M366251 五、新型說明： 【新型所屬之技術領域】 且特別是有關於一種 本創作是有關於一種測試機台， 落下測試（Drop Test)的測試機台。 【先前技術】 由^^言’大部分的電子裝置细裝完成之後，會藉 試’以確保電子裝置的生產品質與良率。常見的 ^測ί例如落下測試、老化測試、電性測試、拉力測試 而置很容易因碰撞或掉落所產生之衝擊， 來件受損。因此’業界常以落下測試 木计电子兀件掉洛在地面時的抗震能力。 下，試ί藉由將電子裝置由—高度自由落 破攝^ 義可射°其_的奸元件受外力 i '私度。但由於此種落下測 得知電子奘罟总5丨夕丄1 卜-、置硬性，因此無法 對電子ίίί:，人力作用的分析結果。再者，若欲 將已落至地面的電子裝置放詈二5人貝則必須多次地 為費時費力。 置至原來的尚度，在測試上較 【新型内容】 其可對一電子裝置重複地 、 本創作提供—種測試機台 進行落下測試。 4 M366251 本創作提出-種職機台 ，下測試。測試機台包括—基座對重複地 於承載電子裝置=裝 接驅動裝置。峨置座、，並且升降裝置連 電子裝置。驅動裝置適於透過降置與釋放 座其中之-㈣* 衫讀祕裝置與基 差時:_置===; 使夾持裝電ί ji縣置與基座相互靠近，以 3創作之—實施射，上述之夾雜置包括一 爽持接升降裝置舆失頭’並且夹頭適於 在本_之—實施财，上述之料裝置包括 滾輪以及-傳動皮帶。導桿的—端固設於基座，^ =裝置滑設於轉。滾輪樞接於導桿的另—端。傳動 ^連接駆動裝置與滚輪，並且夾持裝置連接於傳= ^部份j域置適於驅動傳動皮帶轉動，以帶動^ 轉動’亚，動失持裝置沿著導桿滑動。 一在本創作之一實施例中，上述之測試機台更包括至* —擋板，且擋板環繞承載台，以限制電子裝置自j 擋板所環繞的區域中。 至 在本創作之一實施例中，上述之測試機台更包括至+ —擋板與一往復裝置，其中擋板環繞承载台，以限制電少 M366251 裝置自由落下讀板所環繞的區域中，而減 板，亚適於驅動擋板朝向承载台移動。 、連接擋 上述之往復裝置為氣I 只鼽例中，上述之測試機台 數器’配置於承载台上.，以計算電子裂置的落計 基於上述，本創作之測試機台透 裝置與基座其中之—往復地上下移動，以對夾持 複地進行落下測試。 $子旋置重 為讓本創作之上述特徵和優點能更明顯 舉實施例，並配合_圖式作詳細說明如下、。下文特 【實施方式】 圖1^本創作-實施例之一種測 裝置的示意圖。請參考圖1，測試機台1〇〇=厂;子 裝置K)錢地進储下輯，轉知電子 電子元件的抗震能力。在本實施例中，電10的内部 手機、衛星定位導航機或相機等攜帶 例如疋M366251 V. New description: [New technical field] and especially related to one. This creation is about a test machine, Drop Test test machine. [Prior Art] After the finalization of most of the electronic devices by ^^言, the test will be taken to ensure the production quality and yield of the electronic device. Common Measure, such as drop test, aging test, electrical test, and pull test, are easily damaged by collision or drop. Therefore, the industry often relies on the test of the earthquake resistance of the wooden electronic components when they are on the ground. Next, try to use the external device i 'privacy by the electronic device from the height of free fall and the right to shoot. However, due to this drop measurement, it is known that the total number of electronic 奘罟 丨 丄 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 电子 电子 电子Furthermore, if you want to put the electronic device that has fallen to the ground for two or five people, it will take time and effort. Set to the original degree, in the test than the [new content] it can be repeated for an electronic device, this creation provides a test machine for drop test. 4 M366251 This creation is proposed - the seed machine, the next test. The test machine includes a pedestal pair that repeatedly carries the electronic device = a mounting drive. The squat is seated, and the lifting device is connected to the electronic device. The driving device is adapted to pass through the lowering and releasing seat - (4) * shirt reading device and the base difference: _ set ===; so that the clamping power ί ji county and the base close to each other, created by 3 - In the case of the shooting, the above-mentioned inclusions include a cooling and holding device, and the chuck is adapted to be used in the present invention. The above-mentioned material device includes a roller and a transmission belt. The end of the guide rod is fixed to the base, and the device is slidably set to rotate. The roller is pivotally connected to the other end of the guide rod. The transmission ^ connects the swaying device and the roller, and the clamping device is connected to the transmission part. The part of the j is adapted to drive the transmission belt to rotate, so as to drive the rotation, the kinetic loss device slides along the guide rod. In one embodiment of the present invention, the test machine described above further includes a baffle, and the baffle surrounds the carrier to limit the area of the electronic device from the j-baffle. In an embodiment of the present invention, the test machine further includes a baffle and a reciprocating device, wherein the baffle surrounds the carrying platform to limit the power of the M366251 device to freely fall into the area surrounded