TWM562394U - A sampling probe and sampling device thereof - Google Patents

Abstract

A sampling device comprises a grip, a sampling probe and a case. The sampling probe is fixed on the grip. The case is disposed on the grip in a movable manner to cover the sampling probe. The sampling probe comprises a probe body, a tube and a spring. The tube sleeves on the probe body. The spring is disposed in the tube and connects to the probe body. The probe body connects to the tube in a collapsible manner through the spring.

Description

Sampling probe and sampling device thereof

This creation relates to a sampling probe and its sampling device, and more particularly to a retractable sampling probe and its sampling device.

Sampling analysis is carried out by feeding the sample intact into the laboratory during the routine inspection of food safety, environment and drugs. However, this method not only takes time and labor, but if the sampled item is too large, it will increase the difficulty and cost of transportation. As technology advances, probes can be used to sample samples. A probe is an item used to collect substances on a liquid or solid surface for subsequent analysis in the laboratory.

Although the aforementioned probe can achieve the function of sampling, the conventional sampler has no structure for protecting the probe, and it is easy to touch the user's hand before and after sampling, so that the sample is contaminated by the outside and affects the accuracy of the test result. In addition, the conventional sampler will be discarded after use, which not only causes resource consumption, but also affects the cost and environmental protection problems, which is not ideal. Further, when detecting a test object (for example, a fruit and vegetable) in which the epidermis is easily damaged, the tester does not easily grasp the force of using the probe. When the force is too strong, it is easy to damage the appearance of the test object; if the force is too small, the sample may be undersampled.

Therefore, it is desirable to provide a probe that can be easily used to solve the above problems.

In view of this, it is necessary to provide an easy-to-use probe to protect the sample from contamination and improve the quality and efficiency of sampling.

The present application provides a sampling probe for collecting a sample comprising a probe body, a cannula, and a spring. The sleeve is sleeved on the probe body. The spring is disposed in the sleeve and is coupled to the probe body. The probe body is connected to the sleeve in a telescopic manner by the aforementioned spring.

Preferably, the probe body comprises a sampling end, a connecting rod and a buckle end. The aforementioned sampling end is used to contact the aforementioned sample. The connecting rod is connected to the sampling end. The aforementioned snap end is connected to the connecting rod. The aforementioned snap end is coupled to the aforementioned spring.

Preferably, the sleeve includes an open end, an end, and a latch portion corresponding to the latch end of the probe body. The spring has a movable end and a fixed end. The movable end of the spring is connected to the latching end of the probe body. The fixed end of the spring is fixed to the end of the sleeve. The spring is disposed between the latch portion and the end of the sleeve. The buckle end moves between the latch portion and the end of the sleeve.

Preferably, the material of the probe body is a beryllium copper alloy.

The creation also provides a sampling device for collecting a sample comprising a grip, a sampling probe and a protective sleeve. The aforementioned sampling probe is fixed to the aforementioned grip. The protective sleeve is movably sleeved on the grip for accommodating the sampling probe. The sampling probe includes a probe body, a sleeve, and a spring. The sleeve is sleeved on the probe body. The spring is disposed in the sleeve and is coupled to the probe body. The probe body is connected to the sleeve in a telescopic manner by the aforementioned spring.

Preferably, the sampling device further includes an upper cover for covering the protective cover.

Preferably, the aforementioned grip has a chute. The protective cover has a protruding structure corresponding to the aforementioned chute. The aforementioned protruding structure slides along the aforementioned chute.

In summary, the sampling probe of the present invention and its sampling device utilize a spring structure inside the probe to absorb the force of the hand sampled by the tester during sampling to avoid damage to the sample. Moreover, the sampling device of the present invention protects the sampling probe with a protective cover to prevent environmental pollution. In addition, the slide rail structure between the protective sleeve and the sleeve moves the protective sleeve up and down to receive or expose the sampling probe, so as to prevent the tester's hand from directly contacting the sampling probe. Therefore, the sampling probe of the present invention and the sampling device thereof have the advantages of being simple, convenient and easy to operate, and can protect the sample from external pollution and improve the quality and efficiency of sampling.

