TWM614215U - Liquid-cooling burn-in socket and burn-in apparatus - Google Patents

Liquid-cooling burn-in socket and burn-in apparatus Download PDF

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Publication number
TWM614215U
TWM614215U TW109216784U TW109216784U TWM614215U TW M614215 U TWM614215 U TW M614215U TW 109216784 U TW109216784 U TW 109216784U TW 109216784 U TW109216784 U TW 109216784U TW M614215 U TWM614215 U TW M614215U
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Taiwan
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burn
socket
cavity
liquid
contact interface
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TW109216784U
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Chinese (zh)
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孫偉志
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伊士博國際商業股份有限公司
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Publication of TWM614215U publication Critical patent/TWM614215U/en

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Abstract

The disclosure provides a burn-in apparatus including a pump, at least one liquid-cooling burn-in socket and a reservoir tank. The pump pushes a coolant. The at least one liquid-cooling burn-in socket electrically connects to a circuit board and communicatively couples to the pump to receive the pushed coolant. The reservoir tank communicatively couples to the socket and receives the coolant exhausted from the socket.

Description

液冷式燒機插座及燒機裝置 Liquid-cooled machine-burning socket and machine-burning device

本創作關於一種針對待測裝置(DUT)的燒機插座及燒機裝置(如燒機電路板,Burn-in Board),尤其是一種整合液體冷卻機制的燒機座及燒機裝置。 This creation is about a burn-in socket and burn-in device (such as Burn-in Board) for the device under test (DUT), especially a burn-in base and burn-in device that integrates a liquid cooling mechanism.

在半導體或者PCB的產業中,燒機(Burn-In)是測試晶圓或晶片的一種過程,複數個晶圓或晶片會對應地安裝在燒機板上的測試座上進行各種參數的測試,如溫度、應力、頻率等,檢測出任何在後續製程中,因IC設計,材料,製程或製造的缺陷所發生的故障。 In the semiconductor or PCB industry, burn-in is a process of testing wafers or chips. Multiple wafers or chips will be installed on the test socket on the burn-in board to test various parameters. Such as temperature, stress, frequency, etc., detect any failures in the subsequent manufacturing process due to defects in IC design, material, manufacturing process or manufacturing.

經封裝後的積體電路(IC),通常需要經過一定時間的燒機測試(burn in test),以確保IC產品可以在嚴苛環境下運作。第一圖顯示一種已知燒機插座的示意圖。經封裝後的一晶片(100)被容置於固定在電路板(101)上的一基座(102)並電性連接至多個訊號接觸(未顯示)。具備散熱單元的一蓋體(103)對晶片(100)進行壓制並以一接觸介面(1031)接觸晶片(100)的頂部。一般而言,蓋體(103)的散熱單元是由多個散熱鰭片(1032)以特定形式排列而成,而這些散熱鰭片(1032)連接至接觸介面(1031),藉此將燒機運行 期間的晶片(100)頂部所累積的熱經由接觸介面(1031)傳導至散熱鰭片(1032),釋放至空氣中。在已知的創作中,有額外提供一風扇於散熱鰭片(1032)上以增加對流,或者在接觸介面(1031)和散熱鰭片(1032)之間提供幫助導熱的多根導管,藉此提升燒機插座的散熱能力。然而,隨著5G和AI時代的來臨,高功率IC的需求提高,針對高功率IC的燒機測試也變得更加嚴苛。例如在燒機過程中,高功率IC晶片所產生的熱,像是大於1500瓦的熱源,以上述創作可能無法滿足這類裝置的測試。 The packaged integrated circuit (IC) usually needs to undergo a burn in test for a certain period of time to ensure that the IC product can operate in a harsh environment. The first figure shows a schematic diagram of a known burn-in socket. The packaged chip (100) is accommodated in a base (102) fixed on the circuit board (101) and electrically connected to a plurality of signal contacts (not shown). A cover body (103) with a heat dissipation unit presses the chip (100) and contacts the top of the chip (100) with a contact interface (1031). Generally speaking, the heat dissipation unit of the cover (103) is made up of a plurality of heat dissipation fins (1032) arranged in a specific form, and these heat dissipation fins (1032) are connected to the contact interface (1031), thereby burning the machine run During this period, the heat accumulated on the top of the chip (100) is conducted to the heat dissipation fins (1032) through the contact interface (1031) and released into the air. In known creations, a fan is additionally provided on the heat dissipation fins (1032) to increase convection, or a plurality of ducts to help heat conduction are provided between the contact interface (1031) and the heat dissipation fins (1032), thereby Improve the heat dissipation capacity of the burn-in socket. However, with the advent of the 5G and AI era, the demand for high-power ICs has increased, and the burn-in test for high-power ICs has become more stringent. For example, during the burn-in process, the heat generated by high-power IC chips, such as a heat source greater than 1500 watts, may not be able to meet the test of this type of device with the above creation.

