TWM462852U - Structure device using prism combination for micro-shift measurement device - Google Patents
Structure device using prism combination for micro-shift measurement device Download PDFInfo
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本創作係關於一種稜鏡組合進行微小位移測量之結構裝置,尤指藉由光源強度改善,搭配對焦反射裝置與稜鏡組合結構,並配合自行設計出之訊號檢出裝置,以提升對待測物進行測量微小角度或位移之解析度。 This creator is a structural device for measuring the displacement of a cymbal combination, especially by improving the intensity of the light source, combining the structure of the focusing and reflecting device with the cymbal, and matching the signal detecting device designed by itself to enhance the object to be tested. Perform a measurement of the resolution of a small angle or displacement.
習知,直角稜鏡1只為一等腰三角形之透鏡(如第一、二圖),只因常需要調整角度,便透過設計將直角稜鏡1固設於具有驅動器11之旋轉平台12上,該直角稜鏡結構常被使用於小角度及小位移之測量裝置上,該小角度及小位移之測量裝置包括:一光源2,其能發出線性偏極的光源;一分光鏡21,能將光源產生反射光211與透射光212;一直角稜鏡1,其上之斜角邊置有待測物13,該直角稜鏡1供射透射光折212射進入直角稜鏡1,經過直角邊至 斜邊上做一次衰退反射後射向另一直角邊;二解偏板22、23,第一解偏板22供直角稜鏡1之透射光212射入,第二解偏板23供分光鏡21之反射光211射入;二光偵測器24、25,第一、二光偵器24、25分別供第一、二解偏板24、25之透射光212、反射光211射入,並轉成第一參考電訊與第一測試電訊以及轉動直角稜鏡1後產生之第二參考電訊與第二測試電訊;一鎖相放大器26,能測出第一、二測試電訊之電訊差異;以及一電腦27,能計算出第一、二測試電訊之相位變化,得出旋轉角度與方向。 Conventionally, a right-angled cymbal 1 is only a lens of an isosceles triangle (such as the first and second figures), and the right angle 稜鏡 1 is fixed to the rotating platform 12 having the driver 11 by design because of the need to adjust the angle. The right angle 稜鏡 structure is often used in a small angle and small displacement measuring device, the small angle and small displacement measuring device comprises: a light source 2, which can emit a linear polarized light source; a beam splitter 21, can The light source generates reflected light 211 and transmitted light 212; a constant angle 稜鏡1, on which an oblique angle is placed with the object 13 to be tested, and the right angle 稜鏡1 is transmitted through the light-transmissive light 212 to enter the right angle 稜鏡1, passing through a right angle Side to The concave side is deflected and reflected to the other right angle side; the second depolarization plates 22, 23, the first depolarization plate 22 is for the transmitted light 212 of the right angle 稜鏡1, and the second depolarization plate 23 is for the spectroscope The reflected light 211 of 21 is incident; the second photodetectors 24 and 25, the first and second photodetectors 24 and 25 respectively transmit the transmitted light 212 and the reflected light 211 of the first and second depolarization plates 24 and 25, respectively. And converting into the first reference telecommunications and the first test telecommunications and the second reference telecommunications and the second test telecommunications generated after rotating the right angle 稜鏡1; a lock-in amplifier 26, capable of detecting the telecommunication difference between the first and second test telecommunications; And a computer 27, can calculate the phase change of the first and second test telecommunications, and obtain the rotation angle and direction.