by the reading plate. And the reduction plate is adapted to drive the baffle to move toward the carrying table. In the case of connecting the above-mentioned reciprocating device to the gas I, the above-mentioned test machine numbering device is disposed on the carrying platform. The calculation of the electronic cracking is based on the above, and the test machine of the present invention is One of the pedestals - reciprocatingly moves up and down to perform a drop test on the clamped land. The sub-rotation weight is to make the above-mentioned features and advantages of the present invention more obvious, and the following is explained in detail with the following figure. The following is a schematic diagram of a measuring device of the present creation-embodiment. Please refer to Figure 1, test machine 1 〇〇 = factory; sub-device K) money to enter the next series, to understand the seismic capacity of electronic components. In this embodiment, the internal mobile phone, the satellite positioning navigation machine or the camera of the electric 10 is carried, for example, 疋
測試機台HK)包括—基座m、—H 升降裝置130卩及—夾持裝置140。基座㈣0、一 台112 ^承載台112適於承載電子装置H)。;二= 中，驅動裝置120例如是馬達，其配置於基座3 = 並相隔-距離。升降裝請連接驅動 ：J M366251 置MO連接升降裝£ UO，並錢於失持與騎電子裝置 驅動裝置120適於透過升降裝置13〇帶動 140與基座110其中之-往復地上下移動。因此，^動 置120可透過升降裝置130帶動夹持裝置14〇相對於美^ 110往復地上下移動。 、土“The test machine HK) includes a base m, an H lifting device 130 and a clamping device 140. The pedestal (4) 0, a 112 ^ carrying station 112 is adapted to carry the electronic device H). In the second = middle, the driving device 120 is, for example, a motor, which is disposed on the base 3 = and separated by a distance. For the lifting and lowering, please connect the drive: J M366251. Connect the MO to the lifting and lowering device and use the lifting device and the riding device. The driving device 120 is adapted to drive the 140 and the base 110 to reciprocally move up and down through the lifting device 13 . Therefore, the movement 120 can drive the clamping device 14 to reciprocate up and down relative to the US 110 through the lifting device 130. ,earth"
值得，意的是，當電子裝置10與基座110相互遠離 至一預定高度差（例如20〜50公分或更高）時，奘 140釋放電子裝置10,以使電子裝置1〇自由落下至承載么 1C。在本實施例中，此預定高度差例如是在一般落下測二 中，電子裝置10與地面之間的距离隹。然而，在其他實施例 中’此預定高度差可配合實際落下測試的需求而決定，本 創作並不以此為限。 接著，夹持裝置140與基座110相互靠近，以使夾持 裝置140可夾持電子裝置10。更進—步地說，當電子芽置 1〇自由落下至承載台112後，夹持裝置14〇可相對於基座 110移動，以使夾持裝置140可再度失持電子裝置1〇。 如此來，測试機台即可自動且重複地對電子裝 置10進行落下測試，進而可得知電子裝置1〇盆内部電子 元件受形趣擊的抗震能力。並且，她於習知技藝， 本實施例之測試機台100不需額外藉由測試人員將已自由 落下至承載台112的電子裝置10置放至夾持裝置140中， 因而較為省時省力。 詳細而言，在本實施例中，夹持裝置140可包括一固 7It is worthwhile, when the electronic device 10 and the susceptor 110 are separated from each other by a predetermined height difference (for example, 20 to 50 cm or more), the cymbal 140 releases the electronic device 10 so that the electronic device 1 〇 freely falls to the bearing. What is 1C. In the present embodiment, the predetermined height difference is, for example, the distance 隹 between the electronic device 10 and the ground in the general drop test. However, in other embodiments, the predetermined height difference may be determined in conjunction with the actual drop test requirement, and the present creation is not limited thereto. Next, the clamping device 140 and the base 110 are in close proximity to each other such that the clamping device 140 can hold the electronic device 10. Further, when the electron buds are free to fall to the stage 112, the clamping device 14 can be moved relative to the base 110 so that the clamping device 140 can again lose the electronic device 1〇. In this way, the test machine can automatically and repeatedly perform the drop test on the electronic device 10, thereby knowing the seismic resistance of the electronic components inside the electronic device 1 in the basin. Moreover, she is skilled in the art, and the test machine 100 of the present embodiment does not require additional time for the tester to place the electronic device 10 that has been freely dropped onto the carrier 112 into the clamping device 140, thereby saving time and effort. In detail, in the embodiment, the clamping device 140 may include a solid 7