上述燒機插座是電性連接至一電路板,以構成所謂的燒機板(BIB)。應了解,該該電路板上還會有其他的電子組件,其也會根據燒機測試訊號的功率而產生熱,並抑制上述差基座的散熱效果,最終導致整個燒機板溫度過高,可達60度以上。已知液冷技術有用於電腦產品,像是伺服器、電腦處理器及繪圖處理器,但未見有整合於燒機裝置。 The above-mentioned burn-in socket is electrically connected to a circuit board to form a so-called burn-in board (BIB). It should be understood that there will be other electronic components on the circuit board, which will also generate heat according to the power of the burn-in test signal, and suppress the heat dissipation effect of the above-mentioned poor base, which will eventually lead to an excessively high temperature of the entire burn-in board. It can reach above 60 degrees. Known liquid cooling technology is used in computer products, such as servers, computer processors, and graphics processors, but it has not been integrated into burn-in devices.

因此,發展一種燒機插座及燒機裝置與液冷技術的整合,為本領域亟待解決的課題。 Therefore, the development of a burn-in socket and the integration of a burn-in device with liquid cooling technology is an urgent issue to be solved in the field.

本創作目的在於提供一種燒機裝置,包含:一泵浦,推送一冷卻液;至少一液冷式燒機插座,電性連接於一電路板且流體耦接至該泵浦以接收該泵浦推送的冷卻液;及一儲槽,流體耦接該液冷式燒機插座並接收來自該液冷式燒機插座排出的冷卻液。 The purpose of this creation is to provide a burn-in device, including: a pump, which pushes a coolant; at least one liquid-cooled burn-in socket, which is electrically connected to a circuit board and fluidly coupled to the pump to receive the pump Pushed cooling liquid; and a storage tank fluidly coupled to the liquid-cooled burning machine socket and receiving the cooling liquid discharged from the liquid-cooled burning machine socket.

在一具體實施例中,燒機裝置還包含:一熱交換器,與該液冷式燒機插座流體耦接並接收來自該液冷式燒機插座排出的冷卻液。 In a specific embodiment, the burn-in device further includes: a heat exchanger fluidly coupled to the liquid-cooled burn-in socket and receives the cooling liquid discharged from the liquid-cooled burn-in socket.

在一具體實施例中,該液冷式燒機插座,包含:一基座,電性連接至該電路板且具有一容置槽,該容置槽用於容置一待測裝置使待測裝置的一頂部暴露;及一蓋體,覆蓋於該基座的容置槽上方且具有一接觸介面和一腔體,其中該接觸介面用於接觸該待測裝置的頂部,該腔體與該接觸介面導熱耦接且接收來自泵浦的冷卻液。 In a specific embodiment, the liquid-cooled machine-burning socket includes: a base electrically connected to the circuit board and having a accommodating slot for accommodating a device to be tested A top of the device is exposed; and a cover covering the top of the accommodating groove of the base and having a contact interface and a cavity, wherein the contact interface is used to contact the top of the device under test, the cavity and the The contact interface is thermally coupled to and receives the coolant from the pump.

在一具體實施例中,該蓋體樞轉連接至該基座,該蓋體還具有一外罩,該外罩將該腔體容置於其中。 In a specific embodiment, the cover is pivotally connected to the base, the cover further has an outer cover, and the outer cover accommodates the cavity therein.

