TWM422073U - Replaceable dynamic adjustment apparatus for system loading test - Google Patents

Replaceable dynamic adjustment apparatus for system loading test Download PDF

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Publication number
TWM422073U
TWM422073U TW100205737U TW100205737U TWM422073U TW M422073 U TWM422073 U TW M422073U TW 100205737 U TW100205737 U TW 100205737U TW 100205737 U TW100205737 U TW 100205737U TW M422073 U TWM422073 U TW M422073U
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Taiwan
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pci
load
dynamic adjustment
adjustment device
power
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TW100205737U
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Chinese (zh)
Inventor
shang-sheng Yang
ming-zhen Yang
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Portwell Inc
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Priority to TW100205737U priority Critical patent/TWM422073U/en
Publication of TWM422073U publication Critical patent/TWM422073U/en

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M422073 五、新型說明: 【新型所屬之技術領域】 本創作係有關於一種負載測試裝置’尤指一種具有模組彈性化設計而 可自由選擇所需消耗功率百分比,並可便利延伸檢測擴充之系統負載測試 之可換式動態調整裝置。 【先前技術】 按’一般電腦或電子產品系統設計完成後,需進行功率負載檢測,以 測知是否有符合系統規格要求之最大電源功率,使確保系統運作之順暢及 • 安全。現行功率負載檢測常用PCI負載器模組(Module),此PCI負載器模 組設計大多直接對電源(12V、5V、3· 3V、-12V)接上假負載電阻消耗系統在 PCI介面上最大消耗功率’但往往消耗最大功率測試若導致系統當機或過熱 時’將會使檢測者難以得到確實之負載問題,而無法進行接績之檢測判斷, 相當麻煩,顯非理想之檢測設計。再者,此類PCI負載器模組設計一般常 用可變電阻來調整電流’但可變電阻之功率耐受度太小,若用一般高瓦特 數繞線電阻因電阻使用滑軌式設計在震動時會導致阻值變動電流精準度較 差,另形成震動所造成電流精準度不佳之問題,亦有一併改善之必要。 馨申請人為功率負載檢測器模組開發製造業者,乃針對前述PCI負載器 模組之缺失問題長期加以思考,認為若能利用PCI-dummy load之可調整功 率方式’用意*一來可解決小瓦特數應用不需浪費成本選擇大功率繞線電阻 使用,二來不會因為震動造成電流精準度不佳問題,並且進一步利用水泥 電阻值固定得到複數段(如八段)不同電流值,同時也可更換電阻值再依所 選電阻值得到複數種(如八種)電流所得到功率,將可得到更精確之檢測判 斷依據,且比傳統方式更具有使用上之彈性效果。 緣此’本創作人有鑑於現有PCI負載器模組其檢測使用上之缺點及其 結構設計上未臻理想之事實,本案創作人即著手研發其解決方案,希望能 開發出一種更具精準性、效率性、經濟性及延展擴充性的系統負載測試之 3 年月曰 可換式動態調整裝置,以促進此業之發展,遂經多時之構思而有本創作之 產生》 【新型内容】 本創作之目的係在提供一種系統負載測試之可換式動態調整裝置,其 能利用負載可換式模組設計而使負載器模组具有功率動態調整之功效,進 而達到功率負載檢測上之極佳精準性、效率性及經濟性。 本創作之再一目的係在提供一種系統負載測試之可換式動態調整裝 置’其能利用負載電阻可隨意更換之方式,讓測試者自由選擇目前需消耗 功率百分比進行測試,且更藉由模組彈性化的結構設計,進而便利功率負 載檢測之操作。 本創作之又一目的係在提供一種系統負載測試之可換式動態調整裝 置’其能利用PCI界面透過轉換擴充槽變成PCI-E XI、X4、X8、X16負載 器’使測試操作上更具彈性選擇功能。 本創作之另一目的係在提供一種系統負載測試之可換式動態調整裝 置’其能利用PCI電源擴充卡外接電源線至延伸散熱系統方式,用以搭配 PCI功率動態調整負載可換式模組使用,且在延伸散熱系統上具複數個PCI 插槽電源可獨立對系統抽載,達到系統負載最大功率消耗調整測試之功效。 本創作為達到上述目的所採用之技術手段包括:一電路板;一負載功 率調整裝置’係設於該電路板上,包括有複數對應不同電壓選擇之負載旋 鈕開關;一可換式負載電阻裝置,係設於該電路板上,包括有複數電阻件; 一金氧半場效電晶體裝置(MOSFET),係設於該電路板上,包括有複數對 應該電阻件之MOSFET開關;一脈寬調變控制裝置,係設於該電路板上,用 以產生脈寬調變(PWM)訊號控制MOSFET開關得到所需電流。 本創作之技術手段進一步包括:一電路板,其設有一 PCI插接件;一 金氧半場效電晶體裝置(MOSFET),係設於該電路板上,包括有複數對應 該電阻件之MOSFET開關;一脈寬調變控制裝置,係設於該電路板上,該脈 M422073 修正 補充 10<Γ·Π. 17 年月日 寬調變控制裝置係以一主角波產生電路和一比制電壓電路比數·後產生撒寬· 調變(PWM)訊號,用以控制該MOSFET開關得到所需電流;一 PCI-EX插槽’ 供該PCI插接件插設以變成PCI-E XI、Χ4、Χ8或Χ16負載器。 茲為使貴審査委員對本創作之技術特徵及所達成之功效更有進一步 之瞭解與認識,謹佐以較佳之實施例圖及配合詳細之說明,說明如後: 【實施方式】 請參閱第1、2圖,本創作系統負載測試之可換式動態調整裝置100包 括有一電路板10,該電路板10上設有一負載功率調整裝置12、可換式負 載電阻裝置14、脈寬調變控制裝置16及金氧半場效電晶體裝置18 (MOSFET);另,該電路板1〇上並設有一 PCI插接件20及電源連接器22, 該PCI插接件20、電源連接器22係可分別連接PCI插槽(SLOT)、電源線規 (Power Cable),用以輸入3. 3V、5V、12V、-12V等之電壓負載,該電源連 接器22及PCI插接件20之外接電源輸入係可擇一使用》 該負載功率調整裝置12係包括有複數個(於本實施例為四個)負載旋紐 開關m、122、123、124 ’該負載旋鈕開關121、122、123、124分別對應 為3.3V、5V、12V、-12V之電壓負載’且該電路板1〇相對該負載旋鈕開關 121、 122、123、124之周邊係分別設有複數負載比例選擇標記1〇1,該負 春載比例選擇標記 101 如 10%、20%、40%、50%、60%、80%、90%、1〇〇 % (八段式電壓)等電流調整選擇之設置,當旋轉使用該負載旋鈕開關121、 122、 123、124時可針對各組電壓進行電流調整,達到所需要功率。例如當 該負載旋鈕開關121指在100%係針對3. 3V負載電阻為L 65歐姆,這時電 流為2A’功率為P=2x3. 3=6. 6W;若該負載旋鈕開關121指在1〇%係針對3.抑 負載阻為1. 65歐姆’這時電流變成為2AxlO%=〇. 2A,功率為P=3.3Vx 0. 2A=0. 66W,其它電壓功率可依此類推。 該可換式負載電阻裝置14包括有複數水泥電阻14ι、142、143、144、 145,該水泥電阻14卜142為3. 3V水泥電阻,採用並聯方式得到丨65歐 M422073M422073 V. New Description: [New Technology Field] This creation is about a load test device, especially a system with modular flexible design that can freely select the required power consumption and facilitate extended detection and expansion. Loadable dynamic adjustment device for load testing. [Prior Art] After the design of the general computer or electronic product system is completed, power load detection is required to detect whether there is a maximum power supply that meets the system specifications, so as to ensure smooth operation and safety of the system. The current power load detection commonly used PCI loader module (Module), this PCI loader module design mostly directly connected to the power supply (12V, 5V, 3 · 3V, -12V) with a dummy load resistance consumption system in the PCI interface maximum consumption Power 'but often consumes the maximum power test if the system is down or overheated' will make it difficult for the tester to get the exact load problem, and the detection and judgment of the performance cannot be performed. It is quite troublesome and is not ideal for the test design. Furthermore, such PCI loader module designs generally use variable resistors to adjust the current 'but the power tolerance of the variable resistor is too small. If a general high watt-number wirewound resistor is used, the slide-type design is used for the vibration. When the resistance value of the