M366251 疋件142與一夾頭144。固定件、去 夾頭144,並且失頭144可夾持與釋放電子升:置裝=〇與 ，144例如是透過氣壓驅動以控制其開啟與夾持，八並且 夾頭144的開啟間距可以依實際需求而調 、 可適用於錄補麟條件的電子裝 口 =夾頭144 Ϊ重頭144對電子裝置10的夾持方二 ^重力方向’進而可聽電找置1Q自由落下時翻轉或傾 再者，在本實施例中，升降裝置13〇可包括二 132、-滾輪134以及—傳動皮帶136。導桿132的 ^ 固設於基座110,而滾輪134樞接於導桿132的另一端 咖。失持裝置140滑設於導桿132的兩端ma、咖 之間。此外’傳動皮帶136連接驅動裝置12〇與滾輪134。 如此一來，驅動裝置120可驅動傳動皮帶136轉 帶動滾輪134轉動。 值得注意的是，夾持裝置14〇連接於傳動皮帶136。 因此，當驅動裝置12〇驅動傳動皮帶136轉動，且帶動滾 輪134轉動時，傳動皮帶136也同時帶動夾持裝置14〇 = 著導桿132上下滑動。換言之，藉由傳動皮帶136與滾: 134的轉動，夾持裝置14〇可於夾持電子裝置1〇之後，向 上移動直到與基座Π0具有預定高度差。此時，失持裝置 140可釋放電子裝置10,以使電子裝置1〇自由落下至承載 台 112。 此外’測試機台100更可包括多個擋板150與一往復 M366251 裝置160。這些擋板150可環繞承載台112’以限制電子 置10自由落下至擋板150所環繞的區域中。如此一1^ 電子裝置10落至承載台112時，電子裝置1〇的落^位田 可受到擋板150的限制，而不會因電子裝置10受到撞=置 產生偏移。 ^ @ 在本實施例中，往復裝置160例如是氣壓缸，其 這些擋板150其中之一，並且可驅動擋板15〇朝向^么 112移動，進而藉由擋板15〇限制電子裝置1〇的落σ 置。再者，為了使測試機台1〇〇同時可達到計算電子= 10之落下次數的功能，測試機台100更可包括— 7 繪示），其配置於承載台112上。 态（未 是本創作另—實施例之—種測賴台承載有 子裝置的4目。請參相2，在本實施财 =亦可透過升降裝置23〇帶動基座21_ 24〇住復地上下移動，以配合實際落下測試㈣夺衣置 ，3至圖5是應用本創作—實施例之 測试步驟。請先參考圖3 Κ機口的 電子裝置Κ)。接著，I考=，+置140夹持 置二與圖基f110相互遠離至-預定高度差。 傻„月參考圖5，釋放雷牡 下至基座110的—承载A 119電子=置10，以使其自由落 動夾持裝置140 〇 。接著，請再度參考圖1，驅 靠近。ίί，動’以使夾持裝置刚與基座m相互 =電步驟多次。如此-來* 奸置10可重複地進行落下測試，進而可得知電; M366251 裝置ίο其内部元件受到多次撞擊的抗震能力。 此外，在本實施例令，在以夾持裝置14〇夾持電子裝 置10之前，更可驅動一擋板150朝向承載台112移動。如 此一來’藉由擋板150,電子裝置10自由落下至承載台112 的位置可被限制住。 此外，在另一未繪不的實施例中，驅動裝置亦可透 升Pf裝置帶動基座相對於夾持裝置往復地上下移動，以配 合貫際落下測試的需求。 創作之測試機台透過升降裝置帶動夹持 裝置：、基座其中之-往復地上下移動，以對―電子裝置 震Ϊ:可知電子裝置的内部電子元件 額外籍由測試人員將已自由落;：= 子义置置放至夾持裝置中，因而 甩 頭可適用於多種不同测試條件 ^ ，夾 料’測試機台亦可同時達 j 下次數的功能。 T t包于衣置之洛 雖然本創作已以實施例揭露如上，铁1 本創作，任何所屬技術領域巾財通常二Μ限定 本創作之精神和範_，t可作 I ’不脫離 創作之保護範1|}1視_之更U飾’故本 ㈤田視後附之申轉鄕圍所界定者為準。 【圖式簡單說明】 圖1是本創作一實施例之—種測試機台承載有1子 10 M366251 裝置的示意圖。 圖2是本創作另一實施例之一種測試機台承載有一電 子裝置的示意圖。 圖3至圖5是應用本創作一實施例之一種測試機台的 測試步驟。 【主要元件符號說明】M366251 element 142 and a collet 144. The fixing member, the chuck 144, and the head 144 can clamp and release the electrons: the mounting = 〇, 144 is driven by air pressure to control the opening and clamping thereof, and the opening interval of the chuck 144 can be Adjusted according to actual needs, can be applied to the electronic mounting of the lining condition = chuck 144 Ϊ heavy head 144 to the clamping position of the electronic device 10 ^ gravity direction 'and then audible to find 1Q free fall when flipping or tilting In the present embodiment, the lifting device 13A may include two 132, a roller 134, and a transmission belt 136. The guide rod 132 is fixed to the base 110, and the roller 134 is pivotally connected to the other end of the guide rod 132. The lost device 140 is slidably disposed between the ends of the guide bar 132 and between the coffee makers. Further, the transmission belt 136 is connected to the driving device 12A and the roller 134. In this way, the driving device 120 can drive the driving belt 136 to rotate the roller 134. It is worth noting that the clamping device 14 is coupled to the drive belt 136. Therefore, when the driving device 12 〇 drives the driving belt 136 to rotate and drives the roller 134 to rotate, the driving belt 136 also drives the clamping device 14 〇 = the guiding rod 132 slides up and down. In other words, by the rotation of the drive belt 136 and the roller: 134, the clamping device 14 can be moved upward after the electronic device 1 is clamped until it has a predetermined height difference from the base Π0. At this time, the lost device 140 can release the electronic device 10 to freely drop the electronic device 1 to the carrier 112. Further, the test machine 100 may further include a plurality of baffles 150 and a reciprocating M366251 device 160. These baffles 150 can wrap around the carrier 112' to limit the free