在一具體實施例中,該外罩設置有一輸入埠及一輸出埠,該輸入埠及該輸出埠流體連通該腔體,該輸入埠用於接收該泵浦推送的冷卻液,該輸出埠用於排出該腔體的冷卻液。 In a specific embodiment, the housing is provided with an input port and an output port, the input port and the output port are in fluid communication with the cavity, the input port is used for receiving the coolant pushed by the pump, and the output port is used for Drain the coolant from the cavity.

在一具體實施例中,該腔體經由至少一導熱管連接至該接觸介面,藉此使該接觸介面的熱傳導至該腔體中。 In a specific embodiment, the cavity is connected to the contact interface via at least one heat conducting tube, so that the heat of the contact interface is conducted to the cavity.

100:晶片 100: chip

101:電路板 101: circuit board

102:基座 102: Pedestal

103:蓋體 103: Lid

1031:接觸介面 1031: contact interface

1032:散熱鰭片 1032: heat sink fins

202:泵浦 202: Pump

204:燒機插座 204: Burn-in socket

2041:接觸介面 2041: contact interface

206:儲槽 206: storage tank

208:熱交換器 208: Heat Exchanger

300:電路板 300: circuit board

301:框體 301: Frame

302:泵浦 302: Pump

304:插座 304: socket

306:儲槽 306: storage tank

308:熱交換器 308: Heat Exchanger

402:基座 402: Pedestal

4021:容置槽 4021: accommodating slot

4022:鎖固手段 4022: locking means

404:蓋體 404: Lid

4041:框體 4041: Frame

4042:接觸介面 4042: contact interface

4043:外罩 4043: outer cover

4044:腔體 4044: Cavity

4045:輸入埠 4045: Input port

4046:輸出埠 4046: output port

4047:熱導管 4047: Heat pipe

D:待測裝置 D: Device to be tested

T1:第一管 T1: The first tube

T2:第二管 T2: second tube

T3:第三管 T3: third tube

T4:第四管 T4: Fourth tube

參照下列圖式與說明,可更進一步理解本創作。非限制性與非窮舉性實例系參照下列圖式而描述。在圖式中的構件並非必須為實際尺寸;重點在於說明結構及原理。 Refer to the following diagrams and descriptions to further understand this creation. Non-limiting and non-exhaustive examples are described with reference to the following drawings. The components in the drawings do not have to be actual sizes; the focus is on explaining the structure and principles.

第一圖顯示已知的燒機插座示意圖。 The first figure shows a schematic diagram of a known burn-in socket.

第二圖示意本創作燒機裝置的冷卻液循環路徑。 The second figure shows the circulation path of the cooling liquid of the burning-in device of the present invention.

第三圖示意本創作燒機裝置的一實施例配置。 The third figure illustrates the configuration of an embodiment of the authoring burning device.

第四A圖及第四B圖分別顯示本創作燒機插座實施例的閉鎖狀態及開啟狀態。 The fourth diagram A and the fourth diagram B respectively show the locked state and the open state of the embodiment of the creative burn-in socket.

底下將參考圖式更完整說明本創作,並且藉由例示顯示特定範例具體實施例。不過,本主張主題可具體實施於許多不同形式,因此所涵蓋或申請主張主題的建構並不受限於本說明書所揭示的任何範例具體實施例;範例具體實施例僅為例示。同樣,本創作在於提供合理寬闊的範疇給所申請或涵蓋之主張主題。除此之外,例如主張主題可具體實施為方法、裝置或系統。因此,具體實施例可採用例如硬體、軟體、韌體或這些的任意組合(已知並非軟體)之形式。 Hereinafter, the creation will be explained more fully with reference to the drawings, and specific examples and specific embodiments will be shown by exemplification. However, the claimed subject matter can be implemented in many different forms. Therefore, the construction of the claimed subject matter covered or applied for is not limited to any exemplary specific embodiments disclosed in this specification; the exemplary specific embodiments are only examples. Similarly, this creation is to provide a reasonably broad category for the claimed subject matter applied for or covered. In addition, for example, the claimed subject matter can be embodied as a method, device, or system. Therefore, the specific embodiments may take the form of, for example, hardware, software, firmware, or any combination of these (not known as software).

