TWM482745U - Fixture for accommodating an electronic device during test - Google Patents

Fixture for accommodating an electronic device during test Download PDF

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Publication number
TWM482745U
TWM482745U TW101222302U TW101222302U TWM482745U TW M482745 U TWM482745 U TW M482745U TW 101222302 U TW101222302 U TW 101222302U TW 101222302 U TW101222302 U TW 101222302U TW M482745 U TWM482745 U TW M482745U
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TW
Taiwan
Prior art keywords
electronic device
conductive
plug
tested
tray
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TW101222302U
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Chinese (zh)
Inventor
Li-Chin Lu
Jian-Hua Xiang
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Hon Hai Prec Ind Co Ltd
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Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Publication of TWM482745U publication Critical patent/TWM482745U/en

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Abstract

A fixture for accommodating an electronic device during a test is provided. The fixture includes a tray defining a cavity for accommodating the electronic device. The fixture further includes a plug assembly, a conductive sheet assembly, and a cover plate. The tray defines a chamber in its end. The plug assembly is slidably connected to the tray. The plug assembly includes a plug that can be inserted into a receptacle of the electronic device. The conductive sheet assembly is located in the chamber and includes several conductive sheets. Each conductive sheet is electrically connected to one of the conductive terminals of the plug. The cover plate is located above the bottom of the chamber. The cover plate and the bottom of the chamber define several through holes. Pins of a connector of a test machine can pass through the through holes of the cover plate or the bottom of the chamber and make contact with the conductive sheets.

Description

用於承載待測試電子裝置的治具Fixture for carrying the electronic device to be tested

本新型涉及一種承載待測試電子裝置的治具。The invention relates to a fixture for carrying an electronic device to be tested.

許多電子裝置,例如手機、平板電腦、筆記本電腦,在生產過程中需要進行多道工序的測試,因此,需要針對不同的測試設置相應的用以承載電子裝置的治具。例如,在電子裝置組裝完成後,需要將電子裝置電連接到一測試裝置,該測試裝置向該電子裝置發送測試訊號以測試電子裝置的軟體和硬體。對於一些特殊的電子裝置,還需要對該電子裝置以不同的位元姿進行測試,例如,將電子裝置正面朝上放置在治具中進行測試以及將電子裝置正面朝下放置在治具中進行測試,由於需要兩次裝夾,增加了電子裝置的外觀被劃傷的幾率。Many electronic devices, such as mobile phones, tablets, and notebook computers, require multiple processes to be tested during the manufacturing process. Therefore, it is necessary to set corresponding jigs for carrying electronic devices for different tests. For example, after the electronic device is assembled, the electronic device needs to be electrically connected to a test device, and the test device sends a test signal to the electronic device to test the software and hardware of the electronic device. For some special electronic devices, the electronic device needs to be tested in different bit positions, for example, placing the electronic device face up in the jig for testing and placing the electronic device face down in the jig. The test, because of the need for two clamping, increases the chance that the appearance of the electronic device will be scratched.

有鑒於此,本新型提供一種承載待測試電子裝置的治具,在需要以正面位元姿和反面位元姿測試電子裝置時,本新型的治具僅需要裝夾一次。In view of this, the present invention provides a jig for carrying an electronic device to be tested, and the jig of the present invention only needs to be clamped once when the electronic device needs to be tested in a front bit posture and a reverse bit position.

一種用於承載待測試電子裝置的治具,包括託盤,該託盤設置有收容腔,該收容腔用於容納該待測試電子裝置,還包括一插頭組件、一導電接觸組件和蓋板;該託盤的末端設置有一容置腔;該插頭組件滑動地連接於該託盤,該插頭組件包括一插頭,該插頭用於與該待測試電子裝置的一插槽相適配;該導電接觸組件位於該容置腔中,該導電接觸組件包括多個導電片,每個導電片與該插頭的一導電端子相連接;該蓋板與該容置腔的底部相對,該蓋板及該容置腔的底部均設置有與所述多個導電片對應的通孔,從而允許一測試裝置的探針穿過蓋板的通孔或者該容置腔的底部的通孔而與所述多個導電片相接觸,從而將該待測試電子裝置電連接到該測試裝置,使得該待測試電子裝置能夠接收到測試裝置的測試訊號。A fixture for carrying an electronic device to be tested, comprising a tray, the tray is provided with a receiving cavity for accommodating the electronic device to be tested, and further comprising a plug component, a conductive contact component and a cover plate; a plug cavity is slidably connected to the tray, the plug assembly includes a plug for adapting to a slot of the electronic device to be tested; the conductive contact component is located at the end In the cavity, the conductive contact assembly comprises a plurality of conductive sheets, each conductive piece being connected to a conductive terminal of the plug; the cover plate is opposite to the bottom of the receiving cavity, the cover plate and the bottom of the receiving cavity Providing a through hole corresponding to the plurality of conductive sheets, thereby allowing a probe of a test device to pass through the through hole of the cover plate or the through hole at the bottom of the accommodating cavity to be in contact with the plurality of conductive sheets Thereby, the electronic device to be tested is electrically connected to the testing device, so that the electronic device to be tested can receive the test signal of the testing device.

