TWM381786U - Detection probe for circuit board - Google Patents

Detection probe for circuit board Download PDF

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Publication number
TWM381786U
TWM381786U TW99200947U TW99200947U TWM381786U TW M381786 U TWM381786 U TW M381786U TW 99200947 U TW99200947 U TW 99200947U TW 99200947 U TW99200947 U TW 99200947U TW M381786 U TWM381786 U TW M381786U
Authority
TW
Taiwan
Prior art keywords
probe
spring
circuit board
probe head
detection
Prior art date
Application number
TW99200947U
Other languages
Chinese (zh)
Inventor
Zhong-Yong Guo
Original Assignee
Zhong-Yong Guo
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhong-Yong Guo filed Critical Zhong-Yong Guo
Priority to TW99200947U priority Critical patent/TWM381786U/en
Publication of TWM381786U publication Critical patent/TWM381786U/en

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)

Description

M381786 五、新型說明: 【新型所屬之技術領域】 本新型係有關於一種電路板之檢測探針,尤指一種可 直接裝置於治具中,並隨該治具移動至預定位置,並直接 接觸受測之電路板之檢測探針。 【先前技術】 目前應用於印刷電路板之電路測試,通常係藉由一專 用探針以檢測、確認該電路板上之線路是否異常,一般習 $所不之探針,係含有-外套管,於該外套管之第一管端 、緊連-導線’而於第二管端滑置有彈簧及探針頭,並於 該外套管之第二管端,係嵌置有固定或限位元件,以撞阻 該探針頭及彈簧向外彈脫。 上述習知探針’由於其外套管必須安裝固定或限位元 :’因此在製造上,不但增加了元件數量,使製造成本增 t外’由於該探針極為細小,因此在組裝上也帶給製造者 莫大的困擾及不便,而顯現其缺點。 本案創作人鑑於此,乃予以研究創新,终揭示出本新 型所示電路板之檢測探針。 【新型内容】 本新型之目的旨在提供—種電路板之檢_針係包 彈|彳穿入檢測治具之預設洞孔中於該彈著 連連Ϊ一導線者;以及—探針頭,其第一端係緊 ^彈簧之第-端,並令該探針頭係可於該治具之洞孔 =滑移,並為該彈簧常時向外頂出,使該探針頭之第二端 露出該治具之洞孔者,如是藉由位移該治具至正讀位置, 3 M381786 使該探針頭可以抵觸於受測電路板之對應電路上,以將所 感測之訊號透過導線傳輸至檢測機具,以判讀該電路板是 否為良品。 本新型所揭示電路板之檢測探針,其中該探針頭之第 一端係突設一插銷段,以穿置於該彈簧之第二端中,或可 令該探針頭與該彈簧間,係施予焊接,以緊固該探針頭及 彈簧者。 本新型所揭示電路板之檢測探針,其中該探針頭之檢 測端係可呈一多齒狀,以多點直接接觸受測電路板,使檢 測訊號可以更為靈敏、準確,而顯本新型之新穎性並具產 業之利用性。 ' 本新型之可取實體’可由以下之說明及所附各圖式而 得以明晰。 【實施方式】 請參閱第一、二圖所示,本新型係有關於一種電路板 之檢測探針’係包括:一彈簧(10),可穿入一檢測治具(2〇) 之預設洞孔(21)中,於該彈簧(1〇)之第一端(η)係連接一 導線(12)者;以及一探針頭(30),其第一端(31)係緊連於 該彈簧(10)之第二端(13),並令該探針頭(3〇)係可於該治 具(20)之洞孔(21)中滑移,並為該彈簧(1〇)常時向外頂 出’使該探針頭(30)之第二端(32)露出該治具(2〇)之洞孔 (21)者’如是藉由位移該治具(2〇)至正確位置,使該探針 頭(30)之第二端(32)可以抵觸於受測電路板(4〇)之對應 電路上,以將所感測之訊號透過導線(12)傳輸至檢測機具 〔圖未示出〕,以判讀該電路板(4〇)是否為良品。 本新型所揭示電路板之檢測探針,其中該探針頭(3〇) 4 M381786 之第一端(31)係突設一插銷段(311),以穿置於該彈簧(10) 之第二端(13)中,或可令該探針頭(30)與該彈簧(10)間, 係施予焊接,以緊固該探針頭(30)及彈簧(10)者,彼等之 連接方式,本新型並不自限。 本新型所揭示電路板之檢測探針,其中該探針頭(30) 之第二端(32),即其檢測端係可呈一多齒狀,以多點直接 接觸受測電路板(40),使檢測訊號可以更為靈敏、準確。 本新型所揭示電路板之檢測探針,其中該探針頭 (30)、彈簧(1〇)等元件,係直接置入於一治具(2〇)之預設 洞孔(21)中,無需再以外管包覆固定,因此在製造上可節 省製造外管之材料及製程,可以大幅降低成本,另本新型 更具有以下之優點,而顯本新型之新穎性並具產業之利用 性: 1·構造簡單、安裝容易。 2·更換容易。 3.以多點直接接觸電路板,使其檢測更為精準。 本新型所揭示之結構、形狀,可於不違本新型之精神 及範躊下予以修飾應用,本新型並不自限。 【囷式簡單說明】 第本新型探針頭、彈簧與導線之組裝立體圖。 第一圖·係本新型於應用狀態之剖面結構圖。 【主要元件符號說明】 (11)第一端 (13)第二端 (21)洞孔 (10)彈簧 (12)導線 (20)檢測治具 5 M381786 (30)探針頭 (31)第一端 (311)插銷段 (32)第二端 (40)電路板M381786 V. New description: [New technical field] The present invention relates to a detection probe for a circuit board, in particular to a device that can be directly mounted in a fixture and moved to a predetermined position with the fixture and directly contacted Test probe for the board under test. [Prior Art] At present, the circuit test applied to a printed circuit board usually uses a special probe to detect and confirm whether the circuit on the circuit board is abnormal. Generally, the probe is not included, and the outer casing is included. a spring and a probe head are slid on the first tube end of the outer sleeve, and the second wire end is slid, and a fixing or limiting component is embedded on the second tube end of the outer sleeve In order to block the probe head and the spring to bounce off. The above-mentioned conventional probes must be mounted or fixed by the outer sleeve: 'Therefore, in manufacturing, not only the number of components is increased, but also the manufacturing cost is increased. 