TWM592512U - Gas analysis apparatus - Google Patents
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- TWM592512U TWM592512U TW108204603U TW108204603U TWM592512U TW M592512 U TWM592512 U TW M592512U TW 108204603 U TW108204603 U TW 108204603U TW 108204603 U TW108204603 U TW 108204603U TW M592512 U TWM592512 U TW M592512U
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本新型係有關於一種氣體分析裝置,更特別是有關於一種使用電聲換能器搭配聲學阻抗材料和高品質因子共振腔的聲學共振頻率法,以增強了所得到的聲速的穩定性和靈敏性,更可進一步精確地分析出氣體的性質與組成成分。 The present invention relates to a gas analysis device, and more particularly to an acoustic resonance frequency method using an electroacoustic transducer with acoustic impedance materials and a high quality factor resonance cavity to enhance the stability and sensitivity of the resulting sound velocity It can further accurately analyze the nature and composition of the gas.
化學氣相沉積製程廣泛地用來生長金屬、半導體、介電質等各種高純度的薄膜。典型化學氣相沉積製程通常將基板暴露在一種或多種金屬有機配位體或揮發性聚合物,該些複雜分子通常被稱為前驅物,該氣相的前驅物透過載氣運輸到基板的表面發生化學反應,以產生均勻厚度及質量的沉積層。薄膜的厚度及質量可透過調整混合氣體濃度來實現,故需精確量測前驅物與載氣之莫耳分率。氣體分析裝置,除了可應用於化學氣相沉積製程中的前驅物濃度監測,也可用於製程安全系統以測量其環境周遭的氣體濃度和品質管理的進料檢驗以確認氣源的所需濃度。 The chemical vapor deposition process is widely used to grow various high-purity films such as metals, semiconductors, and dielectrics. A typical chemical vapor deposition process usually exposes the substrate to one or more metal organic ligands or volatile polymers. These complex molecules are often referred to as precursors, and the gas phase precursors are transported to the surface of the substrate through the carrier gas Chemical reactions occur to produce deposits of uniform thickness and quality. The thickness and quality of the film can be achieved by adjusting the concentration of the mixed gas, so it is necessary to accurately measure the molar fraction of the precursor and carrier gas. The gas analysis device can be used not only for monitoring the concentration of precursors in the chemical vapor deposition process, but also for the process safety system to measure the gas concentration around the environment and the feed inspection of quality management to confirm the required concentration of the gas source.
目前商業用的氣體分析裝置的分析原理大多基於光學方法、聲學方法、氣相色譜儀、質譜儀和量熱方法。其中,聲學方法主要又可以細分為飛行時間法(time of flight)和共振頻率法(resonant frequency)。飛行時間法是使用一發送電聲換能器發送一聲音脈衝,並在稍後由另一接收電聲換能器接收該聲音脈衝,透過在固定距離測量該聲音脈衝的飛行時間以計算聲速,該聲速正比於飛行時間除發送電聲換能器與接收電聲換能器之間的距離之關係式(sound speed distance between transmitter and receiver/time of flight)。該聲音脈衝之工作頻率通常於超聲波範圍(>0.1MHz)。使用飛行時間法常見的問題包含迴音、訊號衰減和脈衝形狀失真等。 The analysis principles of current commercial gas analysis devices are mostly based on optical methods, acoustic methods, gas chromatographs, mass spectrometers, and calorimetry methods. Among them, acoustic methods can be subdivided into time of flight and resonance frequency. The time-of-flight method is to use a sending electroacoustic transducer to send a sound pulse, and later to receive the sound pulse by another receiving electroacoustic transducer, by measuring the flight time of the sound pulse at a fixed distance to calculate the speed of sound, The sound speed is proportional to the relationship between the time of flight divided by the distance between the sending electroacoustic transducer and the receiving electroacoustic transducer (sound speed distance between transmitter and receiver/time of flight). The working frequency of the sound pulse is usually in the ultrasonic range (>0.1MHz). Common problems with the time-of-flight method include echo, signal attenuation, and pulse shape distortion.
另一種測量聲速的方法是共振頻率法,當外加聲波頻率與待測物質的固有頻率相近時,待測物質會產生更大聲波振幅且不同週期的駐波,此一現象即為共振。該外加聲波頻率會因不同待測物質的固有頻率而有不同的特定頻率響應值,此特定頻率即為共振頻率。共振頻率法使用於封閉腔室內當中的氣體,外加一特定頻譜範圍的聲音頻率使腔內的氣體的固有頻率產生共振,透過測量氣體的共振頻率以計算聲速,該聲速正比於共振頻率與發送器與接收器之間的距離乘積之關係式(sound speed distance between transmitter and receiver × resonant frequency)。目前市面上使用共振頻率法之氣體分析儀常見的問題有:電聲換能器的固有頻率與氣體的固有頻率相近而互相干擾共振、共振腔室尺寸過小無法提供高品質因子的環境、電聲換能器置於共振腔室之外側而無法承受共振腔室內外的壓力差、共振腔室內材料之聲學阻抗不匹配而導致能量損耗、受流量干擾以致共振腔室內氣體溫度不易控制、共振腔室內壓力影響電聲換能器頻率測量的精度等。 此外,常見的氣體分析裝置通常假定共振腔室內氣體為理想氣體,無測量即時溫度與壓力等參數以修正體積與熱動力學係數,進而修正共振頻率及聲速,並且須依據定期參考氣體所測得的校正數值以計算相對濃度。 Another method for measuring the speed of sound is the resonance frequency method. When the frequency of the applied sound wave is close to the natural frequency of the material to be measured, the material to be tested will generate a standing wave with a larger sound wave amplitude and a different period. This phenomenon is resonance. The applied sound wave frequency will have different specific frequency response values due to the natural frequencies of different substances to be measured, and this specific frequency is the resonance frequency. The resonance frequency method is used for the gas in the closed cavity, plus a specific frequency range of sound frequency to resonate the natural frequency of the gas in the cavity. The sound velocity is calculated by measuring the resonance frequency of the gas, which is proportional to the resonance frequency and the transmitter The relationship between the distance product and the receiver (sound speed distance between transmitter and receiver × resonant frequency). At present, the common problems of gas analyzers using the resonance frequency method on the market are: the natural frequency of the electroacoustic transducer is close to the natural frequency of the gas and interferes with each other. The resonance chamber is too small to provide a high quality factor environment. The transducer is placed outside the resonance chamber and cannot withstand the pressure difference between the inside and outside of the resonance chamber, the acoustic impedance of the materials in the resonance chamber does not match, which results in energy loss, and the flow is disturbed so that the temperature of the gas in the resonance chamber is not easy to control. Pressure affects the accuracy of frequency measurement of electroacoustic transducers. In addition, common gas analysis devices usually assume that the gas in the resonance chamber is an ideal gas, without measuring real-time temperature and pressure parameters to modify the volume and thermodynamic coefficients, and then correct the resonance frequency and sound velocity, and must be measured based on the periodic reference gas To calculate the relative concentration.