resistance change current is poor, and the accuracy of the current caused by the vibration is not good, there is also a need for improvement. Xin applicants are developing manufacturers of power load detector modules. They have long thought about the lack of PCI loader modules. They think that if you can use PCI-dummy load's adjustable power method, you can solve small watts. The number of applications does not need to waste the cost to choose high-power wirewound resistors, and secondly, it will not cause the current accuracy to be poor due to vibration, and further use the cement resistance value to obtain different current values of multiple segments (such as eight segments), and also Replacing the resistance value and then obtaining the power of a plurality of (for example, eight) currents according to the selected resistance value can obtain a more accurate detection and judgment basis, and has a more elastic effect than the conventional method. Therefore, the creator of this creator has developed the solution in view of the shortcomings of the existing PCI loader module and the unsatisfactory design of its structure design, hoping to develop a more accurate 3, months of changeable dynamic adjustment device for efficiency, economy and extended system load test to promote the development of this industry, and the creation of this creation after a long period of time. [New content] The purpose of this creation is to provide a replaceable dynamic adjustment device for system load testing, which can utilize the load exchangeable module design to make the load module have power dynamic adjustment effect, thereby achieving the ultimate in power load detection. Good accuracy, efficiency and economy. A further object of the present invention is to provide a system for dynamic testing of a system load test, which can be freely replaced by a load resistor, allowing the tester to freely select the current percentage of power consumed for testing, and more The flexible design of the structure facilitates the operation of power load detection. Another object of the present invention is to provide a system dynamic load changeable dynamic adjustment device that can use the PCI interface to convert into a PCI-E XI, X4, X8, X16 loader through a conversion expansion slot to make the test operation more Flexible selection function. Another object of the present invention is to provide a system dynamic load changeable dynamic adjustment device capable of utilizing a PCI power supply expansion card external power supply line to an extended heat dissipation system for dynamically adjusting a load changeable module with a PCI power. It can be used to load the system independently with multiple PCI slot power supplies on the extended cooling system to achieve the maximum power consumption adjustment test of the system load. The technical means adopted for the above purposes include: a circuit board; a load power adjusting device is disposed on the circuit board, and includes a plurality of load knob switches corresponding to different voltage selections; and a replaceable load resistance device The circuit board is disposed on the circuit board and includes a plurality of resistors; a metal oxide half field effect transistor device (MOSFET) is disposed on the circuit board and includes a plurality of MOSFET switches corresponding to the resistors; a pulse width adjustment A variable control device is disposed on the circuit board for generating a pulse width modulation (PWM) signal to control a MOSFET switch to obtain a desired current. The technical means of the present invention further includes: a circuit board having a PCI connector; a metal oxide half field effect transistor device (MOSFET), disposed on the circuit board, including a plurality of MOSFET switches corresponding to the resistors A pulse width modulation control device is disposed on the circuit board, and the pulse M422073 is supplemented by a supplement 10<Γ·Π. The 17th day wide-width modulation control device is a main angle wave generating circuit and a ratio voltage circuit After the ratio, a widening/modulation (PWM) signal is generated to control the MOSFET switch to obtain the required current; a PCI-EX slot is inserted into the PCI connector to become PCI-E XI, Χ4, Χ8 or Χ16 loader. In order to give your reviewers a better understanding and understanding of the technical features of the creation and the efficacies achieved, please refer to the preferred embodiment diagram and the detailed description as follows: [Embodiment] Please refer to section 1. 2, the removable dynamic adjustment device 100 of the present invention load test includes a circuit board 10, and the circuit board 10 is provided with a load power adjustment device 12, a replaceable load resistance device 14, and a pulse width modulation control device. 