fall of the electronic device 10 into the area surrounded by the baffle 150. When the electronic device 10 is dropped onto the carrying platform 112, the falling position of the electronic device 1 can be restricted by the baffle 150 without being offset by the electronic device 10. ^ @ In the present embodiment, the reciprocating device 160 is, for example, a pneumatic cylinder, one of the baffles 150, and can drive the baffle 15 to move toward the 112, thereby restricting the electronic device 1 by the baffle 15 The falling σ. Moreover, in order to enable the test machine 1 to simultaneously achieve the function of calculating the number of drops of the electronic=10, the test machine 100 may further include -7, which is disposed on the carrier 112. State (not the creation of the other embodiment - the type of measuring platform carrying the sub-device 4 mesh. Please refer to phase 2, in this implementation of the money = can also drive the base 21_ 24 through the lifting device 23_ 24 on the foreground Move down to match the actual drop test (4) to take the clothes, 3 to 5 is the test procedure of the application of this creation - the embodiment. Please refer to Figure 3 for the electronic device of the machine port). Next, I test =, + set 140 and set the second and the base f110 away from each other to a predetermined height difference. Silent „month refer to Figure 5, releasing the Thunder down to the pedestal 110—bearing A 119 electronic=set 10 to freely drop the clamping device 140 〇. Next, please refer to Figure 1 again, drive close. ίί, Move 'to make the clamping device and the base m mutually = electric step multiple times. So - to slay 10 can repeat the drop test, and then know the electricity; M366251 device ίο its internal components are subjected to multiple impacts In addition, in the present embodiment, before the electronic device 10 is clamped by the clamping device 14 , a baffle 150 can be driven to move toward the carrying table 112. Thus, by the baffle 150, the electronic device 10, the position of free fall to the carrying platform 112 can be restricted. In addition, in another embodiment, the driving device can also drive the base to move up and down relative to the clamping device through the Pf device to cooperate with The requirements of the test are continuously dropped. The test machine of the creation drives the clamping device through the lifting device: the base is reciprocally moved up and down to shock the electronic device: the internal electronic components of the electronic device are additionally tested. Staff will have The falling;:= sub-position is placed in the clamping device, so the boring head can be applied to a variety of different testing conditions ^, the clamping material 'testing machine can also achieve the function of the number of times at the same time. T t package Although this creation has been exposed as above in the example, the creation of iron 1 is not limited to the spirit and scope of the creation of any technical field. t can be used as a protection model for 1 '} _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ 2 is a schematic diagram of a test machine carrying an electronic device according to another embodiment of the present invention. FIGS. 3 to 5 are test steps of a test machine to which an embodiment of the present invention is applied. Description]
10 :電子裝置 100 : 測試機台 110、 210 :基座 112 ： 承載台 120、 220 :驅動裝置 130、 230 :升降裝置 132 ： 導桿 132a :一端 132b :另一端 134 ： 滾輪 136 ： 傳動皮帶 140、 240 :夾持裝置 142 ： 固定件 144 ： 夾頭 150 ： 擋板 160 ： 往復裝置 1110: electronic device 100: test machine 110, 210: pedestal 112: carrier 120, 220: drive device 130, 230: lifting device 132: guide bar 132a: one end 132b: the other end 134: roller 136: transmission belt 140 , 240 : clamping device 142 : fixing member 144 : collet 150 : baffle 160 : reciprocating device 11