使用本新型的治具,在需要以正面位元姿和反面位元姿測試電子裝置時,本新型的治具僅需要裝夾一次,降低了電子裝置的外觀被劃傷的幾率。With the jig of the present invention, when the electronic device needs to be tested in the front position and the reverse position, the jig of the present invention only needs to be clamped once, which reduces the chance of the appearance of the electronic device being scratched.

請參照圖1和圖2,一種用於承載待測試電子裝置200的治具100包括託盤10、兩個夾持件20和撥動件30。該託盤10設置有與電子裝置200的輪廓相適應的收容腔11,該電子裝置200能恰好收容在該收容腔11中。請同時參考圖3,該治具100還包括該插頭組件40、導電接觸組件50及蓋板60。Referring to FIGS. 1 and 2 , a jig 100 for carrying an electronic device 200 to be tested includes a tray 10 , two clamping members 20 , and a dial member 30 . The tray 10 is provided with a receiving cavity 11 adapted to the contour of the electronic device 200, and the electronic device 200 can be accommodated in the receiving cavity 11. Referring to FIG. 3 at the same time, the jig 100 further includes the plug assembly 40, the conductive contact assembly 50 and the cover plate 60.

在本實施方式中,該撥動件30可滑動地收容於該託盤10的一第一滑槽12中。該第一滑槽12與該收容腔11通過突出壁13相分隔,該突出壁13設置有與第一滑槽12和收容腔11相連通的兩個通孔131,該通孔131用於可滑動地收容該兩個夾持件20。該插頭組件40位於該兩個夾持件20之間,其可滑動地收容在突出壁13上位於兩個通孔131之間的第二滑槽15中。該導電接觸組件50收容在設置於託盤10末端且與收容腔11相連通的容置腔17中。In the embodiment, the dial member 30 is slidably received in a first sliding slot 12 of the tray 10 . The first sliding slot 12 is separated from the receiving cavity 11 by a protruding wall 13 . The protruding wall 13 is provided with two through holes 131 communicating with the first sliding slot 12 and the receiving cavity 11 . The two clamping members 20 are slidably received. The plug assembly 40 is located between the two clamping members 20 and is slidably received in the second sliding slot 15 between the two through holes 131 on the protruding wall 13. The conductive contact assembly 50 is housed in a receiving cavity 17 disposed at the end of the tray 10 and communicating with the receiving cavity 11.

該夾持件20能夠沿著圖1和圖2中的X方向在通孔131中相對託盤10滑動,該夾持件20能夠卡住該電子裝置200而使之無法移動。該撥動件30能夠沿著圖1和圖2中的Y方向在第一滑槽12中相對託盤10滑動,該撥動件30用於推動該夾持件20滑動。該插頭組件40包括插頭41,該導電接觸組件50包括多個導電片51,每個導電片51通過導線(未示出)與插頭41的一個導電端子(未示出)相連接。在本實施方式中,該插頭組件40和導電接觸組件50均能沿著圖1和圖2中的X方向相對託盤10滑動。該蓋板60上設置有與該多個導電片51相對應的通孔61。The holder 20 is slidable relative to the tray 10 in the through hole 131 along the X direction in FIGS. 1 and 2, and the holder 20 can catch the electronic device 200 so as not to move. The dial member 30 is slidable relative to the tray 10 in the first chute 12 in the Y direction in FIGS. 1 and 2, and the dial member 30 is used to urge the grip member 20 to slide. The plug assembly 40 includes a plug 41 that includes a plurality of conductive sheets 51, each of which is coupled to a conductive terminal (not shown) of the plug 41 by a wire (not shown). In the present embodiment, both the plug assembly 40 and the conductive contact assembly 50 are slidable relative to the tray 10 in the X direction of FIGS. 1 and 2. The cover plate 60 is provided with a through hole 61 corresponding to the plurality of conductive sheets 51.

