TWM599908U - Metal surface inspection system and lighting device thereof - Google Patents

Metal surface inspection system and lighting device thereof Download PDF

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Publication number
TWM599908U
TWM599908U TW109206624U TW109206624U TWM599908U TW M599908 U TWM599908 U TW M599908U TW 109206624 U TW109206624 U TW 109206624U TW 109206624 U TW109206624 U TW 109206624U TW M599908 U TWM599908 U TW M599908U
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light
metal surface
light source
lens
emitting module
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TW109206624U
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Chinese (zh)
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蕭賢德
王宣復
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華洋精機股份有限公司
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Priority to TW109206624U priority Critical patent/TWM599908U/en
Priority to CN202021504605.1U priority patent/CN213364606U/en
Publication of TWM599908U publication Critical patent/TWM599908U/en

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Abstract

本創作的金屬表面檢查系統的照明裝置包括發光模組、擴散板及光源偏振片。發光模組用以產生光。擴散板連接發光模組,用以以供光通過而形成面光源。光源偏振片連接發光模組,且供面光源通過而形成偏振光,用以對金屬表面提供照明。The lighting device of the metal surface inspection system created by this invention includes a light-emitting module, a diffuser and a light source polarizer. The light emitting module is used for generating light. The diffuser plate is connected to the light-emitting module to allow light to pass through to form a surface light source. The light source polarizer is connected to the light-emitting module, and the surface light source passes through to form polarized light, which is used to illuminate the metal surface.

Description

金屬表面檢查系統及其照明裝置Metal surface inspection system and lighting device thereof

本創作與光學檢查系統有關,特別是指一種金屬表面檢查系統及其照明裝置。This creation is related to the optical inspection system, especially a metal surface inspection system and its lighting device.

金屬表面存在金屬本身的紋路,目前透過光學檢查系統拍攝金屬表面來進行檢查的過程需要經過複雜的影像處理來消除金屬紋,之後才能知道金屬表面是否存在缺陷,例如灰塵、髒污、破損或凹陷等,但複雜的影像處理的過程需要較長的演算時間,而不利於快速的檢查。雖然可以透過高速運算設備來縮短演算時間,但高速運算設備的建置成本昂貴。There are lines on the metal surface. At present, the process of photographing the metal surface through an optical inspection system for inspection requires complex image processing to eliminate the metal lines before it can be known whether there are defects on the metal surface, such as dust, dirt, damage or dents. Etc., but the complicated image processing process requires a long calculation time, which is not conducive to quick inspection. Although the calculation time can be shortened by high-speed computing equipment, the high-speed computing equipment is expensive to build.

此外,目前為了提高金屬表面的照度通常會選擇高亮度或高功率的發光元件,發光元件產生的光是點光源,點光源直接照射金屬表面,金屬表面的被照射區域的亮度是不均勻的,因此,拍攝被照射區域的影像不僅包含金屬表面紋路,還有光造成的影像,這將不利於消除金屬紋路。In addition, in order to improve the illuminance of the metal surface, high-brightness or high-power light-emitting elements are usually selected. The light generated by the light-emitting elements is a point light source. The point light source directly illuminates the metal surface. The brightness of the illuminated area of the metal surface is uneven. Therefore, the image of the irradiated area contains not only metal surface textures, but also images caused by light, which will not help to eliminate metal textures.

有鑑於上述缺失,本創作的金屬表面檢查系統及其照明裝置是透過照明設備產生的面光源的偏振光來照射金屬表面,取像裝置在拍攝金屬表面的檢查圖案,透過特定方向的偏振光來提供照明以簡化金屬表面的金屬紋的消除流程。In view of the above-mentioned deficiencies, the metal surface inspection system and its lighting device created by this invention illuminate the metal surface through the polarized light of the surface light source generated by the lighting equipment. The image capture device is shooting the inspection pattern on the metal surface, passing the polarized light in a specific direction. Provide lighting to simplify the process of eliminating metal lines on metal surfaces.