綜合上述各種問題,目前使用共振頻率法的分析儀不僅再現性、解析度、與精度低,更受限於可操作工作頻率範圍過窄而只能應用於數十種氣體。 In summary of the above problems, the current analyzer using the resonance frequency method is not only low in reproducibility, resolution, and accuracy, but also limited in the operable operating frequency range is too narrow and can only be applied to dozens of gases.
為了改善以上缺失,本新型之氣體分析裝置,藉由使用聲學阻抗材料下的聲學共振頻率法,並採用較大尺寸的共振腔室(>100cm3),提供 高品質因子的共振腔以提高測量的訊號雜訊比,並且將電聲換能器安裝於腔室內使換能器兩側受到相同的壓力以消除過壓或快速減壓造成的損害,因而容許高流量及高壓力氣體進入腔室內;本新型更藉由壓力與溫度的量測結果來修正電聲換能器對共振頻率的影響,以及修正真實氣體的比熱、維里修正(virial correction)、氣體熱黏滯性修正以及氣體馳豫修正(relaxation correction)對共振頻率及聲速的影響,進而提高頻率量測與氣體濃度分析的穩定性與準確度,可分析量測上萬種氣體的性質與組成成分。 In order to improve the above deficiencies, the new gas analysis device uses a resonance frequency method under acoustic impedance materials, and uses a larger size resonance chamber (>100cm 3 ) to provide a high quality factor resonance chamber to improve measurement Signal-to-noise ratio, and the electroacoustic transducer is installed in the chamber so that both sides of the transducer are subjected to the same pressure to eliminate the damage caused by overpressure or rapid decompression, thus allowing high flow and high pressure gas to enter the chamber The new type uses the measurement results of pressure and temperature to correct the effect of electroacoustic transducer on the resonance frequency, as well as the specific heat of the real gas, virial correction, gas thermal viscosity correction and gas The effect of relaxation correction on the resonance frequency and sound velocity can further improve the stability and accuracy of frequency measurement and gas concentration analysis, and can analyze and measure the properties and composition of tens of thousands of gases.
為達本新型之一目的,本新型提供了一種氣體分析裝置,包括:一控制元件、一氣體分析器、與一測量元件,該控制元件,產生一寬頻訊號,並用於控制該氣體分析器之作動;該氣體分析器主要包含:一封閉腔室,用於包含一氣體,該封閉腔室設置一發送端、一接收端、一氣體入口與一氣體出口,且該封閉腔室內設置有一聲學阻抗材料層;一發送元件,配置於該發送端,用於以第一寬頻訊號激發該氣體之共振能量(頻率);一接收元件,配置於該接收端,用於接收該氣體之共振能量(頻率)轉換第二寬頻訊號;以及一測量元件,依據該第二寬頻訊號計算得該氣體的共振能量(頻率),並依據該封閉腔室的該發送端與該接收端之間的固定距離與該氣體的共振頻率計算該氣體的聲速,進而決定該氣體的性質與組成成分。 To achieve one of the objectives of the new model, the present invention provides a gas analysis device, including: a control element, a gas analyzer, and a measuring element, the control element generates a broadband signal, and is used to control the gas analyzer Acting; the gas analyzer mainly includes: a closed chamber for containing a gas, the closed chamber is provided with a sending end, a receiving end, a gas inlet and a gas outlet, and the closed chamber is provided with an acoustic impedance Material layer; a transmitting element, arranged at the transmitting end, for exciting the resonance energy (frequency) of the gas with a first broadband signal; a receiving element, arranged at the receiving end, for receiving the resonance energy (frequency) of the gas ) Convert the second broadband signal; and a measuring element, calculate the resonance energy (frequency) of the gas according to the second broadband signal, and according to the fixed distance between the transmitting end and the receiving end of the enclosed chamber and the The resonance frequency of a gas calculates the sound velocity of the gas, which in turn determines the nature and composition of the gas.
根據本新型之一特徵,該聲學阻抗材料層係至少一薄膜層施加封閉腔室內壁不連續之轉角處,選自低聲學阻抗係數之材料以避免聲波於轉角處散射造成能量損失和干擾氣體共振頻率,常見低聲學阻抗材料可選自聚醯亞胺(Polyimide)薄膜、含氟高分子(Fluoropolymer)、環氧樹脂(Epoxy)、聚氨酯(Polyurethane)。 According to one of the features of the present invention, the acoustic impedance material layer is a discontinuous corner where at least one thin film layer is applied to the inner wall of the enclosed chamber, and is selected from materials with low acoustic impedance coefficients to avoid energy loss and interference with gas resonance caused by scattering of acoustic waves at the corner Frequency, common low acoustic impedance materials can be selected from polyimide (Polyimide) film, fluoropolymer (Fluoropolymer), epoxy (Epoxy), polyurethane (Polyurethane).
根據本新型之一特徵,該封閉腔室體積大於100cm3以上,以提供高品質因子的共振效果。 According to one feature of the present invention, the volume of the closed chamber is greater than 100 cm 3 or more, so as to provide a resonance effect with a high quality factor.