本說明書內使用的詞彙「在一實施例」並不必要參照相同具體實施例,且本說明書內使用的「在其他(一些/某些)實施例」並不必要參照不同的具體實施例。其目的在於例如主張的主題包括全部或部分範例具體實施例的組合。 The term "in one embodiment" used in this specification does not necessarily refer to the same specific embodiment, and the term "in other (some/some) embodiments" used in this specification does not necessarily refer to different specific embodiments. The purpose is, for example, that the claimed subject matter includes all or part of a combination of exemplary embodiments.

第二圖顯示本創作液冷式燒機裝置的冷卻液循環路徑及各部件的關係。本創作液冷式燒機裝置主要包含一泵浦(202)、至少一燒機插座(204)、一儲槽(206)及一熱交換器(208),其彼此以流體連通的方式連接或耦接以形成一冷卻液循環路徑。 The second figure shows the coolant circulation path of the liquid-cooled burn-in device of this invention and the relationship between its components. This creative liquid-cooled burning device mainly includes a pump (202), at least one burning socket (204), a storage tank (206) and a heat exchanger (208), which are connected to each other in fluid communication or Coupled to form a cooling liquid circulation path.

泵浦(202)流體連接於所述循環路徑中並配置成沿著所述循環路徑朝一或多個方向(如圖中箭頭指向)推送一冷卻液。雖然未顯示,泵浦(202)是基於一控制器的指令而運作,使泵浦(202)可持續推送或間歇推送冷卻液。所述控制器可進一步配置成基於一溫度感測器的感測結果而控制泵浦(202), 其中所述溫度感測器可適當地配置於冷卻液循環路徑,以監測裝置的溫度變化情況。 The pump (202) is fluidly connected to the circulation path and is configured to push a coolant along the circulation path in one or more directions (pointed by the arrow in the figure). Although not shown, the pump (202) operates based on an instruction from a controller, so that the pump (202) can continuously or intermittently push the coolant. The controller may be further configured to control the pump (202) based on the sensing result of a temperature sensor, The temperature sensor can be appropriately configured in the cooling liquid circulation path to monitor the temperature change of the device.

燒機插座(204)流體連接於所述循環路徑中並配置成流體耦接至泵浦(202)的下游端,以接收泵浦(202)推送的冷卻液。燒機插座(204)可容置一待測裝置(D)且提供有複數個與待測裝置(D)連接的訊號接觸(未顯示)。待測裝置(D)可為一IC晶片。燒機插座(204)具有一接觸介面(2041),其用於接觸容置於該燒機插座(204)中的待測裝置(D),使待測裝置(D)於測試期間產生的熱可傳導至接觸介面(2041)。因此,接觸介面(2041)通常選自具有高導熱係數的材料,或者使用多種材料製作出複合結構,像是已知的均溫板(vapor chamber)。前述溫度感測器可以適當的方式配置於燒機插座(204),藉此可實現待測裝置(D)的溫度監控。關於燒機插座(204)的其他細節將於後續說明。 The burn-in socket (204) is fluidly connected in the circulation path and configured to be fluidly coupled to the downstream end of the pump (202) to receive the cooling liquid pushed by the pump (202). The burn-in socket (204) can accommodate a device under test (D) and is provided with a plurality of signal contacts (not shown) connected with the device under test (D). The device under test (D) can be an IC chip. The burn-in socket (204) has a contact interface (2041), which is used to contact the device under test (D) accommodated in the burn-in socket (204), so that the device under test (D) generates heat during the test. Can be conducted to the contact interface (2041). Therefore, the contact interface (2041) is usually selected from materials with high thermal conductivity, or a composite structure made of multiple materials, such as a known vapor chamber. The aforementioned temperature sensor can be configured in the burn-in socket (204) in an appropriate manner, so as to realize the temperature monitoring of the device under test (D). Other details about the burn-in socket (204) will be described later.