再操作上,先將待測物13置於直角稜鏡1之斜邊上,該待測物13與直角稜鏡1能同步旋轉;以光源2射向分光鏡21,形成產生反射光211與透射光212,透射光212能射向待測物13;取得第一參考電訊,該反射光211先穿經通過第二解偏板23,再進入第二光偵測器25,以取得第一參考電訊;取得第一測試電訊,該透射光212先垂直射入直角稜鏡1,經過一次衰退全反射後向直角稜鏡1另一直角 邊,再反射至第一解偏板22,並進入第一光偵測器24,以取得待測物兩邊界光相位差之第一測試電訊;對焦取得第二參考電訊與第二測試訊電訊,即將直角稜鏡1轉動小角度,依第三第四步驟以取得第二參考電訊與待測物13兩邊界光相位差之第二測試電訊;偵測相位差,將第一、二參考電訊與測試電訊交由鎖相放大器26放大偵測出其相位的變化量;計算位移量與轉動角度,將鎖相放大器26偵測出其相位的變化量所測出之電訊,經電腦27運算,算出直角稜鏡12旋轉角度與方向,並得知待測物13之旋轉角度、位移量、間隙及高度差。 In operation, the object to be tested 13 is first placed on the oblique side of the right angle 稜鏡1, and the object to be tested 13 can rotate synchronously with the right angle 稜鏡1; the light source 2 is directed toward the beam splitter 21 to form the reflected light 211 and The transmitted light 212, the transmitted light 212 can be directed to the object to be tested 13; the first reference signal is obtained, and the reflected light 211 passes through the second depolarization plate 23 and then enters the second photodetector 25 to obtain the first Referring to the telecommunication; obtaining the first test telecommunication, the transmitted light 212 is first injected perpendicularly into the right angle 稜鏡1, and after a full reflection of the recession, the right angle 稜鏡1 is another right angle Edge, then reflected to the first depolarization plate 22, and enters the first photodetector 24 to obtain the first test telecommunication of the two-edge optical phase difference of the object to be tested; focusing to obtain the second reference telecommunication and the second test telecommunication , that is, the right angle 稜鏡 1 rotates a small angle, according to the third and fourth steps to obtain the second test telecommunication of the second reference telecommunication and the boundary of the object 13 with the optical phase difference; detecting the phase difference, the first and second reference telecommunication The test telecommunication is connected to the lock-in amplifier 26 to amplify and detect the change amount of the phase; the displacement amount and the rotation angle are calculated, and the lock-in amplifier 26 detects the change of the phase, and the telecommunication is measured by the computer 27, Calculate the rotation angle and direction of the right angle 稜鏡12, and know the rotation angle, displacement amount, gap and height difference of the object to be tested 13.
前述之直角稜鏡1採一次衰退全反射,致待測物13兩邊界光相位差之第一、二測試訊號不夠明顯,進而影嚮電訊之解析度。 The above-mentioned right angle 稜鏡1 adopts a decay total reflection, so that the first and second test signals of the two-edge optical phase difference of the object to be tested 13 are not sufficiently obvious, and thus the resolution of the telecommunications is affected.
緣是,本創作人有感上述缺失之可改善,乃特潛心研究並配合學理之運用,終於提出一種設計合理且有效改善上述缺失。 The reason is that this creator feels that the above-mentioned deficiency can be improved. He is devoted to research and cooperates with the application of theory, and finally proposes a reasonable design and effectively improves the above-mentioned deficiency.
本創作之主要目的在於提供一種加強控制調配光源波 長之稜鏡組合進行微小位移測量之結構裝置。其係在光源與第一分光鏡間設有單光儀,利用此不同的面的偏轉角度與刻痕,來分析第一入射光的光譜,以取得不同波長光源,更可在單光儀與第一分光鏡間設有偏光裝置,控制第一入射光的大小,偏光裝置與第一分光鏡間設有虹膜,使第一入射光具有收縮的能力,作為控制第一入射光源的大小,能調整至適當波長。 The main purpose of this creation is to provide a way to enhance the control of the source light. Long 稜鏡 combines structural devices for small displacement measurement. The utility model is characterized in that a single light meter is arranged between the light source and the first beam splitter, and the deflection angle and the score of the different surfaces are used to analyze the spectrum of the first incident light to obtain different wavelength light sources, and more in the single light meter and A polarizing device is disposed between the first beam splitters to control the size of the first incident light, and an iris is arranged between the polarizing device and the first beam splitter to enable the first incident light to have a contraction capability, as the size of the first incident light source can be controlled. Adjust to the appropriate wavelength.