使用時,首先將待測試電子裝置200放置在該收容腔11中,並撥動該撥動件30使該夾持件20卡住該電子裝置200,然後推動該插頭組件40,使插頭41的導電端子部分插入電子裝置200的插槽中。此後,將治具100放置到測試裝置(未示出)上,測試裝置的探針穿過該蓋板60上的通孔61與導電片51相接觸,從而將測試裝置與該待測試電子裝置200電連接。該測試裝置可以通過讀取待測試電子裝置200中的資料或者向待測試電子裝置200寫入資料對待測試電子裝置200進行測試。測試完成後,滑動該插頭組件40使插頭41的導電端子部分脫離電子裝置200,然後撥動該撥動件30使夾持件20不再卡持該電子裝置200,此時,可以將該電子裝置200從收容腔11中取出。下文將對治具100的具體結構進行詳細描述。In use, the electronic device 200 to be tested is first placed in the receiving cavity 11 , and the dialing member 30 is toggled to cause the clamping member 20 to catch the electronic device 200 , and then the plug assembly 40 is pushed to make the plug 41 The conductive terminal portion is inserted into the slot of the electronic device 200. Thereafter, the jig 100 is placed on a test device (not shown), and the probe of the test device contacts the conductive sheet 51 through the through hole 61 in the cover plate 60, thereby connecting the test device and the electronic device to be tested. 200 electrical connections. The test device can test the electronic device 200 to be tested by reading the data in the electronic device 200 to be tested or writing data to the electronic device 200 to be tested. After the test is completed, the plug assembly 40 is slid to disengage the conductive terminal portion of the plug 41 from the electronic device 200, and then the toggle member 30 is toggled so that the clamping member 20 no longer holds the electronic device 200. At this time, the electronic device can be used. The device 200 is taken out of the housing chamber 11. The specific structure of the jig 100 will be described in detail below.

如圖3所示,在本實施方式中,該第一滑槽12的一側壁121設置有凹槽122,該凹槽122的頂部123設置有開口124。該撥動件30的一側設置有凸塊31,該凸塊31收容在該凹槽122中,並與其頂部123相抵觸。由於該凸塊31受到該頂部123的抵觸,該撥動件30無法脫離該第一滑槽12。需要將撥動件30拆下時,滑動該撥動件30直至該凸塊31移動至該開口124的位置,該凸塊31不再受到該頂部123的限制,從而允許從該第一滑槽12中取出該撥動件30。As shown in FIG. 3 , in the embodiment, a sidewall 121 of the first sliding slot 12 is provided with a recess 122 , and a top portion 123 of the recess 122 is provided with an opening 124 . One side of the dial member 30 is provided with a bump 31 which is received in the recess 122 and which is in contact with the top portion 123 thereof. Since the bump 31 is resisted by the top portion 123, the dial member 30 cannot be separated from the first sliding slot 12. When the dial 30 needs to be removed, the dial 30 is slid until the bump 31 moves to the position of the opening 124, and the bump 31 is no longer restricted by the top 123, thereby allowing the first chute to be removed from the first chute. The dial 30 is taken out in 12.

在本實施方式中,每個夾持件20包括滑塊21和自滑塊21的末端伸出的凸出部22。該每一滑塊21滑動地收容在該託盤10的突出壁13的通孔131中,並且能夠沿著圖1和圖2中的X方向相對託盤10滑動。該託盤10的一端向內伸出兩個凸出部14(圖1可見)。當該夾持件20滑動至如圖1所示的鎖定位置時,該凸出部22及凸出部14勾住該電子裝置200的上表面,從而能夠將電子裝置200定位在該收容腔11中而無法移動。In the present embodiment, each of the holding members 20 includes a slider 21 and a projection 22 projecting from the end of the slider 21. Each of the sliders 21 is slidably received in the through hole 131 of the protruding wall 13 of the tray 10, and is slidable relative to the tray 10 in the X direction in FIGS. 1 and 2. One end of the tray 10 projects inwardly from the two projections 14 (shown in Figure 1). When the clamping member 20 is slid to the locking position as shown in FIG. 1 , the protruding portion 22 and the protruding portion 14 are hooked on the upper surface of the electronic device 200 , so that the electronic device 200 can be positioned in the receiving cavity 11 . Can't move.

如圖3所示,在本實施方式中,該撥動件30還包括本體32及自本體32的兩端向外伸出的彎折部33。該本體32收容在該第一滑槽12的底部125上的通孔126中,該撥動件30滑動至本體32的末端與通孔126的一端接觸的位置時,該撥動件30無法繼續向前滑動。As shown in FIG. 3 , in the present embodiment, the dial member 30 further includes a body 32 and a bent portion 33 extending outward from both ends of the body 32 . The body 32 is received in the through hole 126 of the bottom portion 125 of the first sliding slot 12. When the sliding member 30 slides to a position where the end of the body 32 contacts the one end of the through hole 126, the dial 30 cannot continue. Slide forward.