為了達成上述目的,本創作的金屬表面檢查系統包括照明裝置及取像裝置。照明裝置用以產生偏振光來照射金屬表面,偏振光是面光源。取像裝置接收偏振光在金屬表面反射的反射光。取像裝置接收反射光的偏振方向與反射光的偏振方向是正交關係。取像裝置將反射光轉換為檢查圖像。In order to achieve the above purpose, the metal surface inspection system created by this invention includes a lighting device and an image capturing device. The lighting device is used to generate polarized light to illuminate the metal surface, and the polarized light is a surface light source. The image capturing device receives the reflected light reflected by the polarized light on the metal surface. The polarization direction of the reflected light received by the imaging device is orthogonal to the polarization direction of the reflected light. The imaging device converts the reflected light into an inspection image.

為了達成上述目的,本創作的金屬表面檢查系統的照明裝置包括發光模組、擴散板及光源偏振片。發光模組用以產生光。擴散板連接發光模組,用以以供光通過而形成面光源。光源偏振片連接發光模組,且供面光源通過而形成偏振光,用以對金屬表面提供照明。In order to achieve the above purpose, the lighting device of the metal surface inspection system created by this invention includes a light-emitting module, a diffuser and a light source polarizer. The light emitting module is used for generating light. The diffuser plate is connected to the light-emitting module to allow light to pass through to form a surface light source. The light source polarizer is connected to the light-emitting module, and the surface light source passes through to form polarized light, which is used to illuminate the metal surface.

如此,本創作的金屬表面檢查系統的照明裝置可以透過擴散板及光源偏振片提供均勻面光源的偏帳光,偏振光的偏振方向與金屬表面的反射光的偏振方向相同,以便於消除金屬紋。In this way, the lighting device of the metal surface inspection system created by this invention can provide the polarized light of a uniform surface light source through the diffuser and the light source polarizer. The polarization direction of the polarized light is the same as the polarization direction of the reflected light on the metal surface, so as to eliminate the metal pattern. .

有關本創作所提供之金屬表面檢查系統的結構、組成、特點、組裝或使用方式,將於後續的實施方式詳細說明中予以描述。然而,在本創作領域中具有通常知識者應能瞭解,該等詳細說明以及實施本創作所列舉的特定實施例,僅係用於說明本創作,並非用以限制本創作之專利申請範圍。The structure, composition, characteristics, assembly or use of the metal surface inspection system provided by this creation will be described in the detailed description of the subsequent implementation. However, those with ordinary knowledge in the field of creation should be able to understand that these detailed descriptions and specific embodiments listed in the implementation of this creation are only used to illustrate the creation and are not intended to limit the scope of patent applications for this creation.

以下,茲配合各圖式列舉對應之較佳實施例來對本創作的金屬表面檢查系統的結構、組成、運用及達成功效來作說明。然各圖式中金屬表面檢查系統的構件、尺寸及外觀僅用來說明本創作的技術特徵,而非對本創作構成限制。Hereinafter, the corresponding preferred embodiments are listed in conjunction with the various drawings to illustrate the structure, composition, application, and effects of the metal surface inspection system of the present invention. However, the components, dimensions and appearance of the metal surface inspection system in the various drawings are only used to illustrate the technical features of this creation, but not to limit this creation.

如圖1所示,本創作的金屬表面檢查系統100用以透過面光源對金屬表面300提供照明,並透過拍攝金屬表面300來取得金屬表面300的檢查圖像。As shown in FIG. 1, the metal surface inspection system 100 of the present invention is used to illuminate the metal surface 300 through a surface light source, and obtain an inspection image of the metal surface 300 by shooting the metal surface 300.

金屬表面檢查系統100包括照明裝置11及取像裝置13。照明裝置11用以透過面光源的偏振光15照射金屬表面300的檢查區域。取像裝置13用以接收金屬表面300的檢查區域的反射光31。反射光31是照明裝置11的偏振光15照射金屬表面300的檢查區域所產生的反射光。The metal surface inspection system 100 includes a lighting device 11 and an image capturing device 13. The illuminating device 11 is used to illuminate the inspection area of the metal surface 300 with polarized light 15 transmitted through the surface light source. The image capturing device 13 is used for receiving the reflected light 31 of the inspection area of the metal surface 300. The reflected light 31 is the reflected light generated by the polarized light 15 of the lighting device 11 irradiating the inspection area of the metal surface 300.

金屬表面300可以金屬板、金屬塊、金屬框或金屬線的表面,金屬的材質可以是銅、金、鋁、鐵、不鏽鋼或其他金屬材質。The metal surface 300 may be a surface of a metal plate, a metal block, a metal frame, or a metal wire, and the metal material may be copper, gold, aluminum, iron, stainless steel or other metal materials.

