TWM514648U - Cleaning equipment - Google Patents

Cleaning equipment Download PDF

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Publication number
TWM514648U
TWM514648U TW104209255U TW104209255U TWM514648U TW M514648 U TWM514648 U TW M514648U TW 104209255 U TW104209255 U TW 104209255U TW 104209255 U TW104209255 U TW 104209255U TW M514648 U TWM514648 U TW M514648U
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TW
Taiwan
Prior art keywords
quartz tube
open end
carrier
cleaning
cleaning device
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Application number
TW104209255U
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Chinese (zh)
Inventor
Yi-Chao Weng
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Song Jaan Technology Co Ltd
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Application filed by Song Jaan Technology Co Ltd filed Critical Song Jaan Technology Co Ltd
Priority to TW104209255U priority Critical patent/TWM514648U/en
Publication of TWM514648U publication Critical patent/TWM514648U/en

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Abstract

A cleaning equipment is adapted to clean the quartz tube. The quartz tube has a hollow chamber and a lower opening, an upper opening connected therewith. The cleaning equipment includes a carrier, an upper connecting assembly and at least one liquid filling head. The carrier is configured to sustain the quartz tube. The lower opening side surface of the quartz tube faces a carrying surface of the carrier, so as to seal between the quartz tube and the carrier in a sealing area of the carrier. The upper connecting assembly is configured to fit and fix the upper opening of the quartz tube, so as to connect the upper connecting opening. The liquid filling head is disposed in the sealing area for instilling the cleaning solution toward the hollow chamber. The cleaning solution flows out after being fully filled in the hollow chamber.

Description

清洗設備Cleaning equipment

本新型創作是有關於一種清洗設備,且特別是有關於一種石英管的清洗設備。The novel creation is related to a cleaning device, and in particular to a cleaning device for a quartz tube.

在目前商業化的半導體製程中,多晶矽的沈積,多是以化學氣相沈積的方式,比如藉著將矽甲烷經加熱後解離的方式,來沈積所需要的多晶矽層。化學氣相沈積的爐管式反應器,是一種熱壁式的反應器,爐管本身是以回火後的石英管所構成。此外,環繞石英管外圍的是一組用來對爐管加熱的加熱器。由於石英爐管加熱時,爐管的溫度與晶片所承受的溫度相當,因此,反應的生成物除了會沈積在晶片上,也會附著在石英管的內表面。這些覆蓋在石英管的沉積物若附著不良,往往會成為製程中微粒的來源,而影響晶片的良率。所以定期清洗內、外管,是避免石英管內表面累積過多沉積物的方法。In the current commercial semiconductor process, the deposition of polycrystalline germanium is mostly by chemical vapor deposition, for example, by dissolving the germanium methane after heating to deposit the desired polycrystalline germanium layer. The chemical vapor deposition furnace tube reactor is a hot wall type reactor, and the furnace tube itself is composed of a tempered quartz tube. In addition, around the periphery of the quartz tube is a set of heaters for heating the tube. Since the temperature of the furnace tube is equal to the temperature of the wafer when the quartz tube is heated, the reaction product is deposited on the inner surface of the quartz tube in addition to being deposited on the wafer. If these deposits on the quartz tube are poorly attached, they tend to be the source of the particles in the process and affect the yield of the wafer. Therefore, cleaning the inner and outer tubes regularly is a way to avoid excessive accumulation of deposits on the inner surface of the quartz tube.

目前的石英管尚無標準化的自動化清洗方式,仍需仰賴人工將石英管浸入清洗液中,並需將石英管浸置於清洗液中一段時間。然而,一般的清洗液多由強酸或強鹼的化學溶劑所組成。 因此,清洗液在去除石英管的表面附著物的同時,亦會同時侵蝕石英管的壁面。也因此,當將石英管浸入清洗液時,石英管的內外壁面皆會同時受到清洗液的侵蝕,而減損石英管的壽命。此外,直接將石英管浸入清洗液清洗,可能會造成石英管表面清洗品質不均勻的問題。再者,以人工清洗石英管,在石英管來回拿取的過程中,將增加清洗的作業時間。同時,清洗作業人員長期暴露在強酸或強鹼的化學溶劑環境下,亦會增加作業上的危險性。At present, there is no standardized automatic cleaning method for the quartz tube, and it is still necessary to manually immerse the quartz tube in the cleaning liquid, and the quartz tube needs to be immersed in the cleaning liquid for a certain period of time. However, the general cleaning solution is mostly composed of a strong acid or a strong base chemical solvent. Therefore, the cleaning liquid simultaneously corrodes the wall surface of the quartz tube while removing the surface adhering matter of the quartz tube. Therefore, when the quartz tube is immersed in the cleaning liquid, the inner and outer wall surfaces of the quartz tube are simultaneously corroded by the cleaning liquid, which detracts from the life of the quartz tube. In addition, directly immersing the quartz tube in the cleaning solution may cause the problem of uneven cleaning quality of the quartz tube surface. Furthermore, the quartz tube is manually cleaned, and the cleaning operation time is increased during the process of taking the quartz tube back and forth. At the same time, the long-term exposure of cleaning workers to chemical solvents such as strong acids or bases increases the risk of work.

本新型創作提供一種清洗設備,其可對石英管的內部進行密封清洗,以提供均勻的清洗品質。The novel creation provides a cleaning apparatus that seals the interior of a quartz tube to provide uniform cleaning quality.

本新型創作提供一種清洗設備,其可避免石英管的耗損,以增加石英管的使用壽命。The novel creation provides a cleaning device that avoids the loss of the quartz tube to increase the service life of the quartz tube.

本新型創作提供一種清洗設備,其可縮短石英管的清洗時間,並且增加石英管的清洗效率。The novel creation provides a cleaning device that can shorten the cleaning time of the quartz tube and increase the cleaning efficiency of the quartz tube.