16 and a gold-oxygen half-field effect transistor device 18 (MOSFET); in addition, the circuit board 1 is provided with a PCI connector 20 and a power connector 22, and the PCI connector 20 and the power connector 22 are respectively respectively Connect a PCI slot (SLOT) and a power cable (Power Cable) for inputting a voltage load of 3.3 V, 5 V, 12 V, -12 V, etc., and the power connector 22 and the PCI connector 20 are connected to a power input system. The load power adjusting device 12 includes a plurality of (four in the present embodiment) load knob switches m, 122, 123, 124 'the load knob switches 121, 122, 123, 124 respectively correspond to Voltage load of 3.3V, 5V, 12V, -12V And the circuit board 1 is respectively provided with a plurality of load ratio selection marks 1〇1 around the load knob switches 121, 122, 123, 124, and the negative spring load ratio selection marks 101 are 10%, 20%, 40, respectively. %, 50%, 60%, 80%, 90%, 1% (eight-section voltage) and other current adjustment options, when rotating the load knob switches 121, 122, 123, 124 for each group The voltage is current adjusted to achieve the required power. For example, when the load knob switch 121 is at 100%, the load resistance of the 3.3V is L 65 ohms, and the current is 2A' power is P=2x3. 3=6. 6W; if the load knob switch 121 is at 1〇 The % is for 3. The load resistance is 1.65 ohms. At this time, the current becomes 2AxlO%=〇. 2A, the power is P=3.3Vx 0. 2A=0. 66W, other voltage power can be deduced by analogy. The replaceable load resistance device 14 includes a plurality of cement resistors 14ι, 142, 143, 144, 145, the cement resistor 14 142 is 3. 3V cement resistor, and is connected in parallel to obtain 65 euros M422073

姆最大電流為2A,該水泥電阻143為5V水泥電阻使用2. 2 姆最大電流為 2. 25A,該水泥電阻144為12V水泥電阻使用24歐姆最大電流為〇. 545A, 該水泥電阻145為-12V水泥電阻使用120歐姆最大電流為〇. 1A。該可換式 負載電阻裝置14可進行如下之選擇運作,例如,當需要電壓12V最大電流 為0. 545A,此時需選用24歐姆水泥電阻;若12V電壓最大電流想要為1A, 此時需選用12歐姆水泥電阻;其它3.3V ' 5V、-12V所需最大電流方法相 同0 該金氧半場效電晶體裝置18 (Meta卜Oxide-Semi conductor Field-Effect Transistor ’ M0SFET)係一種可以廣泛使用在模擬電路與數 字電路的場效電晶趙(field-effect transistor),其包括有複數M0SFET 開關 181、*182、183、184,該 M0SFET 開關 181、182、183、184 分別對應 為3. 3V負載、5V負載、12V負載、-12V負載之M0SFET開關使用。 請一併參閱第5、5a囷,係以針對3,3V調整功率電路架構圖來說明, 該脈寬調變控制裝置16係為三角波產生器和電壓比較電路,用以產生腻宽 調變(PWM)訊號控制負載M0SFET開關得到所需電流,該脈寬調變控制裝置 16包括有三角波產生電路161、比例電壓電路162、PWM訊號電路163、負 載開關電路164及八段式分壓電路165;其中,該三角波產生電路161係以 三角波產生器所產生,該比例電壓電路162係通過該負載旋鈕開關121、 122、123、124選擇所需要之比例電壓,該p奶(訊號電路163係以該三角波 (三角波產生電路161)和比例電壓(比例電壓電路162)比較後產生PWM訊 號’繼該PWM訊號控制負載開關電路164達到所需Duty周期《該八段式分 壓電路165 ’如第5圓所示,係由上至下分別為ιον、9V、8V、6V,5V、4V, 2V、1V ’ 分別代表 1〇〇%、90%、80%、60%、50%、40%、20%、10%之選擇電壓, 如此把水泥電阻值固定可得到八段不同電流值,也可更換電阻值再依所選 電阻值得到八種電流所得到功率,比傳統利用可變電阻其電阻值變化方式 更具有使用上之彈性’且如此更可藉小瓦特數應用不需浪費成本選擇大功 率繞線電阻使用’也不會因為震動造成電流精準度不佳之問題。又如第5b 6 M422073 Ά修正 + s3補充 圖所示,其中所示Vout一SAW為三角波167,VIN為旋轉開關所呈一 一斜率168) ’ Vout為前兩者比較後pwm波形166 » 請參閱第3圓’係本創作應用示意圖,其包括有一電腦主機1,該電腦 主機1具有一主機板2,該主機板2上設有複數PCI插槽3,該系統負載測 試之可換式動態調整裝置1〇〇係藉該PCI插接件2〇插設連結於該pci插槽 3,使進行該電腦主機1系統之功率負載檢測。 請參閱第4圖,係本創作之系統應用架構示意圓,其包括有一電腦主 機之PCI插槽3’該PCI插槽3可如第3圖所示插接一系統負載測試之可換 ^ 式動態調整裝置10〇進行功率負載檢測,亦可連結一 PCI Power延伸卡40 使用’請一併參閱第8圖,該PCI power延伸卡4〇具有獨立之p〇wer cabie 電源接槽103,並提供12V、-12V、5V、3. 3V等電源電壓之測試,該pci power 延伸卡40係設有或連結一 pci power擴充插槽散熱系統5〇,並提供至少一 PCI插槽3,用以插設該系統負載測試之可換式動態調整裝置。再者, 該PCI Power擴充插槽散熱系統50若設有兩個PCI插槽,則該兩個⑽插 糟之電源係獨立對系統抽載,也因為延伸散熱模組電源迴路是分開的,故 可達到系統負載最大功率消耗測試之目的,如:25W+25W=50W,也可 25W+0W=25W。又,本創作以延伸式散熱模組形態不僅使產品的應用上更為 • 靈活,且使整體測試也提供測試者對於系統供電設計問題能更加嚴謹,以 達到系統成本和電源系統穩定度的控制,設計上也能做更周全的考量。 請參閱第6圖’本創作系統負載測試之可換式動態調整裝置1〇〇於該 電路板10上係可進一步設有一散熱器52,該散熱器52係接引設有一導流 板54’用以對該可換式負載電阻裝置14及M0SFET開關181-184進行散熱, 避免直接插上系統PCI Slot所產生熱源影響測試結果或是系統過熱導致當 機。The maximum current is 2A, the cement resistance 143 is 5V cement resistance using 2. 2 m maximum current is 2. 25A, the cement resistance 144 is 12V cement resistance using 24 ohm maximum current is 〇. 545A, the cement resistance 145 is - The 12V cement resistor uses a maximum current of 120 ohms as 〇.1A. The replaceable load resistor device 14 can perform the following selection operations, for example, when a maximum current of 12V is required to be 0. 545A, a 24 ohm cement resistor is required; if the maximum current of 12V is desired to be 1A, then 12 ohm cement resistor is used; other 3.3V '5V, -12V required maximum current method is the same 0. The gold oxide half field effect transistor device 18 (Meta Bu Oxide-Semi Conductor Field-Effect Transistor 'M0SFET) is a kind that can be widely used in The field-effect transistor of the analog circuit and the digital circuit, comprising a plurality of MOSFET switches 181, 182, 183, 184, respectively, the MOSFET switches 181, 182, 183, 184 corresponding to 3. 3V load , 5V load, 12V load, -12V load MOSFET switch. Please refer to Sections 5 and 5a for the purpose of explaining the 3,3V adjustment power circuit architecture diagram. The pulse width modulation control device 16 is a triangular wave generator and a voltage comparison circuit for generating a greasy width modulation ( The PWM) signal control load MOSFET switch obtains a required current. The pulse width modulation control device 16 includes a triangular wave generation circuit 161, a proportional voltage circuit 162, a PWM signal circuit 163, a load switch circuit 164, and an eight-stage voltage dividing circuit 165. Wherein, the triangular wave generating circuit 161 is generated by a triangular wave generator, and the proportional voltage circuit 162 selects a required proportional voltage through the load knob switches 121, 122, 123, 124, and the signal circuit 163 is The triangular wave (triangular wave generating circuit 161) and the proportional voltage (proportional voltage circuit 162) are compared to generate a PWM signal 'following the PWM signal to control the load switch circuit 164 to reach a desired duty cycle "the eight-stage voltage dividing circuit 165' As shown by the 5 circle, from top to bottom, ιον, 9V, 8V, 6V, 5V, 4V, 2V, 1V 'represent 1%, 90%, 80%, 60%, 50%, 40%, respectively. 