The creation will be specifically described below with reference to the accompanying drawings.

Please refer to FIG. 1A to FIG. 1C. FIG. 1A is a schematic diagram of the sampling probe of the present invention. 1B and 1C are schematic cross-sectional views of the sampling probe of the present invention. As shown in FIG. 1A to FIG. 1C, the sampling probe 100 of the present invention comprises a probe body 110, a sleeve 120 and a spring 130. The sleeve 120 is sleeved on the probe body 110. The spring 130 is disposed in the sleeve 120 and is coupled to the probe body 110. The probe body 110 is connected to the sleeve 120 in a telescopic manner by the aforementioned spring 130. The probe body 110 includes a sampling end 111, a connecting rod 112 and a latching end 113. The aforementioned sampling end 111 is used to contact the aforementioned sample. The connecting rod 112 is connected to the sampling end 111. The aforementioned latching end 113 is coupled to the aforementioned connecting rod 112. The buckle end 113 is connected to the spring 130. The sleeve includes an open end 121, a distal end 122 and a latching portion 123 corresponding to the latching end 113 of the probe body 110. The aforementioned spring 130 has a movable end 131 and a fixed end 132. The movable end 131 of the spring 130 is coupled to the latching end 113 of the probe body 110. The fixed end 132 of the spring 130 is fixed to the end 122 of the sleeve 120. The spring 130 is disposed between the latch portion 123 and the end 122 of the sleeve 120. The latching end 113 moves between the latching portion 123 and the end 122 of the sleeve 120. Specifically, the latching end 113 of the probe body 110 and a portion of the connecting rod 112 are sleeved in the sleeve 120. The sampling end 111 of the probe body 110 and the other portion of the connecting rod 112 extend beyond the open end 121. Also, the aforementioned snap end 113 is coupled to the movable end 131 of the aforementioned spring 130. Therefore, when the sampling end 111 contacts the surface of the sample, the probe body 110 may be in a telescopic manner in contact with the surface of the sample according to the elastic force of the spring 130 (see FIG. 1C). The display spring is compressed by force). The latching portion 123 of the sleeve can catch the latching end of the probe body 110 to prevent the probe body 110 from being disengaged from the sleeve 120. In this way, it is possible to prevent the examiner from damaging the surface of the sample due to excessive application of force, while making it easier for the examiner to manipulate the aforementioned sampling probe 100.

The material of the probe body 110 may be a metal having good thermal conductivity (for example, a material such as stainless steel, nickel chrome, or copper). The material of the sleeve 120 is also made of metal. Preferably, the probe body 110 is made of beryllium copper alloy, which has good thermal and mechanical properties, and has good corrosion resistance and processing properties. The probe body 110 can increase the toughness and hardness through heat treatment, and is designed into different shapes according to the requirements of sample collection, as a medium for collecting samples. The foregoing samples may be solids including, but not limited to, large area solids, granules, and powdered solids. The aforementioned sample may also be a liquid, such as a liquid in a general liquid or a viscous state. The aforementioned spring 130 may be a spring that requires different elastic coefficients for sample collection, so that the force of the hand sampled by the inspector is absorbed during sampling (the spring is compressed by the force as shown in FIG. 1C) to avoid breaking the sample. After the sampling is completed, the collected sample can be separated from the sampling end 111 by high-temperature heating, and qualitative or quantitative detection analysis can be performed. Alternatively, the collected sample may be removed from the sampling end 111 using a solvent for subsequent analysis. When the collected sample is separated from the aforementioned sampling end 111, the aforementioned sampling probe 100 can be cleaned for reuse. Therefore, the sampling probe 100 of the present invention has the advantages of being simple, convenient, and easy to operate, and adopts a metal material for re-use, reduces the cost of sampling, and has the concept of a circular economy.

