M426022 五、新型說明： 【新型所屬之技術領域】 本創作係關於-種電子裝置之調㈣統，特^ 有時效性的電子裝置之調校系統。 〃 【先前技術】M426022 V. New description: [New technical field] This creation is about the adjustment system of electronic devices (fourth) and special time-sensitive electronic devices. 〃 【Prior technology】
電子裝置往往係由許多電子式零件所組成的，然而這歧 電子式零件會@使用-段時間後，㈣電子式零件老化而需 要重新調校或更新以雜該電子裝置能约正常運作，以發 該電子裝置應發揮的功用。從小型電子裝置，例如：三用電 表’到大型電子裝置’例如：半導體生產設備，皆須絰由調 校來確保錢Η作正常，使的該機Μ發揮應有的產能， 並生產出品質優良的產品以替公司帶來利潤。如該生產機器 經過-段生產時間後卻從未經過調校，則該生產機器將無法 正吊運作，使的該生產設備生產出的產品無法符合客戶的規 疋’進而將已生產出的產品丟棄，無形中會造成公司成本增 加，最壞的是會使公司的商譽受損，而無法承接後續訂單: 對於小型電子裝置而言，調校的工作可經由各種運輸方 式將該小型電子裝置送回原製造公司進行，並再經由原先的 運送方式送回到使用者手上，或經由網路將最新的調校資料 參數傳送到該小型電子裝置來完成調校卫作。然而，相對於 J型電子裝置，大型的電子裝置由於需調校的資料參數量非 常龐大以及大型電子裝置無法拆解後再運送回原廠進行調 校的工作，例如：半導體廠的生產設備。再加上工廠有維持 4 M426022 一定產能的需求及生產設備的原製造公司也無法及時提供 替代性的生產機器予該工廢。所以，僅能由生產設借的原製 造公司派出維修人員到現場對該生產設備進行調校的工作 ’此舉亦會增加原製造公司的成本及維修人員於交通往返的 危險性。 由此可知，上述習知的電子設備調校方式係僅經配置以 調校小型電子裝置而不經配置以大型電子調校裝置。因此， 本創作提供一種調校系統，其利用一電子調校裝置、一具有 該電子調校裝置的置放空間之待測電子裝置及具有時：性 的調校資料參數’以解決上述問題。 【新型内容】 鑑於上述問題’本創作提供—種電子裝置之調校系統及 其調校方法，藉以解決先前技術所存在的問題。Electronic devices are often composed of many electronic components. However, after the electronic components are used for a period of time, (4) the electronic components are aged and need to be recalibrated or updated to make the electronic device operate normally. The function that the electronic device should play. From small electronic devices, such as three-meter meters to large-scale electronic devices, such as semiconductor production equipment, it is necessary to adjust the meter to ensure that the money is normal, so that the machine can play its proper capacity and produce High quality products bring profits to the company. If the production machine has not been calibrated after a period of production, the production machine will not be able to hang itself, so that the products produced by the production equipment cannot meet the customer's specifications, and the products that have been produced will be produced. Discarding will inevitably lead to an increase in the cost of the company. In the worst case, the company’s goodwill will be damaged and it will not be able to undertake subsequent orders: For small electronic devices, the adjustment work can be carried out by various means of transportation. Return to the original manufacturing company, and then send it back to the user via the original shipping method, or transfer the latest tuning data parameters to the small electronic device via the network to complete the tuning. However, compared with J-type electronic devices, large-scale electronic devices are very large due to the large amount of data parameters that need to be calibrated, and large-scale electronic devices cannot be disassembled and then transported back to the original factory for calibration work, such as the production equipment of semiconductor factories. In addition, the original manufacturing company that maintains the demand for 4 M426022 and the production equipment of the factory cannot provide an alternative production machine to the waste in time. Therefore, it is only possible to dispatch maintenance personnel from the original manufacturing company to the site to adjust the production equipment. This will also increase the cost of the original manufacturing company and the danger of maintenance personnel in the transportation. Thus, it can be seen that the above-described conventional electronic device tuning method is only configured to calibrate small electronic devices without being configured with a large electronic tuning device. Accordingly, the present invention provides a calibration system that utilizes an electronic calibration device, an electronic device to be tested having a placement space for the electronic calibration device, and a time-adjusted data parameter' to solve the above problem. [New content] In view of the above problems, the present invention provides an electronic device calibration system and a calibration method thereof, thereby solving the problems of the prior art.