本新型創作提供一種清洗設備,其可全程以自動化作業,減少人力的使用與成本。The novel creation provides a cleaning device that can automate operations throughout the entire process, reducing manpower usage and cost.

本新型創作的清洗設備適於清洗石英管。石英管具有中空腔室以及連接中空腔室的底部開口端以及頂部開口端。清洗設備包括承載座、頂部連接總成以及至少一注液頭。承載座用來承載石英管。石英管的底部開口端朝向承載座的承載面,且在承載面的密封區域與承載座之間形成密封。頂部連接總成用來對準並 且固定石英管的頂部開口端,以連通頂部開口端與第一管路。注液頭配置於密封區域內,用以朝中空腔室內注入清洗液。清洗液充滿中空腔室後適於經由頂部開口端與第一管路輸出。The cleaning device created by the present invention is suitable for cleaning quartz tubes. The quartz tube has a hollow chamber and a bottom open end connecting the hollow chamber and a top open end. The cleaning device includes a carrier, a top connection assembly, and at least one liquid injection head. The carrier is used to carry a quartz tube. The open end of the bottom of the quartz tube faces the bearing surface of the carrier and forms a seal between the sealing area of the bearing surface and the carrier. The top connection assembly is used to align and And fixing the top open end of the quartz tube to connect the top open end to the first line. The liquid injection head is disposed in the sealing area for injecting the cleaning liquid into the hollow chamber. After the cleaning fluid fills the hollow chamber, it is adapted to be output to the first conduit via the top open end.

在本新型創作的一實施例中,上述的中空腔室具有垂直於承載面的中心軸。注液頭的出液方向偏離中心軸,並且出液方向與承載面夾小於90度的傾角。In an embodiment of the novel creation, the hollow chamber has a central axis that is perpendicular to the bearing surface. The liquid discharge direction of the liquid injection head is offset from the central axis, and the liquid discharge direction is inclined by less than 90 degrees with the bearing surface.

在本新型創作的一實施例中,上述的承載座包括密封環,密封環設置於承載面上,並且密封環承靠於底部開口端與承載面之間。In an embodiment of the present invention, the above-mentioned carrier includes a sealing ring, the sealing ring is disposed on the bearing surface, and the sealing ring is supported between the open end of the bottom and the bearing surface.

在本新型創作的一實施例中,上述的清洗設備還包括壓緊裝置,其設置於承載座上方。石英管的底部開口端具有向外水平延伸的側裙部。壓緊裝置適於壓著側裙部的頂部,以使底部開口端與承載座之間形成密封。In an embodiment of the present invention, the cleaning apparatus further includes a pressing device disposed above the carrier. The bottom open end of the quartz tube has a side skirt that extends outwardly horizontally. The pressing device is adapted to press against the top of the side skirt to form a seal between the open end of the bottom and the carrier.

在本新型創作的一實施例中,上述的清洗設備還包括罩體,其配置於密封區域內。罩體被設置為阻擋在注液頭的出液方向上。In an embodiment of the present invention, the cleaning apparatus further includes a cover disposed in the sealed area. The cover is arranged to block in the direction of discharge of the liquid injection head.

在本新型創作的一實施例中,上述的承載座還包括多個導引調節裝置,其配置於承載座上方,並且位於密封區域外,用以導引並調整石英管相對於承載座的位置。In an embodiment of the present invention, the carrier further includes a plurality of guiding adjustment devices disposed above the carrier and located outside the sealing region for guiding and adjusting the position of the quartz tube relative to the carrier .

在本新型創作的一實施例中,上述的清洗設備還包括緩衝槽以及第二管路。第一管路連接於頂部開口端與緩衝槽之間,並且第二管路連接於至少一注液頭與緩衝槽之間。In an embodiment of the present invention, the cleaning apparatus further includes a buffer tank and a second pipeline. The first conduit is connected between the top open end and the buffer tank, and the second conduit is connected between the at least one liquid injection head and the buffer tank.

在本新型創作的一實施例中,上述的頂部連接總成包括接口、多個定位夾爪以及伸縮對準機構。接口用來連接頂部開口端。定為夾爪設置於接口周圍,用以扣持頂部開口端,以固定頂部開口端相對於接口的位置。伸縮對準機構連接於接口與清洗設備的固定端之間,用以在頂部開口端接觸接口時,對接口提供沿接觸方向的緩衝位移。In an embodiment of the novel creation, the top connection assembly includes an interface, a plurality of positioning jaws, and a telescopic alignment mechanism. The interface is used to connect the top open end. A jaw is disposed around the interface for holding the top open end to fix the position of the top open end relative to the interface. The telescopic alignment mechanism is coupled between the interface and the fixed end of the cleaning device to provide a buffer displacement in the contact direction when the top open end contacts the interface.

在本新型創作的一實施例中,上述的清洗設備還包括自動推車,用以在承載座上取放石英管。In an embodiment of the present invention, the cleaning apparatus further includes an automatic cart for picking up and placing a quartz tube on the carrier.

為讓本新型創作的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the present invention will become more apparent and understood from the following description.

