TWM500367U - Pogo pin connector - Google Patents
Pogo pin connector Download PDFInfo
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- TWM500367U TWM500367U TW103222698U TW103222698U TWM500367U TW M500367 U TWM500367 U TW M500367U TW 103222698 U TW103222698 U TW 103222698U TW 103222698 U TW103222698 U TW 103222698U TW M500367 U TWM500367 U TW M500367U
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- metal sleeve
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Description
本創作涉及一種連接器,尤其涉及一種探針連接器。The present invention relates to a connector, and more particularly to a probe connector.
一種習知的探針連接器,包括金屬套筒、探針及彈性件。金屬套筒具有一圓筒狀呈中空的容置筒及一封閉該容置筒底端的底座。底座與容置筒圍成一收容空間。探針可活動地裝設於金屬套筒內,且一端可伸出金屬套筒。彈性件收容於金屬套筒的收容空間內,並抵頂於探針和底座之間。A conventional probe connector includes a metal sleeve, a probe, and an elastic member. The metal sleeve has a cylindrical hollow receiving tube and a base for closing the bottom end of the receiving tube. The base and the receiving cylinder enclose a receiving space. The probe is movably mounted within the metal sleeve and has a metal sleeve extending from one end. The elastic member is received in the receiving space of the metal sleeve and abuts between the probe and the base.
另一種習知的探針連接器,其結構大致與上述習知的探針連接器相同,不同之處在於,在探針與彈性件之間裝設有一金屬球。其作用為增加探針與金屬套筒接觸側向力,使之接觸阻抗更低,從而達到穩定的電流傳輸功效。Another conventional probe connector is generally identical in construction to the conventional probe connector described above, except that a metal ball is mounted between the probe and the resilient member. The function is to increase the lateral force of the probe and the metal sleeve to make the contact impedance lower, thereby achieving stable current transmission.
然,上述兩種習知的探針連接器,基本組成亦為金屬導體,多部分電流流經主路徑(即從探針沿著金屬套筒筒壁向金屬套筒之底座傳導),少部分電流流經次路徑(即從探針流經金屬球和彈性件向金屬套筒之底座傳導),一旦探針與金屬套筒分離且電流過大時,易造成彈性件瞬間受大電流衝擊而燒毀,導致產品失效。However, the two conventional probe connectors have a basic composition of a metal conductor, and a plurality of currents flow through the main path (ie, from the probe along the wall of the metal sleeve to the base of the metal sleeve), a small portion. The current flows through the secondary path (that is, the probe flows through the metal ball and the elastic member to the base of the metal sleeve). Once the probe is separated from the metal sleeve and the current is too large, the elastic member is easily damaged by a large current and burned. , causing product failure.
本創作的目的是針對習知技術存在的缺陷和不足提供一種探針連接器,該探針連接器可以防止瞬間大電流灌入而燒毀彈性件。The purpose of this creation is to provide a probe connector that prevents the inrush of a large current and burns the elastic member in view of the drawbacks and deficiencies of the prior art.
為實現上述目的,本創作探針連接器,包括一金屬套筒、一探針、一彈性件及一絕緣球。金屬套筒具有一圓筒狀呈中空結構的容置筒,容置筒的後端設有一封閉該容置筒的底座,底座與容置筒圍成一收容空間,容置筒的前端向內收縮形成一與收容空間連通的開口,開口的直徑小於收容空間內壁的直徑。探針可前後滑動地裝設於金屬套筒內,探針具有一呈圓柱狀的卡持部,卡持部的前端向內收縮並向前延伸形成一接觸部,卡持部裝設於金屬套筒之收容空間內,接觸部則穿過金屬套筒之開口向外伸出於金屬套筒。彈性件和絕緣球裝設於金屬套筒之收容空間內。其中,所述彈性件的一端抵頂於金屬套筒之底座的內壁上,彈性件的另一端抵頂於絕緣球,所述絕緣球另一端則抵頂於探針之卡持部的後端。To achieve the above object, the present probe connector includes a metal sleeve, a probe, an elastic member and an insulating ball. The metal sleeve has a cylindrical hollow-shaped accommodating cylinder. The rear end of the accommodating cylinder is provided with a base for closing the accommodating cylinder. The base and the accommodating cylinder enclose a receiving space, and the front end of the accommodating cylinder contracts inward. An opening is formed in communication with the receiving space, and the diameter of the opening is smaller than the diameter of the inner wall of the receiving space. The probe is slidably mounted in the metal sleeve, and the probe has a cylindrical locking portion. The front end of the locking portion is contracted inwardly and extends forward to form a contact portion. The clamping portion is mounted on the metal. In the receiving space of the sleeve, the contact portion protrudes outwardly from the metal sleeve through the opening of the metal sleeve. The elastic member and the insulating ball are installed in the accommodating space of the metal sleeve. Wherein, one end of the elastic member abuts against the inner wall of the base of the metal sleeve, and the other end of the elastic member abuts against the insulating ball, and the other end of the insulating ball abuts against the rear of the probe end.