本創作之-實施例揭示—種電子裝置之調校系統包含 -電子調校裝置及-待測電子裝置。在本創作之—實施例中 ，該電子調校裝置具有-資料參㈣存模組，其經配置以預 先儲存對應該待測電子裝置的待測項目所建立之第一標準 資料參數，其中該第-標準資料參數具有—第—日期，該第 -曰期為該第-標準資料參數的最後制祕。在本創作之 -實施例中，該待測電子裝置則具有—置放空間及—記憶體 ’其中該置放空間經配置以耦接該.待測電子裝置，該記憶體 經配置以儲存該待測電子裝置的第二標準f料參數，該第二 5 M426022 標準資料參數包含一第二日期，該第二曰期係該第二標準資 料參數的寫入日期。 上文已經概略地敍述本揭露之技術特徵，俾使下文之本 揭露詳細描述得以獲得較佳瞭解。構成本揭露之申請專利範 圍標的之其它技術特徵將描述於下文。本揭露所屬技術領域 中具有通常知識者應可瞭解，下文揭示之概念與特定實施例 可作為基礎而相當輕易地予以修改或設計其它結構或製程 而實現與本揭露相同之目的。本揭露所屬技術領域中具有通 常知識者亦應可瞭解，這類等效的建構並無法脫離後附之申 請專利範圍所提出之本揭露的精神和範圍。 【實施方式】 為解決習知中半導體設備不易移動至原廠調校的問題 ，本創作提供一種調校系統及其調校方法，可使該半導體設 備的調校工作於半導體設備所處之場所來執行，不需送至原 廠進行調校。 圖1例示本創作一實施例之電子裝置之調校系統的示意 圖。在本創作之一實施例中，該待測電子裝置係一半導體設 備，其具有一置放空間13,經配置以置放一電子調校裝置15 〇 圖2係本創作一實施例的電子裝置之調校系統的架構示 意圖。在本創作之一實施例中，該電子調校裝置15具有一資 料參數接收模組23、一資料參數比對模組25、一資料參數儲 6 M426022 存模組27及一資料參數寫入模組29，該資料參數儲存模組29 經配置以預先儲存對應該待測電子裝置i丨的待測項目所建 立之第一標準資料參數，其中該第一標準資料參數包含一第 一曰期，該第一曰期係該第一標準資料參數的最後使用期限 。在本創作之一實施例中，該待測電子裝置11更具有一記憶 體21，其經配置以儲存對應該待測電子裝置丨丨的第二標準資 料參數’其中該第二標準資料參數包含一第二曰期，該第二 曰期係該第二標準資料參數的寫入曰期。此外，在本創作之 一實施例中’該電子調校裝置15經由一資料傳輸介面22連接 該待測電子裝置丨丨、傳輸第一標準資料參數及第二標準資料 參數，其中該資料傳輸介面22係設置於該置放空間13内。 螓 在本創作之一實施例中，該資料參數接收模組23在該電 子調校裝置15中耦接於該資料參數比對模組乃，該資料參數 儲存模組27及該資料參數寫入模組29分別麵接於該資料參 數比對模組25。在本創作之—實施例中，該資料參數接收模 組23經配置以接收來自該待測電子裝置⑽該待測項目之 該第二標準資料參數。在本創作之—實施例中該資料參數 比對模組25，經配置以比對㈣儲存於該資料參數健存模組 27的該第一標準資料參數之該第一曰期及該待測電子裝置 11的該複數個待測項目之該第二標準資料參數之該第二日 期。在本創作之—實施财，該資料參數寫人模組29經配置 M 資料參數寫人該待測電子裝置η的記憶體 21内，並㈣將寫人日期-同儲存於該記憶體21内。 7 M426022 07糸本創作—實施例之電子裝置之調校系統的調校流 在本創作之—實施例中首先建立對應該待測電子裝 之待測項目所建立的第—標準資料參數並預先錯存於該 子=校裝置，置放該電子調校裝置於該置放空間，並藉由 原先叹置於該置放空間内的該資料傳輸介面以連接該待測 電子裝置及該電子調校裝置，·接收該待測電子裝置的該待測The present invention discloses a calibration system for an electronic device comprising: an electronic calibration device and an electronic device to be tested. In an embodiment of the present invention, the electronic calibration device has a data reference (four) storage module configured to pre-store a first standard data parameter established for the item to be tested of the electronic device to be tested, wherein The first-standard data parameter has a -date-date, which is the last secret of the first-standard data parameter. In the present invention, the electronic device to be tested has a storage space and a memory, wherein the placement space is configured to couple the electronic device to be tested, and the memory is configured to store the electronic device. The second standard f material parameter of the electronic device to be tested, the second 5 M426022 standard data parameter includes a second date, and the second cycle is the date of writing the second standard data parameter. The technical features of the present disclosure have been briefly described above, so that a detailed description of the present disclosure will be better understood. Other technical features constituting the patent application scope of the present disclosure will be described below. It is to be understood by those of ordinary skill in the art that the present invention may be practiced as a It should be understood by those of ordinary skill in the art that this invention is not limited to the spirit and scope of the present disclosure as set forth in the appended claims. [Embodiment] In order to solve the problem that the semiconductor device is difficult to move to the original factory adjustment, the present invention provides a calibration system and a calibration method thereof, which can adjust the semiconductor device to a place where the semiconductor device is located. To perform, no need to send to the original factory for adjustment. Fig. 1 is a view showing a calibration system of an electronic device according to an embodiment of the present invention. In an embodiment of the present invention, the electronic device to be tested is a semiconductor device having a placement space 13 configured to place an electronic calibration device. FIG. 2 is an electronic device according to an embodiment of the present invention. Schematic diagram