50‧‧‧清洗液50‧‧‧ cleaning solution

100‧‧‧清洗設備100‧‧‧cleaning equipment

110‧‧‧承載座110‧‧‧ bearing seat

112‧‧‧承載面112‧‧‧ bearing surface

113‧‧‧密封區域113‧‧‧ Sealed area

114‧‧‧排液孔114‧‧‧Drain hole

115‧‧‧密封環115‧‧‧Seal ring

117‧‧‧壓緊裝置117‧‧‧Holding device

118‧‧‧噴液環118‧‧‧ spray ring

118a、156a‧‧‧歧管118a, 156a‧‧‧Management

130‧‧‧注液頭130‧‧‧Injection head

135‧‧‧罩體135‧‧‧ Cover

135a‧‧‧出液孔135a‧‧‧ liquid hole

140‧‧‧噴氣頭140‧‧‧Air head

150‧‧‧頂部連接總成150‧‧‧Top connection assembly

151‧‧‧固定端151‧‧‧ fixed end

151a‧‧‧第一固定座151a‧‧‧first mount

151b‧‧‧第二固定座151b‧‧‧Second seat

151b1‧‧‧感測器151b1‧‧‧ sensor

152‧‧‧接口152‧‧‧ interface

153‧‧‧伸縮對準機構153‧‧‧ Telescopic alignment mechanism

153a‧‧‧固定板153a‧‧‧Fixed plate

153b‧‧‧緩衝板153b‧‧‧Battery board

153c‧‧‧壓縮彈簧153c‧‧‧Compressed spring

155‧‧‧定位夾爪155‧‧‧Positioning jaws

156‧‧‧噴洗環156‧‧‧Spray ring

157‧‧‧吊線157‧‧‧ hanging wire

158‧‧‧注液孔158‧‧‧ injection hole

170‧‧‧導引調節裝置170‧‧‧ guidance adjustment device

180‧‧‧緩衝槽180‧‧‧buffer tank

181‧‧‧第一管路181‧‧‧First line

182‧‧‧第二管路182‧‧‧Second line

183‧‧‧第三管路183‧‧‧ third pipeline

184‧‧‧第一氣體管路184‧‧‧First gas line

190‧‧‧外殼體190‧‧‧ outer casing

192‧‧‧儀控面板192‧‧‧ instrument panel

195‧‧‧自動推車195‧‧‧Automatic cart

196‧‧‧電控單元196‧‧‧Electronic control unit

197‧‧‧挾持機構197‧‧‧ Maintaining institutions

200‧‧‧石英管200‧‧‧Quartz tube

210‧‧‧中空腔室210‧‧‧ hollow room

212‧‧‧底部開口端212‧‧‧Bottom open end

213‧‧‧側裙部213‧‧‧Side skirt

213a‧‧‧頂部213a‧‧‧ top

214‧‧‧頂部開口端214‧‧‧Top open end

215‧‧‧內壁215‧‧‧ inner wall

216‧‧‧外壁216‧‧‧ outer wall

A1‧‧‧中心軸A1‧‧‧ central axis

圖1是根據本新型創作的一實施例的示意圖。1 is a schematic illustration of an embodiment of the creation in accordance with the present invention.

圖2是圖1的承載座的俯視示意圖。2 is a top plan view of the carrier of FIG. 1.

圖3是圖1的清洗設備的側視示意圖。3 is a side elevational view of the cleaning apparatus of FIG. 1.

圖4是圖1的頂部連接總成的放大示意圖。4 is an enlarged schematic view of the top connection assembly of FIG. 1.

圖5是根據本新型創作的另一實施例的承載座的俯視示意圖。Figure 5 is a top plan view of a carrier according to another embodiment of the present invention.

圖6是根據本新型創作的一實施例的清洗設備的外殼體與自動推車的示意圖。6 is a schematic illustration of an outer casing and an automatic cart of a cleaning apparatus in accordance with an embodiment of the present invention.

圖1是根據本新型創作的一實施例的清洗設備的示意圖。圖2是圖1的承載座的俯視示意圖。請參考圖1與圖2。本實施例的清洗設備100可用來清洗石英管200。石英管200具有中空腔室210以及連接中空腔室210的底部開口端212以及頂部開口端214。此外,清洗設備100包括承載座110、頂部連接總成150以及至少一個注液頭130(圖2舉例繪示兩個)。承載座110可用來承載石英管200,並且石英管200的底部開口端212朝向承載座110的承載面112。此外,石英管200在承載面112的密封區域113內與承載座110形成密封。再者,如圖1所示,石英管200的底部開口端212具有向外延伸的側裙部213。此外,清洗設備100可具有壓緊裝置117,其配置於承載座110的上方。在本實施例中,壓緊裝置117例如是以氣壓驅動的方式緊壓於上述側裙部213的頂部213a,以使石英管200的底部開口端212與承載座110之間形成密封。1 is a schematic illustration of a cleaning apparatus in accordance with an embodiment of the present invention. 2 is a top plan view of the carrier of FIG. 1. Please refer to Figure 1 and Figure 2. The cleaning apparatus 100 of the present embodiment can be used to clean the quartz tube 200. The quartz tube 200 has a hollow chamber 210 and a bottom open end 212 that connects the hollow chamber 210 and a top open end 214. In addition, the cleaning apparatus 100 includes a carrier 110, a top connection assembly 150, and at least one liquid injection head 130 (two are illustrated in FIG. 2). The carrier 110 can be used to carry the quartz tube 200, and the bottom open end 212 of the quartz tube 200 faces the bearing surface 112 of the carrier 110. Furthermore, the quartz tube 200 forms a seal with the carrier 110 in the sealing region 113 of the bearing surface 112. Further, as shown in FIG. 1, the bottom open end 212 of the quartz tube 200 has an outwardly extending side skirt portion 213. Further, the cleaning apparatus 100 may have a pressing device 117 disposed above the carrier 110. In the present embodiment, the pressing device 117 is pressed against the top portion 213a of the side skirt portion 213, for example, in a pneumatically driven manner to form a seal between the bottom open end 212 of the quartz tube 200 and the carrier 110.

此外,如圖2所示,承載座110亦可包括密封環115,並且密封環115設置於承載面112上。本實施例的密封環115例如是O形環(O-ring),並且當石英管200放置於承載座110上時,密封環115可承靠於石英管200的底部開口端212與承載座110的承載面112之間,以藉由密封環115的伸縮彈性進一步加強底部開口端212與承載面112之間的密封效果。In addition, as shown in FIG. 2 , the carrier 110 may also include a sealing ring 115 , and the sealing ring 115 is disposed on the bearing surface 112 . The seal ring 115 of the present embodiment is, for example, an O-ring, and when the quartz tube 200 is placed on the carrier 110, the seal ring 115 can bear against the bottom open end 212 of the quartz tube 200 and the carrier 110. Between the bearing surfaces 112, the sealing effect between the bottom open end 212 and the bearing surface 112 is further enhanced by the elastic elasticity of the sealing ring 115.