20%, 10% of the selection voltage, so Fixing the cement resistance value can obtain eight different current values, and can also replace the resistance value and then obtain the power of the eight currents according to the selected resistance value, which is more flexible than the conventional use of the variable resistance. And so can use small wattage applications without wasting costs to choose high-power wirewound resistors to use 'also does not cause poor current accuracy due to vibration. As shown in Figure 5b 6 M422073 ΆRevision + s3 supplementary picture, Vout-SAW is shown as triangle wave 167, VIN is the slope of the rotary switch 168) 'Vout is the first two comparisons after pwm waveform 166 » Please refer to the 3rd circle's schematic application diagram, which includes a computer host 1 The computer host 1 has a motherboard 2, and the motherboard 2 is provided with a plurality of PCI slots 3, and the removable dynamic adjustment device 1 of the system load test is connected by the PCI connector 2 In the pci slot 3, the power load detection of the computer host 1 system is performed. Please refer to FIG. 4, which is a schematic diagram of the system application architecture of the present invention, which includes a PCI slot 3' of a computer host. The PCI slot 3 can be plugged into a system load test as shown in FIG. The dynamic adjustment device 10 performs power load detection, and can also be connected to a PCI Power extension card 40. Please refer to FIG. 8 together. The PCI power extension card 4 has an independent p〇wer cabie power socket 103 and provides 12V, -12V, 5V, 3. 3V and other power supply voltage tests, the pci power extension card 40 is provided with or connected to a pci power expansion slot cooling system 5〇, and provides at least one PCI slot 3 for insertion A replaceable dynamic adjustment device for the system load test. Furthermore, if the PCI Power expansion slot cooling system 50 is provided with two PCI slots, the power supply of the two (10) plugs is independently pumped to the system, and because the power supply circuit of the extended heat dissipation module is separate, It can achieve the purpose of system load maximum power consumption test, such as: 25W+25W=50W, or 25W+0W=25W. In addition, the creation of the extended heat dissipation module not only makes the application of the product more flexible, but also enables the overall test to provide the tester with more stringent rigor for the system power supply design to achieve system cost and power system stability control. Design can also make more comprehensive considerations. Please refer to FIG. 6 'the removable dynamic adjustment device of the present invention for load testing. The circuit board 10 can further be provided with a heat sink 52, and the heat sink 52 is connected with a deflector 54'. The heat-dissipating load resistor device 14 and the MOSFET switch 181-184 are used to dissipate heat, so as to prevent the heat source generated by directly inserting the PCI Slot of the system from affecting the test result or the system overheating and causing the machine to crash.

本創作系統負載測試之可換式動態調整裝置其PCI界面可透過轉換擴 充槽變成PCI-E XI、X4、X8、X16負載器,使客戶能對測試需求選擇負載 器,請參閱第7圖,電腦主機1其主機板2上設有一 pci-EX插槽3A(如PCI-E 7 M422073 ιοΟΤΠΤΙΓΤ …It X卜 X4、X8、X16 等),另一 PCI-EX 轉接件 56,該 PCI-EX 轉接- 具有一 PCI插槽561及下方一 PCI-EX插件562,該PCI-EX轉接件56藉其 PCI-EX插件562插設於該PCI-EX插槽3A上,如此使得系統負載測試之可 換式動態調整裝置100可藉其PCI插接件20插詨於該PCI-EX轉接件56之 PCI插槽561上’而得以轉換成PCI-EX界面,增加測試使用之彈性選擇功 效0 請參蘭第9、10圓,用以說明本創作外插式系统負載测試之可換式動 態調整裝置’如圖所示,其包括有一外插式功率可調式負載器6〇,該外插 式功率可調式負載器60設有一電路板62,該電路板62上設有PCI擴充槽 64 ’該PCI擴充槽64可為PCI界面或PCI-EX界面,在本實施例中,該籲 擴充槽64係為PCI-EX界面,其上設有二(或其它數目)pci擴充槽64,該 PCI擴充槽64係可供PCI-EX界面之系統負載測試之可換式動態調整裝置 100A之插設連結’即藉該系統負載測試之可換式動態調整裝置ι〇〇Α之 PCI-EX插接件20A插結於該PCI擴充槽64 ;又,該外插式功率可調式負載 器60(電路板62)設有二電源插接件66,用以連接電纜線(PCI POWER Cable),形成獨立之電源供應係統。 本創作系統負載測試之可換式動態調整裝置藉由上述構成,使能利用 負載可換式模組設計而使負載器模組具有功率動態調整之功效,以達到功 鲁 率負載檢測上之極佳精準性、效率性及經濟性;且其能利用負載電阻可隨 意更換之方式,讓測試者自由選擇目前需消耗功率百分比進行測試,且更 藉由模組彈性化的結構設計,進而便利功率負載檢測之操作;又,本創作 通過PCI界面透過轉換擴充槽變成PCI-E XI、X4、X8、X16負載器,使測 試操作上更具彈性選擇功能,同時利用PCI電源擴充卡外接電源線至延伸 散熱系統方式,用以搭配PCI功率動態調整負載可換式模組使用,且在延 伸散熱系統上具複數個PCI插槽電源可獨立對系統抽載,達到系統負載最 大功率消耗調整測試之功效。 綜上所述,本創作確已符合新型專利之要件,爰依法提出專利申請。 8 M422073 iqa u. 17 年 β曰修正 , ^ 月補充 惟以上所述者,僅為本創作較佳實施例而已,並非用來限定彳作貪n” 範圍,故舉凡依本創作申請專利範圍所述之形狀、構造、特徵及精神所為 之均等變化與修飾,均應包括於本創作之申請專利範園内。 【圖式簡單說明】 第1圖係本創作之結構示意圓。 第2圖係本創作之上視示意圖》 第3圖係本創作之測試應用示意圓。 第4圖係本創作之系統應用架構示意圓。 第5、5a圖係本創作針對3.3V調整功率電路架構禾意圓。 第5b圖係本創作之PWM波形示意圖。 