本創作之次要目的在於選用對焦反射裝置提升待測物兩邊緣光的強度值變化之稜鏡組合進行微小位移測量之結構裝置。該對焦反射裝置包括一顯微物鏡、一與顯微物鏡對立之面鏡、一固定於面鏡後能改變面鏡位置之致動器及一偵測面鏡位置之位移探針;該對焦反射裝置讓光偵測器能檢測出待測物兩邊緣光的強度值變化。 The secondary purpose of this creation is to select a structure device that uses a focusing reflection device to increase the change in the intensity value of the light at both edges of the object to be tested and to perform a small displacement measurement. The focus reflection device comprises a microscope objective, a mirror opposite to the microscope objective, an actuator fixed to the mirror after changing the position of the mirror, and a displacement probe for detecting the position of the mirror; the focus reflection The device allows the photodetector to detect changes in the intensity values of the light at both edges of the object to be tested.
本創作之又一目的在於選用稜鏡組合結構提升待測物解析度之稜鏡組合進行微小位移測量之結構裝置。該稜鏡組合結構包括:二直角稜鏡、二旋轉平台,以及一半波片;其係將半波片置於兩對立之第一、二直角稜鏡間;為使便於調整,於第一旋轉平台上設有第二旋轉平台,於第一、二旋轉平台上分別固設有相對應之第一、二直角稜鏡,即使第一、二直角稜鏡之斜邊呈相對立。 Another object of the present invention is to use a 稜鏡-combination structure to improve the resolution of the analyte to be combined and to perform a micro-displacement measurement. The cymbal combination structure comprises: two right angle 稜鏡, two rotating platforms, and a half wave plate; the half wave plate is placed between the two opposite first and second right angle ;; for easy adjustment, the first rotation A second rotating platform is arranged on the platform, and corresponding first and second right angles are respectively fixed on the first and second rotating platforms, even if the oblique edges of the first and second right angles are opposite.
本創作之又二目的在於自行設計稜鏡組合進行微小位移測量之結構裝置。其包括光源、第一分光鏡、稜鏡組合結構、第二分光鏡、第一放大器、第二放大器、訊號處理裝置、資料擷取裝置,及個人電腦。利用光源及單光儀, 以取得不同波長光源,再將其送入稜鏡組合結構,並將稜鏡組合結構的入射角設定為共振角,以作為初始角,由單光儀出射的光先由第一分光鏡穿過後,通過對焦反射裝置,再將反射光反射進入稜鏡組合結構,藉由稜鏡組合結構,經由具偏極化的分光鏡後,其反射光為後來的S偏振光,此光由第一線性光偵測器,取出兩邊緣光的電訊,並第二分光鏡穿透的P偏振光,此光由第二線性光偵測器,取出兩邊緣光的電訊,再將所獲得的訊號送入第一放大器進行放大電訊,將所得的第一訊號,送入第二微分放大器放大電訊,所得到第二電訊,將第一、二電訊送入訊號處理裝置進行雜訊過濾,經由訊號擷取裝置轉換為網路位元,再送入個人電腦,經運算處理可以得到微小位移,在不同波長輸入時,訊號強度差對微小位移有明顯的變化。 The second purpose of this creation is to design a structural device that combines small displacement measurements. The utility model comprises a light source, a first beam splitter, a chirp combination structure, a second beam splitter, a first amplifier, a second amplifier, a signal processing device, a data acquisition device, and a personal computer. Using a light source and a single light meter, To obtain different wavelength light sources, and then send them into the 稜鏡 composite structure, and set the incident angle of the 稜鏡 composite structure to the resonance angle as the initial angle, and the light emitted by the single illuminator is first passed by the first beam splitter. Through the focusing and reflecting device, the reflected light is reflected into the 稜鏡 composite structure. After the 稜鏡 combined structure, after passing through the polarizing beam splitter, the reflected light is the later S-polarized light, and the light is from the first line. a photodetector that takes out the telecommunications of the two edge lights and the P-polarized light that the second beam splitter penetrates. The light is taken by the second linear photodetector, and the telecommunications of the two edge lights are taken out, and the obtained signal is sent. The first amplifier is used to amplify the telecommunications, and the obtained first signal is sent to the second differential amplifier to amplify the telecommunications, and the second telecommunications is obtained, and the first and second telecommunications are sent to the signal processing device for noise filtering, and the signal is captured by the signal. The device is converted into a network bit and then sent to a personal computer. After the operation, a small displacement can be obtained. When inputting at different wavelengths, the signal intensity difference has a significant change to the small displacement.