該彎折部33與該底部125相對的表面上形成有推動柱34,該夾持件20的滑塊21上設置有收容槽23,該推動柱34收容在該收容槽23中。在本實施方式中,該收容槽23的相對的兩側壁均包括平面231、平面233以及連接平面231和233的斜面232。該平面231和233與圖1和圖2中的Y方向大致平行。因此,當推動柱34跟隨撥動件30移動從收容槽23的一端移動至另一端過程中,該推動柱34會接觸到該兩個斜面232中的一個,從而使得該夾持件20受到該推動柱34的推動而滑動。該夾持件20因此能夠在圖1所示的鎖定位置和圖2所示的解鎖位置之間滑動。A pushing column 34 is formed on the surface of the bent portion 33 opposite to the bottom portion 125. The slider 21 of the clamping member 20 is provided with a receiving groove 23, and the pushing column 34 is received in the receiving groove 23. In this embodiment, the opposite sidewalls of the receiving slot 23 include a plane 231, a plane 233, and a slope 232 connecting the planes 231 and 233. The planes 231 and 233 are substantially parallel to the Y direction in FIGS. 1 and 2. Therefore, when the push column 34 follows the movement of the dial member 30 from one end of the receiving groove 23 to the other end, the push column 34 contacts one of the two inclined faces 232, so that the holding member 20 receives the same. The push of the column 34 is pushed to slide. The clamp 20 is thus slidable between the locked position shown in Figure 1 and the unlocked position shown in Figure 2 .

如圖4和5所示,該插頭組件40還包括插頭承載部42和蓋板43,該蓋板43通過螺釘固定在該承載部42。該蓋板43設置有容納腔431,該容納腔431和容納腔421構成與插頭41的主體411的輪廓相一致的腔體,該主體411恰好收容在該腔體中。該插頭41的導電端子部分412完全位於該腔體之外。該容納腔421的兩端分別設置有止擋部422和423,該插頭41的主體411的兩端分別與止擋部422和423相抵觸,從而使插頭41受到止擋部422和423的限制而無法移動。該止擋部422的長度略小於主體411的寬度,如此,在電子裝置200的測試完成後,操作人員推動該插頭組件40將導電端子部分412拔出電子裝置200的插槽過程中,操作人員施加的拉力通過止擋部422均勻的施加到該主體411上,從而有利於導電端子部分412的順利拔出。As shown in Figures 4 and 5, the header assembly 40 further includes a plug carrier portion 42 and a cover plate 43 that is secured to the carrier portion 42 by screws. The cover plate 43 is provided with a receiving chamber 431 which constitutes a cavity which conforms to the contour of the body 411 of the plug 41, and the body 411 is just received in the cavity. The conductive terminal portion 412 of the plug 41 is completely outside the cavity. The two ends of the accommodating chamber 421 are respectively provided with stopper portions 422 and 423, and the two ends of the main body 411 of the plug 41 respectively interfere with the stopper portions 422 and 423, so that the plug 41 is restricted by the stopper portions 422 and 423. Can't move. The length of the stopping portion 422 is slightly smaller than the width of the main body 411. Thus, after the test of the electronic device 200 is completed, the operator pushes the plug assembly 40 to pull the conductive terminal portion 412 out of the slot of the electronic device 200, and the operator The applied pulling force is uniformly applied to the main body 411 through the stopper portion 422, thereby facilitating the smooth extraction of the conductive terminal portion 412.

在本實施方式中,承載部42的兩側均設置有伸出部424,該蓋板43的兩側亦設置有伸出部432,每個伸出部424和與之相對的伸出部432之間形成有導向槽44(圖3可見),該導向槽44與託盤10的第二滑槽15側壁上的導向肋16相配合,實現插頭組件40滑動連接於該託盤10。In this embodiment, the two sides of the carrying portion 42 are provided with a protruding portion 424. The two sides of the cover plate 43 are also provided with a protruding portion 432, and each protruding portion 424 and a protruding portion 432 opposite thereto A guide groove 44 (shown in FIG. 3) is formed between the guide groove 44 and the guide rib 16 on the side wall of the second sliding groove 15 of the tray 10, so that the plug assembly 40 is slidably coupled to the tray 10.