儲槽(206)流體連接於所述循環路徑中並配置成流體耦接至燒機插座(204)的下游端,以接收自燒機插座(204)排出的冷卻液,其帶走了燒機插座(204)中相當的熱。儲槽(206)應盛裝足夠的容量的冷卻液,以確保所述循環路徑中有充分的冷卻液流動著,或者可用於調節循環路徑的流率。 The storage tank (206) is fluidly connected in the circulation path and configured to be fluidly coupled to the downstream end of the burner socket (204) to receive the coolant discharged from the burner socket (204), which takes away the burner The socket (204) is quite hot. The storage tank (206) should contain sufficient capacity of cooling liquid to ensure that there is sufficient cooling liquid flowing in the circulation path, or can be used to adjust the flow rate of the circulation path.

熱交換器(208)流體連接於所述循環路徑中並配置成可盛裝相當容量的冷卻液。熱交換器(208)流體耦接至儲槽(206)的下游端,以接收自儲槽(206)排出的冷卻液。雖然圖示熱交換器(208)位於儲槽(206)的下游端,但本創作並未以此為限制,意即熱交換器(208)亦可位於儲槽(206)的上游端或其他位置。熱交換器(208)的下游端耦接有泵浦(202),藉此形成一個封閉 的循環路徑。熱交換器(208)主要具備熱轉移的能力,意即將冷卻液中的熱轉移給周圍環境。熱交換器(208)可基於前述控制器的指令而運行,以節省電力。 The heat exchanger (208) is fluidly connected to the circulation path and is configured to hold a considerable volume of cooling liquid. The heat exchanger (208) is fluidly coupled to the downstream end of the storage tank (206) to receive the cooling liquid discharged from the storage tank (206). Although the heat exchanger (208) shown in the figure is located at the downstream end of the storage tank (206), this creation is not limited to this, which means that the heat exchanger (208) can also be located at the upstream end of the storage tank (206) or other Location. The downstream end of the heat exchanger (208) is coupled with a pump (202), thereby forming a closed Cycle path. The heat exchanger (208) mainly has the ability of heat transfer, which means that the heat in the cooling liquid is transferred to the surrounding environment. The heat exchanger (208) can be operated based on the instructions of the aforementioned controller to save power.

第三圖例示本創作液冷式燒機裝置的一實施例。本創作燒機裝置包含一電路板(300)、一泵浦(302)、至少一插座(304)、一儲槽(306)及一熱交換器(308)。 The third figure illustrates an embodiment of the liquid-cooled burning device of the present invention. The creative burning device includes a circuit board (300), a pump (302), at least one socket (304), a storage tank (306) and a heat exchanger (308).

電路板(300)基本上為一印刷電路板,其具有一正面及一背面並布局有由各種電子元件和導電路徑構成的電路。例如,電路板(300)可提供有前述控制器的電路。電路板(300)還可具有一或多個輸入埠和輸出埠,其中輸入埠可接收外部的電力以及用於燒機測試的各種測試訊號,輸出埠則可將測試的結果傳送至外部進行分析。雖然僅顯示單一電路板(300),但本創作不排除該電路板(300)可以是一母板和一子板的結合。 The circuit board (300) is basically a printed circuit board, which has a front surface and a back surface and is laid out with circuits composed of various electronic components and conductive paths. For example, the circuit board (300) may be provided with the circuit of the aforementioned controller. The circuit board (300) can also have one or more input ports and output ports. The input port can receive external power and various test signals for burn-in testing, and the output port can transmit the test results to the outside for analysis . Although only a single circuit board (300) is shown, this creation does not exclude that the circuit board (300) can be a combination of a mother board and a daughter board.

此外,電路板(300)的週圍具有一框體(301),其用於保護電路板(300)並配置有把手供操作人員將電路板(300)裝載至一燒機系統中。舉例而言,已知的燒機系統可以層為單位容納多個本創作燒機裝置。 In addition, a frame (301) is provided around the circuit board (300), which is used to protect the circuit board (300) and is equipped with a handle for the operator to load the circuit board (300) into a burn-in system. For example, a known burn-in system can accommodate multiple creative burn-in devices in units of layers.

泵浦(302)可固定於框體(301)上以避免影響電路板(300)的布局。泵浦(302)經由一第一管(T1)與燒機插座(304)連接以推送冷卻液至燒機插座(304)中。在其他的可能性中,第一管(T1)可包含一分流手段,藉此控制推送至燒機插座(304)的冷卻液流量。 The pump (302) can be fixed on the frame (301) to avoid affecting the layout of the circuit board (300). The pump (302) is connected to the burn-in socket (304) via a first tube (T1) to push the cooling liquid to the burn-in socket (304). In other possibilities, the first pipe (T1) may include a shunting means, thereby controlling the flow of the cooling liquid sent to the burning socket (304).