'Because the probe is extremely small, it is also assembled. It is a big problem for the manufacturer and it is inconvenient, and it shows its shortcomings. In view of this, the creators of this case have been researching and innovating, and finally revealed the detection probes of the circuit board shown in this new type. [New content] The purpose of the new model is to provide a kind of circuit board inspection _ needle system package | 彳 penetration into the preset hole of the detection fixture in the bombing of a wire; and - probe head The first end of the spring is fastened to the first end of the spring, and the probe head is slidable in the hole of the jig, and the spring is always ejected outward, so that the probe head is If the two ends expose the hole of the fixture, if the fixture is displaced to the reading position, 3 M381786 can make the probe head interfere with the corresponding circuit of the circuit board under test to transmit the sensed signal through the wire. Transfer to the inspection tool to determine if the board is good. The detection probe of the circuit board disclosed in the present invention, wherein the first end of the probe head protrudes from a pin segment to be inserted into the second end of the spring, or the probe head and the spring can be , the welding is applied to fasten the probe head and the spring. The detection probe of the circuit board disclosed in the present invention, wherein the detection end of the probe head can be in a multi-tooth shape, and the multi-point direct contact with the circuit board under test can make the detection signal more sensitive and accurate, and the original The novelty of the new type is also industrially useful. The 'preferable entity of the present invention' can be clarified by the following description and the accompanying drawings. [Embodiment] Please refer to the first and second figures. The present invention relates to a detection probe for a circuit board, which comprises: a spring (10), which can be inserted into a preset of a detection fixture (2〇) In the hole (21), a first end (η) of the spring (1) is connected to a wire (12); and a probe head (30), the first end (31) of which is closely connected to a second end (13) of the spring (10), and the probe head (3〇) is slidable in the hole (21) of the jig (20), and is the spring (1〇) Always outwardly ejecting 'the second end (32) of the probe head (30) is exposed to the hole (21) of the jig (2) if the jig (2〇) is displaced to the correct Positioning such that the second end (32) of the probe head (30) can interfere with the corresponding circuit of the circuit board under test (4〇) to transmit the sensed signal through the wire (12) to the detecting device (Fig. Not shown] to determine whether the board (4〇) is good. The detection probe of the circuit board disclosed in the present invention, wherein the first end (31) of the probe head (3〇) 4 M381786 protrudes from a latch section (311) to be placed on the spring (10) In the two ends (13), the probe head (30) and the spring (10) may be welded to fasten the probe head (30) and the spring (10), and they are The connection method, the new model is not self-limiting. The detecting probe of the circuit board disclosed in the present invention, wherein the second end (32) of the probe head (30), that is, the detecting end thereof can be in a multi-tooth shape, and directly contacts the circuit board under test at multiple points (40) ), making the detection signal more sensitive and accurate. The detecting probe of the circuit board disclosed in the present invention, wherein the probe head (30), the spring (1〇) and the like are directly placed in a predetermined hole (21) of a jig (2〇), There is no need to cover and fix the outer tube, so the material and process for manufacturing the outer tube can be saved in manufacturing, and the cost can be greatly reduced. The novel has the following advantages, and the novelty of the novel is industrially usable: 1. Simple structure and easy installation. 2. Easy to replace. 3. Directly contact the board with multiple points to make the detection more accurate. The structure and shape disclosed in the present invention can be modified and applied without departing from the spirit and scope of the present invention, and the present invention is not self-limiting. [Simple description] The assembled perspective view of the new probe head, spring and wire. The first figure is a cross-sectional structure diagram of the new application state. [Main component symbol description] (11) First end (13) Second end (21) Hole (10) Spring (12) Wire (20) Detection fixture 5 M381786 (30) Probe head (31) First End (311) latch section (32) second end (40) circuit board