第6圖係本創作之散熱結構示意圓。 第7圖係本創作之介面轉換結構示意圓。 第8圖係本創作之pci power延伸卡獨立電源結構示意圖。 第9圖係本創作之外插式功率可調式負載器局部示意圖。 第10圖係本創作之外插式功率可調式負載器示意圈。 【主要元件符號說明】 系統負載測試之可換式動態調整裝置 100 外插式功率可調式負載器 60 系統負載測試之可換式動態調整裝置 100A 電路板 10 負載功率調整裝置 12 可換式負載電阻裝置 14 脈寬調變控制裝置 16 金氧半場效電晶體裝置 18 PCI插接件 20 電源連接器 22 負載旋鈕開關 121-124 水泥電阻 U1- -145 MOSFET開關 181-184 三角波產生電路 161 比例電壓電路 162 PWM訊號電路 163 負載開關電路 164 9 M422073The interchangeable dynamic adjustment device of the load test of the authoring system can be converted into a PCI-E XI, X4, X8, X16 loader through a conversion expansion slot, so that the customer can select a loader for the test requirement, please refer to FIG. The mainframe 2 of the computer mainframe 2 is provided with a pci-EX slot 3A (such as PCI-E 7 M422073 ιοΟΤΠΤΙΓΤ ... It X Bu X4, X8, X16, etc.), another PCI-EX adapter 56, the PCI-EX Transfer - has a PCI slot 561 and a PCI-EX plug-in 562 below, the PCI-EX adapter 56 is plugged into the PCI-EX slot 3A by its PCI-EX plug-in 562, thus enabling system load testing The removable dynamic adjustment device 100 can be converted into a PCI-EX interface by inserting the PCI connector 20 into the PCI slot 561 of the PCI-EX adapter 56, thereby increasing the flexibility of the test. 0 Please refer to the 9th and 10th rounds of the Lantern to illustrate the interchangeable dynamic adjustment device of the external plug-in system load test. As shown in the figure, it includes an external power-adjustable loader 6〇. The plug-in power adjustable loader 60 is provided with a circuit board 62, which is provided with a PCI expansion slot 64' The expansion slot 64 can be a PCI interface or a PCI-EX interface. In this embodiment, the expansion slot 64 is a PCI-EX interface, and two (or other numbers) of pci expansion slots 64 are provided thereon. The slot 64 is a plug-in connection of the replaceable dynamic adjustment device 100A for the system load test of the PCI-EX interface, that is, the PCI-EX connector of the replaceable dynamic adjustment device ι〇〇Α by the system load test The 20A is plugged into the PCI expansion slot 64. In addition, the external power-adjustable loader 60 (circuit board 62) is provided with two power connectors 66 for connecting a PCI POWER cable to form an independent Power supply system. The changeable dynamic adjustment device of the load test of the authoring system enables the load module to have the power dynamic adjustment effect by using the load replaceable module design, so as to achieve the extreme power load detection. Excellent accuracy, efficiency and economy; and it can be replaced by load resistors, allowing testers to freely choose the current percentage of power consumption to be tested, and more flexible design by module, which facilitates power The operation of the load detection; in addition, the creation becomes a PCI-E XI, X4, X8, X16 loader through the conversion expansion slot through the PCI interface, so that the test operation is more flexible, and the external power cable of the PCI power expansion card is used to The extended heat dissipation system mode is used to dynamically adjust the load replaceable module with the PCI power, and the plurality of PCI slot power supplies on the extended heat dissipation system can independently load the system to achieve the system power maximum power consumption adjustment test effect. . In summary, this creation has indeed met the requirements of the new patent, and filed a patent application in accordance with the law. 8 M422073 iqa u. 17-year beta correction, ^ month supplement only the above, only for the preferred embodiment of this creation, not for limiting the scope of the practice, so the scope of patent application according to this creation The equal changes and modifications of the shape, structure, characteristics and spirit mentioned in the above should be included in the patent application garden of this creation. [Simplified description of the schema] The first diagram is the schematic circle of the creation of this creation. Figure 3 is a schematic diagram of the test application of this creation. Figure 4 is a schematic diagram of the system application architecture of this creation. The 5th and 5th diagrams are for the 3.3V adjustment power circuit architecture. Figure 5b is a schematic diagram of the PWM waveform of this creation. Figure 6 is a schematic diagram of the heat dissipation structure of the creation. Figure 7 is a schematic circle of the interface conversion structure of the creation. Figure 8 is the independent power supply structure of the pci power extension card of the creation. Fig. 9 is a partial schematic diagram of the external power-adjustable loader of the present invention. Fig. 10 is a schematic diagram of the external power-adjustable loader of the present invention. [Main component symbol description] System load Testable changeable dynamic adjustment device 100 External power adjustable loader 60 System load test replaceable dynamic adjustment device 100A Circuit board 10 Load power adjustment device 12 Replaceable load resistance device 14 Pulse width modulation control device 16 gold oxygen half field effect transistor device 18 PCI connector 20 power connector 22 load knob switch 121-124 cement resistor U1- -145 MOSFET switch 181-184 triangle wave generation circuit 161 proportional voltage circuit 162 PWM signal circuit 163 load switch circuit 164 9 M422073