為使 貴審查委員能對本創作之形狀、結構、功能及作用能有深入之瞭解,特列舉一實施例並配合圖式,詳細說明介紹本創作,然而所附圖式僅供參考與說明,並非用來對本創作加以限制。 In order to enable your review committee to have a deep understanding of the shape, structure, function and function of this creation, an example is given and the drawings are introduced to explain the creation in detail. However, the drawings are for reference and explanation only, not Used to limit this creation.
請同時參閱第四圖,係為本創作一種稜鏡組合進行微小位移測量之結構裝置之示意圖,圖中揭示微小位移測量裝置依序至少包括一光源3、一第一分光鏡31、一對焦反 射裝置32、一稜鏡組合結構33、一第二分光鏡34、一第一光偵測器35、一第二光偵測器36、一第一放大器37、一第二放大器38、一訊號處理裝置39、一資料擷取裝置40、一電腦41。其中光源3為第一入射光30;第一分光鏡31係接收第一入射光30,產生第一透射光301;對焦反射裝置32係將第一透射光301反射至第一分光鏡31之另一面,產生第一折射光302送至稜鏡組合結構33;稜鏡組合結構33係接收第一折射光302,投射置於稜鏡組合結構33上之待測物(圖未示),並產出第二折射光303;第二分光鏡34係接收稜鏡組合結構33投射經待測物之第二折射光303,以產出第三折射光304與第二透射光305,分送至第一光偵測器35與第二光偵測器36;第一光偵測器35係接收第二分光鏡34產出的第三折射光,產生測量到稜鏡組合結構33上待測物(圖未示)兩邊緣光的強度變化值,轉成左右兩邊緣位置之參考電訊;第二線性光偵測器36係接收第二分光鏡34產出的第二透射光,產生測量到稜鏡組合結構33上待測物兩邊緣光的強度變化值,轉成左右兩邊緣位置之測試電訊;第一放大器37係放大第一、二光偵測器35、36上所測得待測物右邊緣位置之參考電訊與右邊緣位置之測 試電訊;第二放大器38係放大第一、二光偵測器35、36上所測得待測物左邊緣位置參考電訊與左邊緣位置測試電訊;訊號處理裝置39係透過訊號線(圖未示),接收並過濾第一、二放大器37、38產生待測物左、右邊緣位置的參考電訊與測試電訊之雜訊;資料擷取裝置40係將訊號處理裝置39所產生待測物左、右邊緣位置的參考電訊與測試電訊經其內部程式運算轉換為網路位元資料傳至個人電腦41;經由本創作之實施,可提升對待測物測量微小角度或位移之解析度。 Please also refer to the fourth figure, which is a schematic diagram of a structural device for performing micro-displacement measurement. The micro-displacement measuring device sequentially includes at least one light source 3, a first beam splitter 31, and a focus counter. The illuminating device 32, the cymbal assembly 33, a second beam splitter 34, a first photodetector 35, a second photodetector 36, a first amplifier 37, a second amplifier 38, a signal The processing device 39, a data capturing device 40, and a computer 41. The light source 3 is the first incident light 30; the first beam splitter 31 receives the first incident light 30 to generate the first transmitted light 301; and the focusing and reflecting device 32 reflects the first transmitted light 301 to the first beam splitter 31. On one side, the first refracted light 302 is sent to the 稜鏡 composite structure 33; the 稜鏡 composite structure 33 receives the first refracted light 302, and projects the object to be tested (not shown) placed on the 稜鏡 composite structure 33, and produces The second refracting light 303 is received by the second beam splitter 34, and the second refracting light 303 is projected by the 稜鏡 combining structure 33 to generate the third refracted light 304 and the second transmitted light 305, and is distributed to the first a photodetector 35 and a second photodetector 36; the first photodetector 35 receives the third refracted light produced by the second dichroic mirror 34, and generates a sample to be measured on the 稜鏡 composite structure 33 ( The intensity change value of the two edge lights is converted into the reference telecommunication at the left and right edge positions; the second linear photodetector 36 receives the second transmitted light generated by the second beam splitter 34 to generate the measurement. The intensity change value of the light at both edges of the object to be tested on the combined structure 33 is converted into a test telecommunication at the left and right edge positions; A first amplifier 37 amplifies system, measured with reference to the