根據本新型之一特徵,該發送元件與該接收元件設置在該封閉腔室內部。 According to one feature of the present invention, the transmitting element and the receiving element are disposed inside the closed chamber.
根據本新型之一特徵,該發送元件包含一第一寬頻電聲換能器,將一電能訊號轉換成一聲學訊號;該接收元件包含一第二寬頻電聲換能器,將一聲學訊號轉換成一電能訊號。 According to one feature of the present invention, the transmitting element includes a first broadband electro-acoustic transducer to convert an electrical energy signal into an acoustic signal; the receiving element includes a second broadband electro-acoustic transducer to convert an acoustic signal into a Energy signal.
根據本新型之一特徵,該發送元件與該接收元件包含一轉換層,係單層或多層聲學阻抗匹配材料薄膜組成,使寬頻電聲換能器的聲學阻抗匹配於該氣體。該聲學阻抗材料包含金屬薄膜與/或非金屬的薄膜,該金屬薄膜與該寬頻電聲換能器接觸,金屬薄膜材料選自,金、銀、銅、鐵、鈦、鋁、鉻、鎢、錫、鋯、鉬、鎳,且該非金屬的薄膜介於該金屬薄膜與該氣體之間,並具有耐化性,非金屬的薄膜材料係選自聚醯亞胺(Polyimide)、含氟高分子(Fluoropolymer)、環氧樹脂(Epoxy)、聚酯(Polyester)與聚氨酯(Polyurethane)。 According to one feature of the present invention, the transmitting element and the receiving element include a conversion layer, which is composed of a single layer or multiple layers of acoustic impedance matching material films, so that the acoustic impedance of the broadband electroacoustic transducer is matched to the gas. The acoustic impedance material includes a metal thin film and/or a non-metallic thin film, the metal thin film is in contact with the broadband electroacoustic transducer, and the metal thin film material is selected from gold, silver, copper, iron, titanium, aluminum, chromium, tungsten, Tin, zirconium, molybdenum, nickel, and the non-metallic film is between the metal film and the gas, and has chemical resistance, the non-metallic film material is selected from polyimide (Polyimide), fluorine-containing polymer (Fluoropolymer), epoxy (Epoxy), polyester (Polyester) and polyurethane (Polyurethane).
根據本新型之一特徵,該發送元件更包含一保護殼,使該一寬頻電聲換能器與該封閉腔室的聲學阻抗不匹配,而與該氣體的聲學阻抗匹配。 該寬頻換能器設置在該保護殼內部。 According to one feature of the present invention, the transmitting element further includes a protective case, so that the acoustic impedance of the wide-band electroacoustic transducer does not match the closed chamber, but matches the acoustic impedance of the gas. The broadband transducer is arranged inside the protective shell.
根據本新型之一特徵,該寬頻電聲換能器可選自電動式換能器、電磁式換能器、靜電式換能器或壓電式換能器。 According to one feature of the present invention, the broadband electroacoustic transducer can be selected from an electric transducer, an electromagnetic transducer, an electrostatic transducer, or a piezoelectric transducer.
根據本新型之一特徵,該寬頻訊號的頻率範圍為介於0到1MHz,較佳者為介於0-36KHz。 According to one feature of the present invention, the frequency range of the broadband signal is between 0 and 1 MHz, preferably between 0-36 KHz.
根據本新型之一特徵,該氣體分析裝置包含數個加熱元件,用於對該氣體分析裝置加熱,以對該氣體分析器除氣,減少量測時的背景誤差干擾。 According to one feature of the present invention, the gas analysis device includes several heating elements for heating the gas analysis device to degas the gas analyzer, reducing background error interference during measurement.
根據本新型之一特徵,該氣體分析裝置包含數個溫度感測元件,該溫度感測元件設置在封閉腔室內部或氣體進出口管路內,靠近封閉腔室,以精確測量氣體溫度。 According to one feature of the present invention, the gas analysis device includes a plurality of temperature sensing elements. The temperature sensing element is disposed inside the enclosed chamber or in the gas inlet and outlet pipes, close to the enclosed chamber, to accurately measure the gas temperature.
根據本新型之一特徵,該氣體分析裝置包含一壓力感測元件,該壓力感測元件設置在封閉腔室內部或氣體進出口管路內,靠近封閉腔室,以精確測量氣體壓力。 According to one feature of the present invention, the gas analysis device includes a pressure sensing element that is disposed inside the enclosed chamber or in the gas inlet and outlet pipelines, close to the enclosed chamber, to accurately measure the gas pressure.
根據本新型之一特徵,該氣體分析裝置被配置在利用化學氣相沉積製程的一反應器中使用,並且所確定的共振頻率能夠匯出在該反應器中使用的氣體的組成成分。 According to one feature of the present invention, the gas analysis device is configured to be used in a reactor using a chemical vapor deposition process, and the determined resonance frequency can sink the composition of the gas used in the reactor.
根據本新型之一特徵,該測量元件基於數位訊號處理(Digital Signal Processing,DSP)的快速傅里葉變換(Fast Fourier Transform,FFT)模型,將所接收的該氣體的聲學能量轉換成一聲譜,從0到1MHz,以一即時相關分析(Real-time correlation analysis)確定該氣體的該共振頻率。 According to one feature of the new type, the measuring element is based on digital signal processing (Digital The Fast Fourier Transform (FFT) model of Signal Processing (DSP) converts the received acoustic energy of the gas into a sound spectrum, from 0 to 1 MHz, with a real-time correlation analysis (Real-time correlation analysis) ) Determine the resonance frequency of the gas.
根據本新型之一特徵,該測量元件基於一洛倫茲擬合(Lorentzian fitting),用於對應所接收該氣體的聲學能量的該聲譜,以獲得精細的該氣體的該共振頻率解析度。 According to one feature of the new type, the measuring element is based on a Lorentzian fit (Lorentzian fitting), used to correspond to the acoustic spectrum of the acoustic energy of the gas received, to obtain a fine resolution of the resonance frequency of the gas.