八段式分壓電路 165 三角波 167 斜率 168 PWM波形 166 電腦主機 1 主機板 2 PCI插槽 3 PCI Power延伸卡 40 Power Cable電源接槽 103 散熱器 52 PCI Power擴充插槽散熱系統 50 導流板 54 PCI-EX插槽 3A PCI-EX轉接件 56 PCI插槽 561 PCI-EX插件 562 電路板 62 插接件 20A PCI擴充槽 64 PCI-EX電源插接件 66Eight-stage voltage divider circuit 165 Triangle wave 167 Slope 168 PWM waveform 166 Computer host 1 Motherboard 2 PCI slot 3 PCI Power extension card 40 Power Cable power socket 103 Heat sink 52 PCI Power expansion slot cooling system 50 deflector 54 PCI-EX slot 3A PCI-EX adapter 56 PCI slot 561 PCI-EX plug-in 562 circuit board 62 connector 20A PCI expansion slot 64 PCI-EX power connector 66

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Claims (1)

M422073* (<5Ό 六、申請專利範圍: 1. 一種系統負载測試之可換式動態調整裝置,其包括: 一電路板; 包括有複同電料 一負載功率調整裝置,係敬於該電路板上, 擇之負載旋鈕開關; 一可換式負載電阻裝置,係敬於該電路板上,包括有複數電阻件;M422073* (<5Ό VI. Patent application scope: 1. A replaceable dynamic adjustment device for system load test, comprising: a circuit board; comprising a complex electric material-load power adjusting device, respecting the circuit On the board, select the load knob switch; a replaceable load resistor device, on the circuit board, including a plurality of resistors; 一金氧半場效電晶體裝置(M0SFET),係設於該電路板上,包括有複數 對應該電阻件之MOSFET開關; 一脈寬調變控制裝置,係設於該電路板上,用以產生脈寬調變(p丽)訊號 控制MOSFET開關得到所需電流。 2.如申請專概圍第丨項所狀—齡統負侧試之可換式動態调整裝 置,其中該電路板上係設有一 PCI插接件。 3·如申請專職gj第2項所述之-種系統貞制試之可換式動態調整裝 置,其中該電路板上係設有至少一電源連接器。 4·如申請專利範圍第3項所述之一種系統負載測誠之可換式動態調整裝 置,其中該PCI插接件或該電源連接器係用以輸入提供3.3V、5V、12V、 ~12V之電壓負載。 5·如申請專利範圍第1項所述之一種系統負載測試之可換式動態調整裝 置,其中該電路板相對該負載旋鈕開關之周邊係設有複數負載比例選擇 標記。 6·如申請專利範圍第5項所述之-種系統負載測試之可換式動態調整裝 置’其中該負載比例選擇標記係為、2〇%、4⑽、5〇%、6〇%、8〇 %、90%、1〇〇%之八段式電壓標設。 7.如申請專概圍第1項所述之一齡統負制試之可換式動態調整裝 置,其中該電阻件為水泥電阻。 &如申請專魏圍第丨項所述之—種純負細試之可換式動態調整裝 M422073 / ·修正 日補充 置’其中該MOSFET開關係分別對應為3.3V負載、5V負載、12V負載、 -12V負載之使用〇 9. 如申請專利範圍第1項所述之一種系統負載測試之可換式動態調整裝 置,其中該脈寬調變控制裝置包括有三角波產生電路、比例電壓電路、 PWM訊號電路及負載開關電路。 10. 如申請專利範圍第9項所述之一種系統負載測試之可換式動態調整裝 置’其中該脈寬調變控制裝置之該脈寬調變(PWM)訊號係以該三角波產生 電路和該比例電壓電路比較後所產生。 11. 如申請專利範圍第9項所述之一種系統負載測試之可換式動態調整裝 置,其中該三角波產生電路係以三角波產生器所產生,該比例電壓電路 · 係通過該負載旋紐開關選擇所需要之比例電壓β 12. 如申請專利範圍第9項所述之一種系統負載測試之可換式動態調整裝 置’其中該脈寬調變控制裝置進一步包括有一八段式分壓電路,該八段 式分壓電路係包括有10V、9V、8V' 6V、5V、4V、2V、IV分別代表為100¾、 90%、80%、60%、50%、40%、20%、10%之選擇電壓。 13. 如申請專利範圍第1項所述之一種系統負載測試之可換式動態調整裝 置’其係進一步連結有一 PCI Power延伸卡。 14. 如申請專利範圍第13項所述之一種系統負載測試之可換式動態調整裝鲁 置,其中該PCI Power延伸卡係具有獨立之Power Cable電源接槽,用 以提供12V、-12V、5V、3. 3V電源電壓之測試p 15. 如申請專利範圍第13項所述之一種系統負載測試之可換式動態調整裝 置,其中該PCI Power延伸卡係連結一 pci power擴充插槽散熱系統, 該PCI Power擴充插槽散熱系統係至少設有一具獨立電源系統抽載之pci 插槽。 16. 如申請專利範圍第1項所述之_種纽貞細試之可換式動態調整裝 置,其進一步設有一散熱器,用以對該可換式負載電阻裝置及M〇SFET開 關進行散熱。 12 M422073 10( . 11 17 ^ + Θ曰補充 17.如申請專利範圍第2項所述之一種系統負載測試之可換式1勁態調整裝------ 置’其中該PCI插接件係進一步連結有一 PCI-EX插槽,用以變成PCI-E X卜X4、X8、X16負載器。 18.如申請專利範圍第2項所述之—種系統負載測試之可換式動態調整裝 置’其係進一步連結有一外插式功率可調式負載器,該外插式功率可調 式負載器設有至少一擴充槽。 19·如申請專利範圍第18項所述之一種系統負載測試之可換式動態調整裝 置’其中該擴充槽係為PCI界面或PCI-ΕΧ界面。 20.如申請專利範圍第19項所述之一種系統負載測試之可換式動態調整裝 置’其中該外插式功率可調式負載器設有二PCI-ΕΧ插槽及二獨立電源供 應之電源插接件。 21,一種系統負載測試之可換式動態調整裝置,其包括: 一電路板,其設有一 PCI插接件; 一可換式負載電阻裝置,係設於該電路板上,包括有複數電阻件; 一金氧半場效電晶體裝置(MOSFET),係設於該電路板上,包括有複數 對應該電阻件之MOSFET開關; 一脈寬調變控制裝置,係設於該電路板上,該脈寬調變控制裝置係以一 三角波產生電路和一比例電壓電路比較後產生脈寬調變(PWM)訊號,用 以控制該MOSFET開關得到所需電流; 一 PCI-ΕΧ插槽,供該pa插接件插設以變成PCI-E XI、X4、X8或X16 負載器。 22·如申請專利範圍第21項所述之一種系統負載測試之可換式動態調整裝 置,其中該電路板進一步設有: 一負載功率調整裝置,其包括有複數對應不同電壓選擇之負載旋鈕開關。 23.如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置,其中該電路板上係設有至少一電源連接器。 24.如申請專利範圍第23項所述之一種系統負載測試之可換式動態調整裝 13 M422073 修正 燊充 ιΟφΤΊΓΎΤ- 年月日 置’其中該PCI插接件或該電源連接器係用以輸入提供3. 3V、5ΓΤ?Γ^ -12V之電流。 25.如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置,其中該電路板相對該負載旋鈕開關之周邊係設有複數負載比例選擇 標記。 26. 如申請專利範圍第25項所述之一種系統負載測試之可換式動態調整裝 置,其中該負載比例選擇標記係為10¾、20¾、40¾、50%、60¾、80 %、90%、100%之八段式電壓標設。 27. 如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置,其中該電阻件為水泥電阻》 28. 如申請專利範圍第21項所述之一種系統負載測試之可換式動態調整裝 置’其中該M0SFET開關係分別對應為3· 3V負載、5V負載、12V負載、 -12V負載之使用。 29. 如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置’其中該脈寬調變控制裝置包括有三角波產生電路、比例電壓電路、 PWM訊號電路及負載開關電路。 30·如申請專利範圍第29項所述之一種系統負載測試之可換式動態調整裝 置’其中該三角波產生電路係以三角波產生器所產生,該比例電壓電路 係通過該負載旋鈕開關選擇所需要之比例電壓。 31·如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置,其中該脈寬調變控制裝置進一步包括有一八段式分壓電路,該八段 式分壓電路係包括有1(^、卯、8¥、6¥、5乂、4¥、2¥、1¥分別代表為1〇〇%、 90%、80%、60%、50%、40%、20%、10%之選擇電壓。 32. 如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置,其係進一步連結有一 PCI Power延伸卡。 33. 如申請專利範圍第32項所述之一種系統負載測試之可換式動態調整裝 置’其中該PCI Power延伸卡係具有獨立之p〇wer Cable電源接槽,用 M422073 - 以提供12V、-12V、5V、3. 3V電源電壓之測試。 Ί 年月 修正補充 34.如申請專利範圍第32項所述之一種系統負載測試之可換式動態調整裝 置,其中該PCI Power延伸卡係連結一 pci Power擴充插槽散熱系統, 該PC I Power擴充插槽散熱系統係至少設有一具獨立電源系統抽載之PC I 插槽。 35.如申請專利範圍第22項所述之一種系統負載測試之可換式動態調整裝 置,其進一步設有一散熱器,用以對該可換式負載電阻裝置及M〇SFET開 關進行散熱。a metal oxide half field effect transistor device (M0SFET) is disposed on the circuit board and includes a plurality of MOSFET switches corresponding to the resistors; a pulse width modulation control device is disposed on the circuit board for generating The pulse width modulation (p) signal controls the MOSFET switch to get the required current. 