再者,頂部連接總成150適於對準並固定於石英管200 的頂部開口端214,以連通頂部開口端214與第一管路181。除此之外,如圖2所示,注液頭130配置於密封區域113內,以用來朝石英管200的中空腔室210內部注入清洗液50,並且清洗液50的注入方向可如同圖2中的注液頭130上的箭頭方向所示。當清洗液50充滿石英管200的中空腔室210時,清洗液50可經頂部開口端214與第一管路181輸出。Furthermore, the top connection assembly 150 is adapted to be aligned and fixed to the quartz tube 200 The top open end 214 is configured to communicate the top open end 214 with the first conduit 181. In addition, as shown in FIG. 2, the liquid filling head 130 is disposed in the sealing area 113 for injecting the cleaning liquid 50 into the hollow chamber 210 of the quartz tube 200, and the injection direction of the cleaning liquid 50 can be as shown in the figure. The direction of the arrow on the liquid filling head 130 in 2 is shown. When the cleaning liquid 50 fills the hollow chamber 210 of the quartz tube 200, the cleaning liquid 50 can be output through the top open end 214 and the first line 181.

圖3是圖1的清洗設備的側視示意圖。請參考圖2及圖3,石英管200的中空腔室210具有垂直承載面112的中心軸A1。在本實施例中,注液頭130的出液方向(如圖2與圖3中的箭頭所示)偏離中心軸A1,並且出液方向與承載座110的承載面112之間具有小於90度的傾角。舉例而言,在本實施例中,注液頭130的出液方向與承載面112之間可夾45度的傾角。當然,本新型創作的注液頭130的出液方向與角度可隨實際需求作調整,本新型創作對此並不加以限制。3 is a side elevational view of the cleaning apparatus of FIG. 1. Referring to FIGS. 2 and 3, the hollow chamber 210 of the quartz tube 200 has a central axis A1 of the vertical bearing surface 112. In the present embodiment, the liquid discharge direction of the liquid filling head 130 (as indicated by the arrows in FIGS. 2 and 3) is offset from the central axis A1, and the liquid discharge direction is less than 90 degrees between the bearing surface 112 of the carrier 110. Inclination. For example, in the present embodiment, the liquid discharge direction of the liquid injection head 130 and the bearing surface 112 can be inclined by 45 degrees. Of course, the direction and angle of the liquid injection head 130 created by the present invention can be adjusted according to actual needs, and the novel creation does not limit this.

如圖2及圖3所示,石英管200具有內壁215與外壁216。清洗液50經由注液頭130注入並充滿整個石英管200的中空腔室210,以對石英管200的內壁215進行清洗,並且去除石英管200例如於半導體製程中在內壁215上所產生的沉積附著物。值得一提的是,為了去除石英管200的內壁215上的沉積附著物,清洗液50中通常包含強酸或強鹼的化學溶劑以加強清除效果。然而,清洗液50在與附著物進行反應並且去除附著物的同時,亦可能對於石英管200的管壁產生侵蝕。由於本實施例的注液頭130僅是 對於石英管200的內壁215進行噴液與清洗。因此,在清洗的過程中,石英管200的外壁216可無需或僅小部份地接觸到清洗液50,避免清洗液50對石英管200的外壁216產生侵蝕現象,進而延長石英管200的使用壽命。As shown in FIGS. 2 and 3, the quartz tube 200 has an inner wall 215 and an outer wall 216. The cleaning liquid 50 is injected through the liquid filling head 130 and fills the hollow chamber 210 of the entire quartz tube 200 to clean the inner wall 215 of the quartz tube 200, and the quartz tube 200 is removed, for example, on the inner wall 215 in the semiconductor process. Deposition deposits. It is worth mentioning that in order to remove deposited deposits on the inner wall 215 of the quartz tube 200, the cleaning solution 50 usually contains a strong acid or a strong base chemical solvent to enhance the scavenging effect. However, the cleaning liquid 50 may also erode the wall of the quartz tube 200 while reacting with the deposit and removing the deposit. Since the liquid filling head 130 of the embodiment is only The inner wall 215 of the quartz tube 200 is sprayed and cleaned. Therefore, during the cleaning process, the outer wall 216 of the quartz tube 200 can contact the cleaning liquid 50 in a small or no part, so as to prevent the cleaning liquid 50 from eroding the outer wall 216 of the quartz tube 200, thereby prolonging the use of the quartz tube 200. life.

此外,請再參考圖2與圖3,在本實施例中,清洗設備100的承載座110上可另外設置多個噴氣頭140(圖2舉例繪示四個)於承載座110的密封區域113內,並且噴氣頭140可向中空腔室210內噴出氣體(未示出)。噴氣頭140的氣體出氣方向可如圖2的虛線箭頭所示。在本實施例中,噴氣頭140的出氣方向偏離中空腔室210的中心軸A1,並且出氣方向與承載面112夾小於90度的傾角。此外,噴氣頭140可經由第一氣體管路184連接至氣體供應源(未示出)。在本實施例中,在中空腔室210中,噴氣頭140所噴出的氣體可延伸或改變由注液頭130注入的清洗液50的出液路徑及方向,並且使得石英管200的內壁215可均勻地受到清洗液50的清洗,避免石英管200各部份清洗品質不均勻的問題。In addition, referring to FIG. 2 and FIG. 3 , in the embodiment, a plurality of air jets 140 (four illustrated in FIG. 2 ) may be additionally disposed on the bearing base 110 of the cleaning device 100 in the sealing area 113 of the carrier 110 . Internally, and the air jet head 140 can eject a gas (not shown) into the hollow chamber 210. The gas outlet direction of the jet head 140 can be as indicated by the dashed arrow in FIG. In the present embodiment, the air outlet direction of the air jet head 140 is offset from the central axis A1 of the hollow chamber 210, and the air outlet direction is inclined by less than 90 degrees with the load bearing surface 112. Additionally, the air jet head 140 can be coupled to a gas supply source (not shown) via a first gas line 184. In the present embodiment, in the hollow chamber 210, the gas ejected from the air jet head 140 can extend or change the liquid discharge path and direction of the cleaning liquid 50 injected by the liquid filling head 130, and the inner wall 215 of the quartz tube 200 is made. The cleaning liquid 50 can be uniformly cleaned to avoid the problem of uneven cleaning quality of each part of the quartz tube 200.