為了精確分析氣體的性質與組成成分,該氣體分析器設置一溫度感測器元件以測量氣體真實溫度,並設置一壓力感測元件以測量氣體的真實壓力。透過測量的實際溫度值與實際壓力值修正真實氣體的熱容比以及聲速的聲學維里修正(acoustical virial correction),同時也修正了電聲換能器因氣體壓力波動造成的共振頻率偏移。並透過氣體分析裝置內氣體的熱力學數據,修正了諸如氣體黏滯性與馳豫現象對共振頻率與聲速的影響。 故根據真實溫度與真實壓力的測量可精確計算出氣體的真實聲速與性質,進而準確的分析出該氣體的組成。 In order to accurately analyze the nature and composition of the gas, the gas analyzer is provided with a temperature sensor element to measure the true temperature of the gas, and a pressure sensing element to measure the true pressure of the gas. The actual temperature value and the actual pressure value are used to correct the heat capacity ratio of the real gas and the acoustic virial correction of the speed of sound. At the same time, the resonance frequency deviation of the electroacoustic transducer caused by the gas pressure fluctuation is also corrected. And through the thermodynamic data of the gas in the gas analysis device, the effects such as gas viscosity and relaxation phenomena on the resonance frequency and sound velocity are corrected. Therefore, the true sound velocity and properties of the gas can be accurately calculated according to the measurement of the true temperature and true pressure, and then the composition of the gas can be accurately analyzed.
根據應結合附圖來閱讀以下詳細描述,這些及其它特徵和優點將是顯而易見的。 These and other features and advantages will be apparent from the following detailed description that should be read in conjunction with the accompanying drawings.
10:氣體分析裝置 10: Gas analysis device
90:控制元件 90: control element
100:氣體分析器 100: gas analyzer
110:封閉腔室 110: closed chamber
112:發送端 112: sender
114:接收端 114: receiver
116:氣體入口 116: Gas inlet
118:氣體出口 118: gas outlet
130:發送元件 130: sending element
132:發送元件保護殼 132: Transmitting element protective shell
140:接收元件 140: receiving element
142:接收元件保護殼 142: Receiver component protective shell
150:測量元件 150: measuring element
160:聲學阻抗材料層 160: Acoustic impedance material layer
170:溫度感測元件 170: temperature sensing element
210:第一寬頻換能器 210: the first broadband transducer
212:第一基板層 212: first substrate layer
214:印刷線圈電路 214: Printed coil circuit
230:強磁體 230: Strong magnet
235:強磁場 235: Strong magnetic field
250:第一轉換層 250: the first conversion layer
252:第一金屬薄膜 252: First metal film
254:第一非金屬薄膜 254: The first non-metallic film
310:第二寬頻換能器 310: Second broadband transducer
312:第二基板層 312: Second substrate layer
314:印刷線圈電路 314: Printed coil circuit
330:強磁體 330: Strong magnet
335:強磁場 335: Strong magnetic field
350:第二轉換層 350: second conversion layer
352:第二金屬薄膜 352: Second metal film
354:第二非金屬薄膜 354: Second non-metallic film
雖然本新型可表現為不同形式之實施例,但附圖所示者及於下文中說明者係為本新型之較佳實施例,並請瞭解本新型所揭示者係考量為本新型之一範例,且並非意圖用以將本新型限制於圖示及/或所描述之特定實施例中。 Although the present invention can be expressed in different forms of embodiments, the figures shown and described below are preferred embodiments of the new type, and please understand that the present disclosure is considered as an example of the new type , And is not intended to limit the invention to the specific embodiments shown and/or described.
第1圖 表示根據本新型之氣體分析裝置的實施例結構分解示意圖。 Fig. 1 shows an exploded schematic view of an embodiment of a gas analysis device according to the present invention.
第2圖 表示根據本新型之氣體分析裝置的實施例發送元件130細部示意圖與接收元件140細部示意圖。
FIG. 2 shows a detailed schematic diagram of the transmitting
第3圖 表示根據本新型之氣體分析方法的實施例之流程圖。 Fig. 3 shows a flowchart of an embodiment of the gas analysis method according to the present invention.
第4圖 表示根據本新型之氣體分析方法的步驟7細部流程圖。 Fig. 4 shows a detailed flowchart of step 7 of the gas analysis method according to the present invention.
第5圖 表示根據本新型之氣體分析裝置中所分析到氣體的聲學共振頻率的示意圖,其中(a)未使用本新型之聲學阻抗材料層或高品質因子共振腔室;(b)使用本新型之聲學阻抗材料層或高品質因子共振腔室。 Fig. 5 shows a schematic diagram of the acoustic resonance frequency of the gas analyzed in the gas analysis device of the present invention, where (a) the acoustic impedance material layer or high-quality factor resonance chamber of the present invention is not used; (b) the new model is used The acoustic impedance material layer or high quality factor resonance chamber.
為讓本新型之目的、特徵和優點能更明顯易懂,下文特舉數個較佳實施例,並配合所附圖式,作詳細說明如下。 In order to make the purpose, features and advantages of the present invention more obvious and understandable, a few preferred embodiments are described below in conjunction with the accompanying drawings, which are described in detail below.