measured position of the right edge telecommunications right edge position of the object to be detected on the photodetector 35, two Trial telecommunications; the second amplifier 38 amplifies the left edge position reference telecommunication and the left edge position test telecommunication of the object to be tested measured on the first and second photodetectors 35, 36; the signal processing device 39 transmits the signal line (Fig. And receiving and filtering the first and second amplifiers 37 and 38 to generate the reference telecommunication and the test telecommunication noise at the left and right edge positions of the object to be tested; the data acquisition device 40 is to generate the object to be tested by the signal processing device 39. The reference telecommunications and test telecommunications at the right edge position are converted into network bit data and transmitted to the personal computer 41 through its internal program operation; through the implementation of the present invention, the resolution of the micro angle or displacement of the object to be measured can be improved.
前述之該對焦反射裝置32包括一顯微物鏡321、一與顯微物鏡321對立之面鏡322、一固定於面鏡322後能改變面鏡322位置之致動器323及一偵測面鏡322位置之位移探針324;該對焦反射裝置32讓第一、二光偵測器35、36能檢測出待測物兩邊緣光的強度值變化。 The focus reflection device 32 includes a microscope objective 321 , a mirror 322 opposite to the microscope objective 321 , an actuator 323 fixed to the mirror 322 to change the position of the mirror 322 , and a detection mirror The 322 position displacement probe 324; the focus reflection device 32 allows the first and second photodetectors 35, 36 to detect changes in the intensity values of the light at both edges of the object to be tested.
前述之該稜鏡組合結構33包括:二直角稜鏡331、332、二旋轉平台333、334,以及一半波片335;其係將半波片335置於兩對立之第一、二直角稜鏡間331、332;為使便於調整,於第一旋轉平台333上設有第二旋轉平台334,於第一、二旋轉平台333、334上分別固設有相對應 之第一、二直角稜鏡331、332,即使第一、二直角稜鏡331、332之斜邊呈相對立。 The foregoing cymbal combination structure 33 includes: two right angle 稜鏡331, 332, two rotation platforms 333, 334, and a half wave plate 335; the half wave plate 335 is placed in two opposite first and second right angles 稜鏡In order to facilitate adjustment, a second rotating platform 334 is disposed on the first rotating platform 333, and correspondingly fixed on the first and second rotating platforms 333 and 334 respectively. The first and second right angles 331 and 332 are opposite to each other even if the first and second right angles 331 and 332 are opposite sides.
再者,該光源3與第一分光鏡31間設有單光儀311,利用此不同的面的偏轉角度與刻痕,來分析第一入射光30的光譜,以取得不同波長光源;單光儀311與第一分光鏡31間設有偏光裝置312,控制第一入射光的大小;偏光裝置312與第一分光鏡31間設有虹膜313,使第一入射光30具有收縮的能力,藉以控制第一入射光30的大小,調整為適當的波長光源。 Furthermore, a light meter 311 is disposed between the light source 3 and the first beam splitter 31, and the spectrum of the first incident light 30 is analyzed by using the deflection angle and the score of the different surfaces to obtain different wavelengths of light; A polarizing device 312 is disposed between the meter 311 and the first beam splitter 31 to control the size of the first incident light; and an iris 313 is disposed between the polarizing device 312 and the first beam splitter 31 to enable the first incident light 30 to have a contraction capability. The size of the first incident light 30 is controlled to be adjusted to an appropriate wavelength source.