電路板(300)可提供多個連接介面,分別用於電性連接燒機插座(304)。該實施例僅顯示單獨一個燒機插座(304)的情況以簡化複雜的配置,不意味本創作燒機裝置僅有一個燒機插座。所述連接介面包含電路板(300)上 的訊號接觸或固定機構,其可和燒機插座(304)底部的訊號接觸或固定機構相對應,藉此提供訊號插座容置的待測裝置。 The circuit board (300) can provide a plurality of connection interfaces, which are respectively used to electrically connect the burn-in socket (304). This embodiment only shows the case of a single burn-in socket (304) to simplify the complicated configuration, which does not mean that the creative burn-in device has only one burn-in socket. The connection interface includes a circuit board (300) The signal contact or fixing mechanism can correspond to the signal contact or fixing mechanism at the bottom of the burn-in socket (304), thereby providing the device under test contained in the signal socket.

儲槽(306)經由一第二管(T2)接收來自燒機插座(304)的冷卻液。雖然該實施例僅顯示儲槽(306)經由第二管(T2)與單獨一個燒機插座(304)連接,但不意味儲槽(306)不能經由更多的管與更多數量的插座連接。本創作亦不限制只能有單獨一個儲槽(306)。 The storage tank (306) receives the cooling liquid from the burning socket (304) through a second pipe (T2). Although this embodiment only shows that the storage tank (306) is connected to a single burning socket (304) via the second tube (T2), it does not mean that the storage tank (306) cannot be connected to a larger number of sockets via more tubes. . This creation is also not limited to a single storage tank (306).

熱交換器(308)經由一第三管(T3)連接於儲槽(306)的下游端以接收溫度較高的冷卻液。熱交換器(308)可由各種已知的手段實現。例如,熱交換器(308)可包含熱沉和風扇的結合,藉由製造對流來降溫位於此處的冷卻液。熱交換器(308)再經由一第四管(T4)將降溫後的冷卻液提供給泵浦(302),完成基本的循環。 The heat exchanger (308) is connected to the downstream end of the storage tank (306) via a third tube (T3) to receive the higher temperature cooling liquid. The heat exchanger (308) can be realized by various known means. For example, the heat exchanger (308) may include a combination of a heat sink and a fan to cool down the coolant located here by creating convection. The heat exchanger (308) supplies the cooled coolant to the pump (302) through a fourth tube (T4) to complete the basic cycle.

第四A圖和第四B圖分別顯示本創作液冷式燒機插座的閉合狀態和開啟狀態。本創作燒機插座包含一基座(402)及一蓋體(404),兩者經由可樞轉的方式相互連接,使蓋體(404)可選擇性地覆蓋於基座(402)的上方。 The fourth picture A and the fourth picture B respectively show the closed state and the open state of the liquid-cooled burn-in socket of the invention. The creative burn-in socket includes a base (402) and a cover (404), which are connected to each other in a pivotable manner, so that the cover (404) can be selectively covered above the base (402) .

基座(402)具有一頂部和一底部,其中底部具有多個訊號接觸,其對應地與第三圖電路板(300)上所述連接介面電性連接。基座(402)的頂部形成有一容置槽(4021),用於容置一待測裝置,如晶片。應可了解,容置槽(4021)的底部提供有對應基座(402)底部訊號接觸的的多個電性接觸。此外,基座(402)還可提供一鎖固手段(4022),用於牢固蓋體(404)維持其閉合狀態。 The base (402) has a top and a bottom, wherein the bottom has a plurality of signal contacts, which are correspondingly electrically connected to the connection interface on the circuit board (300) in the third figure. A accommodating groove (4021) is formed on the top of the base (402) for accommodating a device to be tested, such as a wafer. It should be understood that the bottom of the accommodating groove (4021) is provided with a plurality of electrical contacts corresponding to the signal contacts at the bottom of the base (402). In addition, the base (402) can also provide a locking means (4022) for securing the cover (404) to maintain its closed state.