Please refer to FIG. 2A to FIG. 2E , which are schematic diagrams of different embodiments of the sampling end of the sampling probe of the present invention. As shown in FIG. 2A to FIG. 2E, the sampling end 111 can be designed into different shapes according to the requirements of different samples. As shown in FIG. 2A, the sampling end 111 has a circular arc contact surface, which is suitable for collecting samples whose surface is easily damaged, such as pesticide residues on the surface of fruits and vegetables. As shown in FIG. 2B and FIG. 2C, the sampling end 111 has a tapered contact surface. The sampling end 111 of FIG. 2B has a conical contact surface; the sampling end of FIG. 2C has a slanted contact surface. The sampling end shown in Figures 2B and 2C is suitable for collecting samples having a hard surface. As shown in FIG. 2D and FIG. 2E, the aforementioned sampling end 111 has a recess 111a for collecting the aforementioned sample. The groove of the sampling end 111a can collect a certain volume or weight of the sample, which is convenient for subsequent quantitative analysis of the sample. The design of the sampling end shown in FIGS. 2A to 2E is merely an example, and the design of the sampling end of the sampling probe of the present invention is not limited to the one shown in FIGS. 2A to 2E.

Please refer to FIG. 3A and FIG. 3B , which are schematic diagrams of the sampling device of the present invention. FIG. 3A is a schematic diagram showing the storage state of the sampling probe of the sampling device; FIG. 3B is a schematic diagram showing the use state of the sampling probe of the sampling device. As shown in FIG. 3A and FIG. 3B, the sampling device 10 of the present invention comprises a grip 400, a sampling probe 100 and a protective cover 300. The sampling probe 100 described above is fixed to the aforementioned grip 400. One end of the aforementioned grip 400 is a hand held position of the inspector, and the other end is used to fix the aforementioned sampling probe 100. The protective cover 300 is movably sleeved on the grip 400 for accommodating the sampling probe 100. The structure and the usage of the sampling probe 100 are the same as those of the above-mentioned FIG. 1A to FIG. 2E, and are not described herein. The sampling device 10 further includes an upper cover 200 for covering the protective cover 300. When the sampling probe 100 is housed in the protective cover, the upper cover 200 is automatically covered on the protective cover 300. The handle 400, the upper cover 200 and the protective cover 300 may be made of a plastic material. Preferably, the protective cover 300 can be made of a transparent plastic material to facilitate observation of the collected sample.

Please refer to FIG. 4A and FIG. 4B again, which are schematic diagrams of the aforementioned grip 400 and the foregoing protective cover 300. As shown in FIGS. 4A and 4B, the aforementioned grip 400 has a chute 410. The protective cover 300 has a protruding structure 310 corresponding to the aforementioned sliding slot 410. The protruding structure 310 is located on the inner surface of the protective cover 300 and slides along the aforementioned sliding slot 410. In this way, the protective cover 300 can be sleeved on the handle 400 and slide up and down. When sampling is required, the upper cover 200 is first removed, and the protective cover 300 is slid to the bottom of the grip 400 to expose the sampling probe 100, and the sampling probe 100 is brought into contact with the surface of the sample. After the sampling is completed, the protective cover 400 can be slid upward, so that the protective cover can cover the sampling probe 100 and cover the upper cover 200. Therefore, the sampling device of the present invention protects the sampling probe with a protective cover to prevent environmental pollution. Moreover, the slide rail structure between the protective cover and the sleeve moves the protective sleeve up and down to receive or expose the sampling probe, so as to avoid direct contact of the tester's hand with the sampling probe.

In summary, the sampling probe of the present invention and its sampling device utilize a spring structure inside the probe to absorb the force of the hand sampled by the tester during sampling to avoid damage to the sample. Moreover, the sampling device of the present invention protects the sampling probe with a protective cover to prevent environmental pollution. In addition, the slide rail structure between the protective sleeve and the sleeve moves the protective sleeve up and down to receive or expose the sampling probe, so as to prevent the tester's hand from directly contacting the sampling probe. Therefore, the sampling probe of the present invention and the sampling device thereof have the advantages of being simple, convenient and easy to operate, and can protect the sample from external pollution and improve the quality and efficiency of sampling.

