M412362 五 新型說明： 【新型所屬之技術領域】 本創作係有治具的改良結構，尤指一種針對多片排版 撕職之峨崎，嶋调絲 計，通過微繼之旋峻下治具連動上治具作多 : 娜，，從而更加綱的測試電路板，如此構造不僅結單、 操作谷易，又達到實用之目的。 【先前技術】 傳統的治具大多都是根據電職上的待咖進行設計製成， 然，由於板會受到因素，使得制點純準確的對準 治·探針以撕測試，尤其是要測試—些有W排版的電路板 時就更加無法戦，因此，如何解決習知治具不鱗著電路板的 變化而做相應_整，贿健造成本之軸，即是待解決的問 【新型内容】 鑒於上述習知技術所造成之缺憾，本創作針對習知技術之缺點 創作出折可針對多片排版的電路板進行測試之治具結構，其主 要目的在於有效解決習知治具不能隨著電路板的變化而做相應的 調整’以降低製造成本之缺陷，而深具實祕，藉由在治具底部 置設微調1之料，if過嫌觀n之触使下治錢動上治具 作多向角度的微調移動，從而更加精確的測試電路板，如此構造 不僅結構簡單、操作容易，又達到實用之目的。 為達前述目的，本創作所設一種可調整角度之治具結構，主要 包括：一電路板’該電路板中間排列有四片相同規格的基板，其 下設有待測點，於四周設有定位孔；一上治具，該上治具中穿設 複數探針，於上側開設活動孔；一活動板，該活動板置設於上治 具中，其上設有固定柱以穿過活動孔活動；一下治具，該下治具 中間置設探針與上治具之探針減合料喊，並以導線連接到 電腦中進行測試，^於底部開設固定孔卜微調器，該微調器設 有’舌動盤’其上⑦連接柱以插人下治具之固定孔巾定位；一調整 旋鈕，該旋鈕設有刻度置設於微調器頂部以調整單方向的距離； 一X軸旋鈕，該旋鈕設有刻度置設於微調器底部以調整义軸方向 距離，一Y軸旋鈕，該旋鈕設有刻度置設於微調器中間以調整Y 勒方向距離； 藉由先將上下治具切割成獨立的四小塊，並於其中三塊下面分 別置設微調ϋ ’再將電路板之定位孔套人固定柱巾定位，並使其 中一片基板之待測點對準沒有置設微調器的一組上治具之探針 上而其匕二片基板則會偏移上治具；當待測點偏移探針右側時， 可扭動調整使活動盤往^帶動下冶具移動，*下治具移動則 會連動上治具使活動孔在固^柱巾作微軸，從喊探針往右移 動以接觸到制點進行峨；反之，可扭動調紐峽治具往左 微調移動以測試電路板； 當待測點與探針之轉線及垂直線都*對料，先扭動具有刻M412362 Five new descriptions: [New technology field] This creation department has an improved structure of fixtures, especially a kind of 峨 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋 嶋The upper fixtures are more: Na, and thus the more standard test circuit board, so that not only the statement, the operation of the valley, but also the practical purpose. [Prior Art] Most of the traditional jigs are designed according to the cafés in the electric service. However, because the plates are subject to factors, the purely accurate alignment of the probes and the probes are torn, especially Testing - some boards with W typesetting are even more difficult to deal with. Therefore, how to solve the problem that the conventional fixture does not scale the board and make corresponding changes _ whole, the bribe is the axis of the present, that is, the problem to be solved [new In view of the shortcomings caused by the above-mentioned prior art, this creation creates a jig structure that can be tested for a multi-chip type of circuit board for the shortcomings of the prior art, and its main purpose is to effectively solve the problem that the conventional jig cannot follow Circuit board changes and corresponding adjustments 'to reduce the defects of manufacturing costs, and deep secrets, by setting a fine-tuning 1 material at the bottom of the fixture, if too much view of the touch of the touch With a multi-directional angle of fine-tuning movement, the board can be tested more accurately. This configuration is not only simple in structure, easy to operate, but also practical. In order to achieve the above objective, the present invention provides an adjustable angle jig structure, which mainly comprises: a circuit board having four substrates of the same specification arranged in the middle of the circuit board, and having a point to be measured under the Positioning hole; an upper jig, the upper jig is provided with a plurality of probes, and a movable hole is opened on the upper side; a movable plate is disposed in the upper jig, and a fixed column is arranged thereon to pass through the activity Hole activity; a fixture, the probe in the middle of the fixture is placed in the middle of the probe and the probe of the upper fixture is shouted, and the wire is connected to the computer for testing, and the fixed hole micro-tuner is opened at the bottom, the fine adjustment The device is provided with a 'tongue disc' with a 7-connecting post for positioning the fixed escutcheon of the lower fixture; an adjustment knob, the knob is provided with a scale on the top of the trimmer to adjust the distance in one direction; a knob, the knob is provided with a scale on the bottom of the trimmer to adjust the distance of the sense axis, and a Y-axis knob, the knob is provided with a scale set in the middle of the trimmer to adjust the distance in the Y-direction direction; Cut into four independent pieces and in it Three fine adjustments are placed under the three blocks, and then the positioning holes of the circuit board are positioned to fix the cylindrical towel, and the points to be tested of one of the substrates are aligned with the probes of a set of upper fixtures without the trimmer. The two substrates are offset from the upper fixture; when the point to be measured is offset to the right side of the probe, the adjustment can be twisted to move the movable plate to the lower tool, and the movement of the lower fixture is linked to the upper fixture. The movable hole is in the micro-axis of the solid-column towel, and moves from the shouting probe to the right to contact the manufacturing point for the sputum; otherwise, the twisting of the yoke can be moved to the left to adjust the circuit board to test the circuit board; The transition line and vertical line of the probe are all *feed, first twisted and engraved