其次,該第二分光鏡33為偏極化分光鏡較佳;該第一、二光偵測器35、36採線性光偵測器較佳;該電腦包括桌上型電腦、筆記型電腦、平板電腦及手機之任一者。 Secondly, the second beam splitter 33 is preferably a polarizing beam splitter; the first and second light detectors 35, 36 are preferably linear light detectors; the computer comprises a desktop computer, a notebook computer, Any of a tablet and a mobile phone.
請繼續參閱第五圖,係本創作之光源對待測物產生兩邊緣光電訊差與對焦裝置對焦位移的關係示意圖;圖中揭示,本實施例採250瓦的光源,選定之(數值孔徑N.A.=0.85)顯微物鏡的直徑D=4.93 mm and焦距f=2.9 mm,且輸入不同波長時,電訊強度差(待測物產生兩邊緣光電訊差(電訊強度Intensity))對微小位移(△Z)(對焦裝置對焦位移)有明顯的變化,尤其對波長為650nm之變化斜 率最大;若以數值分析的方法模擬得到解析度(Resolution)與之係圖(如第六圖所示-第一折射光進入稜鏡組合結構產生解析度對與對焦裝置對焦位移的關係示意圖),明顯地看出,當波長為650nm時,其解析度可達1.08nm以上。 Please continue to refer to the fifth figure, which is a schematic diagram showing the relationship between the two edge photoelectric aberrations and the focusing displacement of the focusing device by the light source of the present invention; the figure shows that the light source of the embodiment is 250 watts selected (numerical aperture NA= 0.85) The diameter of the microscope objective is D = 4.93 mm and the focal length f = 2.9 mm, and the difference in telecommunication strength when the input wavelength is different (the edge of the object to be measured produces two edge photoelectric aberration (telecommunication intensity)) to the small displacement (△Z) (focusing device focus shift) has a significant change, especially for the wavelength 650nm change slope; if the numerical analysis method to simulate the resolution (Resolution) and its map (as shown in Figure 6 - first refracted light The relationship between the resolution of the input 稜鏡 combination structure and the focus displacement of the focusing device is clearly shown. When the wavelength is 650 nm, the resolution can reach 1.08 nm or more.
綜上所陳,本創作稜鏡組合進行微小位移測量之結構裝置,利用光源及單光儀,以取得不同波長光源,再將其送入稜鏡組合結構,將稜鏡組合結構的入射角設定為共振角,以作為初始角,由單光儀射出的第一入射光先由第一分光鏡穿過後,通過一對焦反射裝置,再將反射光反射進入稜鏡組合結構,再經由具第二分光鏡的分光鏡後,其第二折射光為後來的S偏振光,此光由第一線性光偵測器,取出兩邊緣光的電訊,並第二分光鏡之第二透射光產生P偏振光,該等偏振光由第一、二光偵測器取出兩邊緣光的電訊,再將所獲得的第一、二電訊送入第一、二微分放大器進行放大電訊,所得到第一、二電訊,送入訊號處理裝置過濾雜訊,供資料擷取裝置將參考、測試電訊轉換為網路位元資料供電腦運算,經運算處理可以得到微小位移,使可以在不同波長輸入時,訊號強度差對微小位移有明顯 的變化,以提升其解析度,由此可知本創作實為一不可多得之新型創作產品,極具新穎性及進步性,完全符合新型專利之申請要件,爰依專利法提出申請,敬請詳查並賜准本案專利,以保障創作者之權益。 In summary, this creation combines a structural device for micro-displacement measurement, using a light source and a single-light meter to obtain different wavelengths of light, and then feeding it into a 稜鏡-combination structure to set the incident angle of the 稜鏡 composite structure. For the resonance angle, as the initial angle, the first incident light emitted by the single illuminator is first passed by the first beam splitter, and then passed through a focusing and reflecting device to reflect the reflected light into the 稜鏡 composite structure, and then through the second After the beam splitter of the beam splitter, the second refracted light is the later S-polarized light, the light is taken out by the first linear light detector, and the second transmitted light of the second beam splitter is generated. Polarized light, the polarized light is taken out by the first and second photodetectors, and the obtained first and second telecommunication are sent to the first and second differential amplifiers to amplify the telecommunication, and the first is obtained. Second telecommunications, the signal processing device is sent to filter the noise, and the data acquisition device converts the reference and test telecommunications into network bit data for computer operation, and can obtain a small displacement after the operation, so that the input can be input at different wavelengths. There are obvious difference in signal intensity small displacement The change, in order to enhance its resolution, it can be seen that this creation is a rare new creative product, very novel and progressive, fully in line with the application requirements of the new patent, apply for the patent law, please Detailed investigation and grant of patents in this case to protect the rights of creators.