of the tuning system. In an embodiment of the present invention, the electronic calibration device 15 has a data parameter receiving module 23, a data parameter comparison module 25, a data parameter storage 6 M426022 storage module 27, and a data parameter writing module. Group 29, the data parameter storage module 29 is configured to pre-store a first standard data parameter established for the item to be tested of the electronic device to be tested, wherein the first standard data parameter includes a first period, The first period is the last period of use of the first standard data parameter. In an embodiment of the present invention, the electronic device under test 11 further has a memory 21 configured to store a second standard data parameter corresponding to the electronic device to be tested, wherein the second standard data parameter includes In a second period, the second period is the writing period of the second standard data parameter. In addition, in an embodiment of the present invention, the electronic calibration device 15 connects the electronic device to be tested via a data transmission interface 22, and transmits a first standard data parameter and a second standard data parameter, wherein the data transmission interface The 22 series is disposed in the placement space 13. In one embodiment of the present invention, the data parameter receiving module 23 is coupled to the data parameter comparison module in the electronic calibration device 15, and the data parameter storage module 27 and the data parameter are written. The modules 29 are respectively connected to the data parameter comparison module 25. In the present embodiment, the data parameter receiving module 23 is configured to receive the second standard data parameter of the item to be tested from the electronic device under test (10). In the present embodiment, the data parameter comparison module 25 is configured to compare (4) the first period of the first standard data parameter stored in the data parameter storage module 27 and the to-be-tested The second date of the second standard data parameter of the plurality of items to be tested of the electronic device 11. In the creation of the present invention, the data parameter writer module 29 is configured to write the M data parameter to the memory 21 of the electronic device η to be tested, and (4) store the date of the writer in the memory 21 . 7 M426022 07糸本作品—The adjustment flow of the adjustment system of the electronic device of the embodiment In the present invention, the first embodiment establishes the first standard data parameter corresponding to the test item to be tested for the electronic device to be tested and Storing the electronic calibration device in the placement space, and connecting the electronic device to be tested and the electronic tone by the data transmission interface originally placed in the placement space School device, receiving the to-be-tested electronic device to be tested
項目之該第-資料參數到該電子調校裝置。；比對對應該待 測電子裝置之該待測項目所建立的該第 該待測電W㈣W辦數；寫入 該待測項目之該第-標準資料參數於該待測電子裝置，並同 時將寫入日期—同儲存於該待測電子裝置。 圖4係本創作—實施例之電子裝置之調校系統的比對流 程圖。在本創作之—實施例中，當該電子調校裝置Μ的資料 參數接收模組23接㈣該第二標準資料參數並將其傳送到 該資料參數比對模組25;該資料參數比對模組25會將預先儲 存於該資料參數儲存模組的該第一標準資料參數的第一日 期及該第二標準資料參數的該第二日期作比對的動作；如果 該第 發出 該第 -曰期大於該第二日帛，則會對該資料參數寫入模㈣ 一資料參數寫人訊號’使該資料參數寫人模組29得以將 一標準資料參數寫人該待測電子.裝置的該記憶體加 ，並同時將資料參數寫入日期一起儲存於該記憶 該第二日期大於該第一曰期，則該電子調校裝置 行調校工作，且該資料參數模組29亦不對該待測 體21内；如 15會停止執 電子裝置11 8 M426022 做出任何寫入動作。 本揭露之技術内容及技術特點已揭示如上，然而本揭露 所屬技術領域中具有通常知識者應瞭解，在不背離後附申請 專利範圍所界定之本揭露精神和範圍内，本揭露之教示及揭 示可作種種之替換及修佛。例如，上文揭示之許多製程可以 不同之方法實施或以其它製程予以取代，或者採用上述二種 方式之組合。