蓋體(404)具有一框體(4041)及由該框體(4041)所固持的一接觸介面(4042)。接觸介面(4042)具有一接觸頭用於接觸待測裝置的頂部,所述接觸頭由高導熱係數材料所製成,也可包含所述均熱板。蓋體(404)還具 有一外罩(4043),其與框體(4041)連接並定義出一容置空間,使一腔體(4044)可經由一固持手段收容於該容置空間中。外罩(4043)具有相對的兩側,其分別提供有連接至腔體(4044)的一輸入埠(4045)及一輸出埠(4046)。輸入埠(4045)連接至如第三圖的第一管(T1),輸出埠(4046)連接至第二管(T2),藉此冷卻液可被推送入腔體(4044)。 The cover (404) has a frame (4041) and a contact interface (4042) held by the frame (4041). The contact interface (4042) has a contact head for contacting the top of the device under test. The contact head is made of a material with high thermal conductivity, and may also include the heat spreader. Cover body (404) also has An outer cover (4043) is connected with the frame (4041) and defines an accommodating space, so that a cavity (4044) can be accommodated in the accommodating space through a holding means. The outer cover (4043) has two opposite sides, which are respectively provided with an input port (4045) and an output port (4046) connected to the cavity (4044). The input port (4045) is connected to the first tube (T1) as shown in the third figure, and the output port (4046) is connected to the second tube (T2), whereby the cooling liquid can be pushed into the cavity (4044).

腔體(4044)導熱耦接至接觸介面(4042),使接觸介面((4042)累積的熱可傳遞至腔體(4044)。具體而言,蓋體(404)還具有一或多個熱導管(4047),其一端連接於接觸介面(4042)而另一端連接至腔體(4044),甚至延伸至腔體(4044)中。據此,接觸介面(4042)的熱得以從熱導管(4047)的一端傳遞至位於腔體(4042)中的另一端,而流經腔體(4042)的冷卻液便可將此處的熱帶走,待測裝置頂部的溫度可有效降低。 The cavity (4044) is thermally coupled to the contact interface (4042), so that the heat accumulated in the contact interface (4042) can be transferred to the cavity (4044). Specifically, the cover (404) also has one or more heat The tube (4047) has one end connected to the contact interface (4042) and the other end connected to the cavity (4044), even extending into the cavity (4044). According to this, the heat of the contact interface (4042) can be removed from the heat pipe ( One end of 4047) is transferred to the other end in the cavity (4042), and the coolant flowing through the cavity (4042) can remove the heat here, and the temperature at the top of the device under test can be effectively reduced.

雖然為了清楚瞭解已經用某些細節來描述前述本創作,吾人將瞭解在申請專利範圍內可實施特定變更與修改。因此,以上實施例僅用於說明,並不設限,並且本創作並不受限於此處說明的細節,但是可在附加之申請專利範圍的領域及等同者下進行修改。 Although some details have been used to describe the aforementioned creation for a clear understanding, we will understand that specific changes and modifications can be implemented within the scope of the patent application. Therefore, the above embodiments are only for illustration and are not limited, and this creation is not limited to the details described here, but can be modified under the scope of the additional patent application and equivalents.

402:基座 402: Pedestal

4022:鎖固手段 4022: locking means

404:蓋體 404: Lid

4041:框體 4041: Frame

4043:外罩 4043: outer cover

4044:腔體 4044: Cavity

4045:輸入埠 4045: Input port

4047:熱導管 4047: Heat pipe

Claims (10)