如圖4和5所示,該導電接觸組件50還包括導電片承載部52和導電片固定部53。該導電片承載部52和該插頭承載部42通過一連接部70連接在一起。在本實施方式中,該導電片承載部52、該插頭承載部42及該連接部70通過注塑成型的方式一體成型。該連接部70設置有收容腔71,該收容腔71用於容納連接插頭41的導電片和導電接觸組件50的導電片51的導線。在其他實施方式中,該連接部70可以省略,該導電片承載部52固定在該託盤10的容置腔17中,該導電片承載部52和插頭承載部42為分別單獨成型的零件。As shown in FIGS. 4 and 5, the conductive contact assembly 50 further includes a conductive sheet carrying portion 52 and a conductive sheet fixing portion 53. The conductive sheet carrying portion 52 and the plug carrying portion 42 are connected together by a connecting portion 70. In the present embodiment, the conductive sheet carrying portion 52, the plug carrying portion 42, and the connecting portion 70 are integrally molded by injection molding. The connecting portion 70 is provided with a receiving cavity 71 for accommodating the conductive strip of the plug 41 and the conductive strip 51 of the conductive contact assembly 50. In other embodiments, the connecting portion 70 can be omitted. The conductive sheet carrying portion 52 is fixed in the receiving cavity 17 of the tray 10. The conductive sheet carrying portion 52 and the plug carrying portion 42 are separately formed parts.

在本實施方式中,該導電接觸組件50的導電片51包括大致相互平行的頂部511和底部512以及連接於頂部511的一端和底部512的一端的隔離部513。該導電片承載部52上設置有相互隔離的卡槽521,每個卡槽521中設置有卡塊522。每個導電片51收容在一卡槽521中,並且扣在其中的卡塊522上,即其頂部511、底部512和隔離部513的內表面分別與卡塊522的頂部、底部及端部相抵觸。導電片固定部53固定在該導電片承載部52的末端,其與導電片51的隔離部513的外表面相抵觸,從而使得導電片51無法脫離導電片承載部52。在本實施方式中,該導電片固定部53通過卡勾連接到該導電片承載部52。在其他實施方式中,該導電片固定部53可以通過螺釘固定到該導電片承載部52。In the present embodiment, the conductive sheet 51 of the conductive contact assembly 50 includes a top portion 511 and a bottom portion 512 that are substantially parallel to each other, and a partition portion 513 that is connected to one end of the top portion 511 and one end of the bottom portion 512. The conductive sheet carrying portion 52 is provided with card slots 521 that are isolated from each other, and each of the card slots 521 is provided with a card block 522. Each of the conductive sheets 51 is received in a card slot 521 and is fastened to the card block 522, that is, the top surface 511, the bottom portion 512 and the inner surface of the partition portion 513 are respectively opposite to the top, bottom and end portions of the card block 522. conflict. The conductive sheet fixing portion 53 is fixed to the end of the conductive sheet carrying portion 52, which is in contact with the outer surface of the partition portion 513 of the conductive sheet 51, so that the conductive sheet 51 cannot be detached from the conductive sheet carrying portion 52. In the present embodiment, the conductive sheet fixing portion 53 is connected to the conductive sheet carrying portion 52 by a hook. In other embodiments, the conductive sheet fixing portion 53 may be fixed to the conductive sheet carrying portion 52 by screws.

如圖3所示,在本實施方式中,託盤10的容置腔17的底部相應該導電片51設置有通孔171。在需要時,可將如圖1所示的治具100翻轉180度放置到測試裝置上,測試裝置的探針可以穿過通孔171接觸導電片51的底部512,從而將測試裝置與該待測試電子裝置200電連接。如此,假定電子裝置200包括前置攝像頭和後置攝像頭,在測試後置攝像頭時,可以將治具100以圖1所示的位元姿放置到測試裝置上,使後置攝像頭能夠接收測試指令拍攝特定位置的樣品。當測試前置攝像頭時,將治具100翻轉180度,使得前置攝像頭能夠收測試指令拍攝到特定位置的樣品。As shown in FIG. 3, in the present embodiment, the bottom of the accommodating cavity 17 of the tray 10 is provided with a through hole 171 corresponding to the conductive sheet 51. When necessary, the jig 100 shown in FIG. 1 can be flipped 180 degrees onto the test device, and the probe of the test device can contact the bottom 512 of the conductive sheet 51 through the through hole 171, thereby the test device and the standby device The test electronics 200 are electrically connected. As such, it is assumed that the electronic device 200 includes a front camera and a rear camera. When testing the rear camera, the jig 100 can be placed on the test device in the bit position shown in FIG. 1 to enable the rear camera to receive the test command. Take a sample at a specific location. When testing the front camera, the jig 100 is flipped 180 degrees so that the front camera can receive the test command to take a sample at a specific position.