惟以上所述僅為本創作之較佳實施,例非因此即拘限本創作之專利範圍,故舉凡運用本創作之說明書及圖式內容所為之等效結構變化,均同理包含於本創作之範圍內,合予陳明。 However, the above description is only a preferred implementation of the present invention. The examples are not limited to the scope of the patent of the creation. Therefore, the equivalent structural changes that are made by using the manual and the contents of the creation are all included in the creation. Within the scope of the agreement, Chen Ming.
習知: Convention:
1‧‧‧直角稜鏡 1‧‧‧right angle
11‧‧‧驅動器 11‧‧‧ Drive
12‧‧‧旋轉平台 12‧‧‧Rotating platform
13‧‧‧待測物 13‧‧‧Test object
2‧‧‧光源 2‧‧‧Light source
21‧‧‧分光鏡 21‧‧‧beam splitter
211‧‧‧反射光 211‧‧‧ reflected light
212‧‧‧透射光 212‧‧‧transmitted light
13‧‧‧待測物 13‧‧‧Test object
22、23‧‧‧解偏板 22, 23 ‧ ‧ solution plate
24、25‧‧‧光偵測器 24, 25‧‧‧Photodetector
26‧‧‧鎖相放大器 26‧‧‧Lock-in amplifier
27‧‧‧電腦 27‧‧‧ computer
本創作: This creation:
3‧‧‧光源 3‧‧‧Light source
30‧‧‧第一入射光 30‧‧‧First incident light
301‧‧‧第一透射光 301‧‧‧first transmitted light
302‧‧‧第一折射光 302‧‧‧First refracted light
303‧‧‧第二折射光 303‧‧‧second refracted light
304‧‧‧第三折射光 304‧‧‧ Third refracted light
305‧‧‧第二透射光 305‧‧‧second transmitted light
31‧‧‧第一分光鏡 31‧‧‧First Beamsplitter
311‧‧‧單光儀 311‧‧‧ single light meter
312‧‧‧偏光裝置 312‧‧‧ polarizing device
313‧‧‧虹膜 313‧‧‧Iris
32‧‧‧對焦反射裝置 32‧‧‧Focus reflection device
321‧‧‧顯微物鏡 321‧‧‧Microscope objective
322‧‧‧面鏡 322‧‧‧Mirror
323‧‧‧致動器 323‧‧‧Actuator
324‧‧‧位移探針 324‧‧‧displacement probe
33‧‧‧稜鏡組合結構 33‧‧‧稜鏡Combination structure
331、332‧‧‧直角稜鏡 331, 332‧‧‧ right angle 稜鏡
333、334‧‧‧旋轉平台 333, 334‧‧‧ rotating platform
335‧‧‧半波片 335‧‧‧Half wave plate
34‧‧‧第二分光鏡 34‧‧‧Second beam splitter
35‧‧‧第一光偵測器 35‧‧‧First photodetector
36‧‧‧第二光偵測器 36‧‧‧Second light detector
37‧‧‧第一放大器 37‧‧‧First amplifier
38‧‧‧第二放大器 38‧‧‧Second amplifier
39‧‧‧訊號處理裝置 39‧‧‧Signal processing unit
40‧‧‧資料擷取裝置 40‧‧‧Information acquisition device
41‧‧‧電腦 41‧‧‧ computer
第一圖係習知直角稜鏡與旋轉平台之平面圖。 The first figure is a plan view of a conventional right angle 稜鏡 and a rotating platform.