It should be noted that the above-described embodiments are merely preferred embodiments of the present invention, and those skilled in the art may make other changes within the spirit of the present invention. These changes, based on the spirit of this creation, should be included within the scope of this creation.

100‧‧‧Sampling probe
110‧‧‧ probe body
111‧‧‧Sampling end
111a‧‧‧ Groove
112‧‧‧ Connecting rod
113‧‧‧ buckle end
120‧‧‧ casing
121‧‧‧Open end
End of 122‧‧‧
123‧‧‧Card Department
130‧‧‧ Spring
131‧‧‧ active end
132‧‧‧ fixed end
200‧‧‧Upper cover
300‧‧‧ protective cover
310‧‧‧ protruding structure
400‧‧‧ grip
410‧‧ ‧ chute

FIG. 1A is a schematic diagram of a sampling probe of the present invention; FIG. 1B and FIG. 1C are schematic cross-sectional views of the sampling probe of the present invention.

2A-2E are schematic views of different embodiments of the sampling end of the sampling probe of the present invention.

3A and 3B are schematic views of the sampling device of the present invention.

4A and 4B are schematic views of the grip and the protective sleeve of the sampling device of the present invention.

Claims (19)

a sampling probe for collecting a sample, comprising: a probe body; a sleeve sleeved on the probe body; and a spring disposed in the sleeve and connected to the probe body; The needle body is telescopically coupled to the sleeve by the aforementioned spring. The sampling probe of claim 1, wherein the probe body comprises: a sampling end for contacting the sample; a connecting rod connected to the sampling end; and a buckle end, connecting The connecting rod; the buckle end is connected to the spring. The sampling probe of claim 2, wherein the sleeve includes an open end, an end, and a snap portion corresponding to the snap end of the probe body; the spring has a movable end and a a fixed end; the movable end of the spring is connected to the latching end of the probe body; the fixed end of the spring is fixed to the end of the sleeve; the spring is disposed between the latch portion and the end of the sleeve; the card The buckle ends between the latch portion and the end of the sleeve. The sampling probe of claim 2, wherein the sampling end has a circular arc contact surface. The sampling probe of claim 2, wherein the sampling end has a tapered contact surface. The sampling probe of claim 2, wherein the sampling end has a groove for collecting the sample. The sampling probe according to claim 1, wherein the probe body is made of a metal. The sampling probe according to claim 7, wherein the probe body is made of beryllium copper alloy. The sampling probe according to claim 1, wherein the sleeve is made of metal. A sampling device for collecting a sample, comprising: a grip; a sampling probe fixed to the handle, comprising: a probe body; a sleeve sleeved on the probe body; and a spring Provided in the sleeve and connected to the probe body; the probe body is telescopically connected to the sleeve by the spring; and a protective sleeve is movably sleeved on the handle. It is used to store the aforementioned sampling probe. The sampling device of claim 10, further comprising an upper cover for covering the protective cover. The sampling device according to claim 11, wherein when the probe body is housed in the protective cover, the upper cover is automatically covered on the protective cover. The sampling device of claim 10, wherein the probe body comprises: a sampling end for contacting the sample; a connecting rod connected to the sampling end; and a snap end connected to The connecting rod; the buckle end is connected to the spring. The sampling device of claim 13, wherein the sleeve includes an open end, an end, and a snap portion corresponding to the snap end of the probe body; the spring has a movable end and a fixed end The movable end of the spring is connected to the latching end of the probe body; the fixed end of the spring is fixed to the end of the sleeve; the spring is disposed between the latch portion and the end of the sleeve; the buckle The end moves between the latch portion and the end of the sleeve. The sampling device of claim 13, wherein the sampling end has a circular arc contact surface. The sampling device of claim 13, wherein the sampling end has a tapered contact surface. The sampling device of claim 13, wherein the sampling end has a groove for collecting the sample. The sampling device according to claim 10, wherein the probe body is made of beryllium copper alloy. The sampling device of claim 10, wherein the grip has a sliding groove; the protective sleeve has a protruding structure corresponding to the sliding groove; and the protruding structure slides along the sliding groove.