請參考第1圖,其係表示根據本新型之氣體分析裝置10的實施例結構分解示意圖。氣體分析裝置10主要包括:控制元件90、氣體分析器100與測量元件150。氣體分析器100主要包含:封閉腔室110、發送元件130與接收元件140。封閉腔室110,用於包含氣體,封閉腔室110設置發送端112、接收端114、氣體入口116與氣體出口118;氣體由氣體入口116
流入而由氣體出口118流出,且封閉腔室110內設置有一聲學阻抗材料層160。控制元件90產生一寬頻訊號,並用於控制氣體分析器100之作動。
發送元件130用於以一寬頻訊號激發該氣體之共振能量(頻率)。接收元件140用於接收該氣體之共振能量(頻率)轉換另一寬頻訊號。測量元件150用於測量在封閉腔室110的發送端112與接收端114之間固定距離內的氣體的共振能量(頻率),以確定氣體的聲速,進而分析氣體的性質與組成成分。
氣體入口116與氣體出口118的位置是可以互換的。需注意的是,雖然,第1圖之氣體分析裝置的結構是以分解的方式呈現,但實施時,氣體分析裝置10的封閉腔室110是以316L或304不鏽鋼製成的密閉的空間。亦即,氣體可以在封閉腔室110內部流動。其中所載氣體也可以是已知成分的混合氣體,因此,亦有可能有兩種以上的氣體同時在封閉腔室110內。
Please refer to FIG. 1, which is an exploded schematic view of the structure of an embodiment of the
封閉腔室110更包含聲學阻抗材料層160,係可設置於封閉腔室110的內壁,具有耐化的效果,並用以調整聲學阻抗。聲學阻抗材料層160係以至少一層薄膜層施加在封閉腔室110不連續之轉角處。當聲學能量遇到轉角處時,部分聲波會產生反射、繞射或散射,產生混附波,造成聲學能量損失。因此,可以在表面不連續處鍍上至少一層聲學阻抗材料層,來吸收反射聲波以避免聲波衍射干擾平衡態的聲學能量傳遞。
The
聲學阻抗材料層160係至少一薄膜層,可採用低聲學阻抗材料,例如,選自聚醯亞胺(Polyimide)薄膜、含氟高分子(Fluoropolymer)、環氧樹脂(Epoxy)、聚酯(Polyester)和聚氨酯(Polyurethane)。聲學阻抗材料層160藉由調整該至少一薄膜層的厚度來調整其聲學阻抗。至少一薄膜層的厚度介於0.0001吋至0.01吋之間。至少一薄膜層亦可藉由在薄膜上製作孔洞來降低薄膜的等效聲學阻抗,可以有效降低傳輸損耗,並降低與氣體的聲學阻抗的匹配差異最小化。
The acoustic
其中,封閉腔室110體積大於100cm3以上,以提供高品質因子的共振效果。請參考第2圖,發送元件130可利用一第一寬頻電聲換能器210,以將一電能訊號轉換成聲學訊號;該接收元件140亦可利用一第二寬頻電聲換能器310,用於將一聲學訊號轉換成電能訊號。寬頻電聲換能器210,310更包含保護殼132,142,使寬頻換能器在保護殼內部而達到保護作用。
Among them, the volume of the
寬頻電聲換能器210,310可選自電動式電聲換能器、電磁式電聲換能器、靜電式電聲換能器、或壓電式電聲換能器。電聲換能器其基本組件包含電系統和機械振動系統。寬頻電聲換能器透過電磁感應或電、磁場變化所造成的形變在電訊號和機械振動之間相互影響。在設計寬頻電聲換能器時,電系統之訊號輸入與輸出電路、放大器...等電阻抗匹配,以及振動系統之材料表面與腔內氣體的聲阻抗匹配皆須同時考量。目前廣泛應用的電動式電聲換能器,其能量傳遞路徑為電能力學能聲能,換能器是利用在恆定強磁場中導體經電磁感應產生運動而帶動導體附近的空氣振動,根據運動導體又型態可以分成移動線圈(moving coil)和平面化帶式狀線圈(planar ribbon coil)等類型。其中移動線圈換能器須連接圓錐形或球頂形隔膜,當線圈通電時,線圈受電磁感應而推動隔膜產生振盪運動而發出聲波,此運動為單一方向;然而平板面化帶狀換能器是將一印刷電路鍍在平坦面化隔膜上,即將線圈和隔膜合併在同一平面,鍍有線圈的隔膜置於強磁場中,當電路通電或接收聲波時,位於強磁場的線圈就會產生洛倫茲力進行正弦波運動,而線圈的疏密性改變而隔膜產生撓曲,隔膜兩側皆可推動氣流傳遞聲波,具有雙向性。相較於傳統移動線圈換能器的圓錐狀隔膜內的氣室共振,使用平面化帶狀換能器的隔膜則無此失效空間的影響,進而影響腔內氣體共振效能。此外平面化帶狀之隔膜質量更輕、反應速度更快、失真更低、耐用性更長,並且隔膜散熱面積大,能夠輕易將多餘廢熱
逸散出去,在整個發聲頻段內阻抗保持定值,提供訊號放大器均勻的電阻抗,使其易於驅動。若在隔膜外加裝柵板,更可以降低聲波相互干擾,提升解析度和準確性。亦可透過增強磁場以增強聲能,達到較佳的共振頻率的解析度與準確性。
The broadband
發送元件130與接收元件140設置在封閉腔室110內部,使發送元件130與接收元件140兩側受到相同的壓力以消除過壓或快速減壓造成的損害及影響。
The transmitting
氣體分析器100更包括一加熱元件172,可對氣體分析器100進行加熱,以避免黏滯性較高的氣體沉積,影響共振頻率的解析度與精確度。加熱元件172更可在置換測量氣體前,對氣體分析器100加熱進行除氣(Degas),以揮發附著在封閉腔室110的非待測量氣體,減小進行測量時的誤差。除了加熱元件172以外,氣體分析器100亦包括數個溫度感測器170,置於該封閉腔室110內,除了配合加熱器用於控制溫度外,更可精確量測氣體的溫度。溫度感測器170可以是熱敏電阻、熱電偶或白金感溫器等,其設置於封閉腔室110內,靠近發送端112或接收端114,以減少對聲學傳輸與共振的影響。較佳地,溫度感測器170是熱敏電阻。
The
氣體分析器100更包括壓力感測元件180,壓力感測元件180設置在封閉腔室110內部或可設置在氣體入口116或氣體出口118,盡可能靠近封閉腔室110,以精確測量氣體壓力。
The
控制元件90包含一般的可程式邏輯控制器(Programmable Logic Controller,PLC),或具有微處理器的數位電子裝置,用於自動化控制氣體分析器100的作動與產生寬頻訊號(第一寬頻訊號),可以執行控制指令與採集相關的氣體分析器100之訊息。
The
測量元件150電性連接於接收元件140,其主要包含一運算元件與一記憶體。運算元件可以是一中央處理器。測量元件150基於數位訊號