再者,請參考圖1及圖2,承載座110還可包括多個配置於其上的導引調節裝置170。此外,導引調整裝置170位於承載座110的密封區域113外,以導引並且調整石英管200相對於承載座110的位置。再者,如圖1所示,承載面112上的密封區域113外還可另外配置環繞石英管200的噴液環118,並且噴液環118上具有多個歧管118a。在本實施例中,當以清洗液50對於石英管200的內壁215進行清洗的時,清洗液50可經由噴液環118上的歧管 118a對石英管200的外壁216進行噴洗,並且用於清洗石英管200的內壁215與外壁216的清洗液50可為相同或不同,以適應內壁215與外壁216不同的清洗需求,例如石英管200的外壁216可僅以純水進行清洗。Furthermore, referring to FIG. 1 and FIG. 2, the carrier 110 may further include a plurality of guiding adjustment devices 170 disposed thereon. Furthermore, the guide adjustment device 170 is located outside the sealing region 113 of the carrier 110 to guide and adjust the position of the quartz tube 200 relative to the carrier 110. Further, as shown in FIG. 1, a spray ring 118 surrounding the quartz tube 200 may be additionally disposed outside the seal region 113 on the bearing surface 112, and the spray ring 118 has a plurality of manifolds 118a thereon. In the present embodiment, when the cleaning liquid 50 is cleaned against the inner wall 215 of the quartz tube 200, the cleaning liquid 50 may pass through the manifold on the liquid discharge ring 118. 118a sprays the outer wall 216 of the quartz tube 200, and the cleaning fluid 50 for cleaning the inner wall 215 and the outer wall 216 of the quartz tube 200 may be the same or different to accommodate different cleaning requirements of the inner wall 215 and the outer wall 216, such as The outer wall 216 of the quartz tube 200 can be cleaned only with pure water.

另一方面,清洗設備100可包括緩衝槽180與第二管路182,其中第二管路182連接於注液頭130與緩衝槽180之間。此外,上述的第一管路181的一端連接頂部連接總成150而另一端連接緩衝槽180。因此,如圖3所示,石英管200可與頂部連接總成150連接,並且頂部連接總成150經由第一管路181連接至緩衝槽180。然後,緩衝槽180再經由第二管路182連接至石英管200內的注液頭130,以形成清洗液50的循環流路。再者,本實施例的承載座110中央可另外配置排液孔114,以及連接排液孔114的第三管路183,並且第三管路183亦連接至緩衝槽180中。當清洗液50經由注液頭130注入石英管200的中空腔室210中,並且完成石英管200的內壁215的清洗時,部份的清洗液50可經由頂部開口端214以及連接頂部連接總成150的第一管路181排出至緩衝槽180中,其餘部份的清洗液50則可直接經由承載座110中央的排液孔114排出至緩衝槽180中,以增加清洗液50排出石英管200的速度。On the other hand, the cleaning apparatus 100 may include a buffer tank 180 and a second line 182, wherein the second line 182 is connected between the liquid filling head 130 and the buffer tank 180. In addition, one end of the first pipe 181 is connected to the top connection assembly 150 and the other end is connected to the buffer groove 180. Thus, as shown in FIG. 3, the quartz tube 200 can be coupled to the top connection assembly 150, and the top connection assembly 150 is coupled to the buffer tank 180 via the first line 181. Then, the buffer tank 180 is further connected to the liquid filling head 130 in the quartz tube 200 via the second line 182 to form a circulation flow path of the cleaning liquid 50. Furthermore, in the center of the carrier 110 of the present embodiment, a drain hole 114 and a third conduit 183 connected to the drain hole 114 may be additionally disposed, and the third conduit 183 is also connected to the buffer tank 180. When the cleaning liquid 50 is injected into the hollow chamber 210 of the quartz tube 200 via the liquid filling head 130, and the cleaning of the inner wall 215 of the quartz tube 200 is completed, part of the cleaning liquid 50 can be connected via the top open end 214 and the connection top. The first line 181 of 150 is discharged into the buffer tank 180, and the remaining portion of the cleaning liquid 50 can be directly discharged into the buffer tank 180 through the liquid discharge hole 114 in the center of the carrier 110 to increase the discharge of the cleaning liquid 50 into the quartz tube. 200 speed.

圖4是圖1的頂部連接總成的放大示意圖。請參考圖4,本實施例的頂部連接總成150包括接口152、多個定位夾爪155(圖4舉例繪示三個)以及伸縮對準機構153。接口152可用來連接石 英管200的頂部開口端214。此外,定位夾爪155設置於接口152的周圍,以扣持石英管200的頂部開口端214並且固定頂部開口端214相對於接口152的位置。再者,在本實施例中,伸縮對準機構153用來連接於接口152與清洗設備100的固定端151之間。伸縮對準機構153可在頂部開口端214接觸接口152時,沿頂部開口端214與接口152的接觸方向上,也就是在頂部開口端214與接口152的垂直方向(圖4的X軸方向)上提供緩衝位移。4 is an enlarged schematic view of the top connection assembly of FIG. 1. Referring to FIG. 4 , the top connection assembly 150 of the present embodiment includes an interface 152 , a plurality of positioning jaws 155 (three are illustrated in FIG. 4 ), and a telescopic alignment mechanism 153 . Interface 152 can be used to connect stones The top open end 214 of the British tube 200. Additionally, a positioning jaw 155 is disposed about the interface 152 to hold the top open end 214 of the quartz tube 200 and secure the position of the top open end 214 relative to the interface 152. Moreover, in the present embodiment, the telescopic alignment mechanism 153 is used to connect between the interface 152 and the fixed end 151 of the cleaning apparatus 100. The telescoping alignment mechanism 153 can be in the direction of contact of the top open end 214 with the interface 152 when the top open end 214 contacts the interface 152, that is, in the vertical direction of the top open end 214 and the interface 152 (X-axis direction of FIG. 4) A buffer displacement is provided on it.