Claims (1)

M381786 六、申請專利範園·· 一種電路板之檢測探針,係包括: I彈Γ可穿人—檢測治具之預設洞孔卜於該彈簧之 第一端,係連接一導線者;以及 黃之 一探針頭,該探針頭的第一端係緊連於該彈簧之第二 端,並令該探針頭係可於該治具之洞孔中滑移,並為^ 彈簧常時向外頂出,使該探針頭之第二端露出該户 洞孔者。 α、M381786 VI. Application for Patent Fan Park·· A detection probe for a circuit board, including: I can be worn by a magazine - the preset hole of the test fixture is at the first end of the spring, and is connected to a wire; And a yellow probe head, the first end of the probe head is fastened to the second end of the spring, and the probe head is slidable in the hole of the fixture, and is a spring Often ejected outward, so that the second end of the probe tip is exposed to the hole. α, 2. 如申請專利範圍第1項所述電路板之檢測探針,其中該 探針頭之第一端,係突設一插銷段,以穿置於該彈簧之 第二端中者。 3. 如申請專利範圍第1項所述電路板之檢測探針,其中該 探針頭與該彈簧間,係施予焊接,以緊固該探針頭及彈 簧者。 4. 如申請專利範圍第1頊所述電路板之檢測探針’其中該 探針頭之第二端,係呈〆多齒狀者。2. The detecting probe of the circuit board according to claim 1, wherein the first end of the probe head has a latching portion protruding to be placed in the second end of the spring. 3. The detecting probe of the circuit board according to claim 1, wherein the probe head and the spring are welded to fasten the probe head and the spring. 4. The detection probe of the circuit board according to the first aspect of the patent application, wherein the second end of the probe head is a multi-toothed shape.
TW99200947U 2010-01-18 2010-01-18 Detection probe for circuit board TWM381786U (en)

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TW99200947U TWM381786U (en) 2010-01-18 2010-01-18 Detection probe for circuit board

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI574014B (en) * 2015-04-22 2017-03-11 旺矽科技股份有限公司 Probe structure and probe card

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI574014B (en) * 2015-04-22 2017-03-11 旺矽科技股份有限公司 Probe structure and probe card

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