處理(Digital Signal Processing,DSP)的快速傅里葉變換(Fast Fourier Transform,FFT)模型,將所接收的氣體之聲學能量轉換成一聲譜,從0到1MHz,並以即時相關分析(Real-time correlation analysis)確定氣體的共振頻率。接收元件140所接收到的氣體的聲學能量之聲譜,從0到1MHz,以洛倫茲擬合(Lorentzian fitting)用於對應所接收氣體的聲學能量的聲譜,以獲得精細的氣體的共振頻率解析度,並由共振頻率確定氣體的聲速。
The measuring
為了精確分析氣體的性質與組成成分,氣體分析器100設置溫度感測器170用以測量氣體真實溫度,並設置壓力感測元件180用以測量氣體的真實壓力。氣體分析裝置10可輸入待測的氣體種類,透過測量氣體的共振頻率、溫度(T)及壓力(P),並通過計算得知發送端112與接收端114之間的固定距離內的氣體的聲速(W)。氣體的性質與組成成分和聲速的關係一般來說可用下列公式描述:
氣體分析裝置10通過測量封閉腔室110的氣體之共振頻率,來確定氣體之聲速。封閉腔室110內部具有兩個電聲換能器,用以激發並檢測封閉腔室110內氣體的聲學共振頻率。
The
氣體分析裝置10可用於化學氣相沉積製程的反應器中,透過氣體分析裝置所確定的共振頻率,能夠匯出在反應器中使用的氣體之聲速,進而得知其組成成分。氣體分析裝置10可以位於化學氣相沉積系統的氣體管路前段、中段或後段,亦即氣體分析裝置10可位於氣體供應系統連接至化學氣相沉積系統的氣體管路中的任何一處。化學氣相沉積系統可以是有機金屬化學氣相沉積系統、電漿增強式化學氣相沉積系統、微波電漿化學氣相沉積系統或低壓化學氣相沉積系統。
The
配合第1圖,請參考第2圖,其係表示根據本新型之氣體分析裝置的實施例發送元件130細部示意圖與接收元件140細部示意圖。在第2圖中,更進一步說明發送元件130與接收元件140的實施方式,其係主要使用電磁聲換能器。氣體分析裝置10中其他的相關組件大致同第1圖說明,在此不再贅述。
With reference to FIG. 1, please refer to FIG. 2, which shows a detailed schematic diagram of the transmitting
發送元件130以0到1MHz(另一實施例為0-36kH或0-50kHz)的寬頻訊號激發該氣體之共振能量(頻率),且發送元件130包含第一寬頻換能器210,其用於將寬頻訊號(第一寬頻訊號)轉換成力學能以激發氣體的寬頻聲學能量(共振能量(頻率))。接收元件140在0到1MHz(另一實施例為0-36kH或0-50kHz)的寬頻範圍接收該氣體之共振能量(頻率),且該接收元件140包含第二寬頻換能器310,其用於將氣體的寬頻聲學能量轉換成另一寬頻訊號(第二寬頻訊號)。
The transmitting
第一寬頻換能器210與第二寬頻換能器310放置在由一強磁鐵(230,330)產生的強磁場(235,335)中,第一寬頻換能器210與第二寬頻換能器310係為電磁相關帶狀電動式電聲換能器(Ribbon Electrodynamic
transducer)。第一寬頻換能器210與第二寬頻換能器310有兩個基本要件:一個是恆定磁場,另一個是電線圈(交流電流感應磁場)。恆定磁場可以是永磁性的強磁體或電磁鐵產生的靜磁場或偏置磁場。
The
第一寬頻換能器210用於將電能訊號轉換成聲學訊號,第一寬頻換能器210係放置在由強磁體230產生的強磁場235中。強磁體230係選自釹磁鐵(Nd2Fe14B)、釤鈷磁鐵(SmCo5)、Sm(Co,Fe,Cu,Zr)7、鋁鎳鈷磁鐵與鍶鐵磁鐵。
The
第一寬頻換能器210主要包含:第一基板層212以及印刷線圈電路214。其中,第一基板層212置於強磁體230產生的恆定磁場235當中,印刷線圈電路214輸入寬頻訊號經電磁感應產生交流磁場。交流磁場與恆定磁場235磁力相互作用下,使第一基板層212振動(力學能),並使附近的氣體振動,進而激發封閉腔室110內的氣體之聲學能量而產生寬頻聲學訊號(共振能量(頻率))。根據應用需要,寬頻訊號(第一寬頻訊號)可以是連續波,尖峰脈衝或調頻訊號等訊號形態,其頻率範圍可在0-1MHz、0-50kHz或0-36kHz。第一基板層212可以是軟性薄膜,具有彈性、韌性及耐化性,並與氣體聲學阻抗匹配。
The
發送元件130更包含第一轉換層250,係多層聲學阻抗匹配材料薄膜組成,耦合於第一寬頻換能器210,使第一寬頻換能器210的聲學阻抗匹配於氣體。聲學阻抗材料薄膜包含金屬薄膜252與/或非金屬的薄膜254,金屬薄膜252與第一寬頻換能器210接觸;金屬薄膜252材料選自,金、銀、銅、鐵、鈦、鋁、鉻、鎢、錫、鋯、鉬、鎳,且非金屬的薄膜254介於金屬薄膜252與氣體之間,並具有耐化性;非金屬的薄膜254材料係選自聚醯亞胺(Polyimide)、含氟高分子(Fluoropolymer)、環氧樹脂(Epoxy)、聚酯(Polyester)與聚氨酯(Polyurethane)。
The transmitting
第二寬頻換能器310,用於將聲學訊號轉換成電能訊號,第二寬頻換能器310係放置在由強磁體330產生的強磁場335中。強磁體330係選自釹磁鐵(Nd2Fe14B)、釤鈷磁鐵(SmCo5)、Sm(Co,Fe,Cu,Zr)7、鋁鎳鈷磁鐵與鍶鐵磁鐵。
The
第二寬頻換能器310係使用強磁場335的電聲換能器,主要包含:第二基板層312以及印刷線圈電路314。其中,第二基板層312置於強磁體330產生的恆定磁場335當中,並接收封閉腔室110內的氣體之寬頻聲學能量(共振能量(頻率))而產生振動,印刷線圈電路314亦與第二基板層312同步振動(力學能),使印刷線圈電路314當中的磁通量產生變化,進而使印刷線圈電路314產生另一寬頻訊號(第二寬頻訊號)。第二基板層312可以是一軟性薄膜,具有彈性、韌性及耐化性,並與氣體聲學阻抗匹配。在此,因為不同的氣體成分與組成具有不同的頻率響應特性,因此,不同的氣體組成,將會對發送元件130所產生的寬頻訊號有不同的頻率響應。換言之,不同的氣體組成將會產生不同的共振能量(頻率)。而接收元件140當中的第二寬頻換能器310所接收並轉換的另一寬頻訊號(第二寬頻訊號),就會忠實呈現此一不同的共振能量(頻率)。本新型即可藉由分析此接收並轉換的第二寬頻訊號來計算得共振能量(頻率)的值。