如上所述,本創作探針連接器藉由探針與彈性件之間設置一絕緣球,不僅增加了探針與金屬套筒間的側向接觸力,亦可以防止次路徑所導致的大電流瞬間灌入而燒毀彈性件使之失效。As described above, the present probe connector is provided with an insulating ball between the probe and the elastic member, which not only increases the lateral contact force between the probe and the metal sleeve, but also prevents the large current caused by the secondary path. Instantly inject and burn the elastic parts to disable them.
100‧‧‧探針連接器
10‧‧‧金屬套筒
11‧‧‧容置筒
12‧‧‧底座
13‧‧‧收容空間
14‧‧‧開口
15‧‧‧焊接端
20‧‧‧探針
21‧‧‧卡持部
22‧‧‧接觸部
30‧‧‧彈性件
40‧‧‧絕緣球
41‧‧‧金屬球
42‧‧‧絕緣漆
43‧‧‧鎳底層
44‧‧‧黑鎳100‧‧‧Probe connector 10‧‧‧Metal sleeve 11‧‧‧Receiving cylinder 12‧‧‧Base 13‧‧‧ Containing space 14‧‧‧ Opening 15‧‧‧welding end 20‧‧‧ probe 21‧‧‧Keeping Department 22‧‧‧Contacts 30‧‧‧Flexible parts 40‧‧‧Insulation ball 41‧‧‧Metal ball 42‧‧‧Insulating varnish 43‧‧‧ Nickel bottom layer 44‧‧‧Black nickel
第一圖係本創作探針連接器一種實施例之立體圖。
第二圖係第一圖所示探針連接器之立體分解圖。
第三圖係第一圖所示探針連接器之剖面圖。
第四圖係第二種實施例所示探針連接器之絕緣球之剖面圖。
第五圖係第三種實施例所示探針連接器之絕緣球之剖面圖。
The first figure is a perspective view of one embodiment of the present probe connector.
The second figure is an exploded perspective view of the probe connector shown in the first figure.
The third figure is a cross-sectional view of the probe connector shown in the first figure.
The fourth figure is a cross-sectional view of the insulating ball of the probe connector shown in the second embodiment.
Fig. 5 is a cross-sectional view showing the insulating ball of the probe connector shown in the third embodiment.
為詳細說明本創作之技術內容、構造特徵、所達成的目的及功效,以下茲例舉實施例並配合圖式詳予說明。To clarify the technical content, structural features, objectives, and effects of the present invention, the embodiments are described in detail below with reference to the drawings.
請參閱第二圖,本創作探針連接器100包括一金屬套筒10、一探針20、一彈性件30及一絕緣球40。Referring to the second figure, the present probe connector 100 includes a metal sleeve 10, a probe 20, an elastic member 30, and an insulating ball 40.
請參閱第一圖至第三圖,所述金屬套筒10具有一圓筒狀呈中空結構的容置筒11。容置筒11的後端設有一封閉該容置筒11的底座12。底座12與容置筒11圍成一收容空間13。容置筒11的前端向內收縮形成一與收容空間13連通的開口14。開口14的直徑小於收容空間13內壁的直徑。容置筒11於底座12的後端向後延伸形成一焊接端15。Referring to the first to third figures, the metal sleeve 10 has a cylindrical casing 17 having a hollow structure. A rear end of the accommodating cylinder 11 is provided with a base 12 that closes the accommodating cylinder 11. The base 12 and the accommodating cylinder 11 enclose a receiving space 13 . The front end of the accommodating cylinder 11 is contracted inward to form an opening 14 communicating with the accommodating space 13. The diameter of the opening 14 is smaller than the diameter of the inner wall of the accommodating space 13. The receiving cylinder 11 extends rearwardly from the rear end of the base 12 to form a welded end 15.