一種燒機裝置,包含:一泵浦,推送一冷卻液;至少一液冷式燒機插座,電性連接於一電路板且流體耦接至該泵浦以接收該泵浦推送的冷卻液;及一儲槽,流體耦接該液冷式燒機插座並接收來自該液冷式燒機插座排出的冷卻液。 A burn-in device, comprising: a pump for pushing a cooling liquid; at least one liquid-cooled burn-in socket, electrically connected to a circuit board and fluidly coupled to the pump to receive the cooling liquid pushed by the pump; And a storage tank, fluidly coupled to the liquid-cooled burning machine socket and receiving the cooling liquid discharged from the liquid-cooled burning machine socket. 如請求項1所述之燒機裝置,還包含:一熱交換器,與該液冷式燒機插座流體耦接並接收來自該液冷式燒機插座排出的冷卻液。 The burning device according to claim 1, further comprising: a heat exchanger fluidly coupled to the liquid-cooled burning socket and receiving the coolant discharged from the liquid-cooled burning socket. 如請求項1所述之燒機裝置,其中該液冷式燒機插座,包含:一基座,電性連接至該電路板且具有一容置槽,該容置槽用於容置一待測裝置使待測裝置的一頂部暴露;及一蓋體,覆蓋於該基座的容置槽上方且具有一接觸介面和一腔體,其中該接觸介面用於接觸該待測裝置的頂部,該腔體與該接觸介面導熱耦接且接收來自泵浦的冷卻液。 The burn-in device according to claim 1, wherein the liquid-cooled burn-in socket includes: a base electrically connected to the circuit board and has a accommodating slot for accommodating a standby The test device exposes a top of the device under test; and a cover covering the top of the accommodating groove of the base and having a contact interface and a cavity, wherein the contact interface is used to contact the top of the device under test, The cavity is thermally coupled to the contact interface and receives the cooling liquid from the pump. 如請求項3所述之燒機裝置,其中該蓋體樞轉連接至該基座,該蓋體還具有一外罩,該外罩將該腔體容置於其中。 The burning device according to claim 3, wherein the cover is pivotally connected to the base, the cover further has an outer cover, and the outer cover accommodates the cavity therein. 如請求項4所述之燒機裝置,其中該外罩設置有一輸入埠及一輸出埠,該輸入埠及該輸出埠流體連通該腔體,該輸入埠用於接收該泵浦推送的冷卻液,該輸出埠用於排出該腔體的冷卻液。 The burning device according to claim 4, wherein the housing is provided with an input port and an output port, the input port and the output port are fluidly connected to the cavity, and the input port is used to receive the coolant pushed by the pump, The output port is used to discharge the coolant from the cavity. 如請求項4所述之燒機裝置,其中該腔體經由至少一導熱管連接至該接觸介面,藉此使該接觸介面的熱傳導至該腔體中。 The burn-in device according to claim 4, wherein the cavity is connected to the contact interface via at least one heat conduction tube, so that the heat of the contact interface is conducted to the cavity. 一種液冷式燒機插座,包含:一基座,具有一容置槽;及一蓋體,覆蓋於該基座的容置槽上方且具有一接觸介面和一腔體,其中該接觸介面用於接觸一待測裝置,該腔體與該接觸介面導熱耦接並配置成流體耦接一泵浦以接收一冷卻液。 A liquid-cooled machine-burning socket includes: a base with a containing groove; and a cover, covering the top of the containing groove of the base and having a contact interface and a cavity, wherein the contact interface is used for When contacting a device under test, the cavity is thermally coupled to the contact interface and configured to be fluidly coupled to a pump to receive a cooling liquid. 如請求項7所述之燒機插座,其中該蓋體樞轉連接至該基座,該蓋體還具有一外罩,該外罩將該腔體容置於其中。 The burn-in socket according to claim 7, wherein the cover is pivotally connected to the base, the cover further has an outer cover, and the outer cover accommodates the cavity. 如請求項8所述之燒機插座,其中該外罩提供有一輸入埠及一輸出埠,該輸入埠及該輸出埠流體連通該腔體,該輸入埠用於接收該冷卻液,該輸出埠用於排出該腔體的冷卻液。 The burn-in socket of claim 8, wherein the housing provides an input port and an output port, the input port and the output port are fluidly connected to the cavity, the input port is used for receiving the coolant, and the output port is used for To discharge the coolant from the cavity. 如請求項7所述之燒機插座,其中該腔體經由至少一導熱管連接至該接觸介面,藉此使該接觸介面的熱傳導至該腔體中。 The burn-in socket according to claim 7, wherein the cavity is connected to the contact interface via at least one heat pipe, so that the heat of the contact interface is conducted to the cavity.
TW109216784U 2020-12-18 2020-12-18 Liquid-cooling burn-in socket and burn-in apparatus TWM614215U (en)

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