim 2, wherein the second optical scanning module includes: a second optical circulator, which is connected to the first optical coupler with an optical fiber to receive the second incident light, Wherein the second incident light enters from the first port of the second optical circulator and exits from the second port; a second optical collimator is connected to the second port of the second optical circulator with an optical fiber, the The second light collimator is used to convert the divergent light of the second incident light into parallel light; and a second convex lens, which is arranged in front of the second light collimator, wherein the second incident light will pass through the first light collimator The two light collimators are sent to a plane mirror through the second convex lens to generate two first reflected light rays. 如請求項3所述之全光纖三維斷層掃描系統,其中該第二光耦合器之兩輸入口以光纖分別連接至該電控衰減器之輸出口與該第二光循環器之第三端口以分別將該第一反射光線與該第二反射光線予以合併。 The all-fiber three-dimensional tomographic scanning system as described in claim 3, wherein the two input ports of the second optical coupler are respectively connected to the output port of the electronically controlled attenuator and the third port of the second optical circulator with optical fibers to Combining the first reflected light and the second reflected light respectively. 如請求項1所述之全光纖三維斷層掃描系統,其中該第一入射光線與該第二入射光線分別同時到達該待觀測物與該平面鏡。 The all-fiber three-dimensional tomographic scanning system according to claim 1, wherein the first incident light and the second incident light respectively reach the object to be observed and the plane mirror at the same time. 如請求項1所述之全光纖三維斷層掃描系統,其中該第一反射光線與該第二反射光線同時到達該第二光耦合器。 The all-fiber three-dimensional tomographic scanning system according to claim 1, wherein the first reflected light and the second reflected light reach the second optical coupler at the same time. 如請求項2所述之全光纖三維斷層掃描系統,其中該電控衰減器之該衰減參數值係根據該待觀測物之種類而來手動或自動設定。 The all-fiber three-dimensional tomographic scanning system as described in Claim 2, wherein the attenuation parameter value of the electronically controlled attenuator is set manually or automatically according to the type of the object to be observed.
TW111212001U 2022-11-02 2022-11-02 All-fiber 3D tomography system TWM638335U (en)

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