The
此外,接收元件140更包含第二轉換層350,係多層聲學阻抗匹配材料薄膜組成,耦合於第二寬頻換能器310,使第二寬頻換能器310的聲學阻抗匹配於氣體。聲學阻抗材料薄膜包含金屬薄膜352與/或非金屬的薄膜354,金屬薄膜352與第二寬頻換能器310接觸,金屬薄膜352材料選自,金、銀、銅、鐵、鈦、鋁、鉻、鎢、錫、鋯、鉬、鎳;且非金屬的薄膜354介於金屬薄膜352與氣體之間,並具有耐化性,非金屬的薄膜354材料係選自聚醯亞胺(Polyimide)、含氟高分子(Fluoropolymer)、環氧樹脂(Epoxy)、聚酯(Polyester)與聚氨酯(Polyurethane)。
In addition, the receiving
第一寬頻換能器210與第二寬頻換能器310中磁場的變化主要是印刷線圈電路214、314經電磁效應造成磁通量於恆定磁場235、335中的改變,其磁力相互作用的大小及方向受到恆定磁場235、335的大小、方向的影響。
The changes in the magnetic field in the
在本新型中,第一寬頻換能器210與第二寬頻換能器310是用於使用電磁機制進行非接觸聲學發送和接收的電動式電聲換能器,因此可配合封閉腔室110的尺寸與形狀的設計,並藉由增強磁場強度與電流強度,不需要接觸或耦合,得到較高的聲學共振強度與品質,增強訊造比,減少雜訊的干擾。
In the present invention, the
請參考第3圖,其係表示根據本新型之氣體分析方法的實施例之流程圖,其主要實施第1圖之氣體分析裝置10之方法,因此氣體分析裝置10的組件在此不在贅述。其中,載氣也可以是已知成分的混合氣體,因此,亦有可能有兩種以上的氣體同時在封閉腔室110內。包括以下步驟:
Please refer to FIG. 3, which is a flowchart showing an embodiment of the gas analysis method according to the present invention, which mainly implements the method of the
步驟S101:提供至少一個封閉腔室110,該封閉腔室110設置一發送端112、一接收端114、一氣體入口116與一氣體出口118。
Step S101: Provide at least one
步驟S102:使一氣體流過該封閉腔室110。
Step S102: flowing a gas through the
步驟S103:該控制器90產生一寬頻訊號;寬頻訊號可以為一寬頻類比訊號,頻率範圍可為0-1MHz,0-50kHz或0-36kHz。
Step S103: The
步驟S104:該發送元件130將該寬頻訊號(第一寬頻訊號)轉換成一寬頻力學能量;該寬頻力學能量激發該氣體之共振能量(頻率)。
Step S104: The transmitting
步驟S105:該接收元件140,接收該氣體之共振頻率(能量);並將該共振能量(頻率)轉換成另一寬頻訊號(第二寬頻訊號)。
Step S105: The receiving
步驟S106:該測量元件150將該訊號(第二寬頻訊號)計算得一共振頻率值。
Step S106: The measuring
步驟S107:依據該封閉腔室110的該發送端112與該接收端114之間的固定距離與該氣體的共振頻率確定該氣體的聲速,進而決定該氣體的性質和組成成分。
Step S107: Determine the sound velocity of the gas according to the fixed distance between the sending
第4圖表示根據本新型之氣體分析方法的步驟S107細部流程圖。其中,步驟S107:測量該氣體的共振頻率包含下列步驟:步驟S107-1:基於數位訊號處理(Digital Signal Processing,DSP)的快速傅里葉變換(Fast Fourier Transform,FFT),將所接收的該氣體的共振能量(頻率)所轉換成的另一寬頻訊號轉換為一聲譜,從0到1MHz(另一實施例為0-36kH或0-50kHz)。 FIG. 4 shows a detailed flowchart of step S107 of the gas analysis method according to the present invention. Wherein, step S107: measuring the resonance frequency of the gas includes the following steps: step S107-1: Fast Fourier Transform (FFT) based on digital signal processing (Digital Signal Processing, DSP), the received Another wideband signal converted by the resonance energy (frequency) of the gas is converted into a sound spectrum, from 0 to 1 MHz (another embodiment is 0-36kH or 0-50kHz).
步驟S107-2:以一即時相關分析(Real-time correlation analysis)確定該氣體的該共振頻率。 Step S107-2: Real-time correlation analysis is used to determine the resonance frequency of the gas.
步驟S107-3:基於一洛倫茲擬合(Lorentzian fitting),用於對應所接收該氣體的該聲譜,以獲得精細的該氣體的該共振頻率解析度。 Step S107-3: Based on a Lorentzian fitting, corresponding to the sound spectrum of the received gas, to obtain a fine resolution of the resonance frequency of the gas.