取像裝置13包括相機本體131及鏡頭133。鏡頭133連接相機本體131,鏡頭133包括透鏡135及鏡頭偏振片137,透鏡135位在鏡頭偏振片137及相機本體131之間。反射光31依序通過鏡頭偏振片137及透鏡135,而被相機本體13接收,並轉換為檢查圖像。其他實施例中,偏振片137可以位在透鏡133的其他位置,例如,偏振片位在透鏡及相機本體之間,透鏡133可以有更多鏡片。The image capturing device 13 includes a camera body 131 and a lens 133. The lens 133 is connected to the camera body 131. The lens 133 includes a lens 135 and a lens polarizer 137. The lens 135 is located between the lens polarizer 137 and the camera body 131. The reflected light 31 sequentially passes through the lens polarizer 137 and the lens 135, is received by the camera body 13, and is converted into an inspection image. In other embodiments, the polarizer 137 may be located at other positions of the lens 133. For example, the polarizer is located between the lens and the camera body, and the lens 133 may have more lenses.

如圖2所示,照明裝置11包括發光模組111、擴散板113及光源偏振片115。發光模組111用以產生光117。本實施例中,發光模組111包括殼體119、散熱器121及發光元件123。散熱器121連接殼體119。發光元件123連接散熱器121,並用以產生光117,發光元件123是發光二極體(LED)。擴散板113連接發光模組111的殼體119。光源偏振片115連接發光模組111的殼體119。擴散板113位在發光模組111的發光元件119及光源偏振片115之間,發光元件123的光117依序通過擴散板113及光源偏振片115,而產生偏振光15,以提供金屬表面所需的照明。As shown in FIG. 2, the lighting device 11 includes a light emitting module 111, a diffuser plate 113 and a light source polarizer 115. The light emitting module 111 is used for generating light 117. In this embodiment, the light-emitting module 111 includes a housing 119, a heat sink 121, and a light-emitting element 123. The radiator 121 is connected to the housing 119. The light-emitting element 123 is connected to the heat sink 121 to generate light 117, and the light-emitting element 123 is a light emitting diode (LED). The diffusion plate 113 is connected to the housing 119 of the light-emitting module 111. The light source polarizer 115 is connected to the housing 119 of the light-emitting module 111. The diffuser plate 113 is located between the light-emitting element 119 and the light source polarizer 115 of the light-emitting module 111. The light 117 of the light-emitting element 123 sequentially passes through the diffuser plate 113 and the light source polarizer 115 to generate polarized light 15 to provide the surface of the metal. Required lighting.

因為照明裝置11具有擴散板113,因此,發光元件123產生的光117(即點光源)可以透過擴散板113轉換成均勻地面光源,來提供均勻照度的照明,接著均勻照度的照明再透過光源偏振片115產生偏振光15,因此,照明裝置11可以提供均勻的偏振光15。Because the lighting device 11 has a diffuser 113, the light 117 (ie point light source) generated by the light-emitting element 123 can be converted into a uniform ground light source through the diffuser 113 to provide uniform illumination, and then the uniform illumination is polarized by the light source. The sheet 115 generates polarized light 15, and therefore, the lighting device 11 can provide uniform polarized light 15.

請再參照圖1,本創作的金屬表面檢查系統100是透過照明裝置11產生均勻或柔和的偏振光15來提供金屬表面300的檢查區域所需的照明,均勻(柔和)的偏振光15可以提供金屬表面300的均勻照度的面光源,此外,偏振光15與金屬表面300的反射光31的偏振方向是水平偏振光。1 again, the metal surface inspection system 100 of the present invention generates uniform or soft polarized light 15 through the illuminating device 11 to provide the illumination required for the inspection area of the metal surface 300. The uniform (soft) polarized light 15 can provide A surface light source with uniform illuminance on the metal surface 300. In addition, the polarization direction of the polarized light 15 and the reflected light 31 of the metal surface 300 is horizontally polarized light.