第二圖係第一圖之側視圖。 The second figure is a side view of the first figure.
第三圖係習知直角稜鏡實施於小角度及小位移之測量裝置上。 The third figure is a conventional right angle 稜鏡 implemented on a small angle and small displacement measuring device.
第四圖係本創作一種稜鏡組合進行微小位移測量之結構裝置。 The fourth figure is a structural device for the combination of small displacement measurement.
第五圖係本創作之光源對待測物產生兩邊緣光訊號差與對焦裝置對焦位移的關係示意圖。 The fifth figure is a schematic diagram of the relationship between the two edge optical signal difference and the focusing displacement of the focusing device by the light source of the present invention.
第六圖係本創作之第一折射光進入稜鏡組合結構產生解析 度對與對焦裝置對焦位移的關係示意圖。 The sixth picture is the analysis of the first refracted light entering the 稜鏡 combination structure of this creation. The relationship between the degree and the focus displacement of the focusing device.
3‧‧‧光源 3‧‧‧Light source
30‧‧‧第一入射光 30‧‧‧First incident light
301‧‧‧第一透射光 301‧‧‧first transmitted light
302‧‧‧第一折射光 302‧‧‧First refracted light
303‧‧‧第二折射光 303‧‧‧second refracted light
304‧‧‧第三折射光 304‧‧‧ Third refracted light
305‧‧‧第二透射光 305‧‧‧second transmitted light
31‧‧‧第一分光鏡 31‧‧‧First Beamsplitter
311‧‧‧單光儀 311‧‧‧ single light meter
312‧‧‧偏光裝置 312‧‧‧ polarizing device
313‧‧‧虹膜 313‧‧‧Iris
32‧‧‧對焦反射裝置 32‧‧‧Focus reflection device
321‧‧‧顯微物鏡 321‧‧‧Microscope objective
322‧‧‧面鏡 322‧‧‧Mirror
323‧‧‧致動器 323‧‧‧Actuator
324‧‧‧位移探針 324‧‧‧displacement probe
33‧‧‧稜鏡組合結構 33‧‧‧稜鏡Combination structure
331、332‧‧‧直角稜鏡 331, 332‧‧‧ right angle 稜鏡
333、334‧‧‧旋轉平台 333, 334‧‧‧ rotating platform
335‧‧‧半波片 335‧‧‧Half wave plate
34‧‧‧第二分光鏡 34‧‧‧Second beam splitter
35‧‧‧第一光偵測器 35‧‧‧First photodetector
36‧‧‧第二光偵測器 36‧‧‧Second light detector
37‧‧‧第一放大器 37‧‧‧First amplifier
38‧‧‧第二放大器 38‧‧‧Second amplifier
39‧‧‧訊號處理裝置 39‧‧‧Signal processing unit
40‧‧‧資料擷取裝置 40‧‧‧Information acquisition device
41‧‧‧電腦 41‧‧‧ computer
Claims (7)
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| TW101213186U TWM462852U (en) | 2012-07-09 | 2012-07-09 | Structure device using prism combination for micro-shift measurement device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101213186U TWM462852U (en) | 2012-07-09 | 2012-07-09 | Structure device using prism combination for micro-shift measurement device |
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| Publication Number | Publication Date |
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| TWM462852U true TWM462852U (en) | 2013-10-01 |
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