進一步而言,如圖4所示,本實施例的伸縮對準機構153包括固定板153a、緩衝板153b以及壓縮彈簧153c。壓縮彈簧153c配置於固定板153a與緩衝板153b之間,並且定位夾爪155可固定於固定板153a上。此外,伸縮對準機構153可經由兩條吊線157懸吊於清洗設備100的固定端151。伸縮對準機構153可藉由壓縮彈簧153c的彈性力推動而沿圖4中的X軸方向相對於固定端151移動。因此,當石英管200的頂部開口端214沿X軸方向與頂部連接總成150的接口152對接時,伸縮對準機構153可藉由壓縮彈簧153c提供緩衝,以吸收頂部開口端214與接口152對接時所產生的衝擊力量。此外,在本實施例中,清洗設備100的固定端151包括第一固定座151a及第二固定座151b,其分別位於頂部連接總成150的相對兩側,其中第二固定座151b位於靠近接口152的一端。再者,本實施例的頂部連接總成150可經由第一固定座151a與第二固定座151b分別連接並固定於清洗裝置100上。Further, as shown in FIG. 4, the telescopic alignment mechanism 153 of the present embodiment includes a fixing plate 153a, a buffer plate 153b, and a compression spring 153c. The compression spring 153c is disposed between the fixed plate 153a and the baffle plate 153b, and the positioning jaw 155 can be fixed to the fixed plate 153a. Further, the telescopic alignment mechanism 153 can be suspended from the fixed end 151 of the cleaning apparatus 100 via two suspension wires 157. The telescopic alignment mechanism 153 is movable relative to the fixed end 151 in the X-axis direction in FIG. 4 by the elastic force of the compression spring 153c. Therefore, when the top open end 214 of the quartz tube 200 abuts the interface 152 of the top connection assembly 150 in the X-axis direction, the telescopic alignment mechanism 153 can be buffered by the compression spring 153c to absorb the top open end 214 and the interface 152. The impact force generated during docking. In addition, in the embodiment, the fixed end 151 of the cleaning device 100 includes a first fixing seat 151a and a second fixing seat 151b respectively located on opposite sides of the top connecting assembly 150, wherein the second fixing seat 151b is located near the interface. One end of 152. Furthermore, the top connection assembly 150 of the present embodiment can be respectively connected to and fixed to the cleaning device 100 via the first fixing seat 151a and the second fixing seat 151b.

此外,由於本實施例的第二固定座151b是配置於靠近接 口152的一端,因此,第二固定座151b上可設置多個感測器151b1,其用來感測石英管200的頂部開口端214的位置,以進行頂部開口端214與接口152的對接。再者,頂部連接總成150還可包括噴洗環156環繞配置於接口152的周圍。噴洗環156上具有多個歧管156a,並且歧管156a分別經由噴洗環156連接至注液孔158。當石英管200的頂部開口端214與頂部連接總成150的接口152連接時,清洗液50可經由注液孔158注入噴洗環156中,並且經由歧管156a噴洗石英管200的頂部開口端214的外緣。In addition, since the second fixing base 151b of the embodiment is disposed close to the connection One end of the port 152, therefore, a plurality of sensors 151b1 can be disposed on the second mount 151b for sensing the position of the top open end 214 of the quartz tube 200 for the docking of the top open end 214 with the interface 152. Moreover, the top connection assembly 150 can also include a spray ring 156 disposed around the interface 152. The spray ring 156 has a plurality of manifolds 156a thereon, and the manifolds 156a are connected to the liquid injection holes 158 via spray wash rings 156, respectively. When the top open end 214 of the quartz tube 200 is coupled to the interface 152 of the top connection assembly 150, the cleaning fluid 50 can be injected into the spray ring 156 via the injection hole 158 and the top opening of the quartz tube 200 can be sprayed via the manifold 156a. The outer edge of the end 214.

圖5是根據本新型創作的另一實施例的承載座的俯視示意圖。本實施例的承載座的結構與圖2中的承載座的結構類似,因此相同或相似的構件以相同或相似的符號表示,並且不再重複說明。請參考圖5,本實施例與圖2的實施例的差異在於,本實施例可選擇性地於承載座110的密封區域113的上方配置罩體135,並且罩體135被設置為阻擋在如圖2所示的注液頭130的出液方向上。然而,清洗液50再由罩體135上的出液孔135a注入中空腔室210。在本實施例中,經由罩體135的阻擋,可避免過量的清洗液50直接經由注液頭130噴灑至石英管200的內壁215的部份表面,而造成清洗品質不均的情形。此外,由於罩體135可阻擋大量的清洗液50在極短的時間內經由注液頭130進入石英管200中,以使清洗液50以更為均勻穩定的速率進入石英管200的中空腔室210中。Figure 5 is a top plan view of a carrier according to another embodiment of the present invention. The structure of the carrier of the present embodiment is similar to that of the carrier in FIG. 2, and therefore the same or similar components are denoted by the same or similar symbols, and the description thereof will not be repeated. Referring to FIG. 5, the difference between this embodiment and the embodiment of FIG. 2 is that the present embodiment can selectively configure the cover 135 above the sealing area 113 of the carrier 110, and the cover 135 is configured to block The liquid discharge head 130 shown in Fig. 2 is in the liquid discharge direction. However, the cleaning liquid 50 is again injected into the hollow chamber 210 from the liquid discharge hole 135a in the cover 135. In the present embodiment, the blocking of the cover body 135 prevents excessive cleaning liquid 50 from being directly sprayed onto the surface of the inner wall 215 of the quartz tube 200 via the liquid filling head 130, resulting in uneven cleaning quality. In addition, since the cover 135 can block a large amount of the cleaning liquid 50 from entering the quartz tube 200 via the liquid injection head 130 in a very short time, the cleaning liquid 50 enters the hollow chamber of the quartz tube 200 at a more uniform and stable rate. 210.