氣體分析裝置10通過測量封閉腔室110的氣體之共振頻率,來確定氣體之聲音的速度(W)。氣體分析裝置10的兩個電聲換能器,其中第一個電聲換能器位於封閉腔室110內一端接收寬頻訊號(第一寬頻訊號),並將寬頻訊號以力學能(振動)的方式激發氣體的共振能量(頻率),其以聲學訊號的形態展現;第二個電聲換能器位於封閉腔室110內另一端,測量氣體的聲學訊號,並以力學能(振動)轉電能的方式轉換為另一寬頻訊號(第二寬頻訊號)。氣體分析裝置10中氣體分析器100經由:(1)測量高品質因子之封閉腔室110內的聲學之共振頻率,並且,(2)通過預先掌握的封閉腔室110尺寸,將共振頻率轉換為聲速。
The
為了測量氣體於封閉腔室110內的共振頻率,氣體分析器100使用基於數位訊號處理(Digital Signal Processing,DSP)的快速傅里葉變換(Fast Fourier Transform,FFT)模型,將所接收到經由該氣體將第一寬頻訊號
所轉換成的第二寬頻訊號轉換為聲譜,從0到1MHz(另一實施例為0-36kH或0-50kHz),再以即時相關分析(Real-time correlation analysis)確定氣體的共振頻率,所以裝置能夠自動跟踪氣體的性質及組成變化,而無需切換測量與分析模式。並以洛倫茲擬合(Lorentzian fitting)用於處理聲譜數據,以提高頻率解析度的精密度,共振頻率測量可以達到百萬分一之解析度。接著,由共振頻率法與腔體的尺寸,即可由共振頻率確定氣體的聲速,可以非常準確地測定氣體的性質與組成成分。氣體分析裝置10在聲速測量的解析度達千分之一,其穩定度5ppm;溫度測量的解析度達千分之一,其穩定度0.005℃;濃度測量的解析度達百萬分之一,其穩定度10ppm。氣體分析裝置10用熱動力學參數計算出流動氣體混合物的絕對濃度,所以不需校正就可以有很高的準確性。
In order to measure the resonance frequency of the gas in the
第5圖是氣體分析儀中所分析到充滿氣體的聲學共振頻率的示意圖,其中(a)未使用本新型之聲學阻抗材料層或高品質共振腔室;(b)使用本新型之聲學阻抗材料層或高品質共振腔室。雖然不同的氣體有不同的共振頻率,但共振頻率與噪音的振幅比仍是相同的,並且是由封閉腔室110的幾何形狀,特別是發送端112與接收端114之距離決定。例如:於封閉腔體室110的氣體入口116或氣體出口118不連續處所產生的寄生(spurious)共振峰值可因聲學阻抗材料的吸收或高品質因子封閉腔室110而被消除。
Figure 5 is a schematic diagram of the gas-filled acoustic resonance frequency analyzed in the gas analyzer, where (a) the acoustic impedance material layer or high-quality resonance chamber of the new type is not used; (b) the acoustic impedance material of the new type is used Layer or high-quality resonance chamber. Although different gases have different resonant frequencies, the amplitude ratio of the resonant frequency to noise is still the same, and is determined by the geometry of the
很明顯的,未使用本新型之聲學阻抗材料層或高品質因子封閉腔室,其寄生的共振頻率的峰值較多;而使用本新型之聲學阻抗材料層或高品質因子共振腔室,由於聲學阻抗材料的吸收或高品質因子封閉腔室可消除無法與洛倫茲圖形擬合的寄生峰值,故根據本新型,使用聲學阻抗材料層或大體積共振腔室之氣體分析儀能得到較高的訊號雜訊比。 Obviously, if the acoustic impedance material layer of this new type or high-quality-factor-enclosed chamber is used, the parasitic resonance frequency peaks are high; while using the acoustic impedance material layer of this new-type or high-quality factor resonance chamber, due to acoustics The absorption of the impedance material or the closed chamber with a high quality factor can eliminate parasitic peaks that cannot be fitted with the Lorentz pattern. Therefore, according to the present invention, a gas analyzer using an acoustic impedance material layer or a large volume resonance chamber can obtain a higher Signal to noise ratio.
因此,根據本新型之氣體分析裝置與氣體分析方法,能改進增強了共振頻率以及所得到的聲速的穩定性和靈敏性。 Therefore, according to the novel gas analysis device and gas analysis method, the stability and sensitivity of the resonance frequency and the resulting sound velocity can be improved and enhanced.
雖然本新型已以前述較佳實施例揭示,然其並非用以限定本新型,任何熟習此技藝者,在不脫離本新型之精神和範圍內,當可作各種之更動與修改。如上述的解釋,都可以作各型式的修正與變化,而不會破壞此新型的精神。因此本新型之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in the foregoing preferred embodiments, it is not intended to limit the present invention. Anyone who is familiar with this art can make various changes and modifications without departing from the spirit and scope of the present invention. As explained above, all types of corrections and changes can be made without destroying the spirit of this new type. Therefore, the scope of protection of this new model shall be subject to the scope defined in the attached patent application.
10:氣體分析裝置 10: Gas analysis device
90:控制元件 90: control element
100:氣體分析器 100: gas analyzer
110:封閉腔室 110: closed chamber
112:發送端 112: sender
114:接收端 114: receiver
116:氣體入口 116: Gas inlet
118:氣體出口 118: gas outlet
130:發送元件 130: sending element
132:發送元件保護殼 132: Transmitting element protective shell
140:接收元件 140: receiving element
142:接收元件保護殼 142: Receiver component protective shell
150:測量元件 150: measuring element
160:聲學阻抗材料層 160: Acoustic impedance material layer
170:溫度感測元件 170: temperature sensing element
172:加熱元件 172: Heating element
180:壓力感測元件 180: pressure sensing element
210:第一寬頻換能器 210: the first broadband transducer
310:第二寬頻換能器 310: Second broadband transducer
Claims (17)
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