取像裝置13接收金屬表面300的反射光31,本實施例中,取像裝置13的傳感器132接收反射光31的偏振方向與反射光31是正交關係,也就是傳感器132是接收垂直方向的光,如此,相機本體131的影像傳感器132接收反射光31,並將反射光31通過鏡頭偏振片137的光信號轉換模擬信號,模擬信號經由相機本體131的影像處理流程轉換為檢查圖像,影像傳感器132可以是電荷耦合器件(CCD)或互補性氧化金屬半導體(CMOS),檢查圖像可以是靜態影像或動態影像。The image capturing device 13 receives the reflected light 31 of the metal surface 300. In this embodiment, the polarization direction of the reflected light 31 received by the sensor 132 of the image capturing device 13 is orthogonal to the reflected light 31, that is, the sensor 132 receives the vertical direction In this way, the image sensor 132 of the camera body 131 receives the reflected light 31 and converts the optical signal of the reflected light 31 through the lens polarizer 137 into an analog signal. The analog signal is converted into an inspection image through the image processing flow of the camera body 131. The sensor 132 may be a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS), and the inspection image may be a static image or a dynamic image.

如此,由於偏振光15與反射光31的偏振方向是相同的,因此,金屬表面300的反射光31是一致而可有效地消除金屬紋。此外,當金屬表面有異物,例如髒汙、灰塵或粉塵等時,異物的表面會讓反射光31的反射角度改變,也就是偏振方向改變,因此,取像裝置13也能容易地辨別異物的位置及尺寸。In this way, since the polarization directions of the polarized light 15 and the reflected light 31 are the same, the reflected light 31 of the metal surface 300 is consistent, and the metal pattern can be effectively eliminated. In addition, when there are foreign objects on the metal surface, such as dirt, dust or dust, the surface of the foreign objects will change the reflection angle of the reflected light 31, that is, the polarization direction. Therefore, the imaging device 13 can also easily distinguish the foreign objects. Location and size.

如圖3所示,圖3是本創作的金屬表面檢查系統的照明裝置省略光源偏振片,簡言之,照明裝置是透過擴散板對金屬表面提供均勻(柔和)的照明,取像裝置所拍攝的檢查圖像,該圖的檢查圖像可看金屬表面的金屬紋仍然存在,且異物(圖中的白點)位置沒有明顯顯現出來。As shown in Figure 3, Figure 3 is the lighting device of the metal surface inspection system created by this invention omitting the light source polarizer. In short, the lighting device provides uniform (soft) illumination to the metal surface through the diffuser plate. In the inspection image of the image, it can be seen that the metal pattern on the metal surface still exists, and the position of the foreign object (the white dot in the image) is not obvious.

如圖4所示,圖4是本創作的金屬表面檢查系統拍攝的檢查圖像,該圖的檢查圖像相較於圖3可清楚發現金屬紋已被消除(黑色部分),僅留下金屬表面的異物,如圖4中的白點。As shown in Figure 4, Figure 4 is the inspection image taken by the metal surface inspection system created by this invention. Compared with Figure 3, it can be clearly found that the metal pattern has been eliminated (the black part), leaving only the metal The foreign matter on the surface is like the white dots in Figure 4.

透過圖3及圖4可發現透過面光源的偏振光對金屬表面提供特定偏振方向的照明,以在金屬表面形成均勻(柔和)的照度及特定偏振方向的反射光,以有效地消除金屬紋。Through Figures 3 and 4, it can be found that the polarized light transmitted through the surface light source provides illumination of a specific polarization direction on the metal surface to form uniform (soft) illuminance and reflected light with a specific polarization direction on the metal surface to effectively eliminate metal lines.

照明裝置的偏振光在金屬表面的照明,不僅可讓取像裝置拍攝的檢查圖像更容易呈現異物的位置、尺寸及形狀等,且簡化檢查圖像的影像處理流程,故可提高檢查效率及品質。The illumination of the polarized light of the illuminating device on the metal surface not only makes the inspection image taken by the imaging device easier to show the position, size and shape of the foreign object, but also simplifies the image processing process of the inspection image, so it can improve the inspection efficiency and quality.

最後,再次強調,本創作於前揭實施例中所揭露的構成元件,僅為舉例說明,並非用來限制本案之範圍,其他等效元件的替代或變化,亦應為本創作之申請專利範圍所涵蓋。Finally, it is emphasized again that the constituent elements disclosed in the previously disclosed embodiments of this creation are only examples and are not used to limit the scope of this case. The substitution or change of other equivalent elements should also be the scope of the patent application for this creation. Covered.