2. For the optional dynamic adjustment device of the age-receiving side test, a PCI connector is provided on the circuit board. 3. The reversible dynamic adjustment device of the system for testing the system described in claim 2, wherein at least one power connector is provided on the circuit board. 4. The system of claim 3, wherein the PCI connector or the power connector is for inputting 3.3V, 5V, 12V, ~12V. Voltage load. 5. A replaceable dynamic adjustment device for system load testing according to claim 1, wherein the circuit board is provided with a plurality of load ratio selection marks adjacent to the load switch. 6. The replaceable dynamic adjustment device of the system load test described in claim 5, wherein the load ratio selection flag is 2〇%, 4(10), 5〇%, 6〇%, 8〇 Eight, 90%, 1% of the eight-stage voltage standard. 7. For the interchangeable dynamic adjustment device of the one-year-old negative test described in Item 1 of the application, wherein the resistance component is a cement resistor. & As described in the application for the Wei Wei 丨 — — — 种 种 种 种 种 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 422 The use of a load, a -12V load, and a variable-rate dynamic adjustment device for a system load test according to claim 1, wherein the pulse width modulation control device comprises a triangular wave generating circuit, a proportional voltage circuit, PWM signal circuit and load switch circuit. 10. The interchangeable dynamic adjustment device of the system load test of claim 9, wherein the pulse width modulation (PWM) signal of the pulse width modulation control device is the triangular wave generation circuit and the The proportional voltage circuit is generated after comparison. 11. The replaceable dynamic adjustment device for a system load test according to claim 9, wherein the triangular wave generating circuit is generated by a triangular wave generator, and the proportional voltage circuit is selected by the load knob switch The required proportional voltage β 12. The switchable dynamic adjustment device of the system load test described in claim 9 wherein the pulse width modulation control device further comprises an eight-stage voltage dividing circuit. The eight-stage voltage dividing circuit includes 10V, 9V, 8V' 6V, 5V, 4V, 2V, and IV, respectively, representing 1003⁄4, 90%, 80%, 60%, 50%, 40%, 20%, 10 % of the selection voltage. 13. The replaceable dynamic adjustment device of a system load test as described in claim 1 is further coupled to a PCI Power extension card. 14. The replaceable dynamic adjustment device for a system load test according to claim 13 of the patent application scope, wherein the PCI Power extension card has a separate Power Cable power connection slot for providing 12V, -12V, 5V, 3. 3V power supply voltage test p 15. A system load test interchangeable dynamic adjustment device according to claim 13 wherein the PCI Power extension card is coupled to a pci power expansion slot cooling system The PCI Power expansion slot cooling system is provided with at least one pci slot for independent power system pumping. 16. The variable dynamic adjustment device according to the first aspect of the patent application, further comprising a heat sink for dissipating the replaceable load resistance device and the M〇SFET switch . 12 M422073 10( . 11 17 ^ + Θ曰Supplement 17. The replaceable 1-state adjustment device for a system load test as described in the second paragraph of the patent application scope. The device is further connected with a PCI-EX slot for becoming a PCI-E X Bu X4, X8, X16 loader. 18. The dynamic adjustment of the system load test as described in claim 2 The device is further coupled to an external power-adjustable loader, the external power-adjustable loader being provided with at least one expansion slot. 19. A system load test as described in claim 18 The dynamic adjustment device of the type of the expansion device is a PCI interface or a PCI-ΕΧ interface. 20. A replaceable dynamic adjustment device for system load testing according to claim 19, wherein the external power is The adjustable loader is provided with two PCI-ΕΧ slots and two independent power supply power connectors. 21 A system load test replaceable dynamic adjustment device, comprising: a circuit board with a PCI plug Piece; a replaceable load resistor The device is disposed on the circuit board and includes a plurality of resistors; a metal oxide half field effect transistor device (MOSFET) is disposed on the circuit board and includes a plurality of MOSFET switches corresponding to the resistors; The modulation control device is disposed on the circuit board, and the pulse width modulation control device compares a triangular wave generating circuit and a proportional voltage circuit to generate a pulse width modulation (PWM) signal for controlling the MOSFET switch. Required current; a PCI-ΕΧ slot for the plug to be plugged into a PCI-E XI, X4, X8 or X16 loader. 