如圖4和5所示,在本實施方式中,該連接部70的一側伸出有限位部72,當該插頭組件40滑動至圖1所示的位置時,該限位部72的末端位於該第一滑槽12中(圖1可見)。當該插頭組件40滑動至圖2所示的位置時,該限位部72的末端位於該容置腔17中,此時,若該撥動件30滑動至圖2所示的位置時,該撥動件30將擋住該限位部72,使該插頭組件40無法再次滑動至圖1所示的位置。這樣設置的作用在於,當該夾持件20處於圖2所示的解鎖位置時,電子裝置200不會受到夾持件20的卡持,可能會因電子裝置200沒有準確定位而導致電子裝置200的插槽與插頭41的導電端子部分412沒有對正,若此時將插頭組件40推動至圖1所示的位置時,可能會損壞導電端子部分412或者電子裝置200的插槽。As shown in FIGS. 4 and 5, in the present embodiment, one side of the connecting portion 70 protrudes from the limiting portion 72, and when the plug assembly 40 is slid to the position shown in FIG. 1, the end of the limiting portion 72 Located in the first chute 12 (visible in Figure 1). When the plug assembly 40 is slid to the position shown in FIG. 2, the end of the limiting portion 72 is located in the accommodating cavity 17, and at this time, if the ejector member 30 is slid to the position shown in FIG. The dial 30 will block the stop 72 so that the plug assembly 40 cannot slide again to the position shown in FIG. The effect of the arrangement is that when the clamping member 20 is in the unlocked position shown in FIG. 2, the electronic device 200 is not caught by the clamping member 20, and the electronic device 200 may be caused by the electronic device 200 not being accurately positioned. The slot is not aligned with the conductive terminal portion 412 of the plug 41. If the plug assembly 40 is pushed to the position shown in FIG. 1, the conductive terminal portion 412 or the slot of the electronic device 200 may be damaged.

如圖2和3所示,在本實施方式中,該蓋板60與該託盤10分別單獨成型,該蓋板60通過緊固件固定在該託盤10上,該蓋板60與容置腔17的底部相對。可以理解地,在需要時,該蓋板60與該託盤10可以一體成型。As shown in FIG. 2 and FIG. 3, in the present embodiment, the cover plate 60 and the tray 10 are separately formed, and the cover plate 60 is fixed on the tray 10 by a fastener, and the cover plate 60 and the receiving cavity 17 are The bottom is opposite. It will be appreciated that the cover plate 60 and the tray 10 may be integrally formed as needed.

本新型的一個優點在於,該治具100的正面和反面均包括與導電片51相對應的通孔(即通孔61和171),使得無需取下電子裝置200即能夠實現以如圖1所示的正面位元姿測試電子裝置200以及以翻轉180度後的反面位元姿測試電子裝置200。與現有的治具相比,在需要以正面位元姿和反面位元姿測試電子裝置200時,本新型的治具100無需取下及再次裝載電子裝置200,降低了電子裝置200的外觀被劃傷的幾率。An advantage of the present invention is that both the front side and the back side of the jig 100 include through holes (ie, through holes 61 and 171) corresponding to the conductive sheets 51, so that it can be realized as shown in FIG. 1 without removing the electronic device 200. The front bit posture test electronic device 200 is shown and the electronic device 200 is tested in a reverse face position after flipping 180 degrees. Compared with the existing jig, when the electronic device 200 needs to be tested in the front bit posture and the reverse bit position, the jig 100 of the present invention does not need to remove and reload the electronic device 200, thereby reducing the appearance of the electronic device 200. The chance of scratching.

本新型的另一個優點在於,插頭41及連接插頭41與導電片51連接的導線受到蓋板43、插頭承載部42以及連接部70的保護,從而不會在插拔插頭41過程中受到損壞。Another advantage of the present invention is that the wires of the plug 41 and the connection plug 41 connected to the conductive sheet 51 are protected by the cover plate 43, the plug carrying portion 42 and the connecting portion 70 so as not to be damaged during the insertion and removal of the plug 41.

本新型的另一個優點在於,撥動件30和插頭組件40的限位元部72的配合,能夠防止電子裝置200沒有準確定位而可能造成的插頭41的導電端子部分412或者電子裝置200的插槽的損壞。Another advantage of the present invention is that the cooperation of the dial member 30 and the limiting portion 72 of the plug assembly 40 can prevent the conductive terminal portion 412 of the plug 41 or the insertion of the electronic device 200 from being caused by the electronic device 200 not being accurately positioned. Damage to the slot.

本新型的另一個優點在於,插頭組件40和導電接觸組件50可以作為一個整體安裝到託盤10或自託盤10上拆下,便於插頭組件40和導電接觸組件50的更換和維修。Another advantage of the present invention is that the header assembly 40 and the conductive contact assembly 50 can be mounted to or removed from the tray 10 as a unit to facilitate replacement and maintenance of the header assembly 40 and the conductive contact assembly 50.