圖6是根據本新型創作的一實施例的清洗設備的外殼體 與自動推車的示意圖。清洗設備100進一步包括外殼體190與自動推車195。在本實施例中,上述的承載座110與頂部連接總成150可置入外殼體190中,並且石英管200可被放入外殼體190中進行清洗,以增加清洗過程的安全性,避免清洗液50外洩至周圍的工作環境。此外,外殼體190可配置儀控面板192,來控制石英管200的清洗時間以及清洗時的溫度及濕度等。再者,上述用來存置清洗液50的緩衝槽180亦可置放於外殼體190中。除此之外,本實施例的清洗設備100還包括自動推車195,自動推車195可由承載座110上取放石英管200,並且輸送石英管200進入或退出外殼體190。自動推車195包括電控單元196以及挾持機構197。因此,自動推車195可以電控單元196來控制其前進、後退以及前進的方向。此外,自動推車195可以挾持機構197來挾持石英管200,避免石英管200在運送過程中產生晃動的情形,以提升運送過程的安全性。Figure 6 is an outer casing of a cleaning apparatus in accordance with an embodiment of the present invention. Schematic with an automatic cart. The cleaning apparatus 100 further includes an outer casing 190 and an automatic cart 195. In this embodiment, the above-mentioned carrier 110 and top connection assembly 150 can be placed in the outer casing 190, and the quartz tube 200 can be placed in the outer casing 190 for cleaning to increase the safety of the cleaning process and avoid cleaning. The liquid 50 is leaked to the surrounding working environment. In addition, the outer casing 190 can be configured with an instrument panel 192 to control the cleaning time of the quartz tube 200 and the temperature and humidity during cleaning. Furthermore, the buffer tank 180 for storing the cleaning liquid 50 may be placed in the outer casing 190. In addition, the cleaning apparatus 100 of the present embodiment further includes an automatic cart 195 that can take the quartz tube 200 from the carrier 110 and transport the quartz tube 200 into or out of the outer casing 190. The automatic cart 195 includes an electronic control unit 196 and a holding mechanism 197. Thus, the automated cart 195 can be electronically controlled 196 to control its forward, reverse, and forward direction. In addition, the automatic cart 195 can hold the quartz tube 200 by the holding mechanism 197 to prevent the quartz tube 200 from swaying during transportation to improve the safety of the transportation process.

綜上所述,本新型創作的清洗設備可將石英管密封,並且將清洗液注入石英管中,對石英管進行清洗。詳細而言,石英管可扣持並置放於承載座與頂部連接總成之間,並且石英管可與承載座在承載座的密封區域內形成密封。再者,注液頭配置於承載座的密封區域內,以朝向石英管的中空腔室內注入清洗液,以對石英管的內壁面進行清洗。除此之外,本新型創作的清洗設備可具有自動推車,以自動化搬運石英管。本新型創作經由上述的配置可達成自動化清洗石英管,取代傳統的人工清洗方式,提升 石英管的清洗速度與效率。此外,由於本新型創作的清洗設備在清洗石英管時,無須將石英管完全地浸入清洗液中,可減緩清洗液對於石英管壁面的侵蝕,從而延長石英管的使用壽命。In summary, the cleaning device created by the present invention can seal the quartz tube and inject the cleaning liquid into the quartz tube to clean the quartz tube. In detail, the quartz tube can be held and placed between the carrier and the top connection assembly, and the quartz tube can form a seal with the carrier in the sealing area of the carrier. Furthermore, the liquid injection head is disposed in the sealing area of the carrier to inject cleaning liquid into the hollow chamber of the quartz tube to clean the inner wall surface of the quartz tube. In addition, the new cleaning device can be equipped with an automatic cart for automated handling of quartz tubes. Through the above configuration, the novel creation can achieve automatic cleaning of the quartz tube, replacing the traditional manual cleaning method and improving The cleaning speed and efficiency of the quartz tube. In addition, since the cleaning device created by the present invention does not need to completely immerse the quartz tube in the cleaning liquid when cleaning the quartz tube, the corrosion of the cleaning liquid on the wall surface of the quartz tube can be slowed down, thereby prolonging the service life of the quartz tube.

雖然本新型創作已以實施例揭露如上,然其並非用以限定本新型創作,任何所屬技術領域中具有通常知識者,在不脫離本新型創作的精神和範圍內,當可作些許的更動與潤飾,故本新型創作的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the novel creation, and any person skilled in the art can make some changes without departing from the spirit and scope of the novel creation. Retouching, the scope of protection of this new creation is subject to the definition of the scope of the patent application attached.