The first-data parameter of the item is sent to the electronic calibration device. Comparing the number of the first to be tested W (four) W to be established in the item to be tested of the electronic device to be tested; writing the first standard data parameter of the item to be tested to the electronic device to be tested, and simultaneously The date of writing is stored in the electronic device to be tested. Figure 4 is a comparison flow diagram of the calibration system of the electronic device of the present creation-embodiment. In the present embodiment, when the data parameter receiving module 23 of the electronic calibration device is connected to (4) the second standard data parameter and transmitted to the data parameter comparison module 25; the data parameter comparison The module 25 compares the first date of the first standard data parameter pre-stored in the data parameter storage module with the second date of the second standard data parameter; if the first issue is the first- If the flood period is greater than the second day, the data parameter is written into the module (4). The data parameter writes the human signal 'to enable the data parameter writer module 29 to write a standard data parameter to the electronic device to be tested. The memory is added, and at the same time, the data parameter is written to the date and stored in the memory. The second date is greater than the first period, and the electronic calibration device performs the calibration operation, and the data parameter module 29 does not In the body 21 to be tested; if 15 will stop the electronic device 11 8 M426022 to make any writing action. The technical content and the technical features of the present disclosure have been disclosed as above, but those skilled in the art should understand that the teachings and disclosures of the present disclosure are disclosed without departing from the spirit and scope of the disclosure as defined by the appended claims. Can be used to replace and repair Buddha. For example, many of the processes disclosed above can be implemented in different ways or in other processes, or a combination of the two.
此外，本案之權利範圍並不偈限於上文揭示之特定實施 例的製程、機台、製造、物質之成份、裝置、方法或步驟。 本揭露所屬技術領域中具有通常知識者應瞭解，基於本揭露 教示及揭示製程、機台、製造、物質之成份、裝置、方法或 步驟’無論現在已存在或日後開發者，其與本案實施例揭示 者係以實質相同的方式執行實質相同的功能，而達到實質相 同的結果’亦可使用於本揭露。因此，以下之申請專利範圍 係用以涵蓋用以此類製程、機台、製造、物質之成份、裝置 、方法或步驟。 【圖式簡單說明】 圖1係本創作一實施例之電子裝置之調校系統的示意圖 9 圖2係本創作一實施例之電子裝置之調校系統的架構示 意圖； 圖3係本創作一實施例之電子裝置之調校系統的調校流 9 M426022 <〇 fgl · ft 程圖，及 圖4係本創作一實施例之電子裝置之調校系統的比對流 程圖8Furthermore, the scope of the present invention is not limited to the particular embodiments of the process, machine, manufacture, compositions, means, methods or steps. It should be understood by those of ordinary skill in the art that, based on the teachings of the present disclosure, the process, the machine, the manufacture, the composition, the device, the method, or the step of the matter, whether existing or future developers, The revealer performs substantially the same function in substantially the same manner, and achieves substantially the same result' can also be used in the present disclosure. Therefore, the following patent claims are intended to cover such processes, machines, manufacture, compositions, devices, methods or steps. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a calibration system of an electronic device according to an embodiment of the present invention. FIG. 2 is a schematic structural diagram of an adjustment system of an electronic device according to an embodiment of the present invention; FIG. For example, the calibration flow of the adjustment system of the electronic device is 9 M426022 < 〇fgl · ft diagram, and FIG. 4 is a comparison flowchart of the adjustment system of the electronic device according to the embodiment of the present invention.
【主要元件符號說明】 11 待測電子裝置 13 置放空間 15 電子調校裝置 21 記憶體 22 資料參數傳輸介面 23 資料參數接收模組 25 資料參數比對模組 27 資料參數儲存模組 29 資料參數寫入模組[Main component symbol description] 11 Electronic device to be tested 13 Placement space 15 Electronic calibration device 21 Memory 22 Data parameter transmission interface 23 Data parameter receiving module 25 Data parameter comparison module 27 Data parameter storage module 29 Data parameters Write module