100‧‧‧治具100‧‧‧ fixture

200‧‧‧電子裝置200‧‧‧Electronic devices

10‧‧‧託盤10‧‧‧Tray

11‧‧‧收容腔11‧‧‧ containment chamber

12‧‧‧第一滑槽12‧‧‧First chute

121‧‧‧側壁121‧‧‧ side wall

122‧‧‧凹槽122‧‧‧ Groove

123‧‧‧頂部123‧‧‧ top

124‧‧‧開口124‧‧‧ openings

125‧‧‧底部125‧‧‧ bottom

126‧‧‧通孔126‧‧‧through hole

13‧‧‧突出壁13‧‧‧Leading wall

131‧‧‧通孔131‧‧‧through hole

14‧‧‧凸出部14‧‧‧Protruding

15‧‧‧第二滑槽15‧‧‧Second chute

16‧‧‧導向肋16‧‧‧ Guide ribs

17‧‧‧容置腔17‧‧‧容容

171‧‧‧通孔171‧‧‧through hole

20‧‧‧夾持件20‧‧‧Clamping parts

21‧‧‧滑塊21‧‧‧ Slider

22‧‧‧凸出部22‧‧‧Protruding

23‧‧‧收容槽23‧‧‧ Containing trough

231、233‧‧‧平面231, 233‧‧ ‧ plane

232‧‧‧斜面232‧‧‧Bevel

30‧‧‧撥動件30‧‧‧WD parts

31‧‧‧凸塊31‧‧‧Bumps

32‧‧‧本體32‧‧‧Ontology

33‧‧‧彎折部33‧‧‧Bends

34‧‧‧推動柱34‧‧‧Promoting column

40‧‧‧插頭組件40‧‧‧plug assembly

41‧‧‧插頭41‧‧‧ plug

411‧‧‧主體411‧‧‧ Subject

412‧‧‧導電端子部分412‧‧‧Electrical terminal parts

42‧‧‧承載部42‧‧‧Loading Department

421‧‧‧容納腔421‧‧‧ accommodating chamber

422、423‧‧‧止擋部422, 423‧‧ ‧ stop

424‧‧‧伸出部424‧‧‧Outreach

43‧‧‧蓋板43‧‧‧ Cover

431‧‧‧容納腔431‧‧‧ accommodating chamber

432‧‧‧伸出部432‧‧‧Outreach

44‧‧‧導向槽44‧‧‧ Guide groove

50‧‧‧導電接觸組件50‧‧‧Electrical contact components

51‧‧‧導電片51‧‧‧Conductor

511‧‧‧頂部511‧‧‧ top

512‧‧‧底部512‧‧‧ bottom

513‧‧‧隔離部513‧‧‧Isolation Department

52‧‧‧導電片承載部52‧‧‧ Conductive sheet bearing

521‧‧‧卡槽521‧‧‧ card slot

522‧‧‧卡塊522‧‧‧ card block

53‧‧‧導電片固定部53‧‧‧Conductor fixing parts

60‧‧‧蓋板60‧‧‧ cover

61‧‧‧通孔61‧‧‧through hole

70‧‧‧連接部70‧‧‧Connecting Department

71‧‧‧收容腔71‧‧‧ containment chamber

72‧‧‧限位部72‧‧‧Limited

圖1係本新型的治具承載待測試電子裝置的立體圖。FIG. 1 is a perspective view of the electronic device of the present invention carrying the electronic device to be tested.

圖2係本新型的治具的立體圖,其示意出一夾持件由圖1所示的鎖緊位置移動至一解鎖位置。2 is a perspective view of the jig of the present invention, illustrating a gripping member moved from the locked position shown in FIG. 1 to an unlocked position.

圖3係本新型的治具的分解圖。Figure 3 is an exploded view of the jig of the present invention.

圖4係本新型的治具的插頭組件和導電接觸組件的分解圖。4 is an exploded view of the plug assembly and the conductive contact assembly of the present jig.

圖5係本新型的治具的插頭組件和導電接觸組件的另一角度的分解圖。Figure 5 is an exploded perspective view of the plug assembly and the conductive contact assembly of the present invention.