所述探針20可前後滑動地裝設於金屬套筒10內。探針20具有一呈圓柱狀的卡持部21。卡持部21的前端向內收縮並向前延伸形成一接觸部22。卡持部21裝設於金屬套筒10之收容空間13內,接觸部22則穿過金屬套筒10之開口14向外伸出於金屬套筒10。本實施例中,卡持部21的直徑大於金屬套筒10之開口14的直徑,而接觸部22的直徑小於金屬套筒10之開口14的直徑。從而使探針20之卡持部21卡持於金屬套筒10之開口14後方,而探針20之接觸部22伸出於金屬套筒10外部與外部電子組件電性連接。The probe 20 is slidably mounted in the metal sleeve 10 in a front-rear direction. The probe 20 has a cylindrical holding portion 21. The front end of the catch portion 21 is contracted inward and extends forward to form a contact portion 22. The retaining portion 21 is mounted in the receiving space 13 of the metal sleeve 10, and the contact portion 22 projects outwardly through the opening 14 of the metal sleeve 10 to the metal sleeve 10. In this embodiment, the diameter of the catch portion 21 is larger than the diameter of the opening 14 of the metal sleeve 10, and the diameter of the contact portion 22 is smaller than the diameter of the opening 14 of the metal sleeve 10. Therefore, the holding portion 21 of the probe 20 is clamped behind the opening 14 of the metal sleeve 10, and the contact portion 22 of the probe 20 protrudes from the outside of the metal sleeve 10 to be electrically connected to the external electronic component.
所述彈性件30及絕緣球40依次裝設於金屬套筒10之收容空間13內。所述絕緣球40的直徑小於金屬套筒10之收容空間13內壁的直徑。所述彈性件30的一端抵頂於金屬套筒10之底座12的內壁上,彈性件30的另一端抵頂於絕緣球40。所述絕緣球40另一端則抵頂於探針20之卡持部21的後端。本實施例中,彈性件30為一彈簧,絕緣球40為一塑膠球。The elastic member 30 and the insulating ball 40 are sequentially disposed in the receiving space 13 of the metal sleeve 10 . The diameter of the insulating ball 40 is smaller than the diameter of the inner wall of the receiving space 13 of the metal sleeve 10. One end of the elastic member 30 abuts against the inner wall of the base 12 of the metal sleeve 10, and the other end of the elastic member 30 abuts against the insulating ball 40. The other end of the insulating ball 40 abuts against the rear end of the holding portion 21 of the probe 20. In this embodiment, the elastic member 30 is a spring, and the insulating ball 40 is a plastic ball.
請參閱第一圖至第四圖,為本實用新型探針連接器100之第二實施例,其結構與第一實施例基本一致,其區別在於,絕緣球40包括一金屬球41,金屬球41的外部披覆有絕緣漆42,使之達到絕緣效果。Referring to FIG. 1 to FIG. 4 , a second embodiment of the probe connector 100 of the present invention is substantially identical in structure to the first embodiment, except that the insulating ball 40 includes a metal ball 41 and a metal ball. The exterior of the 41 is covered with an insulating varnish 42 to achieve an insulating effect.
請參閱第一圖、第二圖、第三圖和第五圖,為本實用新型探針連接器100之第三實施例,其結構與第一實施例基本一致,其區別在於,絕緣球40包括一金屬球41,金屬球的外部電鍍有鎳底層43,並於鎳底層43的外部電鍍有黑鎳44,使之達到絕緣效果。Referring to the first, second, third and fifth figures, a third embodiment of the probe connector 100 of the present invention is substantially identical in structure to the first embodiment, and the difference is that the insulating ball 40 A metal ball 41 is included, and the outer surface of the metal ball is plated with a nickel underlayer 43, and black nickel 44 is plated on the outside of the nickel underlayer 43 to achieve an insulating effect.
如上所述,本創作探針連接器100藉由探針20與彈性件30之間設置一絕緣球40,不僅增加了探針20與金屬套筒10間的側向接觸力,亦可以防止次路徑所導致的大電流瞬間灌入而燒毀彈性件使之失效。As described above, the present probe connector 100 is provided with an insulating ball 40 between the probe 20 and the elastic member 30, which not only increases the lateral contact force between the probe 20 and the metal sleeve 10, but also prevents the secondary contact force. The large current caused by the path is instantaneously poured and the elastic member is burned to make it invalid.