100:金屬表面檢查系統 11:照明裝置 111:發光模組 113:擴散板 115:光源偏振片 117:光 119:殼體 121:散熱器 123:發光元件 13:取像裝置 131:相機本體 132:影像傳感器 133:鏡頭 135:透鏡 137:鏡頭偏振片 15:偏振光 300:金屬表面 31:反射光 100: Metal surface inspection system 11: Lighting device 111: Light-emitting module 113: diffuser 115: light source polarizer 117: Light 119: Shell 121: radiator 123: Light-emitting element 13: Capture device 131: Camera body 132: Image sensor 133: lens 135: lens 137: lens polarizer 15: Polarized light 300: metal surface 31: reflected light

圖1是本創作的金屬表面檢查系統檢查金屬表面的示意圖。 圖2是圖1中照明裝置的示意圖。 圖3是圖2中照明裝置省略光源偏振片,取像裝置拍攝金屬表面的檢查影像。 圖4是圖1的金屬表面檢察系統的取像裝置拍攝金屬表面的檢查影像。 Figure 1 is a schematic diagram of the metal surface inspection system of this creation to inspect the metal surface. Fig. 2 is a schematic diagram of the lighting device in Fig. 1. Fig. 3 shows the illuminating device in Fig. 2 omitting the light source polarizer, and the imaging device takes an inspection image of the metal surface. FIG. 4 is an inspection image of a metal surface taken by the image capturing device of the metal surface inspection system of FIG. 1.

100:金屬表面檢查系統 100: Metal surface inspection system

11:照明裝置 11: Lighting device

13:取像裝置 13: Capture device

131:相機本體 131: Camera body

132:影像傳感器 132: Image sensor

133:鏡頭 133: lens

135:透鏡 135: lens

137:鏡頭偏振片 137: lens polarizer

15:偏振光 15: Polarized light

300:金屬表面 300: metal surface

31:反射光 31: reflected light

Claims (4)

一種金屬表面檢查系統,包括: 一照明裝置,用以產生一偏振光來照射一金屬表面,該偏振光是一面光源;及 一取像裝置,接收該偏振光在該金屬表面反射的一反射光,該取像裝置接收該反射光的偏振方向與該反射光的偏振方向是正交關係,該取像裝置將該反射光轉換為一檢查圖像。 A metal surface inspection system, including: An illumination device for generating a polarized light to illuminate a metal surface, the polarized light being a surface light source; and An image capturing device receives a reflected light reflected by the polarized light on the metal surface, the polarization direction of the reflected light received by the image capturing device is orthogonal to the polarization direction of the reflected light, and the image capturing device receives the reflected light Convert to an inspection image. 如請求項1所述的金屬表面檢查系統,其中,該照明裝置包括一發光模組、一擴散板及一光源偏振片,該發光模組用以產生一光,該擴散板及該光源偏振片連接該發光模組,該光依序通過該擴散板及該光源偏振片,以形成該偏振光。The metal surface inspection system according to claim 1, wherein the lighting device includes a light emitting module, a diffuser plate and a light source polarizer, the light emitting module is used to generate a light, the diffuser plate and the light source polarizer The light-emitting module is connected, and the light sequentially passes through the diffuser plate and the light source polarizer to form the polarized light. 請求項1所述的金屬表面檢查系統,其中,該取像裝置包括一相機本體及一鏡頭,該鏡頭連接該相機本體,且包括一透鏡及一鏡頭偏振片,該反射光依序通過該鏡頭偏振片及該透鏡,而被該相機本體接收而轉換為該檢查圖像。The metal surface inspection system of claim 1, wherein the image capturing device includes a camera body and a lens, the lens is connected to the camera body, and includes a lens and a lens polarizer, and the reflected light sequentially passes through the lens The polarizer and the lens are received by the camera body and converted into the inspection image. 一種金屬表面檢查系統的照明裝置,包括: 一發光模組,用以產生一光; 一擴散板,連接該發光模組,且用以供該光通過而形成一面光源;及 一光源偏振片,連接該發光模組,且供該面光源通過而形成一偏振光,用以對一金屬表面提供照明。 A lighting device of a metal surface inspection system, including: A light-emitting module for generating a light; A diffusion plate connected to the light emitting module and used for the light to pass through to form a surface light source; and A light source polarizer is connected to the light-emitting module and allows the surface light source to pass through to form a polarized light for illuminating a metal surface.
TW109206624U 2020-05-28 2020-05-28 Metal surface inspection system and lighting device thereof TWM599908U (en)

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