100‧‧‧治具 100‧‧‧ fixture

200‧‧‧電子裝置 200‧‧‧Electronic devices

10‧‧‧託盤 10‧‧‧Tray

11‧‧‧收容腔 11‧‧‧ containment chamber

12‧‧‧第一滑槽 12‧‧‧First chute

13‧‧‧突出壁 13‧‧‧Leading wall

14‧‧‧凸出部 14‧‧‧Protruding

20‧‧‧夾持件 20‧‧‧Clamping parts

30‧‧‧撥動件 30‧‧‧WD parts

72‧‧‧限位部 72‧‧‧Limited

Claims (6)

一種用於承載待測試電子裝置的治具,包括託盤,該託盤設置有收容腔,該收容腔用於容納該待測試電子裝置,其改良在於,還包括一插頭組件、一導電接觸組件和蓋板;
該託盤的末端設置有一容置腔;
該插頭組件滑動地連接於該託盤,該插頭組件包括一插頭,該插頭用於與該待測試電子裝置的一插槽相適配;
該導電接觸組件位於該容置腔中,該導電接觸組件包括多個導電片,每個導電片與該插頭的一導電端子相連接;
該蓋板與該容置腔的底部相對,該蓋板及該容置腔的底部均設置有與所述多個導電片對應的通孔,從而允許一測試裝置的探針穿過蓋板的通孔或者該容置腔的底部的通孔而與所述多個導電片相接觸,從而將該待測試電子裝置電連接到該測試裝置,使得該待測試電子裝置能夠接收到測試裝置的測試訊號。
A fixture for carrying an electronic device to be tested, comprising a tray, the tray is provided with a receiving cavity for accommodating the electronic device to be tested, and the improvement comprises: a plug component, a conductive contact component and a cover board;
The end of the tray is provided with a receiving cavity;
The plug assembly is slidably coupled to the tray, the plug assembly including a plug for adapting to a slot of the electronic device to be tested;
The conductive contact assembly is located in the accommodating cavity, the conductive contact assembly includes a plurality of conductive sheets, each conductive sheet being connected to a conductive terminal of the plug;
The cover plate is opposite to the bottom of the accommodating cavity, and the bottom of the cover plate and the accommodating cavity are provided with through holes corresponding to the plurality of conductive sheets, thereby allowing the probe of a test device to pass through the cover plate a through hole or a through hole at a bottom of the accommodating cavity contacts the plurality of conductive sheets, thereby electrically connecting the electronic device to be tested to the testing device, so that the electronic device to be tested can receive the test of the testing device Signal.
如申請專利範圍第1項所述之用於承載待測試電子裝置的治具,其中,該蓋板與該託盤一體成型。The jig for carrying the electronic device to be tested, as described in claim 1, wherein the cover plate is integrally formed with the tray. 如申請專利範圍第1項所述之用於承載待測試電子裝置的治具,其中,該蓋板與該託盤分別單獨成型,該蓋板通過緊固件固定在該託盤。The jig for carrying the electronic device to be tested, as described in claim 1, wherein the cover plate and the tray are separately formed separately, and the cover plate is fixed to the tray by a fastener. 如申請專利範圍第1項所述之用於承載待測試電子裝置的治具,其中,該插頭組件包括插頭承載部,該導電接觸組件包括導電片承載部,該多個導電片固定在該導電片承載部上,該插頭承載部和該導電片承載部通過一體成型方式成型。The jig for carrying the electronic device to be tested, according to claim 1, wherein the plug assembly comprises a plug bearing portion, the conductive contact assembly comprises a conductive sheet bearing portion, and the plurality of conductive sheets are fixed at the conductive On the sheet carrying portion, the plug carrying portion and the conductive sheet carrying portion are formed by integral molding. 如申請專利範圍第4項所述之用於承載待測試電子裝置的治具,其中,該導電片承載部設置多個卡槽,該多個導電片分別收容在該多個卡槽中。The jig for carrying the electronic device to be tested, as described in claim 4, wherein the conductive sheet carrying portion is provided with a plurality of card slots, and the plurality of conductive sheets are respectively received in the plurality of card slots. 如申請專利範圍第5項所述之用於承載待測試電子裝置的治具,其中,每個導電片包括相互平行的頂部和底部以及連接於頂部的一端和底部的一端的隔離部,每個卡槽中設置有卡塊,該頂部、底部和隔離部的內表面分別與卡塊的頂部、底部及端部相抵觸,該頂部與該蓋板的一通孔對齊,該底部與該容置腔的底部的一通孔對齊。The jig for carrying the electronic device to be tested, as described in claim 5, wherein each of the conductive sheets includes a top and a bottom parallel to each other and a partition connected to one end of the top and one end of the bottom, each of each A card block is disposed in the card slot, and the inner surfaces of the top portion, the bottom portion and the partition portion respectively abut against the top, the bottom portion and the end portion of the card block, and the top portion is aligned with a through hole of the cover plate, the bottom portion and the receiving cavity A through hole at the bottom is aligned.
TW101222302U 2012-11-08 2012-11-16 Fixture for accommodating an electronic device during test TWM482745U (en)

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Application Number Priority Date Filing Date Title
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