100‧‧‧探針連接器 100‧‧‧ probe connector
10‧‧‧金屬套筒 10‧‧‧Metal sleeve
11‧‧‧容置筒 11‧‧‧容筒
12‧‧‧底座 12‧‧‧Base
13‧‧‧收容空間 13‧‧‧ accommodating space
14‧‧‧開口 14‧‧‧ openings
15‧‧‧焊接端 15‧‧‧welding end
20‧‧‧探針 20‧‧‧ probe
21‧‧‧卡持部 21‧‧‧Card Department
22‧‧‧接觸部 22‧‧‧Contacts
30‧‧‧彈性件 30‧‧‧Flexible parts
40‧‧‧絕緣球 40‧‧‧Insulation ball
Claims (7)
一金屬套筒,具有一圓筒狀呈中空結構的容置筒,容置筒的後端設有一封閉該容置筒的底座,底座與容置筒圍成一收容空間,容置筒的前端向內收縮形成一與收容空間連通的開口,開口的直徑小於收容空間內壁的直徑;
一探針,可前後滑動地裝設於金屬套筒內,探針具有一呈圓柱狀的卡持部,卡持部的前端向內收縮並向前延伸形成一接觸部,卡持部裝設於金屬套筒之收容空間內,接觸部則穿過金屬套筒之開口向外伸出於金屬套筒;
一彈性件,裝設於金屬套筒之收容空間內;及
一絕緣球,裝設於金屬套筒之收容空間內;
其中,所述彈性件的一端抵頂於金屬套筒之底座的內壁上,彈性件的另一端抵頂於絕緣球,所述絕緣球另一端則抵頂於探針之卡持部的後端。A probe connector comprising:
a metal sleeve having a cylindrical hollow-shaped accommodating cylinder, the rear end of the accommodating cylinder is provided with a base for closing the accommodating cylinder, and the base and the accommodating cylinder enclose a receiving space for accommodating the front end of the cylinder The inner contraction forms an opening communicating with the receiving space, and the diameter of the opening is smaller than the diameter of the inner wall of the receiving space;
A probe is slidably mounted in the metal sleeve, and the probe has a cylindrical locking portion. The front end of the engaging portion is contracted inwardly and extends forward to form a contact portion, and the clamping portion is mounted. In the receiving space of the metal sleeve, the contact portion protrudes outwardly from the metal sleeve through the opening of the metal sleeve;
An elastic member is disposed in the receiving space of the metal sleeve; and an insulating ball is disposed in the receiving space of the metal sleeve;
Wherein, one end of the elastic member abuts against the inner wall of the base of the metal sleeve, and the other end of the elastic member abuts against the insulating ball, and the other end of the insulating ball abuts against the rear of the probe end.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103222698U TWM500367U (en) | 2014-12-23 | 2014-12-23 | Pogo pin connector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW103222698U TWM500367U (en) | 2014-12-23 | 2014-12-23 | Pogo pin connector |
Publications (1)
Publication Number | Publication Date |
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TWM500367U true TWM500367U (en) | 2015-05-01 |
Family
ID=53722167
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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TW103222698U TWM500367U (en) | 2014-12-23 | 2014-12-23 | Pogo pin connector |
Country Status (1)
Country | Link |
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TW (1) | TWM500367U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI666452B (en) * | 2017-03-30 | 2019-07-21 | 日商日本發條股份有限公司 | Contact probe and probe unit |
TWI727200B (en) * | 2017-10-05 | 2021-05-11 | 日商友華股份有限公司 | Spring connector |
-
2014
- 2014-12-23 TW TW103222698U patent/TWM500367U/en unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI666452B (en) * | 2017-03-30 | 2019-07-21 | 日商日本發條股份有限公司 | Contact probe and probe unit |
US11346859B2 (en) | 2017-03-30 | 2022-05-31 | Nhk Spring Co., Ltd. | Contact probe and probe unit |
US11874300B2 (en) | 2017-03-30 | 2024-01-16 | Nhk Spring Co., Ltd. | Contact probe and probe unit |
TWI727200B (en) * | 2017-10-05 | 2021-05-11 | 日商友華股份有限公司 | Spring connector |
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