100‧‧‧清洗設備100‧‧‧cleaning equipment

110‧‧‧承載座110‧‧‧ bearing seat

112‧‧‧承載面112‧‧‧ bearing surface

117‧‧‧壓緊裝置117‧‧‧Holding device

118‧‧‧噴液環118‧‧‧ spray ring

118a‧‧‧歧管118a‧‧‧Management

150‧‧‧頂部連接總成150‧‧‧Top connection assembly

182‧‧‧第二管路182‧‧‧Second line

183‧‧‧第三管路183‧‧‧ third pipeline

184‧‧‧第一氣體管路184‧‧‧First gas line

200‧‧‧石英管200‧‧‧Quartz tube

210‧‧‧中空腔室210‧‧‧ hollow room

212‧‧‧底部開口端212‧‧‧Bottom open end

213‧‧‧側裙部213‧‧‧Side skirt

213a‧‧‧頂部213a‧‧‧ top

214‧‧‧頂部開口端214‧‧‧Top open end

Claims (10)

一種清洗設備,適於清洗一石英管,該石英管具有一中空腔室以及連接該中空腔室的一底部開口端以及一頂部開口端,該清洗設備包括:一承載座,用以承載該石英管,其中該石英管的該底部開口端朝向該承載座的一承載面,且在該承載面的一密封區域內與該承載座之間形成密封;一頂部連接總成,適於對準並固定於該石英管的該頂部開口端,以連通該頂部開口端與一第一管路;以及至少一注液頭,配置於該密封區域內,用以朝該中空腔室內部注入一清洗液,且該清洗液充滿該中空腔室後適於經由該頂部開口端與該第一管路輸出。A cleaning device adapted to clean a quartz tube having a hollow chamber and a bottom open end connecting the hollow chamber and a top open end, the cleaning device comprising: a carrier for carrying the quartz a tube, wherein the bottom open end of the quartz tube faces a bearing surface of the carrier, and forms a seal with the carrier in a sealing area of the bearing surface; a top connecting assembly adapted to be aligned Fixed to the top open end of the quartz tube to communicate the top open end and a first pipeline; and at least one liquid injection head disposed in the sealing area for injecting a cleaning liquid into the interior of the hollow chamber And the cleaning fluid is filled in the hollow chamber and is adapted to be output to the first conduit via the top open end. 如申請專利範圍第1項所述的清洗設備,其中該中空腔室具有垂直於該承載面的一中心軸,該至少一注液頭的一出液方向偏離該中心軸,且該出液方向與該承載面夾小於90度的一傾角。The cleaning device of claim 1, wherein the hollow chamber has a central axis perpendicular to the bearing surface, a liquid discharge direction of the at least one liquid injection head is offset from the central axis, and the liquid discharge direction An angle of inclination of less than 90 degrees is clamped to the bearing surface. 如申請專利範圍第2項所述的清洗設備,更包括多個噴氣頭,配置於該密封區域內,各該噴氣頭的一出氣方向偏離該中心軸,且該出氣方向與該承載面夾小於90度的一傾角。The cleaning device of claim 2, further comprising a plurality of air jet heads disposed in the sealing area, wherein an air outlet direction of each of the air jet heads is offset from the central axis, and the air outlet direction and the bearing surface are less than A dip of 90 degrees. 如申請專利範圍第1項所述的清洗設備,其中該承載座包括一密封環,設置於該承載面上,且該密封環承靠於該底部開口端與該承載面之間。The cleaning device of claim 1, wherein the carrier includes a sealing ring disposed on the bearing surface, and the sealing ring bears between the open end of the bottom and the bearing surface. 如申請專利範圍第1項所述的清洗設備,更包括一壓緊裝置,設置於該承載座上方,該石英管的該底部開口端具有向外水平延伸的一側裙部,且該壓緊裝置適於壓著該側裙部的頂部,以使該底部開口端與該承載座之間形成密封。The cleaning device of claim 1, further comprising a pressing device disposed above the carrier, the bottom open end of the quartz tube having a skirt extending laterally outwardly, and the pressing The device is adapted to press against the top of the side skirt to form a seal between the open end of the bottom and the carrier. 如申請專利範圍第1項所述的清洗設備,更包括一罩體,配置於該密封區域內,該罩體被設置為阻擋在該至少一注液頭的一出液方向上。The cleaning device of claim 1, further comprising a cover disposed in the sealing area, the cover being disposed to block in a liquid discharge direction of the at least one liquid injection head. 如申請專利範圍第1項所述的清洗設備,其中該承載座更包括多個導引調節裝置,配置於該承載座上方且位於該密封區域外,用以導引並調整該石英管相對於該承載座的位置。The cleaning device of claim 1, wherein the carrier further comprises a plurality of guiding adjustment devices disposed above the carrier and outside the sealing region for guiding and adjusting the quartz tube relative to The position of the carrier. 如申請專利範圍第1項所述的清洗設備,更包括一緩衝槽以及一第二管路,其中該第一管路連接於該頂部開口端與該緩衝槽之間,而該第二管路連接於該至少一注液頭與該緩衝槽之間。The cleaning device of claim 1, further comprising a buffer tank and a second pipeline, wherein the first pipeline is connected between the top open end and the buffer tank, and the second pipeline Connected between the at least one liquid injection head and the buffer tank. 如申請專利範圍第1項所述的清洗設備,其中該頂部連接總成包括:一接口,用以連接該頂部開口端;多個定位夾爪,設置於該接口周圍,用以扣持該頂部開口端,以固定該頂部開口端相對於該接口的位置;以及一伸縮對準機構,連接於該接口與該清洗設備的一固定端之間,用以在該頂部開口端接觸該接口時,對該接口提供沿一接觸方向的緩衝位移。The cleaning device of claim 1, wherein the top connection assembly comprises: an interface for connecting the top open end; and a plurality of positioning jaws disposed around the interface for holding the top An open end for fixing a position of the top open end relative to the interface; and a telescopic alignment mechanism coupled between the interface and a fixed end of the cleaning device for contacting the interface at the top open end The interface is provided with a buffer displacement along a contact direction. 如申請專利範圍第1項所述的清洗設備,更包括一自動推車,用以在該承載座上取放該石英管。The cleaning device of claim 1, further comprising an automatic cart for picking up and placing the quartz tube on the carrier.
TW104209255U 2015-06-10 2015-06-10 Cleaning equipment TWM514648U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI615209B (en) * 2016-05-25 2018-02-21 上海新昇半導體科技有限公司 An apparatus for cleaning a quartz chamber and a method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI615209B (en) * 2016-05-25 2018-02-21 上海新昇半導體科技有限公司 An apparatus for cleaning a quartz chamber and a method thereof

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