22. A system load test as described in claim 21 The switchable dynamic adjustment device, wherein the circuit board is further provided with: a load power adjustment device comprising a plurality of load knob switches corresponding to different voltage selections. 23. A system load according to claim 22 The testable dynamic adjustment device, wherein the circuit board is provided with at least one power connector. 24. A system for load testing according to the scope of claim 23, the movable dynamic adjustment device 13 M422073 Amendment Ο Ο Ο ΤΊΓΎΤ 年 年 其中 其中 其中 其中 其中 其中 其中 PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI PCI A replaceable dynamic adjustment device for system load testing, wherein the circuit board is provided with a plurality of load ratio selection marks adjacent to the load knob switch. 26. A system load test according to claim 25 The replaceable dynamic adjustment device, wherein the load ratio selection mark is an eight-stage voltage standard of 103⁄4, 203⁄4, 403⁄4, 50%, 603⁄4, 80%, 90%, and 100%. 27. A replaceable dynamic adjustment device for a system load test according to claim 22, wherein the resistor member is a cement resistor. 28. A system load test according to claim 21 of the patent application scope. The switching dynamic adjustment device 'where the MOSFET open relationship corresponds to the use of a 3·3V load, a 5V load, a 12V load, and a -12V load, respectively. 29. The replaceable dynamic adjustment device of a system load test according to claim 22, wherein the pulse width modulation control device comprises a triangular wave generating circuit, a proportional voltage circuit, a PWM signal circuit, and a load switching circuit. 30. The replaceable dynamic adjustment device for system load testing according to claim 29, wherein the triangular wave generating circuit is generated by a triangular wave generator, and the proportional voltage circuit is selected by the load knob switch. The proportional voltage. 31. The replaceable dynamic adjustment device of a system load test according to claim 22, wherein the pulse width modulation control device further comprises an eight-stage voltage dividing circuit, the eight-stage voltage dividing device The circuit system includes 1 (^, 卯, 8 ¥, 6 ¥, 5 乂, 4 ¥, 2 ¥, 1 ¥, respectively, representing 1〇〇%, 90%, 80%, 60%, 50%, 40% 20%, 10% of the selection voltage. 32. A system type test according to the scope of claim 22, the removable dynamic adjustment device is further connected to a PCI Power extension card. The system for load testing of the replaceable dynamic adjustment device of claim 32, wherein the PCI Power extension card has a separate p〇wer cable power connection slot, using M422073 - to provide 12V, -12V, 5V, 3. 3V power supply voltage test. Ί Yearly correction supplement 34. A system load test interchangeable dynamic adjustment device according to claim 32, wherein the PCI Power extension card is connected to a pci Power expansion slot for heat dissipation System, the PC I Power expansion slot cooling system is at least provided A PC I slot with a separate power supply system. 35. The system of claim 4, wherein the system of the system is tested for a system load test, further comprising a heat sink for the replaceable The load resistor device and the M〇SFET switch dissipate heat. 36.如申請專利細第21項所述之―齡統負載測試之可換式動態調整裝 置,其係進一步連結有一外插式功率可調式負載器 ,該外插式功率可調 式負載器設有至少一擴充槽。 37.如申物細㈣項所述之—齡統負細試之可換式動態調整裝 置’其中該擴充槽係為PCI界面或ρ(:Ι_Εχ界面。 38^° 第36項所述之""種系統負載測試之可換式動態調整裝 :有二PCI-EX插槽及二獨立電源供 置,其中該外插式功率可調式負載器設: 應之電源插接件β36. The interchangeable dynamic adjustment device of the age-old load test according to claim 21, further comprising an external power-adjustable loader, wherein the external power-adjustable loader is provided At least one expansion slot. 37. As described in item (4) of the application item, the changeable dynamic adjustment device of the age-standard negative test is the PCI interface or the ρ(:Ι_Εχ interface. 38^° ;"Replaceable dynamic adjustment of the system load test: There are two PCI-EX slots and two independent power supplies, wherein the external power adjustable loader is: The power connector is required β 15 M422073 ·',15 M422073 ·', 18 M42207318 M422073 寸91Inch 91 od-αΝο scdLO鰣 21 M422073*· * 7 /修正 年月于 補无Od-αΝο scdLO鲥 21 M422073*· * 7 / Amendment 22 M42207% …22 M42207% ... 6060 第10圖 26Figure 10 26
TW100205737U 2011-03-31 2011-03-31 Replaceable dynamic adjustment apparatus for system loading test TWM422073U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI456407B (en) * 2012-10-18 2014-10-11 Inventec Corp Detecting system for pci express slot and method thereof
TWI578681B (en) * 2012-04-24 2017-04-11 光寶電子(廣州)有限公司 Power supply device and circuit board of synchronous rectifier module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI578681B (en) * 2012-04-24 2017-04-11 光寶電子(廣州)有限公司 Power supply device and circuit board of synchronous rectifier module
TWI456407B (en) * 2012-10-18 2014-10-11 Inventec Corp Detecting system for pci express slot and method thereof

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